Electronic devices, such as computers, wireless telephones, personal digital assistants, audio/video devices, etc. include integrated circuits (IC) chips that provide active and passive devices. The chip may be bound to a printed circuit board or substrate which connects the product chip to other product chips and/or to system components (e.g., processors, memory, etc) of the device.
The processes for creating the passive and active devices using semiconductors include expensive and time consuming processes and techniques, including masking, etching, and high temperature steps. Additionally, aspects of the processes specific to creating the active devices are incompatible with those specific to creating passive devices. For example, the high temperature processes involved in creating thin dielectrics and other passive features may cause other deleterious effects, and may even destroy active components such as a transistor. Still further, when a given IC product is being developed using masking techniques, a different mask may have to be developed for each iteration of a design modification.
Embodiments of the present disclosure include systems and methods for creating a stack of printed passive devices.
According to one implementation a method is disclosed for creating a stacked passive device on a die. A conductive material is printed onto a first substrate to form a printed passive device according to a predetermined design. The first substrate is attached to a second substrate, such as a die, to form a component for performing a predetermined function. The component may then be tested to determine whether the component formed according to the predetermined design performs the predetermined function. The design may be adjusted in response to the test to improve the performance of the component in performing the predetermined function. An adjusted component may be created by printing a conductive material on a third substrate to form a passive device according to the adjusted design and attaching the third substrate to a forth substrate to form the adjusted component for performing the predetermined function.
Multiple substrates having printed passive devices may be stacked and electrically connected to the die or other substrate in order to increase the number of devices formed on a particular area of that die or other substrate.
This Summary is provided to introduce a selection of concepts in a simplified form that are further described below in the Detailed Description. This Summary is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to be used as an aid in determining the scope of the claimed subject matter.
Systems and methods for creating a stacked printed passive device will now be described with more particularity and with reference to the drawings.
The fluid ejection device may be any suitable device for the deposition of conductive and dielectric printing, particularly those that that do not require expensive and time consuming mask creation procedures. For example, the fluid ejection device may have thermal or piezoelectric print heads to serve as a “drop-on-demand” mechanism. A temperature-controlled vacuum chuck may be employed so that drops may be deposited onto a heated substrate with a relatively high level of precision. One exemplary fluid ejection printing device is the Dimatix® Materials Printer manufactured by FUJIFILM Dimatix, of Santa Clara, Calif., USA. The conductive materials deposited may be silver, gold, copper, or other suitable conductive materials including metals and alloys. A solvent may be used to deliver the material from the print head in a liquid form. As the conductive material in solution is deposited on the heated substrate, or in a heated environment, the solvent used in the deposition of the conductive material evaporates or burns off and the conductive particles anneal together to form the conductive pattern.
The fluid ejection device may also be used to deposit dielectric materials. Exemplary dielectric materials include polyimide, benzocyclobutene (BCB), or other suitable insulating material.
The passive device carrier substrate 112 may be attached to a die 114, such as a semiconductor die. The die 114 may also carry active devices, circuitry or other carrier substrates. The passive device carrier substrate 112 may be attached using an epoxy or adhesive layer. Additionally or alternatively, the passive device carrier substrate 112 and die 114 may be electrically connected using wire bonding and/or solder ball techniques. For example, wire bond 116 may electrically connect the passive device carrier substrate 112 to the die 114. The passive device carrier substrate 112 and die 114 may be encapsulated as a package to reduce or eliminate detrimental environmental effects. The passive device carrier substrate 112 and die 114 may be used as a component of a larger system by electrically connecting the package to a base substrate 118. The passive device carrier substrate 112 and/or passive devices therein may be directly connected to the base substrate 118 by wire bonds 120 or other suitable connection means.
A method of manufacturing stacked passive devices may be shown by way of the flowchart in
The passive device carrier substrate 112 may be physically and/or electrically connected to a die 114 (Block 214). The die 114 may have other passive or active carrier substrates connected thereto. The die 114 may be connected to circuitry on a base substrate 118 by wire bonds 119 or other connection means.
The passive devices and/other circuitry may be tested (Block 216) to determine if the printed passive devices 110 and/or circuit adequately perform the function or functions as per the design created or input (Block 210). The testing may be conducted on the passive device carrier substrate 112 before or after it is connected to the die 114 or other passive device carrier substrates, as described below. The passive carrier substrates and die may also be tested before or after connecting the passive carrier substrates and die to the base substrate. According to one example, the passive devices 110 on the passive carrier substrate 112 may be tested using well known techniques such as an open/short or flying probe test. Additionally or alternatively, testing may be performed using a tester that measures specific values for resistors, capacitors, and/or inductors. The passive device carrier substrate 112, the die 114, and or the base substrate 118 may also be encapsulated prior to testing.
If it is determined through testing that the printed design is not performing as intended (Block 216), the design may be modified or adjusted (Block 218). Thus, for example, if an engineer or technician determines that the inductance obtained by a printed inductor does not meet the requirements of a particular circuit design, the design can be altered so that the inductor is made shorter or longer to achieve the desired inductance value. A new printed passive device carrier substrate 112′ can be printed with one or more passive devices 110 according to the adjusted design (Block 220). The adjusted design may be a minor iteration of the original design or may be a significant design change based on the results of testing the passive device carrier substrate 112. The printed passive carrier substrate 112′ may replace the original printed passive carrier substrate 112 on the original die 114 or may be attached to a new die for further testing or insertion in a final application (Block 222).
With reference to
Solder balls 818 are employed to connect die 814 to printed passive device carrier substrate 812(a). Wire bonds 828 may provide electrical connection between die 814 and printed passive device carrier substrate 812(b). The solder balls 818 may be connected to bond pads 819 disposed on or within printed passive device carrier substrate 812(a) and to bond pads 820 disposed on or within die 814. The wire bonds may be connected to wire bond pads 830 and 832 disposed on or within die 814. The bonding pads 819, 820, 830, and 832 may be connected to further circuitry, which is not illustrated for the sake of simplicity.
Wire bonded devices may also be stacked with printed passive device carrier substrates 1012(a) and 1012(b). For example, printed passive device carrier substrate 1012(c) may be attached to printed passive device carrier substrate 1012(b) by adhesive layer 1029, such as an epoxy or other suitable layer. Electrical connection between the printed passive device carrier substrate 1012(c) and die 1014 may be established with wire bonds 1028(a). Printed passive device carrier substrate 1012(d) may be attached to printed passive device carrier substrate 1012(c) by adhesive layer 1031, which may also be an epoxy or other suitable layer. Electrical connection between the printed passive device carrier substrate 1012(c) and die 1014 may be established with wire bonds 1028(b). Printed passive device carrier substrate 1012(d) may be made slightly smaller than printed passive device carrier substrate 1012(c) to accommodate the wire bond connections. Adhesive layers 1026, 1027,1029, and 1031 may encapsulate passive devices and/or circuitry on the surfaces of the printed passive device substrates.
Stacking multiple substrates with passive devices allows more passive devices to be formed using the same amount of surface space on the base substrate.
Although the invention has been described in language specific to structural features and/or methodological steps, it is to be understood that the invention defined in the appended claims is not necessarily limited to the specific features or steps described. Rather, the specific features and steps are disclosed as preferred forms of implementing the claimed invention.
The present application claims priority under 35 U.S.C. §119(e) to U.S. provisional application No. 60/877,787, filed Dec. 29, 2006.
Number | Date | Country | |
---|---|---|---|
60877787 | Dec 2006 | US |