Janos Kirz

Person

Berkeley, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 12,153,001
- Issue date Nov 26, 2024
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
System and method for compact laminography utilizing microfocus tra...
- Patent number 11,992,350
- Issue date May 28, 2024
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 11,686,692
- Issue date Jun 27, 2023
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,428,651
- Issue date Aug 30, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,215,572
- Issue date Jan 4, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray mirror optics with multiple hyperboloidal/hyperbolic surface...
- Patent number 11,217,357
- Issue date Jan 4, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray dark-field in-line inspection for semiconductor samples
- Patent number 11,175,243
- Issue date Nov 16, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source with rotating anode at atmospheric pressure
- Patent number 11,152,183
- Issue date Oct 19, 2021
- Sigray, Inc.
- Janos Kirz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for computed laminography x-ray fluorescence imaging
- Patent number 11,143,605
- Issue date Oct 12, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for depth-selectable x-ray analysis
- Patent number 11,056,308
- Issue date Jul 6, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray interferometric imaging system
- Patent number RE48612
- Issue date Jun 29, 2021
- Sigray, Inc.
- Wenbing Yun
Information Patent Grant
Wavelength dispersive x-ray spectrometer
- Patent number 10,989,822
- Issue date Apr 27, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
High brightness x-ray reflection source
- Patent number 10,991,538
- Issue date Apr 27, 2021
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray spectrometer system
- Patent number 10,976,273
- Issue date Apr 13, 2021
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for x-ray fluorescence with filtering
- Patent number 10,962,491
- Issue date Mar 30, 2021
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Energy-resolving x-ray detection system
- Patent number 10,845,491
- Issue date Nov 24, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging system
- Patent number 10,653,376
- Issue date May 19, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Talbot-lau x-ray source and interferometric system
- Patent number 10,656,105
- Issue date May 19, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
High brightness x-ray reflection source
- Patent number 10,658,145
- Issue date May 19, 2020
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray emission spectrometer system
- Patent number 10,578,566
- Issue date Mar 3, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray interrogation system using multiple x-ray beams
- Patent number 10,466,185
- Issue date Nov 5, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing X-ray spectroscopy and X-ray absorption spectr...
- Patent number 10,416,099
- Issue date Sep 17, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray techniques using structured illumination
- Patent number 10,401,309
- Issue date Sep 3, 2019
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray interferometric imaging system
- Patent number 10,349,908
- Issue date Jul 16, 2019
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for x-ray microscopy
- Patent number 10,352,880
- Issue date Jul 16, 2019
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Talbot X-ray microscope
- Patent number 10,304,580
- Issue date May 28, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray illumination system with multiple target microstructures
- Patent number 10,297,359
- Issue date May 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20250027889
- Publication date Jan 23, 2025
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20230384245
- Publication date Nov 30, 2023
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
- Publication number 20230349842
- Publication date Nov 2, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR COMPACT LAMINOGRAPHY UTILIZING MICROFOCUS TRA...
- Publication number 20230293128
- Publication date Sep 21, 2023
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULA...
- Publication number 20230280291
- Publication date Sep 7, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
MICROFOCUS X-RAY SOURCE FOR GENERATING HIGH FLUX LOW ENERGY X-RAYS
- Publication number 20230218247
- Publication date Jul 13, 2023
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD USING X-RAYS FOR DEPTH-RESOLVING METROLOGY AND AN...
- Publication number 20220082515
- Publication date Mar 17, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
- Publication number 20220082516
- Publication date Mar 17, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
- Publication number 20210356412
- Publication date Nov 18, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MIRROR OPTICS WITH MULTIPLE HYPERBOLOIDAL / HYPERBOLIC SURFAC...
- Publication number 20210247334
- Publication date Aug 12, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING
- Publication number 20210080408
- Publication date Mar 18, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE WITH ROTATING ANODE AT ATMOSPHERIC PRESSURE
- Publication number 20210020398
- Publication date Jan 21, 2021
- Sigray, Inc.
- Janos Kirz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH BRIGHTNESS X-RAY REFLECTION SOURCE
- Publication number 20200350138
- Publication date Nov 5, 2020
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DEPTH-SELECTABLE X-RAY ANALYSIS
- Publication number 20200098537
- Publication date Mar 26, 2020
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR X-RAY FLUORESCENCE WITH FILTERING
- Publication number 20200072770
- Publication date Mar 5, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
TALBOT-LAU X-RAY SOURCE AND INTERFEROMETRIC SYSTEM
- Publication number 20200041428
- Publication date Feb 6, 2020
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HIGH BRIGHTNESS X-RAY REFLECTION SOURCE
- Publication number 20200035440
- Publication date Jan 30, 2020
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENERGY-RESOLVING X-RAY DETECTION SYSTEM
- Publication number 20190369272
- Publication date Dec 5, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH DISPERSIVE X-RAY SPECTROMETER
- Publication number 20190369271
- Publication date Dec 5, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY EMISSION SPECTROMETER SYSTEM
- Publication number 20190302042
- Publication date Oct 3, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INTERFEROMETRIC IMAGING SYSTEM
- Publication number 20190254616
- Publication date Aug 22, 2019
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY INTERROGATION SYSTEM USING MULTIPLE X-RAY BEAMS
- Publication number 20190250113
- Publication date Aug 15, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION SPECTROMETER SYSTEM
- Publication number 20190145917
- Publication date May 16, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ILLUMINATION SYSTEM WITH MULTIPLE TARGET MICROSTRUCTURES
- Publication number 20190088438
- Publication date Mar 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ILLUMINATORS WITH HIGH FLUX AND HIGH FLUX DENSITY
- Publication number 20190088381
- Publication date Mar 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING X-RAY SPECTROSCOPY AND X-RAY ABSORPTION SPECTR...
- Publication number 20190011379
- Publication date Jan 10, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
TALBOT X-RAY MICROSCOPE
- Publication number 20180261350
- Publication date Sep 13, 2018
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
MATERIAL MEASUREMENT TECHNIQUES USING MULTIPLE X-RAY MICRO-BEAMS
- Publication number 20180202951
- Publication date Jul 19, 2018
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

X-ray detector system with at least two stacked flat Bragg diffractors

High throughput 3D x-ray imaging system using a transmission x-ray...

System and method for compact laminography utilizing microfocus tra...

X-ray sequential array wavelength dispersive spectrometer

High throughput 3D x-ray imaging system using a transmission x-ray...

System and method using x-rays for depth-resolving metrology and an...

System and method for x-ray absorption spectroscopy using a crystal...

System and method for x-ray absorption spectroscopy using a crystal...

X-ray mirror optics with multiple hyperboloidal/hyperbolic surface...

X-ray dark-field in-line inspection for semiconductor samples

X-ray source with rotating anode at atmospheric pressure

System and method for computed laminography x-ray fluorescence imaging

System and method for depth-selectable x-ray analysis

X-ray interferometric imaging system

Wavelength dispersive x-ray spectrometer

High brightness x-ray reflection source

X-ray spectrometer system

System and method for x-ray fluorescence with filtering

Energy-resolving x-ray detection system

X-ray imaging system

Talbot-lau x-ray source and interferometric system

High brightness x-ray reflection source

X-ray emission spectrometer system

X-ray interrogation system using multiple x-ray beams

Method of performing X-ray spectroscopy and X-ray absorption spectr...

X-ray techniques using structured illumination

X-ray interferometric imaging system

Method and apparatus for x-ray microscopy

Talbot X-ray microscope

X-ray illumination system with multiple target microstructures

Patents Applicationslast 30 patents

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER

SYSTEM AND METHOD FOR COMPACT LAMINOGRAPHY UTILIZING MICROFOCUS TRA...

X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULA...

MICROFOCUS X-RAY SOURCE FOR GENERATING HIGH FLUX LOW ENERGY X-RAYS

SYSTEM AND METHOD USING X-RAYS FOR DEPTH-RESOLVING METROLOGY AND AN...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...

X-RAY MIRROR OPTICS WITH MULTIPLE HYPERBOLOIDAL / HYPERBOLIC SURFAC...

SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING

X-RAY SOURCE WITH ROTATING ANODE AT ATMOSPHERIC PRESSURE

HIGH BRIGHTNESS X-RAY REFLECTION SOURCE

SYSTEM AND METHOD FOR DEPTH-SELECTABLE X-RAY ANALYSIS

SYSTEM AND METHOD FOR X-RAY FLUORESCENCE WITH FILTERING

TALBOT-LAU X-RAY SOURCE AND INTERFEROMETRIC SYSTEM

HIGH BRIGHTNESS X-RAY REFLECTION SOURCE

ENERGY-RESOLVING X-RAY DETECTION SYSTEM

WAVELENGTH DISPERSIVE X-RAY SPECTROMETER

X-RAY EMISSION SPECTROMETER SYSTEM

X-RAY INTERFEROMETRIC IMAGING SYSTEM

X-RAY INTERROGATION SYSTEM USING MULTIPLE X-RAY BEAMS

X-RAY TRANSMISSION SPECTROMETER SYSTEM

X-RAY ILLUMINATION SYSTEM WITH MULTIPLE TARGET MICROSTRUCTURES

X-RAY ILLUMINATORS WITH HIGH FLUX AND HIGH FLUX DENSITY

METHOD OF PERFORMING X-RAY SPECTROSCOPY AND X-RAY ABSORPTION SPECTR...

TALBOT X-RAY MICROSCOPE

MATERIAL MEASUREMENT TECHNIQUES USING MULTIPLE X-RAY MICRO-BEAMS