Manny K. Ma

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cascode I/O driver with improved ESD operation
- Patent number 7,903,379
- Issue date Mar 8, 2011
- Micron Technology, Inc.
- Michael D. Chaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cascode I/O driver with improved ESD operation
- Patent number 7,253,064
- Issue date Aug 7, 2007
- Micron Technology, Inc.
- Michael D. Chaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EEPROM transistor for a DRAM
- Patent number 6,924,522
- Issue date Aug 2, 2005
- Micron Technology, Inc.
- Manny K. F. Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing to test a capacitor
- Patent number 6,882,587
- Issue date Apr 19, 2005
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Cascode I/O driver with improved ESD operation
- Patent number 6,809,386
- Issue date Oct 26, 2004
- Micron Technology, Inc.
- Michael D. Chaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection device having a graded junction...
- Patent number 6,787,400
- Issue date Sep 7, 2004
- Micron Technology, Inc.
- Stephen R. Porter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit and method for voltage regulation in a semiconductor device
- Patent number 6,778,452
- Issue date Aug 17, 2004
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Fork-like memory structure for ULSI DRAM
- Patent number 6,724,033
- Issue date Apr 20, 2004
- Aaron Schoenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fork-like memory structure for ULSI DRAM and method of fabrication
- Patent number 6,707,096
- Issue date Mar 16, 2004
- Micron Technology, Inc.
- Aaron Schoenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for coupling a semiconductor die to die terminals
- Patent number 6,699,734
- Issue date Mar 2, 2004
- Micron Technology, Inc.
- Aaron Schoenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for employing piggyback multiple die #3
- Patent number 6,682,954
- Issue date Jan 27, 2004
- Micron Technology, Inc.
- Manny Kin F. Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Advance metallization process
- Patent number 6,653,220
- Issue date Nov 25, 2003
- Micron Technology, Inc.
- Manny Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for reducing bleed currents within a DRAM arra...
- Patent number 6,631,091
- Issue date Oct 7, 2003
- Micron Technology, Inc.
- Manny Kin F. Ma
- G11 - INFORMATION STORAGE
Information Patent Grant
CMOS output driver for semiconductor device and related method for...
- Patent number 6,624,660
- Issue date Sep 23, 2003
- Micron Technology, Inc.
- Wen Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for reducing bleed currents within a DRAM array having ro...
- Patent number 6,625,068
- Issue date Sep 23, 2003
- Micron Technology, Inc.
- Manny Kin F. Ma
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of compensating for a defect within a semiconductor device
- Patent number 6,600,687
- Issue date Jul 29, 2003
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for coupling a semiconductor die to die terminals
- Patent number 6,600,215
- Issue date Jul 29, 2003
- Micron Technology, Inc.
- Aaron Schoenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket and methods
- Patent number 6,593,764
- Issue date Jul 15, 2003
- Micron Technology, Inc.
- Chris G. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic discharge protection device having a graded junction...
- Patent number 6,593,218
- Issue date Jul 15, 2003
- Micron Technology, Inc.
- Stephen R. Porter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for ESD protection in semiconductor chips
- Patent number 6,586,290
- Issue date Jul 1, 2003
- Micron Technology, Inc.
- Stephen L. Casper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for coupling a semiconductor die to die terminals
- Patent number 6,579,746
- Issue date Jun 17, 2003
- Micron Technology, Inc.
- Aaron Schoenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection device having a graded junction...
- Patent number 6,576,960
- Issue date Jun 10, 2003
- Micron Technology, Inc.
- Stephen R. Porter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having increased breakdown voltage and method...
- Patent number 6,524,922
- Issue date Feb 25, 2003
- Micron Technology, Inc.
- Manny Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a field effect transistor having increased break...
- Patent number 6,518,178
- Issue date Feb 11, 2003
- Micron Technology, Inc.
- Manny Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for ESD protection in semiconductor chips
- Patent number 6,507,074
- Issue date Jan 14, 2003
- Micron Technology, Inc.
- Stephen L. Casper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting an output slew rate of a buffer
- Patent number 6,504,396
- Issue date Jan 7, 2003
- Micron Technology, Inc.
- Joseph C. Sher
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test socket and methods
- Patent number 6,472,893
- Issue date Oct 29, 2002
- Micron Technology, Inc.
- Chris G. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Method of compensating for a defect within a semiconductor device
- Patent number 6,469,944
- Issue date Oct 22, 2002
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Driver circuit for a voltage-pulling device
- Patent number 6,452,846
- Issue date Sep 17, 2002
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of fabricating a semiconductor device having increased break...
- Patent number 6,444,577
- Issue date Sep 3, 2002
- Micron Technology, Inc.
- Manny Ma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CASCODE I/O DRIVER WITH IMPROVED ESD OPERATION
- Publication number 20080019064
- Publication date Jan 24, 2008
- Micron Technology, Inc.
- Michael D. Chaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of preparing to test a capacitor
- Publication number 20040240286
- Publication date Dec 2, 2004
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
Cascode I/O driver with improved ESD operation
- Publication number 20040219760
- Publication date Nov 4, 2004
- Micro Technology, Inc.
- Michael D. Chaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit and method for voltage regulation in a semiconductor device
- Publication number 20040095822
- Publication date May 20, 2004
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
Cascode I/O driver with improved ESD operation
- Publication number 20040041215
- Publication date Mar 4, 2004
- Micron Technology, Inc.
- Michael D. Chaine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for reducing bleed currents within a DRAM array having ro...
- Publication number 20040032784
- Publication date Feb 19, 2004
- Manny Kin F. Ma
- G11 - INFORMATION STORAGE
Information Patent Application
Electrostatic discharge protection device having a graded junction...
- Publication number 20030173622
- Publication date Sep 18, 2003
- Stephen R. Porter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for coupling a semiconductor die to die terminals
- Publication number 20030113953
- Publication date Jun 19, 2003
- Aaron Schoenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS OUTPUT DRIVER FOR SEMICONDUCTOR DEVICE AND RELATED METHOD FOR...
- Publication number 20030107406
- Publication date Jun 12, 2003
- Micron Technology, Inc.
- Wen Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test socket and methods
- Publication number 20030057985
- Publication date Mar 27, 2003
- Chris G. Martin
- G01 - MEASURING TESTING
Information Patent Application
Method of compensating for a defect within a semiconductor device
- Publication number 20030021171
- Publication date Jan 30, 2003
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
Method of making EEPROM transistor for a DRAM
- Publication number 20020135005
- Publication date Sep 26, 2002
- Micron Technology, Inc.
- Manny K. F. Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic discharge protection device having a graded junction...
- Publication number 20020094627
- Publication date Jul 18, 2002
- Stephen R. Porter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fork-like memory structure for ULSI DRAM and method of fabrication
- Publication number 20020056867
- Publication date May 16, 2002
- Aaron Schoenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test socket and methods
- Publication number 20020053919
- Publication date May 9, 2002
- Chris G. Martin
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for reducing bleed currents within a dram arra...
- Publication number 20020048206
- Publication date Apr 25, 2002
- Manny Kin F. Ma
- G11 - INFORMATION STORAGE
Information Patent Application
Structure for ESD proctection in semiconductor chips
- Publication number 20020047165
- Publication date Apr 25, 2002
- Micron Technology, Inc.
- Stephen L. Casper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Buffer with adjustable slew rate and a method of providing an adjus...
- Publication number 20020030511
- Publication date Mar 14, 2002
- Joseph C. Sher
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electrostatic discharge protection device having a graded junction...
- Publication number 20020028522
- Publication date Mar 7, 2002
- Stephen R. Porter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of testing a memory array
- Publication number 20020018381
- Publication date Feb 14, 2002
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF MAKING EEPROM TRANSISTOR FOR A DRAM
- Publication number 20020009831
- Publication date Jan 24, 2002
- MANNY K.F. MA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Advance metallization process
- Publication number 20020004297
- Publication date Jan 10, 2002
- Manny Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for coupling a semiconductor die to die terminals
- Publication number 20010052638
- Publication date Dec 20, 2001
- Aaron Schoenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for reducing bleed currents within a DRAM arra...
- Publication number 20010046174
- Publication date Nov 29, 2001
- Manny Kin F. Ma
- G11 - INFORMATION STORAGE
Information Patent Application
Test socket and methods
- Publication number 20010035760
- Publication date Nov 1, 2001
- Chris G. Martin
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor processing methods of forming a contact opening
- Publication number 20010023131
- Publication date Sep 20, 2001
- Zhiqiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTANCE INTEGRATED CIRCUIT RESISTOR
- Publication number 20010017396
- Publication date Aug 30, 2001
- JAMES E. MILLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Margin-range apparatus for a sense amp's voltage-pulling transistor
- Publication number 20010009522
- Publication date Jul 26, 2001
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
Method of compensating for a defect within a semiconductor device
- Publication number 20010004333
- Publication date Jun 21, 2001
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF TESTING A MEMORY CELL
- Publication number 20010002888
- Publication date Jun 7, 2001
- Kurt D. Beigel
- G11 - INFORMATION STORAGE

Manny K. Ma

Person

Patents Grantslast 30 patents

Cascode I/O driver with improved ESD operation

Cascode I/O driver with improved ESD operation

EEPROM transistor for a DRAM

Method of preparing to test a capacitor

Cascode I/O driver with improved ESD operation

Electrostatic discharge protection device having a graded junction...

Circuit and method for voltage regulation in a semiconductor device

Fork-like memory structure for ULSI DRAM

Fork-like memory structure for ULSI DRAM and method of fabrication

Method and apparatus for coupling a semiconductor die to die terminals

Method for employing piggyback multiple die &#x00023;3

Advance metallization process

Method and apparatus for reducing bleed currents within a DRAM arra...

CMOS output driver for semiconductor device and related method for...

Apparatus for reducing bleed currents within a DRAM array having ro...

Method of compensating for a defect within a semiconductor device

Method and apparatus for coupling a semiconductor die to die terminals

Test socket and methods

Electrostatic discharge protection device having a graded junction...

Structure for ESD protection in semiconductor chips

Method and apparatus for coupling a semiconductor die to die terminals

Electrostatic discharge protection device having a graded junction...

Semiconductor device having increased breakdown voltage and method...

Method for forming a field effect transistor having increased break...

Structure for ESD protection in semiconductor chips

Method for adjusting an output slew rate of a buffer

Test socket and methods

Method of compensating for a defect within a semiconductor device

Driver circuit for a voltage-pulling device

Method of fabricating a semiconductor device having increased break...

Patents Applicationslast 30 patents

CASCODE I/O DRIVER WITH IMPROVED ESD OPERATION

Method of preparing to test a capacitor

Cascode I/O driver with improved ESD operation

Circuit and method for voltage regulation in a semiconductor device

Cascode I/O driver with improved ESD operation

Apparatus for reducing bleed currents within a DRAM array having ro...

Electrostatic discharge protection device having a graded junction...

Method and apparatus for coupling a semiconductor die to die terminals

CMOS OUTPUT DRIVER FOR SEMICONDUCTOR DEVICE AND RELATED METHOD FOR...

Test socket and methods

Method of compensating for a defect within a semiconductor device

Method of making EEPROM transistor for a DRAM

Electrostatic discharge protection device having a graded junction...

Fork-like memory structure for ULSI DRAM and method of fabrication

Test socket and methods

Method and apparatus for reducing bleed currents within a dram arra...

Structure for ESD proctection in semiconductor chips

Buffer with adjustable slew rate and a method of providing an adjus...

Electrostatic discharge protection device having a graded junction...

Method of testing a memory array

METHOD OF MAKING EEPROM TRANSISTOR FOR A DRAM

Advance metallization process

Method and apparatus for coupling a semiconductor die to die terminals

Method and apparatus for reducing bleed currents within a DRAM arra...

Test socket and methods

Semiconductor processing methods of forming a contact opening

HIGH RESISTANCE INTEGRATED CIRCUIT RESISTOR

Margin-range apparatus for a sense amp's voltage-pulling transistor

Method of compensating for a defect within a semiconductor device

METHOD OF TESTING A MEMORY CELL

Method for employing piggyback multiple die #3