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Manny K. Ma
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Cascode I/O driver with improved ESD operation
Patent number
7,903,379
Issue date
Mar 8, 2011
Micron Technology, Inc.
Michael D. Chaine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cascode I/O driver with improved ESD operation
Patent number
7,253,064
Issue date
Aug 7, 2007
Micron Technology, Inc.
Michael D. Chaine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
EEPROM transistor for a DRAM
Patent number
6,924,522
Issue date
Aug 2, 2005
Micron Technology, Inc.
Manny K. F. Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of preparing to test a capacitor
Patent number
6,882,587
Issue date
Apr 19, 2005
Micron Technology, Inc.
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Grant
Cascode I/O driver with improved ESD operation
Patent number
6,809,386
Issue date
Oct 26, 2004
Micron Technology, Inc.
Michael D. Chaine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic discharge protection device having a graded junction...
Patent number
6,787,400
Issue date
Sep 7, 2004
Micron Technology, Inc.
Stephen R. Porter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit and method for voltage regulation in a semiconductor device
Patent number
6,778,452
Issue date
Aug 17, 2004
Micron Technology, Inc.
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Grant
Fork-like memory structure for ULSI DRAM
Patent number
6,724,033
Issue date
Apr 20, 2004
Aaron Schoenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fork-like memory structure for ULSI DRAM and method of fabrication
Patent number
6,707,096
Issue date
Mar 16, 2004
Micron Technology, Inc.
Aaron Schoenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for coupling a semiconductor die to die terminals
Patent number
6,699,734
Issue date
Mar 2, 2004
Micron Technology, Inc.
Aaron Schoenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for employing piggyback multiple die #3
Patent number
6,682,954
Issue date
Jan 27, 2004
Micron Technology, Inc.
Manny Kin F. Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Advance metallization process
Patent number
6,653,220
Issue date
Nov 25, 2003
Micron Technology, Inc.
Manny Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for reducing bleed currents within a DRAM arra...
Patent number
6,631,091
Issue date
Oct 7, 2003
Micron Technology, Inc.
Manny Kin F. Ma
G11 - INFORMATION STORAGE
Information
Patent Grant
CMOS output driver for semiconductor device and related method for...
Patent number
6,624,660
Issue date
Sep 23, 2003
Micron Technology, Inc.
Wen Li
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Apparatus for reducing bleed currents within a DRAM array having ro...
Patent number
6,625,068
Issue date
Sep 23, 2003
Micron Technology, Inc.
Manny Kin F. Ma
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of compensating for a defect within a semiconductor device
Patent number
6,600,687
Issue date
Jul 29, 2003
Micron Technology, Inc.
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for coupling a semiconductor die to die terminals
Patent number
6,600,215
Issue date
Jul 29, 2003
Micron Technology, Inc.
Aaron Schoenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test socket and methods
Patent number
6,593,764
Issue date
Jul 15, 2003
Micron Technology, Inc.
Chris G. Martin
G01 - MEASURING TESTING
Information
Patent Grant
Electrostatic discharge protection device having a graded junction...
Patent number
6,593,218
Issue date
Jul 15, 2003
Micron Technology, Inc.
Stephen R. Porter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Structure for ESD protection in semiconductor chips
Patent number
6,586,290
Issue date
Jul 1, 2003
Micron Technology, Inc.
Stephen L. Casper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for coupling a semiconductor die to die terminals
Patent number
6,579,746
Issue date
Jun 17, 2003
Micron Technology, Inc.
Aaron Schoenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic discharge protection device having a graded junction...
Patent number
6,576,960
Issue date
Jun 10, 2003
Micron Technology, Inc.
Stephen R. Porter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having increased breakdown voltage and method...
Patent number
6,524,922
Issue date
Feb 25, 2003
Micron Technology, Inc.
Manny Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming a field effect transistor having increased break...
Patent number
6,518,178
Issue date
Feb 11, 2003
Micron Technology, Inc.
Manny Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Structure for ESD protection in semiconductor chips
Patent number
6,507,074
Issue date
Jan 14, 2003
Micron Technology, Inc.
Stephen L. Casper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for adjusting an output slew rate of a buffer
Patent number
6,504,396
Issue date
Jan 7, 2003
Micron Technology, Inc.
Joseph C. Sher
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test socket and methods
Patent number
6,472,893
Issue date
Oct 29, 2002
Micron Technology, Inc.
Chris G. Martin
G01 - MEASURING TESTING
Information
Patent Grant
Method of compensating for a defect within a semiconductor device
Patent number
6,469,944
Issue date
Oct 22, 2002
Micron Technology, Inc.
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Grant
Driver circuit for a voltage-pulling device
Patent number
6,452,846
Issue date
Sep 17, 2002
Micron Technology, Inc.
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of fabricating a semiconductor device having increased break...
Patent number
6,444,577
Issue date
Sep 3, 2002
Micron Technology, Inc.
Manny Ma
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CASCODE I/O DRIVER WITH IMPROVED ESD OPERATION
Publication number
20080019064
Publication date
Jan 24, 2008
Micron Technology, Inc.
Michael D. Chaine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of preparing to test a capacitor
Publication number
20040240286
Publication date
Dec 2, 2004
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Application
Cascode I/O driver with improved ESD operation
Publication number
20040219760
Publication date
Nov 4, 2004
Micro Technology, Inc.
Michael D. Chaine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Circuit and method for voltage regulation in a semiconductor device
Publication number
20040095822
Publication date
May 20, 2004
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Application
Cascode I/O driver with improved ESD operation
Publication number
20040041215
Publication date
Mar 4, 2004
Micron Technology, Inc.
Michael D. Chaine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus for reducing bleed currents within a DRAM array having ro...
Publication number
20040032784
Publication date
Feb 19, 2004
Manny Kin F. Ma
G11 - INFORMATION STORAGE
Information
Patent Application
Electrostatic discharge protection device having a graded junction...
Publication number
20030173622
Publication date
Sep 18, 2003
Stephen R. Porter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for coupling a semiconductor die to die terminals
Publication number
20030113953
Publication date
Jun 19, 2003
Aaron Schoenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CMOS OUTPUT DRIVER FOR SEMICONDUCTOR DEVICE AND RELATED METHOD FOR...
Publication number
20030107406
Publication date
Jun 12, 2003
Micron Technology, Inc.
Wen Li
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Test socket and methods
Publication number
20030057985
Publication date
Mar 27, 2003
Chris G. Martin
G01 - MEASURING TESTING
Information
Patent Application
Method of compensating for a defect within a semiconductor device
Publication number
20030021171
Publication date
Jan 30, 2003
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Application
Method of making EEPROM transistor for a DRAM
Publication number
20020135005
Publication date
Sep 26, 2002
Micron Technology, Inc.
Manny K. F. Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrostatic discharge protection device having a graded junction...
Publication number
20020094627
Publication date
Jul 18, 2002
Stephen R. Porter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Fork-like memory structure for ULSI DRAM and method of fabrication
Publication number
20020056867
Publication date
May 16, 2002
Aaron Schoenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Test socket and methods
Publication number
20020053919
Publication date
May 9, 2002
Chris G. Martin
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for reducing bleed currents within a dram arra...
Publication number
20020048206
Publication date
Apr 25, 2002
Manny Kin F. Ma
G11 - INFORMATION STORAGE
Information
Patent Application
Structure for ESD proctection in semiconductor chips
Publication number
20020047165
Publication date
Apr 25, 2002
Micron Technology, Inc.
Stephen L. Casper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Buffer with adjustable slew rate and a method of providing an adjus...
Publication number
20020030511
Publication date
Mar 14, 2002
Joseph C. Sher
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Electrostatic discharge protection device having a graded junction...
Publication number
20020028522
Publication date
Mar 7, 2002
Stephen R. Porter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of testing a memory array
Publication number
20020018381
Publication date
Feb 14, 2002
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD OF MAKING EEPROM TRANSISTOR FOR A DRAM
Publication number
20020009831
Publication date
Jan 24, 2002
MANNY K.F. MA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Advance metallization process
Publication number
20020004297
Publication date
Jan 10, 2002
Manny Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for coupling a semiconductor die to die terminals
Publication number
20010052638
Publication date
Dec 20, 2001
Aaron Schoenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for reducing bleed currents within a DRAM arra...
Publication number
20010046174
Publication date
Nov 29, 2001
Manny Kin F. Ma
G11 - INFORMATION STORAGE
Information
Patent Application
Test socket and methods
Publication number
20010035760
Publication date
Nov 1, 2001
Chris G. Martin
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor processing methods of forming a contact opening
Publication number
20010023131
Publication date
Sep 20, 2001
Zhiqiang Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH RESISTANCE INTEGRATED CIRCUIT RESISTOR
Publication number
20010017396
Publication date
Aug 30, 2001
JAMES E. MILLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Margin-range apparatus for a sense amp's voltage-pulling transistor
Publication number
20010009522
Publication date
Jul 26, 2001
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Application
Method of compensating for a defect within a semiconductor device
Publication number
20010004333
Publication date
Jun 21, 2001
Kurt D. Beigel
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD OF TESTING A MEMORY CELL
Publication number
20010002888
Publication date
Jun 7, 2001
Kurt D. Beigel
G11 - INFORMATION STORAGE