Claims
- 1. A bump bonding apparatus comprising:a bonding head being operable to form bumps on a wafer having an orientation flat on a circumferential edge thereof before the wafer is diced into a plurality of individual IC chips; a bonding stage being operable to support and position the wafer such that said bonding head is operable to form bumps on the wafer, said bonding stage including a floating and turning component being operable to float and turn the wafer on a top surface of said bonding stage; and a transporting device being operable to transport the wafer to said bonding stage and place the wafer on said bonding stage in a prearranged orientation, said transporting device including a chucking component operable to hold the wafer, said chucking component comprising a first outside-finger and a second outside-finger arranged in parallel, each of said first and second outside-fingers having a pair of chucking pins positioned at a specific distance along a longitudinal direction of said first and second outside-fingers, respectively, and extended vertically downward, and said first and second outside-fingers being adapted to be driven such that said pairs of chucking pins on said first and second outside-fingers are moveable in a direction towards and away from each other, each chucking pin of said pairs of chucking pins including a flange disposed at a bottom end thereof to prevent the wafer from dropping out, and a middle-finger positioned between said first and second outside-fingers in parallel with each of said first and second outside-fingers, said middle-finger having a pair of chucking pins adapted to be moveable in a direction towards and away from each other in a longitudinal direction of said middle-finger orthogonal to the moving direction of said pairs of chucking pins of said first and second outside-fingers, each of said pair of chucking pins of said middle-finger including a flange disposed at a bottom end thereof to prevent the wafer from dropping out.
- 2. The apparatus of claim 1, wherein said transporting device further includes an orientation flat detection component being operable to detect a position of the orientation flat of the wafer supported by said bonding stage.
Priority Claims (1)
Number |
Date |
Country |
Kind |
10-173100 |
Jun 1998 |
JP |
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Parent Case Info
This application is a Divisional application of application Ser. No. 09/335,779, filed Jun. 18, 1999 now U.S. Pat. No. 6,302,317.
US Referenced Citations (19)
Foreign Referenced Citations (3)
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401230240 |
Sep 1989 |
JP |
403006842 |
Jan 1991 |
JP |
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Jun 1993 |
JP |