The present invention relates to electronic circuitry, and more particularly, is related to packaging for a high speed switching circuit.
Embodiments of the present invention provide low inductance laser driver packaging using a lead-frame and a thin dielectric layer mask pad definition, and a method of producing the same. Briefly described, the present invention is directed to a laser driver circuit package for mounting on a host printed circuit board (PCB). A surface mount circuit package includes a lead-frame. A plurality of laser driver circuit components is mounted on and in electrical communication with the lead-frame of the surface mount circuit package. A dielectric layer is located between the lead-frame and the host PCB including portals through the dielectric layer each arranged to accommodate an electrical connection between the lead-frame and the host PCB. The lead-frame and the dielectric layer are arranged such that a first lead-frame portion and a first dielectric layer portal align with a first end of a host PCB trace configured to provide a current return path for the surface mount laser driver, and a second lead-frame portion and a second dielectric layer portal align with a second end of the host PCB trace.
Other systems, methods and features of the present invention will be or become apparent to one having ordinary skill in the art upon examining the following drawings and detailed description. It is intended that all such additional systems, methods, and features be included in this description, be within the scope of the present invention and protected by the accompanying claims.
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The components in the drawings are not necessarily to scale, emphasis instead being placed upon clearly illustrating the principles of the present invention. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
The following definitions are useful for interpreting terms applied to features of the embodiments disclosed herein, and are meant only to define elements within the disclosure.
As used within this disclosure “lead-frame” refers to a metal structure inside a chip package (or just “package”) that carries signals from one or more dies inside the chip package to the outside the chip package. Lead-frames are typically manufactured by removing material from a flat plate of copper or copper-alloy. For example, the lead-frame may be formed by etching (generally suitable for high density of leads), or stamping (generally suitable for low density of leads). Lead-frames are used in the manufacture a flat no-leads package, a flat package, or a dual in-line package (DIP).
As used within this disclosure, a “through-hole” or “via” refers to an aperture or opening in a printed circuit board to facilitate electrical communication between components on either side of the printed circuit board. A “portal refers” an aperture or opening in a solder mask and/or dielectric layer to facilitate electrical communication between components on either side thereof.
As used within this disclosure a “flat no-leads package” is a manufactured structure that physically and electrically connects integrated circuits (ICs) to printed circuit boards (PCB). Flat no-leads, also known as micro lead-frame (MLF) and SON (small-outline no leads), is a surface-mount technology, one of several package technologies that connect ICs to the surfaces of PCBs, typically without through-holes. Flat no-lead is a near chip scale plastic encapsulated package made with a planar copper lead-frame substrate. Perimeter lands on the package bottom (the portion adjacent to the PCB when attached) provide electrical connections to the PCB. Flat no-lead packages may include an exposed thermal pad to improve heat transfer out of the IC (into the PCB). Heat transfer can be further facilitated by metal vias in the thermal pad. A single die or multiple dies inside the package is affixed to the lead-frame, for example, glued, and bond wires attach the die pads to the leads. Typically in the last stage of the manufacturing process, the lead-frame is molded in a plastic case, and the outside of the lead-frame is trimmed off, separating all leads. While the embodiments described herein refer to a flat no-leads package, it is to be understood that alternative embodiments may use other packages in a similar fashion, for example a ceramic package.
To differentiate between PCBs within a package and an external PCB that the package is mounted to, the external PCB is referred to herein as the “host PCB,” and a PCB within the package is referred to as an “internal PCB.” Embodiments of packages described herein may omit an internal PCB.
As used within this disclosure, “vertical” refers to a direction normal to the one or more package PCBs in a package, while “horizontal” refers to a direction parallel to the one or more package PCBs. In general, the package bottom refers to the portion of the package mounted to the mounting surface (typically a PCB external to the package), whereas the package top refers to the portion of the package furthest away from the mounting surface. Directional language (up, down, above, below) is relative to the top (up, above) and bottom (down, below) of the package.
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts.
Typically, a flat no-leads package is used to mount an IC chip to a host PCB. A solder mask, typically a polymer applied on top of metal of the host PCB for protection against oxidation and for preventing solder bridges between solder pads, is interposed between the IC chip and the host PCB and may be used to electrically isolate portions of the IC chip from the host PCB.
Loop inductance in a circuit interferes with rapid pulses of a switching component, for example, a laser in a LIDAR application. Therefore, it is desirable to arrange the circuit components in the package with minimal lead run distances therebetween. Short lead run distances may be accomplished, for example, by stacking layers of components rather than using a co-planar arrangement of the circuit components.
The first layer PCB traces 345, the components 310, 320, 330, and one or more wire bonds 317 conduct current in a first layer 301 of the laser driver circuit 300. The laser driver circuit 300 includes a return path for the current for the laser driver circuit 300 to behave properly, so at least a second layer 302 of the laser driver circuit 300, here a second layer PCB 350, is used. The second layer PCB 350 has second layer traces 355 conduct current in the second layer 302 of the circuit. The current passes between the first layer PCB traces 345 and the second layer PCB traces 355 using conducting material in through hole vias 341, 342 disposed through the first layer PCB 340. A circuit loop (shown by dark arrows) passes upward from the second layer PCB trace 355 through a first via 341 to the first layer PCB trace 345 and to the storage capacitor 310. From the storage capacitor 310, the current loop proceeds through a separate section of the first layer PCB trace 345 through the wire bonds 317 to the laser diode 320. After passing through the laser diode 320, the current loop proceeds through a third section of the first layer PCB trace 345 to a switch, typically a GaN field effect transistor (FET) or Silicon metal-oxide-semiconductor field-effect transistor (MOSFET) 330. The current loop then proceeds downward through the second via 342 through the first layer PCB 340 to the second layer PCB trace 355. The dotted arrow represents a bias voltage 358 applied to the capacitor 310 prior to a discharge. The bias voltage 358 is provided by a slow non-critical path applied through an internal via (not shown) in the laser driver circuit 300.
While stacking components may reduce the length of lateral leads and/or traces in the plane of a PCB, the length of vertical inter-layer electrical connections (for example, vias, wire leads, solder, and metal traces) may still contribute unwanted inductance to the laser driver circuit 300. For example, the thickness 348 of the first layer PCB 340 may be on the order of 50 to 200 μm.
The flat no-leads package 405 is mounted on a substrate, for example a host PCB 450, with a thin dielectric layer 440, for example, a solder mask 440 typically on the order of 20 to 30 μm thick providing electrical isolation between the lead-frame 445 and the PCB 450. The solder mask 440 has openings (or portals) to provide desired electrical connection between portions of the lead-frame 445 and electrical traces 455 on the PCB 450. For example, portions of the lead-frame 445 may be electrically connected to the PCB traces 455 using solder points 441, 442 located in openings in the solder mask 440
The laser driver 400 incorporates a return path for the current so that the circuit 400 behaves properly, so at least a second layer 402 is used, here the PCB 450 and PCB traces 455. The PCB traces 455 conduct current in the second layer 402 of the circuit. The current passes upward between the PCB traces 455 of the second layer 402 and the lead-frame 445 of the first layer 401 by solder points 441, 442 through openings in the solder mask 440. The circuit loop (shown by dark arrows) passes upward from the PCB trace 455 through a first solder point 441 disposed in a first hole in the solder mask 440 to the lead-frame 445 and to the storage capacitor 310. From the storage capacitor 310, the current loop proceeds through a separate section of the lead-frame 445 through the wire bonds 317 to the laser diode 320. From the laser diode 320, the current loop proceeds through a third section of the lead-frame 445 to the switch 330. The current loop then passes downward through the second solder point 442 through a second opening in the solder mask 440 to the second layer PCB trace 355. The dotted arrow represents a bias voltage 358 applied to the capacitor 310 prior to a discharge. bias voltage 358 is a slow non-critical path applied through an opening (not shown) in the solder mask in
Returning to
The solder mask 440 may be a dielectric layer formed directly upon the bottom of the flat no-leads package 405 adjacent to the lead frame 445, or directly upon the PCB 450. The solder mask 440 dielectric layer may be formed, for example, by printing or otherwise depositing a dielectric material upon the flat no-leads package 405 and/or the PCB 450. Alternatively, the solder mask 440 dielectric layer may be formed separately from the flat no-leads package 405 and the PCB 450 and attached, for example, when the flat no-leads package 405 is soldered to the PCB 450.
The manufacturing of the first embodiment stacked circuit 400 has many advantages over using stacked PCBs, as shown in
It should be noted that the thickness of the layers and circuit components depicted in
A plurality of laser driver circuit components 310, 320, 330 are mounted to a lead-frame 445 of a surface mount circuit package 405, as shown by block 910. Electrical connections are formed between the laser driver circuit components 310, 320, 330 and the lead frame 445, as shown by block 920. A dielectric layer 440 of an electrically insulating material to be positioned between the lead-frame 445 and a printed circuit board 450 is formed, as shown by block 930. A plurality of portals is formed in the dielectric layer 440 to accommodate electrical connections between the lead-frame 445 and the printed circuit board 450, shown by block 940. The portals are preferably arranged to provide a return path for current through the laser driver circuit components 310, 320, 330.
It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the present invention cover modifications and variations of this invention provided they fall within the scope of the following claims and their equivalents.
This application claims the benefit of U.S. Provisional Patent Application Ser. No. 62/752,460, filed Oct. 30, 2018 entitled “High Speed Switching Circuit Configuration,” which is incorporated by reference herein in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
6649832 | Brophy et al. | Nov 2003 | B1 |
6754407 | Chakravorty | Jun 2004 | B2 |
7400791 | Kagaya | Jul 2008 | B2 |
8040930 | Mizusako | Oct 2011 | B2 |
8447153 | Douma et al. | May 2013 | B2 |
8831061 | Lauer et al. | Sep 2014 | B2 |
8882310 | Mandelboum et al. | Nov 2014 | B2 |
8888331 | Mandelboum et al. | Nov 2014 | B2 |
9337613 | Lim et al. | May 2016 | B1 |
9509117 | Schwarz et al. | Nov 2016 | B2 |
9722394 | Lauer et al. | Aug 2017 | B2 |
9837393 | Standing | Dec 2017 | B2 |
9905460 | Chae et al. | Feb 2018 | B2 |
9960106 | Chen et al. | May 2018 | B2 |
10297980 | Ryu et al. | May 2019 | B2 |
10459157 | Chojnacki | Oct 2019 | B2 |
20050041934 | Zama et al. | Feb 2005 | A1 |
20050047455 | Tanaka | Mar 2005 | A1 |
20070014321 | Shimotsu | Jan 2007 | A1 |
20070228535 | Fujino et al. | Oct 2007 | A1 |
20090059981 | Mizusako | Mar 2009 | A1 |
20090135878 | Yamaguchi et al. | May 2009 | A1 |
20090321777 | Mitsuyama et al. | Dec 2009 | A1 |
20130195134 | Okahisa et al. | Aug 2013 | A1 |
20150255949 | Lee et al. | Sep 2015 | A1 |
20160268770 | Tazawa et al. | Sep 2016 | A1 |
20160285233 | Victoria et al. | Sep 2016 | A1 |
20170338626 | Eichler et al. | Nov 2017 | A1 |
20180045882 | Chojnacki et al. | Feb 2018 | A1 |
20180145478 | Sakai et al. | May 2018 | A1 |
20180254605 | Wojcik et al. | Sep 2018 | A1 |
20180261731 | Wojcik et al. | Sep 2018 | A1 |
20180278017 | Mignoli et al. | Sep 2018 | A1 |
20180366396 | Komatsu | Dec 2018 | A1 |
20190006818 | Minato et al. | Jan 2019 | A1 |
20190019925 | Morita | Jan 2019 | A1 |
20190036299 | Wojcik et al. | Jan 2019 | A1 |
20190067901 | Khassine et al. | Feb 2019 | A1 |
20190115505 | Tsai et al. | Apr 2019 | A1 |
20190146319 | Stapleton et al. | May 2019 | A1 |
20190259924 | Ho et al. | Aug 2019 | A1 |
20190260179 | Ueyama et al. | Aug 2019 | A1 |
Number | Date | Country |
---|---|---|
102016208431 | Nov 2017 | DE |
2 738 806 | Jun 2014 | EP |
207198668 | Nov 2017 | WO |
2018011279 | Jan 2018 | WO |
2018122013 | Jul 2018 | WO |
2018188910 | Oct 2018 | WO |
2018192972 | Oct 2018 | WO |
2016234068 | Dec 2018 | WO |
2018234068 | Dec 2018 | WO |
2019020761 | Jan 2019 | WO |
Entry |
---|
International Search Report and Written Opinion for PCT/US2019/058445 dated Jan. 23, 2020. |
International Search Report and Written Opinion for PCT/US2019/0058432 dated Feb. 3, 2020. |
International Search Report and Written Opinion for International Application No. PCT/US2019/058436 dated Feb. 2, 2017. |
International Preliminary Report on Patentability for International Application No. PCT/US2019/058436 dated Mar. 29, 2018. |
Number | Date | Country | |
---|---|---|---|
20200136347 A1 | Apr 2020 | US |
Number | Date | Country | |
---|---|---|---|
62752460 | Oct 2018 | US |