Patent Application
20140291701
The present invention relates to semiconductor devices provided inside with semiconductor elements and electronic components disposed near the semiconductor elements.
In a semiconductor device, electronic components such as resistors for adjusting the balance between input signals input to the semiconductor elements, individually, are provided near semiconductor elements via solder. The electronic components are joined (connected) to a top of an electrode pattern formed on a substrate (for example, see Patent Document 1).
Patent Document 1: Japanese Patent Application Laid-Open No. 2007-237212
With advances in the high-temperature operation of semiconductor elements in recent years, it has been required that material used around (near) the semiconductor elements also be improved in reliability under high temperatures. It has also been required that solder joint parts of electronic components be improved in reliability under high temperatures as compared with conventional ones. In order to improve the reliability of solder joint parts of electronic components, solder joint parts need to be formed in such a manner as to withstand high-temperature operation of semiconductor elements to increase their life. However, no measures have previously been taken to increase the life of solder joint parts of electronic components.
The present invention has been made to solve these problems, and has an object of providing semiconductor devices that allow the life of solder joint parts of electronic components to be increased.
In order to solve the above problems, a semiconductor device according to the present invention includes a substrate, an electrode pattern formed on the substrate, and an electronic component connected onto the electrode pattern via solder. The electrode pattern has a portion formed in a recess shape, the portion being connected to the electronic component via the solder.
According to the present invention, a substrate, an electrode pattern formed on the substrate, and an electronic component connected onto the electrode pattern via solder are provided. The electrode pattern has a portion formed in a recess shape, the portion being connected to the electronic component via the solder. Thus the life of solder joint parts of the electronic component can be increased.
An embodiment of the present invention will be described below with reference to the drawings.
<Underlying Technology>
First, a technology that underlies the present invention (underlying technology) will be described.
In
As shown in
The resistor 4 is disposed in such a manner as to straddle a space in the upper pattern 2. Electrode portions of the resistor 4 are joined (connected) to the upper pattern 2 via solder 5.
The surface of the upper pattern 2 has a flat shape with no steps.
As described above, with advances in the high-temperature operation of semiconductor elements in recent years, it has been required that solder joint parts of the resistor 4 (electronic component) also be improved in reliability (increased in life) under high temperatures. However, no measures have been taken to increase the life of the solder joint parts of the resistor 4 provided in the semiconductor device according to the underlying technology as shown in
The present invention has been made to solve the above problems, and will be described in detail below.
In
As shown in
The resistor 4 is disposed in such a manner as to straddle a space in the upper pattern 2. Electrode portions of the resistor 4 are joined (connected) to the upper pattern 2 via solder 5.
In a surface of the upper pattern 2, stepped portion 6 in a recess shape are formed. The resistor 4 is disposed above the stepped portion 6, and is joined to the upper pattern 2 via the solder 5. At this time, the solder 5 is formed to cover the bottom surface and the side surface of the stepped portion 6.
That is, the semiconductor device according to the embodiment includes the ceramic 1 (substrate), the upper pattern 2 (electrode pattern) formed on the ceramic 1, and the resistor 4 (electronic component) joined (connected) onto the upper pattern 2 via the solder 5, in which the upper pattern 2 has a portion formed in a recess shape (stepped portion 6) that is connected to the resistor 4 via the solder 5.
The above-described configuration increases the amount of the solder 5 and also increases the area of the solder 5 joined to the resistor 4 and the upper pattern 2, as compared with conventional ones. Thus, the joint strength of the solder 5 can be made greater than before.
From the above, according to the embodiment, the joint strength of the solder 5 can be increased by forming the stepped portion 6 on the upper pattern 2. Consequently, even when the resistor 4 (electronic component) is disposed near the semiconductor element, the life of the solder joint parts of the resistor 4 can be increased. Further, it is particularly effective to apply to the present invention a semiconductor element that operates at high temperatures such as SiC, thereby improving the reliability of an entire semiconductor device provided with the semiconductor element.
The embodiment has been described using the resistor 4 as an example of an electronic component, but electronic components other than the resistor 4 may be used.
In the present invention, the embodiment can be modified and omitted as appropriate within the scope of the invention.
1 ceramic, 2 upper pattern, 3 lower pattern, 4 resistor, 5 solder, 6 stepped portion.
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/JP2012/055507 | 3/5/2012 | WO | 00 | 4/24/2014 |
