Claims
- 1. A stackable integrated circuit chip package, comprising:
a flex circuit comprising:
a flexible substrate having opposed, generally planar top and bottom surfaces; and a conductive pattern disposed on the substrate; a frame attached to the substrate of the flex circuit; and an integrated circuit chip at least partially circumvented by the frame and electrically connected to the conductive pattern; the substrate being wrapped about and attached to at least a portion of the frame such that the conductive pattern defines first and second portions which are each electrically connectable to another stackable integrated circuit chip package.
- 2. The chip package a claim 1 wherein:
the frame defines a central opening for receiving the integrated circuit chip, a top surface, and a bottom surface; the top and bottom surfaces of the frame are attached to the top surface of the substrate; and the substrate is wrapped about the frame such that the first portion of the conductive pattern extends over a portion of the bottom surface of the frame and the second portion of the conductive pattern extends over a portion of the top surface of the frame.
- 3. The chip package of claim 2 wherein:
the frame has a generally rectangular configuration defining opposed pairs of longitudinal and lateral sides; and the substrate is wrapped about the longitudinal sides of the frame such that the first and second portions of the conductive pattern extend in spaced, generally parallel relation to each other over respective portions of the bottom and top surfaces of the frame.
- 4. The chip package of claim 3 wherein:
the substrate has a generally rectangular configuration defining a pair of longitudinal peripheral edge segments and a pair of lateral peripheral edge segments; the conductive pattern extends along the bottom surface of the substrate to the longitudinal peripheral edge segments thereof; and the substrate is wrapped about the longitudinal sides of the frame such that the longitudinal peripheral edge segments of the substrate extend along respective ones of the longitudinal sides of the frame.
- 5. The chip package of claim 4 wherein the substrate is sized relative to the frame such that the lateral sides of the frame protrude from respective ones of the lateral peripheral edge segments of the substrate, and the longitudinal peripheral edge segments of the substrate extend to the central opening of the frame.
- 6. The chip package of claim 5 further comprising a pair of heat sinks attached to respective ones of the lateral sides of the frame.
- 7. The chip package of claim 1 wherein the conductive pattern comprises:
a first set of pads disposed on the bottom surface of the substrate; and a second set of pads disposed on the top surface of the substrate and electrically connected to respective ones of the pads of the first set; the integrated circuit chip being electrically connected to the pads of the second set.
- 8. The chip package of claim 7 further comprising a plurality of metallic bumps electrically connected to respective ones of the pads of the first set.
- 9. The chip package of claim 7 wherein the pads of the second set are arranged in an identical pattern to the pads of the first set such that pads of the second set are aligned with and electrically connected to respective ones of the pads of the first set.
- 10. The chip package of claim 7 wherein the integrated circuit chip comprises:
a body having opposed, generally planar top and bottom surfaces; and a plurality of conductive contacts disposed on the bottom surface of the body; the conductive contacts of the integrated circuit chip being electrically connected to respective ones of the pads of the second set.
- 11. The chip package of claim 10 wherein the conductive contacts are arranged on the bottom surface of the body in an identical pattern to the pads of the second set.
- 12. The chip package of claim 10 wherein the conductive contacts of the integrated circuit chip are electrically connected to respective ones of the pads of the second set via solder.
- 13. The chip package of claim 10 further comprising a layer of epoxy disposed between the bottom surface of the body and the top surface of the substrate.
- 14. The chip package of claim 10 wherein the integrated circuit chip is selected from the group consisting of:
a flip chip device; and a fine pitch BGA device.
- 15. The chip package of claim 1 wherein the substrate is attached to the frame through the use of an acrylic film adhesive.
- 16. The chip package of claim 1 wherein the substrate is fabricated from a polyamide having a thickness in the range of from about one mil to about eight mils.
- 17. The chip package of claim 1 wherein the frame is fabricated from a plastic material filled with a thermal enhancing material.
- 18. The chip package of claim 1 wherein the frame is fabricated from a metal material.
- 19. The chip package of claim 1 further in combination with a second chip package stacked upon the chip package, the first portion of the conductive pattern of the second chip package being electrically connected to the second portion of the conductive pattern of the chip package.
- 20. The chip package of claim 19 wherein the chip packages are electrically connected to each other via a Z-axis film material.
- 21. A stackable integrated circuit chip package, comprising:
a flex circuit comprising:
a flexible substrate having opposed, generally planar top and bottom surfaces; and a conductive pattern disposed on the substrate; an integrated circuit chip electrically connected to the conductive pattern; the substrate being wrapped about and attached to at least a portion of the integrated circuit chip such that the conductive pattern defines first and second portions which are each electrically connectable to another stackable integrated circuit chip package.
- 22. The chip package of claim 21 wherein the conductive pattern comprises:
a first set of pads disposed on the bottom surface of the substrate; and a second set of pads disposed on the top surface of the substrate and electrically connected to respective ones of the pads of the first set; the integrated circuit chip being electrically connected to pads of the second set.
- 23. The chip package of claim 22 further comprising a plurality of copper bumps electrically connected to respective ones of the pads of the first set.
- 24. The chip package of claim 22 wherein the pads of the second set are arranged in an identical pattern to the pads of the first set such that the pads of the second set are aligned with and electrically connected to respective ones of the pads of the first set.
- 25. The chip package of claim 22 wherein the integrated circuit chip comprises:
a body having opposed, generally planar top and bottom surfaces; and a plurality of conductive contacts disposed on the bottom surface of the body; the conductive contacts of the integrated circuit chip being electrically connected to respective ones of the pads of the second set.
- 26. The chip package of claim 25 wherein the conductive contacts are arranged on the bottom surface of the body in an identical pattern to the pads of the second set.
- 27. The chip package of claim 25 wherein the conductive contacts of the integrated circuit chip are attached to respective ones of the pads of the second set via solder.
- 28. The chip package of claim 25 further comprising a layer of epoxy disposed between the bottom surface of the body and the top surface of the substrate.
- 29. The chip package of claim 25 wherein the integrated circuit chip is selected from the group consisting of:
a flip chip device; and a fine pitch BGA device.
- 30. The chip package of claim 25 wherein:
the body of the integrated circuit chip has a generally rectangular configuration defining a pair of longitudinal sides and a pair of lateral sides; the substrate has a generally rectangular configuration defining a pair of longitudinal peripheral edge segments and a pair of lateral peripheral edge segments; the conductive pattern extends along the bottom surface of the substrate to the longitudinal peripheral edge segments thereof; and the substrate is wrapped about the longitudinal sides of the body such that the longitudinal peripheral edge segments of the substrate extend along the top surface of the body in spaced, generally parallel relation to each other, and the first and second portions of the conductive pattern extend in spaced, generally parallel relation to each other over respective portions of the bottom and top surfaces of the body of the integrated circuit chip.
- 31. The chip package of claim 21 wherein the substrate is attached to the integrated circuit chip through the use of an acrylic film adhesive.
- 32. The chip package of claim 21 wherein the substrate is fabricated from a polyamide having a thickness in the range of from about 1 mil to about 8 mils.
- 33. A stackable integrated circuit chip package, comprising:
a flex circuit comprising:
a flexible substrate having opposed, generally planar top and bottom surfaces; and a conductive pattern disposed on the bottom surface; an integrated circuit chip electrically connected to the conductive pattern; the substrate being folded and attached to itself such that the conductive pattern defines first and second portions which are each electrically connectable to another stackable integrated circuit chip package.
- 34. The chip package of claim 33 wherein the conductive pattern comprises:
a first set of pads disposed on the bottom surface of the substrate; and a second set of pads disposed on the top surface of the substrate and electrically connected to respective ones of the pads of the first set; the integrated circuit chip being electrically connected to the pads of the second set.
- 35. The chip package of claim 34 further comprising a plurality of metallic bumps electrically connected to respective ones of the pads of the first set.
- 36. The chip package of claim 34 wherein the pads of the second set are arranged in an identical pattern to the pads of the first set such that the pads of the second set are aligned with and electrically connected to respective ones of the pads of the first set.
- 37. The chip package of claim 34 wherein the integrated circuit chip comprises:
a body having opposed, generally planar top and bottom surfaces; and a plurality of conductive contacts disposed on the bottom surface of the body; the conductive contacts of the integrated circuit chip being electrically connected to respective ones of the pads of the second set.
- 38. The chip package of claim 37 wherein the conductive contacts are arranged on the bottom surface of the body in an identical pattern to the pads of the second set.
- 39. The chip package of claim 37 wherein the conductive contacts of the integrated circuit chip are electrically connected to respective ones of the pads of the second set via solder.
- 40. The chip package of claim 37 further comprising a layer of epoxy disposed between the bottom surface of the body and the top surface of the substrate.
- 41. The chip package of claim 37 wherein the integrated circuit chip is selected from the group consisting:
a flip chip device; and a fine pitch BGA device.
- 42. The chip package of claim 37 wherein:
the body of the integrated circuit chip has a generally rectangular configuration defining a pair of longitudinal sides and a pair of lateral sides; the substrate has a generally rectangular configuration defining a pair of longitudinal peripheral edge segments and a pair of lateral peripheral edge segments; the conductive pattern extends along the bottom surface of the substrate to the longitudinal peripheral edge segments thereof; and the substrate is folded such that the longitudinal peripheral edge segments thereof extend along and in substantially parallel relation to respective ones the longitudinal sides of the body, and the first and second portions of the conductive pattern extend in generally parallel relation to each other.
- 43. The chip package of claim 33 wherein the substrate is attached to itself through the use of an acrylic film adhesive.
- 44. The chip package of claim 33 wherein the substrate is fabricated from a polyamide having a thickness in the range of from about 1 mil to about 8 mils.
- 45. A method of assembling a stackable integrated circuit chip package, comprising the steps of:
(a) electrically connecting an integrated circuit chip to a conductive pattern on a flexible substrate of a flex circuit; (b) attaching a frame to the flex circuit such that the frame at least partially circumvents the integrated circuit chip; and (c) wrapping the flex circuit about and securing the flex circuit to at least a portion of the frame such that the conductive pattern defines first and second portions which are each electrically connectable to at least one other stackable integrated circuit chip package.
- 46. The method of claim 45 wherein the integrated circuit chip includes a plurality of conductive contacts having solder applied thereto, and step (a) comprises the steps of:
(1) applying a layer of flux to the conductive contacts of the integrated circuit chip; (2) positioning the integrated circuit chip upon the substrate such that at least some of the conductive contacts abut the conductive pattern; and (3) applying heat to the integrated circuit chip and the substrate to facilitate the reflow of the solder and electrical connection of the conductive contacts to the conductive pattern.
- 47. The method of claim 46 wherein step (3) is completed at a temperature not exceeding about 220 degrees Celsius and in a reducing atmosphere of about 90 percent nitrogen and about 10 percent hydrogen.
- 48. The method of claim 47 wherein step (3) is completed while a vacuum is being applied to the substrate to maintain the substrate in a generally flat orientation.
- 49. The method of claim 46 wherein step (a) further comprises the steps of:
(4) dispensing a quantity of an epoxy onto the substrate along a side of the integrated circuit chip to facilitate the wicking of the epoxy between the integrated circuit chip and the substrate; and (5) applying heat to the integrated circuit chip and the substrate to facilitate the hardening of the epoxy.
- 50. The method of claim 49 wherein:
step (4) is completed when the substrate is placed on a heated stage at a temperature of about 90 degrees Celsius; and step (5) is completed on the heated stage at a temperature of about 160 degrees Celsius for a time period of about 5 minutes.
- 51. The method of claim 50 wherein steps (4) and (5) are completed while a vacuum is being applied to the substrate to maintain the substrate in a generally in flat orientation.
- 52. The method of claim 49 wherein step (a) further comprises the step of:
(6) testing the integrity of the electrical connection of the conductive contacts of the integrated circuit chip to the conductive pattern.
- 53. The method of claim 45 wherein step (b) comprises the steps of:
(1) bonding two strips of an adhesive to the substrate along opposite sides of the integrated circuit chip; (2) punching a pair of flex windows through the substrate and respective ones of the adhesive strips; and (3) attaching the frame to the adhesive strips.
- 54. The method of claim 53 wherein step (1) is completed by heating the adhesive strips and the substrate to a temperature of about 140 degrees Celsius and applying pressure to the adhesive strips for a time period of from about 5 seconds to about 10 seconds.
- 55. The method of claim 53 wherein step (3) comprises heating the frame, the adhesive strips, and the substrate to a temperature of about 140 degrees Celsius and applying pressure of about 20 psi to the frame for a time period of about 5 seconds.
- 56. The method of claim 45 wherein the frame defines opposed sides, and step (c) comprises the steps of:
(1) positioning the substrate upon a spaced pair or reciprocally movable wrapping fingers; (2) applying downward pressure to at least one of the frame and the integrated circuit chip to force the frame and the integrated circuit chip between the wrapping fingers and facilitate the folding of the substrate upwardly along each of the opposed sides of the frame; (3) moving the wrapping fingers toward each other to facilitate the wrapping of the substrate about the opposed sides of the frame; and (4) moving the wrapping fingers away from each other to allow for the removal of the chip package from therebetween.
- 57. The method of claim 56 wherein step (3) comprises applying heat to the chip package at a temperature of about 180 degrees Celsius for a time period of about 5 minutes.
- 58. The method of claim 45 further comprising the step of:
(d) electrically connecting the second portion of the conductive pattern of the chip package to the first portion of the conductive pattern of another stackable integrated circuit chip package to form a chip stack.
- 59. The method of claim 58 wherein step (d) comprises the steps of:
(1) placing a Z-axis film between the chip packages; and (2) applying heat and pressure to the chip packages for a time period of about 1 minute to cure the Z-axis film.
- 60. The method of claim 58 further comprising the steps of:
(e) forming a plurality of copper bumps on the first portion of the conductive pattern of the lowermost chip package of the chip stack; and (f) testing the integrity of the electrical connection of the chip packages to each other.
- 61. A method of assembling a stackable integrated circuit chip package, comprising the steps of:
(a) electrically connecting an integrated circuit chip to a conductive pattern on a flexible substrate of a flex circuit; (b) wrapping the flex circuit about and securing the flex circuit to at least a portion of the integrated circuit chip such that the conductive pattern defines first and second portions which are each electrically connectable to at least one other stackable integrated circuit chip package.
- 62. The method of claim 61 wherein the integrated circuit chip includes a plurality of conductive contacts having solder applied thereto, and step (a) comprises the steps of:
(1) applying a layer of flux to the conductive contacts of the integrated circuit chip; (2) positioning the integrated circuit chip upon the substrate such that at least some of the conductive contacts abut the conductive pattern; and (3) applying heat to the integrated circuit chip and the substrate to facilitate the reflow of the solder and electrical connection of the conductive contacts to the conductive pattern.
- 63. The method of claim 62 wherein step (3) is completed at a temperature not exceeding about 220 degrees Celsius and in a reducing atmosphere of about 90 percent nitrogen and about 10 percent hydrogen.
- 64. The method of claim 63 wherein step (3) is completed while a vacuum is being applied to the substrate to maintain the substrate in a generally flat orientation.
- 65. The method of claim 62 wherein step (a) further comprises the steps of:
(4) dispensing a quantity of an epoxy onto the substrate along a side of the integrated circuit chip to facilitate the wicking of the epoxy between the integrated circuit chip and the substrate; and (5) applying heat to the integrated circuit chip and the substrate to facilitate the hardening of the epoxy.
- 66. The method of claim 65 wherein:
step (4) is completed when the substrate is placed on a heated stage at a temperature of about 90 degrees Celsius; and step (5) is completed on the heated stage at a temperature of about 160 degrees Celsius for a time period of about 5 minutes.
- 67. The method of claim 66 wherein steps (4) and (5) are completed while a vacuum is being applied to the substrate to maintain the substrate in a generally in flat orientation.
- 68. The method of claim 65 wherein step (a) further comprises the step of:
(6) testing the integrity of the electrical connection of the conductive contacts of the integrated circuit chip to the conductive pattern.
- 69. The method of claim 61 wherein the integrated circuit chip defines opposed sides, and step (b) comprises the steps of:
(1) positioning the substrate upon a spaced pair or reciprocally movable wrapping fingers; (2) applying downward pressure to the integrated circuit chip to force the integrated circuit chip between the wrapping fingers and facilitate the folding of the substrate upwardly along each of the opposed sides of the integrated circuit chip; (3) moving the wrapping fingers toward each other to facilitate the wrapping of the substrate about the opposed sides of the integrated circuit chip; and (4) moving the wrapping fingers away from each other to allow for the removal of the chip package from therebetween.
- 70. The method of claim 69 wherein step (3) comprises applying heat to the chip package at a temperature of about 180 degrees Celsius for a time period of about 5 minutes.
- 71. The method of claim 61 further comprising the step of:
(c) electrically connecting the second portion of the conductive pattern of the chip package to the first portion of the conductive pattern of another stackable integrated circuit chip package to form a chip stack.
- 72. The method of claim 71 wherein step (c) comprises the steps of:
(1) placing a Z-axis film between the chip packages; and (2) applying heat and pressure to the chip packages for a time period of about 1 minute to cure the Z-axis film.
- 73. The method of claim 71 further comprising the steps of:
(d) forming a plurality of copper bumps on the first portion of the conductive pattern of the lowermost chip package of the chip stack; and (e) testing the integrity of the electrical connection of the chip packages to each other.
- 74. A method of assembling a stackable integrated circuit chip package, comprising the steps of:
(a) electrically connecting an integrated circuit chip to a conductive pattern on a flexible substrate of a flex circuit; (b) folding the flex circuit over and securing it to a portion of itself such that the conductive pattern defines first and second portions which are each electrically connectable to at least one other stackable integrated circuit chip package.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] The present application is a continuation-in-part of U.S. application Ser. No. 09/305,584 entitled STACKABLE FLEX CIRCUIT IC PACKAGE AND METHOD OF MAKING SAME filed May 5, 1999, the disclosure of which is incorporated herein by reference.
Divisions (1)
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Number |
Date |
Country |
Parent |
09574321 |
May 2000 |
US |
Child |
09888785 |
Jun 2001 |
US |
Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
09305584 |
May 1999 |
US |
Child |
09574321 |
May 2000 |
US |