Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Industry

CPC
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Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,965,910
- Issue date Apr 23, 2024
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Method for referencing a near-field measurement with drift and fluc...
- Patent number 11,899,041
- Issue date Feb 13, 2024
- ATTOCUBE SYSTEMS AG
- Ivan Malovichko
- G01 - MEASURING TESTING
Information Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
- Patent number 11,860,187
- Issue date Jan 2, 2024
- Dalian University of Technology
- Wei Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for tailoring dialysis treatment based on sensed potassium c...
- Patent number 11,839,709
- Issue date Dec 12, 2023
- Fresenius Medical Care Holdings, Inc.
- Stephen Merchant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vibration component measurement device, Kelvin probe force microsco...
- Patent number 11,835,548
- Issue date Dec 5, 2023
- Osaka University
- Yasuhiro Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of nanoindented and scratch induced accoustic events
- Patent number 11,835,546
- Issue date Dec 5, 2023
- Nanometronix LLC
- Antanas Daugela
- G01 - MEASURING TESTING
Information Patent Grant
Systems, method and computer-accessible medium for providing balanc...
- Patent number 11,835,545
- Issue date Dec 5, 2023
- The Trustees of Columbia University In the City of New York
- Alexander Swinton McLeod
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for detecting mechanical and magnetic features with nanoscal...
- Patent number 11,835,547
- Issue date Dec 5, 2023
- Yi-Chun Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample, method for manufacturing sample, and method for measuring i...
- Patent number 11,828,772
- Issue date Nov 28, 2023
- Kioxia Corporation
- Machiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy apparatus, methods, and applications
- Patent number 11,808,783
- Issue date Nov 7, 2023
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with metrology-preserving real time denoising
- Patent number 11,796,565
- Issue date Oct 24, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 11,796,564
- Issue date Oct 24, 2023
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying sample position in atomic forc...
- Patent number 11,761,981
- Issue date Sep 19, 2023
- Park Systems Corp.
- JeongHun An
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
- Patent number 11,733,186
- Issue date Aug 22, 2023
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computerized creation of measurement plans and plan-based control o...
- Patent number 11,719,534
- Issue date Aug 8, 2023
- Carl Zeiss Industrielle Messtechnik GmbH
- Markus Ritter
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 11,714,103
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,680,963
- Issue date Jun 20, 2023
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with a sample holder fed with electromagn...
- Patent number 11,674,976
- Issue date Jun 13, 2023
- ALCATERA INC.
- Marco Farina
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope
- Patent number 11,668,729
- Issue date Jun 6, 2023
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 11,670,480
- Issue date Jun 6, 2023
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compensating control signal for raster scan of a scanning probe mic...
- Patent number 11,656,244
- Issue date May 23, 2023
- Bruker Nano GmbH
- Wolfgang Dobler
- G01 - MEASURING TESTING
Information Patent Grant
Battery electrode analysis method
- Patent number 11,650,223
- Issue date May 16, 2023
- LG Energy Solution, Ltd.
- Byung Hee Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Holder system
- Patent number 11,635,446
- Issue date Apr 25, 2023
- Winbond Electronics Corp.
- Hsueh-Cheng Liao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
- Publication number 20240118310
- Publication date Apr 11, 2024
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
Atomic-force Microscopy for Identification of Surfaces
- Publication number 20240012022
- Publication date Jan 11, 2024
- Trustees of Tufts College
- Igor Sokolov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20230326711
- Publication date Oct 12, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Surface Analysis Device
- Publication number 20230296644
- Publication date Sep 21, 2023
- Hitachi High-Tech Corporation
- Ritsuo FUKAYA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...
- Publication number 20230280369
- Publication date Sep 7, 2023
- attocube systems AG
- Ivan MALOVICHKO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20230251285
- Publication date Aug 10, 2023
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20230243867
- Publication date Aug 3, 2023
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING I...
- Publication number 20230236221
- Publication date Jul 27, 2023
- KIOXIA Corporation
- Machiko ITO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...
- Publication number 20230194566
- Publication date Jun 22, 2023
- The Regents of the University of California
- Shenkai Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MONITORING AT LEAST ONE OF AN OVERLAY OR AN ALIGNMENT BET...
- Publication number 20230184807
- Publication date Jun 15, 2023
- Nearfield Instruments B.V.
- Paul ZABBAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
- Publication number 20230176088
- Publication date Jun 8, 2023
- Rutgers, The State University of New Jersey
- Angela M. COE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING MECHANICAL AND MAGNETIC FEATURES WITH NANOSCAL...
- Publication number 20230168275
- Publication date Jun 1, 2023
- National Cheng Kung University
- Yi-Chun Chen
- B82 - NANO-TECHNOLOGY
Information Patent Application
PHOTOTHERMAL IMAGING DEVICE AND SYSTEM
- Publication number 20230160817
- Publication date May 25, 2023
- UNIVERSITY OF NOTRE DAME DU LAC
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGR...
- Publication number 20230143659
- Publication date May 11, 2023
- Nearfield Instruments B.V.
- Paul ZABBAL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAME...
- Publication number 20230134093
- Publication date May 4, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCO...
- Publication number 20230110754
- Publication date Apr 13, 2023
- OSAKA UNIVERSITY
- Yasuhiro SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING A SPECIMEN FOR SCANNING CAPACITANCE MICROSCOPY
- Publication number 20230098264
- Publication date Mar 30, 2023
- MSSCORPS CO., LTD.
- CHI-LUN LIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
- Publication number 20230030991
- Publication date Feb 2, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Real Time Drift Correction
- Publication number 20230009857
- Publication date Jan 12, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HET...
- Publication number 20230003762
- Publication date Jan 5, 2023
- Lua Optomekatronik ARGE A.S.
- Tayfun Tatar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20220413007
- Publication date Dec 29, 2022
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
HOLDER SYSTEM
- Publication number 20220413006
- Publication date Dec 29, 2022
- WINBOND ELECTRONICS CORP.
- Hsueh-Cheng LIAO
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
- Publication number 20220357359
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Metrology-Preserving Real Time Denoising
- Publication number 20220326277
- Publication date Oct 13, 2022
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20220252638
- Publication date Aug 11, 2022
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY

Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Device and method for operating a bending beam in a closed control...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Coated active cantilever probes for use in topography imaging in op...

Method for referencing a near-field measurement with drift and fluc...

Modified method to fit cell elastic modulus based on Sneddon model

System for tailoring dialysis treatment based on sensed potassium c...

Vibration component measurement device, Kelvin probe force microsco...

Characterization of nanoindented and scratch induced accoustic events

Systems, method and computer-accessible medium for providing balanc...

Method for detecting mechanical and magnetic features with nanoscal...

Sample, method for manufacturing sample, and method for measuring i...

Nanoscale scanning sensors

Atomic force microscopy apparatus, methods, and applications

AFM imaging with metrology-preserving real time denoising

Atomic-force microscopy for identification of surfaces

Method and apparatus for measuring magnetic field strength

Method and apparatus for identifying sample position in atomic forc...

Method of imaging a surface using a scanning probe microscope

Device and method for analyzing a defect of a photolithographic mas...

Computerized creation of measurement plans and plan-based control o...

Method and apparatus for resolution and sensitivity enhanced atomic...

AFM imaging with creep correction

Method and apparatus for examining a measuring tip of a scanning pr...

Scanning probe microscope with a sample holder fed with electromagn...

Atomic force microscope

System and method for generating and analyzing roughness measurements

Compensating control signal for raster scan of a scanning probe mic...

Battery electrode analysis method

Automated optimization of AFM light source positioning

Holder system

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

NANOSCALE SCANNING SENSORS

Atomic-force Microscopy for Identification of Surfaces

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

Surface Analysis Device

METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING I...

SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...

METHOD OF MONITORING AT LEAST ONE OF AN OVERLAY OR AN ALIGNMENT BET...

DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD

METHOD FOR DETECTING MECHANICAL AND MAGNETIC FEATURES WITH NANOSCAL...

PHOTOTHERMAL IMAGING DEVICE AND SYSTEM

METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGR...

SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAME...

VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCO...

METHOD OF PREPARING A SPECIMEN FOR SCANNING CAPACITANCE MICROSCOPY

METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE

AFM Imaging with Real Time Drift Correction

DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HET...

NANOSCALE SCANNING SENSORS

HOLDER SYSTEM

INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER

AFM Imaging with Metrology-Preserving Real Time Denoising

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...