Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Industry

CPC
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Industries

Patents Grantslast 30 patents

Information Patent Grant
Detection of probabilistic process windows
- Patent number 12,142,454
- Issue date Nov 12, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining dimensions of features of a subsurface topogr...
- Patent number 12,123,895
- Issue date Oct 22, 2024
- Nearfield Instruments B.V.
- Paul Zabbal
- G01 - MEASURING TESTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Method for electrically examining electronic components of an integ...
- Patent number 12,007,408
- Issue date Jun 11, 2024
- Forschungszentrum Juelich GmbH
- Bert Voigtlaender
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for scanning probe sample property measurement...
- Patent number 11,994,533
- Issue date May 28, 2024
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,996,265
- Issue date May 28, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,965,910
- Issue date Apr 23, 2024
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Method for referencing a near-field measurement with drift and fluc...
- Patent number 11,899,041
- Issue date Feb 13, 2024
- ATTOCUBE SYSTEMS AG
- Ivan Malovichko
- G01 - MEASURING TESTING
Information Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
- Patent number 11,860,187
- Issue date Jan 2, 2024
- Dalian University of Technology
- Wei Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for tailoring dialysis treatment based on sensed potassium c...
- Patent number 11,839,709
- Issue date Dec 12, 2023
- Fresenius Medical Care Holdings, Inc.
- Stephen Merchant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vibration component measurement device, Kelvin probe force microsco...
- Patent number 11,835,548
- Issue date Dec 5, 2023
- Osaka University
- Yasuhiro Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of nanoindented and scratch induced accoustic events
- Patent number 11,835,546
- Issue date Dec 5, 2023
- Nanometronix LLC
- Antanas Daugela
- G01 - MEASURING TESTING
Information Patent Grant
Systems, method and computer-accessible medium for providing balanc...
- Patent number 11,835,545
- Issue date Dec 5, 2023
- The Trustees of Columbia University In the City of New York
- Alexander Swinton McLeod
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for detecting mechanical and magnetic features with nanoscal...
- Patent number 11,835,547
- Issue date Dec 5, 2023
- Yi-Chun Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample, method for manufacturing sample, and method for measuring i...
- Patent number 11,828,772
- Issue date Nov 28, 2023
- Kioxia Corporation
- Machiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy apparatus, methods, and applications
- Patent number 11,808,783
- Issue date Nov 7, 2023
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with metrology-preserving real time denoising
- Patent number 11,796,565
- Issue date Oct 24, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 11,796,564
- Issue date Oct 24, 2023
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying sample position in atomic forc...
- Patent number 11,761,981
- Issue date Sep 19, 2023
- Park Systems Corp.
- JeongHun An
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
- Patent number 11,733,186
- Issue date Aug 22, 2023
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computerized creation of measurement plans and plan-based control o...
- Patent number 11,719,534
- Issue date Aug 8, 2023
- Carl Zeiss Industrielle Messtechnik GmbH
- Markus Ritter
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 11,714,103
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,680,963
- Issue date Jun 20, 2023
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with a sample holder fed with electromagn...
- Patent number 11,674,976
- Issue date Jun 13, 2023
- ALCATERA INC.
- Marco Farina
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MATCHING METHOD FOR SEMICONDUCTOR TOPOGRAPHY MEASUREMENT AND PROCES...
- Publication number 20240369594
- Publication date Nov 7, 2024
- United Microelectronics Corp.
- Po-Jen HSIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY
- Publication number 20240361351
- Publication date Oct 31, 2024
- ICSPI CORP.
- David MORRIS
- G01 - MEASURING TESTING
Information Patent Application
DECOUPLED OPTICAL FORCE NANOSCOPY
- Publication number 20240345129
- Publication date Oct 17, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Yang Zhao
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20240312757
- Publication date Sep 19, 2024
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITIONING SYSTEM AND METHOD
- Publication number 20240295583
- Publication date Sep 5, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD
- Publication number 20240280605
- Publication date Aug 22, 2024
- WINBOND ELECTRONICS CORP.
- Hsueh-Cheng LIAO
- G01 - MEASURING TESTING
Information Patent Application
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...
- Publication number 20240280606
- Publication date Aug 22, 2024
- Hitachi, Ltd
- Masanari KOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE...
- Publication number 20240272197
- Publication date Aug 15, 2024
- Technische Universitat Wien
- Markus VALTINER
- G01 - MEASURING TESTING
Information Patent Application
Method of Dispositioning and Control of a Semiconductor Manufacturi...
- Publication number 20240258066
- Publication date Aug 1, 2024
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...
- Publication number 20240241151
- Publication date Jul 18, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20240230709
- Publication date Jul 11, 2024
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REMOVING DEFECT OF MASK
- Publication number 20240219826
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Yoonki HWANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...
- Publication number 20240210442
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20240175895
- Publication date May 30, 2024
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...
- Publication number 20240168053
- Publication date May 23, 2024
- Bruker Nano, Inc.
- Martin Wagner
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IM...
- Publication number 20240151742
- Publication date May 9, 2024
- UTI Limited Partnership
- Arindam PHANI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
- Publication number 20240118310
- Publication date Apr 11, 2024
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
Atomic-force Microscopy for Identification of Surfaces
- Publication number 20240012022
- Publication date Jan 11, 2024
- Trustees of Tufts College
- Igor Sokolov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20230326711
- Publication date Oct 12, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Surface Analysis Device
- Publication number 20230296644
- Publication date Sep 21, 2023
- Hitachi High-Tech Corporation
- Ritsuo FUKAYA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...
- Publication number 20230280369
- Publication date Sep 7, 2023
- attocube systems AG
- Ivan MALOVICHKO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20230251285
- Publication date Aug 10, 2023
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING

Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Detection of probabilistic process windows

Method of determining dimensions of features of a subsurface topogr...

Automated optimization of AFM light source positioning

Method for electrically examining electronic components of an integ...

Methods and systems for scanning probe sample property measurement...

System and method for generating and analyzing roughness measuremen...

Device and method for operating a bending beam in a closed control...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Coated active cantilever probes for use in topography imaging in op...

Method for referencing a near-field measurement with drift and fluc...

Modified method to fit cell elastic modulus based on Sneddon model

System for tailoring dialysis treatment based on sensed potassium c...

Vibration component measurement device, Kelvin probe force microsco...

Characterization of nanoindented and scratch induced accoustic events

Systems, method and computer-accessible medium for providing balanc...

Method for detecting mechanical and magnetic features with nanoscal...

Sample, method for manufacturing sample, and method for measuring i...

Nanoscale scanning sensors

Atomic force microscopy apparatus, methods, and applications

AFM imaging with metrology-preserving real time denoising

Atomic-force microscopy for identification of surfaces

Method and apparatus for measuring magnetic field strength

Method and apparatus for identifying sample position in atomic forc...

Method of imaging a surface using a scanning probe microscope

Device and method for analyzing a defect of a photolithographic mas...

Computerized creation of measurement plans and plan-based control o...

Method and apparatus for resolution and sensitivity enhanced atomic...

AFM imaging with creep correction

Method and apparatus for examining a measuring tip of a scanning pr...

Scanning probe microscope with a sample holder fed with electromagn...

Patents Applicationslast 30 patents

MATCHING METHOD FOR SEMICONDUCTOR TOPOGRAPHY MEASUREMENT AND PROCES...

METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY

DECOUPLED OPTICAL FORCE NANOSCOPY

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

POSITIONING SYSTEM AND METHOD

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD

DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE...

Method of Dispositioning and Control of a Semiconductor Manufacturi...

SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

METHOD OF REMOVING DEFECT OF MASK

METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...

Scanning Probe Microscope, Sample Observation Processing System, an...

TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IM...

SCANNING PROBE MICROSCOPE

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

NANOSCALE SCANNING SENSORS

Atomic-force Microscopy for Identification of Surfaces

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

Surface Analysis Device

METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...