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General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
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PHYSICS
G01
Measuring instruments
G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES
Current Industry
G01Q70/00
General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
Sub Industries
G01Q70/02
Probe holders
G01Q70/04
with compensation for temperature or vibration induced errors
G01Q70/06
Probe tip arrays
G01Q70/08
Probe characteristics
G01Q70/10
Shape or taper
G01Q70/12
Nano-tube tips
G01Q70/14
Particular materials
G01Q70/16
Probe manufacture
G01Q70/18
Functionalization
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Self-packing three-arm thermal scanning probe for micro-nano manufa...
Patent number
11,970,392
Issue date
Apr 30, 2024
Zhejiang University
Huan Hu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Debris removal from high aspect structures
Patent number
11,964,310
Issue date
Apr 23, 2024
Bruker Nano, Inc.
Tod Evan Robinson
B08 - CLEANING
Information
Patent Grant
Large radius probe
Patent number
11,953,517
Issue date
Apr 9, 2024
Bruker Nano, Inc.
Jeffrey Wong
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Cantilever, ultrasound acoustic microscopy device comprising the ca...
Patent number
11,927,564
Issue date
Mar 12, 2024
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Maarten Hubertus Van Es
G01 - MEASURING TESTING
Information
Patent Grant
Coated active cantilever probes for use in topography imaging in op...
Patent number
11,906,546
Issue date
Feb 20, 2024
Massachusetts Institute of Technology
Fangzhou Xia
G01 - MEASURING TESTING
Information
Patent Grant
Probe for scanning probe microscope and binary state scanning probe...
Patent number
11,860,188
Issue date
Jan 2, 2024
Industry-Academic Cooperation Foundation, Yonsei University
Wooyoung Shim
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale scanning sensors
Patent number
11,815,528
Issue date
Nov 14, 2023
President and Fellows of Harvard College
Michael S. Grinolds
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for a scanning probe microscope
Patent number
11,796,563
Issue date
Oct 24, 2023
Carl Zeiss SMT GmbH
Ulrich Matejka
G01 - MEASURING TESTING
Information
Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
Patent number
11,789,037
Issue date
Oct 17, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lianqing Liu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring magnetic field strength
Patent number
11,762,046
Issue date
Sep 19, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Baohua Niu
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
Patent number
11,733,186
Issue date
Aug 22, 2023
Carl Zeiss SMT GmbH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Metrology probe with built-in angle and method of fabrication thereof
Patent number
11,719,719
Issue date
Aug 8, 2023
Bruker Nano, Inc.
Jeffrey Wong
G01 - MEASURING TESTING
Information
Patent Grant
Probe cassette for holding a probe in storage for use in a scanning...
Patent number
11,709,181
Issue date
Jul 25, 2023
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Roelof Willem Herfst
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for mechanosynthesis
Patent number
11,708,384
Issue date
Jul 25, 2023
CBN Nano Technologies Inc.
Ralph C. Merkle
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Probe, method of manufacturing a probe and scanning probe microscop...
Patent number
11,698,389
Issue date
Jul 11, 2023
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Roelof Willem Herfst
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
Patent number
11,680,963
Issue date
Jun 20, 2023
Carl Zeiss SMT GmbH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Grant
Method of positioning a carrier on a flat surface, and assembly of...
Patent number
11,650,224
Issue date
May 16, 2023
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Hamed Sadeghian Marnani
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Atomic force microscopy cantilever, system and method
Patent number
11,644,481
Issue date
May 9, 2023
Nederlandse Organisatie voor toegepast-nataurwetenschappelijk onderzoek TNO
Maarten Hubertus Van Es
G01 - MEASURING TESTING
Information
Patent Grant
Initiating and monitoring the evolution of single electrons within...
Patent number
11,635,450
Issue date
Apr 25, 2023
QUANTUM SILICON INC.
Robert Wolkow
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for mechanosynthesis
Patent number
11,592,463
Issue date
Feb 28, 2023
CBN Nano Technologies Inc.
Ralph C. Merkle
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope, scan head and method
Patent number
11,592,460
Issue date
Feb 28, 2023
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Roelof Willem Herfst
G01 - MEASURING TESTING
Information
Patent Grant
Diamond probe hosting an atomic sized defect
Patent number
11,592,462
Issue date
Feb 28, 2023
President and Fellows of Harvard College
Xu Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe having micro-tip, method and apparatus for manufactu...
Patent number
11,579,169
Issue date
Feb 14, 2023
National Institute of Metrology, China
Zhen-Dong Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Probe card for characterizing processes of submicron semiconductor...
Patent number
11,579,171
Issue date
Feb 14, 2023
Meta Platforms Technologies, LLC
Christopher Percival
G02 - OPTICS
Information
Patent Grant
Debris removal in high aspect structures
Patent number
11,577,286
Issue date
Feb 14, 2023
Bruker Nano, Inc.
Tod Evan Robinson
B08 - CLEANING
Information
Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
Patent number
11,573,247
Issue date
Feb 7, 2023
Xallent INC.
Kwame Amponsah
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale scanning electrochemical microscopy electrode method
Patent number
11,543,429
Issue date
Jan 3, 2023
Morgan State University
Birol Ozturk
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Surface analysis device
Patent number
11,499,989
Issue date
Nov 15, 2022
Shimadzu Corporation
Kanji Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscope probes and methods of manufacturing probes
Patent number
11,499,990
Issue date
Nov 15, 2022
Nanosurf AG
Dominik Ziegler
G01 - MEASURING TESTING
Information
Patent Grant
Method for providing a probe device for scanning probe microscopy
Patent number
11,480,588
Issue date
Oct 25, 2022
Nanotools GmbH
Bernd Irmer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SCANNING PROBE MICROSCOPE
Publication number
20240126061
Publication date
Apr 18, 2024
Hitachi, Ltd
Masanari Koguchi
G01 - MEASURING TESTING
Information
Patent Application
OPTOMECHANICAL TRANSDUCER
Publication number
20240094240
Publication date
Mar 21, 2024
Centre National de la Recherche Scientifique
Cyprien LEMOUCHI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
NANOSCALE SCANNING SENSORS
Publication number
20240044938
Publication date
Feb 8, 2024
President and Fellows of Harvard College
Michael S. GRINOLDS
G01 - MEASURING TESTING
Information
Patent Application
CASSETTE FOR HOLDING A PROBE
Publication number
20240027491
Publication date
Jan 25, 2024
Nearfield Instruments B.V.
Hamed SADEGHIAN MARNANI
G01 - MEASURING TESTING
Information
Patent Application
SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...
Publication number
20240002220
Publication date
Jan 4, 2024
ZHEJIANG UNIVERSITY
Huan HU
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
A Method of Manufacturing a MEMS Device
Publication number
20230416080
Publication date
Dec 28, 2023
Cytosurge AG
Edin SARAJLIC
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...
Publication number
20230417795
Publication date
Dec 28, 2023
University of Central Florida Research Foundation, Inc.
Laurene Tetard
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
Publication number
20230358829
Publication date
Nov 9, 2023
Taiwan Semiconductor Manufacturing company Ltd.
Baohua NIU
G01 - MEASURING TESTING
Information
Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
Publication number
20230358782
Publication date
Nov 9, 2023
Versitech Limited
Ning Xi
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...
Publication number
20230324433
Publication date
Oct 12, 2023
PARK SYSTEMS CORP.
Ahjin JO
G01 - MEASURING TESTING
Information
Patent Application
A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...
Publication number
20230213552
Publication date
Jul 6, 2023
Nearfield Instruments B.V.
Johannes Gradus Martinus KOERS
G01 - MEASURING TESTING
Information
Patent Application
A PROBE CASSETTE AND METHOD FOR STORING, TRANSPORTING AND HANDLING...
Publication number
20230213551
Publication date
Jul 6, 2023
Nearfield Instruments B.V.
Johannes Gradus Martinus KOERS
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE (SPM) TIP
Publication number
20230204625
Publication date
Jun 29, 2023
NEXT-TIP, S.L.
Belén SANZ SANZ
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...
Publication number
20230204624
Publication date
Jun 29, 2023
Park Systems Corp.
JeongHun AN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
Publication number
20230194567
Publication date
Jun 22, 2023
Samsung Electronics Co., Ltd.
Kwangeun Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detection Device for Scanning Probe Microscope
Publication number
20230184809
Publication date
Jun 15, 2023
Vmicro
Benjamin WALTER
G01 - MEASURING TESTING
Information
Patent Application
PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...
Publication number
20230160924
Publication date
May 25, 2023
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
Roelof Willem HERFST
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
Publication number
20230143037
Publication date
May 11, 2023
Xallent Inc.
Kwame Amponsah
G01 - MEASURING TESTING
Information
Patent Application
A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...
Publication number
20230113008
Publication date
Apr 13, 2023
UNIVERSITAT BASEL
Brendan SHIELDS
C30 - CRYSTAL GROWTH
Information
Patent Application
METHOD FOR OBTAINING CHARACTERISTICS OF SURFACE TO BE MEASURED, BY...
Publication number
20230046236
Publication date
Feb 16, 2023
PARK SYSTEMS CORP.
Ahjin JO
G01 - MEASURING TESTING
Information
Patent Application
Large Radius Probe
Publication number
20230021148
Publication date
Jan 19, 2023
Bruker Nano, Inc.
Jeffrey Wong
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...
Publication number
20230019239
Publication date
Jan 19, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lianqing LIU
G01 - MEASURING TESTING
Information
Patent Application
NANOSCALE SCANNING SENSORS
Publication number
20220413007
Publication date
Dec 29, 2022
President and Fellows of Harvard College
Michael S. GRINOLDS
G01 - MEASURING TESTING
Information
Patent Application
PROBE CASSETTE FOR HOLDING A PROBE IN STORAGE FOR USE IN A SCANNING...
Publication number
20220390486
Publication date
Dec 8, 2022
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
Roelof Willem HERFST
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE
Publication number
20220357360
Publication date
Nov 10, 2022
ACTOPROBE LLC
ALEXANDER A. UKHANOV
G01 - MEASURING TESTING
Information
Patent Application
NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF
Publication number
20220349916
Publication date
Nov 3, 2022
OptiPro Systems, LLC
James Fredric Munro
G01 - MEASURING TESTING
Information
Patent Application
Probe for Scanning Probe Microscope and Binary State Scanning Probe...
Publication number
20220308086
Publication date
Sep 29, 2022
Industry-Academic Cooperation Foundation, Yonsei University
Wooyoung Shim
G01 - MEASURING TESTING
Information
Patent Application
CARBON NANOMATERIAL FUNCTIONALIZED NEEDLE TIP MODIFIED WITH LOW WOR...
Publication number
20220308087
Publication date
Sep 29, 2022
National Center for Nanoscience and Technology
Jianxun XU
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
Publication number
20220291255
Publication date
Sep 15, 2022
Carl Zeiss SMT GMBH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...
Publication number
20220244288
Publication date
Aug 4, 2022
Massachusetts Institute of Technology
Fangzhou XIA
G01 - MEASURING TESTING