1. Technical Field
This disclosure relates generally to electronic assembly. More particularly, the present disclosure relates to the assembly method of a die on a substrate or a die on another die as part of a 3D assembly (also called 3D through-silicon vias (“TSV”)) for mass reflow or reflow soldering.
2. Related Art
The dies in a die on die or 3D TSV assembly can be so thin that during the heating or a mass reflow or bonding process the die has a tendency to curl up. This is referred to in the industry as the “potato chip” effect. The “potato chip” effect leaves many bad connections between the base die and the upper die. The current solution for this problem is to use a special nozzle that will enable in situ bonding of the die at the time of placement. The problem with this solution is that often the die needs to be thermally processed before the nozzle can be removed. To accelerate this, the nozzle must be heated and must also be able to be quickly cooled. The entire placement process, therefore, of the die by the nozzle, takes a significant amount of time for each die because the nozzle must remain at the placement location in order to heat and cool the die before moving to pick up another part. Even though progress has been made, the above process of heating and cooling results in a very low placement rate. Moreover, the equipment required to perform these processes is expensive because the accuracy of placement that is required. Therefore, the equipment cost and the time cost (with tact times in the 5 to 60 seconds per die) makes this an expensive process step in a TSV assembly. Additionally, the use of local heating and cooling at the nozzle tip makes it more difficult to reach the required accuracy in the placement and attachment steps.
Thus, a die on die or 3D TSV assembly method and assembly machine compatible with a mass reflow method that alleviates or prevents many of the problems described hereinabove would be well received in the art.
According to one embodiment, a method comprises: picking up a plate with a nozzle, the plate including at least one opening to allow air to flow therethrough; picking up a die with the nozzle such that the plate is located between the nozzle and the die; placing the die and the plate onto a device, substrate, or another die such that the plate is located on top of the die; and heating the device and the die in a heat chamber while the plate remains on top of the die to permanently attach the die to the device, substrate, or another die.
According to another embodiment, a method comprises: a) picking up a combination of a plate and a die with a nozzle such that the plate is located between the die and the nozzle; b) placing the combination of the plate and the die on a device, substrate, or another die; c) repeating steps a) and b) to populate the device, substrate, or another die with a plurality of combinations of plates and die; d) heating the device, substrate, or another die and the plurality of combinations of plates and die simultaneously to attach each of the die to the device, substrate, or another die; and e) removing each of the plates from each of the die.
According to another embodiment, an assembly system comprises: an assembly machine further comprising: a nozzle configured to pick up a combination of a plate and a die such that the plate is located between the nozzle and the die, wherein the plate includes at least one opening in it to allow air to flow therethrough, and wherein the plate is picked up at a first pickup location and wherein the die is picked up at a second pickup location; and a placement location for placing the combination of the plate and the die on a device, substrate, or another die by the nozzle, wherein the nozzle is configured to populate the device, substrate, or another die with a plurality of the combinations of the plate and the die; and a heat chamber configured to heat the entire device, substrate, or another die to attach the die to the device, substrate, or another die.
Some embodiments of this invention will be described in detail, with reference to the following figures, wherein like designations denote like members, wherein:
A detailed description of the hereinafter described embodiments of the disclosed apparatus and method are presented herein by way of exemplification and not limitation with reference to the Figures.
Referring to
The sequence of the assembly may be as follows. First, a nozzle 16 is lowered on top of the clean flat plate 10, as shown in
Once the nozzle 16 has picked up the plate, then the nozzle 16 and plate 10 are lowered to the top of the die 14, as shown in
As shown in
Instead of individual heating of the individual die 14 to the device 18, the device 18 may become fully populated by a plurality of the plate and die combinations 10, 14 prior to heating. From here, the populated device 18 may be transferred by the assembly machine 100 to a heat chamber 200 (shown in
As shown in
In another embodiment shown in
It should be understood that the process described hereinabove may be repeated as necessary to add additional layers on top of the first layer of 3D TSV die 14. For example, a single die 14 may be applied as a bottom layer attached directly to the device 18. Then the device 18 may be placed through the assembly machine 100 or another assembly machine (not shown) which runs the exact same process in order to attach a second die layer (not shown) directly on top of the first die 14. This second die may be attached to the first die 14 with the same mass reflow process and using a plate to retain the shape of the die in the exact same manner as described hereinabove.
Thus, the TSV die 14 with plates 10 can be mounted in significantly higher speeds than in prior art processes and the entire fully populated wafer/substrate or device 18, with all the dies 14 and plates 10 can be attached in a mass reflow/bonding process without the risk of curling or potato chip effects on the individual dies 14. This process prevents the need to individually heat and cool the dies 14 right at the time of placement or with a specific individual heating and cooling head. This may create a significant cost reduction for the assembly process of 3D TSV. The output of a one million dollar assembly machine may, for example, be increased by a factor of 50. The above described method and assembly machine may also enable production of the same quantity and speed in a smaller clean room space.
In another embodiment, a layer of material may be attached or otherwise applied to the bottom side of the plate 10 prior to contact with the die 14. This material may either be compliant, adhesive, or provide enhanced friction to allow the plate 10 to better stick to the die 14. Materials such as high temperature silicon rubber could be used for this purpose. These materials may be even somewhat sticky to temporarily adhere to the top of the TSV die 14. These materials may be resistant to heat and may not cause permanent adhesion of the plate 10 with the die 14 and rather may simply assist in creating friction and retaining the plate 10 in the proper position above the die 14 during the movement of the device 18 in the assembly machine 100 and heat chamber 200.
In another embodiment, it may be beneficial to keep the TSV die 14 flat to have a precision ground and a highly polished surface to interface with the plate 10. This way molecular attraction can be the force to attach the plate 10 temporarily to the die 14. In addition the plates 10 may have to have pockets or recesses to prevent contact to sensitive areas or non-flat areas on the top of the die 14. For example, if a die 14 does not include a flat top surface to integrate with the plate 10, the plate 10 may be specifically designed with a surface which corresponds to the surface of the die 14.
The above described apparatus and method for attaching a die to a device may also be used for attaching a die to substrate or another die.
Elements of the embodiments have been introduced with either the articles “a” or “an.” The articles are intended to mean that there are one or more of the elements. The terms “including” and “having” and their derivatives are intended to be inclusive such that there may be additional elements other than the elements listed. The conjunction “or” when used with a list of at least two terms is intended to mean any term or combination of terms. The terms “first” and “second” are used to distinguish elements and are not used to denote a particular order.
While the invention has been described in detail in connection with only a limited number of embodiments, it should be readily understood that the invention is not limited to such disclosed embodiments. Rather, the invention can be modified to incorporate any number of variations, alterations, substitutions or equivalent arrangements not heretofore described, but which are commensurate with the spirit and scope of the invention. Additionally, while various embodiments of the invention have been described, it is to be understood that aspects of the invention may include only some of the described embodiments. Accordingly, the invention is not to be seen as limited by the foregoing description, but is only limited by the scope of the appended claims.
This application claims the benefit of U.S. Provisional Application No. 61/695,092, filed Aug. 30, 2012, entitled 3D TSV ASSEMBLY METHOD FOR MASS REFLOW.
Filing Document | Filing Date | Country | Kind |
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PCT/US2013/057289 | 8/29/2013 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
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WO2014/036257 | 3/6/2014 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
4792302 | Baker | Dec 1988 | A |
6185816 | Freund | Feb 2001 | B1 |
6279815 | Correia et al. | Aug 2001 | B1 |
6565706 | Moriuchi | May 2003 | B2 |
7034401 | Savastiouk | Apr 2006 | B2 |
7759165 | Bajaj | Jul 2010 | B1 |
7790597 | Chauhan et al. | Sep 2010 | B2 |
7969013 | Chen et al. | Apr 2011 | B2 |
20040154529 | Nogiwa et al. | Aug 2004 | A1 |
20050045914 | Agranat et al. | Mar 2005 | A1 |
20060040521 | Gordon | Feb 2006 | A1 |
20070181644 | Ueno et al. | Aug 2007 | A1 |
20090064489 | Inoue | Mar 2009 | A1 |
20090321948 | Wang et al. | Dec 2009 | A1 |
20110092030 | Or-Bach et al. | Apr 2011 | A1 |
20120012645 | Motomura | Jan 2012 | A1 |
20120070939 | Dunne et al. | Mar 2012 | A1 |
Number | Date | Country |
---|---|---|
112013004281 | May 2015 | DE |
2264113 | Dec 2010 | EP |
H07297595 | Nov 1995 | JP |
01064300 | Mar 1998 | JP |
H11017397 | Jan 1999 | JP |
11260859 | Sep 1999 | JP |
2001179671 | Jul 2001 | JP |
2006253249 | Sep 2006 | JP |
2010232414 | Oct 2010 | JP |
2010272650 | Dec 2010 | JP |
11201500364 | Aug 2017 | SG |
Entry |
---|
JP 11260859 A computer english translation. |
International Search Report and Written Opinion for PCT Application No. PCT/US13/57289, dated Feb. 7, 2014. |
Number | Date | Country | |
---|---|---|---|
20150165537 A1 | Jun 2015 | US |
Number | Date | Country | |
---|---|---|---|
61695092 | Aug 2012 | US |