The embodiments relate to the field of chip packaging, and to a chip package module, a method for manufacturing the chip package module, a power module in which the chip package module is used, and an electronic device.
As power modules such as a power supply in a package (PSIP) and a brick module power (BMP) have increasingly higher requirements on power and application frequency, a single metal-oxide-semiconductor field-effect transistor (MOSFET) chip is driven to evolve toward a small size, a low loss, and a high power density. An existing single-transistor MOSFET package includes only one bare wafer. Under a current manufacturing process, a performance improvement speed of wafers gradually cannot match a performance improvement speed of power modules. Only one bare wafer is packaged in a device, and space of a package body in a height direction is not fully used. In addition, performance of a single device fully depends on performance of the bare wafer. When a system requirement is high but performance of the bare wafer is insufficient, a performance bottleneck is formed, hindering further optimization of the power module.
A first aspect of embodiments provides a chip package module, including:
According to the chip package module in the first aspect, the first conductive connecting sheet, the conductive cover plate, and the like are used to implement electrical interconnection between the first bare die and the second bare die that are vertically laminated, and the two bare dies are packaged inside one device, so that performance of a single device is improved, and a requirement of a high-performance power supply system for a device is met to some extent.
In an implementation, a first electrode of the first bare die is electrically connected to the first conductive frame, and a second electrode of the second bare die is electrically connected to the conductive cover plate, to implement an electrical connection between the first electrode and the second electrode; and both a third electrode of the first bare die and a fourth electrode of the second bare die are electrically connected to the first conductive connecting sheet, to implement an electrical connection between the third electrode and the fourth electrode.
The vertically laminated first bare die and second bare die packaged inside one device have two pairs of electrodes that are electrically interconnected.
In an implementation, the chip package module further includes a third conductive frame and a second conductive connecting sheet, and the first conductive frame, the second conductive frame, and the third conductive frame are disposed at an interval from each other; and the second conductive connecting sheet is connected to the surface of the first bare die away from the first conductive frame, and extends to be lapped on the third conductive frame, and the second conductive connecting sheet is disposed at an interval from the first conductive connecting sheet.
In an implementation, both a fifth electrode of the first bare die and a sixth electrode of the second bare die are electrically connected to the second conductive connecting sheet, to implement an electrical connection between the fifth electrode and the sixth electrode.
The vertically laminated first bare die and second bare die packaged inside one device have three pairs of electrodes that are electrically interconnected.
In an implementation, the first electrode is a first source, the third electrode is a first drain, the fifth electrode is a first gate, the second electrode is a second source, the fourth electrode is a second drain, and the sixth electrode is a second gate; the first source, the first drain, and the first gate are electrically connected in a one-to-one correspondence to the first conductive frame, the first conductive connecting sheet, and the second conductive connecting sheet; and the second source, the second drain, and the second gate are electrically connected in a one-to-one correspondence to the conductive cover plate, the first conductive connecting sheet, and the second conductive connecting sheet.
In an implementation, the first source is connected in parallel to the second source, the first drain is connected in parallel to the second drain, and the first gate is connected in parallel to the second gate.
The first bare die and the second bare die may be MOSFET chips, and three terminals, such as the sources, the drains, and the gates, of the second bare die and the first bare die that are vertically laminated inside the single device are connected in parallel, to greatly improve device performance.
In an implementation, the first drain is electrically connected to the first conductive frame, the first gate is electrically connected to the first conductive connecting sheet, and the first source is electrically connected to the second conductive connecting sheet; and the second drain is electrically connected to the conductive cover plate, the second gate is electrically connected to the first conductive connecting sheet, and the second source is electrically connected to the second conductive connecting sheet.
In an implementation, the conductive cover plate includes a flat plate and at least one side plate that is bent and connected to the flat plate, the flat plate covers the surface of the second bare die away from the first conductive frame, and each side plate is connected between the flat plate and the first conductive frame.
The side plates are supported between the flat plate and the first conductive frame to provide support. The conductive cover plate is connected to the first conductive frame by the bent side plate, and can bear a weight of the conductive cover plate itself and a weight of a plastic package material obtained after a part of the chip package module is packaged in plastic, to relieve stress of the first bare die below to some extent.
In an implementation, each side plate is vertically connected to the flat plate.
In an implementation, the conductive cover plate includes three side plates vertically connected to the flat plate.
The conductive cover plate is connected to the first conductive frame by three vertically bent side plates, and the three side plates can bear a weight of the conductive cover plate itself and a weight of a plastic package material obtained after a part of the chip package module is packaged in plastic, to relieve stress of the first bare die below to some extent.
In an implementation, solder is disposed between the first bare die and the first conductive frame, and an electrical connection is implemented by soldering; solder is disposed in regions in which the first conductive connecting sheet is lapped on the first bare die and the second conductive frame, and the first conductive connecting sheet is electrically connected to the first bare die and the second conductive frame by soldering; solder is disposed in a region in which the second bare die is lapped on the first conductive connecting sheet, and the second bare die is electrically connected to the first conductive connecting sheet by soldering; and solder is disposed between the conductive cover plate and the second bare die, and the conductive cover plate is electrically connected to the second bare die by soldering.
A second aspect of embodiments provides a power module, including a circuit board and a chip package module located on the circuit board. The chip package module is the chip package module according to the first aspect of embodiments.
A third aspect of embodiments provides an electronic device, including a circuit board and a chip package module located on the circuit board. The chip package module is the chip package module according to the first aspect of embodiments.
A fourth aspect of embodiments provides a method for manufacturing a chip package module, including:
According to the method for manufacturing a chip package module, without challenging a device manufacturing process, performance of a single device is improved and a power density is increased through innovation of a package structure, so that a requirement of a high-performance power supply system for a device is met to some extent, and a stress condition of the device can be optimized through a special design of a conductive cover plate.
In an implementation, the manufacturing method further includes: before the second bare die is arranged, providing a third conductive frame located at an interval beside the first conductive frame; and arranging a second conductive connecting sheet, where the second conductive connecting sheet is connected to the surface of the first bare die away from the first conductive frame and extends to be lapped on the third conductive frame, and the second conductive connecting sheet is disposed at an interval from the first conductive connecting sheet.
In an implementation, the conductive cover plate includes a flat plate and at least one side plate that is bent and connected to the flat plate, the flat plate covers the surface of the second bare die away from the first conductive frame, and each side plate is connected between the flat plate and the first conductive frame.
In an implementation, each of the first bare die and the second bare die includes a plurality of electrodes, the plurality of electrodes of the first bare die include a source, a drain, and a gate, and the plurality of electrodes of the second bare die also include a source, a drain, and a gate; the source, the drain, and the gate of the first bare die are electrically connected in a one-to-one correspondence to the first conductive frame, the first conductive connecting sheet, and the second conductive connecting sheet; the source, the drain, and the gate of the second bare die are electrically connected in a one-to-one correspondence to the conductive cover plate, the first conductive connecting sheet, and the second conductive connecting sheet; and the source of the first bare die is connected in parallel to the source of the second bare die, the drain of the first bare die is connected in parallel to the drain of the second bare die, and the gate of the first bare die is connected in parallel to the gate of the second bare die.
In an implementation, the attaching a first bare die to the first conductive frame includes: arranging solder on the first conductive frame, placing the first bare die on the solder, and then electrically connecting the first bare die to the first conductive frame by soldering;
The following describes embodiments with reference to the accompanying drawings. Unless otherwise specified, a data range in the embodiments should include endpoint values.
Embodiments provide a chip package module with a novel structure. To resolve a problem that single-transistor performance cannot meet a system-level requirement due to slow wafer-level performance improvement, two bare wafers may be packaged in parallel in a single device, to reduce a single-transistor loss, improve a power density, and improve performance of a single-chip package module.
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The conductive cover plate 33 is connected to the first conductive frame 11 by the three bent side plates 333. The three side plates 333 can bear a weight of the conductive cover plate 33 itself and a weight of a plastic package material obtained after a part of the chip package module 100 is packaged in plastic, to relieve stress of the first bare die 41 below to some extent.
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In this embodiment, the first conductive frame 11, the second conductive frame 12, and the third conductive frame 13 have a same thickness. Therefore, when the first bare die 41 is disposed on the first conductive frame 11, a height of the first bare die 41 is larger than that of the second conductive frame 12 and the third conductive frame 13. The first conductive connecting sheet 31 is bent and extends from the first bare die 41 to the second conductive frame 12 to be lapped on and cover the second conductive frame 12. The second conductive connecting sheet 32 is bent and extends from the first bare die 41 to the third conductive frame 13 to be lapped on and cover the third conductive frame 13. The first conductive connecting sheet 31 and the second conductive connecting sheet 32 are spaced from each other. As shown in
The chip package module 100 may further include a plastic package layer (not shown in the figure) for packaging the conductive cover plate 33, the first bare die 41, and the second bare die 42. The conductive cover plate 33 may be included inside the plastic package layer, or may be partially exposed to air to increase a heat dissipation capability.
The first conductive connecting sheet 31, the second conductive connecting sheet 32, and the conductive cover plate 33 may be made of a same material. The material is a metal material or a solid-state conductive organic material, but is not limited thereto.
Each of the first bare die 41 and the second bare die 42 includes a plurality of electrodes (not shown in the figure). An electrode (a first electrode) of the first bare die 41 is electrically connected to the first conductive frame 11. An electrode (a second electrode) of the second bare die 42 is electrically connected to the conductive cover plate 33. The first conductive frame 11 is electrically connected to the first bare die 41. Therefore, the first pair of electrodes of the first bare die 41 and the second bare die 42 are electrically connected to the conductive cover plate 33 by the first conductive frame 11. In addition, signal transmission with an external circuit is implemented through the first conductive frame 11. Another electrode (a third electrode) of the first bare die 41 and another electrode (a fourth electrode) of the second bare die 42 are both electrically connected to the first conductive connecting sheet 31. In other words, the second pair of electrodes of the first bare die 41 and the second bare die 42 are electrically connected by the first conductive connecting sheet 31, and then are electrically connected to the first conductive connecting sheet 31 by the second conductive frame 12 to implement signal transmission with an external circuit. Still another electrode (a fifth electrode) of the first bare die 41 and still another electrode (a sixth electrode) of the second bare die 42 are both electrically connected to the second conductive connecting sheet 32. That is, the third pair of electrodes of the first bare die 41 and the second bare die 42 are electrically connected by the second conductive connecting sheet 32, and then are electrically connected to the second conductive connecting sheet 32 by the third conductive frame 13, to implement signal transmission with an external circuit.
It may be understood that the first conductive connecting sheet 31 and the second conductive frame 12 are cooperatively disposed and the second conductive connecting sheet 32 and the third conductive frame 13 are cooperatively disposed according to a quantity of pairs of electrodes that need to be electrically connected in the first bare die 41 and the second bare die 42, and may be correspondingly increased or decreased as required. For example, if only one pair of electrodes in the first bare die 41 and the second bare die 42 need to be electrically connected, the first conductive connecting sheet 31 and the second conductive frame 12 and the second conductive connecting sheet 32 and the third conductive frame 13 may both be omitted. For example, if two pairs of electrodes in the first bare die 41 and the second bare die 42 need to be electrically connected, the second conductive connecting sheet 32 and the third conductive frame 13 may be omitted.
According to the chip package modules 100 and 200 in the embodiments, the first conductive connecting sheet 31, the second conductive connecting sheet 32, and the conductive cover plate 33 are used to implement electrical interconnection between the bare dies 41 and 42 that are vertically laminated, and the two bare dies are packaged inside one device, so that performance of a single device is improved, and a requirement of a high-performance power supply system for a device is met to some extent.
In an embodiment, both the first bare die 41 and the second bare die 42 are MOSFET chips. The plurality of electrodes of the first bare die 41 include a source, a drain, and a gate, and the plurality of electrodes of the second bare die 42 also include a source, a drain, and a gate. The source, the drain, and the gate of the first bare die 41 are electrically connected in a one-to-one correspondence to the first conductive frame 11, the first conductive connecting sheet 31, and the second conductive connecting sheet 32. A specific correspondence connection relationship is not limited. For example, the source of the first bare die 41 is electrically connected to any one of the first conductive frame 11, the first conductive connecting sheet 31, and the second conductive connecting sheet 32. The drain of the first bare die 41 is electrically connected to one of the remaining two of the first conductive frame 11, the first conductive connecting sheet 31, and the second conductive connecting sheet 32. The gate of the first bare die 41 is electrically connected to the last remaining one of the first conductive frame 11, the first conductive connecting sheet 31, and the second conductive connecting sheet 32. The source, the drain, and the gate of the second bare die 42 are electrically connected in a one-to-one correspondence to the conductive cover plate 33, the first conductive connecting sheet 31, and the second conductive connecting sheet 32. A specific correspondence connection relationship is not limited. For example, the source of the second bare die 42 is electrically connected to any one of the conductive cover plate 33, the first conductive connecting sheet 31, and the second conductive connecting sheet 32. The drain of the second bare die 42 is electrically connected to one of the remaining two of the conductive cover plate 33, the first conductive connecting sheet 31, and the second conductive connecting sheet 32. The gate of the second bare die 42 is electrically connected to the last remaining one of the conductive cover plate 33, the first conductive connecting sheet 31, and the second conductive connecting sheet 32. The source of the first bare die 41 is connected in parallel to the source of the second bare die 42. The drain of the first bare die 41 is connected in parallel to the drain of the second bare die 42. The gate of the first bare die 41 is connected in parallel to the gate of the second bare die 42. The three terminals, such as the sources, the drains, and the gates, of the second bare die 42 and the first bare die 41 that are vertically laminated are connected in parallel.
In this embodiment, the first electrode of the first bare die 41 is the drain and is electrically connected to the first conductive frame 11. The third electrode of the first bare die 41 is the gate and is electrically connected to the first conductive connecting sheet 31. The fifth electrode of the first bare die 41 is the source and is electrically connected to the second conductive connecting sheet 32. However, this is not limited thereto. The second electrode of the second bare die 42 is the drain and is electrically connected to the conductive cover plate 33. The fourth electrode of the second bare die 42 is the gate and is electrically connected to the first conductive connecting sheet 31. The sixth electrode of the second bare die 42 is the source and is electrically connected to the second conductive connecting sheet 32. However, this is not limited thereto. In this case, the three terminals, such as the sources, the drains, and the gates, of the second bare die 42 and the first bare die 41 are connected in parallel.
According to the chip package modules 100 and 200 in the embodiments, the first conductive connecting sheet 31, the second conductive connecting sheet 32, and the conductive cover plate 33 are used to implement a parallel connection of the three terminals of the bare dies 41 and 42 that are vertically laminated, so that a single device has vertically laminated chips, and performance of the device is greatly improved.
It may be understood that sizes and thicknesses of the first bare die 41 and the second bare die 42, and an area of the solder 21 to be coated in the chip package module 100 may be adjusted and designed as required.
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It may be understood that, as described above, the first conductive connecting sheet 31 and the second conductive frame 12 are cooperatively disposed and the second conductive connecting sheet 32 and the third conductive frame 13 are cooperatively disposed according to a quantity of pairs of electrodes that need to be electrically connected in the first bare die 41 and the second bare die 42, and may be correspondingly increased or decreased as required.
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In this embodiment, the first conductive frame 11, the second conductive frame 12, and the third conductive frame 13 have a same thickness.
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A shape of the first conductive connecting sheet 31 needs to match shapes of the first bare die 41 and the first conductive frame 11. The first conductive connecting sheet 31 includes two flat parts 310 and a connecting part 311 connected between the two flat parts 310. The connecting part 311 is bent and extends from an end part of each flat part 310. One flat part 310 covers the first bare die 41, and the other flat part 310 covers the second conductive frame 12. Similarly, a shape of the second conductive connecting part needs to match shapes of the first bare die 41 and the second conductive frame 12. The second conductive connecting part also includes two flat parts 310 and a connecting part 311 connected between the two flat parts 310. The connecting part 311 is bent and extends from an end part of each flat part 310. One flat part 310 covers the first bare die 41, and the other flat part 310 covers the third conductive frame 13.
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According to the method for manufacturing a chip package module in the embodiments, without challenging a device manufacturing process, performance of a single device is improved and a power density is increased through innovation of a package structure, so that a requirement of a high-performance power supply system for a device is met to some extent, and a stress condition of the device can be optimized through a special design of a conductive cover plate.
It should be noted that the foregoing descriptions are merely specific implementations of embodiments, but are not intended as limiting. Any variation or replacement that may be readily figured out by a person skilled in the art shall fall within the scope of the embodiments. The implementations in the embodiments and the features in the implementations may be combined with each other without causing any conflict.
Number | Date | Country | Kind |
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202210194673.X | Mar 2022 | CN | national |
This application is a continuation of International Application No. PCT/CN2022/138513, filed on Dec. 13, 2022, which claims priority to Chinese Patent Application No. 202210194673.X, filed on Mar. 1, 2022. The disclosures of the aforementioned applications are hereby incorporated by reference in their entireties.
Number | Date | Country | |
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Parent | PCT/CN2022/138513 | Dec 2022 | WO |
Child | 18671243 | US |