The solder mask 330 is disposed on the substrate 310 and the wiring layer 320. The solder mask 330 has a first opening 332a, a second opening 332b and a chip area 334. The first opening 332a and the second opening 332b are respectively located outside two sides of the chip area 334 that are adjacent to each other. In addition, first opening 332a exposes at least part of one of the first trace 324a and the second opening 332b exposes at least part of one of the second trace 324b. In other words, the first opening 332a and the second opening 332b respectively expose parts of the wiring layer 320. Preferably, the first opening 332a may be rectangular and the second opening 332b may be rectangular, too.
The chip 400 is disposed on the substrate 310 and in the chip area 334. When the chip 400 is disposed in the chip area 334, the back of the chip 400 faces the substrate 310 and the profile of the chip 400 overlaps with the profile of the chip area 334. In such a way, the first opening 332a and the second opening 332b are respectively located outside a first side 402 and a second side 404 adjacent to each other of the chip 400.
Based on the circuit structure 500 above, the parts of the wiring layer 320 exposed by the first opening 332a and the second opening 332b, i.e. the exposed first trace 324a and the second trace 324b of the present embodiment may be used as a positioning mark. The positioning marks are used for identifying the relative location of the circuit board 300 relative to the chip 400.
The following introduces the steps of measuring the relative location of the circuit board 300 relative to the chip 400. First, one of a plurality of pads 410 on the active surface of the chip 400 is determined as a fiducial pad 410′. Then, taking the fiducial pad 410′ as the original point, the distance of the fiducial pad 410′ to the wiring layer 320 exposed by the first opening 332a is determined by a measuring device. Later, taking the fiducial pad 410′ as the original point, the distance of the fiducial pad 410′ to the wiring layer 320 exposed by the second opening 332b is determined by a measuring device. In such a way the location of the circuit board 300 relative to the chip 400 is determined in this embodiment. Once the location of the circuit board 300 relative to the chip 400 is determined, the pads 410 may be electrically connected to the first inner contacts 322a and the second inner contacts 322b through the wire bonding process.
More preferably, the relative location of the first opening 332a and the chip 400 and the relative location of the second opening 332b and the chip 400 may be adjusted so as to enhance the efficiency of measuring the relative location of the circuit board 300 relative to the chip 400.
For example, in the embodiment the location of the first opening 332a and the second opening 332b may be adjusted so that the first opening 332a is disposed along the extension of the first side 402 of the chip 400 and the second opening 332b is disposed along the extension of the second side 404 of the chip. In such a way, the fiducial pad 410′ can be taken as the original point to measure the distance of the fiducial pad 410′ to the wiring layer 320 exposed by the first opening 332a along the extension of the first side 402 as well as the distance of the fiducial pad 410′ to the wiring layer 320 exposed by the second opening 332b along the extension of the second side 404.
To sum up, because the first opening and the second opening respectively expose parts of the wiring layer, the present invention uses the exposed parts of the wiring layer as positioning marks. Compared with the prior art, the positioning marks of the present invention less likely affect the layout space of other circuits on the surface of the circuit board.
Additionally, because the first opening may be on the extension of the first side and the second opening may be on the extension of the second side, the present invention may obtain the relative location of the circuit board relative to the chip quicker compared with the prior art.
Those skilled in the art will readily observe that numerous modifications and alterations of the device and method may be made while retaining the teachings of the invention.
Number | Date | Country | Kind |
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095129189 | Aug 2006 | TW | national |