Integrated circuit package

Information

  • Patent Grant
  • 6440770
  • Patent Number
    6,440,770
  • Date Filed
    Monday, March 27, 2000
    24 years ago
  • Date Issued
    Tuesday, August 27, 2002
    22 years ago
Abstract
An integrated circuit package. The package includes a substrate that has a first internal conductive bus and a second internal conductive bus that are located on a common layer of the substrate and dedicated to different power voltage levels. The busses are coupled to external lands located on a first surface of the package by vias that extend through the substrate. The first and second busses are located on a common layer of the substrate. The package contains an integrated circuit which is mounted to a heat slug that is attached to a second surface of the package. The integrated circuit is coupled to bond fingers located on a shelf of the substrate. Some of the bond fingers are connected to the internal busses by conductive strips that wrap around the edges of the shelf. Some of the vias are connected to a whole group of external lands. Grouping the lands to a single via reduces the number of vias on the second surface of the package. The reduction in vias allows additional capacitors to be mounted to the second surface of the package.
Description




BACKGROUND OF THE INVENTION




1. Field of the Invention




The present invention relates to an integrated circuit package.




2. Description of Related Art




Integrated circuits are typically enclosed by a package that is mounted to a printed circuit board. The package has a plurality of external contacts that are solder to the printed circuit board and dedicated to the various power, ground and signal pins of the integrated circuit. The contacts may be solder balls that are attached to external conductive lands of the package. Packages with external solder balls are typically referred to as ball grid array (BGA) packages.




The packages have internal routing layers which couple the external lands to internal bond fingers that are wire bonded to the surface pads of the integrated circuit. The internal routing typically contains separate layers for a ground bus, a power bus and a plurality of signal lines. The various layers are coupled to the external lands by vias that extend through the substrate.




Some highly functional integrated circuits such as microprocessors require different power voltage levels. For example, some devices require both 5.0 volt and 3.3 volt power. The package must have two different power planes to accommodate the different voltage levels. The extra power plane requires additional layers and fabrication steps that increase the cost of the package. The multiple power busses also require additional vias that also increase the cost of manufacturing the package. It would be desirable to provide an integrated circuit package that incorporates multiple power planes without increasing the number of layers and vias of the package.




It is desirable to mount capacitors to an integrated circuit package. The capacitors can either be mounted internally within the package or on the top surface of the package. Mounting the capacitors internally occupies valuable routing space. It is therefore desirable to attach the capacitors to the top surface of the package.




Many packages incorporate a thermally conductive heat slug to facilitate the removal of heat generated by the integrated circuit. The heat slugs are typically attached to the top surface of the package and occupy space that could be utilized for the capacitors. Additionally, the capacitors are mounted to conductive land strips which must be flat to insure a rugged solder joint between the strips and the capacitors. To insure flatness, it is desirable to form the lands in an area that does not have vias. Packages of the prior art require a via for each external land. Removing a via will therefore eliminate a land and may reduce the functionality of the package. The utilization of a heat slug and vias thus limit the space available for the capacitors. It would be desirable to provide an integrated circuit package that contains an optimum number of capacitors without degrading the thermal performance and number of lands on the package.




SUMMARY OF THE INVENTION




The present invention is an integrated circuit package. The package includes a substrate that has a first internal conductive bus and a second internal conductive bus that are dedicated to different power voltage levels. The busses are coupled to external lands located on a first surface of the package by vias that extend through the substrate. The vias also couple the lands to other internal busses and signal routing lines within the package. The first and second busses are located on a common layer of the substrate.




The package contains an integrated circuit which is mounted to a heat slug that is attached to a second surface of the package. The integrated circuit is coupled to bond fingers located on a shelf of the substrate. Some of the bond fingers are connected to the internal busses by conductive strips that wrap around the edges of the shelf.




Placing some of the busses in the same plane and coupling the busses to the bond fingers with conductive strips reduces the number of layers and vias required to construct the package. The reduction in layers and vias lowers the cost of producing the package. Some of the vias are connected to a whole group of external lands. Grouping the lands to a single via reduces the number of vias on the second surface of the package. The reduction in vias allows additional capacitors to be mounted to the second surface of the package.











BRIEF DESCRIPTION OF THE DRAWINGS




The objects and advantages of the present invention will become more readily apparent to those ordinarily skilled in the art after reviewing the following detailed description and accompanying drawings, wherein:





FIG. 1

is a cross-sectional view of an integrated circuit package of the present invention;





FIG. 2

is a top perspective view of the package;





FIG. 3

is a bottom sectional view of the package;





FIG. 4

is a top cross-sectional view showing a pair of power planes of the package;





FIG. 5

is a perspective view showing a number of shelves within the package.











DETAILED DESCRIPTION OF THE INVENTION




Referring to the drawings more particularly by reference numbers,

FIGS. 1-5

show an integrated circuit package


10


of the present invention. The package


10


includes a substrate


12


that has a first surface


14


and an opposite second surface


16


. The substrate


14


is typically constructed as a multi-layered printed circuit board, although it is to be understood that the substrate can be constructed with ceramic co-fired processes.




The package


10


includes an integrated circuit


18


located within a die cavity


20


of the substrate


14


. The integrated circuit


18


may be a microprocessor or any other electrical device. The integrated circuit


18


is preferably mounted to a heat slug


22


that is attached to the second surface


16


of the substrate


12


. The heat slug


22


is typically attached to the substrate


12


with a layer of adhesive


24


and an outer solder fillet


26


.




The heat slug


22


is typically constructed from a nickel plated copper material that has a relatively high coefficient of thermal conductivity. The heat slug


22


provides a thermal path of low impedance between the integrated circuit


18


and the ambient of the package. The low thermal impedance of the heat slug


22


reduces the junction temperature of the integrated circuit


18


. The heat slug


22


may be electrically connected to the integrated circuit


18


to provide a ground plane for the package


10


. Although a heat slug


22


is shown and described, it is to be understood that the integrated circuit


18


may be mounted directly to the substrate


12


.




The heat slug


22


preferably has an octagonal shape that has chamfered corners. The chamfered corners increase the amount of usable surface area on the second surface


16


. The package


10


may have a plurality of capacitors


28


mounted to land strips


30


located on the second surface


16


of the substrate


12


. Although capacitors are shown and described, it is to be understood that any passive or active device can be mounted to the second surface


16


.




The package


10


also has a plurality of vias


32


that extend from the second surface


16


to the first surface


14


of the substrate


12


. The vias


32


couple the integrated circuit


18


and capacitors


28


to a plurality of lands


34


located on the first surface


14


shown in FIG.


3


. The lands


34


are typically connected to an external printed circuit board (not shown) by a plurality of solder balls


36


. The solder balls


36


are initially attached to the lands


34


to provide a ball grid array (BGA) package. Although a BGA package is shown and described, it is to be understood that the package may have other external contacts such as pins or solder columns.




To provide a rugged solder joint it is desirable to construct flat land strips


30


for the capacitors


28


. Therefore, in the preferred embodiment there are no vias


32


located within the strips


30


. As shown in

FIG. 3

, most of the lands


34


are coupled to a corresponding dedicated via


32


. To eliminate vias and provide additional space on the second surface


16


, one or more vias


32


may be connected to a group of lands


34




g


so that each land


34


does not require a separate dedicated via


32


that interferes with the land strips


30


of the capacitors


28


. The land strips


30


of the second surface


16


are located above the lands


34


of the first surface


14


that are connected to the same single via


32


. The group of lands


34




g


are typically connected to a power or ground bus of the package. The present invention provides additional space for mounting capacitors


28


without reducing the number of lands


34


on the package


10


.




As shown in

FIGS. 1 and 5

, the package


10


has a plurality of bond fingers


40


located on bond shelves


42


,


44


and


46


formed in the substrate


12


. The bond fingers


40


are coupled to corresponding surface pads


48


of the integrated circuit


18


by bond wires


50


. Although bond wires


50


are shown and described, it is to be understood that the integrated circuit


18


may be coupled to the bond fingers


40


by other means such as tape automated bonding (TAB) tape.




The substrate


12


has a plurality of internal routing layers


52


,


54


,


56


,


58


,


60


,


62


and


64


that are connected to the vias


32


. The routing layers and vias couple the bond fingers


40


to the external lands


34


of the package


10


. As shown in

FIG. 5

, some of the bond fingers


40


have traces


66


that extend to the vias


32


or an internal conductive bus of the package. Some of the bond fingers


40


are connected to the conductive busses by conductive strips


68


that wrap around the edges


70


of the shelves. The wrap around strips


68


reduce the number of layers and vias required to construct the package


10


. Additionally, the wrap around strips


68


reduce the inductive path to the conductive busses and the overall impedance of the package.





FIG. 4

shows a layer of the substrate


12


which has a pair of conductive busses


72


and


74


. The conductive busses


72


and


74


are separated by a dielectric space


76


to electrically isolate the busses. The busses


72


and


74


are typically dedicated to two different voltage potentials. Some of the vias


32


are connected to the conductive busses


72


and


74


to route the busses to the external lands


34


. The remaining vias


32


are dedicated to other signals, power and ground busses within the package


10


. The remaining vias


32


have outer rings


78


of dielectric spacing to isolate the vias from the conductive busses


72


and


74


. The second bus


74


has a conductive strip


80


that extends around the entire die opening


20


so that the bus


74


can be connected by wrap around strips to any location on the shelves.




The integrated circuit


18


may be a microprocessor which requires power for the processor core and a separate power bus for the input/output (I/O) of the device. Referring to

FIG. 1

, in the preferred embodiment, the first layer


52


preferably has a first conductive bus dedicated to VSS of the device I/O. The VSS bus is coupled to the bond fingers


40


and external lands


34


by the vias


32


. The second layer


54


preferably contains a plurality of signal lines that are coupled to the bond fingers


40


by the traces


66


and to the external lands


34


by vias


32


. The third layer


56


preferably includes the split bus pattern shown in FIG.


4


. The busses are coupled to the VSS and VCC busses of the device I/O. The VCC bus is coupled to bond fingers


40


on the first shelf


42


by wrap around strips


68


.




The fourth layer


58


preferably has a plurality of signal lines that are connected to the bond fingers


40


by traces


66


and to the external lands


34


by vias


32


. The fifth layer


60


preferably includes the split bus shown in FIG.


4


. The busses are coupled to the VCC and VSS busses of the device I/O. The VSS bus is coupled to the bond fingers


40


of the second shelf


44


by wrap around strips


68


. The sixth layer


62


preferably contains a conductive bus that is coupled to bond fingers


66


on the third shelf


46


. The conductive bus is dedicated to the VCC bus of the device core. The seventh layer


64


preferably has a conductive bus that is dedicated to the VSS bus of the device core. The VSS bus is coupled to bond fingers


66


on the third shelf


46


by a wrap around strip


68


. The second surface


16


of the substrate


12


may have metallization to electrically couple the heat slug


22


to a ground bus of the package. The die cavity


20


is typically filled with a plastic encapsulant


82


to enclose the integrated circuit


18


.




The package


10


can be assembled by initially fabricating the substrate


12


. The substrate


12


is assembled by etching the bus and signal layers on individual single-sided or double-sided substrates. The conductive strips


68


are then plated onto the edges of the shelves. The strips


68


are typically plated in electrolytic and electrolysis bathes. The individual etched boards are then bonded together to form the substrate


12


. The bond fingers


40


are then plated with gold.




The package


10


of the present allows plating without a separate plating bar by utilizing the vias


32


and a layer of metallization located on the second surface


16


. The metallization layer typically shorts the vias


32


of the substrate


12


. A voltage source (not shown) can be connected to the bond fingers


40


and metallization layer to plate the substrate


12


. The metallization layer is then etched off of the second surface


16


after the plating process. Eliminating the plating bar reduces the fabrication steps of the substrate


12


and the impedance of the package


10


.




After the substrate


12


is fabricated, the heat slug


22


is mounted to the second surface


16


. The capacitors


28


may also be soldered to the land strips


30


. The integrated circuit


18


is mounted to the heat slug


22


and wire bonded to the bond fingers


40


. The die cavity


20


is then filled with the encapsulant


82


to enclose the integrated circuit


18


. The solder balls


36


can then be attached to the lands


34


.




While certain exemplary embodiments have been described and shown in the accompanying drawings, it is to be understood that such embodiments are merely illustrative of and not restrictive on the broad invention, and that this invention not be limited to the specific constructions and arrangements shown and described, since various other modifications may occur to those ordinarily skilled in the art.



Claims
  • 1. A method for assembling an integrated circuit package, comprising:a) providing a substrate which has a bond finger located on a bond shelf that has an edge, a first conductive bus, and a second conductive bus that is located on a common plane within said substrate as said first conductive bus; and, b) forming a conductive strip that wraps around said edge of said bond shelf and connects said bond finger to said second conductive bus.
  • 2. The method as recited in claim 1, further comprisingattaching an integrated circuit to said substrate and coupling said integrated circuit to said bond finger.
  • 3. The method as recited in claim 2, further comprisingattaching a contact to a land that is located on a first surface of said substrate and coupled to said bond finger.
  • 4. The method as recited in claim 3, further comprisingmounting an electrical device on a second surface of said substrate.
  • 5. A method for assembling an integrated circuit package, comprising:a) providing a substrate that has a first surface and an opposite second surface, said substrate having a plurality of external contacts that are located on said first surface and connected to a single via that extends through said substrate, said substrate further having a land strip including a plurality of lands that are located on said second surface and connected together to said single via; and, b) mounting an electrical device to said land strip.
  • 6. The method as recited in claim 5, further comprisingattaching an integrated circuit to said substrate and coupling said integrated circuit to a bond finger that is located on a shelf of said substrate and coupled to said external contacts.
  • 7. The method as recited in claim 6, further comprisingattaching a plurality of solder balls to a plurality of lands.
  • 8. A method for plating a bond finger that is located on a substrate of an integrated circuit package which has a via that is coupled to the bond finger, comprising:a) creating an electrical connection with the bond finger; b) creating an electrical connection with the via; c) providing a voltage across the via and the bond finger; and, d) placing the bond finger within an electrolytic plating bath.
  • 9. A method for assembling an integrated circuit package, comprising:providing a plurality of boards with a metal layer etching the metal layer of each of the plurality of boards to form bus and signal layers including bond fingers; plating conductive strips onto edges of the plurality of boards; and bonding the plurality of boards together to form a substrate having shelves, at least one of the conductive strips wraps around an edge of one of the plurality of boards for coupling to one of the bond fingers.
  • 10. The method as recited in claim 9, further comprisingattaching an integrated circuit to the substrate and electrically coupling the integrated circuit to at least one bond finger.
  • 11. The method as recited in claim 10, whereinthe electrical coupling of the integrated circuit to the at least one bond finger is by means of a bond wire.
  • 12. The method as recited in claim 9, further comprisingplating the bond fingers with gold.
CROSS REFERENCE TO RELATED APPLICATION

This application is a continuation of application Ser. No. 08/709,728, filed Sep. 9, 1996, now U.S. Pat. No. 6,043,559.

US Referenced Citations (56)
Number Name Date Kind
3388457 Totta Jun 1968 A
4420767 Hodge et al. Dec 1983 A
4608592 Miyamoto Aug 1986 A
4819041 Redmond Apr 1989 A
4891687 Mallik et al. Jan 1990 A
4899118 Polinski, Sr. Feb 1990 A
4951098 Albergo et al. Aug 1990 A
5130889 Hamburgen et al. Jul 1992 A
5191511 Sawaya Mar 1993 A
5218515 Bernhardt Jun 1993 A
5235211 Hamburgen Aug 1993 A
5285352 Pastore et al. Feb 1994 A
5291062 Higgins, III Mar 1994 A
5355283 Marrs et al. Oct 1994 A
5357672 Newman Oct 1994 A
5371403 Huang et al. Dec 1994 A
5400220 Swamy Mar 1995 A
5442852 Danner Aug 1995 A
5468999 Lin et al. Nov 1995 A
5473196 De Givry Dec 1995 A
5488257 Bhattacharyya et al. Jan 1996 A
5490324 Newman Feb 1996 A
5491362 Hamzehdoost et al. Feb 1996 A
5497031 Kozono Mar 1996 A
5530287 Currie et al. Jun 1996 A
5548161 Hirano et al. Aug 1996 A
5557502 Banerjee et al. Sep 1996 A
5569955 Chillara et al. Oct 1996 A
5591941 Acocella et al. Jan 1997 A
5604383 Matsuzaki Feb 1997 A
5608261 Bhattacharyya et al. Mar 1997 A
5615089 Yoneda et al. Mar 1997 A
5625166 Natarajan Apr 1997 A
5640048 Selna Jun 1997 A
5652463 Weber et al. Jul 1997 A
5666004 Bhattacharyya et al. Sep 1997 A
5672909 Glenn et al. Sep 1997 A
5672911 Patil et al. Sep 1997 A
5679977 Khandros et al. Oct 1997 A
5686764 Fulcher Nov 1997 A
5689091 Hamzehdoost et al. Nov 1997 A
5691041 Frankeny et al. Nov 1997 A
5691568 Chou et al. Nov 1997 A
5724232 Bhatt et al. Mar 1998 A
5726860 Mozdzen Mar 1998 A
5753976 Harvey May 1998 A
5767575 Lan et al. Jun 1998 A
5777265 Bhattacharyya et al. Jul 1998 A
5787575 Banerjee et al. Aug 1998 A
5796170 Marcantonio Aug 1998 A
5796589 Barrow Aug 1998 A
5801450 Barrow Sep 1998 A
5847936 Forehand et al. Dec 1998 A
5880529 Barrow Mar 1999 A
6020631 Mozdzen Feb 2000 A
6031283 Banerjee et al. Feb 2000 A
Foreign Referenced Citations (3)
Number Date Country
4314910 May 1993 DE
5-343605 Dec 1993 JP
9425984 Apr 1994 WO
Non-Patent Literature Citations (1)
Entry
US 5,719,439, 02/1998, Iwasaki et al. (withdrawn)
Continuations (1)
Number Date Country
Parent 08/709728 Sep 1996 US
Child 09/535571 US