The present invention relates to a multilayer printed circuit board and a method of manufacturing the same, and particularly relates to a multilayer printed circuit board and a method of manufacturing the same, in which a multilayered wiring layer is stacked on both an upper surface and a lower surface of a core layer.
Recent electronic devices offer higher performances and are smaller in size than before, and the significance of heat dissipation has been elevated by an increase in the capacities of components mounted on a mounting board and by an increase in the density of the mounting board itself. For this reason, for example, a board including a core layer having excellent heat release performance and uniform heat distribution is used (refer to Patent Document 1, for example).
The configuration of a board 100 including a core layer is described referring to the sectional view in
The core layer 111 is a plate-shaped body made of metal such as copper or aluminum and having a thickness of about 100 μm to 200 μm. The core layer 111 provides the overall mechanical strength of the board 100 and functions to improve heat release through the board 100. Accordingly, heat released from a circuit element, such as a transistor, mounted on an upper surface of the board 100 is dissipated well to the outside through the core layer 111.
The first wiring layer 116A and the second wiring layer 116B are formed by patterning copper foil or the like into predetermined shapes, and are isolated from the core layer by the insulating layers made of a resin.
The first wiring layer 116A and the second wiring layer 116B are electrically connected to each other via the inside of a through-hole 121 provided to penetrate the core layer 111. Specifically, first, the through-hole 121 is formed by partially removing the core layer 111. Then, the through-hole 121 is filled with a resin material forming the first resin layer 114A and the second resin layer 116B, and a connection portion 125 is formed by further penetrating this filling resin material. Through the connection portion 125, the first wiring layer 116A formed on the upper surface of the core layer 111 is electrically connected to the second wiring layer 116B formed on the lower surface of the core layer 111.
However, a diameter L10 of the above-described through-hole 121 provided in the board 100 is about 0.4 mm for example, and the width of the connection portion 125 arranged inside the through-hole 121 is about 0.1 mm for example. It is difficult to further reduce the sizes of the through-hole 121 and the connection portion 125 because they are formed through wet etching, laser irradiation, and plating.
For this reason, even when the first wiring layer 116A and the second wiring layer 116B are formed with a fine line width of about 50 μm to 100 μm, a further reduction in the overall size of the board 100 is difficult since the through-hole 121 and the connection portion 125 occupy a large area of the board 100.
In addition to this problem, to connect the first wiring layer 116A and the second wiring layer 116B at multiple connection locations, the through-hole 121 and the connection portion 125 have to be formed for each of these connection locations. In such a case, a size reduction of the board 100 is even more difficult.
The present invention has been made in consideration of the above problems, and a main objective of the present invention is to provide a board having a configuration in which wiring layers staked on an upper surface and a lower surface of a core layer, respectively, are connected to each other by simple means, and to provide a manufacturing method thereof.
A board of the present invention comprises: a core layer having a first main surface and a second main surface; a first wiring layer stacked on the first main surface of the core layer with a first insulating layer interposed therebetween; a second wiring layer stacked on the second main surface of the core layer with a second insulating layer interposed therebetween; a removed area provided to penetrate part of the core layer; a connection board being arranged in the removed area and including a plurality of layers of wiring patterns, the connection board functioning as a path connecting the first wiring layer and the second wiring layer, wherein a first wiring pattern of the connection board located at the first main surface side of the core layer is connected to the first wiring layer via a first connection portion provided to penetrate the first insulating layer, and a second wiring pattern of the connection board located at the second main surface side of the core layer is connected to the second wiring layer via a second connection portion provided to penetrate the second insulating layer.
A method of manufacturing a board of the present invention comprises the steps of: preparing a core layer having a first main surface, a second main surface, and a removed area provided to penetrate part of the core layer; arranging a connection board in the removed area of the core layer, the connection board having a first wiring pattern provided at the first main surface side and a second wiring pattern provided at the second main surface side; and stacking a first wiring layer on the first main surface of the core layer with a first insulating layer interposed therebetween, stacking a second wiring layer on the second main surface of the core layer with a second insulating layer interposed therebetween, and electrically connecting the first wiring layer to the second wiring layer via the connection board.
According to the present invention, a removed area is provided by partially removing a core layer, and via a connection board arranged in this removed area, a first wiring layer stacked on an upper surface of the core layer is electrically connected to a second wiring layer stacked on a lower surface of the core layer. Accordingly, there is no need for providing a through-hole in the core layer for each of locations where the wiring layers are to be connected to each other. This reduces the overall area occupied by connection means that connects the wiring layers to each other, and thereby improves high wiring density of the board.
Further, multilayered wiring patterns provided in the connection board are formed finer than the wiring layers stacked on the core layer. For this reason, part of an electric circuit configured by the wiring layers stacked on the core layer in the prior art can be instead configured by the wiring patterns included in the connection board 13. This contributes to a further size reduction of the board.
Furthermore, a manufacturing cost for the board is reduced because steps required for providing connection means that penetrate the core layer, such as a laser irradiation step and a plated-film formation step, are unnecessary in the manufacturing method.
Referring to
Referring to
Although multilayered wiring having a total of four layers is formed on the upper and lower main surfaces of the core layer 11 here, the number of the wiring layers to be stacked is not limited to four layers. Two wiring layers or six or more wiring layers may be formed.
The core layer 11 functions as a layer configured to enhance the mechanical strength of the board 10A and to improve the heat release performance of the board 10A. The core layer 11 is formed thicker than the wiring layers, and has a thickness of for example, 100 μm to 200 μm. A material usable for the core layer 11 is metal containing copper as its main component, metal containing aluminum as its main component, an alloy, or the like. In addition, as a material for the core layer 11, use of rolled metal, such as rolled copper foil, can further improve the mechanical strength and the heat release performance of the core layer 11.
If aluminum is used as a material for the core layer 11, the upper and lower surfaces of the core layer 11 may be coated with an alumite film formed by oxidizing aluminum. Like Cu, Al easily bends if its thickness is small. For this reason, if the Al layer is provided with a hard layer mainly formed of aluminum oxide and therefore made of the same material as the Al layer, the Al layer can be resistant to bending. Consequently, provision of the hard layer offers resistance against deformation, and therefore allows the board 10A itself to be maintained to be flat.
Further, the core layer 11 may be used as a signal pattern through which electrical signals inputted to and outputted from each of the wiring layers pass, or as a pattern for extracting a fixed potential (e.g., a power supply potential or a ground potential) at a predetermined location.
Here, a material other than metal can be used as the material for the core layer 11, and an inorganic material, such as ceramic, or a resin material, such as a glass epoxy substrate, can also be used.
A first insulating layer 14A and a second insulating layer 14B cover the upper surface and the lower surface of the core layer 11, respectively. The thickness of each of the first insulating layer 14A and the second insulating layer 14B covering the core layer 11 is, for example, 50 μm to 100 μm. A material usable for the first insulating layer 14A and the second insulating layer 14B is a thermosetting resin, such as an epoxy resin, or a thermoplastic resin, such as a polyethylene resin.
The heat resistance of the first insulating layer 14A and the second insulating layer 14B is decreased by using, for these insulating layers, a resin material filled with a fibrous or particulate filler. Moreover, by mixing a filler into the first insulating layer 14A and the second insulating layer 14B, the coefficient of thermal expansion of these insulating layers comes closer to that of the core layer 11 made of metal, preventing a warp of the board caused when the board experiences a thermal change. A material usable for the filler is alumina, silicon oxide, or a silicon nitride.
The first wiring layer 16A is a wiring layer formed on an upper surface of the first insulating layer 14A, and is formed by selectively etching a conductive film or a plated film attached to the first insulating layer 14A. The L/S of the first wiring layer 16A can be as fine as 50 μm/50 μm to 100 μm/100 μm, for example.
Here, L/S indicates the fineness of the wiring. When the L/S is 20 μm/20 μm, the width (L: line) of each wiring line is 20 μm and the distance (S: space) between the wiring lines is 20 μm.
The first wiring layer 16A is electrically connected to the core layer 11 via connection portions 31 provided to penetrate the first insulating layer 14A. Such configuration allows the core layer 11 to be used as a layer for routing the ground potential.
The second wiring layer 16B is a wiring layer formed on a lower surface of the second insulating layer 14B, and has the same configuration as the first wiring layer 16A described above. Further, the second wiring layer 16B is electrically connected to the lower surface of the core layer 11 via connection portions 33 provided to penetrate the second insulating layer 14B.
The connection portions 31 and the connection portions 33 are made of a conductive material, such as a plated film or a conductive paste, formed in through-holes which are provided by removing the insulating layers, and function to connect the corresponding wiring layers to the core layer 11. Here, the first wiring layer 16A and the core layer 11 are connected to each other via the connection portions 31 provided to penetrate the first insulating layer 14A, and the second wiring layer 16B and the core layer 11 are connected to each other via the connection portions 33 provided to penetrate the second insulating layer 14B.
The connection portions may function as paths through which electrical signals pass, or may be so-called dummy paths through which no electrical signal pass. Even when the connection portions 31 and the like are ones that do not allow electrical signals to pass therethrough, they can still be used as thermal via holes through which heat passes.
The third wiring layer 16C is stacked on the upper surface of the first wiring layer 16A with a third insulating layer 14C interposed therebetween. The details of the first insulating layer 14A and the third wiring layer are the same as those of the first insulating layer 14A and the first wiring layer 16A descried above. The third wiring layer 16C and the first wiring layer 16A are electrically connected to each other at predetermined locations via connection portions 27 penetrating the third insulating layer 14C.
Circuit elements such as an IC are connected to the third wiring layer 16C being the uppermost wiring layer. The upper surfaces of the third wiring layer 16C and the third insulating layer 14C may be covered with a solder resist, except for the portions of the third wiring layer 16C which are to be connected with the circuit elements. Such configuration prevents solder used in mounting of the elements from being attached to the third wiring layer 16C, which in turn prevents a short circuit between the wiring lines occurring in the mounting step.
The fourth wiring layer 16D is formed on a lower surface of the second wiring layer 16B with a fourth insulating layer 14D interposed therebetween. The details of the fourth insulating layer 14D and the fourth wiring layer 16D are the same as those of the second insulating layer 14B and the second wiring layer 16B described above. The second wiring layer 16B and the fourth wiring layer 16D are electrically connected to each other via connection portions 28 formed to penetrate the fourth insulating layer 14D. An external connection electrode, such as a solder ball, may be formed on the fourth wiring layer 16D being the lowermost layer. Further, the lower surfaces of the fourth wiring layer 16D and the fourth insulating layer 14D may be covered with a solder resist, except for the portion of the fourth insulating layer 14D which is to be the connection location.
The connection board 13 is a multilayer board housed in the removed area 12 which is provided by partially removing the core layer 11, and functions as connection means that connects the wiring layers stacked on the upper surface of the core layer 11 to the wiring layers stacked on the lower surface of the core layer 11.
Specifically, the connection board 13 includes multilayered wiring patterns stacked with insulating materials such as a glass epoxy resin and ceramic interposed. Namely, the connection board 13 is provided with, from up to down, a first wiring pattern 15A, a second wiring pattern 15B, a third wiring pattern 15C, and a fourth wiring pattern 15D. These wiring patterns are connected to each other at predetermined locations by penetrating the insulating materials.
The connection board 13 has the same thickness as the core layer 11, and is 100 μm to 200 μm thick, for example. Referring to
Here, the thickness of the connection board 13 may be thinner or thicker than the core layer 11. In this case, if a sheet-shaped resin material is used as a material for the first insulating layer 14A and the second insulating layer 14B, steps might be formed in these insulating layers due to the difference in thickness between the core layer 11 and the connection board 13. However, such formation of the steps is mitigated by applying a liquid resin material as the material for the first insulating layer 14A and the second insulating layer 14B.
Moreover, although only one connection board 13 is shown here, multiple removed areas 12 may be provided to the core layer 11 when necessary, to arrange the connection board 13 in each of these removed areas 12. Alternatively, a relatively large removed area 12 may be formed, and multiple connection boards 13 may be arranged inside this removed area 12.
Furthermore, by forming a wiring pattern of a predetermined shape inside the connection board 13, a capacitor and a coil may be formed. Moreover, a coil, a capacitor, and a resistor may be embedded in the connection board 13, or they may be embedded in the removed area 12 along with the connection board 13 and be connected to each of the wiring layers. With such configuration, the functions of the elements which are, in the prior art, arranged on the upper surface of the board 10A are embedded in the removed area 12 of the core layer 11. Consequently, a circuit device including the board 10A can be reduced in size.
In addition, if a ceramic board is used as the connection board 13, a capacitor and a resistor can easily be provided inside or on a surface of the ceramic board by calcining a conductive material. A board made of ceramic is advantageous over a board made of other materials, because of its performance in high-frequency regions and its high pressure resistance.
The first wiring pattern 15A and the like provided in the connection board 13 are formed finer than the first wiring layer 16A and the like stacked on the core layer 11. The L/S of the first wiring pattern 15A and the like is 30 μm/30 μm or less, for example. By forming such fine conductive patterns in the connection board 13, a part of an electric circuit which is, in the prior art, formed by the wiring layers stacked on the core layer can be formed by the connection board 13. As a result, a circuit part implemented by the first wiring layer 16A to the fourth wiring layer 16D stacked on the core layer 11 is small in size, allowing a size reduction of the board 10A itself.
The first wiring layer 16A and the second wiring layer 16B stacked on the core layer 11 are electrically connected to each other via the connection board 13 having the above configuration. Specifically, the first wiring pattern 15A formed on an upper surface of the connection board 13 is connected to the first wiring layer 16A via the connection portions 31 provided to penetrate the first insulating layer 14A. Further, the fourth wiring pattern 15D provided as the lowermost layer of the connection board 13 is connected to the second wiring layer 16B via the connection portions 33 provided to penetrate the second insulating layer 14B. With such configuration, the first wiring layer 16A located on the upper surface of the core layer 11 is connected to the second wiring layer 16B located on the lower surface of the core layer 11, via the connection board 13.
Note that the first wiring pattern 15A of the connection board 13 and the first wiring layer 16A are connected to each other via the multiple connection portions 31, and that the fourth wiring pattern 15D of the connection board 13 and the second wiring layer 16B are also connected to each other via the multiple connection portions 33. With such configuration, the connection locations at which the wiring layer stacked on the upper surface of the core layer 11 is connected to the wiring layer stacked on the lower surface of the core layer 11 can be concentrated in the connection board 13. As a result, there is no need to provide multiple connection holes shown in the prior art, and therefore the overall size of the board can be reduced. In the above case, the first wiring layer 16A and the second wiring layer 16B that are internally arranged include wiring for routing the connection locations described above.
The wiring patterns of the connection board 13 can also be connected to the third wiring layer 16C or the fourth wiring layer 16D. When the connection board 13 is to be connected to the third wiring layer 16C, the first wiring pattern 15A of the connection board 13 is connected to the third wiring layer 16C by penetrating the first insulating layer 14A and the third insulating layer 14C. Moreover, when the connection board 13 is to be connected to the fourth wiring layer 16D, the fourth wiring pattern 15D of the connection board 13 is connected to the fourth wiring layer 16D by penetrating the second insulating layer 14B and the fourth insulating layer 14D.
In the present embodiment, as described above, the wiring layers stacked at the upper surface of the core layer 11 is connected to the wiring layers stacked at the lower surface of the core layer 11 via the connection board 13 housed in the removed area 12 of the core layer 11. Accordingly, compared with the prior art in which a through-hole is provided to the core layer 11 for each connection portion, an area occupied by the connection portions connecting the upper wiring layers and the lower wiring layers can be reduced. For this reason, the overall size of the board 10A can be reduced.
Further, as described above, the connection board 13 not only functions as connection means, but also can house therein functional elements such as a coil to form a circuit. This contributes to further size reduction and performance enhancement of the board 10A as a whole.
Referring to
In this configuration, when the connection board 13 is to be connected to a first wiring layer 16A, first, a through-hole is formed by performing laser irradiation to remove the first insulating layer 14A and an insulating material of the connection board 13 under the first insulating layer 14A. Then, a conductive material is embedded in this through-hole to form a connection portion 31. Through this connection portion 31, a second wiring pattern 15B embedded in the connection board 13 is connected to the first wiring layer 16A.
The lower surface of the connection board 13 has such a configuration, too. Specifically, referring to
Referring to
The basic configuration of a board 10B shown in
When a typical board made of a glass epoxy resin is used as the core layer 11, the L/S of the wiring layers provided to the core layer 11 is in a range of for example, 50 μm/50 μm to 100 μm/100 μm, which is larger than that of the wiring patterns provided to a connection board 13.
The board 10B is formed of a multilayered board as the core layer, such as a printed board or a ceramic board, made of a resin material such as a glass epoxy resin, and therefore can have a more complicated circuit configuration.
In a board 10C shown in
Further, elements such as a transistor are formed inside the connection board 13, which is a semiconductor board, through a diffusion process, and pads on the upper surface of the connection board 13 that are connected to the elements are connected to the first wiring layer 16A via connection portions 31B and 31C. Heat generated by operation of the transistor and the like provided inside the connection board 13 is dissipated well to the outside through the core layer 11. Here, the pads connected to the diffused regions may be provided on the lower surface of the connection board 13 to connect the pads to the second wiring layer 16B through a connection portion 33.
When a semiconductor board having elements such as a transistor embedded therein is used as the connection board 13 as described above, the board 10C can be provided with more functions.
In
Note that the upper surface of the board 10A may be coated with a resin material such as a glass epoxy resin so as to seal the semiconductor elements. Moreover, the board 10B shown in
Referring to
The basic configuration of the board 10D is similar to that of the board 10A shown in
Here, multiple removed areas 12A, 12B, 12C, and 12D are provided by partially removing the core layer 11, and functional elements such as a connection board 13 are housed in these removed areas, respectively.
Specifically, the connection board 13 is housed in the removed area 12A, a chip element 38 in the removed area 12B, a semiconductor element 40 in removed area 12C, and a heat spreader 42 in the removed area 12D. A space between the removed area 12A and the connection board 13 is filled with part of each of insulating layers, and the other removed areas also have such a configuration.
An element having electrodes at its both ends is used as the chip element 38, and is a chip capacitor or a chip resistor, for example. These electrodes are connected to a wiring layer via connection portions. Although the electrodes of the chip element 38 are connected to a first wiring layer 16A via connection portions 31 here, they may be connected to a second wiring layer 16B being a lower layer via connection portions 33.
The semiconductor element 40 is an LSI having many pads on its upper surface, and is arranged with its main surface, having these pads, facing up. The pads arranged on the upper surface of the semiconductor element 40 are connected to the first wiring layer 16A through the corresponding connection portions 31 penetrating a first insulating layer 14A. Further, the second wiring layer 16B, connection portions 28, and a fourth wiring layer 16D are arranged below the semiconductor element 40, and heat generated by the semiconductor element 40 is dissipated well to the outside through them. Here, pads may be provided on the lower surface of the semiconductor element 40 so as to be electrically connected to the second wiring layer 16B via the connection portions 33.
The heat spreader 42 is made of metal having for example copper or aluminum as its main component and having an excellent thermal conductivity, and functions as means that dissipates heat well to the outside, the heat being generated by the circuit elements arranged on the upper surface of the board 10D. The upper surface of the heat spreader 42 is connected to the first wiring layer 16A and a third wiring layer 16C via the connection portions 31 and connection portions 27. Further, the lower surface of the heat spreader 42 is connected to the second wiring layer 16B and the fourth wiring layer 16D via the connection portions 33 and the connection portions 28. Here, a current does not pass through the connection portions with which the heat spreader 42 is connected, but these connection portions function as thermal via holes through which passes heat generated by the circuit elements mounted on the upper surface.
A method of manufacturing the board 10D having the above-described configuration is basically the same a method of manufacturing the board 10A, which will be described later with reference to
In the board 10D, the connection portions connecting the wiring layers on the upper surface of the core layer 11 to the wiring layers on the lower surface of the core layer 11 are concentrated in the connection board 13. Thereby, the connection portions which are discretely arranged in the prior art are concentrated in one location. Consequently, the multiple removed areas 12B to 12D can be provided at areas other than a location where the connection board 13 is to be arranged, and the functional elements such as the semiconductor 40 can be embedded in these removed areas 12B to 12D.
Thus, the board 10D on which to mount circuit elements such as a transistor can have various functions in itself, so that a circuit device employing this board 10D can be highly-functional and small in size.
A method of manufacturing the above-described board 10A is described with reference to the sectional views shown in
Referring to
Referring to
Specifically, first, the connection board 13 including multilayered wiring patterns is embedded in the removed area 12. Here, the connection board 13 is connection means which connects wiring layers stacked on the upper surface of the core layer 11 to wiring layers stacked on a lower surface of the core layer 11. In the connection board 13, multiple wiring patterns are stacked with an insulating layer interposed therebetween, and these wiring patterns are formed finer than the wiring layers stacked on the core layer 11.
Next, a conductive film is stacked on each of upper and lower main surfaces of the core layer 11 with an insulating layer interposed therebetween. Specifically, a first conductive film 20 is stacked on the upper surface of the core layer 11 with a first insulating layer 14A interposed therebetween. In addition, a second conductive film 22 is stacked on the lower surface of the core layer 11 with a second insulating layer 14B interposed therebetween. The first insulating layer 14A and the second insulating layer 14B are made of a resin material having a filler mixed therein, and the thickness of each of these insulating layers covering the core layer 11 is 50 μm to 100 μm as described earlier.
The first insulating layer 14A is prepared in a state of being attached to a lower surface of the first conductive film 20, and the second insulating layer 14B is prepared in a state of being attached to an upper surface of the second conductive film 22. Here, each insulating layer may be stacked in a sheet form on the core layer 11 separately from the conductive films. Further, the first insulating layer 14A and the second insulating layer 14B may be applied, in a liquid form, to the upper and lower main surfaces of the core layer 11 and heated and cured thereafter.
The first conductive film 20 and the second conductive film 22 are rolled conductive foil obtained by rolling a conductive material such as copper, and each have a thickness of 20 μm to 50 μm, for example. Besides the rolled conductive foil, a plated film is usable as a material for the first conductive film 20 and the second conductive film 22.
Note that, as a specific method of housing the connection board 13 in the removed area 12, the first conductive film 20 and the second conductive film 22 to each of which the insulating layer is attached as well as the connection board 13 may be stacked and housed collectively, or they may be separately stacked and housed.
To house and stack separately, first, the second conductive film 22 is attached to the lower surface of the core layer 11 with the second insulating layer 14B interposed therebetween. Next, the connection board 13 is housed from above in the removed area 12 whose lower part is plugged by the second conductive film 22 and the second insulating layer 14B. Here, the connection board 13 is fixed at a predetermined position inside the removed area 12 with its lower surface in contact with the second insulating layer 14B. In other words, the second insulating layer 14B in a partially-cured state acts as an adhesive for fixing the connecting board 13 at the predetermined position. Lastly, the first conductive film 20 is attached to the upper surface of the core layer 11 with the first insulating layer 14A interposed therebetween. Here, the removed area 12 is filled with the resin component of the first insulating layer 14A. As a result, a space between the connection board 13 and the side surface of the core layer 11 facing the removed area 12 are filled with part of the first insulating layer 14A and part of the second insulating layer 14B, to thereby determine the position of the connection board 13 inside the removed area 12.
Referring to
Specifically, first, an upper surface of the first conductive film 20 and a lower surface of the second conductive film 22 are each covered with an etching resist 32. Next, an exposure-development process is performed on the resist 32, so as to expose portions of the upper surface of the first conductive film 20 and of the lower surface of the second conductive film 22, the portions corresponding to areas where the through-holes 30 are to be formed. Then, wet etching is performed using the resist 32 as a mask to remove the portions of the first conductive film 20 and of the second conductive film 22 that are exposed from the resist 32.
Subsequently, after removal of the resist 32, the first insulating layer 14A exposed from the first conductive film 20 is removed by being irradiated with laser, thereby forming the through-holes 30 from which the upper surface of the core layer 11 is exposed. Similarly, the second insulating layer 14B exposed from the second conductive film 22 is removed by being irradiated with laser, thereby forming the through-holes 30 from which the lower surface of the core layer 11 is exposed.
In addition, a first wiring pattern 15A and a fourth wiring pattern 15D of the connection board 13 are also exposed from the through-holes 30 formed in the above manner.
Referring to
Referring to
Referring to
Connection portions penetrating the insulating layers are also formed in this step. Specifically, connection portions 27 penetrating the third insulating layer 14C are formed to connect the third conductive film 24 and the first wiring layer 16A. In addition, connection portions 28 penetrating the fourth insulating layer 14D are formed to connect the second wiring layer 16B and the fourth conductive film 26. The connection portions 27 and 28 are formed in the same way as the connection portions 31 and 33 shown in
Referring to
The board 10A whose configuration is shown in
Although a total of four wiring layers are stacked on the upper and lower main surfaces of the core layer 11 in the above description, six or more wiring layers may be formed by stacking more wiring layers with insulating layers interposed.
Moreover, referring to
If a circuit device 17 as shown in
Further, referring to
Now, the connection board in
This drawing is redrawn based on
A core layer 11 is etched from both sides as shown in
Here, sheets in each of which a conductive film is formed on an insulating layer are prepared and attached to the respective sides.
Lastly, after formation of a resist 32, the conductive films are removed through openings of the resist, and holes thus formed in the conductive films are irradiated with laser to form through-holes 30.
Thereafter, steps similar to those in
A molding for sealing may be used for the connection board 13 to embed the wirings inside the connection board 13. Generally, separation of the connection boards is carried out by dicing, and therefore the planar shape of each connection board is a square. However, using a molding enables various structures such as a circle, a triangle, or an L shape.
A description has been given above of board embedment with core metal used as a base. For example, the board in
By enabling the connection board to have highly fine patterns with high density, it is sometimes enough for the board 10A to have rough patterns with low density. Accordingly, the connection board 13 may be embedded in such a manner that a wiring pattern 101 being an outermost surface of the connection board 13 at the front side (or the back side) may be substantially flush with a wiring layer 102 being an outermost surface of the board 10A.
In such a case, a solder resist 103 to be formed on the outermost surface can be formed on the surface of the board 10A and on the surface of the connection board 13 at once. Then, the solder resist at areas corresponding to electrical connection portions only have to be removed. In this way, a cost reduction can be achieved because, while the connection board requires highly accurate processes, the board 10A only requires rough patterns.
In
The LSI chip 100 is connected to the connection board with its face down in
In
Number | Date | Country | Kind |
---|---|---|---|
2010-36239 | Feb 2010 | JP | national |
2011-028582 | Feb 2011 | JP | national |
This application is a national stage application under 35 USC 371 of International Application No. PCT/JP2011/054420, filed Feb. 21, 2011, which claims the priority of Japanese Patent Application No. 2010-36239, filed Feb. 22, 2010, and Japanese Patent Application No. 2011-028582, filed Feb. 14, 2011, the entire contents of which are incorporated herein by reference.
Filing Document | Filing Date | Country | Kind | 371c Date |
---|---|---|---|---|
PCT/JP2011/054420 | 2/21/2011 | WO | 00 | 9/10/2012 |