Number | Name | Date | Kind |
---|---|---|---|
4437141 | Prokop | Mar 1984 | |
4437141 | Prokop | Mar 1984 | |
4881029 | Kawamura | Nov 1989 | |
4975765 | Ackermann et al. | Dec 1990 | |
5065227 | Frankeny et al. | Nov 1991 |
Number | Date | Country |
---|---|---|
63751 | Apr 1984 | JPX |
2211648 | Aug 1990 | JPX |
Entry |
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Semiconductor Wafer Testing, D. E. Shultis, Dec. 1970, IBM Technical Disclosure Bulletin vol. 13 No. 7 p. 1793. |