BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING
In FIG. 1, (a) is a side view of a lead type semiconductor device implemented on a substrate according to a first embodiment, (b) is a view showing stress acting on the lead type semiconductor device caused by substrate warpage, and (c) is a top view of the lead type semiconductor device according to the first embodiment.
In FIG. 2, (a) is a flow chart illustrating a manufacturing method for the lead type semiconductor device according to the first embodiment, and (b) to (f) are schematic depictions illustrating the manufacturing process.
FIG. 3 is a flow chart illustrating a manufacturing method for a lead type semiconductor device according to a second embodiment.
In FIG. 4, (a) is a side view of a lead type semiconductor device implemented on a substrate according to a third embodiment, and (b) is a top view of the lead type semiconductor device of FIG. 4 (a).
In FIG. 5, (a) is a flow chart illustrating a manufacturing process for the lead type semiconductor device according to the third embodiment, and (b) shows a top view of a lead frame after a half etching process of leads and a cross-section view taken along a dotted line A-A′.
FIG. 6 is a top view of a lead type semiconductor device according to a fourth embodiment.
In FIG. 7, (a) is a top view of a lead type semiconductor device according to a fifth embodiment, and (b) is an enlarged cross-section view of an end thereof.
FIG. 8 is a diagram showing a stress-distortion curve when a large distortion is applied to leads lying between small pieces.
In FIG. 9, (a) is a side view of another lead type semiconductor device according to the fourth embodiment, and (b) is a top view of the device.
FIG. 10 is a cross-section view of a lead type semiconductor device.
FIG. 11 is a perspective view of an electronics device in which the lead type electronic components of the invention are installed.