1. Field of Invention
The present invention relates to an apparatus for large area atmospheric pressure plasma enhanced chemical vapor deposition without contaminations on electrode assemblies and deposited films and, more particularly, to an apparatus for atmospheric pressure plasma enhanced chemical vapor deposition on a roll of substrate.
2. Related Prior Art
Plasma includes highly active species such as high-energy electrons, ions, free radicals and ultraviolet light. Vacuum plasma has been used in highly value-added process for making semiconductor products such as etching and deposition since 30 years ago. Vacuum plasma however requires an expensive vacuum chamber and an expensive pump. To reduce the cost of the equipment and the cost of the product, atmospheric pressure plasma devices and related processes have been developed since 20 years ago.
An atmospheric pressure plasma process does not require an expensive vacuum chamber. The area of a substrate to be processed in an atmospheric pressure plasma process is not limited by any vacuum chamber. These are two advantages over a vacuum plasma process. Atmospheric pressure plasma enhanced chemical vapor deposition (PECVD) is often used to make highly value-added products such as an anti-scratch plastic lens, an anti-reflection film of a display of a personal digital assistant (PDA), a cell phone or a digital camera, an anti-erosion film on metal, and an air-tight layer of polymer. Atmospheric pressure PECVD can be used for encapsulating a light, tiny and flexible electronic product such as an organic light-emitting diode (OLED), a thin-film cell, an organic solar cell, an inorganic solar cell and an LED/LED. Therefore, a lot of efforts have been made on atmospheric pressure PECVD and can be found in various documents. For example, R. Morent et al of Ghent University published an essay in Progress in Organic Depositions, 2009, and S. Martin et al of LGET-UPS published another essay in Surface and Deposition Technology, 2004. The techniques discussed in these documents are however difficult. Hence, there has not been devised any commercially available device related thereto.
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As discussed above, these two conventional atmospheric pressure PECVD devices exhibit two major common disadvantages. That is, the manufacturing cost of the plasma is high because expensive helium gas is used. Secondly, continuous production of the PECVD is impossible because a portion of the precursor is inevitably deposited on the electrode assemblies and they have to be shut down often for cleaning their electrode assemblies. Although these conventional atmospheric pressure PECVD devices can be used to coat flexible substrates, they are not economic.
The present invention is therefore intended to obviate or at least alleviate the problems encountered in prior art.
It is an objective of the present invention to provide an apparatus for large area atmospheric pressure plasma enhanced chemical vapor deposition on a roll of substrate.
It is another objective of the present invention to provide an apparatus for large area atmospheric pressure plasma enhanced chemical vapor deposition on a roll of substrate while preventing fragments of the deposition and aerosols in the deposition chamber from falling on the substrate or the films of deposition on the inner surfaces of electrode assemblies.
It is another objective of the present invention to provide an apparatus for continuous large area atmospheric pressure plasma enhanced chemical vapor deposition on a roll of substrate.
To achieve the foregoing objectives, the large area atmospheric pressure PECVD apparatus includes a sub-atmospheric pressure deposition chamber, at least one large area vertical planar atmospheric pressure nitrogen gas (N2) plasma activation electrode assembly, at least one large area vertical planar atmospheric pressure N2 plasma deposition electrode assembly, at least one long-line uniform precursor distributor and a roll-to-roll substrate conveyor. The sub-atmospheric pressure deposition chamber includes a vent defined therein and a pump operable for pumping gas from the sub-atmospheric pressure deposition chamber through the vent to create a sub-atmospheric pressure condition in the sub-atmospheric pressure deposition chamber. The large area vertical planar atmospheric pressure plasma activation electrode assembly is located in the sub-atmospheric pressure deposition chamber and connected to a high voltage power supply located outside the sub-atmospheric pressure deposition chamber. The large area vertical planar atmospheric pressure plasma deposition electrode assembly is located in the sub-atmospheric pressure deposition chamber and connected to a high voltage power supply located outside the sub-atmospheric pressure deposition chamber. The roll-to-roll substrate conveyor is located in the sub-atmospheric pressure deposition chamber for conveying the substrate so that the first vertical section of the substrate travels past the large area vertical planar atmospheric pressure plasma activation electrode assembly while a second vertical section of the substrate travels past the large area vertical planar atmospheric pressure plasma deposition electrode assembly. The precursor distributor is located in the sub-atmospheric pressure deposition chamber between the large area vertical planar atmospheric pressure plasma deposition electrode assembly and a second vertical section of a substrate and connected to a precursor provider located outside the sub-atmospheric pressure deposition chamber.
In another aspect, each of the large area vertical planar atmospheric pressure plasma activation and deposition electrode assemblies includes a grounded and sealed rectangular metal chamber, a grounded planar electrode located on the rectangular metal chamber, a water-cooled planar high voltage electrode located in the rectangular metal chamber, and two uniform plasma gas distributors located above and below the planar high voltage electrode, respectively.
In another aspect, the planar high voltage electrode includes a rectangular metal plate, an aluminum oxide ceramic dielectric plate attached to a rectangular metal plate, a plastic coolant tank located around and attached to the aluminum oxide ceramic dielectric plate, a high voltage connecting rod inserted through the plastic coolant tank and connected to the metal plate, a high voltage isolative sleeve located around the high voltage connecting rod, and a coolant channel defined in the plastic coolant tank.
In another aspect, the rectangular metal chamber includes coolant inlet and outlet defined therein and two plasma gas inlet pipes inserted therein.
In another aspect, the grounded planar electrode includes a metal plate with a plasma spraying orifice array evenly defined therein, a plurality of aluminum oxide ceramic pads attached to the metal plate around the plasma spraying orifice array, and a plurality of apertures or screw holes defined in the metal plate for receiving fasteners such as screws for attaching the metal plate to the rectangular metal chamber.
In another aspect, the plasma spraying orifice array includes at least two plasma spraying orifice groups each including several plasma spraying orifice rows. Transverse projections of the plasma spraying orifice rows are continuous or overlapped one another in each of the plasma spraying orifice groups.
The plasma spraying orifice array may include two plasma spraying orifice groups. The plasma spraying orifice groups are transversely shifted from each other by ½ of the diameter d of the plasma spraying orifices.
Alternatively, the plasma spraying orifice array may include three plasma spraying orifice groups. Any two adjacent ones of the plasma spraying orifice groups are transversely shifted from each other by ⅓ of the diameter d of the plasma spraying orifices.
In another aspect, each of the plasma gas distributors includes a flat shell and four plasma gas dividers. The flat shell includes a plasma gas inlet defined in a side, a plasma gas outlet defined in an opposite side, and a plasma gas mixing and distributing section defined therein near the plasma gas outlet. The first plasma gas divider is located in the flat rectangular shell for dividing plasma gas to two streams. The second plasma gas divider is located in the flat rectangular shell for dividing the plasma gas into four streams. The third plasma gas divider is located in the flat rectangular shell for dividing the plasma gas into eight streams. The fourth plasma gas divider is located in the flat rectangular shell for dividing plasma gas into sixteen streams.
In another aspect, each of the plasma gas distributors includes a high voltage isolative plate located beneath or on the plasma gas mixing and distributing section and two plasma gas guiding plates and located on two opposite sides of the plasma gas outlet.
In another aspect, the precursor distributor includes a flat shell and four precursor dividers. The flat shell includes a precursor inlet defined in a side, a precursor outlet defined in an opposite side, and a flat precursor mixing and distributing section defined therein near the precursor outlet. The first precursor divider is located therein for dividing precursor into two streams. The second precursor divider is located therein for dividing the precursor into four streams. The third precursor divider is located therein for dividing the precursor into eight streams. The fourth precursor divider is located therein for dividing the precursor into sixteen streams.
In another aspect, the roll-to-roll substrate conveyor includes a first reel located near the large area vertical planar atmospheric pressure plasma activation electrode assembly, a second reel located near the large area vertical planar atmospheric pressure plasma deposition electrode assembly, a first positioning roller located above the first reel, a second positioning roller located above the second reel, an IR heater located between the second reel and the second positioning roller.
In another aspect, each of the high voltage power supplies may be a pulse power supply, AC sine-wave power supply or a high power RF power supply operated at 1 to 100 kHz.
Other objectives, advantages and features of the present invention will be apparent from the following description referring to the attached drawings.
The present invention will be described via detailed illustration of the preferred embodiment referring to the drawings wherein:
Referring to
The large area vertical planar atmospheric pressure N2 plasma activation electrode assembly 1a and the large area vertical planar atmospheric pressure N2 plasma deposition electrode assembly 1b are located in the sub-atmospheric pressure deposition chamber 4. A high voltage power supply 5a is located outside the sub-atmospheric pressure deposition chamber 4. The high voltage power supply 5a is electrically connected to the large area vertical planar atmospheric pressure N2 plasma activation electrode assembly 1a to produce N2 plasma to activate substrate for promoting adhesion of deposited films. A high voltage power supply 5b is located outside the sub-atmospheric pressure deposition chamber 4. The high voltage power supply 5a is electrically connected to the large area vertical planar atmospheric pressure N2 plasma deposition electrode assembly 1b to produce N2 plasma for coating the substrate. The high voltage power supplies 5a and 5b provides high voltage pulses, AC sine-waves or high power RF at 1 to 100 kHz.
The roll-to-roll substrate conveyor 3 is also located in the sub-atmospheric pressure deposition chamber 4. The roll-to-roll substrate conveyor 3 continuously conveys the substrate so that a first vertical section of the substrate travels in a plasma activation zone near the large vertical area planar atmospheric pressure N2 plasma activation electrode assembly 1a while a second vertical section of the substrate travels in a plasma deposition zone near the large area vertical planar atmospheric pressure N2 plasma deposition electrode assembly 1b. In the N2 plasma activation zone, the first vertical section of the substrate travels parallel to the large area vertical planar atmospheric pressure N2 plasma activation electrode assembly 1a, with a gap of 2 to 4 mm defined between them. In the N2 plasma deposition zone, the second vertical section of the substrate travels parallel to the large area vertical planar atmospheric pressure N2 plasma deposition electrode assembly 1b, with a gap of 6 to 10 mm defined between them.
The long-line uniform precursor distributor 2 is also located in the sub-atmospheric pressure deposition chamber 4. The long-line uniform precursor distributor 2 is preferably located above a gap defined between the large area vertical planar atmospheric pressure N2 plasma deposition electrode assembly 1b and the second vertical section of the substrate. The long-line uniform precursor distributor 2 is connected to a precursor provider 201 located outside the sub-atmospheric pressure deposition chamber 4 to evenly distribute gaseous precursor so that the gaseous precursor travels parallel to and between the large area vertical planar atmospheric pressure N2 plasma deposition electrode assembly 1b and the second vertical section of the substrate.
The sub-atmospheric pressure deposition chamber 4 includes a vent 41 defined in an upper portion for example. A pump 42 is located on the sub-atmospheric pressure deposition chamber 4. The pump 42 is in communication with the sub-atmospheric pressure deposition chamber 4 through the vent 41. The pump 42 is operated to pump used plasma gas and decomposed precursor not deposited on the substrate out of the sub-atmospheric pressure deposition chamber 4 through the vent 41 to provide a sub-atmospheric pressure condition in the sub-atmospheric pressure deposition chamber 4 to prevent the gaseous precursor from entering the environment around the sub-atmospheric pressure deposition chamber 4.
Referring to
The planar high voltage electrode 11 includes a rectangular metal plate, an aluminum oxide ceramic dielectric plate 112 attached to a rectangular metal plate 111, a plastic coolant tank 113 located around and attached to the aluminum oxide ceramic dielectric plate 112, a high voltage connecting rod 114 inserted through the plastic coolant tank 113 and connected to the metal plate 111, a high voltage isolative sleeve 115 located around the high voltage connecting rod 114, and a coolant channel 116 defined in the plastic coolant tank 113.
The rectangular metal chamber 13 includes a coolant inlet 131, a coolant outlet 132, and two plasma gas inlet pipes 133 and 134. The coolant inlet 131 and the coolant outlet 132 are located on two opposite sides of the planar high voltage electrode 11. The uniform plasma gas inlet pipes 133 and 134 are located above and below the planar high voltage electrode 11, respectively.
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The first-grade plasma gas divider 142 includes two identical apertures 421 and 422 defined therein and a plasma gas dividing partition 423 formed thereon. The plasma gas dividing partition 423 is located between the apertures 421 and 422.
The second-grade plasma gas divider 143 includes four identical apertures 431, 432, 433 and 434 defined therein and three identical plasma gas dividing partitions 435, 436 and 437 formed thereon. Each of the plasma gas dividing partitions 435, 436 and 437 is located between two related ones of the apertures 431, 432, 433 and 434.
The third-grade plasma gas divider 144 includes eight identical apertures and seven identical plasma gas dividing partitions formed thereon. The apertures defined in the third-grade plasma gas divider 144 are not numbered for the clarity of the drawings; however, they are identical to or smaller than the apertures 421, 422 and 431 to 434. The plasma gas dividing partitions formed on the third-grade plasma gas divider 144 are not numbered for the clarity of the drawings; however, they are identical to the plasma gas dividing partitions 423 and 435 to 437. Similarly, each of the plasma gas dividing partitions formed on the third-grade plasma gas divider 144 is located between two related ones of the apertures defined in the third-grade plasma gas divider 144.
The fourth-grade plasma gas divider 145 includes sixteen identical apertures defined therein. The apertures defined in the fourth-grade plasma gas divider 145 are not numbered for the clarity of the drawings; however, they are identical to or smaller than the apertures 421, 422 and 431 to 434.
The gap between the plasma gas dividing partitions of each of the plasma gas dividers and a next one of the plasma gas dividers is smaller the better. The length L of the plasma gas mixing and distributing section 146 is ten times or more as large as the distance D between any two adjacent ones of the apertures defined in the fourth-grade plasma gas divider 145. The width W of the plasma gas mixing and distributing section 146 is marginally smaller or identical to the gap defined between the plastic coolant tank 113 and the grounded rectangular metal chamber 13.
An L-shaped high voltage isolative plate 148 is located beneath or on the plasma gas uniformly mixing and distributing section 146. The L-shaped high voltage isolative plate 148 is preferably in contact with the plastic coolant tank 113.
Two plasma gas guiding plates 149 and 150 are located on two opposite sides of the plasma gas outlet 147. The plasma gas guiding plates 149 and 150 are located as close to the plastic coolant tank 113 as possible.
Referring to
The first-grade precursor divider 22 includes two identical apertures 221 and 222 defined therein and a plasma gas dividing partition 223 formed thereon between the apertures 221 and 222.
The second-grade precursor divider 23 includes four identical apertures 231, 232, 233 and 234 defined therein and three identical precursor dividing partitions 235, 236 and 237 formed thereon. Each of the precursor dividing partitions 235, 236 and 237 is located between two related ones of the apertures 231, 232, 233 and 234.
The third-grade precursor divider 24 includes eight identical apertures and seven identical precursor dividing partitions formed thereon. The apertures defined in the third-grade precursor divider 24 are not numbered for the clarity of the drawings; however, they are identical to or smaller than the apertures 221, 222 and 231 to 234. The plasma gas dividing partitions formed on the third-grade precursor divider 24 are not numbered for the clarity of the drawings; however, they are identical to the precursor dividing partitions 223 and 235 to 237. Similarly, each of the plasma gas dividing partitions formed on the third-grade precursor divider 24 is located between two related ones of the apertures defined in the third-grade precursor divider 24.
The fourth-grade precursor divider 25 includes sixteen identical apertures defined therein. The apertures defined in the fourth-grade precursor divider 25 are not numbered for the clarity of the drawings; however, they are identical to or smaller than the apertures 221, 222 and 231 to 234.
The gap between the plasma gas dividing partitions of each of the precursor dividers and a next one of the precursor dividers is smaller the better. The length P of the precursor uniformly mixing and distributing section 26 is ten times or more as large as the distance Q between any two adjacent ones of the apertures defined in the fourth-grade precursor divider 25. The width V of the precursor mixing and distributing section 26 is marginally smaller or identical to ½ of the diameter of the apertures defined in the fourth-grade precursor divider 25 to increase the speed of the precursor leaving the precursor distributor 2.
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The plasma spraying orifice array 122 consists of at least two plasma spraying orifice groups. Each of the plasma spraying orifice groups includes several plasma spraying orifice rows. In each of the plasma spraying orifice groups, the transverse projections of the plasma spraying orifice rows are continuous or overlap one another. In each of the plasma spraying orifice rows, the plasma spraying orifices are located evenly. For example, if the plasma spraying orifice array 122 includes two plasma spraying orifice groups, the plasma spraying orifice groups are transversely shifted from each other by ½ of the diameter d of the plasma spraying orifices. If the plasma spraying orifice array 122 includes three plasma spraying orifice groups, any two adjacent ones of the plasma spraying orifice groups are transversely shifted from each other by ⅓ of the diameter d of the plasma spraying orifices. The diameter d of the plasma spraying orifices of the plasma spraying orifice array 122 is smaller than or equal to 0.6 mm. In each of the plasma spraying orifice rows, any two adjacent ones of the plasma spraying orifices are transversely separated from each other by a distance smaller or equal to 3d. Any two adjacent ones of the plasma spraying orifice rows are separated from each other by a distance smaller than or equal to 4d. The last plasma spraying orifice row of the first plasma spraying orifice group is separated from the first plasma spraying orifice row of the second plasma spraying orifice group by a distance smaller than or equal to 4d.
The apparatus 100 of the present invention exhibits four advantageous features. At first, the gap between the electrode assemblies is small so that inexpensive nitrogen gas (N2) can be used as the plasma gas. Secondly, the plasma is sprayed horizontally from the plasma jets of the grounded electrode assembly, and the precursor for deposition is sprayed vertically to intersect the ejected plasma jets and is decomposed by the plasma outside the grounded electrode assembly so that the interior of the N2 plasma deposition electrode assembly would not be contaminated by the decomposed precursor. Thirdly, the plasma activation electrode assembly and the plasma deposition electrode assembly and the surface section of the substrate to be treated are positioned vertically to avoid peeled fragments of the deposition and aerosols in the deposition chamber from falling on the substrate. Fourthly, the uniform plasma gas distributor, the well overlapped plasma spraying orifices of the grounded electrode assembly and the plasma spraying orifices of the long-line uniform precursor distributor make it possible to execute excellent and uniform large area plasma deposition. The apparatus 100 of the present invention overcome the problems addressed in the Related Prior Art.
The present invention has been described via the detailed illustration of the preferred embodiment. Those skilled in the art can derive variations from the preferred embodiment without departing from the scope of the present invention. Therefore, the preferred embodiment shall not limit the scope of the present invention defined in the claims.