Mounting for a package containing a chip

Information

  • Patent Grant
  • 6967395
  • Patent Number
    6,967,395
  • Date Filed
    Friday, October 17, 2003
    20 years ago
  • Date Issued
    Tuesday, November 22, 2005
    18 years ago
Abstract
A mounting for a package containing a semiconductor chip is disclosed, along with methods of making such a mounting. The mounting includes a substrate having a mounting surface with conductive traces thereon, and an aperture extending through the substrate. The package includes a base, such as a leadframe or a laminate sheet, and input/output terminals. A chip is on a first side of the base and is electrically connected (directly or indirectly) to the input/output terminals. A cap, which may be a molded encapsulant, is provided on the first side of the base over the chip. The package is mounted on the substrate so that the cap is in the aperture, and a peripheral portion of the first side of the base is over the mounting surface so as to support the package in the aperture and allow the input/output terminals of the package to be juxtaposed with to the circuit patterns of the mounting surface. Because the cap is within the aperture, a height of the package above the mounting surface is minimized.
Description
BACKGROUND

1. Field of the Invention


The present invention relates to a mounting for a package containing a semiconductor chip.


2. Description of the Related Art


A typical package for a semiconductor chip includes an internal leadframe, which functions as a substrate for the package. The leadframe includes a central metal die pad and a plurality of leads. A body of a hardened, insulative encapsulant material covers the die, die pad, and an inner portion of each of the leads. The encapsulant material is provided both above and below the die pad and leads.


The semiconductor chip is mounted on the die pad and is electrically connected to the leads. In particular, the chip includes a plurality of bond pads, each of which is electrically connected by a conductor (e.g., a bond wire) to an encapsulated inner portion of one of the leads. An outer portion of each lead extends outward from the body of encapsulant material, and serves as an input/output terminal for the package. The outer portion of the leads may be bent into various configurations, such as a J lead configuration or a gull wing configuration.


Customers of such packages typically mount the package on an larger substrate, such as motherboard. The outer lead portions are soldered to metal traces of a mounting surface of the motherboard. The outer lead portions space the body of encapsulant material (and accordingly the chip, die pad, bond wires, and inner leads) a vertical distance above the mounting surface. Accordingly, the package has a relatively large height above the mounting surface, which is undesirable in some applications.


Lately, practitioners have attempted to make packages thinner by providing the die pad and leads at a bottom surface of the body of encapsulant material, rather than in the middle of the body of encapsulant material. Such packages enjoy a lower height than the standard leadframe packages mentioned above, since there is no encapsulant beneath the die pad and leads. Nonetheless, the height of the package above the mounting surface may still be too great for some applications, since the encapsulant must still extend over the die. Accordingly, a solution is necessary for applications where the height of the package above the mounting surface of the motherboard must be as small as possible.


SUMMARY OF THE INVENTION

A mounting for a package containing a semiconductor chip is disclosed, along with methods of making such a mounting. The mounting includes a substrate having a mounting surface with conductive traces thereon, and an aperture extending through the substrate. The package includes a base, such as a leadframe or a metallized laminate sheet, with input/output terminals for electrically connecting the package to the traces of the mounting surface. At least one chip is provided on a first side of the base of the package. The chip is electrically connected through the package (i.e., directly or indirectly) to the input/output terminals of the package. A cap, which may be a molded encapsulant material, is provided on the first side of the base over the chip. The package is mounted on the substrate so that the cap extends into the aperture of the substrate. A circumferential portion of the first side of the base outside of the cap is juxtaposed with the mounting surface so as to support the package and allow the input/output terminals of the package to be electrically connected to juxtaposed traces of the mounting surface of the substrate. Because the cap is within the aperture, a height of the package over the mounting surface is much less than in a conventional mounting, yielding distinct advantages in applications where the height of the package over the mounting surface is critical.


Various exemplary embodiments of mountings and packages for the mountings also are disclosed herein. For example, a mounting for a stack of packages is disclosed, wherein a second package is mounted on a first package that is mounted on the substrate. Alternatively, two packages may be mounted on opposite sides of the substrate, with the cap of each package in the aperture and facing the cap of the other package. In addition, embodiments for electrically connecting the package to the traces of the substrate using clips on the substrate, or channels in the substrate, are disclosed. Such embodiments can allow for a snap-in, solderless electrical connection of the package to the substrate.


These and other features and aspects of the present invention will become clear upon a reading of the following detailed description of the exemplary embodiments, in conjunction with the accompanying drawings thereof.





BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1 is a cross-sectional side view of a mounting for a package.



FIG. 2 is a cross-sectional side view of an alternative mounting for a package, wherein the mounting surface includes clips to fasten the package to the substrate.



FIG. 3 is a cross-sectional side view of a mounting for an alternative package, wherein the package includes a semiconductor chip in a flip chip connection with leads of the package.



FIG. 4 is a cross-sectional side view of a mounting for an alternative package, wherein the die pad and leads of the package include a means for preventing the die pad and leads from being pulled vertically from the body of encapsulant material.



FIG. 5 is a cross-sectional side view of a mounting for an alternative package, wherein the package includes a pair of stacked, electrically interconnected chips.



FIG. 6 is a cross sectional side view of a mounting for an alternative package, wherein the package includes a central cavity for the chip and a lid over the chip.



FIG. 7 is a cross-sectional side view of a mounting for an alternative package, wherein the package is leadless chip carrier package.



FIG. 8 is a cross sectional side view of another alternative mounting for a package, wherein the mounting surface includes channels for insertion of the outer portion of the leads of the package therein.



FIG. 9 is a cross-sectional side view of another alternative mounting, wherein the mounting includes a stack of electrically interconnected packages.



FIG. 10 is a cross sectional side view of a mounting for two packages.





In the drawings, identical or similar features of the various embodiments shown therein are typically labeled with the same reference numbers.


DETAILED DESCRIPTION


FIG. 1 illustrates a mounting 101 in accordance with one embodiment of the present invention. Mounting 101 includes a semiconductor package 12 that is mounted on and electrically connected to an interconnective substrate 10, which may be a motherboard or some other type of electronic chassis.


Substrate 10 includes a core layer 14. For example, layer 14 may be a glass-fiber reinforced epoxy laminate sheet, a ceramic sheet, an insulated metal sheet, a film, or some other suitable material. Substrate 10 includes a first surface 10a and an opposite second surface 10b. A rectangular aperture 10c extends through substrate 10 between first surface 10a and second surface 10b. Conductive traces 20 (e.g., copper) are formed on second surface 10b. (The term “conductive trace” is used broadly to include any type of conductive terminals). Traces 20 carry electrical signals to and from package 12.


Semiconductor package 12 includes a semiconductor chip 22, a metal leadframe, and a body 24 of a hardened, insulative encapsulant material. The leadframe includes a metal die pad 26 and horizontal metal leads 28. Leads 28 each include an inner lead portion 30 that is within body 24, and an outer lead portion 32 that extends out of body 24 in the same horizontal plane as inner lead portion 30 and die pad 26. The leadframe may be formed of copper, copper alloy, steel, Alloy 42, or some other metal.


Chip 22 includes an active surface 22a where integrated circuit devices are formed, and an opposite inactive surface 22b. Active surface 22a includes a plurality of conductive bond pads 22c along the edges of active surface 22a. Bond pads 22c may be formed along two peripheral edges or all four peripheral edges of active surface 22a. Inactive surface 22b of chip 22 may be polished to make chip 22 thinner, thereby reducing package height.


Body 24 has a first surface 24(a), an opposite planar second surface 24(b), and peripheral side surfaces 24c. Typically, body 24 may be formed by molding or pouring and then curing a resin material (e.g., an epoxy resin). Where body 24 is molded, as in this example, side surfaces 24c typically will be tapered to accommodate release from the mold.


Die pad 26 has a planar first surface 26a, an opposite second surface 26b, and peripheral side surfaces 26c. Inactive surface 22b of chip 22 is adhesively attached to first surface 26a. Second surface 26b of die pad 26 is exposed in the plane of second surface 24b of body 24. First surface 26a and side surfaces 26c of die pad 26 are covered by the encapsulant material of body 24. In an alternative embodiment, die pad 26 may be set up into body 24, i.e., out of the horizontal plane of leads 28 and second surface 24b of body 24, so that second surface 26b of die pad 26 is covered by the encapsulant material of body 24.


As mentioned, leads 28 are horizontal and include an inner lead portion 30 that is within body 24, and an outer lead portion 32 that is outside of body 24. Leads 28 have a first surface 28a, an opposite second surface 28b, and peripheral side surfaces between the first and second surfaces 28a, 28b. An inner end surface 28c of inner lead portion 30 of leads 28 faces die pad 26. The first surface 28a, peripheral side surfaces, and inner end surface 28c of inner lead portion 30 are covered with the encapsulant material of body 24. All of second surface 28b of lead 28 is exposed, including the portion of second surface 28b corresponding to inner lead portion 30. The peripheral side surfaces of inner lead portion 30 may include protruding anchor ears or the like, or an aperture may be formed vertically through inner lead portion 30, in order to prevent leads 28 from being pulled horizontally from body 24.


In a typical process for making package 12, a metal strip including an array of identical leadframes is processed in parallel. After each chip 22 is mounted on the die pad 26 of one of the leadframes and is electrically connected to the leads 28 of the respective leadframe, a body 24 is individually formed (e.g., molded) over each chip 22 and leadframe of the array. After the encapsulant material is cured, individual packages 12 are singulated from the metal strip by punching or sawing through the outer lead portion 30 of the leads 28 at a selected distance (e.g., 0.1 to 0.2 mm) from side surface 24c of body 24.


Practitioners will appreciate that package 12 has a reduced height, compared to the first conventional package mentioned above, because die pad 26 and leads 28 are provided at second surface 24b of package body 24.


Package 12 is electrically connected to traces 20 of second surface 10b of substrate 10 so that electrical signals may be passed between substrate 10 and chip 22 of package 12. In particular, each bond pad 22c of chip 22 is electrically connected by a conductor, e.g., a metal wire 34 made of gold or aluminum, to a first surface 28a of an inner lead portion 30 of a lead 28. Low loop bond wires or TAB bonds may be used to help reduce package height. In addition, the first surface 28a of each outer lead portion 30 is electrically connected by a conductor, such as metal solder 36, to metal traces 20 of substrate 10. Of course, these electrical connections may vary. For example, a conductive adhesive material, such as a metal-filled epoxy, may be used instead of solder 36 to electrically connect outer leads 32 to metal traces 20.


Package 12 is mounted on substrate 10 in a manner that significantly lessens a height of package 12 above second surface 10b of substrate 10, on which package 10 is mounted. In particular, package 12 is mounted so that most of body 24 of package 12 is within aperture 10c of substrate 10. First surface 24a of body 24 and a majority portion of side surfaces 24c of body 24 are within aperture 10c. Only die pad 26, leads 28, and second surface 24b of body 24 are above second surface 10b of substrate 10, thereby accomplishing a very low mounting height.


The height of package 10 of mounting 101 above second surface 10b of substrate 10 is about equal to the height (i.e., thickness) of die pad 26 and leads 28. In comparison to conventional mountings, height savings are realized by providing body 24 of package 10 within aperture 10c, providing die pad 26 and leads 28 at second surface 24b of body 24 rather than in the middle of body 24, and, if desired, by thinning chip 22 and by using low-loop height bond wires 34.


If desired, an additional electronic device (e.g., a package containing a chip, or a passive device such as a capacitor, resistor, or inductor) may be placed on package 12 and electrically connected thereto so that there is an electrical connection between the electronic device and second surface 28b of some or all of the leads 28, thereby electrically connecting package 12 to the additional electronic device.



FIG. 2 depicts a mounting 102 in accordance with another embodiment of the present invention. Mounting 102 is nearly the same as mounting 101 of FIG. 1, and thus does not need to be discussed in redundant detail. In mounting 102 of FIG. 2, clips 11 are provided on second surface 10b of substrate 10 adjacent to aperture 10c. Clips 11 each include an electrically conductive portion that is electrically connected to one of the traces 20 of second surface 10b. For example, each clip 11 may be metal, and may be soldered to one of the traces 20. Outer leads 32 of package 12 each snap into a respective one of the clips 11, thereby electrically connecting package 12 to substrate 10 without a soldered or otherwise adhesive connection.



FIG. 3 depicts a mounting 103 in accordance with another embodiment of the present invention. The difference between mounting 103 of FIG. 3 and mounting 101 of FIG. 1 is in the configuration of package 12. In contrast to FIG. 1, inner lead portion 30 of each lead 28 of package 12 of FIG. 3 is made longer, and the area of die pad 26 is reduced so as to fit within a boundary defined by bond pads 22c. Moreover, chip 22 is mounted in a flip chip style on first surface 26a of die pad 26 and first surface 28a of the inner lead portions 30. An insulative adhesive is used to attach first surface 22a of chip 22 to first surface 26a of die pad 26. Bond pads 22c of chip 22 face first surface 28a of the inner lead portions 30 and are electrically connected thereto with a conductive metal solder (e.g., a gold solder) or a conductive adhesive. In an alternative embodiment, die pad 26 may be omitted, such that chip 22 is supported in a flip chip style solely on first surface 28a of leads 28. In such an embodiment, encapsulant material of body 24 would fill in under active surface 22a of chip 22.



FIG. 4 depicts a mounting 104 in accordance with another embodiment of the present invention. Again, the difference between mounting 104 of FIG. 4 and mounting 101 of FIG. 1 is in the configuration of package 12. Die pad 26 and leads 28 of package 12 of FIG. 4 include a means for preventing die pad 26 and leads 28 from being pulled vertically from body 24. On die pad 26, this vertical locking feature includes an undercut region 26d at the periphery of die pad 26 that extends fully around, or extends at least along two opposing edges of, die pad 26. On leads 28, this vertical locking feature includes an undercut region 28d in second surface 28b of inner lead portion 30. Encapsulant material of body 24 fills in under undercut region 26d of die pad 26 and undercut region 28d of inner lead portion 30. The underfilled encapsulant material supports die pad 26 and leads 28 in body 24. Undercut regions 26d and 28d may be formed by masking and then etching about half way through the thickness of die pad 26 and leads 28 in the regions shown. In this regard, the reader is referred to U.S. patent application Ser. No. 09/176,614, which is incorporated herein by reference in its entirety.


Alternatively, instead of having half-etched regions, die pad 26 and leads 28 may have a stamped or coined circumferential lip at first surface 26a of die pad 26 and first surface 28a of lead 28. The lip circumscribes die pad 26, and extends along the side surfaces and inner end surface 28c of each lead 28. The lip ultimately is underfilled by encapsulant material of body 24, thereby vertically locking die pad 26 and leads 28 to body 24. Alternatively, side surfaces 26c of die pad 26 and the side surfaces and inner end surface 28c of leads 28 may include a central peak that extends into the encapsulant material or a central depression that is filled by the encapsulant material. In this regard, the reader is directed to U.S. Pat. No. 6,143,981, which is incorporated herein by reference in its entirety.



FIG. 5 depicts a mounting 105 in accordance with another embodiment of the present invention. Again, the difference between mounting 105 of FIG. 5 and mounting 101 of FIG. 1 is in the configuration of package 12. In particular, package 12 of FIG. 5 includes two chips 22 (e.g., two semiconductor memory chips) stacked one on top of the other. A spacer 40 is attached between the active surface 22a of a first chip 22 and the inactive surface 22b of a second chip 22 stacked on the first chip 22. Spacer 40 is fully within a perimeter defined by the bond pads 22c of the first chip 22, and spaces the second chip 22 above the bond wires 34 that are bonded to the bond pads 22c of the first chip 22. Spacer 40 may be formed of silicon with an insulative adhesive material coated on its opposing major surfaces, among other possibilities. The first and second chips 22 are electrically connected with each other through pairs of bond wires 34 that are connected to the same leads 28 of package 12. Alternatively, an adhesive film or a thick glob of an adhesive material may be between the chips so as to space them apart and attach them together.



FIG. 6 depicts a mounting 106 in accordance with another embodiment of the present invention. Again, the difference between mounting 106 of FIG. 6 and mounting 101 of FIG. 1 is in the configuration of package 12. In particular, package 12 of FIG. 5 provides a cavity 24d in body 24. First surface 26a of die pad 26 and first surface 28a of inner lead portion 30 of the leads 28 are exposed in cavity 24d. After forming body 24, a chip 22 is placed on first surface 26a of die pad 26 in cavity 24d, and is wire bonded to the exposed surface 28a of leads 28. A lid 42 is attached to the rim of cavity 24, thereby closing cavity 24d. Such a package may be appropriate where chip 22 is an optical device, in which case lid 42 is optically clear so as to transmit light to an optical cell on active surface 22a of chip 22. Alternatively, an optically clear encapsulant can be provided in cavity 24d in place of having a lid 42. Having a cavity 24d in body 24 also is appropriate where chip 22 is a micromachine or some other chip that cannot covered by an encapsulant material.



FIG. 7 depicts a mounting 107 in accordance with another embodiment of the present invention. Again, the difference between mounting 107 of FIG. 7 and mounting 101 of FIG. 1 is in the configuration of the package. In mounting 107 of FIG. 7, package 50 includes a substrate 52 that includes a layer of insulative material 54 (e.g., a polyimide film, a glass-fiber reinforced laminate sheet, or ceramic) upon which metal circuit patterns 56 are formed. A body 24 of an insulative encapsulant material is provided over a central region of a first surface 52a of substrate 52. A peripheral region of first surface 52a around body 24 is free of the encapsulant material. Chip 22 is attached to a metal die pad 55 on first surface 52a and is electrically connected to an encapsulated inner end 56a of the circuit patterns 56. An outer end 56b of each circuit pattern 56 is exposed at the periphery of first surface 52a outside of body 24. The outer end 56b of each circuit pattern 56 of package substrate 52 serves as an input/output terminal of package 50.


Body 24 of package 50 is positioned in aperture 10c of mounting substrate 10, just as in FIG. 1. The peripheral region of first surface 52a of substrate 52 is supported on first surface 10a of substrate 10 around aperture 10c. Outer end 56b of each of the circuit patterns 56 is connected by solder 36 or the like to one of the traces 20 on first surface 10a of substrate 10, thereby forming an electrical connection between package 50 and substrate 10. Accordingly, package 50 of mounting 107 has a very low height above second surface 10b of substrate 10. The height of package 50 of mounting 107 is approximately equal to the thickness of substrate 52 of package 50, since body 54 is in aperture 10c.


If desired, package 50 may include further metal input/output terminals 58 on second surface 52b of substrate 50. Input/output terminals 58 are electrically connected by vias 60 through substrate 50 to circuit patterns 56 on first surface 52a. Accordingly, another package could be stacked on second surface 52b if desired, and electrically connected to package 50 (and hence to substrate 10) through terminals 58.


In an alternative embodiment, package 50 may include a rectangular central aperture through substrate 52 within which chip 22 is located. In such a package, chip 22 would be supported and connected to substrate 52 by the encapsulant material of body 24. Such a package enjoys a very thin profile because chip 22 is in an aperture of substrate 52.



FIG. 8 depicts a mounting 108 in accordance with another embodiment of the present invention. The difference between mounting 108 of FIG. 8 and mounting 101 of FIG. 1 is in the connection of package 12 to substrate 10. In particular, substrate 10 of FIG. 8 includes a plurality of metal-lined channels 10d in second surface 10b around aperture 10c. The metal lining of each channel 10d is electrically connected to a trace 20 of first surface 10a. Channels 10d are formed so that outer leads 32 of package 10 can be fitted or snapped therein, thereby forming a solderless electrical connection between package 12 and substrate 10. Depending on the tightness of the fit, solder may be applied over leads 32 to make a more secure electrical connection to the metal lining of the respective channels 10d. Accordingly, with body 24 in aperture 10c and each outer lead 32 in a channel 10d, second surface 24b of body 24 of package 10 may be flush with or nearly flush with second surface 10b of substrate 10, depending on the depth of the channels 10b.



FIG. 9 depicts a mounting 109 in accordance with another embodiment of the present invention. In mounting 109, a second package 12 is stacked on the package 12 of FIG. 1 that is mounted on substrate 10. In particular, second surface 24b of body 24 of the upper package 12 is juxtaposed with and supported on the second surface 24 of body 24 of the lower package 12. Moreover, the exposed second surface 28b of each lead 28 of the upper package 12 is juxtaposed with and electrically connected by solder 36 or the like to the exposed second surface 28b of one of the leads 28 of the lower package 12, thereby electrically connecting the stacked packages 12. With the body 24 of the lower package 12 in aperture 10c of substrate 10, the height of the stack of packages 12 above mounting surface 10b of substrate 10 is less than the sum of the heights of the two packages 12 unstacked. Further reductions in height may be obtained, for example, by using channels 10d in substrate 10, as shown in FIG. 8. Mounting 109 may be made by mounting a first package 12 on substrate 10, as in FIG. 1, and then mounting a second package 12 on the first package 12. Alternatively, the two packages 12 can be electrically connected in a stack prior to electrically connecting the stack to substrate 10. In one application, the two packages may include identical memory chips, with one package arranged to be the mirror image of the other so that the chips therein may be electrically connected in parallel.



FIG. 10 depicts a mounting 110 in accordance with another embodiment of the present invention. Mounting 110 is the same as mounting 101 of FIG. 1, except that two packages 12 are independently mounted on opposing sides of substrate 10. In particular, a first package 12 is mounted on the surface 10b of substrate 10, as in FIG. 1, and a second package 12 is mounted on first surface 10a of substrate 10. The body 24 of each package 12 is in aperture 10c, such that their respective first surfaces 24a are juxtaposed. Substrate 10 must be sufficiently thick in this embodiment that each package will fit within aperture 10c. If desired, the two packages 10 may be electrically interconnected by providing metal vias through substrate 10 between the respective metal traces 20 of first surface 10a and second surface 10b. With both packages 12 in aperture 10c, a low combined height above mounting surfaces 10a, 10b is achieved while doubling the mounting density.


Practitioners will appreciate that the embodiments described herein are exemplary only, and not limiting. The present invention includes all that fits within the literal and equitable bounds of the claims.

Claims
  • 1. A semiconductor package comprising: a die pad having opposed, generally planar first and second surfaces, and peripheral side surfaces which extend between the first and second surfaces;a plurality of leads extending at least partially about the die pad in spaced relation to the side surfaces thereof, each of the leads having: opposed, generally planar first and second surfaces;peripheral side surfaces extending between the first and second surfaces;an inner lead portion defining an inner end surface; andan outer lead portion, a portion of the first surface defined by the outer lead portion being sized and configured for electrical connection to a conductive terminal;a semiconductor chip including an active surface having a plurality of conductive bond pads thereon, a portion of the active surface being attached to the first surface of the die pad, with the semiconductor chip and the leads being sized and oriented relative to each other such that each of the bond pads at least partially overlaps and is electrically connected to the first surface of a respective one of the leads; anda package body at least partially encapsulating the semiconductor chip, the die pad, and the leads such that the inner lead portion of each of the leads is within the package body and the outer lead portion of each of the leads extends out of the package body.
  • 2. The semiconductor package of claim 1 wherein the inner end surface of each of the leads and portions of the first and side surfaces of each of the leads which extend along the inner lead portion thereof are covered by the package body.
  • 3. The semiconductor package of claim 2 wherein: the package body has opposed, generally planar first and second surfaces; anda portion of the second surface of each of the leads which extends along the inner lead portion thereof is exposed in and substantially flush with the second surface of the package body.
  • 4. The semiconductor package of claim 3 wherein the first and side surfaces of the die pad are covered by the package body.
  • 5. The semiconductor package of claim 4 wherein the second surface of the die pad is exposed in and substantially flush with the second surface of the package body.
  • 6. The semiconductor package of claim 1 wherein: each of the leads includes an undercut region which is disposed in the second surface thereof and extends to the inner end surface thereof; andthe undercut region of each of the leads is covered by the package body.
  • 7. The semiconductor package of claim 6 wherein: the die pad includes an undercut region which is disposed in the second surface thereof and extends to the side surfaces thereof; andthe undercut region of the die pad is covered by the package body.
  • 8. The semiconductor package of claim 1 further in combination with a second semiconductor chip attached to the semiconductor chip and electrically connected to at least one of the leads, the second semiconductor chip being covered by the package body.
  • 9. A semiconductor package comprising: a die pad having opposed, generally planar first and second surfaces, and peripheral side surfaces which extend between the first and second surfaces;a plurality of leads extending at least partially about the die pad in spaced relation to the side surfaces thereof, each of the leads having: opposed, generally planar first and second surfaces;peripheral side surfaces extending between the first and second surfaces;an inner lead portion defining an inner end surface; andan outer lead portion;a package body at least partially encapsulating the die pad and the leads such that the first surface of the die pad and a portion of the first surface of each of the leads extending along the inner lead portion thereof are exposed in a cavity defined by the package body, and the outer lead portion of each of the leads extends out of the package body; anda semiconductor chip disposed within the cavity and attached to the first surface of the die pad, the semiconductor chip being electrically connected to at least one of the leads.
  • 10. The semiconductor package of claim 9 wherein the inner end surface of each of the leads and portions of the side surfaces of each of the leads which extend along the inner lead portion thereof are covered by the package body.
  • 11. The semiconductor package of claim 10 wherein: the package body has a generally planar second surface; anda portion of the second surface of each of the leads which extends along the inner lead portion thereof is exposed in and substantially flush with the second surface of the package body.
  • 12. The semiconductor package of claim 11 wherein the first and side surfaces of the die pad are covered by the package body.
  • 13. The semiconductor package of claim 12 wherein the second surface of the die pad is exposed in and substantially flush with the second surface of the package body.
  • 14. The semiconductor package of claim 9 wherein the semiconductor chip is electrically connected to the first surface of at least one of the leads via a conductive wire which is disposed within the cavity of the package body.
  • 15. The semiconductor package of claim 9 further in combination with a lid attached to the package body and enclosing the cavity thereof.
RELATED APPLICATIONS

The present application is a continuation of U.S. application Ser. No. 10/340,256 entitled MOUNTING FOR A PACKAGE CONTAINING A CHIP filed Jan. 10, 2003, now U.S. Pat. No. 6,777,789, which is a continuation of U.S. application Ser. No. 09/813,485 entitled MOUNTING FOR A PACKAGE CONTAINING A CHIP filed Mar. 20, 2001 and issued as U.S. Pat. No. 6,545,345 on Apr. 8, 2003.

US Referenced Citations (285)
Number Name Date Kind
2596993 Gookin May 1952 A
3435815 Forcier Apr 1969 A
3734660 Davies et al. May 1973 A
3838984 Crane et al. Oct 1974 A
4054238 Lloyd et al. Oct 1977 A
4189342 Kock Feb 1980 A
4258381 Inaba Mar 1981 A
4289922 Devlin Sep 1981 A
4301464 Otsuki et al. Nov 1981 A
4332537 Slepcevic Jun 1982 A
4417266 Grabbe Nov 1983 A
4451224 Harding May 1984 A
4530152 Roche et al. Jul 1985 A
4541003 Otsuka et al. Sep 1985 A
4646710 Schmid et al. Mar 1987 A
4707724 Suzuki et al. Nov 1987 A
4727633 Herrick Mar 1988 A
4737839 Burt Apr 1988 A
4756080 Thorp, Jr. et al. Jul 1988 A
4812896 Rothgery et al. Mar 1989 A
4862245 Pashby et al. Aug 1989 A
4862246 Masuda et al. Aug 1989 A
4907067 Derryberry Mar 1990 A
4920074 Shimizu et al. Apr 1990 A
4935803 Kalfus et al. Jun 1990 A
4942454 Mori et al. Jul 1990 A
4987475 Schlesinger et al. Jan 1991 A
5018003 Yasunaga et al. May 1991 A
5029386 Chao et al. Jul 1991 A
5041902 McShane Aug 1991 A
5057900 Yamazaki Oct 1991 A
5059379 Tsutsumi et al. Oct 1991 A
5065223 Matsuki et al. Nov 1991 A
5070039 Johnson et al. Dec 1991 A
5087961 Long et al. Feb 1992 A
5091341 Asada et al. Feb 1992 A
5096852 Hobson Mar 1992 A
5118298 Murphy Jun 1992 A
5151039 Murphy Sep 1992 A
5157475 Yamaguchi Oct 1992 A
5157480 McShane et al. Oct 1992 A
5168368 Gow, 3rd et al. Dec 1992 A
5172213 Zimmerman Dec 1992 A
5172214 Casto Dec 1992 A
5175060 Enomoto et al. Dec 1992 A
5200362 Lin et al. Apr 1993 A
5200809 Kwon Apr 1993 A
5214845 King et al. Jun 1993 A
5216278 Lin et al. Jun 1993 A
5218231 Kudo Jun 1993 A
5221642 Burns Jun 1993 A
5250841 Sloan et al. Oct 1993 A
5252853 Michii Oct 1993 A
5258094 Furui et al. Nov 1993 A
5266834 Nishi et al. Nov 1993 A
5273938 Lin et al. Dec 1993 A
5277972 Sakumoto et al. Jan 1994 A
5278446 Nagaraj et al. Jan 1994 A
5279029 Burns Jan 1994 A
5281849 Singh Deo et al. Jan 1994 A
5294897 Notani et al. Mar 1994 A
5327008 Djennas et al. Jul 1994 A
5332864 Liang et al. Jul 1994 A
5335771 Murphy Aug 1994 A
5336931 Juskey et al. Aug 1994 A
5343076 Katayama et al. Aug 1994 A
5358905 Chiu Oct 1994 A
5365106 Watanabe Nov 1994 A
5381042 Lerner et al. Jan 1995 A
5391439 Tomita et al. Feb 1995 A
5406124 Morita et al. Apr 1995 A
5410180 Fujii et al. Apr 1995 A
5414299 Wang et al. May 1995 A
5424576 Djennas et al. Jun 1995 A
5428248 Cha Jun 1995 A
5435057 Bindra et al. Jul 1995 A
5444301 Song et al. Aug 1995 A
5452511 Chang Sep 1995 A
5454905 Fogelson Oct 1995 A
5474958 Djennas et al. Dec 1995 A
5484274 Neu Jan 1996 A
5493151 Asada et al. Feb 1996 A
5508556 Lin Apr 1996 A
5517056 Bigler et al. May 1996 A
5521429 Aono et al. May 1996 A
5528076 Pavio Jun 1996 A
5534467 Rostoker Jul 1996 A
5539251 Iverson et al. Jul 1996 A
5543657 Diffenderfer et al. Aug 1996 A
5544412 Romero et al. Aug 1996 A
5545923 Barber Aug 1996 A
5581122 Chao et al. Dec 1996 A
5592019 Ueda et al. Jan 1997 A
5592025 Clark et al. Jan 1997 A
5594274 Suetaki Jan 1997 A
5595934 Kim Jan 1997 A
5604376 Hamburgen et al. Feb 1997 A
5608267 Mahulikar et al. Mar 1997 A
5625222 Yoneda et al. Apr 1997 A
5633528 Abbott et al. May 1997 A
5639990 Nishihara et al. Jun 1997 A
5640047 Nakashima Jun 1997 A
5641997 Ohta et al. Jun 1997 A
5643433 Fukase et al. Jul 1997 A
5644169 Chun Jul 1997 A
5646831 Manteghi Jul 1997 A
5650663 Parthasaranthi Jul 1997 A
5661088 Tessier et al. Aug 1997 A
5665996 Williams et al. Sep 1997 A
5673479 Hawthorne Oct 1997 A
5683806 Sakumoto et al. Nov 1997 A
5689135 Ball Nov 1997 A
5696666 Miles et al. Dec 1997 A
5701034 Marrs Dec 1997 A
5703407 Hori Dec 1997 A
5710064 Song et al. Jan 1998 A
5723899 Shin Mar 1998 A
5724233 Honda et al. Mar 1998 A
5736432 Mackessy Apr 1998 A
5745984 Cole, Jr. et al. May 1998 A
5753532 Sim May 1998 A
5753977 Kusaka et al. May 1998 A
5756380 Berg et al. May 1998 A
5766972 Takahashi et al. Jun 1998 A
5770888 Song et al. Jun 1998 A
5776798 Quan et al. Jul 1998 A
5783861 Son Jul 1998 A
5801440 Chu et al. Sep 1998 A
5814877 Diffenderfer et al. Sep 1998 A
5814881 Alagaratnam et al. Sep 1998 A
5814883 Sawai et al. Sep 1998 A
5814884 Davis et al. Sep 1998 A
5817540 Wark Oct 1998 A
5818105 Kouda Oct 1998 A
5821457 Mosley et al. Oct 1998 A
5821615 Lee Oct 1998 A
5834830 Cho Nov 1998 A
5835988 Ishii Nov 1998 A
5844306 Fujita et al. Dec 1998 A
5856911 Riley Jan 1999 A
5859471 Kuraishi et al. Jan 1999 A
5866939 Shin et al. Feb 1999 A
5871782 Choi Feb 1999 A
5874784 Aoki et al. Feb 1999 A
5877043 Alcoe et al. Mar 1999 A
5886397 Ewer Mar 1999 A
5886398 Low et al. Mar 1999 A
5894108 Mostafazadeh et al. Apr 1999 A
5897339 Song et al. Apr 1999 A
5900676 Kweon et al. May 1999 A
5903049 Mori May 1999 A
5903050 Thurairajaratnam et al. May 1999 A
5909053 Fukase et al. Jun 1999 A
5915998 Stidham et al. Jun 1999 A
5917242 Ball Jun 1999 A
5939779 Kim Aug 1999 A
5942794 Okumura et al. Aug 1999 A
5951305 Haba Sep 1999 A
5959356 Oh Sep 1999 A
5969426 Baba et al. Oct 1999 A
5973388 Chew et al. Oct 1999 A
5976912 Fukutomi et al. Nov 1999 A
5977613 Takata et al. Nov 1999 A
5977615 Yamaguchi et al. Nov 1999 A
5977630 Woodworth et al. Nov 1999 A
5981314 Glenn et al. Nov 1999 A
5986333 Nakamura Nov 1999 A
5986885 Wyland Nov 1999 A
6001671 Fjelstad Dec 1999 A
6013947 Lim Jan 2000 A
6018189 Mizuno Jan 2000 A
6020625 Qin et al. Feb 2000 A
6025640 Yagi et al. Feb 2000 A
6031279 Lenz Feb 2000 A
RE36613 Ball Mar 2000 E
6034423 Mostafazadeh Mar 2000 A
6040626 Cheah et al. Mar 2000 A
6043430 Chun Mar 2000 A
6060768 Hayashida et al. May 2000 A
6060769 Wark May 2000 A
6072228 Hinkle et al. Jun 2000 A
6072243 Nakanishi Jun 2000 A
6075284 Choi et al. Jun 2000 A
6081029 Yamaguchi Jun 2000 A
6084310 Mizuno et al. Jul 2000 A
6087715 Sawada et al. Jul 2000 A
6087722 Lee et al. Jul 2000 A
6100594 Fukui et al. Aug 2000 A
6113473 Costantini et al. Sep 2000 A
6118174 Kim Sep 2000 A
6118184 Ishio et al. Sep 2000 A
RE36907 Templeton, Jr. et al. Oct 2000 E
6130115 Okumura et al. Oct 2000 A
6130473 Mostafazadeh et al. Oct 2000 A
6133623 Otsuki et al. Oct 2000 A
6140154 Hinkle et al. Oct 2000 A
6143981 Glenn Nov 2000 A
6169329 Farnworth et al. Jan 2001 B1
6177718 Kozono Jan 2001 B1
6181002 Juso et al. Jan 2001 B1
6184465 Corisis Feb 2001 B1
6184573 Pu Feb 2001 B1
6194777 Abbott et al. Feb 2001 B1
6197615 Song et al. Mar 2001 B1
6198171 Huang et al. Mar 2001 B1
6201186 Daniels et al. Mar 2001 B1
6201292 Yagi et al. Mar 2001 B1
6204554 Ewer et al. Mar 2001 B1
6208020 Minamio Mar 2001 B1
6208021 Ohuchi et al. Mar 2001 B1
6208023 Nakayama et al. Mar 2001 B1
6211462 Carter, Jr. et al. Apr 2001 B1
6218731 Huang et al. Apr 2001 B1
6222258 Asano et al. Apr 2001 B1
6225146 Yamaguchi et al. May 2001 B1
6229200 McLellan et al. May 2001 B1
6229205 Jeong et al. May 2001 B1
6239367 Hsuan et al. May 2001 B1
6239384 Smith et al. May 2001 B1
6242281 Mclellan et al. Jun 2001 B1
6256200 Lam et al. Jul 2001 B1
6258629 Niones et al. Jul 2001 B1
6281566 Magni Aug 2001 B1
6281568 Glenn et al. Aug 2001 B1
6282095 Houghton et al. Aug 2001 B1
6285075 Combs et al. Sep 2001 B1
6291271 Lee et al. Sep 2001 B1
6291273 Miyaki et al. Sep 2001 B1
6294100 Fan et al. Sep 2001 B1
6294830 Fjelstad Sep 2001 B1
6295977 Ripper et al. Oct 2001 B1
6297548 Moden et al. Oct 2001 B1
6303984 Corisis Oct 2001 B1
6303997 Lee Oct 2001 B1
6307272 Takahashi et al. Oct 2001 B1
6309909 Ohgiyama Oct 2001 B1
6316822 Venkateshwaran et al. Nov 2001 B1
6316838 Ozawa et al. Nov 2001 B1
6323550 Martin et al. Nov 2001 B1
6326243 Suzuya et al. Dec 2001 B1
6326244 Brooks et al. Dec 2001 B1
6326678 Karnezos et al. Dec 2001 B1
6335564 Pour Jan 2002 B1
6337510 Chun-Jen et al. Jan 2002 B1
6339255 Shin Jan 2002 B1
6348726 Bayan et al. Feb 2002 B1
6355502 Kang et al. Mar 2002 B1
6369447 Mori Apr 2002 B2
6369454 Chung Apr 2002 B1
6373127 Baudouin et al. Apr 2002 B1
6380048 Boon et al. Apr 2002 B1
6384472 Huang May 2002 B1
6388336 Venkateshwaran et al. May 2002 B1
6395578 Shin et al. May 2002 B1
6400004 Fan et al. Jun 2002 B1
6410979 Abe Jun 2002 B2
6414385 Huang et al. Jul 2002 B1
6420779 Sharma et al. Jul 2002 B1
6429508 Gang Aug 2002 B1
6437429 Su et al. Aug 2002 B1
6444499 Swiss et al. Sep 2002 B1
6448633 Yee et al. Sep 2002 B1
6452279 Shimoda Sep 2002 B2
6464121 Reijnders Oct 2002 B2
6476469 Hung et al. Nov 2002 B2
6476474 Hung Nov 2002 B1
6482680 Khor et al. Nov 2002 B1
6498099 McLellan et al. Dec 2002 B1
6498392 Azuma Dec 2002 B2
6507096 Gang Jan 2003 B2
6507120 Lo et al. Jan 2003 B2
6534849 Gang Mar 2003 B1
6545345 Glenn et al. Apr 2003 B1
6559525 Huang May 2003 B2
6566168 Gang May 2003 B2
20010008305 McLellan et al. Jul 2001 A1
20010014538 Kwan et al. Aug 2001 A1
20020011654 Kimura Jan 2002 A1
20020024122 Jung et al. Feb 2002 A1
20020027297 Ikenaga et al. Mar 2002 A1
20020140061 Lee Oct 2002 A1
20020140068 Lee et al. Oct 2002 A1
20020163015 Lee et al. Nov 2002 A1
20030030131 Lee et al. Feb 2003 A1
20030073265 Hu et al. Apr 2003 A1
Foreign Referenced Citations (65)
Number Date Country
19734794 Aug 1997 DE
0393997 Oct 1990 EP
0459493 Dec 1991 EP
0720225 Mar 1996 EP
0720234 Mar 1996 EP
0794572 Oct 1997 EP
0844665 May 1998 EP
0936671 Aug 1999 EP
0989608 Mar 2000 EP
1032037 Aug 2000 EP
55163868 Dec 1980 JP
5745959 Mar 1982 JP
58160096 Aug 1983 JP
59208756 Nov 1984 JP
59227143 Dec 1984 JP
60010756 Jan 1985 JP
60116239 Aug 1985 JP
60195957 Oct 1985 JP
60231349 Nov 1985 JP
6139555 Feb 1986 JP
629639 Jan 1987 JP
63067762 Mar 1988 JP
63205935 Aug 1988 JP
63233555 Sep 1988 JP
63249345 Oct 1988 JP
63316470 Dec 1988 JP
64054749 Mar 1989 JP
1106456 Apr 1989 JP
1175250 Jul 1989 JP
1205544 Aug 1989 JP
1251747 Oct 1989 JP
3177060 Aug 1991 JP
4098864 Sep 1992 JP
5129473 May 1993 JP
5166992 Jul 1993 JP
5283460 Oct 1993 JP
692076 Apr 1994 JP
6140563 May 1994 JP
6260532 Sep 1994 JP
7297344 Nov 1995 JP
7312405 Nov 1995 JP
864634 Mar 1996 JP
8083877 Mar 1996 JP
8125066 May 1996 JP
8222682 Aug 1996 JP
8306853 Nov 1996 JP
98205 Jan 1997 JP
98206 Jan 1997 JP
98207 Jan 1997 JP
992775 Apr 1997 JP
9293822 Nov 1997 JP
10022447 Jan 1998 JP
10163401 Jun 1998 JP
10199934 Jul 1998 JP
10256240 Sep 1998 JP
00150765 May 2000 JP
556398 Oct 2000 JP
2001060648 Mar 2001 JP
200204397 Aug 2002 JP
941979 Jan 1994 KR
9772358 Nov 1997 KR
100220154 Jun 1999 KR
0049944 Jun 2002 KR
9956316 Nov 1999 WO
9967821 Dec 1999 WO
Continuations (2)
Number Date Country
Parent 10340256 Jan 2003 US
Child 10688138 US
Parent 09813485 Mar 2001 US
Child 10340256 US