The present invention relates to a power semiconductor device used for motor control, for example, in electric railway use, on industrial equipment, or on consumer equipment.
It is necessary for semiconductor manufacturers to determine, for example, a rated current, a rated voltage and a circuit configuration in designing a semiconductor device according to use of the semiconductor device and to provide parts and perform manufacture management according to a lineup of various semiconductor devices. Simultaneously, users are required to make preparations for and management of semiconductor devices for pieces of equipment. A semiconductor device has a number of semiconductor chips mounted therein. When even only one of the semiconductor chips is broken, a need arises to replace the entire device because it is difficult to make internal repairs in the device. The unit price of a semiconductor chip using SiC in particular is higher than that of an Si chip and replacement of the entire devices means a large loss. There has been such a high-cost problem. To cope with this, a semiconductor device in which two semiconductor modules are connected by a wiring bus bar has been provided (see, for example, Patent Literature 1).
With the conventional semiconductor device, however, there is a problem of an increase in the number of component parts and an increase in the entire size of the semiconductor device because of the use of a wiring bus bar.
The present invention has been achieved to solve the above-described problem and an object of the present invention is to provide a semiconductor device capable of reducing the cost and the number of component parts and being reduced in size.
A semiconductor device according to the present invention includes: first and second semiconductor modules, wherein each of the first and second semiconductor modules includes a semiconductor chip, a case surrounding the semiconductor chip, and a main electrode connected to the semiconductor chip and led out to an upper surface of case; and a connecting electrode connected and fixed to the main electrodes of the first and second semiconductor modules, wherein the connecting electrode is formed only of a metal plate.
The present invention makes it possible to reduce the cost and the number of component parts and enable reduction of the device in size.
A semiconductor device according to the embodiments of the present invention will be described with reference to the drawings. The same components will be denoted by the same symbols, and the repeated description thereof may be omitted.
Embodiment 1
Metal platings 13 and 14 are provided on the insulating substrate 10. A collector electrode of the IGBT 2 and a cathode electrode of the FWD 3 are joined to the metal plating 13 by solder 12. An emitter electrode of the IGBT 2 and an anode electrode of the FWD 3 are connected to the metal plating 14 by wires 15. The collector main electrode 5 and the emitter main electrode 6 are connected to the metal platings 13 and 14, respectively, by solder 12.
A gate electrode of the IGBT 2 is connected to the drive substrate 11 by wires 15. The drive substrate 11 is led out to the outside of the module through a metal electrode or a special-purpose substrate. The drive substrate 11 has a resistor connected between the gate electrode of the IGBT 2 and a gate drive circuit. With this resistor, operating variation between chips caused when a multiplicity of IGBTs 2 are connected in parallel with each other can be reduced.
The case 4 surrounds the IGBT 2, the FWD 3 and the other components. The IGBT 2, the FWD 3 and the other components are encapsulated in an encapsulating material 16 such as a resin. The connecting electrode 7 is connected and fixed to the collector main electrode 5 of the semiconductor module 1a and the emitter main electrode 6 of the semiconductor module 1b by inserting the bolts 8 in nuts on the case 4 side and fastening the bolts 8.
In the present embodiment, as described above, the collector main electrode 5 of the semiconductor module 1a and the emitter main electrode 6 of the semiconductor module 1b are connected to each other by using the connecting electrode 7. The rated current, the rated voltage and the circuit configuration, for example, can easily be changed by changing the connection using the connecting electrode 7, thus enabling reduction of the design time and facilitating manufacture management. Only a malfunctioning one of the semiconductor modules 1a and 1B may be replaced. There is, therefore, no need to replace the entire device. As a result, a reduction in cost can be achieved. In the present embodiment, the connecting electrode 7 is formed of an electrically conductive plate and, therefore, enables reduction of the number of component parts and reduction of the device in size in comparison with the conventional wiring bus bar.
Preferably, the upper surfaces of the collector main electrode 5 and the emitter main electrode 6 are flush with the upper surfaces of the cases 4. The current path is thereby made shorter to reduce the wiring inductance.
Embodiment 2
Embodiment 3
Embodiment 4
The main electrode of one of the semiconductor modules is thus provided with a connecting electrode function to eliminate the need for a separate connecting electrode for connection between the semiconductor modules. The method of making the connection at one position improves the working facility.
Embodiment 5
Embodiment 6
Embodiment 7
Embodiment 8
In Embodiments 1 to 8, each of the semiconductor modules 1a and 1b has an Si-IGBT and an Si diode. However, the present invention is not limited to this. One of an Si-IGBT, an Si diode, an SiC-IGBT, an SiC-MOSFET and an SiC diode or a combination of some of these transistors and diodes may be used as a semiconductor chip. A semiconductor chip formed of SiCs has a high withstand voltage and a high allowable current density and can therefore be reduced in size. When this semiconductor device reduced in size is used, a semiconductor device incorporating the semiconductor chip can also be reduced in size. Also, the heat resistance of the semiconductor chip is high. Therefore, heat radiating fins of a heat sink can be reduced in size and it is possible to form an air cooling portion in place of a water cooling portion. As a result, the device can be further reduced in size. Also, the semiconductor chip has a smaller power loss and a higher efficiency, and the efficiency of the device can therefore be improved.
Filing Document | Filing Date | Country | Kind | 371c Date |
---|---|---|---|---|
PCT/JP2012/071453 | 8/24/2012 | WO | 00 | 11/10/2014 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO2014/030254 | 2/27/2014 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
5956231 | Yamada | Sep 1999 | A |
6313598 | Tamba | Nov 2001 | B1 |
6434008 | Yamada | Aug 2002 | B1 |
20020062973 | Yamada | May 2002 | A1 |
20030067749 | Tamba | Apr 2003 | A1 |
20100295187 | Tsuruoka | Nov 2010 | A1 |
20100315786 | Ochi | Dec 2010 | A1 |
Number | Date | Country |
---|---|---|
201226385 | Apr 2009 | CN |
H02-154457 | Jun 1990 | JP |
H05-160337 | Jun 1993 | JP |
H07-123738 | May 1995 | JP |
H08-186193 | Jul 1996 | JP |
2000-082772 | Mar 2000 | JP |
2001-168278 | Jun 2001 | JP |
2002-170923 | Jun 2002 | JP |
2003-078107 | Mar 2003 | JP |
2010-186953 | Aug 2010 | JP |
2010-287737 | Dec 2010 | JP |
Entry |
---|
Notification of Transmittal of Translation of the International Preliminary Report on Patentability and Translation of Written Opinion of the International Searching Authority; PCT/JP2012/071453; issued on Mar. 5, 2015. |
International Search Report; PCT/JP2012/071453; Nov. 27, 2012. |
An Office Action issued by the Chinese Patent Office on Dec. 1, 2016, which corresponds to Chinese Patent Application No. 201280075360.7 and is related to U.S. Appl. No. 14/400,105; with English language partial translation. |
Number | Date | Country | |
---|---|---|---|
20150138733 A1 | May 2015 | US |