Patent Application
20130082260
The present invention relates to a semiconductor integrated circuit device inspection method and a semiconductor integrated circuit device.
Patent Literature 1 discloses a semiconductor device having a so-called chip-on-chip structure formed by bonding a parent chip and a child chip together. Respective power supply and grounding parts of the parent and child chips are electrically isolated from each other. Diodes (protective or parasitic diodes) are connected in reverse between grounding and signal leads and between power supply and signal leads in each chip. For inspecting whether the connection between signal connection bumps is good or not, test probes are attached to the signal connection bump of the parent chip and the grounding connection bump for supplying a grounding potential to the child chip, so as to apply a test voltage thereto, and it is examined whether or not a circuit is formed through the diodes.
Patent Literature 2 discloses a technique concerning a multilayer module constructed by stacking a plurality of chips. This multilayer module has a plurality of stacked chips and a substrate arranged under the plurality of chips. Each chip has mounting pads and inspection conduction pads on its upper face and mounting terminals, inspection conduction terminals electrically connected to the inspection conduction pads, and inspection signal terminals adjacent to the inspection conduction terminals on its lower face. Inspection connectors to connect with the inspection conduction terminals on the lower face of the chip are arranged on the upper face of the substrate, while mounting terminals and inspection conduction terminals are arranged on the lower face of the substrate. In this multilayer module, an inspection pad of the mounted chip and an inspection terminal of a chip to be stacked are connected to each other, and an inspection signal is fed from the inspection terminal of the mounted chip electrically continuous with the inspection pad, so as to perform a continuity test.
Patent Literature 3 discloses a technique concerning a memory system including a plurality of memory modules as respective memory subsystems. In this memory system, which comprises a plurality of DRAM chips stacked on an IO chip and a through-hole electrode connecting each DRAM chip to the IO chip, a system data signal and an inner data signal within each DRAM are converted into each other by the IO chip.
Patent Literature 4 discloses a technique concerning a program such as a CAD tool for estimating a failure position which is a cause of a reaction from a location of the reaction detected by a luminescent microscope or the like and a failure analysis method using the same. This failure analysis method detects light emitted by a transistor formed within a circuit, so as to narrow the location where the circuit fails.
Though techniques for making semiconductor integrated circuits finer have now advanced dramatically, it has gradually been becoming harder for them to be made further finer. Hence, for further improving the integration density, semiconductor integrated circuit devices in which a number of substrates and layers formed with integrated circuits are stacked in their thickness direction have been under development. Since signals must be exchanged between a plurality of integrated circuit layers, electric connection terminals such as bump electrodes are provided between the integrated circuit layers in this semiconductor integrated circuit device.
In such a semiconductor integrated circuit device, the number of connection terminals for connecting the integrated circuit layers to each other increases as the integrated circuit in each integrated circuit layer is larger in scale. This raises the probability of connection failures occurring, thereby necessitating continuity tests for the connection terminals. In particular, performing a continuity test every time a layer is stacked can effectively prevent a new integrated circuit layer from uselessly being stacked on an integrated circuit layer having a connection failure portion.
A method performing probing for each connection terminal such as the method disclosed in Patent Literature 1, for example, necessitates enormous time and labor for inspection when the semiconductor integrated circuit device has a number of connection terminals. The probing may also produce damages and dust on pad surfaces, thereby causing connection failures, and thus is hard to be employed in inline inspections in which a continuity test is performed every time a layer is stacked.
It is an object of the present invention to provide an inspection method and semiconductor integrated circuit device which can inspect, in a short time every time a layer is stacked, whether or not an interlayer connection failure exists in a semiconductor integrated circuit device constructed by stacking a plurality of integrated circuit layers in their thickness direction.
The semiconductor integrated circuit device inspection method in accordance with an embodiment of the present invention is a method for inspecting a semiconductor integrated circuit device constructed by stacking a plurality of integrated circuit layers in a thickness direction thereof, each of the integrated circuit layers including a support layer having front and rear faces and a semiconductor device group and a lead both formed on the front face of the support layer, the method comprising the steps of forming, when making a first of the integrated circuit layers, on the front face a plurality of first inspection rectifier device units connected between a plurality of connection terminals for electrically connecting with a second of the integrated circuit layers and the lead and adapted to emit light in response to a current, each of the first inspection rectifier device units including a rectifier device; forming, when making the second integrated circuit layer, on the front face a plurality of second inspection rectifier device units connected between a plurality of connection terminals for electrically connecting with the first integrated circuit layer and the lead and adapted to emit light in response to a current, each of the second inspection rectifier device units including a rectifier device; causing the front face of the second integrated circuit layer and the first integrated circuit layer to oppose each other when stacking the first and second integrated circuit layers on top of each other; electrically connecting the plurality of connection terminals in the first integrated circuit and the plurality of connection terminals in the second integrated circuit layer to each other and then applying a bias voltage to the first and second inspection rectifier device units through the leads of the first and second integrated circuit layers; and inspecting a connection state between the plurality of connection terminals of the first integrated circuit layer and the plurality of connection terminals of the second integrated circuit layer according to light emissions in the first and second inspection rectifier device units observed on the rear face side of the second integrated circuit layer.
When making a first of integrated circuit layers, this semiconductor integrated circuit device inspection method connects a first inspection rectifier device unit between each of a plurality of (interlayer) connection terminals and a lead. Similarly, when making a second of integrated circuit layers, a second inspection rectifier device unit is connected between each of a plurality of (interlayer) connection terminals and a lead. Each of the first and second inspection rectifier device units includes a rectifier device and emits light in response to a current supplied thereto. In the inspection rectifier device units, the rectifier device itself or a light-emitting device provided separately from the rectifier device may emit light.
After the plurality of connection terminals in the first integrated circuit layer and the plurality of connection terminals in the second integrated circuit layer are electrically connected to each other through bumps, for example, a bias voltage is applied to the first and second inspection rectifier device units through the leads of the first and second integrated circuit layers. If the connection terminals of the first integrated circuit layer and the connection terminals of the second integrated circuit layer are favorably connected to each other here, a current path connecting the lead of the first integrated circuit layer, the first inspection rectifier device unit, the connection terminal of the first integrated circuit layer, the connection terminal of the second integrated circuit layer, the second inspection rectifier device unit, and the lead of the second integrated circuit layer in sequence is constructed, whereby the first and second inspection rectifier device units emit light. When a connection failure occurs between the connection terminals of the first and second integrated circuit layers, however, the above-mentioned current path is cut off between the connection terminals, whereby the first and second inspection rectifier device units emit no light or fail to achieve a predetermined amount of light emission.
That is, the above-mentioned semiconductor integrated circuit device inspection method can inspect the connection state between the plurality of connection terminals of the first integrated circuit layer and the plurality of connection terminals of the second integrated circuit layer according to the light emission of at least one of the first and second inspection rectifier device units. Therefore, it can easily determine whether or not there is a connection failure by collectively observing whether or not there is a light emission corresponding to each of a number of connection terminals, thereby making it possible to inspect whether or not there is a connection failure in a short time every time an integrated circuit layer is stacked.
In the semiconductor integrated circuit device inspection method, the first and second inspection rectifier device units may further include a light-emitting device connected in series to the rectifier device. Alternatively, in the semiconductor integrated circuit device inspection method, the rectifier devices of the first and second inspection rectifier device units may emit light in response to a current. Any of these structures can favorably achieve the above-mentioned first and second inspection rectifier device units.
In the semiconductor integrated circuit device inspection method, at least one of the first and second integrated circuit layers may further be formed with a voltage application unit for generating the bias voltage in response to an energy input from outside of the semiconductor integrated circuit device. This can apply the bias voltage without probing, thereby making it possible to further reduce the number of probing operations (or eliminate probing) in the inspection. In this case, the voltage application unit may include a photoelectric transducer for generating an electromotive force in response to light emitted from outside of the semiconductor integrated circuit device. This can favorably achieve the voltage application unit.
The semiconductor integrated circuit device inspection method may be configured such that the lead of the first integrated circuit layer is one of positive power supply and grounding leads formed on the front face of the support layer so as to supply a power supply voltage to the semiconductor device group, the lead of the second integrated circuit layer is the other of the positive power supply and grounding leads formed on the front face of the support layer so as to supply the power supply voltage to the semiconductor device group, the rectifier devices of the plurality of first inspection rectifier device units are connected in reverse to the one lead when making the first integrated circuit layer, and the rectifier devices of the plurality of second inspection rectifier device units are connected in reverse to the other lead when making the second integrated circuit layer.
In this inspection method, the rectifier device of the first inspection rectifier device unit is connected in reverse to one of positive power supply and grounding leads in the first integrated circuit layer, so that no current flows in the first inspection rectifier device unit during normal operation. Similarly, the rectifier device of the second inspection rectifier device unit is connected in reverse to the other of positive power supply and grounding leads in the second integrated circuit layer, so that no current flows in the second inspection rectifier device unit during normal operation. Applying an inspection voltage which is in the forward direction to the first and second inspection rectifier device units (i.e., in a polarity opposite to that of the power supply voltage during normal operation) between the one lead of the first integrated circuit layer and the other lead of the second integrated circuit layer at the time of inspection can supply a current to the first and second inspection rectifier device units, so as to make them emit light. Therefore, this inspection method can inspect whether or not there is an interlayer connection failure by utilizing the existing power supply and grounding leads. The leads of the plurality of integrated circuit layers may also be those provided for inspection independently from the semiconductor device groups.
The semiconductor integrated circuit device in accordance with the present invention is a semiconductor integrated circuit device constructed by stacking a plurality of integrated circuit layers in a thickness direction thereof, each of the integrated circuit layers including a support layer having front and rear faces and a semiconductor device group and a lead both formed on the front face of the support layer; wherein a first of the integrated circuit layers has a plurality of connection terminals for electrically connecting with a second of the integrated circuit layers and a plurality of first inspection rectifier device units formed on the front face, connected between the respective connection terminals and the lead, and adapted to emit light in response to a current, each of the first inspection rectifier device units including a rectifier device; wherein the second of the integrated circuit layers has a plurality of connection terminals for electrically connecting with the first integrated circuit layer and a plurality of second inspection rectifier device units formed on the front face, connected between the respective connection terminals and the lead, and adapted to emit light in response to a current, each of the second inspection rectifier device units including a rectifier device; wherein the front face of the second integrated circuit layer and the first integrated circuit layer oppose each other; wherein the plurality of connection terminals of the first integrated circuit layer and the plurality of connection terminals of the second integrated circuit layer are electrically connected to each other; and wherein the semiconductor integrated circuit device further comprises a voltage application unit for applying a bias voltage to the first and second inspection rectifier device units through the leads of the first and second integrated circuit layers.
In this semiconductor integrated circuit device, a first of integrated circuit layers has a first inspection rectifier device unit connected between each of a plurality of (interlayer) connection terminals and a lead. Similarly, a second of the integrated circuit layers has a second inspection rectifier device unit connected between each of a plurality of (interlayer) connection terminals and a lead. Each of the first and second inspection rectifier device units includes a rectifier device and emits light in response to a current supplied thereto.
The plurality of connection terminals in the first integrated circuit layer and the plurality of connection terminals in the second integrated circuit layer are electrically connected to each other through bumps, for example. Furthermore, the voltage application unit applies a bias voltage to the first and second inspection rectifier device units through the leads of the first and second integrated circuit layers. When the connection terminals of the first integrated circuit layer and the connection terminals of the second integrated circuit layer are favorably connected to each other, the first and second inspection rectifier device units emit light as explained in the above-mentioned inspection method. When a connection failure occurs between the connection terminals of the first and second integrated circuit layers, however, the first and second inspection rectifier device units emit no light.
That is, the above-mentioned semiconductor integrated circuit device can inspect the connection state between the plurality of connection terminals of the first integrated circuit layer and the plurality of connection terminals of the second integrated circuit layer according to the light emission of at least one of the first and second inspection rectifier device units. Therefore, it can easily determine whether or not there is a connection failure by collectively observing whether or not there is a light emission corresponding to each of a number of connection terminals, thereby making it possible to inspect whether or not there is a connection failure in a short time every time an integrated circuit layer is stacked.
In the semiconductor integrated circuit device, the first and second inspection rectifier device units may further include a light-emitting device connected in series to the rectifier device. Alternatively, in the semiconductor integrated circuit device, the rectifier devices of the first and second inspection rectifier device units may emit light in response to a current. Any of these structures can favorably achieve the first and second inspection rectifier device units.
In the semiconductor integrated circuit device, the voltage application unit may be provided with at least one of the first and second integrated circuit layers and generate the bias voltage in response to an energy input from outside of the semiconductor integrated circuit device. This can apply the bias voltage without probing, thereby making it possible to further reduce the number of probing operations (or eliminate probing) in the inspection. In this case, the voltage application unit may include a photoelectric transducer for generating an electromotive force in response to light emitted from outside of the semiconductor integrated circuit device. This can favorably achieve the voltage application unit.
The semiconductor integrated circuit device may be configured such that the lead of the first integrated circuit layer is one of positive power supply and grounding leads formed on the front face of the support layer so as to supply a power supply voltage to the semiconductor device group, the lead of the second integrated circuit layer is the other of the positive power supply and grounding leads formed on the front face of the support layer so as to supply the power supply voltage to the semiconductor device group, the rectifier devices of the plurality of first inspection rectifier device units are connected in reverse to the one lead, and the rectifier devices of the plurality of second inspection rectifier device units are connected in reverse to the other lead.
In this semiconductor integrated circuit device, the rectifier device of the first inspection rectifier device unit is connected in reverse to one of positive power supply and grounding leads in the first integrated circuit layer, so that no current flows in the first inspection rectifier device unit during normal operation. Similarly, the rectifier device of the second inspection rectifier device unit is connected in reverse to the other of positive power supply and grounding leads in the second integrated circuit layer, so that no current flows in the second inspection rectifier device unit during normal operation. Applying an inspection voltage which is in the forward direction to the first and second inspection rectifier device units (i.e., in a polarity opposite to that of the power supply voltage during normal operation) between the one lead of the first integrated circuit layer and the other lead of the second integrated circuit layer at the time of inspection can supply a current to the first and second inspection rectifier device units, so as to make them emit light. Therefore, this semiconductor integrated circuit device can inspect whether or not there is an interlayer connection failure by utilizing the existing power supply and grounding leads. The leads of the plurality of integrated circuit layers may also be those provided for inspection independently from the semiconductor device groups.
The present invention can inspect, in a short time every time a layer is stacked, whether or not an interlayer connection failure exists in a semiconductor integrated circuit device constructed by stacking a plurality of integrated circuit layers in their thickness direction.
In the following, embodiments of the semiconductor integrated circuit device inspection method and semiconductor integrated circuit device in accordance with the present invention will be explained in detail with reference to the accompanying drawings. In the drawings, the same or equivalent parts will be referred to with the same signs while omitting their overlapping descriptions.
The integrated circuit layer 10 comprises the semiconductor substrate 11 having the front face 11a and rear face 11b, a device layer 12 disposed on the front face 11a of the semiconductor substrate 11, a wiring layer 13 disposed on the device layer 12, and a plurality of connection terminals (electrodes) 14 for electrically connecting with the integrated circuit layer 20. Similarly, the integrated circuit layer 20 comprises the semiconductor substrate 21 having the front face 21a and rear face 21b, a device layer 22 disposed on the front face 21a of the semiconductor substrate 21, a wiring layer 23 disposed on the device layer 22, and a plurality of connection terminals (electrodes) 24 for electrically connecting with the integrated circuit layer 10.
The semiconductor substrates 11, 21 are made of silicon, for example. The semiconductor substrates 11, 21 are support layers for the integrated circuit layers 10, 20. Each of the device layers 12, 22 includes a semiconductor device group constituted by a plurality of semiconductor devices such as transistors, for example. The plurality of semiconductor devices are formed through a semiconductor process such as ion implantation on the front faces 11a, 21a of the semiconductor substrates 11, 21. The plurality of semiconductor devices may also be those formed by epitaxially growing semiconductor crystals on the semiconductor substrates 11, 21. The plurality of semiconductor devices may also be those formed by a semiconductor process such as ALD (Atomic Layer Deposition), for example, which does not use the ion implantation.
The wiring layers 13, 23 include a plurality of leads for electrically connecting a plurality of semiconductor devices included in the device layers 12, 22 to each other. The plurality of leads include not only signal leads for connecting the semiconductor devices to each other, but also positive power supply leads 13a, 23a and grounding leads 13b, 23b for applying a power supply voltage to the plurality of semiconductor devices. In this embodiment, the positive power supply lead 13a and grounding lead 13b of the integrated circuit layer 10 and the positive power supply lead 23a and grounding lead 23b of the integrated circuit layer 20 are arranged independently from each other and not mutually connected at the time of inspection.
The plurality of connection terminals 14, 24 are disposed on their corresponding wiring layers 13, 23. The plurality of connection terminals 14 in the integrated circuit layer 10 and the plurality of connection terminals 24 in the integrated circuit layer 20 are arranged on their corresponding front faces 11a, 21a at such positions as to oppose each other, while coming into contact with each other, so as to connect with each other electrically. Each of the plurality of connection terminals 14, 24 is favorably constituted by a bump electrode, for example.
The integrated circuit layer 10 further comprises a plurality of first inspection rectifier device units 15. The plurality of inspection rectifier device units 15 are formed in the device layer 12 and correspond one-to-one to the plurality of connection terminals 14 for the signal leads. Each of the plurality of inspection rectifier device units 15 has rectifier devices 15a, 15b. An example of the rectifier devices 15a, 15b are diodes. The rectifier device 15a is connected in reverse between the positive power supply lead 13a and connection terminal 14 of the integrated circuit layer 10, while the rectifier device 15b is connected in reverse between the grounding lead 13b and connection terminal 14 of the integrated circuit layer 10. More specifically, the cathode of the rectifier device 15a and the positive power supply lead 13a are connected to each other, while the anode of the rectifier device 15a and the connection terminal 14 are connected to each other. The anode of the rectifier device 15b and the grounding lead 13b are connected to each other, while the cathode of the rectifier device 15b and the connection terminal 14 are connected to each other. For easier understanding,
The inspection rectifier device unit 15 has a structure for emitting light in response to a current. Such a structure can be achieved more favorably if the rectifier devices 15a, 15b emit light themselves in response to a current, for example. It can also be achieved favorably if the inspection rectifier device unit 15 further comprises two light-emitting devices connected in series to the rectifier devices 15a, 15b, respectively.
The integrated circuit layer 20 further comprises a plurality of second inspection rectifier device units 25. The plurality of inspection rectifier device units 25 are formed in the device layer 22 and correspond one-to-one to the plurality of connection terminals 24 for the signal leads. Each of the plurality of inspection rectifier device units 25 has rectifier devices 25a, 25b. An example of the rectifier devices 25a, 25b are diodes. The rectifier device 25a is connected in reverse between the positive power supply lead 23a and connection terminal 24 of the integrated circuit layer 20, while the rectifier device 25b is connected in reverse between the grounding lead 23b and connection terminal 24 of the integrated circuit layer 20. More specifically, the cathode of the rectifier device 25a and the positive power supply lead 23a are connected to each other, while the anode of the rectifier device 25a and the connection terminal 24 are connected to each other. The anode of the rectifier device 25b and the grounding lead 23b are connected to each other, while the cathode of the rectifier device 25b and the connection terminal 24 are connected to each other. For easier understanding,
The inspection rectifier device unit 25 has a structure for emitting light in response to a current. Such a structure can be achieved more favorably if the rectifier devices 25a, 25b emit light themselves in response to a current. It can also be achieved favorably if the inspection rectifier device unit 25 further comprises two light-emitting devices connected in series to the rectifier devices 25a, 25b, respectively.
An inspection rectifier device unit having light-emitting devices connected in series to rectifier devices will now be explained by way of example.
As illustrated in
Reference will be made to
The semiconductor integrated circuit device 1A further comprises an adhesive layer 7a. The adhesive layer 7a is disposed in a gap between the integrated circuit layers 10, 20 and mechanically bonds them together. The adhesive layer 7a preferably includes a material which can block light from the inspection rectifier device units 15.
An inspection method of the semiconductor integrated circuit device 1A explained in the foregoing will now be explained.
First, the integrated circuit layers 10, 20 are made individually (integrated circuit layer formation step S11). Specifically, the semiconductor substrate 11 for the integrated circuit layer 10 is prepared, and the device layer 12 is formed on the front face 11a of the semiconductor substrate 11. Here, the inspection rectifier device units 15 (rectifier devices 15a, 15b) are formed in the device layer 12 together with the semiconductor device group. Subsequently, the wiring layer 13 is formed on the device layer 12. Here, the plurality of connection terminals 14 for electrically connecting with the integrated circuit layer 20, the positive power supply lead 13a, and the grounding lead 13b are formed within or on the wiring layer 13. Also, a lead is formed to connect with the rectifier device 15a between the connection terminal 14 and the positive power supply lead 13a, and a lead is formed to connect with the rectifier device 15b between the connection terminal 14 and the grounding lead 13b. In this step S11, it is desirable to perform an operation test of the integrated circuit layer 10, so as to check to see if the semiconductor device group of the device layer 12 has no abnormality.
The integrated circuit layer 20 is formed as with the integrated circuit layer 10. That is, the semiconductor substrate 21 for the integrated circuit layer 20 is prepared, and the device layer 22 is formed on the front face 21a of the semiconductor substrate 21. Here, the inspection rectifier device units 25 (rectifier devices 25a, 25b) are formed in the device layer 22 together with the semiconductor device group. Subsequently, the wiring layer 23 is formed on the device layer 22. Here, the plurality of connection terminals 24 for electrically connecting with the integrated circuit layer 10, the positive power supply lead 23a, and the grounding lead 23b are formed within or on the wiring layer 23. Also, a lead is formed to connect with the rectifier device 25a between the connection terminal 24 and the positive power supply lead 23a, and a lead is formed to connect with the rectifier device 25b between the connection terminal 24 and the grounding lead 23b. In this step S11, it is desirable to perform an operation test of the integrated circuit layer 20, so as to check to see if the semiconductor device group of the device layer 22 has no abnormality.
Next, the integrated circuit layers 10, 20 are bonded together (bonding step S12). That is, the integrated circuit layers 10, 20 are attached to each other through the adhesive layer 7a such that the front face 11a of the semiconductor substrate 11 and the front face 21a of the semiconductor substrate 21 oppose each other. Simultaneously, the plurality of connection terminals 14 of the integrated circuit layer 10 and the plurality of connection terminals 24 of the integrated circuit layer 20 are joined to each other, so as to be electrically connected to each other. In this bonding step, each of the integrated circuit layers 10, 20 may be a single chip cut from a wafer, an assembly containing a plurality of chips, or in the state of a wafer before cutting.
Subsequently, a bias voltage is applied to the inspection rectifier device units 15, 25 (first inspection voltage application step S13). That is, an inspection bias voltage having a positive potential on the grounding lead 23b side is applied between the positive power supply lead 13a of the integrated circuit layer 10 and the grounding lead 23b of the integrated circuit layer 20 through probes brought into contact with the connection terminals 26b, 26c, respectively. As a consequence, a forward bias voltage is applied to the rectifier device 15a of the inspection rectifier device unit 15 and the rectifier device 25b of the inspection rectifier device unit 25. Hence, a forward current flows in the rectifier devices 15a, 25b, so that the rectifier devices 15a, 25b (or other light-emitting devices connected in series thereto) emit light if the connection between the connection terminals 14, 24 is normal.
Then, according to at least one of the light emission of the inspection rectifier device unit 25 observed on the rear face 21b side of the integrated circuit layer 20 and the light emission of the inspection rectifier device unit 15 observed on the rear face 11b side of the integrated circuit layer 10, the connection state between a plurality of connection terminals 14 of the integrated circuit layer 10 and a plurality of connection terminals 24 of the integrated circuit layer 20 is inspected (first inspection step S14). Specifically, an image of the semiconductor integrated circuit device 1A is captured from the rear face 21b side of the integrated circuit layer 20 or from the rear face 11b side of the integrated circuit layer 10. Then, a bright point (the light emission of the inspection rectifier device unit 15 or 25) on the image data and a bright point on a reference data concerning a light emission position of the inspection rectifier device unit 15 or 25 prepared beforehand are compared with each other. When the inspection rectifier device unit 15 or 25 does not emit light or fails to achieve a predetermined amount of light emission at the position to emit light as a result of the comparison, it is determined that there is a connection failure between the inspection rectifier device unit 15 or 25 and its corresponding connection terminal 14 or 24.
Next, a bias voltage is applied to the inspection rectifier device units 15, 25 (second inspection voltage application step S15). That is, an inspection bias voltage having a positive potential on the grounding lead 13b side is applied between the grounding lead 13b of the integrated circuit layer 10 and the positive power supply lead 23a of the integrated circuit layer 20 through probes brought into contact with the connection terminals 26a, 26d, respectively. As a consequence, a forward bias voltage is applied to the rectifier device 15b of the inspection rectifier device unit 15 and the rectifier device 25a of the inspection rectifier device unit 25. Hence, a forward current flows in the rectifier devices 15b, 25a, so that the rectifier devices 15b, 25a (or other light-emitting devices connected in series thereto) emit light if the connection between the connection terminals 14, 24 is normal.
Then, according to at least one of the light emission of the inspection rectifier device unit 25 observed on the rear face 21b side of the integrated circuit layer 20 and the light emission of the inspection rectifier device unit 15 observed on the rear face 11b side of the integrated circuit layer 10, the connection state between a plurality of connection terminals 14 of the integrated circuit layer 10 and a plurality of connection terminals 24 of the integrated circuit layer 20 is inspected (second inspection step S16). Specifically, an image of the semiconductor integrated circuit device 1A is captured from the rear face 21b side of the integrated circuit layer 20 or from the rear face 11b side of the integrated circuit layer 10. Then, a bright point (the light emission of the inspection rectifier device unit 15 or 25) included in the image data and a reference data concerning a light emission position of the inspection rectifier device unit 15 or 25 prepared beforehand are compared with each other. When the inspection rectifier device unit 15 or 25 does not emit light or fails to achieve a predetermined amount of light emission at the position to emit light as a result of the comparison, it is determined that there is a connection failure between the inspection rectifier device unit 15 or 25 and its corresponding connection terminal 14 or 24.
When comparing the image data and the reference data with each other, it is necessary for their position to align with each other. Therefore, the light emission image from the inspection rectifier device unit 15 or 25 and the rear face pattern image of the integrated circuit in the integrated circuit layer 10 or 20 are preferably acquired sequentially or simultaneously, so as to align the layout data of the integrated circuit layer 10 or 20 and the rear face pattern image with each other. The light emission image from the inspection rectifier device unit 15 or 25 may be acquired alone, so as to compare the light emission position with a data concerning a characteristic arrangement of the light emission position, thereby achieving the alignment.
The inspection method of this embodiment may perform one of the combinations of steps S13 and S14 and steps S15 and S16 alone. In other words, the inspection rectifier device units 15, 25 may respectively have the rectifier devices 15a, 25b or the rectifier devices 15b, 25a alone. The captured image data obtained in steps S13 and S14 may be compared with each other (or superposed on each other), and the resulting comparison data (or superposition data) may be compared with the reference data, so as to inspect whether or not there is a connection failure. When the rectifier devices 15a, 15b are located close to each other, for example, the light from the rectifier device 15a and the light from the rectifier device 15b may be observed together, so as to increase the reliability of captured image data.
Effects obtained by the inspection method of the semiconductor integrated circuit device 1A and semiconductor integrated circuit device 1A in accordance with this embodiment explained in the foregoing will now be explained together with problems of the prior art.
In recent years, for further improving the integration density of circuits, semiconductor integrated circuit devices in which a number of substrates and layers formed with integrated circuits are stacked in their thickness direction have been under development. In such semiconductor integrated circuit devices, electric (interlayer) connection terminals such as bump electrodes are provided between the integrated circuit layers. The number of connection terminals increases as the integrated circuit of each integrated circuit layer is larger in scale, thereby necessitating continuity tests for the connection terminals. It is also desirable to analyze causes of connection failures in parallel with the manufacturing of semiconductor integrated circuit devices and feed back them to the manufacturing technology.
After completing a semiconductor integrated circuit, however, interlayer connection terminals are hidden within its multilayer structure, so that locations where connection failures occur cannot be specified easily. Therefore, the locations incurring connection failures can be specified if a continuity test of interlayer connection terminals can be preformed every time an integrated circuit layer is stacked. Further, it can effectively prevent a new integrated circuit layer from uselessly being stacked on an integrated circuit layer having a connection failure location.
The above-mentioned inspection method of the semiconductor integrated circuit device 1A in accordance with this embodiment electrically connects a plurality of connection terminals 14 of the integrated circuit layer 10 and a plurality of connection terminals 24 of the integrated circuit layer 20 to each other through bumps, for example, and then applies a bias voltage to the inspection rectifier device units 15, 25 through the positive power supply lead 13a (or grounding lead 13b) of the integrated circuit layer 10 and the grounding lead 23b (or positive power supply lead 23a) of the integrated circuit layer 20. If the connection terminals 14 of the integrated circuit layer 10 and the connection terminals 24 of the integrated circuit layer 20 are favorably connected to each other here, a current path connecting the positive power supply lead 13a (or grounding lead 13b) of the integrated circuit layer 10, the inspection rectifier device unit 15, the connection terminal 14 of the integrated circuit layer 10, the connection terminal 24 of the integrated circuit layer 20, the inspection rectifier device unit 25, and the grounding lead 23b (or positive power supply lead 23a) of the integrated circuit layer 20 in sequence is constructed.
Therefore, the magnitude of the current flowing through this current path is inversely proportional to the total of the resistance values in the positive power supply lead 13a (or grounding lead 13b) and the grounding lead 23b (or positive power supply lead 23a), the resistance values of the connection terminals 14, 24, and the resistance values of the inspection rectifier device units 15, 25. Typically, the resistance values of the power supply and grounding leads are much lower than those of interlayer connection terminals, while the resistance values of inspection rectifier device units (rectifier devices) have been known. Therefore, the amounts of light emissions in the inspection rectifier device units 15, 25 mainly depend on the resistance values of the connection terminals 14, 24, so that the inspection rectifier device units 15, 25 will not emit light if the connection terminals 14, 24 are not in contact with each other (i.e., the resistance value therebetween is infinite). Hence, seeing whether or not the inspection rectifier device units 15, 25 emit light can detect connection failures between the connection terminals 14, 24, and observing the amount of light emission can estimate the resistance value between the connection terminals 14, 24.
That is, the above-mentioned inspection method of the semiconductor integrated circuit device 1A and semiconductor integrated circuit device 1A can inspect connection states between a plurality of connection terminals 14 of the integrated circuit layer 10 and a plurality of connection terminals 24 of the integrated circuit layer 20 according to the light emission of at least one of the inspection rectifier device units 15, 25. Therefore, collectively seeing whether or not there is a light emission corresponding to each of a number of connection terminals 14, 24 can easily determine whether or not there is a connection failure, so that whether or not a connection failure exists can be inspected in a shorter time every time an integrated circuit layer is stacked as compared with a conventional method of sequentially inspecting a plurality of terminals by probing.
When stacking three or more integrated circuit layers, performing an inspection by probing every time an integrated circuit layer is stacked may allow damages, irregularities, dust, and the like on pads to cause failures in subsequent stacking steps. This embodiment can remarkably decrease the number of probing operations or totally eliminate them per stacking and thus can reduce connection failures.
This embodiment can easily inspect whether or not there is a connection failure every time an integrated circuit layer is stacked, thereby making it possible to prevent a normal integrated circuit layer from uselessly being stacked on an integrated circuit layer having incurred a connection failure. It can easily detect connection failure locations inline, so as to accelerate the feedback for improving integrated circuit layers, thereby increasing the yield.
Preferably, as in this embodiment, the lead for applying the inspection bias voltage to the inspection rectifier device unit 15 is the positive power supply lead 13a for supplying the power supply voltage to the semiconductor device group in the device layer 12, while the lead for supplying the inspection bias voltage to the inspection rectifier device unit 25 is the grounding lead 23b for supplying the power supply voltage to the semiconductor device group in the device layer 22. Preferably, in this case, the rectifier device 15a of the inspection rectifier device unit 15 is connected in reverse to the positive power supply lead 13a, while the rectifier device 25b of the inspection rectifier device unit 25 is connected in reverse to the grounding lead 23b.
Preferably, as an alternative, the lead for applying the inspection bias voltage to the inspection rectifier device unit 15 is the grounding lead 13b for supplying the power supply voltage to the semiconductor device group in the device layer 12, while the lead for supplying the inspection bias voltage to the inspection rectifier device unit 25 is the positive power supply lead 23a for supplying the power supply voltage to the semiconductor device group in the device layer 22. Preferably, in this case, the rectifier device 15b of the inspection rectifier device unit 15 is connected in reverse to the grounding lead 13b, while the rectifier device 25a of the inspection rectifier device unit 25 is connected in reverse to the positive power supply lead 23a.
When the semiconductor integrated circuit device 1A has any of the structures mentioned above, the rectifier devices 15a, 15b of the inspection rectifier device unit 15 are connected in reverse to the positive power supply and grounding leads 13a, 13b, respectively, in the integrated circuit layer 10, whereby no current flows in the inspection rectifier device unit 15 during normal operation. Similarly, the rectifier devices 25a, 25b of the inspection rectifier device unit 25 are connected in reverse to the positive power supply and grounding leads 23a, 23b, respectively, in the integrated circuit layer 20, whereby no current flows in the inspection rectifier device unit 25 during normal operation. Applying an inspection voltage which is in the forward direction to the inspection rectifier device units 15, 25 (i.e., in a polarity opposite to that of the power supply voltage during normal operation) through the positive power supply and grounding leads 13a, 23b or the grounding and positive power supply leads 13b, 23a at the time of inspection can supply a current to the inspection rectifier device units 15, 25, so as to make them emit light. Therefore, the semiconductor integrated circuit device 1A having the above-mentioned structure can inspect whether or not there is an interlayer connection failure by utilizing the existing power supply and grounding leads.
While
Though it is desirable for rectifier devices to be arranged very close to the connection terminals and TSVs in order to reduce the additional capacity caused by adding inspection rectifier devices, the connection terminals and TSVs may hinder light emissions from being detected. Hence, providing light-emitting devices separately from the rectifier devices as illustrated in
The following devices are preferred as the rectifier devices 15a and 15b, 25a and 25b, and 35a and 35b. By the rectifier devices are meant herein devices (diodes, transistors, thyristors, and the like) having a junction structure through which a current flows in nonlinear response to a bias voltage. Examples of such a junction structure include a p-n junction which is a junction between a p-type semiconductor and an n-type semiconductor, a junction between a p-type semiconductor and an i (intrinsic)-type semiconductor, a junction between an i-type semiconductor and an n-type semiconductor, a p-i-n junction in which an i-type semiconductor is held between a p-type semiconductor and an n-type semiconductor, a Schottky junction between a semiconductor and a metal, and a tunnel junction holding a thin insulating film, void, or point-contact part, through which a tunnel current flows, in a boundary part. The most preferred among them is the p-n junction. The light emissions in the p-n and p-i-n junctions under forward biasing are mainly recombination emissions, while the light emissions in the p-n and p-i-n junctions under reverse biasing and the light emissions from channels of MOS transistors are mainly hot-carrier emissions. In the tunnel junction, both hot-carrier and recombination emissions can occur. As the rectifier device in this embodiment, a p-n diode also having a light-emitting function is the most preferred.
In a tunnel junction device, there is a case where its forward current and reverse current have substantially the same magnitude. However, the tunnel junction has such a characteristic that no current flows therein under low bias, while a large current flows therein under high bias. Therefore, it can be configured such that a current flows when a high voltage is applied during an inspection, while no current flows under a normal condition of use. At the tunnel junction part, a hot-carrier emission corresponding to the applied voltage difference occurs, and a recombination emission also occurs when one of semiconductors constituting the tunnel junction part is of the p type while the other is of the n type. Hence, it can be used as a rectifier device also having a light-emitting function or a light-emitting device.
In the inspection method of the semiconductor integrated circuit device 1A in accordance with this embodiment, the inspection rectifier device unit 15 of the integrated circuit layer 10 and the inspection rectifier device unit 25 of the integrated circuit layer 20 emit light simultaneously, while the respective wiring layers 13, 23 of the integrated circuit layers 10, 20 exist between the inspection rectifier device units 15, 25. Also, bumps as the connection terminals 14, 24 and the like exist between the integrated circuit layers 10, 20. Therefore, light from the inspection rectifier device units 15, 25 is blocked by the wiring layers 13, 23 and connection terminals 14, 24, so that the light from the inspection rectifier device unit 25 (or 15) is less likely to hinder the light from the inspection rectifier device unit 15 (or 25) from being observed on the side thereof. The wiring density distribution and wiring form may be contrived in the wiring layers 13, 23 so as to block these kinds of light effectively. Materials and components of the adhesive layer 7a may also be selected such as to block these kinds of light effectively.
The integrated circuit layer 30 comprises the semiconductor substrate (support layer) 11 having the front face 11a and rear face 11b, a device layer 12 disposed on the front face 11a of the semiconductor substrate 11, a wiring layer 13 disposed on the device layer 12, and a plurality of connection terminals (electrodes) 34 for electrically connecting with the integrated circuit layer 20. A plurality of leads in the wiring layer 13 include positive power supply and grounding leads 13a, 13b for applying a power supply voltage to a plurality of semiconductor devices.
The plurality of connection terminals 34 are disposed on the rear face 11b of the semiconductor substrate 11. The plurality of connection terminals 34 of the integrated circuit layer 30 and the plurality of connection terminals 24 of the integrated circuit layer 20 are arranged on the rear face 11b and front face 21a at such positions as to oppose each other, while coming into contact with each other, so as to connect with each other electrically. The plurality of connection terminals 34 are favorably constituted by bump electrodes, for example.
The integrated circuit layer 30 has a plurality of first inspection rectifier device units 15 corresponding one-to-one to the plurality of connection terminals 34 for the signal leads. The first inspection rectifier device units 15 are constructed as in the first embodiment. However, the rectifier device 15a is connected in reverse between the positive power supply lead 13a and connection terminal 34 of the integrated circuit layer 30, while the rectifier device 15b is connected in reverse between the grounding lead 13b and connection terminal 34 of the integrated circuit layer 30. The rectifier devices 15a, 15b are connected to the connection terminal 34 through a TSV 37. The TSV 37 is a TSV for connecting leads in the wiring layer 13 and the plurality of connection terminals 34 on the rear face 11b to each other.
The semiconductor integrated circuit device 1B further comprises a handling substrate 8. The handling substrate 8 is bonded to the front face 11a side of the integrated circuit layer 30 by an adhesive layer 7b.
In the semiconductor integrated circuit device 1B in accordance with this embodiment, the inspection method illustrated in
The integrated circuit layer 40 comprises the semiconductor substrate (support layer) 41 having the front face 41a and rear face 41b, a device layer 42 disposed on the front face 41a of the semiconductor substrate 41, a wiring layer 43 disposed on the device layer 42, and a plurality of connection terminals (electrodes) 44 for electrically connecting with the integrated circuit layer 20. The device layer 42 includes a semiconductor device group constituted by a plurality of semiconductor devices.
The wiring layer 43 includes a plurality of leads for electrically connecting a plurality of semiconductor devices included in the device layer 42 to each other. The plurality of leads include positive power supply and grounding leads 43a, 43b for applying a power supply voltage to a plurality of semiconductor devices. In this embodiment, the positive power supply and grounding leads 43a, 43b of the integrated circuit layer 40 and the positive power supply leads 13a, 23a and grounding leads 13b, 23b of the integrated circuit layers 10, 20 are arranged independently from each other and not mutually connected.
The plurality of connection terminals 44 are disposed on the wiring layer 43. A plurality of connection terminals 26 in the integrated circuit layer 20 and the plurality of connection terminals 44 are arranged on the rear face 21b and front face 41a at such positions as to oppose each other, while coming into contact with each other, so as to connect with each other electrically. The plurality of connection terminals 44 are favorably constituted by bump electrodes, for example.
The integrated circuit layer 40 further comprises a plurality of inspection rectifier device units 45. The plurality of inspection rectifier device units 45 are formed on the device layer 42 and correspond one-to-one to the plurality of connection terminals 44 for the signal leads. Each of the plurality of inspection rectifier device units 45 has rectifier devices 45a, 45b. The rectifier device 45a is connected in reverse between the positive power supply lead 43a and connection terminal 44 of the integrated circuit layer 40, while the rectifier device 45b is connected in reverse between the grounding lead 43b and connection terminal 44 of the integrated circuit layer 40. Detailed structural examples and modified examples of the inspection rectifier device units 45 are the same as with the inspection rectifier device units 15, 25 of the first embodiment.
The integrated circuit layer 40 further comprises a plurality of through-silicon vias (TSVs) 47 in order to connect the leads of the wiring layer 43 on the front face 41a of the semiconductor substrate 41 and a plurality of connection terminals (electrodes) 46 on the rear face 41b to each other. The plurality of connection terminals 46 include connection terminals 46a to 46f. The connection terminals 46a, 46b are electrically connected to the positive power supply and grounding leads 43a, 43b through the TSVs 47, respectively. The connection terminal 46c is electrically connected to the positive power supply lead 23a of the integrated circuit layer 20 through the TSV 47, connection terminals 44, 26a, and TSV 27. The connection terminal 46d is electrically connected to the grounding lead 23b of the integrated circuit layer 20 through the TSV 47, connection terminals 44, 26b, and TSV 27. The connection terminal 46e is electrically connected to the positive power supply lead 13a of the integrated circuit layer 10 through the TSV 47, connection terminals 44, 26c, TSV 27, and connection terminals 24, 14. The connection terminal 46f is electrically connected to the grounding lead 13b of the integrated circuit layer 10 through the TSVs 47, connection terminals 44, 26d, TSV 27, and connection terminals 24, 14. Thus, the connection terminals 46a to 46f are provided in order to dispose respective power supply lines of the integrated circuit layers 10, 20, 40 independently from each other. The connection terminals 46a to 46f and the TSVs and connection terminals connected thereto constitute a voltage application unit for applying a bias voltage to the inspection rectifier device units 15, 25, 45.
The semiconductor integrated circuit device 1C further comprises an adhesive layer 6. The adhesive layer 6 is disposed in a gap between the integrated circuit layers 20, 40 and mechanically bonds them together. The adhesive layer 6 preferably includes a material which can block light from the inspection rectifier device unit 25.
In the semiconductor integrated circuit device 1C in accordance with this embodiment, the inspection method illustrated in
The integrated circuit layer 50 comprises the semiconductor substrate (support layer) 51 having the front and rear faces 51a, 51b, a device layer 52 disposed on the front face 51a of the semiconductor substrate 51, a wiring layer 53 disposed on the device layer 52, and a plurality of connection terminals (electrodes) 54 for electrically connecting with the integrated circuit layer 40. The device layer 52 includes a semiconductor device group constituted by a plurality of semiconductor devices.
The wiring layer 53 includes a plurality of leads for electrically connecting a plurality of semiconductor devices included in the device layer 52 to each other. The plurality of leads include positive power supply and grounding leads 53a, 53b for applying a power supply voltage to the plurality of semiconductor devices. In this embodiment, the positive power supply leads 13a, 43a, 53a and grounding leads 13b, 43b, 53b of the integrated circuit layers 10, 40, 50 are arranged independently from each other and not mutually connected.
The plurality of connection terminals 54 are disposed on the wiring layer 53. The plurality of connection terminals 54 and the plurality of connection terminals 44 in the integrated circuit layer 40 are arranged on their corresponding front faces 51a, 41a at such positions as to oppose each other, while coming into contact with each other, so as to connect with each other electrically. Each of the plurality of connection terminals 54 is favorably constituted by a bump electrode, for example.
The integrated circuit layer 50 further comprises a plurality of inspection rectifier device units 55. The plurality of inspection rectifier device units 55 are formed on the device layer 52 and correspond one-to-one to the plurality of connection terminals 54 for the signal leads. Each of the plurality of inspection rectifier device units 55 has rectifier devices 55a, 55b. The rectifier device 55a is connected in reverse between the positive power supply lead 53a and connection terminal 54 of the integrated circuit layer 50, while the rectifier device 55b is connected in reverse between the grounding lead 53b and connection terminal 54 of the integrated circuit layer 50. Detailed structural examples and modified examples of the inspection rectifier device units 55 are the same as with the inspection rectifier device units 15, 25 of the first embodiment.
The integrated circuit layer 50 further comprises a plurality of through-silicon vias (TSVs) 57 in order to connect the leads of the wiring layer 53 on the front face 51a of the semiconductor substrate 51 and a plurality of connection terminals (electrodes) 56 on the rear face 51b to each other. The connection terminals 46c, 46d of the integrated circuit layer 40 are respectively connected to the positive power supply and grounding leads 53a, 53b of the integrated circuit layer 50 through the TSVs 47 and connection terminals 44, 54. The connection terminals 46e, 46f of the integrated circuit layer 40 are respectively connected to the positive power supply and grounding leads 13a, 13b of the integrated circuit layer 10 through the TSVs 47, connection terminals 44, 54, TSVs 57, and connection terminals 56, 14. Thus, the connection terminals 46a to 46f are provided in order to dispose respective power supply lines of the integrated circuit layers 10, 50, 40 independently from each other. The connection terminals 46a to 46f and the TSVs and connection terminals connected thereto constitute a voltage application unit for applying a bias voltage to the inspection rectifier device units 15, 55, 45.
In the semiconductor integrated circuit device 1D in accordance with this embodiment, the inspection method illustrated in
The integrated circuit layer 10B is bonded to the integrated circuit layer 20A such that the rear face 11b of its semiconductor substrate 11 opposes the rear face 21b of a semiconductor substrate 21 in the integrated circuit layer 20A by an adhesive layer 7c.
The integrated circuit layer 10B further comprises a plurality of through-silicon vias (TSVs) 17 in order to connect the leads of the wiring layer 13 on the front face 11a of the semiconductor substrate 11 and a plurality of connection terminals (electrodes) 16 on the rear face 11b to each other. The plurality of connection terminals 16 are arranged so as to correspond one-to-one to a plurality of connection terminals 26 for the signal leads in the integrated circuit layer 20A, whereby the plurality of connection terminals 16 in the integrated circuit layer 10B and the plurality of connection terminals 26 in the integrated circuit layer 20A are electrically connected to each other.
The plurality of connection terminals 26 include terminal electrodes 26a to 26f. The connection terminals 26a, 26b are electrically connected to the positive power supply and grounding leads 23a, 23b of the integrated circuit layer 20B through TSVs 27, respectively. The connection terminal 26c is electrically connected to the positive power supply lead 23a of the integrated circuit layer 20A through the TSV 27 and connection terminal 24 of the integrated circuit layer 20B, the connection terminal 14, TSV 17, and connection terminal 16 of the integrated circuit layer 10B, and the connection terminal 26 and TSV 27 of the integrated circuit layer 20A. The connection terminal 26d is also electrically connected to the grounding lead 23b of the integrated circuit layer 20A through a similar structure. The connection terminal 26e is electrically connected to the positive power supply lead 13a of the integrated circuit layer 10A through the TSV 27 and connection terminal 24 of the integrated circuit layer 20B, the connection terminal 14, TSV 17, and connection terminal 16 of the integrated circuit layer 10B, the connection terminal 26, TSV 27, and connection terminal 24 of the integrated circuit layer 20A, and the connection terminal 14 of the integrated circuit layer 10A. The connection terminal 26f is also electrically connected to the grounding lead 13b of the integrated circuit layer 10A through a similar structure.
Thus, the integrated circuit layer 20B is provided with the connection terminals 26a to 26f in order to dispose respective power supply lines of the integrated circuit layers 10A, 20A, 20B independently from each other in this embodiment. The connection terminals 26a to 26f and the TSVs and connection terminals connected thereto constitute a voltage application unit for applying a bias voltage to the inspection rectifier device units 15, 25.
In the semiconductor integrated circuit device 1E in accordance with this embodiment, the inspection method illustrated in
In particular, in the case where three or more integrated circuit layers are stacked, while an inter-substrate lead such as a bus lead commonly provided among the integrated circuit layers continue over three or more layers, applying an inspection bias voltage between the uppermost integrated circuit layer 20B and the third or later integrated circuit layer 20A as in this embodiment makes it possible to detect connection failures or estimate the resistance value in the three or more integrated circuit layers 20A, 10B, 20B. This embodiment may individually inspect a multilayer body constructed by joining the integrated circuit layers 10A, 20A together and a multilayer body constructed by joining the integrated circuit layers 10B, 20B together, then stack one of the multilayer bodies with the other, and apply an inspection bias voltage between the connection terminals 26a, 26d or between the connection terminals 26b, 26c, thereby making it possible to collectively detect interlayer connection failures between the uppermost layer (integrated circuit layer 20B) and second layer (integrated circuit layer 10B) and between the second layer (integrated circuit layer 10B) and third layer (integrated circuit layer 20A) and connection failures of TSV within the second and third layers.
While the semiconductor integrated circuit device 1E in accordance with this embodiment has a structure in which two semiconductor integrated circuit devices 1A in accordance with the first embodiment are joined together, thus joined two semiconductor integrated circuit devices may have any of the structures of the above-mentioned first to fourth embodiments or combinations of structures different from each other.
The integrated circuit layers 10C, 20C in accordance with this embodiment have connection terminals 14A, 24A in place of the connection terminals 14, 24 in the first embodiment, respectively. The connection terminal 14A is a pad-shaped electrode instead of the bump electrode used in the first embodiment. As the connection terminal 24A, one end of a TSV 28a projects from the front face 21a of the integrated circuit layer 20C, so as to come into contact with the connection terminal 14A. The other end of the TSV 28a, when it is a signal lead, is in contact with a rewiring lead 29 disposed on the rear face 21b of the semiconductor substrate 21, so as to be connected to a lead of the wiring layer 23 through another TSV 28b in contact with the rewiring lead 29. The other end of the TSV 28a, when it is a power supply or grounding lead, is in contact with a connection terminal 26 disposed on the rear face 21b of the semiconductor substrate 21.
An interlayer connection structure such as that in this embodiment is produced, for example, by joining the integrated circuit layers 10C, 20C in such an orientation that their front faces 11a, 21a oppose each other, then forming a first hole reaching the connection terminal 14A of the integrated circuit layer 10C from the rear face 21b of the semiconductor substrate 21 and a second hole reaching the wiring layer 23 from the rear face 21b by etching or the like, embedding a metal material in the first and second holes, and thereafter forming the rewiring lead 29 thereon. Alternatively, it is produced by joining the integrated circuit layers 10C, 20C together, then forming a hole reaching the connection terminal 14A from the rear face 21b, embedding a metal material in this hole, and thereafter forming the connection terminal 26 thereon. The operations and effects explained in the first embodiment can also be obtained favorably in an interlayer connection structure such as that in this embodiment.
The integrated circuit layers 20D, 30D in this embodiment, each of which is produced by eliminating a silicon layer from a substrate having a so-called SOI (Silicon On Insulator) structure, have oxide film layers 21D, 11D as support layers, respectively. A plurality of TSVs 27 in the integrated circuit layer 20D are formed through the oxide film layer 21D, while having respective one ends on the rear face 21b side exposed from the oxide film layer 21D as a plurality of connection terminals 26A. Similarly, a plurality of TSVs 37 in the integrated circuit layer 30D are formed through the oxide film layer 11D, while having respective one ends on the rear face 31b side exposed from the oxide film layer 11D as a plurality of connection terminals 34A. The plurality of connection terminals 34A are electrically connected to a plurality of connection terminals 24 of the integrated circuit layer 20D. The plurality of TSVs 27, 37 are not TSV as in the above-mentioned embodiments, but just via contacts.
The operations and effects explained in the first embodiment can also be obtained favorably in the case where the integrated circuit layers 20D, 30D have the oxide film layers 21D, 11D as in this embodiment.
In the above-mentioned first to seventh embodiments, the bump electrode acting as a connection terminal may be a one-sided bump, and a TSV may be used in place of the bump electrode. Metal films acting as connection terminals may directly be joined together without providing bump electrodes. Though the above-mentioned embodiments use an adhesive layer for bonding the integrated circuit layers together, metal films may be formed in regions other than the connection terminals in the integrated circuit layers and directly bonded together. A gap may be formed between two integrated circuit layers as long as each integrated circuit layer has a sufficient mechanical strength.
One power supply lead 63a applies a bias voltage to the inspection rectifier device units 65 electrically connected to a part of connection terminals 64 arranged in a lattice pattern among the plurality of connection terminals 64. The other power supply lead 63b applies a bias voltage to the inspection rectifier device units 65 electrically connected to the remaining connection terminals 64. Therefore, the connection terminal 64 connected to the inspection rectifier device unit 65 to which the bias voltage is applied from the power supply lead 63a and the connection terminal 64 connected to the inspection rectifier device unit 65 to which the bias voltage is applied from the power supply lead 63b are not adjacent to each other in the above-mentioned two directions.
Constructing the power supply leads as in this embodiment makes it possible to observe the light emitted from the inspection rectifier device units 65 connected to the above-mentioned part of connection terminals 64 and the light emitted from the inspection rectifier device units 65 connected to the remaining connection terminals 64 separately from each other. While each inspection rectifier device unit 65 emits light only when the bias voltage is applied thereto from its corresponding power supply lead 63a or 63b if there is no short circuit between the connection terminals 64 adjacent to each other, the inspection rectifier device unit 65 emits light when the bias voltage is applied to any of the power supply leads 63a, 63b if the adjacent connection terminals 64 are short-circuited. Observing the light emission can detect the short circuit between the adjacent connection terminals 64.
Though an example provided with at least two lines of power supply leads has been explained, providing at least two lines of grounding leads or combining at least two lines each of power supply and grounding leads together can also yield the same effects as those mentioned above.
Providing at least one of the integrated circuit layers 10, 20 with the voltage application unit 68 such as that of this embodiment can apply a bias voltage to the inspection rectifier device units 15, 25 without probing, thereby making it possible to further reduce the number of probing operations (or eliminate probing) in the inspection. The device achieving such a voltage application unit is not limited to photoelectric transducers, while other kinds of devices may be employed as long as they can generate an electromotive force in response to an energy line incident thereon from the outside. For example, at least one of the integrated circuit layers 10, 20 may be provided with a coil unit as an electromotive force device. This can generate a bias voltage by irradiating the coil unit with a magnetic field.
For capturing light emitted from the inspection rectifier device unit 15 or 25 of the semiconductor integrated circuit device 1A as an image, the inspection device 100A comprises a camera 101 for capturing an image including the emitted light, a power supply 102 for generating a bias voltage having a sufficient magnitude for inspection, probes (voltage application means) 103a, 103b for forwardly applying the bias voltage to the inspection rectifier device unit 15 or 25, and a control system 104 for inspecting whether or not there is a connection failure according to the image from the camera 101. An objective lens 109 and an imaging lens 110 are disposed between the camera 101 and the semiconductor integrated circuit device 1A, so that the camera 101 captures the image of the light emitted from the inspection rectifier device unit 15 or 25 through the objective lens 109 and imaging lens 110. The camera 101 is electrically connected to the control system 104 through a camera cable 101a, so as to feed imaging data to the control system 104, while its operation is controlled by the control system 104.
The inspection device 100A further comprises an illumination system 105 for observing patterns of integrated circuits. The illumination system 105 includes a light guide 106, a lamp light source 107, and a beam splitter 108. Light emitted from the lamp light source 107 reaches the beam splitter 108 through the light guide 106. The beam splitter 108, which is arranged between the objective lens 109 and imaging lens 110, reflects the light from the lamp light source 107 to the semiconductor integrated circuit device 1A and transmits therethrough the light emitted from the semiconductor integrated circuit device 1A. This illumination system 105 allows the camera 101 to capture the integrated circuit pattern of the uppermost integrated circuit layer 20 in addition to the light emitted from the inspection rectifier device unit 15 or 25. The image including the integrated circuit pattern can be used when aligning layout data with the rear face pattern image at the time of comparing the captured data with reference data.
Preferably, among the constituents of the inspection device 100A mentioned above, those other than the control system 104 and lamp light source 107 are accommodated in a dark box 120. The camera 101, which is arranged above the semiconductor integrated circuit device 1A in this embodiment, may be arranged under the semiconductor integrated circuit device 1A.
This inspection device 100B comprises a laser light source 112, a laser scanner 113, and a wavelength-selective mirror 114 in addition to the structure of the above-mentioned inspection device 100A (
The wavelength-selective mirror 114 is arranged between the beam splitter 108 and imaging lens 110. The wavelength-selective mirror 114 reflects the laser light emitted from the laser scanner 113 to the semiconductor integrated circuit device 1A. The wavelength-selective mirror 114 passes therethrough the light image from the semiconductor integrated circuit device 1A to the camera 101.
As in this embodiment, the inspection device for inspecting the semiconductor integrated circuit device may comprise a structure for emitting an energy line for generating an electromotive force in the semiconductor integrated circuit device in place of the probes 103a, 103b and bias power supply 102 illustrated in
Without being restricted to the above-mentioned embodiments, the semiconductor integrated circuit device and its inspection method in accordance with the present invention can be modified in various ways. For example, though each of the above-mentioned embodiments uses power supply and grounding leads as leads for applying a bias voltage to the inspection rectifier device units, the semiconductor integrated circuit device may be equipped with dedicated leads for applying a bias voltage to the inspection rectifier device units. The same effects as those of the above-mentioned embodiments can also be obtained when leads for applying a bias voltage are provided for inspection independently from the semiconductor device group of each integrated circuit layer. The semiconductor integrated circuit devices in accordance with the above-mentioned embodiments can also be used for OBIRCH (Optical Beam Induced Resistance CHange) tests, OBIC (Optical Beam Induced Current) tests, and the like.
The inspection rectifier device units in the semiconductor integrated circuit devices in accordance with the above-mentioned embodiments may be provided in each integrated circuit layer for the purpose of inspection alone or utilize rectifier devices (diodes and the like) formed parasitically on integrated circuits including semiconductor device groups within integrated circuit layers.
The rectifier devices of the inspection rectifier device units in the semiconductor integrated circuit devices in accordance with the above-mentioned embodiments may have a structure in which an insulating thin film and an electrode film are stacked in sequence on a silicon substrate. Utilizing the tunnel effect occurring in the insulating thin film when a bias voltage is applied between the electrode film and silicon substrate and the light emission at the time when a current passes through the insulating thin film can favorably achieve the inspection rectifier device units in each of the above-mentioned embodiments.
Though each of the above-mentioned embodiments exemplifies a structure in which a forward bias voltage is applied to the rectifier devices in the inspection rectifier device units, the reverse-bias resistance of the rectifier devices may be lowered, so that the bias voltage to the rectifier devices becomes a reverse bias during both inspection and normal operation. In this case, as leads for applying a bias voltage to the inspection rectifier device units, the power supply lead of one integrated circuit layer and the power supply lead of another integrated circuit layer may be used. Alternatively, as the leads for applying a bias voltage to the inspection rectifier device units, the grounding lead of one integrated circuit layer and the grounding lead of another integrated circuit layer may be used. Applying a bias voltage such that the rectifier device on the observation side attains a reverse bias and observing a hot-carrier emission or a light emission caused by a tunnel current can make the emission size smaller than that of the recombination emission occurring when a forward current flows through a diode.
Though each of the above-mentioned embodiments blocks the light emitted from the inspection rectifier device unit of one integrated circuit layer with the adhesive layer or wiring layer, so as to make the light emitted from the inspection rectifier device unit of the other integrated circuit layer easier to observe, such light-blocking means are not limited to the adhesive layer and wiring layer, whereby other light-blocking members may also be used.
As the light emission area per inspection rectifier device unit is made smaller, light emissions from a plurality of inspection rectifier device units are easier to observe in each of the above-mentioned embodiments. Therefore, the inspection rectifier device unit preferably has a structure for preventing its rectifier devices (or light-emitting devices provided separately from the rectifier devices) from diffusing carriers, for example.
The present invention can be utilized as an inspection method and semiconductor integrated circuit device which can inspect, in a short time every time a layer is stacked, whether or not an interlayer connection failure exists in a semiconductor integrated circuit device constructed by stacking a plurality of integrated circuit layers in their thickness direction.
1A to 1G . . . semiconductor integrated circuit device; 6, 7a to 7c . . . adhesive layer; 8 . . . handling substrate; 10, 20 . . . integrated circuit layer; 11, 21 . . . semiconductor substrate; 12, 22 . . . device layer; 13, 23 . . . wiring layer; 13a, 23a . . . positive power supply lead; 13b, 23b . . . grounding lead; 14, 24 . . . connection terminal; 15, 25 . . . inspection rectifier device unit; 15a, 15b, 25a, 25b . . . rectifier device; 16, 26 . . . connection terminal; 17, 27 . . . through-silicon via; 68 . . . voltage application unit; 68a . . . photoelectric transducer; 100A, 100B . . . inspection device; 101 . . . camera; 102 . . . bias power supply; 103a, 103b . . . probe; 104 . . . control system; 105 . . . illumination system; 107 . . . lamp light source; 108 . . . beam splitter; 109 . . . objective lens; 110 . . . imaging lens; 112 . . . laser light source; 113 . . . laser scanner; 114 . . . wavelength-selective mirror; 115 . . . notch filter
| Number | Date | Country | Kind |
|---|---|---|---|
| 2010-138554 | Jun 2010 | JP | national |
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/JP2011/063528 | 6/13/2011 | WO | 00 | 12/13/2012 |
