This application is the U.S. national stage of PCT/CN2016/075827, published as WO 2017/152353, filed Mar. 8, 2016, the disclosure of which is hereby incorporated by reference herein in its entirety.
The present disclosure relates generally to thermal interface materials, and more particularly to thermal interface materials including a phase change material.
Thermal interface materials are widely used to dissipate heat from electronic components, such as central processing units, video graphics arrays, servers, game consoles, smart phones, LED boards, and the like. Thermal interface materials are typically used to transfer excess heat from the electronic component to a heat spreader, then transfer heat to a heat sink.
TIM 22A is designated as a TIM 2 and is positioned between a heat spreader 18 and a heat sink 20, such that a first surface of TIM 22A is in contact with a surface of heat spreader 18 and a second surface of TIM 22A is in contact with a surface of heat sink 20.
TIM 22B is designated as a TIM 1 and is positioned between an electronic chip 10 and a heat spreader 18 such that a first surface of TIM 22B is in contact with a surface of electronic chip 34, such as a surface of silicon die 12, and a second surface of TIM 22B is in contact with a surface of heat spreader 18.
In some embodiments (not shown), the TIM 22 is designated as a TIM 1.5 and positioned between an electronic chip 10 and a heat sink 20, such that a first surface of TIM 22 is in contact with a surface of electronic chip 10, such as a surface of silicon die 12, and a second surface of TIM 2 is in contact with a surface of heat sink 22.
Thermal interface materials include thermal grease, grease-like materials, elastomer tapes, and phase change materials. Traditional thermal interface materials include components such as gap pads and thermal pads. Exemplary thermal interface materials are disclosed in the following patents and applications: CN 103254647, CN 103254647, JP 0543116, U.S. Pat. Nos. 6,238,596, 6,451,422, 6,500,891, 6,605,238, 6,673,434, 6,706,219, 6,797,382, 6,811,725, 6,874,573, 7,172,711, 7,147,367, 7,244,491, 7,867,609, 8,324,313, 8,586,650, U.S. 2005/0072334, U.S. 2007/0051773, U.S. 2007/0179232, U.S. 2008/0044670, U.S. 2009/0111925, U.S. 2010/0048438, U.S. 2010/0129648, U.S. 2011/0308782, US 2013/0248163, WO 2008/121491, and PCT/CN2014/093138.
Thermal greases and phase change materials have lower thermal resistance than other types of thermal interface materials because of the ability to be spread in very thin layers and provide intimate contact between adjacent surfaces. However, in some situations, the electronic chip 10 and heat sink 20 and/or heat spreader 18 are placed in a vertical orientation, such as shown in
Improvements in the foregoing are desired.
The present disclosure provides thermal interface materials that are useful in transferring heat from heat generating electronic devices, such as computer chips, to heat dissipating structures, such as heat spreaders and heat sinks. The thermal interface materials illustratively include at least one phase change material, at least one polymer matrix material, one or more thermally conductive fillers, and at least one crosslinker, wherein the thermally conductive filler comprises at least 80 wt. % of the total weight of the thermal interface material, and the thermally conductive filler includes a first plurality of particles having a particle diameter less than 1 micron. In a more particular embodiment, the thermally conductive filler comprises at least 90 wt. %, 91 wt. %, 92 wt. %, 93 wt. %, or 95 wt. % of the total weight of the thermal interface material.
In one more particular embodiment of any of the above embodiments, the thermal interface material comprises 1 wt. % to 16 wt. % of at least one polymer matrix material; 0.5 wt. % to 8 wt. % of at least one phase change material; and 0.1 wt. % to 1 wt. % of at least one amine or amine-based crosslinker. In a more particular embodiment, the thermal interface material comprises 1 wt. % to 8 wt. % of at least one polymer matrix material; 0.5 wt. % to 5 wt. % of at least one phase change material; and 0.1 wt. % to 1 wt. % of at least one amine or amine-based crosslinker.
In one more particular embodiment of any of the above embodiments, the first plurality of particles comprises particles of zinc oxide. In an even more particular embodiment, the particles of zinc oxide have a diameter of 0.1 microns to about 1 micron. In another more particular embodiment, the particles of zinc oxide have a diameter of 0.9 micron or less.
In one more particular embodiment of any of the above embodiments, the thermally conductive filler further includes a second plurality of particles having a particle diameter greater than 1 micron. In an even more particular embodiment, the second plurality of particles comprises particles of aluminum. In a still more particular embodiment, the second plurality of particles comprises aluminum particles having a diameter of from about 3 microns to about 15 microns. In a yet still more particular embodiment, the second plurality of particles comprises a first portion of aluminum particles having a diameter of about 3 microns and a second portion of aluminum particles having a diameter about 10 microns.
In one more particular embodiment of any of the above embodiments, the crosslinker is an amine or amine-based crosslinker.
In one more particular embodiment of any of the above embodiments, the thermally conductive filler comprises from 91 wt. % to 95 wt. % of the total weight of the thermal interface material. In an even more particular embodiment, the thermally conductive filler comprises from 92 wt. % to 94 wt. % of the total weight of the thermal interface material.
In one more particular embodiment of any of the above embodiments, the thermal interface material further includes at least one coupling agent, such as a titanate coupling agent. In another more particular embodiment of any of the above embodiments, the thermal interface material further includes at least one antioxidant. In another more particular embodiment of any of the above embodiments, the thermal interface material further includes at least one ion scavenger. In another more particular embodiment of any of the above embodiments, the thermal interface material further includes at least one thixotropic agent.
In another embodiment, a formulation for forming a thermal interface material is provided. The formulation includes a solvent, at least one phase change material, at least one polymer matrix material, one or more thermally conductive filler, and at least one crosslinker, wherein the thermally conductive filler comprises at least 80 wt. % of the dry weight (solvent-free weight) of the thermal interface material, and the thermally conductive filler includes a first plurality of particles having a particle diameter less than 1 micron.
In another embodiment, an electronic component is provided. The electronic component includes a heat sink, an electronic chip, and a thermal interface material positioned between the heat sink and electronic chip, the thermal interface material including: at least one phase change material, at least one polymer matrix material, one or more thermally conductive filler, and at least one crosslinker, wherein the thermally conductive filler comprises at least 91 wt. % of the total weight of the thermal interface material, and the thermally conductive filler includes a first plurality of particles having a particle diameter less than 1 micron. The electronic chip and heat sink are positioned in a vertical orientation, and the thermal interface material is positioned in a vertical orientation between the vertically orientated electronic chip and heat sink.
In a more particular embodiment, a first surface of the thermal interface material is in contact with a surface of the electronic chip and a second surface of the thermal interface material is in contact with the heat sink. In another more particular embodiment, the electronic component includes a heat spreader positioned between the heat sink and the electronic chip, wherein a first surface of the thermal interface material is in contact with a surface of the electronic chip and a second surface of the thermal interface material is in contact with the heat spreader. In still yet another more particular embodiment, the electronic component includes a heat spreader positioned between the heat sink and the electronic chip, wherein a first surface of the thermal interface material is in contact with a surface of the heat spreader and a second surface of the thermal interface material is in contact with the heat sink.
The above-mentioned and other features and advantages of this disclosure, and the manner of attaining them, will become more apparent and the invention itself will be better understood by reference to the following description of embodiments of the invention taken in conjunction with the accompanying drawings, wherein:
Corresponding reference characters indicate corresponding parts throughout the several views. The exemplifications set out herein illustrate exemplary embodiments of the invention and such exemplifications are not to be construed as limiting the scope of the invention in any manner.
The present invention relates to thermal interface materials useful in transferring heat away from electronic components.
A. Thermal Interface Material
In one exemplary embodiment, the TIM 22 is a thermal interface material. In some exemplary embodiments, TIM 22 comprises one or more phase change materials, one or more polymer matrix materials, one or more thermally conductive fillers, one or more crosslinkers, and, optionally, one or more additives.
a. Thermally Conductive Filler
In some exemplary embodiments, the TIM 22 includes at least one thermally conductive filler.
Exemplary thermally conductive fillers include metals, alloys, nonmetals, metal oxides, metal nitrides and ceramics, and combinations thereof. Exemplary metals include but are not limited to aluminum, copper, silver, zinc, nickel, tin, indium, lead, silver coated metals such as silver coated copper or silver coated aluminum, metal coated carbon fibers, and nickel coated fibers. Exemplary nonmetals include but are not limited to carbon, carbon black, graphite, carbon nanotubes, carbon fibers, graphene, powdered diamond, glass, silica, silicon nitride, and boron coated particles. Exemplary metal oxides, metal nitrides and ceramics include but are not limited to alumina, aluminum nitride, boron nitride, zinc oxide, and tin oxide.
The TIM 22 may comprise one or more thermally conductive fillers in a total amount as little as 80 wt. %, 85 wt. %, 90 wt. %, 91 wt. %, 91.5 wt. %, 92 wt. %, 92.5 wt. %, 93 wt. % as great as 93.5 wt. %, 94 wt. %, 95 wt. %, 96 wt. %, 97 wt. %, 98 wt. %, 99 wt. %, or within any range defined between any two of the foregoing values, based on the total weight of the TIM 22, such as 80 wt. % to 99 wt. %, 91 wt. % to 99 wt. %, 91 wt. % to 95 wt. %, or 92 wt. % to 94 wt. %.
The thermally conductive fillers may be provided as particles. Average particle diameter (D50) is commonly used to measure particle size. Illustrative particles have average particle diameters as little as 10 nm, 20 nm, 50 nm, 0.1 microns, 0.2 microns, 0.5 microns, 1 micron, 2 microns, 3 microns, as great as 5 microns, 8 microns, 10 microns, 12 microns, 15 microns 20 microns, 25 microns, 50 microns, 100 microns, or within any range defined between any two of the foregoing values, such as 10 nm to 100 microns, 0.1 microns to 20 microns, or 0.5 microns to 12 microns.
In one embodiment, a first thermally conductive filler has a particle diameter as little as 1 micron, 0.9 microns, 0.8 microns, 0.6 microns, 0.5 microns, 0.2 microns, 0.1 microns, or less, or within any range defined between any two of the foregoing values, such as 1 micron to 0.1 microns, 1 micron to 0.2 microns, or 1 micron to 0.8 microns. In a more particular embodiment, the first thermally conductive filler includes a plurality of zinc oxide particles having a diameter of 1 micron or less.
In one embodiment, a second thermally conductive filler provided with the first thermally conductive filler has a particle diameter as little as 1 micron, 2 microns, 3 microns, 4 microns, as great as 6 microns, 8 microns, 10 microns, or 12 microns, or within any range defined between any two of the foregoing values, such as 1 micron to 12 microns, 3 microns to 10 microns, 2 microns to 4 microns, or 8 microns to 12 microns. In a more particular embodiment, the second thermally conductive filler is comprised of particles having a mixture of particle sizes greater than 1 micron, including particles having a diameter as little as 2 microns, 3 microns, 4 microns, as great as 6 microns, 8 microns, 10 microns, or 12 microns, or mixtures thereof. In a more particular embodiment, the first thermally conductive filler includes a plurality of aluminum particles having a diameter greater than 1 micron.
In a more particular embodiment, the second thermally conductive filler includes a plurality of particles having a diameter greater than 1 micron, the first thermally conductive filler includes a plurality of particles having a diameter of 1 micron or less, and a weight ratio of the second thermally conductive filler to the first thermally conductive filler is as little as 0.5:1, 1:1, 1.25:1, 1.5:1, 2:1, 2.5:1, as great as 2.75:1, 3:1, 5:1, 10:1, 20:1, or within any range defined between any two of the foregoing values, such as 0.5:1 to 20:1, 1:1 to 10:1, 1.25:1 to 5:1, or 2.5:1 to 3:1.
In a more particular embodiment, the thermally conductive filler includes a plurality of aluminum particles having a particle diameter as little as 1 micron, 2 microns, 3 microns, as great as 5 microns, 8 microns, 10 microns, 12 microns, 15 microns, or within any range defined between any two of the foregoing values, such as 1 micron to 15 microns or 2 microns to 12 microns, or 3 microns to 10 microns and a plurality of zinc oxide particles having a particle diameter of one micron or less.
b. Polymer Matrix Material
In some exemplary embodiments, the TIM 22 comprises a polymer matrix material. In some exemplary embodiments, the polymer matrix material provides a matrix for incorporating the thermally conductive fillers, and provides flowability when pressed under heat and pressure.
In one exemplary embodiment, the polymer matrix material comprises a hydrocarbon rubber compound or a blend of rubber compounds. Exemplary materials include saturated and unsaturated rubber compounds. In some embodiments, saturated rubbers may be less sensitive to thermal oxidation degradation than unsaturated rubber compounds. Exemplary saturated rubber compounds include ethylene-propylene rubbers (EPR, EPDM), polyethylene/butylene, polyethylene-butylene-styrene, polyethylene-propylene-styrene, hydrogenated polyalkyldiene “mono-ols” (such as hydrogenated polybutadiene mono-ol, hydrogenated polypropadiene mono-ol, hydrogenated polypentadiene mono-ol), hydrogenated polyalkyldiene “diols” (such as hydrogenated polybutadiene diol, hydrogenated polypropadiene diol, hydrogenated polypentadiene dial) and hydrogenated polyisoprene, polyolefin elastomer, or any other suitable saturated rubber, or blends thereof. In one embodiment, the polymer matrix material is a hydrogenated polybutadiene mono-ol, which may also be referred to as a hydroxyl-terminated ethylene butylene copolymer, specialty mono-ol.
In one exemplary embodiment, the polymeric matrix material comprises a silicone rubber, a siloxane rubber, a siloxane copolymer or any other suitable silicone-containing rubber.
In some exemplary embodiments, the TIM 22 may comprise the polymer matrix material in an amount as little as 0.5 wt. %, 1 wt. %, 2 wt. %, 3 wt. %, 4 wt. % as great as 5 wt. %, 6 wt. %, 7 wt. %, 8 wt. %, 10 wt. %, 12 wt. %, 16 wt. % or within any range defined between any two of the foregoing values, based on the total weight of the TIM 22, such as 1 wt. % to 16 wt. %, 1 wt. % to 8 wt. %, or 4 wt. % to 6 wt. %.
c. Phase Change Material
In some exemplary embodiments, the TIM 22 comprises one or more phase change materials. A phase change material is a material having a melting point or melting point range at or below the operating temperature of a portion of an electronic device in which the TIM 22 is to be used. An exemplary phase change material is a wax, such as paraffin wax. Paraffin waxes are a mixture of solid hydrocarbons having the general formula CnH2n+2 and having melting points in the range of about 20° C. to 100° C. Polymer waxes include polyethylene waxes and polypropylene waxes, and typically have a range of melting points from about 40° C. to 160° C. Other exemplary phase change materials include low melting alloys, such as Wood's metal, Field's metal, or a metal or alloy having a melting point between about 20° C. and 90° C.
In some embodiments, the amount of phase change material can be used to adjust the hardness of the TIM 22. For example, in some embodiments wherein the loading of the phase change material is low, the composition may be in the form of a soft gel, and in some embodiments wherein the loading of the phase change material is high, the composition may be a hard solid. The TIM 22 may comprise the one or more phase change materials in an amount in an amount as little as 0.1 wt. %, 0.2 wt. %, 0.5 wt. %, 1 wt. %, 2 wt. %, as great as 3 wt. %, 3.5 wt. %, 4 wt. %, 5 wt. %, 7 wt. %, 8 wt. %, 10 wt. %, 12 wt. %, or within any range defined between any two of the foregoing values, based on the total weight of the TIM 22, such as 0.1 wt. % to 10 wt. %, 0.5 wt. % wt. % to 8 wt. %, or 0.5 wt. % to 5 wt. %.
d. Coupling Agent
In some exemplary embodiments, the TIM 22 comprises one or more coupling agents. In some exemplary embodiments, inclusion of a coupling agent may improve thermal properties, such as properties at relatively high temperatures by providing an interface between the polymer matrix and the thermally conductive filler. Exemplary coupling agents include titanate coupling agents, such as those disclosed in US Patent Application Publication 2011/0308782, the disclosure of which is hereby incorporated by reference in its entirety. Exemplary coupling agents include:
titanium IV 2,2 (bis 2-propenolatomethyl)butanolato, tris(dioctyl)pyrophosphato-O;
zirconium IV 2,2 (bis 2-propenolatomethyl)butanolato, tris(diisooctyl)pyrophosphato-O:
titanium IV 2-propanolato, tris(dioctyl)-pyrophosphato-O) adduct with 1 mole of diisooctyl phosphite:
titanium IV bis(dioctyl)pyrophosphato-O, oxoethylenediolato, (Adduct), bis(dioctyl) (hydrogen)phosphite-O:
titanium IV bis(dioctyl)pyrophosphato-O, ethylenediolato (adduct), bis(dioctyl)hydrogen phosphite;
and zirconium IV 2,2-bis(2-propenolatomethyl) butanolato, cyclo di[2,2-(bis 2-propenolatomethyl) butanolato], pyrophosphato-O,O:
In one exemplary embodiment, the coupling agent is titanium IV 2, 2 (bis 2-propenolatomethyl) butanolato, tris(dioctyl)pyrophosphato-0.
In some exemplary embodiments, the TIM 22 may comprise the one or more coupling agents in an amount as little as 0.1 wt. %, 0.2 wt. %, 0.3 wt. %, 0.5 wt. %, as great as 1 wt. %, 2 wt. %, 3 wt. %, 5 wt. %, or within any range defined between any two of the foregoing values, based on the total weight of the TIM 22, such as 0.1 wt. % to 5 wt. %, 0.2 wt. % to 2 wt. %, or 0.2 wt. % to 1 wt. %.
e. Crosslinkers
In some exemplary embodiments, the TIM 22 comprises one or more crosslinkers, such as amine or amine-based resins. Crosslinkers are added or incorporated into the thermal interface material composition to facilitate a crosslinking reaction between the crosslinker and the primary or terminal hydroxyl groups on at least one of the polymer matrix materials. Exemplary crosslinkers are disclosed in U.S. Pat. No. 7,244,491, the disclosure of which is hereby incorporated by reference in its entirety.
In one exemplary embodiment, the crosslinker is an amine or amine-based resin that comprises at least one amine substituent group on any part of the resin backbone. Exemplary amine and amine-based resins include alkylated melamine resins and synthetic resins derived from the reaction of urea, thiourea, melamine or allied compounds with aldehydes, particularly formaldehyde. In a more particular embodiment, the crosslinker is a resin selected from the group consisting of primary amine resins, secondary amine resins, tertiary amine resins, glycidyl amine epoxy resins, alkoxybenzyl amine resins, epoxy amine resins, melamine resins, alkylated melamine resins, and melamine-acrylic resins.
In one exemplary embodiment, the crosslinker is a melamine resin, such as an alkylated melamine resin, or even more particularly a butylated melamine resin. Melamine resins are ring-based compounds, whereby the ring contains three carbon and three nitrogen atoms. Melamine resins typically combine easily with other compounds and molecules through condensation reactions. Melamine resins typically can react with other molecules and compounds to facilitate chain growth and crosslinking, are more water resistant and heat resistant than urea resins, can be used as water-soluble syrups or as insoluble powders dispersible in water, and have high melting points (greater than 325° C.) and are relatively non-flammable). Alkylated melamine resins, such as butylated melamine resins, are formed by incorporating alkyl alcohols during the resin formation. They are soluble in paint and enamel solvents and in surface coatings.
In some exemplary embodiments, the TIM 22 may comprise the one or more crosslinkers in an amount as little as 0.1 wt. %, 0.2 wt. %, 0.3 wt. %, 0.5 wt. %, as great as 1 wt. %, 2 wt. %, 3 wt. %, 5 wt. %, or within any range defined between any two of the foregoing values, based on the total weight of the TIM 22, such as 0.1 wt. % to 5 wt. %, 0.2 wt. % to 2 wt. %, or 0.2 wt. % to 1 wt. %.
f. Additives
In some exemplary embodiments, the TIM 22 comprises one or more additives. Exemplary additives include antioxidants, ion scavengers, and thixotropic agents.
In one exemplary embodiment, an antioxidant inhibits thermal degradation of the polymer matrix by transferring elections of a free radical to an oxidizing agent. Exemplary antioxidants include phenolic-type antioxidants, amine-type antioxidants, or any other suitable type of antioxidant or combinations thereof, such as a sterically hindered phenol or amine type antioxidant. Exemplary antioxidants include phenol type antioxidants such as Irganox® 1076, or octadecyl 3-(3,5-di-(tert)-butyl-4-hydroxyphenyl) propionate; amine type antioxidants such as Irganox® 565, or 2,6-di-tert-butyl-4-(4,6-bis(octylthio)-1,3,5-triazin-2-ylamino) phenol, and sulfur containing phenolic antioxidants, such as a sterically hindered sulfur containing phenolic antioxidant. Other exemplary antioxidants include:
In some exemplary embodiments, the TIM 22 may comprise the one or more antioxidants in an amount as little as 0.05 wt. %, 0.1 wt. %, 0.2 wt. %, 0.5 wt. %, as great as 1 wt. % 1.5 wt. %, 2 wt. %, 5 wt. %, or within any range defined between any two of the foregoing values, based on the total weight of the TIM, such as 0.05 wt. % to 5 wt. %, 0.1 wt. % to 2 wt. %, or 0.1 wt. % to 1 wt. %.
In one exemplary embodiment, an ion scavenger inhibits thermal degradation of the polymer matrix by capturing and binding metal ions such that they cannot initiate the formation of free radicals in the polymer. Exemplary ion scavengers are disclosed in PCT application number PCT/CN2014/081724, the disclosure of which is hereby incorporated by reference in its entirety. Exemplary ion scavengers include:
In some exemplary embodiments, the TIM 22 may comprise the one or more ion scavengers in an amount as little as 0.05 wt. %, 0.1 wt. %, 0.2 wt. %, 0.5 wt. %, as great as 0.6 wt. %, 1 wt. % 1.5 wt. %, 2 wt. %, 5 wt. %, or within any range defined between any two of the foregoing values, based on the total weight of the TIM, such as 0.05 wt. % to 5 wt. %, 0.1 wt. % to 1 wt. %, or 0.1 wt. % to 0.6 wt. %.
Exemplary thixotropic agents include fumed silica and cellulose. In some exemplary embodiments, the TIM 22 may comprise the one or more thixotropic agents in an amount as little as 0.1 wt. %, 0.2 wt. %, 0.3 wt. %, 0.5 wt. %, as great as 1 wt. %, 2 wt. %, 3 wt. %, 5 wt. %, or within any range defined between any two of the foregoing values, based on the total weight of the TIM 22, such as 0.1 wt. % to 5 wt. %, 0.2 wt. % to 2 wt. %, or 0.2 wt. % to 1 wt. %.
B. Methods of Forming a Thermal Interface Material
In some embodiments, the TIM 22 is formed from a dispensable formulation including one or more polymer matrix materials, one or more phase change materials, two or more thermally conductive fillers, one or more solvents, and, optionally, one or more additives.
Exemplary solvents are described in U.S. Patent Application Publication 2007/0517733, the disclosure of which is hereby incorporated by reference herein in its entirety. Suitable solvents include pure solvents or mixtures of organic or inorganic solvents that are volatilized at a desired temperature, such as the critical temperature, or that can facilitate any of the above-mentioned design goals or needs, and that are compatible with the phase change materials, in that they will interact with the phase change materials to achieve the previously-mentioned goals. In some embodiments, the solvent, solvent mixture or combination thereof will solvate the phase change material such that it can be applied by printing techniques. In some exemplary embodiments, the solvent or mixture of two or more solvents are selected from the hydrocarbon family of solvents. Hydrocarbon solvents comprise carbon and hydrogen. A majority of hydrocarbon solvents are non-polar; however, there are a few hydrocarbon solvents that are considered polar.
Hydrocarbon solvents are generally classified into three classes: aliphatic, cyclic and aromatic. Aliphatic hydrocarbon solvents comprise both straight-chain compounds and compounds that are branched and possibly crosslinked, however, aliphatic hydrocarbon solvents are not typically considered cyclic. Cyclic hydrocarbon solvents are those solvents that comprise at least three carbon atoms oriented in a ring structure with properties similar to aliphatic hydrocarbon solvents. Aromatic hydrocarbon solvents are those solvents that comprise generally three or more unsaturated bonds with a single ring or multiple rings attached by a common bond and/or multiple rings fused together. In some exemplary embodiments, the solvent or mixture of two or more solvents are selected from solvents that are not considered part of the hydrocarbon solvent family of compounds, such as ketones, alcohols, esters, ethers and amines. In yet other contemplated embodiments, the solvent or solvent mixture may comprise a combination of any of the solvents mentioned herein.
Exemplary hydrocarbon solvents include toluene, xylene, p-xylene, m-xylene, mesitylene, solvent naphtha H, solvent naphtha A, Isopar H and other paraffin oils and isoparaffinic fluids, alkanes, such as pentane, hexane, isohexane, heptane, nonane, octane, dodecane, 2-methylbutane, hexadecane, tridecane, pentadecane, cyclopentane, 2,2,4-trimethylpentane, petroleum ethers, halogenated hydrocarbons, such as chlorinated hydrocarbons, nitrated hydrocarbons, benzene, 1,2-dimethylbenzene, 1,2,4-trimethylbenzene, mineral spirits, kerosene, isobutylbenzene, methylnaphthalene, ethyltoluene, ligroine. Exemplary ketone solvents include acetone, diethyl ketone, methyl ethyl ketone and the like.
In one exemplary embodiment, the solvent includes one or more solvents selected from: pentane, hexane, heptane, cyclohexane, paraffin oils, isoparaffinic fluids, benzene, toluene, xylene and mixtures or combinations thereof.
In some exemplary embodiments, the formulation may comprise the one or more solvents in an amount as little as 0.1 wt. %, 0.5 wt. %, 1 wt. % as great as 5 wt. %, 10 wt. %, 20 wt. %, or within any range defined between any two of the foregoing values, based on the total weight of the formulation.
In some exemplary embodiments, a method of forming a TIM 22 is provided. In some exemplary embodiments, forming the TIM 22 includes processes such as baking and drying the TIM 22.
In some exemplary embodiments, baking the TIM 22 include baking at a temperature as low as 25° C., 50° C., 75° C., 80° C., as high as 100° C., 125° C., 150° C., 170° C., or within any range defined between any two of the foregoing values. In some exemplary embodiments, the TIM 22 is baked for as little as 0.5 minutes, 1 minute, 30 minutes, 1 hour, 2 hours, as long as 8 hours, 12 hours, 24 hours, 36, hours, 48 hours, or within any range defined between any two of the foregoing values.
C. Thermal Interface Material Properties
In some exemplary embodiments, the TIM 22 has a thermal impedance as little as 0.05° C.·cm2/W, 0.06° C.·cm2/W, 0.07° C.·cm2/W, as high as 0.08° C.·cm2/W, 0.09° C.·cm2/W, 0.1° C.·cm2/W, 0.12° C.·cm2/W, or within any range defined between any two of the foregoing values, such as 0.05° C.·cm2/W to 0.12° C.·cm2/W, 0.06° C.·cm2/W to 0.1° C.·cm2/W, or 0.06° C.·cm2/W to 0.08° C.·cm2/W.
In some exemplary embodiments, the TIM 22 has a thermal impedance following conditioning at a temperature of 130° C. and a relative humidity of 85% for 96 hours that is no more than 20% greater, no more than 10% greater, no more than 5% greater, or no more than the thermal impedance of the TIM 22 prior to said conditioning.
In some exemplary embodiments, the TIM 22 has a thermal impedance following conditioning at a temperature of 150° C. for 1000 hours that is no more than 20% greater, no more than 10% greater, no more than 5% greater, or no more than the thermal impedance of the TIM 22 prior to said conditioning.
The final thickness of the applied TIM, following application between the heat generating and heat dissipating components, is referred to as the bond line thickness (BLT). The value of the BLT is determined, in part, by the flowability of the TIM when being heated by the heat generating component. Phase change materials (PCM) include a wax or other material to be increase the flowability of the TIM when heated by the heat generating component, which in turn reduced the BLT. BLT is related to thermal impedance (TI) and thermal conductivity (TC) by the formula TI=BLT/TC, such that lower BLT results in lower thermal impedance at the same thermal conductivity. Without wishing to be bound by any particular theory, it is believed that including multiple sizes of thermally conductive fillers allows smaller particle sizes to fill gaps present between larger particle sizes, increasing the flowability of the TIM and reducing the BLT. TIM formulations having low BLT tend to have low thermal impedance.
In some embodiments, when subjected to a pressure of 40 psi and heated to 80° C., the TIM 22 has a bond line thickness as great as 80 microns, 70 microns, 60 microns, 50 microns, 40 microns, as little as 30 microns, 25 microns, 20 microns, 15 microns, 10 microns, 5 microns, or less, or within any range defined between any two of the foregoing values, such as from 80 microns to 5 microns, from 60 microns to 10 microns, or from 30 to 20 microns.
In some embodiments, the TIM 22 resists dripping at elevated temperature. In one exemplary dripping test, a TIM 22 composition is applied at a thickness of about 0.6 mm between two metal bars and subjected to about 30 psi of pressure. The TIM 22 interface between the metal is positioned vertically and subjected to 120° C. temperature for two days. Any TIM 22 material dripping from the interface during the two days indicates a failed baking test. The sample is then cycled 90 times between −55° C. and 125° C. Any TIM 22 material dripping from the interface during the cycling indicates a failed cycling test.
Examples were prepared according to the compositions indicated in Table 1. As shown in Table 1, Example 1 included a melamine resin crosslinker and about 91.9 wt. % total thermally conductive filler comprised of aluminum particles having a diameter greater than 1 micron and zinc oxide particles having a diameter less than 1 micron. Comparative Example 1 lacked the melamine resin crosslinker, included only about 90.8 wt. % total thermally conductive filler, and did not include any particles having a diameter less than 1 micron. Comparative Example 2 included the melamine resin crosslinker, but had only about 89.8 wt. % total thermally conductive filler, and did not include any particles having a diameter less than 1 micron. Comparative Example 3 lacked the melamine resin crosslinker, but included about 93.0 wt. % total thermally conductive filler comprised of aluminum particles having a diameter greater than 1 micron and zinc oxide particles having a diameter less than 1 micron.
Each TIM was sandwiched between two metal plates oriented with the interface in the vertical direction and subjected to 30 psi. The original thickness for each sample was about 0.6 mm, as shown in Table 2.
Each sample was subjected a baking test of 120° C. temperature for two days. Any TIM material dripping from the interface during the two days indicates a failed baking test. Each sample was then subjected to a Thermal Cycling test of 90 temperature cycles from −55° C. to 125° C. over two and a half days. Any TIM material dripping from the interface during the cycling indicates a failed Thermal cycling test.
As shown in Table 2, only Example 1, which included a submicron thermally conductive filler and a crosslinker, passed both the baking test and the Thermal Cycling temperature cycling test. Comparative Examples 1 and 2, which included the crosslinker but lacked the submicron filler, failed both the baking result test and the Thermal Cycling cycling test. Comparative Example 3, which included the submicron filler but lacked the crosslinker, passed the baking test, but failed the Thermal Cycling cycling test. Example 1 had better anti-drip properties than any of the comparative examples.
Each TIM was then subjected to a thermal reliability test. Each sample was sandwiched in a mold at 90 degrees C. for 1 hour, and the original thermal impedance and thickness (bond line thickness) were measured. For Comparative Example 1, Comparative Example 2, and Ex. 1, the first two samples of each material were pressed with 35 psi, while the third sample was baked without pressure. For Comparative Example 3, no pressure was applied to any of the three samples.
Each sample was baked at 260° C. for 10 minutes, after which time the samples were cleaned and thermal impedance retested. For Ex. 1, samples were also backed for 20 minutes, after which time they were cleaned and the thermal impedance retested. A smaller change in the thermal impedance following baking is desirable.
As shown in Table 3, only Example 1, which included a submicron thermally conductive filler and a crosslinker, provided good results in both the pressed (35 psi) and unpressed (0 psi) results. The thermal impedance of Example 1 was shown to be relatively constant even after 20 minutes at 26° C. Comparative Examples 1 and 2, which included the crosslinker but lacked the submicron filler, showed increases in thermal impendence for the pressed (35 psi), and substantial increases in thermal impedance for the unpressed (0 psi). Comparative Example 3, which included the submicron filler but lacked the crosslinker, showed a substantial increase in thermal impedance for the unpressed (0 psi). Accordingly, Example 1 provided better reliability than any of the comparative examples.
While this invention has been described as having exemplary designs, the present invention can be further modified within the spirit and scope of this disclosure. This application is therefore intended to cover any variations, uses, or adaptations of the invention using its general principles. Further, this application is intended to cover such departures from the present disclosure as come within known or customary practice in the art to which this invention pertains and which fall within the limits of the appended claims.
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/CN2016/075827 | 3/8/2016 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO2017/152353 | 9/14/2017 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
1655133 | Clase | Jan 1928 | A |
2451600 | Woodcock | Oct 1948 | A |
2810203 | Bachofer | Oct 1957 | A |
3262997 | Cameron et al. | Jul 1966 | A |
4006530 | Nicolas | Feb 1977 | A |
4087918 | Schmid et al. | May 1978 | A |
4180498 | Spivack | Dec 1979 | A |
4265026 | Meyer | May 1981 | A |
4446266 | von Gentzkow et al. | May 1984 | A |
4459185 | Obata et al. | Jul 1984 | A |
4559709 | Beseme et al. | Dec 1985 | A |
4565610 | Nobel et al. | Jan 1986 | A |
4604424 | Cole et al. | Aug 1986 | A |
4787149 | Possati et al. | Nov 1988 | A |
4816086 | Oleske | Mar 1989 | A |
4832781 | Mears | May 1989 | A |
4839955 | Vannier | Jun 1989 | A |
4910050 | Oldham et al. | Mar 1990 | A |
5162555 | Remmers et al. | Nov 1992 | A |
5167851 | Jamison et al. | Dec 1992 | A |
5294923 | Juergens et al. | Mar 1994 | A |
5391924 | Uchida et al. | Feb 1995 | A |
5403580 | Bujanowski et al. | Apr 1995 | A |
5562814 | Kirby | Oct 1996 | A |
5660917 | Fujimori et al. | Aug 1997 | A |
5816699 | Keith et al. | Oct 1998 | A |
5930115 | Tracy et al. | Jul 1999 | A |
5950066 | Hanson et al. | Sep 1999 | A |
6040362 | Mine et al. | Mar 2000 | A |
6054198 | Bunyan et al. | Apr 2000 | A |
6090484 | Bergerson | Jul 2000 | A |
6096414 | Young | Aug 2000 | A |
6165612 | Misra | Dec 2000 | A |
6197859 | Hanson et al. | Mar 2001 | B1 |
6238596 | Nguyen et al. | May 2001 | B1 |
6339120 | Misra et al. | Jan 2002 | B1 |
6372337 | Takahashi et al. | Apr 2002 | B2 |
6372997 | Hill et al. | Apr 2002 | B1 |
6391442 | Duvall et al. | May 2002 | B1 |
6400565 | Shabbir et al. | Jun 2002 | B1 |
6432320 | Bonsignore et al. | Aug 2002 | B1 |
6432497 | Bunyan | Aug 2002 | B2 |
6451422 | Nguyen | Sep 2002 | B1 |
6475962 | Khatri | Nov 2002 | B1 |
6496373 | Chung | Dec 2002 | B1 |
6500891 | Kropp et al. | Dec 2002 | B1 |
6506332 | Pedigo | Jan 2003 | B2 |
6562180 | Bohin et al. | May 2003 | B1 |
6597575 | Matayabas et al. | Jul 2003 | B1 |
6605238 | Nguyen et al. | Aug 2003 | B2 |
6610635 | Khatri | Aug 2003 | B2 |
6616999 | Freuler et al. | Sep 2003 | B1 |
6617517 | Hill et al. | Sep 2003 | B2 |
6620515 | Feng et al. | Sep 2003 | B2 |
6624224 | Misra | Sep 2003 | B1 |
6645643 | Zafarana et al. | Nov 2003 | B2 |
6649325 | Gundale et al. | Nov 2003 | B1 |
6657297 | Jewram et al. | Dec 2003 | B1 |
6673434 | Nguyen | Jan 2004 | B2 |
6706219 | Nguyen | Mar 2004 | B2 |
6761928 | Hill et al. | Jul 2004 | B2 |
6764759 | Duvall et al. | Jul 2004 | B2 |
6783692 | Bhagwagar | Aug 2004 | B2 |
6791839 | Bhagwagar | Sep 2004 | B2 |
6797382 | Nguyen et al. | Sep 2004 | B2 |
6797758 | Misra et al. | Sep 2004 | B2 |
6811725 | Nguyen et al. | Nov 2004 | B2 |
6815486 | Bhagwagar et al. | Nov 2004 | B2 |
6835453 | Greenwood et al. | Dec 2004 | B2 |
6838182 | Kropp et al. | Jan 2005 | B2 |
6841757 | Marega et al. | Jan 2005 | B2 |
6874573 | Collins et al. | Apr 2005 | B2 |
6900163 | Khatri | May 2005 | B2 |
6901675 | Edwards et al. | Jun 2005 | B2 |
6908669 | Nguyen | Jun 2005 | B2 |
6908682 | Mistele | Jun 2005 | B2 |
6913686 | Hilgarth | Jul 2005 | B2 |
6921780 | Ducros et al. | Jul 2005 | B2 |
6924027 | Matayabas et al. | Aug 2005 | B2 |
6926955 | Jayaraman et al. | Aug 2005 | B2 |
6940721 | Hill | Sep 2005 | B2 |
6946190 | Bunyan | Sep 2005 | B2 |
6956739 | Bunyan | Oct 2005 | B2 |
6975944 | Zenhausern | Dec 2005 | B1 |
6984685 | Misra et al. | Jan 2006 | B2 |
7013965 | Zhong et al. | Mar 2006 | B2 |
7038009 | Sagal et al. | May 2006 | B2 |
7056566 | Freuler et al. | Jun 2006 | B2 |
7074490 | Feng et al. | Jul 2006 | B2 |
7078109 | Hill et al. | Jul 2006 | B2 |
7119143 | Jarnjevic et al. | Oct 2006 | B2 |
7135232 | Yamada et al. | Nov 2006 | B2 |
7147367 | Balian et al. | Dec 2006 | B2 |
7172711 | Nguyen | Feb 2007 | B2 |
7208191 | Freedman | Apr 2007 | B2 |
7241707 | Meagley et al. | Jul 2007 | B2 |
7244491 | Nguyen | Jul 2007 | B2 |
7253523 | Dani et al. | Aug 2007 | B2 |
7262369 | English | Aug 2007 | B1 |
7291396 | Huang et al. | Nov 2007 | B2 |
7294394 | Jayaraman et al. | Nov 2007 | B2 |
RE39992 | Misra et al. | Jan 2008 | E |
7326042 | Alper et al. | Feb 2008 | B2 |
7328547 | Mehta et al. | Feb 2008 | B2 |
7369411 | Hill et al. | May 2008 | B2 |
7440281 | Bailey et al. | Oct 2008 | B2 |
7446158 | Okamoto et al. | Nov 2008 | B2 |
7462294 | Kumar et al. | Dec 2008 | B2 |
7463496 | Robinson et al. | Dec 2008 | B2 |
7465605 | Raravikar et al. | Dec 2008 | B2 |
7538075 | Yamada et al. | May 2009 | B2 |
7550097 | Tonapi et al. | Jun 2009 | B2 |
7572494 | Mehta et al. | Aug 2009 | B2 |
7608324 | Nguyen et al. | Oct 2009 | B2 |
7641811 | Kumar et al. | Jan 2010 | B2 |
7646778 | Sajassi | Jan 2010 | B2 |
7682690 | Bunyan et al. | Mar 2010 | B2 |
7695817 | Lin et al. | Apr 2010 | B2 |
7700943 | Raravikar et al. | Apr 2010 | B2 |
7732829 | Murphy | Jun 2010 | B2 |
7744991 | Fischer et al. | Jun 2010 | B2 |
7763673 | Okamoto et al. | Jul 2010 | B2 |
RE41576 | Bunyan et al. | Aug 2010 | E |
7765811 | Hershberger et al. | Aug 2010 | B2 |
7807756 | Wakabayashi et al. | Oct 2010 | B2 |
7816785 | Iruvanti et al. | Oct 2010 | B2 |
7842381 | Johnson | Nov 2010 | B2 |
7846778 | Rumer et al. | Dec 2010 | B2 |
7850870 | Ahn et al. | Dec 2010 | B2 |
7867609 | Nguyen | Jan 2011 | B2 |
7893170 | Wakioka et al. | Feb 2011 | B2 |
7955900 | Jadhav et al. | Jun 2011 | B2 |
7960019 | Jayaraman et al. | Jun 2011 | B2 |
7973108 | Okamoto et al. | Jul 2011 | B2 |
8009429 | Sundstrom et al. | Aug 2011 | B1 |
8039961 | Suhir et al. | Oct 2011 | B2 |
8076773 | Jewram et al. | Dec 2011 | B2 |
8081468 | Hill et al. | Dec 2011 | B2 |
8102058 | Hsieh et al. | Jan 2012 | B2 |
8105504 | Gerster et al. | Jan 2012 | B2 |
8110919 | Jewram et al. | Feb 2012 | B2 |
8112884 | Tullidge et al. | Feb 2012 | B2 |
8115303 | Bezama et al. | Feb 2012 | B2 |
8138239 | Prack et al. | Mar 2012 | B2 |
8167463 | Loh | May 2012 | B2 |
8223498 | Lima | Jul 2012 | B2 |
8308861 | Rolland et al. | Nov 2012 | B2 |
8324313 | Funahashi | Dec 2012 | B2 |
8362607 | Scheid et al. | Jan 2013 | B2 |
8373283 | Masuko et al. | Feb 2013 | B2 |
8431647 | Dumont et al. | Apr 2013 | B2 |
8431655 | Dershem | Apr 2013 | B2 |
8445102 | Strader et al. | May 2013 | B2 |
8518302 | Gerster et al. | Aug 2013 | B2 |
8535478 | Pouchelon et al. | Sep 2013 | B2 |
8535787 | Lima | Sep 2013 | B1 |
8557896 | Jeong et al. | Oct 2013 | B2 |
8586650 | Zhang et al. | Nov 2013 | B2 |
8587945 | Hartmann et al. | Nov 2013 | B1 |
8618211 | Bhagwagar et al. | Dec 2013 | B2 |
8632879 | Weisenberger | Jan 2014 | B2 |
8633478 | Cummings et al. | Jan 2014 | B2 |
8638001 | Kimura et al. | Jan 2014 | B2 |
8647752 | Strader et al. | Feb 2014 | B2 |
8758892 | Bergin et al. | Jun 2014 | B2 |
8796068 | Stender et al. | Aug 2014 | B2 |
8837151 | Hill et al. | Sep 2014 | B2 |
8865800 | Stammer et al. | Oct 2014 | B2 |
8917510 | Boday et al. | Dec 2014 | B2 |
8937384 | Bao et al. | Jan 2015 | B2 |
9055694 | Lima | Jun 2015 | B2 |
9070660 | Lowe et al. | Jun 2015 | B2 |
9080000 | Ahn et al. | Jul 2015 | B2 |
9222735 | Hill et al. | Dec 2015 | B2 |
9260645 | Bruzda | Feb 2016 | B2 |
9353304 | Merrill et al. | May 2016 | B2 |
9392730 | Hartmann et al. | Jul 2016 | B2 |
9481851 | Matsumoto et al. | Nov 2016 | B2 |
9527988 | Habimana et al. | Dec 2016 | B2 |
9537095 | Stender et al. | Jan 2017 | B2 |
9593209 | Dent et al. | Mar 2017 | B2 |
9593275 | Tang et al. | Mar 2017 | B2 |
9598575 | Bhagwagar et al. | Mar 2017 | B2 |
10155894 | Liu et al. | Dec 2018 | B2 |
10287471 | Zhang et al. | May 2019 | B2 |
10312177 | Zhang et al. | Jun 2019 | B2 |
10501671 | Zhang et al. | Dec 2019 | B2 |
20020018885 | Takahashi et al. | Feb 2002 | A1 |
20020132896 | Nguyen | Sep 2002 | A1 |
20020140082 | Matayabas | Oct 2002 | A1 |
20020143092 | Matayabas | Oct 2002 | A1 |
20030031876 | Obeng et al. | Feb 2003 | A1 |
20030068487 | Nguyen et al. | Apr 2003 | A1 |
20030112603 | Roesner et al. | Jun 2003 | A1 |
20030128521 | Matayabas et al. | Jul 2003 | A1 |
20030151030 | Gurin | Aug 2003 | A1 |
20030159938 | Hradil | Aug 2003 | A1 |
20030171487 | Ellsworth et al. | Sep 2003 | A1 |
20030178139 | Clouser et al. | Sep 2003 | A1 |
20030203181 | Ellsworth et al. | Oct 2003 | A1 |
20030207064 | Bunyan et al. | Nov 2003 | A1 |
20030207128 | Uchiya et al. | Nov 2003 | A1 |
20030230403 | Webb | Dec 2003 | A1 |
20040037965 | Salter | Feb 2004 | A1 |
20040053059 | Mistele | Mar 2004 | A1 |
20040069454 | Bonsignore et al. | Apr 2004 | A1 |
20040097635 | Fan et al. | May 2004 | A1 |
20040149587 | Hradil | Aug 2004 | A1 |
20040161571 | Duvall et al. | Aug 2004 | A1 |
20040206941 | Gurin | Oct 2004 | A1 |
20050020738 | Jackson et al. | Jan 2005 | A1 |
20050025984 | Odell et al. | Feb 2005 | A1 |
20050045855 | Tonapi et al. | Mar 2005 | A1 |
20050072334 | Czubarow et al. | Apr 2005 | A1 |
20050110133 | Yamada et al. | May 2005 | A1 |
20050148721 | Tonapi et al. | Jul 2005 | A1 |
20050228097 | Zhong | Oct 2005 | A1 |
20050256291 | Okamoto et al. | Nov 2005 | A1 |
20050287362 | Garcia-Ramirez et al. | Dec 2005 | A1 |
20060040112 | Dean | Feb 2006 | A1 |
20060057364 | Nguyen | Mar 2006 | A1 |
20060094809 | Simone et al. | May 2006 | A1 |
20060122304 | Matayabas, Jr. | Jun 2006 | A1 |
20060155029 | Zucker | Jul 2006 | A1 |
20060208354 | Liu et al. | Sep 2006 | A1 |
20060228542 | Czubarow | Oct 2006 | A1 |
20060260948 | Zschintzsch et al. | Nov 2006 | A2 |
20060264566 | Cassar et al. | Nov 2006 | A1 |
20070013054 | Ruchert et al. | Jan 2007 | A1 |
20070051773 | Ruchert | Mar 2007 | A1 |
20070097651 | Canale et al. | May 2007 | A1 |
20070116626 | Pan et al. | May 2007 | A1 |
20070131913 | Cheng et al. | Jun 2007 | A1 |
20070161521 | Sachdev et al. | Jul 2007 | A1 |
20070164424 | Dean | Jul 2007 | A1 |
20070166554 | Ruchert et al. | Jul 2007 | A1 |
20070179232 | Collins et al. | Aug 2007 | A1 |
20070219312 | David | Sep 2007 | A1 |
20070241303 | Zhong et al. | Oct 2007 | A1 |
20070241307 | Nguyen | Oct 2007 | A1 |
20070249753 | Lin et al. | Oct 2007 | A1 |
20070293604 | Frenkel et al. | Dec 2007 | A1 |
20080021146 | Komatsu et al. | Jan 2008 | A1 |
20080023665 | Weiser et al. | Jan 2008 | A1 |
20080044670 | Nguyen | Feb 2008 | A1 |
20080110609 | Fann | May 2008 | A1 |
20080116416 | Chacko | May 2008 | A1 |
20080141629 | Alper et al. | Jun 2008 | A1 |
20080149176 | Sager et al. | Jun 2008 | A1 |
20080269405 | Okamoto et al. | Oct 2008 | A1 |
20080291634 | Weiser et al. | Nov 2008 | A1 |
20080302064 | Rauch | Dec 2008 | A1 |
20090053515 | Luo et al. | Feb 2009 | A1 |
20090072408 | Kabir et al. | Mar 2009 | A1 |
20090111925 | Burnham et al. | Apr 2009 | A1 |
20090184283 | Chung et al. | Jul 2009 | A1 |
20100040768 | Dhindsa | Feb 2010 | A1 |
20100048435 | Yamagata et al. | Feb 2010 | A1 |
20100048438 | Carey et al. | Feb 2010 | A1 |
20100075135 | Kendall et al. | Mar 2010 | A1 |
20100129648 | Xu et al. | May 2010 | A1 |
20100197533 | Kendall et al. | Aug 2010 | A1 |
20100256280 | Bruzda | Oct 2010 | A1 |
20100304152 | Clarke | Dec 2010 | A1 |
20110000516 | Hershberger et al. | Jan 2011 | A1 |
20110038124 | Burnham et al. | Feb 2011 | A1 |
20110121435 | Mitsukura et al. | May 2011 | A1 |
20110141698 | Chiou et al. | Jun 2011 | A1 |
20110187009 | Masuko et al. | Aug 2011 | A1 |
20110192564 | Mommer et al. | Aug 2011 | A1 |
20110204280 | Bruzda | Aug 2011 | A1 |
20110205708 | Andry et al. | Aug 2011 | A1 |
20110265979 | Chen et al. | Nov 2011 | A1 |
20110294958 | Ahn et al. | Dec 2011 | A1 |
20110308782 | Merrill | Dec 2011 | A1 |
20120048528 | Bergin et al. | Mar 2012 | A1 |
20120060826 | Weisenberger | Mar 2012 | A1 |
20120087094 | Hill et al. | Apr 2012 | A1 |
20120142832 | Varma et al. | Jun 2012 | A1 |
20120174956 | Smythe et al. | Jul 2012 | A1 |
20120182693 | Boday et al. | Jul 2012 | A1 |
20120195822 | Werner et al. | Aug 2012 | A1 |
20120253033 | Boucher et al. | Oct 2012 | A1 |
20120280382 | Im et al. | Nov 2012 | A1 |
20120285673 | Cola et al. | Nov 2012 | A1 |
20120288725 | Tanaka et al. | Nov 2012 | A1 |
20120292005 | Bruzda et al. | Nov 2012 | A1 |
20130127069 | Boday | May 2013 | A1 |
20130199724 | Dershem | Aug 2013 | A1 |
20130248163 | Bhagwagar et al. | Sep 2013 | A1 |
20130265721 | Strader et al. | Oct 2013 | A1 |
20130285233 | Bao et al. | Oct 2013 | A1 |
20130288462 | Stender et al. | Oct 2013 | A1 |
20130299140 | Ling et al. | Nov 2013 | A1 |
20140043754 | Hartmann et al. | Feb 2014 | A1 |
20140190672 | Swaroop et al. | Jul 2014 | A1 |
20140264818 | Lowe et al. | Sep 2014 | A1 |
20150000151 | Roth et al. | Jan 2015 | A1 |
20150125646 | Tournilhac et al. | May 2015 | A1 |
20150138739 | Hishiki | May 2015 | A1 |
20150158982 | Saito et al. | Jun 2015 | A1 |
20150183951 | Bhagwagar et al. | Jul 2015 | A1 |
20150275060 | Kuroda et al. | Oct 2015 | A1 |
20150279762 | Lowe et al. | Oct 2015 | A1 |
20150307743 | Ireland et al. | Oct 2015 | A1 |
20160160102 | Minegishi et al. | Jun 2016 | A1 |
20160160104 | Bruzda et al. | Jun 2016 | A1 |
20160226114 | Hartmann et al. | Aug 2016 | A1 |
20160272839 | Yamamoto et al. | Sep 2016 | A1 |
20170009362 | Werner et al. | Jan 2017 | A1 |
20170018481 | Zeng et al. | Jan 2017 | A1 |
20170107415 | Shiono | Apr 2017 | A1 |
20170137685 | Liu et al. | May 2017 | A1 |
20170167716 | Ezaki et al. | Jun 2017 | A1 |
20170226396 | Yang et al. | Aug 2017 | A1 |
20170243849 | Sasaki et al. | Aug 2017 | A1 |
20170317257 | Ezaki et al. | Nov 2017 | A1 |
20170321100 | Zhang et al. | Nov 2017 | A1 |
20180030327 | Zhang et al. | Feb 2018 | A1 |
20180030328 | Zhang et al. | Feb 2018 | A1 |
20180085977 | Ezaki | Mar 2018 | A1 |
20180194982 | Ezaki et al. | Jul 2018 | A1 |
20180267315 | Yonemura | Sep 2018 | A1 |
20180358283 | Zhang et al. | Dec 2018 | A1 |
20180370189 | Tang et al. | Dec 2018 | A1 |
20190048245 | Liu et al. | Feb 2019 | A1 |
20190078007 | Zhang et al. | Mar 2019 | A1 |
20190092993 | Naik et al. | Mar 2019 | A1 |
20190119544 | Shen et al. | Apr 2019 | A1 |
20190122954 | Bruzda | Apr 2019 | A1 |
20190249007 | Shen et al. | Aug 2019 | A1 |
Number | Date | Country |
---|---|---|
2311067 | Jan 2001 | CA |
2433637 | Dec 2002 | CA |
1407141 | Apr 2003 | CN |
1456710 | Nov 2003 | CN |
1549875 | Nov 2004 | CN |
1580116 | Feb 2005 | CN |
1970666 | May 2007 | CN |
1972988 | May 2007 | CN |
101067030 | Nov 2007 | CN |
101090922 | Dec 2007 | CN |
101113241 | Jan 2008 | CN |
101126016 | Feb 2008 | CN |
100394566 | Jun 2008 | CN |
101288353 | Oct 2008 | CN |
101445627 | Jun 2009 | CN |
101525489 | Sep 2009 | CN |
101735619 | Jun 2010 | CN |
101835830 | Sep 2010 | CN |
101942197 | Jan 2011 | CN |
102134474 | Jul 2011 | CN |
102341474 | Feb 2012 | CN |
102627943 | Aug 2012 | CN |
102634212 | Aug 2012 | CN |
102348763 | Apr 2013 | CN |
103087389 | May 2013 | CN |
103102552 | May 2013 | CN |
103102689 | May 2013 | CN |
103131138 | Jun 2013 | CN |
103214848 | Jul 2013 | CN |
103254647 | Aug 2013 | CN |
103333447 | Oct 2013 | CN |
103409116 | Nov 2013 | CN |
103436027 | Dec 2013 | CN |
103709757 | Apr 2014 | CN |
103756631 | Apr 2014 | CN |
103773322 | May 2014 | CN |
103849356 | Jun 2014 | CN |
103865271 | Jun 2014 | CN |
104098914 | Oct 2014 | CN |
104140678 | Nov 2014 | CN |
104152103 | Nov 2014 | CN |
104194733 | Dec 2014 | CN |
104449550 | Mar 2015 | CN |
104497574 | Apr 2015 | CN |
104513487 | Apr 2015 | CN |
104804705 | Jul 2015 | CN |
104861661 | Aug 2015 | CN |
105111750 | Dec 2015 | CN |
105349113 | Feb 2016 | CN |
105419339 | Mar 2016 | CN |
104479623 | May 2016 | CN |
105566920 | May 2016 | CN |
105670555 | Jun 2016 | CN |
103923463 | Aug 2016 | CN |
105838322 | Aug 2016 | CN |
105925243 | Sep 2016 | CN |
105980512 | Sep 2016 | CN |
106221236 | Dec 2016 | CN |
106243720 | Dec 2016 | CN |
107057370 | Aug 2017 | CN |
102007037435 | Feb 2009 | DE |
102009001722 | Sep 2010 | DE |
0816423 | Jan 1998 | EP |
1224669 | Jul 2002 | EP |
1291913 | Mar 2003 | EP |
1414063 | Apr 2004 | EP |
1149519 | Nov 2004 | EP |
1514956 | Mar 2005 | EP |
1629059 | Mar 2006 | EP |
2194165 | Jun 2010 | EP |
2848215 | Jun 2004 | FR |
2508320 | May 2014 | GB |
57027188 | Jun 1982 | JP |
0543116 | May 1986 | JP |
3662715 | Jan 1991 | JP |
02611364 | May 1997 | JP |
2000143808 | May 2000 | JP |
2001139818 | May 2001 | JP |
2002003830 | Jan 2002 | JP |
2003-218296 | Jul 2003 | JP |
100479857 | Jul 2003 | JP |
2005-032468 | Feb 2005 | JP |
2006-502248 | Jan 2006 | JP |
2007002002 | Jan 2007 | JP |
2007-106809 | Apr 2007 | JP |
2007-131798 | May 2007 | JP |
4016326 | Dec 2007 | JP |
2008063412 | Mar 2008 | JP |
5269366 | Mar 2009 | JP |
2009102577 | May 2009 | JP |
5137538 | Jun 2009 | JP |
2009138036 | Jun 2009 | JP |
4288469 | Jul 2009 | JP |
5607298 | Mar 2010 | JP |
4480457 | Jun 2010 | JP |
5390202 | Aug 2010 | JP |
2010-248349 | Nov 2010 | JP |
2010248277 | Nov 2010 | JP |
2010278115 | Dec 2010 | JP |
5318733 | Jun 2011 | JP |
2011165792 | Aug 2011 | JP |
2012-119725 | Jun 2012 | JP |
5687167 | Apr 2013 | JP |
5463116 | Apr 2014 | JP |
2014-105283 | Jun 2014 | JP |
5944306 | Jul 2014 | JP |
5372270 | Sep 2014 | JP |
2014194006 | Oct 2014 | JP |
2015-212318 | Nov 2015 | JP |
20070116654 | Dec 2007 | KR |
10-0820902 | Apr 2008 | KR |
0953679 | Apr 2010 | KR |
1175948 | Aug 2012 | KR |
10-2015-0049376 | May 2015 | KR |
569348 13 | Jan 2004 | TW |
200907040 | Feb 2009 | TW |
201033268 | Sep 2010 | TW |
201527309 | Jul 2015 | TW |
201546257 | Dec 2015 | TW |
8706492 | Nov 1987 | WO |
1997026297 | Jul 1997 | WO |
WO0120618 | Mar 2001 | WO |
0193648 | Dec 2001 | WO |
WO03052818 | Jun 2003 | WO |
2003064148 | Aug 2003 | WO |
2004008497 | Jan 2004 | WO |
2004022330 | Mar 2004 | WO |
WO2005021257 | Mar 2005 | WO |
2005111146 | Nov 2005 | WO |
200511146 | Nov 2005 | WO |
2005119771 | Dec 2005 | WO |
2006014171 | Feb 2006 | WO |
WO2006023860 | Mar 2006 | WO |
2007027670 | Mar 2007 | WO |
2008014171 | Jan 2008 | WO |
WO2008103219 | Aug 2008 | WO |
2008121491 | Oct 2008 | WO |
2008121970 | Oct 2008 | WO |
2009032212 | Mar 2009 | WO |
2010104534 | Sep 2010 | WO |
2010104542 | Sep 2010 | WO |
2013074920 | May 2013 | WO |
2013191116 | Dec 2013 | WO |
2014007119 | Jan 2014 | WO |
2014021980 | Feb 2014 | WO |
2014160067 | Oct 2014 | WO |
2015120773 | Aug 2015 | WO |
2015179056 | Nov 2015 | WO |
2016004565 | Jan 2016 | WO |
2016103424 | Jun 2016 | WO |
2018022288 | Feb 2018 | WO |
2018022293 | Feb 2018 | WO |
WO2018068222 | Apr 2018 | WO |
Entry |
---|
“Dynasylan 1146: Oligomeric Diamino-Silane-System” Evonik Industries, pp. 1-3, 2008. |
“Hi-Flow 225F-AC Reinforced, Phase Change Thermal Interface Material,” The Bergquist Company, 1 page, available at least as early as Aug. 31, 2017. |
“Semicosil 9212A.” Wacker Silicones Material Safety Data Sheet, pp. 1-8, printed Dec. 11, 2009. |
“Semicosil 9212B.” Wacker Silicones Material Safety Data Sheet, pp. 1-8, printed Dec. 11, 2009. |
“Therm-A-Gap HCS10,569,570,579 and 580 Thermally Conductive Gap Filler Pads,” Parker Chomerics, Engineering Your Success, pp. 11-12, available at least as early as the filed of the present application. |
Aranzabe, Estibaliz, et al. “More than Color: Pigments with Thermal Storage Capacity; Processing and Degradation Behavior.” Advances in Materials Physics and Chemistry, 5:171-184, 2015. |
Extended European Search Report issued in EP Application 14867847.7, dated Jun. 26, 2017, 7 pages. |
Extended European Search Report issued in EP Application No. 14897036.1, dated Jul. 2, 2018, 7 pages. |
Extended Search Report issued in EP Application 14907530.1, dated Jun. 27, 2018, 9 pages. |
Fink, Johannes Karl. “Chapter 18: Metal Deactivators.” in: A Concise Introduction to Additives for Thermoplastic Polymers, Wiley-Scrivener, pp. 165-171, Jan. 1, 2010. |
Gowda, Arun, et al. “Choosing the Right Thermal Interface Material.” Solid State Technology, Insights for Electronics Manufacturing, Online Blog, 9 pages, 2005. Retrieved May 25, 2017 from the Internet <http://electroiq.com/blog/2005/03/choosing-the-right-thermal-interface-material/. |
International Preliminary Report on Patentability issued in PCT/CN2016/075827, dated Sep. 20, 2018, 5 pages. |
International Search Report and Written Opinion issued in PCT/CN2014/081724, dated Apr. 1, 2015, 12 pages. |
International Search Report and Written Opinion issued in PCT/CN2014/093138, dated Sep. 6, 2015, 8 pages. |
International Search Report and Written Opinion issued in PCT/US2014/068033, dated Mar. 26, 2015, 12 pages. |
International Search Report and Written Opinion issued in PCT/US2017/041498, dated Oct. 20, 2017, 10 pages. |
Martyak et al., On the oxidation of tin(II) in methanesulfonate solutions and the role of sulfate, Galvanotechnik (2005), 96(3), 594-601 (Abstract). |
Ping, Ding, et al. “Preparation and Application Research of Novel Silicone Gel for High-Power IGBT.” Insulating Materials, 47(2):52-55, Chinese text with English translation of Abstract, 2014. |
Ramaswamy, C., et al. “Phase Change Materials as a Viable Thermal Interface Material for High-Power Electronic Applications.” The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, IEEE, 2:687-691, 2004. |
Search Report issued in CN application 201480066502.2, dated May 18, 2017, 2 pages. |
Singaporean Search Report and Written Opinion issued in SG Application No. 11201704238Y, completed May 18, 2018, 9 pages. |
Yasuhiro Aoyagi et al., “Effects of antioxidants and the solild component on the thermal stability of polyol-ester-based thermal pastes”, J Mater Sci (2007) 42:2358-2375; Mar. 12, 2007. |
Yasuhiro Aoyagi et al., “Polyol-Based Phase-Change Thermal Interface Materials”, Journal of Electronic Materials, vol. 35, No. 3, (2006); pp. 416-424. |
Yunsheng Xu et al., “Lithium Doped Polyethylene-Glycol-Based Thermal Interface Pastes for High Thermal Contact Conductance”, Transactions of the ASME; Journal of Electronic Packagiing, vol. 124, Sep. 2002; pp. 188-191. |
“Phase Change Material: DAPCM80-1”,MH&W International Corp., May 2012, http://mhw-thermal.com, 1 pages. |
Dow Coming_RTM. Two-Part RTV Silicone Sealant: Total Assembly Solutions for Home Appliance Production; www.dowcoming.com; Form No. 80-3375-01; 6 pages. |
Evonik, Silanes for Adhesives and Sealants, 2013, p. 1-24. |
Extended European Search Report issued in EP Application 15749120.0, dated Aug. 11, 2017, 6 pages. |
International Preliminary Report on Patentability received for PCT Patent Application No. PCT/US17/41447, dated Feb. 7, 2019, 8 pages. |
International Search Report and Written Opinion issued in PCT/CN2015/072202, dated Apr. 29, 2015, 14 pages. |
International Search Report and Written Opinion issued in PCT/CN2016/075827, dated Dec. 1, 2016, 7 pages. |
International Search Report and Written Opinion issued in PCT/CN2016/101874, dated Apr. 28, 2017, 12 pages. |
International Search Report and Written Opinion issued in PCT/US2009/069090, dated Aug. 17, 2010, 6 pages. |
International Search Report and Written Opinion issued in PCT/US2018/049218, ated Dec. 28, 2018, 13 pages. |
International Search Report and Written Opinion issued in PCT/US2018/056870, dated Feb. 8, 2019, 9 pages. |
International Search Report and Written Opinion received for PCT Patent Application No. PCT/US17/41447, dated Oct. 19, 2017, 10 pages. |
International Search Report and Written Opinion received for PCT Patent Application No. PCT/US2018/049218, dated Dec. 28, 2018, 11 pages. |
International Search Report and Written Opinion received for PCT Patent Application No. PCT/US2019/017743, dated May 28, 2019, 10 pages. |
Search Report issued in Chinese patent application 201410411725X (with English Translation), report dated Jul. 6, 2016, 4 pages. |
Singaporean Written Opinion issued in SG Application No. 11201704238Y, completed Apr. 11, 2019, 5 pages. |
Wacker Silicones, Catalyst EP/Inhibitor PT 88 product data sheet, p. 1-3, Oct. 6, 2008. |
Number | Date | Country | |
---|---|---|---|
20190085225 A1 | Mar 2019 | US |