Light emitting die (LED) packages and related methods

Information

  • Patent Grant
  • 10256385
  • Patent Number
    10,256,385
  • Date Filed
    Wednesday, July 20, 2011
    13 years ago
  • Date Issued
    Tuesday, April 9, 2019
    5 years ago
Abstract
LED packages and related methods are provided. The LED packages can include a submount having a top and bottom surface and a plurality of top electrically conductive elements on the top surface of the submount. An LED can be disposed on one of the top electrically conductive elements. The LED can emit a dominant wavelength generally between approximately 600 nm and approximately 650 nm, and more particularly between approximately 610 nm and approximately 630 nm when an electrical signal is applied to the top electrically conductive elements. A bottom thermally conductive element can be provided on the bottom surface and is not in electrical contact with the top electrically conductive elements. A lens can be disposed over the LED. The LED packages can have improved lumen performances, lower thermal resistances, improved efficiencies, and longer operational lifetimes.
Description
TECHNICAL FIELD

The subject matter disclosed herein relates generally to light emitting die packages and, more particularly, to light emitting die packages with improved performance characteristics and with at least one light emitting die operable for emitting red light or light close in wavelength to red or red-orange light.


BACKGROUND

Light emitting dies (LED or LEDs) are solid state devices that convert electric energy to light, and generally comprise one or more active layers of semiconductor material sandwiched between oppositely doped layers. When a bias is applied across the doped layers, holes and electrons are injected into the active layer where they recombine to generate light. As the bias or voltage is applied to the semiconductor, the energy that is used by the LED is converted into light energy, and the light is emitted from the active layer and from all surfaces of the LED. In order to use an LED chip in a circuit or other like arrangement, it is known to enclose an LED chip in a package to provide environmental and/or mechanical protection, color selection, focusing and the like. An LED package can also include electrical leads, contacts or traces for electrically connecting the LED package to an external circuit. In a typical LED package, an LED chip can be mounted on a reflective cup by means of a solder bond or conductive epoxy. One or more wire bonds can connect the ohmic contacts of the LED chip to leads, which may be attached to or integral with the reflective cup. The reflective cup may be filled with an encapsulant material containing a wavelength conversion material such as a phosphor. Light emitted by the LED at a first wavelength may be absorbed by the phosphor, which may responsively emit light at a second wavelength. The entire assembly can then be encapsulated in a clear protective resin, which may be molded in the shape of a lens to collimate the light emitted from the LED chip. While the reflective cup may direct light in an upward direction, optical losses may occur when the light is reflected (i.e. some light may be absorbed by the reflector cup instead of being reflected). In addition, heat retention may be an issue for such a package, since it may be difficult to extract heat through the leads.


A conventional LED package may be more suited for high power operations in one or more LED chips are mounted onto a carrier such as a printed circuit board (PCB) carrier, substrate or submount. Such a package can also generate more heat. A metal reflector mounted on the submount can surround the LED chip(s) and can reflect light emitted by the LED chips away from the package. The reflector can also provide mechanical protection to the LED chips. One or more wirebond connections can be made between ohmic contacts on the LED chips and electrical traces on the carrier. The mounted LED chips can then be covered with an encapsulant, which may provide environmental and mechanical protection to the chips while also acting as a lens. The metal reflector is typically attached to the carrier by means of a solder or epoxy bond.


While such a package may have certain advantages for high power operation, there may be a number of potential problems associated with using a separate metal piece as a metal reflector. For example, small metal parts may be difficult to manufacture repeatable with a high degree of precision at a reasonable expense. In addition, since the reflector is typically affixed to a carrier using an adhesive, several manufacturing steps may be required to carefully align and mount the reflector, which may add to the expense and complexity of the manufacturing process for such packages.


For higher powered operation, it may also be difficult to dissipate heat generated by the LED chip. This can be true for packages employing LEDs of specific light ranges, for example, LEDs that emit red and/or red-orange light. Submounts can be made of materials such as ceramics that are robust but do not efficiently conduct or dissipate heat which can result in reduced efficiency and output of the LED package as well as reduced lifetime or failure of the package. Other factors involved in using conventional packages can also reduce and/or limit the lumen performance, efficiency and/or lifetime of such LED packages.


SUMMARY

In accordance with this disclosure, novel LED packages and related methods are provided. In particular, LED packages and related methods are provided with at least one LED operable for emitting a dominant wavelength of, for example, generally between approximately 600 nm and approximately 650 nm, and more particularly between approximately 610 nm and approximately 630 nm. It is, therefore, an object of the disclosure herein to provide novel packages for LEDs and methods as described for example in further detail herein.


These and other objects as can become apparent from the disclosure herein are achieved, at least in whole or in part, by the subject matter described herein.





BRIEF DESCRIPTION OF THE DRAWINGS

A full and enabling disclosure of the present subject matter including the best mode thereof to one of ordinary skill in the art is set forth more particularly in the remainder of the specification, including reference to the accompanying figures, in which:



FIG. 1 is a top plan view illustrating an embodiment of a light emitting diode (LED) package according to the subject matter disclosed herein;



FIG. 2 is a side view illustrating the embodiment of the LED package according to FIG. 1;



FIG. 3 is a bottom plan view illustrating the embodiment of the LED package according to FIG. 1;



FIG. 4 is a top perspective view illustrating the embodiment of the LED package according to FIG. 1;



FIG. 5 is a bottom perspective view illustrating the embodiment of the LED package according to FIG. 1;



FIG. 6 is an exploded perspective view illustrating the embodiment of the LED package according to FIG. 1;



FIG. 7 is a top plan view illustrating a portion of an embodiment of a package for an LED according to the subject matter disclosed herein;



FIG. 8 is a bottom plan view illustrating the embodiment of the package for an LED according to FIG. 7; and



FIG. 9 is a top plan view illustrating the embodiment of the package for an LED according to FIG. 7 with an embodiment of a solder mask disposed thereon according to the subject matter disclosed herein.





DETAILED DESCRIPTION

Reference will now be made in detail to possible aspects or embodiments of the subject matter herein, one or more examples of which are shown in the figures. Each example is provided to explain the subject matter and not as a limitation. In fact, features illustrated or described as part of one embodiment can be used in another embodiment to yield still a further embodiment. It is intended that the subject matter disclosed and envisioned herein covers such modifications and variations.


As illustrated in the various figures, some sizes of structures or portions are exaggerated relative to other structures or portions for illustrative purposes and, thus, are provided to illustrate the general structures of the present subject matter. Furthermore, various aspects of the subject matter disclosed herein are described with reference to a structure or a portion being formed on other structures, portions, or both. As will be appreciated by those of skill in the art, references to a structure being formed “on” or “above” another structure or portion contemplates that additional structure, portion, or both may intervene. References to a structure or a portion being formed “on” another structure or portion without an intervening structure or portion may be described herein as being formed “directly on” the structure or portion. Similarly, it will be understood that when an element is referred to as being “connected”, “attached”, or “coupled” to another element, it can be directly connected, attached, or coupled to the other element, or intervening elements may be present. In contrast, when an element is referred to as being “directly connected”, “directly attached”, or “directly coupled” to another element, no intervening elements are present.


Furthermore, relative terms such as “on”, “above”, “upper”, “top”, “lower”, or “bottom” are used herein to describe one structure's or portion's relationship to another structure or portion as illustrated in the figures. It will be understood that relative terms such as “on”, “above”, “upper”, “top”, “lower” or “bottom” are intended to encompass different orientations of the device in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, structure or portion described as “above” other structures or portions would now be oriented “below” the other structures or portions. Likewise, if devices in the figures are rotated along an axis, structure or portion described as “above”, other structures or portions would now be oriented “next to” or “left” of the other structures or portions. It is understood that these terms are intended to encompass different orientations of the device in addition to the orientation depicted in the figures. Like numbers refer to like elements throughout.


Light emitting devices according to package embodiments described herein can comprise light emitting devices that emit a red or red-orange light, for example, light having a dominant wavelength generally between approximately 600 nm and approximately 650 nm, and, for example and without limitation, more specifically between approximately 610 nm and approximately 630 nm. Light emitting devices according to embodiments described herein may also comprise group III-V nitride (e.g., gallium nitride) based light emitting diodes (LEDs) or lasers fabricated on a growth substrate, for example, silicon carbide substrate, such as those devices manufactured and sold by Cree, Inc. of Durham, N.C. For example, Silicon carbide (SiC) substrates/layers discussed herein may be 4H polytype silicon carbide substrates/layers. Other silicon carbide candidate polytypes, such as 3C, 6H, and 15R polytypes, however, may be used. Appropriate SiC substrates are available from Cree, Inc., of Durham, N.C., the assignee of the present subject matter, and the methods for producing such substrates are set forth in the scientific literature as well as in a number of commonly assigned U.S. patents, including but not limited to U.S. Pat. Nos. Re. 34,861; 4,946,547; and 5,200,022, the disclosures of which are incorporated by reference herein in their entireties.


As used herein, the term “Group III nitride” refers to those semiconducting compounds formed between nitrogen and one or more elements in Group III of the periodic table, usually aluminum (Al), gallium (Ga), and indium (In). The term also refers to binary, ternary, and quaternary compounds such as GaN, AlGaN and AlInGaN. The Group III elements can combine with nitrogen to form binary (e.g., GaN), ternary (e.g., AlGaN), and quaternary (e.g., AlInGaN) compounds. These compounds may have empirical formulas in which one mole of nitrogen is combined with a total of one mole of the Group III elements. Accordingly, formulas such as AlxGa1−xN where 1>x>0 are often used to describe these compounds. Techniques for epitaxial growth of Group III nitrides have become reasonably well developed and reported, for example, in commonly assigned U.S. Pat. Nos. 5,210,051, 5,393,993, and 5,523,589, the disclosures of which are hereby incorporated by reference herein in their entireties.


Although various embodiments of LEDs disclosed herein comprise a growth substrate, it will be understood by those skilled in the art that the crystalline epitaxial growth substrate on which the epitaxial layers comprising an LED are grown may be removed, and the freestanding epitaxial layers may be mounted on a substitute carrier substrate or submount which may have better thermal, electrical, structural and/or optical characteristics than the original substrate. The subject matter described herein is not limited to structures having crystalline epitaxial growth substrates and may be used in connection with structures in which the epitaxial layers have been removed from their original growth substrates and bonded to substitute carrier substrates.


Group III nitride based LEDs according to some embodiments of the present subject matter, for example, may be fabricated on growth substrates (such as a silicon carbide substrates) to provide horizontal devices (with both electrical contacts on a same side of the LED) or vertical devices (with electrical contacts on opposite sides of the LED). Moreover, the growth substrate may be maintained on the LED after fabrication or removed (e.g., by etching, grinding, polishing, etc.). The growth substrate may be removed, for example, to reduce a thickness of the resulting LED and/or to reduce a forward voltage through a vertical LED. A horizontal device (with or without the growth substrate), for example, may be flip chip bonded (e.g., using solder) to a carrier substrate or printed circuit board (PCB), or wire bonded. A vertical device (with or without the growth substrate) may have a first terminal solder bonded to a carrier substrate, mounting pad, or PCB and a second terminal wire bonded to the carrier substrate, electrical element, or PCB. Examples of vertical and horizontal LED chip structures are discussed by way of example in U.S. Publication No. 2008/0258130 to Bergmann et al. and in U.S. Publication No. 2006/0186418 to Edmond et al., the disclosures of which are hereby incorporated by reference herein in their entireties.


Solid state light LEDs may be used individually or in combinations, optionally together with one or more luminescent materials (e.g., phosphors, scintillators, lumiphoric inks) and/or filters, to generate light of desired perceived colors (including combinations of colors that may be perceived as white). Inclusion of luminescent (also called ‘lumiphoric’) materials in LED devices may be accomplished by adding such materials to encapsulants, adding such materials to lenses, or by direct coating onto LEDs. Other materials, such as dispersers and/or index matching materials may be disposed in such encapsulants.


One or more of the LEDs can be coated, at least partially, with one or more phosphors with the phosphors absorbing at least a portion of the LED light and emitting a different wavelength of light such that the LED emits a combination of light from the LED and the phosphor. In one embodiment, such an LED emits a white light combination of LED and phosphor light. The LED can be coated and fabricated using many different methods, with one suitable method being described in U.S. patent application Ser. Nos. 11/656,759 and 11/899,790, both entitled “Wafer Level Phosphor Coating Method and Devices Fabricated Utilizing Method”, and both of which are incorporated herein by reference. In the alternative, LEDs can be coated using other methods such an electrophoretic deposition (EPD), with a suitable EPD method described in U.S. patent application Ser. No. 11/473,089 entitled “Close Loop Electrophoretic Deposition of Semiconductor Devices”, which is also incorporated herein by reference. It is understood that LED devices and methods according to the present subject matter can also have multiple LEDs of different colors, one or more of which may be white emitting.


The disclosure herein is directed to compact, simple and efficient LED packages. Different embodiments can comprise one or more high power LEDs that typically operate at elevated temperatures. Packages according to the disclosure herein can include features to provide for improved thermal management, increased efficiency, greater luminance performance and longer life for the LED and LED package. The packages according to the disclosure herein can also comprise a lens molded directly over the one or more LEDs to protect the LED while still allowing for efficient emission characteristics.


Although the terms first, second, etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or section from another region, layer or section. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the disclosure herein.


Embodiments of the subject matter of the disclosure are described herein with reference to schematic illustrations of idealized embodiments. As such, variations from the shapes of the illustrations as a result, for example, of manufacturing techniques and/or tolerances are expected. Embodiments of the subject matter disclosed herein should not be construed as limited to the particular shapes of the regions illustrated herein but are to include deviations in shapes that result, for example, from manufacturing. A region illustrated or described as square or rectangular will typically have rounded or curved features due to normal manufacturing tolerances. Thus, the regions illustrated in the figures are schematic in nature and their shapes are not intended to illustrate the precise shape of a region of a device and are not intended to limit the scope of the subject matter disclosed herein.


The subject matter of disclosure herein can be used in and/or with many different solid state emitters with the embodiments below being described in relation to LEDs, and in particular to red emitting LEDs and LED packages. It is understood that the disclosure herein can also use other solid state emitter packages beyond the embodiment shown. The disclosure herein can also be used with multiple emitter packages, such as LED packages having more than one LED. As stated above, other LEDs, such as white emitting LEDs, can be used with the red emitting LEDs for use in general lighting applications. The disclosure herein can also be used in any application wherein a conversion material is used to down-convert the wavelength of light from an emitter, and the discussion of the disclosure herein with reference to the following embodiment should not be construed as limiting to that particular embodiment or similar embodiments.



FIGS. 1 through 6 show one embodiment of a package for an LED generally designated 10 according to the disclosure herein generally comprising a substrate/submount (“submount”) 12 with one or more LEDs 14 emitting the same or different colors. In the embodiment shown, a single LED or multiple LEDs can be mounted on submount 12. Submount 12 can comprise a ceramic submount. In the embodiment shown, LED 14 as shown herein can represent a single LED or multiple LEDs and at least one of the LEDs can emit red or red-orange light. For example, at least one of the LEDs can generate or emit a dominate wavelength of generally between approximately 600 nm and approximately 650 nm, or more particularly between approximately 610 nm and approximately 630 nm. The LEDs can have many different semiconductor layers arranged in different ways.


LED 14 can comprise a conductive current spreading structure (not shown) and can be mounted on wire bond pads on its top surface, both of which can be made of a conductive material and can be deposited using known methods. Some materials that can, for example, be used for these elements include Au, Cu, Ni, In, Al, Ag or combinations thereof and conducting oxides and transparent conducting oxides. The current spreading structure can generally comprise conductive fingers (not shown) arranged in a grid on LED 14 with the fingers spaced to enhance current spreading from wire bond pads into the LED's top surface. In operation, an electrical signal is applied to LEDs 14, such as through a wire bond as described below, and the electrical signal spreads through the fingers of the current spreading structure and the top surface into LED 14. Current spreading structures are often used in LEDs where the top surface is a p-type material, but they can also be used for n-type materials.


One or more of LEDs represented by LED 14 can be coated with one or more phosphors with the phosphors absorbing at least some of the LED light and emitting a different wavelength of light such that the LED emits a combination of light from LED 14 and the phosphor. At least one of the LEDs can be configured to emit red or red-orange light. In some embodiments, an LED can be constructed to emit a white light combination of LED and phosphor light. Alternatively, the LEDs can be coated using other methods such an electrophoretic deposition (EPD). It is understood that LED packages according to the disclosure herein can also have multiple LEDs of different colors, such as white emitting LEDs in additional to one or more red and/or red-orange emitting LEDs. Submount 12 can have a top surface 16 and a bottom surface 18 and can be formed of many different materials. Materials for submount 12 can be electrically insulating. Suitable materials can comprise, but are not limited to, ceramic materials such as aluminum oxide, aluminum nitride or organic insulators like polyimide (PI) and polyphthalamide (PPA). In some embodiments, submount 12 can comprise a printed circuit board (PCB), sapphire or silicon or any other suitable material, such as T-Clad thermal clad insulated substrate material, available from The Bergquist Company of Chanhassen, Minn. For PCB embodiments different PCB types can be used such as standard FR-4 PCB, metal core PCB, or any other type of printed circuit board.


As stated above, submount 12 can comprise a ceramic submount. In some embodiments, submount 12 can comprise aluminum nitride (AlN). In package embodiments that use AlN as a material for submount 12 to which one or more red or red-orange LEDs are attached and the polarity is reversed such that the N-cladding is below the multi-quantum well and the P-cladding is above the multi-quantum well, the minimum luminous flux at a current of approximately 350 mA can be higher than in conventional packages the include red or red-orange LEDs.


For an LED 14 in package 10 that can emit light having a dominant wavelength of, for example, approximately 600 nm to approximately 650 nm, and more particularly approximately 610 nm to approximately 630 nm, luminance performance can be such that the minimum luminous flux can be approximately 90 lumens (lm) or greater. LED 14 when attached to package 10 in some embodiments can emit light having a dominant wavelength of approximately 610 nm to approximately 630 nm and a luminance performance such that the luminous flux can be approximately 100 lm or greater. In some embodiments, for example, LED 14 when attached to package 10 can emit light having a dominant wavelength of approximately 610 nm to approximately 630 nm and a luminance performance such that the luminous flux can be approximately 95 lm or greater. Packages 10 that use other substrate materials in submount 12 other than AlN and do not have the polarity reversed may also facilitate an LED that has a dominant wavelength of, for example, approximately 610 to approximately 630 nm to achieve a luminance performance of a luminous flux of approximately 90 lm or greater. While the minimum luminous flux produced above is with a current of approximately 350 mA, it is understood that a higher drive current can yield a higher luminous flux.


Using AlN as a substrate material for submount 12 in accordance with the disclosure herein can give improved thermal performance. In turn, improved thermal performance can give better reliability as well as less shift of the wavelength and less of a drop in lumens with increasing temperature. Using AlN as a substrate material for submount 12 can allow package 10 and any system in which it is used to run at a higher heat sink (submount) temperature for the same performance or at the same heat sink (submount) temperature for the same or greater performance. LEDS that are driven at higher temperatures and are able to thermally accommodate the higher temperatures can lead to a brighter output from LED 14 and package 10, since LEDs 14 can be driven harder or cheaper since a corresponding submount 12 can be easier to build. Running at higher current can lead to brighter output.


In manufacturing LEDs, the LEDs are formed on a larger semiconductor sheet or wafer. Some of these newly manufactured LEDs will not work as well as the majority of the other LEDs. These newly manufactured LEDs can be passed through a screening process that can quickly identify and/or predict which LED 14 will have the best reliability and should be selected for inclusion in a package 10.


As noted, many materials can be used to fabricate the submount element. In various embodiments, it is desirable to have a submount that is a good electrical insulator with low thermal resistance or high thermal conductivity (e.g., aluminum nitride). Some materials that may be used have a thermal conductivity of approximately 30 W/mK or higher, such as zinc oxide (ZnO). Other acceptable materials have thermal conductivities of approximately 120 W/mK or higher, such as aluminum nitride (AlN) which has a thermal conductivity that can range from approximately 140 W/mK to approximately 180 W/mK. In terms of thermal resistance, some acceptable materials have a thermal resistance of approximately 2° C./W or lower. Thus, package 10, for example, through the selection of the materials for the submount, can have a reduced thermal resistance. Other materials may also be used that have thermal characteristics outside the ranges discussed herein.


Top surface 16 of submount 12 can comprise patterned conductive features such as top electrically conductive elements that can comprise a die attach pad 20 with an integral first contact pad 22. A second contact pad 24 that is also considered a top electrically conductive element can also be included on top surface 16 with LED 14 mounted approximately at a center of attach pad 20. These electrically conductive elements can provide conductive paths for electrical connection to LED 14 using known contacting methods. LED 14 can be mounted to attach pad 20 using known mounting methods and material such as using conventional solder materials that may or may not contain a flux material or dispensed polymeric materials that may be thermally and electrically conductive. As noted above, LED 14 can be attached to attach pad 20 with the polarity of LED 14 reversed such that the N-cladding of LED 14 is below the multi-quantum well and the P-cladding of LED 14 is above the multi-quantum well.


In some embodiments, LED 14 can be mounted on attach pad 20 with a gold-tin (Au/Sn) solder. The Au/Sn solder can be deposited on LED 14. For example, the Au/Sn solder can be deposited on a bottom surface 14A of LED 14 and can reside between LED 14 and attach pad 20. Alternatively, The Au/Sn solder can be deposited on attach pad 20. For example, the Au/Sn solder can be deposited on attach pad 20 and can reside between LED 14 and attach pad 20.


A robust die attach process can help to achieve low electrical resistance, low thermal resistance and good mechanical and electrical integrity. A “flux-eutectic” die attach method can be used in attaching LEDs 14 to attach pad 20 with an Au/Sn solder. In such an attach method, no external force needs to be applied throughout the process. Such a die attach method can help prevent squeeze-out of the die attach metal during attachment, thereby reducing the risk of forming a Schottky contact in the package 10, for example with an n-substrate. During chip fabrication, an 80% Au/20% Sn eutectic metal layer can be deposited on bottom surface 14A of LED 14. The melting temperature of the 80% Au/20% Sn metal can be, for example, about 282° C. During assembly, a very small volume of flux can be placed on attach pad 20 by pin transfer or other precision dispense method, and LED 14 can be placed into the flux. For example, a no-clean flux (such as Alpha Metals UP78) can be dispensed onto attach pad 20 via pin transfer with a dot size of approximately 200 um. After die placement, attach pad 20 can be heated to a predetermined temperature for a set amount of time. For example, attach pad 20 can be heated to about 305° C. for about 5-8 seconds with direct heating method or hot air guns to reflow the Au/Sn metal. Subsequent cleaning in isopropyl alcohol in an ultrasonic bath can remove flux residue prior to wirebonding and encapsulation. For example, about a 15-minute ultrasonic isopropyl alcohol clean bath can be used.


When using such a die attach process, careful control of flux dispense volume can help to minimize risk of LED 14 movement during reflow. In addition, LED 14 can be placed through the flux and in contact with attach pad 20 prior to reflow. The peak temperature can be about 20° C. to about 30° C. above the melting temperature of the solder that is used. An RMA flux can result in good shear strengths; however, using too much flux can cause poor melting of the Au/Sn. The type of flux, the amount of flux used, and the reflow time and temperatures can be factors that should be understood and controlled by the user to optimize die attach results and long term reliability of the package 10.


Attach pad 20 and first and second contact pads 22, 24 can comprise different materials. Attach pad 20 and first and second contact pads 22, 24 can comprise, for example, metals or other conductive materials. In some embodiments, pads 20, 22, 24 comprise copper deposited using known techniques such as plating. In a typical plating process a titanium adhesion layer and copper seed layer are sequentially sputtered onto a substrate. Then, approximately 75 microns of copper is plated onto the copper seed layer. The resulting copper layer being deposited can then be patterned using standard lithographic processes. In other embodiments, the layer can be sputtered using a mask to form the desired pattern.


In some embodiments according to the disclosure herein some of the conductive elements can include only copper, with others of the elements including additional materials. For example, attach pad 20 can be plated or coated with additional metals or materials to make attach pad 20 more suitable for mounting one or more LEDs 14. For example, attach pad 20 can be plated with adhesive or bonding materials, or reflective and barrier layers.


A gap 26 as seen in FIGS. 1, 4, and 6 can be included between second pad 24 and attach pad 20 down to the surface of submount 12. Gap 26 can provide electrical isolation between attach pad 20 and second pad 24. An electrical signal can be applied to LED 14 through second pad 24 and first pad 22, with the electrical signal on first pad 22 passing directly to LED 14 through attach pad 20 and the signal from second pad 24 passing into LED 14 through wire bonds or other conductive elements (not shown). Gap 26 can also provide electrical isolation between second pad 24 and attach pad 20 to prevent shorting of the signal applied to LED 14.


In some embodiments, an electrical signal can be applied to package 10 by providing external electrical contact to first and second bond pads 22, 24 such as by solder contacts or other conductive paths to a PCB. In the embodiment shown, LED package 10 can be arranged for mounting using surface mount technology and having internal conductive paths. LED package 10 can comprise first and second surface mount pads 30, 32, respectively, as seen in FIGS. 3 and 5 that can be formed on back surface 18 of submount 12. First and second surface mount pads 30, 32 can be at least partially in alignment with first and second contact pads 22, 24, respectively. Conductive vias 34 can be formed through submount 12 between first mounting pad 30 and first contact pad 22, such that, when a signal is applied to first mounting pad 30, the signal is conducted to first contact pad 22. Similarly, conductive vias 34 can be formed between second mounting pad 32 and second contact pad 24 to conduct an electrical signal therebetween as well. First and second mounting pads 30, 32 allow for surface mounting of LED package 10. In such embodiments, the electrical signal can be applied to LED 14 across first and second mounting pads 30, 32. Vias 34 and mounting pads 30, 32 can be made of many different materials using different techniques, including deposition methods that can be used for attach and contact pads 20, 22, 24.


It is understood that mounting pads 30, 32 and vias 34 can be arranged in many different ways and can have many different shapes and sizes. It is also understood that instead of vias, one or more conductive traces can be provided on the surface of the submount between the mounting pads and contact pads, such as along a side surface of submount 12.


A solder mask 36, as shown for example in FIGS. 1, 2 and 4, made of conventional materials can be included on top surface 16 of submount 12, at least partially covering attach pad 20 and first and second contact pads 22, 24, and at least partially covering gap 26. Solder mask 36 can protect these features during subsequent processing steps, which can include the mounting of LED 14 to attach pad 20 and wire bonding of LED 14 to package 10. During such steps, there can be a danger of solder or other materials depositing in undesired areas, which can result in damage to the areas or result in electrical shorting. Solder mask 36 can serve as an insulating and protective material that can reduce or prevent these dangers. Solder mask 36 can comprise an opening for mounting LED 14 to attach pad 20 and for attaching wire bonds (not shown) to second contact pad 24. Solder mask 36 can also comprise side openings 38 to allow convenient electrical access to contact pads 22, 24 for testing package 10 during fabrication. Solder mask 36 and/or attach pad 20 can also have alignment holes that provide for alignment during fabrication of package 10 and can also allow for alignment when mounted in place by an end user.


In some embodiments, solder mask 36 and/or attach pad 20 can be provided with a symbol or indicator 36A to illustrate which side of LED package 10 should be coupled to a positive or negative signal that can be applied to package 10. Symbol 36A can ensure accurate mounting of LED package 10 to a PCB or other fixture, whether by machine or hand. As in the embodiment shown, symbol 36A can comprise a plus (+) sign over first contact pad 22, indicating that package 10 should be mounted with the positive of the signal coupled to first mounting pad 30. The negative of the signal can then be coupled to second mounting pad 32. It is understood that many different symbol types can be used and that a symbol can also be included over second conductive pad 24 in addition or in the alternative to symbol 36A. It is also understood that the symbols can be placed in other locations other than solder mask 36.


Package 10 can also comprise elements to protect against damage from electrostatic discharge (ESD). Different elements can be used which can be on-chip. Examples of different elements can include, but are not limited to, various vertical silicon (Si) Zener diodes, different LEDs arranged in parallel and reverse biased to LED 14, surface mount varistors and/or lateral Si diodes. It is noted that solder mask 36 can include an opening for an ESD diode (not shown) if such a diode is desired, so that it can be mounted to attach pad 20. An arrangement with an LED 14 and the ESD diode can allow excessive voltage and/or current passing through the LED package 10 from an ESD event to pass through the ESD diode instead of LED 14, protecting LED 14 from damage. Different mounting materials and methods can be used such as those used to mount LED 14 to attach pad 20. One or more wire bonds (not shown) can also be included between the solder mask opening in the second contact pad 24 and LED 14. Wire bonds (not shown) for both LED 14 and the ESD diode can be applied using known methods and can comprise known conductive materials, with a suitable material being, for example, gold (Au). It is understood that LED package 10 according to the disclosure herein can be provided without an ESD element/diode or with an ESD element/diode that is external to LED package 10.


As described above, in conventional packages, heat typically does not spread efficiently into the submount, particularly those made of materials such as ceramic. In some embodiments, when an LED is provided on an attach pad that extends generally only under the LED, heat does not spread through most of the submount, and is generally concentrated to the area just below the LED. This can cause overheating of the LED which can limit the operating power level for the LED package.


Thermal resistance, however, in package 10 is lower than in other, conventional packages. This lower thermal resistance can lead to lower operating temperatures for the LED by allowing quicker heat dissipation therefrom. Such lower thermal resistance can thus lead to greater lumen performance of the attached LED(s) and a greater lifetime for the LED(s). As above, for example, thermal resistance can be lower for package 10 with submount 12 comprising aluminum nitride (AlN) as compared to similarly sized chips with ceramic submounts. Package 10 can have a thermal resistance of approximately 3° C./Watt or less. In some embodiments, package 10 can have a thermal resistance of approximately 2.5° C./Watt or less. Pads 20, 22, 24 can provide extending thermally conductive paths to laterally conduct heat away from LED 14 such that it can spread to other areas of submount 12 beyond the areas just below LED 14 to further improve heat dissipation. Attach pad 20 can cover more of the surface of submount 12 than LED 14, with attach pad 20, for example, extending from the edges of LED 14 toward the edges of submount 12. As in the embodiment shown, attach pad 20 can be generally circular and can extend radially from LED 14 toward the edges of submount 12. A portion of attach pad 20 can intersect with first and second contact pads 22, 24, with gap 26 separating part of attach pad 20 adjacent to second contact pad 24. It is understood that attach pad 20 can be many other shapes and in some embodiments, for example, it can extend to the edge of submount 12.


Contact pads 22, 24 can also cover the surface of submount 12 extending out from vias 34. For example, contact pads 22, 24 can cover the area between vias 34 and the edges of the submount 12. By extending pads 20, 22 and 24 in this manner, the heat spreading from LED 14 can be improved. Thermal dissipation of heat generated in LED 14 can thus be improved, which improves the operating life and allows for higher operating power for LED 14 and LED package 10. Pads 20, 22, and 24 can cover different percentages of top surface 16 of submount 12, with a typical coverage area being greater than 50%. In LED package 10, pads 20, 22 and 24 can, for example, cover approximately 70% of submount 12. In other embodiments, the coverage area can, for example, be greater than 75%.


As shown for example beginning with FIGS. 3 and 5, LED package 10 can further comprise a bottom thermally conductive element that can comprise thermal pad 40 on back surface 18 of submount 12 between first and second mounting pads 30, 32. Thermal pad 40 can be made of a heat conductive material and can be in at least partial vertical alignment with LED 14. In some embodiments, thermal pad 40 may not be in electrical contact with the elements on top surface 16 of submount 12 or first and second mounting pads 30, 32 on back surface 18 of submount 12. Although heat from the LED can be laterally spread over top surface 16 of submount 12 by attach pad 20 and pads 22, 24, more heat can pass into submount 12 directly below and around LED 14 with such placement of thermal pad 40. Thus, thermal pad 40 can assist with this dissipation by allowing this heat to spread into thermal pad 40 where it can dissipate more readily. It is also noted that the heat can conduct from top surface 16 of submount 12, through vias 34, where the heat can spread into first and second mounting pads 30, 32 where it can also dissipate. For package 10 used in surface mounting, the thickness of thermal pad 40 and first and second pads 30, 32 as seen in FIGS. 3 and 5 can be approximately the same such that all three make contact to a lateral surface such as a PCB. Thermal pad 40 can be attached to a larger heat sink if desired.


Thermal pad 40 can comprise a metal that may or may not be electrically conductive. In one aspect, thermal pad 40 can be electrically attached to at least one of first contact pad 22 or second contact pad 24. In another aspect, thermal pad 40 can be electrically neutral allowing one or more LEDs to be configured in an array using a common metal substrate without risk of electrical shorting, thus simplifying thermal design.


Solder dams 28 (shown in dotted lines) can be included around the area of attach pad 20 for mounting of LED 14. Solder dams 28 can help center LED 14 to reduce movement of LED 14 from the mounting area while the mounting solder is in liquid form. When the liquid solder encounters any one of dams 28, movement can be slowed or stopped. Thereby, the movement of LED 14 on attach pad 20 can be reduced until the solder hardens.


An optical element or lens 50 can be formed on top surface 16 of submount 12, over LED 14. Lens 50 can provide both environmental and/or mechanical protection. Lens 50 can be in different locations on the top surface 16. As shown, lens 50 can be located with LED 14 placed at approximately a center of a base of lens 50. In some embodiments, lens 50 can be formed in direct contact with the LED and top surface 16 on submount 12. In other embodiments, there may be an intervening material or layer between LED 14 and top surface 16. Direct contact to LED 14 can provide certain advantages such as improved light extraction and ease of fabricating. In particular, lens 50 can be molded onto submount 12.


Lens 50 can be molded using different molding techniques. Lens 50 can be many different shapes depending on the desired shape of the light output. One suitable shape as shown is hemispheric, with some examples of alternative shapes being ellipsoid bullet, flat, hex-shaped and square. Many different materials can be used for lens 50 such as silicones, plastics, epoxies or glass, with a suitable material being compatible with molding processes. Silicone is suitable for molding and provides suitable optical transmission properties. For example, a silicone can be selected that has a high refractive Index and high transparency. It can also withstand subsequent reflow processes and does not significantly degrade over time. It is understood that lens 50 can also be textured to improve light extraction or can contain materials such as phosphors or scattering particles. Lens 50 can vary in size. The size of the lens can vary based on the size of package 10, in particular, submount 12. For example, an approximately 3.5 mm by approximately 3.5 mm submount 12 can have a lens 50 can have a radius size of approximately 1.275 mm or greater. In some embodiments, an approximately 3.5 mm by approximately 3.5 mm submount 12 can have a lens 50 can have a radius size of approximately 1.275 mm. Lens 50 can for example have a radius size of between approximately 1.275 mm to approximately 1.53 mm. Package 10 can also comprise a protective layer 52 covering top surface 16 of submount 12 between lens 50 and edge of submount 12. Layer 52 can provide additional protection to the elements on top surface 16 to reduce damage and contamination during subsequent processing steps and use. Protective layer 52 can be formed during formation of lens 50 and can comprise the same material as lens 50. It is understood, however, that package 10 can also be provided without protective layer 52. For example, a technique for molding lens 50 and/or protective layer 52 can include those described in U.S. patent application Ser. No. 11/982,275 entitled “Light Emitting Diode Package and Method of Fabricating Same”, which, as stated above, is also incorporated herein by reference.


Lens 50 can also be able to withstand certain sheer forces before being displaced from submount 12. In one embodiment, the lens can withstand approximately a 1 kilogram (kg) or more sheer force. Embodiments of package 10 using silicones that are harder after curing and have a higher durometer reading, such as Shore A 70 or higher, in molding lens 50 may tend to better withstand sheer forces. Properties such as high adhesion and high tensile strength can also contribute to the ability of lens 50 to withstand sheer forces. The lens arrangement of LED package 10 can easily be adapted for use with secondary lens or optics that can be included over lens 50 by the end user to facilitate beam shaping. These secondary lenses are generally known in the art, with many of them being commercially available.


Thus, LED packages 10 as described above can be used with at least one LED 14 that can emit a dominant wavelength generally between approximately 600 nm and approximately 650 nm, and more particularly between approximately 610 nm and approximately 630 nm, when an electrical signal is applied to package 10, thereby emitting a red or red-orange light. When a current of approximately 350 mA is applied to package 10, package 10 can be configured to have a lumen performance of a minimum luminous flux of approximately 90 lm or greater. In some embodiments, package 10 can be configured to have a lumen performance of a minimum luminous flux of approximately 100 lm or greater. For example, a package 10 in which LED 14 generates a dominant wavelength between approximately 610 nm and approximately 630 nm when an electrical signal can be applied to top electrically conductive elements such as contact pads 22, 24 can be configured to have a minimum luminous flux that can be approximately 90 lm or greater. Such an LED package 10 can have, for example, a luminance performance with a minimum luminous flux of approximately 95 lm or greater even in package 10. Wavelength shift can be approximately 0.5 nanometers for a current of approximately 1,000 milliamps.


The size of submount 12 and package 10 can vary depending on different factors, such as, for example, the size of LED(s) 14. Package 10 can have a height H. For example, height H of package 10 can be approximately 2.0 mm as measured between a top of lens 50 and bottom surface 18 of submount 12 as shown in FIG. 2. Package 10 can, as shown in FIG. 1 for example, have a width W and length L that can be generally the same as the length and width of submount 12. For example, package 10 can have a width W of between approximately 3.2 mm and approximately 3.6 mm. Package 10 can have a length L of approximately 3.2 mm and approximately 3.6 mm. For example, package 10 can have a width W of approximately 3.45 mm and a length L of approximately 3.45 mm. When a 1 mm LED is used, package 10 can have a width W of approximately 3.5 mm and a length L of approximately 3.5 mm. When a 0.7 mm LED is used, package 10 can have a width W of approximately 3.2 mm and a length L of approximately 3.2 mm. It is further understood that submount 12 and outer perimeter of package 10 can have other shapes, as viewed from above, including circular, rectangular or other multiple sided shapes.


Since package 10 can be relatively small, but still emit a large amount of light, package 10 can have a large luminous flux to footprint ratio. As an example, an LED package that comprises an LED that generates a dominant wavelength of between approximately 610 nm and approximately 630 nm that can have a luminous flux of 90 lm or greater for a footprint area of approximately 12 mm2 can have a luminous flux to foot print ratio of greater than approximately 7.5 lm/mm2 for a red and/or red-orange light emitting LED. Thus, package 10 can produce a minimum luminous flux to footprint ratio of greater than approximately 7.5 lm/mm2. In some embodiments, package 10 can produce a minimum luminous flux to footprint ratio of approximately 3.75 lm/mm2 or greater. In some embodiments, package 10 can produce a minimum luminous flux to footprint ratio of approximately 8.3 lm/mm2 or greater. For example, package 10 can produce a minimum luminous flux to footprint ratio of between approximately 3.75 lm/mm2 and approximately 8.3 lm/mm2 for a red and/or red-orange light emitting LED. For example, package 10 can produce a minimum luminous flux to footprint ratio of between approximately 5.9 lm/mm2 and approximately 7.9 lm/mm2 for a red and/or red-orange light emitting LED.


Similarly, LED packages 10 as described above used with at least one LED 14 that can emit a dominant wavelength between approximately 610 nm and approximately 630 nm can be efficient in its energy use by generating a high amount of lumens per unit of power used. For example, packages 10 can be configured to generate a light output having a high amount of lumens per watt (lm/W) for a red and/or red-orange light emitting LED such a wavelength range of between approximately 610 nm and approximately 630 nm, or between 610 nm and approximately 620 nm. In some embodiments, LED package 10 can be configured to generate a light output of approximately 120 lm/W or greater for a red and/or red-orange light emitting LED. In some embodiments, the lumens per watt generated by LED package 10 can be, approximately 130 or greater for a red and/or red-orange light emitting LED.


LED package 10 as described above used with at least one LED 14 that can emit a dominant wavelength between approximately 610 nm and approximately 630 nm such package 10 can also have a reduced thermal resistance as compared to conventional LED packages. For example, package 10 can be configured to have a thermal resistance of approximately 3° C./Watt or less. In some embodiments, the thermal resistance for LED package 10 can be approximately 2.5° C./Watt or less. LED package 10 as described above used with at least one LED 14 that can emit a dominant wavelength between approximately 610 nm and approximately 630 nm such package 10 can thus also have a greater operational lifetime as compared to conventional LED packages. For example and based upon operating conditions, LED package 10 can have a predicted L70 lifetime based upon standard modeling practices for lighting of at least 50,000 hours or greater at 350 milliamps and 85° C. In a further aspect, LED package 10 can be configured to have an operational lifetime of at least 35,000 hours or greater at 350 milliamps and 85° C.



FIGS. 7-9 show another embodiment of a package generally designated 110 for one or more LEDs. As above, package 110 can comprise a submount 112 that can have a top surface 116 and a bottom surface 118. Patterned conductive features such as top electrically conductive elements can reside on top surface 116 of submount 112. Top electrically conductive elements can comprise a die attach pad 120 with an integral first contact pad 122 and second contact pad 124. One or more LEDs (not shown) can be mounted approximately at the center of attach pad 120. The one or more LEDs can comprise at least one LED that can emit a dominant wavelength generally between approximately 600 nm and approximately 650 nm, and more particularly between approximately 610 nm and approximately 630 nm, to emit a red and/or red-orange light.


These patterned electrically conductive elements can provide conductive paths for electrical connection to the LED using known contacting methods. The LED can be mounted to attach pad 120 using known methods and material for mounting such as using conventional solder materials that may or may not contain a flux material or dispensed polymeric materials that may be thermally and electrically conductive. Attach pad 120 and first and second contact pads 122, 124 can comprise materials such as metals or other conductive materials as outlined above. As noted above, the LED can be attached to attach pad 120 with the polarity of the LED reversed such that the N-cladding of the LED is below the multi-quantum well and the P-cladding of the LED is above the multi-quantum well.


As above, a gap 126 seen in FIGS. 7 and 9 can be included between second pad 124 and attach pad 120 down to the surface of submount 112. Gap 126 can be in different shapes and widths. For example, as in the embodiment shown, gap 126 can extend in a straight line and/or can have turns, such as angled turns therein. Such turns can be used as markers for placement of the one or more LEDs. Gap 126 can provide electrical isolation between attach pad 120 and second pad 124, which can be used to prevent shorting of the signal applied to the LED. An electrical signal can be applied to the LED through second pad 124 and first pad 122 with the electrical signal on first pad 122 passing to the LED through attach pad 120 and the signal from second pad 124 passing into the LED through wire bonds (not shown).


As above, in some embodiments an electrical signal can be applied to package 110 by providing external electrical contact to first and second bond pads 122, 124 such as by solder contacts or other conductive paths to a PCB. Package 110 can be arranged for mounting using surface mount technology and having internal conductive paths; such as first and second surface mount pads 130, 132 that can be formed on back surface 118 of submount 112 and vias 134 as shown in FIG. 8. As above, first and second surface mount pads 130, 132 can be at least partially aligned with first and second contact pads 122, 124, respectively. It is understood that mounting pads 130, 132 and vias 134 can be arranged in many different ways and can have many different shapes and sizes. It is also understood that instead of vias, one or more conductive traces can be provided on the surface of submount 112 between the mounting pads and contact pads, such as along a side surface of the submount. Package 110 can further comprise a bottom thermally conductive element that can comprise a thermal pad 140 as shown in FIG. 8 on back surface 118 of submount 112, between first and second mounting pads 130, 132. Thermal pad 140 can comprise a heat conductive material and can be in at least partial vertical alignment with the portion of attach pad 120 where the LED is to be attached for the reasons described above.


As shown in FIG. 9, a solder mask 136 made of conventional materials can be included on top surface 116 of submount 112, at least partially covering attach pad 120 and first and second contact pads 122, 124, and at least partially covering gap 126. As above, solder mask 136 can protect these features during subsequent processing steps and in particular mounting the LED (not shown) to attach pad 120 and wire bonding. Solder mask 136 can serve as an insulating and protective material that can reduce or prevent dangers associated with solder or other materials being deposited in undesired areas, which can result in damage to package 110 or result in electrical shorting. Solder mask 136 can comprise an opening 136A for mounting the LED to attach pad 120 and for attaching wire bonds (not shown) to second contact pad 124. Solder mask 136 can also comprise side openings 138 to allow convenient electrical access to first and second contact pads 122, 124, respectively, for testing package 110 during fabrication. Solder mask 136 can also have alignment holes that provide for alignment during fabrication of package 110 and also allow for alignment when mounted in place by an end user.


Additionally, as above, attach pad 120 can be provided with a symbol or indicator 136B to illustrate which side of LED package 110 should be coupled to a positive or negative aspect of the signal to be applied to package 110 as shown in FIG. 7. Symbol 136B can ensure accurate mounting of LED package 110 to a PCB or other fixture, whether by machine or hand. In the embodiment shown the symbol 136B comprises a plus (+) sign over first contact pad 122, indicating that the package 110 should be mounted with the positive of the signal coupled to the first surface mount pad 132. Thus, the negative of the signal would then be coupled to second mount pad 130 and second conductive pad 124. It is understood that many different symbol types can be used and that a symbol can also be included on or over second conductive pad 124.


Further, as shown in embodiments of FIGS. 7-9, cut-outs 128 can be included in attach pad 120 to aid in alignment of the LED. Cut-outs 128 can comprise many different shapes and sizes. In the embodiment shown, cut-outs 128 can provide generally a square outline. When mounting the LED chip to that attach pad 120, the corners of the LED chip can fit on the inside edge of cut-outs 128 for proper alignment. Additionally, cut-outs 128 can be formed by part of gap 126.


LED packaging configured as packages 10 and 110 can provide a greater minimum luminous flux than LED packages using conventional types of packaging. Thus, LED packages similar to LED packages 10 and 110 can be approximately 10% to approximately 25% brighter than conventional LED packages for LEDs that generate a dominant wavelength between, for example, approximately 610 and approximately 630 nm or between approximately 610 and approximately 620 nm. Packages 10, 110 can be configured to generate a light output of a large amount of lumens per watt. In some embodiments, LED packages 10, 110 can be configured to generate a light output of approximately 120 lm/W or greater. In some embodiments, the lumens per watt generated by LED packages 10, 110 can be approximately 130 lm/W or greater.


Further, such packages 10, 110 can be configured to have a lumen performance when a current of approximately 350 mA is applied to packages 10, 110 that can be a minimum luminous flux of approximately 90 lm or greater. For example, the LED(s) that can emit light having a dominant wavelength of approximately 610 to approximately 630 nm can have a luminance performance with the minimum luminous flux of approximately 95 lm or greater in packages 10, 110.


As stated above, LED packages 10, 110 as described above used with at least one LED 14 that can emit a dominant wavelength between approximately 610 nm and approximately 630 nm such packages 10, 110 can also have a reduced thermal resistance as compared to conventional LED packages. For example, packages 10, 110 can be configured to have a thermal resistance of approximately 3° C./Watt or less. In some embodiments, the thermal resistance for LED packages 10, 110 can be approximately 2.5° C./Watt or less. Thereby, due to the improve performance characteristics described above, LED packages 10, 110 that have at least one LED that can emit a dominant wavelength between approximately 600 nm and approximately 650 nm can thus also have greater operational lifetimes as compared to conventional LED packages. For example and based upon operating conditions, LED packages 10, 110 can have a predicted L70 lifetime based upon standard modeling practices for lighting of at least 50,000 hours or greater at 350 milliamps and 85° C. In a further aspect, they can have an operational lifetime of at least 35,000 hours or greater at 350 milliamps and 85° C.


Embodiments of the present disclosure shown in the drawings and described above are exemplary of numerous embodiments that can be made within the scope of the appended claims. It is contemplated that the configurations of LED packages and methods disclosed herein can comprise numerous configurations other than those specifically disclosed.

Claims
  • 1. A light-emitting die (LED) package comprising: a ceramic submount comprising a top surface, a bottom surface, and a plurality of side edges;a bottom thermally conductive element disposed on the bottom surface of the submount for conducting heat from the submount;an LED having a multi-quantum well and disposed on the submount, the LED operable for emitting a dominant wavelength between approximately 610 nm and approximately 630 nm, the LED having a luminous flux that is approximately 100 lm or greater, such that a minimum luminous flux to footprint ratio for the LED package is greater than approximately 5.8 lm/mm2 of a footprint of the LED package when an electrical signal comprises a current of approximately 350 mA;a flux eutectic LED die attachment attaching the LED to the submount;a lens molded over the LED and the submount; anda protective layer substantially disposed over the top surface of the ceramic submount between the ceramic submount and the lens;wherein a polarity of the LED is such that an N-cladding of the LED is below the multi-quantum well and a P-cladding of the LED is above the multi-quantum well; and
  • 2. The LED package of claim 1, wherein the submount comprises aluminum nitride.
  • 3. The LED package of claim 1, wherein the LED package is configured to generate a light output of approximately 130 lumens/watt or greater.
  • 4. The LED package of claim 1, wherein the LED package is configured to have a predicted L70 lifetime of at least 50,000 hours or greater at 350 milliamps and 85° C.
  • 5. The LED package of claim 1, wherein the lens is of a radius size of approximately 1.275 mm or greater.
  • 6. The LED package of claim 1 wherein the LED package comprises: a plurality of top electrically conductive elements on the top surface of the submount; andthe LED disposed on at least one of the top electrically conductive elements.
  • 7. The LED package of claim 6, wherein the submount comprises aluminum nitride.
  • 8. The LED package of claim 1, wherein the protective layer is substantially disposed over an entirety of the top surface of the ceramic submount between the ceramic submount and the lens.
  • 9. A light-emitting die (LED) package comprising: a ceramic submount comprising a top surface, a bottom surface, and a plurality of side edges;a bottom thermally conductive element disposed on the bottom surface of the submount for conducting heat from the submount;an LED having a multi-quantum well and disposed on the submount, the LED operable for emitting a dominant wavelength between approximately 610 nm and approximately 630 nm, the LED having a luminous flux that is approximately 100 lm or greater, such that a minimum luminous flux to footprint ratio for the LED package is greater than approximately 5.8 lm/mm2 of a footprint of the LED package when an electrical signal comprises a current of approximately 350 mA;a flux eutectic LED die attachment attaching the LED to the submount;a lens molded over the LED and the submount; anda protective layer substantially disposed over the top surface of the ceramic submount between the ceramic submount and the lens;wherein a polarity of the LED is such that an N-cladding of the LED is below the multi-quantum well and a P-cladding of the LED is above the multi-quantum well; andwherein each of the plurality of side edges of the ceramic submount is substantially flush with a corresponding side edge of the protective layer,wherein the LED package generates a light output of approximately 120 lumens/watt or greater.
  • 10. The LED package of claim 9, wherein the submount comprises aluminum nitride.
  • 11. The LED package of claim 9, wherein the LED package is configured to generate a light output of approximately 130 lumens per watt or greater.
  • 12. The LED package of claim 9, wherein the LED package is configured to have a predicted L70 lifetime of at least 50,000 hours or greater at 350 milliamps and 85° C.
  • 13. The LED package of claim 9, wherein the lens is of a radius size of approximately 1.275 mm or greater.
  • 14. The LED package of claim 9 wherein the LED package comprises: a plurality of top electrically conductive elements on the top surface of the submount; andthe LED disposed on one of the top electrically conductive elements.
  • 15. The LED package of claim 14, wherein the submount comprises aluminum nitride.
  • 16. A light-emitting die (LED) package comprising: a submount comprising aluminum nitride comprising a top surface, a bottom surface, and a plurality of side edges;a bottom thermally conductive element disposed on the bottom surface of the submount for conducting heat from the submount;an LED having a multi-quantum well and disposed on the submount, the LED operable for emitting a dominant wavelength between approximately 610 nm and approximately 630 nm, the LED having a luminous flux that is approximately 100 lm or greater, such that a minimum luminous flux to footprint ratio for the LED package is greater than approximately 5.8 lm/mm2 of a footprint of the LED package when an electrical signal comprises a current of approximately 350 mA;a flux eutectic LED die attachment attaching the LED to the submount;a lens molded over the LED and the submount; anda protective layer substantially disposed over the top surface of the submount between the submount and the lens;wherein a polarity of the LED is such that an N-cladding of the LED is below the multi-quantum well and a P-cladding of the LED is above the multi-quantum well; andwherein each of the plurality of side edges of the ceramic submount is substantially flush with a corresponding side edge of the protective layer,wherein the LED package generates a light output of approximately 120 lumens/watt or greater.
  • 17. A method of operating a light-emitting die (LED) package comprising: providing an LED package comprising: a ceramic submount comprising a top surface, a bottom surface, and a plurality of side edges;a bottom thermally conductive element disposed on the bottom surface of the submount for conducting heat from the submount;an LED disposed on the submount, the LED having a multi-quantum well with a polarity such that an N-cladding of the LED is below the multi-quantum well and a P-cladding of the LED is above the multi-quantum well, the LED operable for emitting a dominant wavelength between approximately 610 nm and approximately 630 nm, the LED having a luminous flux that is approximately 100 lm or greater, such that a minimum luminous flux to footprint ratio for the LED package is greater than approximately 5.8 lm/mm2 of a footprint of the LED package when an electrical signal comprises a current of approximately 350 mA;a flux eutectic LED die attachment attaching the LED to the submount;a lens molded over the LED and the submount;wherein each of the plurality of side edges of the ceramic submount is substantially flush with a corresponding side edge of the protective layer;applying an electrical signal to the LED package; andgenerating a light output from the LED in the LED package that is approximately 120 lumens per watts or greater.
  • 18. The method of claim 17, wherein the LED package is configured to have a predicted L70 lifetime of at least 50,000 hours or greater at 350 milliamps and 85° C.
  • 19. A light-emitting die (LED) package comprising: a submount comprising a top surface, a bottom surface, and a plurality of side edges;a bottom thermally conductive element disposed on the bottom surface of the submount for conducting heat from the submount;an LED having a multi-quantum well and disposed on the submount, the LED operable for emitting a dominant wavelength between approximately 610 nm and approximately 630 nm, the LED having a luminous flux that is approximately 100 lm or greater, such that a minimum luminous flux to footprint ratio for the LED package is greater than approximately 5.8 lm/mm2 of a footprint of the LED package when an electrical signal comprises a current of approximately 350 mA;a flux eutectic LED die attachment attaching the LED to the submount;a lens molded over the LED and the submount; anda protective layer substantially disposed over the top surface of the submount between the submount and the lens;wherein a polarity of the LED is such that an N-cladding of the LED is below the multi-quantum well and a P-cladding of the LED is above the multi-quantum well; andwherein each of the plurality of side edges of the ceramic submount is substantially flush with at least one corresponding side edge of the protective layer,wherein the LED package generates a light output of approximately 120 lumens/watt or greater.
CROSS REFERENCE TO RELATED APPLICATIONS

This application relates, claims priority to and is a continuation-in-part application from these related matters: U.S. utility patent application Ser. No. 11/982,275, filed Oct. 31, 2007 now U.S. Pat. No. 9,070,850; and U.S. utility patent application Ser. No. 12/757,891, filed Apr. 9, 2010 now U.S. Pat. No. 8,866,169. The entire contents of all of the above matters are hereby incorporated by reference herein.

US Referenced Citations (379)
Number Name Date Kind
1880399 Benjamin Oct 1932 A
3760237 Jaffe Sep 1973 A
4152044 Liu May 1979 A
D259782 Mochizuki et al. Jul 1981 S
4307297 Groff Dec 1981 A
4322725 Tetsuo et al. Mar 1982 A
4322735 Shibawra et al. Mar 1982 A
4511425 Boyd Apr 1985 A
4675575 Smith Jun 1987 A
4946547 Palmour et al. Aug 1990 A
5008718 Fletcher Apr 1991 A
5040868 Waitl Aug 1991 A
5042048 Meyer Aug 1991 A
5122943 Pugh Jun 1992 A
5130761 Toshiaki Jul 1992 A
5167556 Stein Dec 1992 A
5200022 Kong et al. Apr 1993 A
5210051 Carter May 1993 A
D345731 Owens et al. Apr 1994 S
5351106 Lesko Sep 1994 A
RE34861 Davis et al. Feb 1995 E
5393993 Edmond et al. Feb 1995 A
D358806 Siegel et al. May 1995 S
D359028 Siegel et al. Jun 1995 S
5477436 Bertling et al. Dec 1995 A
5523589 Edmond et al. Jun 1996 A
5703401 Van de Water Dec 1997 A
5706177 Nather Jan 1998 A
5731547 Derwin et al. Mar 1998 A
D396847 Nakayama et al. Aug 1998 S
D397092 Sano et al. Aug 1998 S
5790298 Tonar Aug 1998 A
5813753 Vriens et al. Sep 1998 A
5907151 Gramann May 1999 A
5942770 Ishinaga et al. Aug 1999 A
5959316 Lowery Sep 1999 A
6040626 Cheah et al. Mar 2000 A
6045240 Hochstein Apr 2000 A
D424725 Cousins May 2000 S
6061160 Maruyama May 2000 A
6066861 Hohn et al. May 2000 A
D427977 Takizawa et al. Jul 2000 S
6183100 Suckow et al. Feb 2001 B1
D439351 Kiba et al. Mar 2001 S
6224216 Parker et al. May 2001 B1
6242800 Munos et al. Jun 2001 B1
6259608 Berardinelli et al. Jul 2001 B1
6265761 Ghai Jul 2001 B1
6274924 Carey et al. Aug 2001 B1
6296367 Parsons et al. Oct 2001 B1
6330111 Myers Dec 2001 B1
6331915 Myers Dec 2001 B1
6335548 Roberts et al. Jan 2002 B1
6359236 Distefano et al. Mar 2002 B1
6376902 Arndt Apr 2002 B1
6376915 Hikita et al. Apr 2002 B1
6392294 Yamaguchi May 2002 B1
6447124 Fletcher et al. Sep 2002 B1
6454437 Kelly Sep 2002 B1
6469321 Arndt Oct 2002 B2
6480389 Shie et al. Nov 2002 B1
D466485 Maehara et al. Dec 2002 S
6517218 Hochstein Feb 2003 B2
D471165 Williams et al. Mar 2003 S
6536913 Yajima et al. Mar 2003 B1
D472528 Kasem et al. Apr 2003 S
6573580 Arndt Jun 2003 B2
D476962 Yoshihira et al. Jul 2003 S
D477580 Kamada Jul 2003 S
6608334 Ishinaga Aug 2003 B1
6610563 Waitl Aug 2003 B1
6614058 Lin et al. Sep 2003 B2
6621210 Kato et al. Sep 2003 B2
6624491 Waitl et al. Sep 2003 B2
6657393 Natsume Dec 2003 B2
6680490 Yasukawa et al. Jan 2004 B2
6686580 Glenn et al. Feb 2004 B1
6686609 Sung Feb 2004 B1
6700136 Guida Mar 2004 B2
6707069 Song et al. Mar 2004 B2
6710373 Wang Mar 2004 B2
6717353 Mueller et al. Apr 2004 B1
6734467 Schlereth et al. May 2004 B2
6746889 Eliashevich et al. Jun 2004 B1
6759733 Arndt Jul 2004 B2
6765235 Tankinaka et al. Jul 2004 B2
6770498 Hsu Aug 2004 B2
6774401 Nakada et al. Aug 2004 B2
6784463 Camras et al. Aug 2004 B2
6791259 Stokes Sep 2004 B1
6809342 Harada Oct 2004 B2
6858879 Waitl Feb 2005 B2
6872585 Matsumura et al. Mar 2005 B2
6876149 Miyashita Apr 2005 B2
6900511 Ruhnau et al. May 2005 B2
6911678 Fujisawa et al. Jun 2005 B2
6914268 Shei Jul 2005 B2
6919586 Fujii Jul 2005 B2
6932497 Huang Aug 2005 B1
6940704 Stalions Sep 2005 B2
6946714 Waitl Sep 2005 B2
6964877 Chen et al. Nov 2005 B2
6975011 Arndt Dec 2005 B2
D515045 Suenaga Feb 2006 S
6995405 Braddell Feb 2006 B2
6995510 Murakami et al. Feb 2006 B2
7005679 Tarsa et al. Feb 2006 B2
D516528 Nakamura et al. Mar 2006 S
D517025 Asakawa Mar 2006 S
7009285 Su et al. Mar 2006 B2
7009627 Abe et al. Mar 2006 B2
7015514 Baur et al. Mar 2006 B2
7021797 Minano et al. Apr 2006 B2
7049159 Lowery May 2006 B2
7057273 Hamden et al. Jun 2006 B2
7064907 Kaneko Jun 2006 B2
7066626 Omata Jun 2006 B2
7078728 Ishii et al. Jul 2006 B2
7087936 Negley Aug 2006 B2
7091653 Ouderkirk et al. Aug 2006 B2
D528672 Nagai et al. Sep 2006 S
7102213 Sorg Sep 2006 B2
7102215 Arndt Sep 2006 B2
7119422 Chin Oct 2006 B2
7126274 Shimizu et al. Oct 2006 B2
7161189 Wu Jan 2007 B2
7183632 Arndt Feb 2007 B2
7187009 Fukasawa Mar 2007 B2
D542743 Jung et al. May 2007 S
7210807 Sakamoto et al. May 2007 B2
7213940 Van De Ven et al. May 2007 B1
7224000 Aanegola et al. May 2007 B2
7244965 Andrews et al. Jul 2007 B2
7262053 Hanson et al. Aug 2007 B2
7264378 Loh Sep 2007 B2
7271425 Arndt et al. Sep 2007 B2
7280288 Loh et al. Oct 2007 B2
7282740 Chikugawa et al. Oct 2007 B2
7282785 Yoshida Oct 2007 B2
7285802 Ouderkirk et al. Oct 2007 B2
7286926 Gotoh et al. Oct 2007 B2
7293889 Kamiya Nov 2007 B2
7303315 Ouderkirk et al. Dec 2007 B2
7317181 Murakami et al. Jan 2008 B2
7321161 Teixeira et al. Jan 2008 B2
7364950 Funato et al. Apr 2008 B2
D572210 Lee Jul 2008 S
D572670 Ono et al. Jul 2008 S
D576574 Kobayakawa Sep 2008 S
7429757 Oyama et al. Sep 2008 B2
7436002 Brunner et al. Oct 2008 B2
7439667 Ohtani Oct 2008 B2
7495322 Hashimoto Feb 2009 B2
7514867 Yano Apr 2009 B2
D591697 Andrews et al. May 2009 S
D593224 Hanley May 2009 S
D594827 Loh et al. Jun 2009 S
D598579 Hanley Aug 2009 S
7579628 Inoguchi Aug 2009 B2
7614759 Negley Nov 2009 B2
7622795 Chiang Nov 2009 B2
7635915 Xie et al. Dec 2009 B2
7649209 Hussell et al. Jan 2010 B2
7675145 Wong et al. Mar 2010 B2
7692206 Loh Apr 2010 B2
7705826 Kalt et al. Apr 2010 B2
7718991 Negley May 2010 B2
7722220 Van de Ven May 2010 B2
7777412 Pang Aug 2010 B2
7800124 Urano et al. Sep 2010 B2
7813400 Denbaars et al. Oct 2010 B2
7821023 Yuan et al. Oct 2010 B2
7828460 Van de Ven Nov 2010 B2
7841747 Oon et al. Nov 2010 B2
7847302 Basin et al. Dec 2010 B2
7862214 Trott Jan 2011 B2
7875899 Yasuda Jan 2011 B2
7919339 Hsu Apr 2011 B2
7923831 Ng Apr 2011 B2
7959329 Van de Ven Jun 2011 B2
7999283 Chakraborty Aug 2011 B2
8008676 Negley Aug 2011 B2
8011818 Negley Sep 2011 B2
8029155 Van de Ven Oct 2011 B2
8033692 Negley Oct 2011 B2
8049230 Chan et al. Nov 2011 B2
8217414 Hayashi Jul 2012 B2
8324654 An et al. Dec 2012 B2
8362512 Hussell et al. Jan 2013 B2
8362605 Hui et al. Jan 2013 B2
8367945 Cheong et al. Feb 2013 B2
8368112 Chan et al. Feb 2013 B2
8431423 Basin et al. Apr 2013 B2
8541797 Hoelen et al. Sep 2013 B2
8563339 Tarsa et al. Oct 2013 B2
8564004 Tarsa et al. Oct 2013 B2
8614456 Leising Dec 2013 B2
8669572 Leung et al. Mar 2014 B2
8735920 Tarsa et al. May 2014 B2
8748915 Chan et al. Jun 2014 B2
8791471 Lueng Jul 2014 B2
8866169 Emerson et al. Oct 2014 B2
9035439 Xuan et al. May 2015 B2
9070850 Keller et al. Jun 2015 B2
20020015013 Ragle Feb 2002 A1
20020021085 Ng Feb 2002 A1
20020030194 Camras et al. Mar 2002 A1
20020054495 Natsume May 2002 A1
20020061174 Hurt et al. May 2002 A1
20020123163 Fujii Sep 2002 A1
20020130405 Kobayashi et al. Sep 2002 A1
20020163001 Shaddock Nov 2002 A1
20020171911 Maegawa Nov 2002 A1
20020195935 Jager Dec 2002 A1
20030015708 Parikh et al. Jan 2003 A1
20030020069 Holmes et al. Jan 2003 A1
20030116769 Song et al. Jun 2003 A1
20030141506 Sano Jul 2003 A1
20030160256 Durocher et al. Aug 2003 A1
20030165169 Nomoto et al. Sep 2003 A1
20030183852 Takenaka Oct 2003 A1
20040016938 Baretz et al. Jan 2004 A1
20040037076 Katoh et al. Feb 2004 A1
20040041222 Loh Mar 2004 A1
20040047151 Bogner et al. Mar 2004 A1
20040061120 Mizuyoshi Apr 2004 A1
20040079957 Andrews et al. Apr 2004 A1
20040080251 Steranka Apr 2004 A1
20040090174 Tasch et al. May 2004 A1
20040207313 Omoto et al. Oct 2004 A1
20040217364 Tarsa et al. Nov 2004 A1
20040227149 Ibbetson Nov 2004 A1
20040232435 Hofer Nov 2004 A1
20040238930 Arndt Dec 2004 A1
20040256706 Nakashima Dec 2004 A1
20050023548 Bhat Feb 2005 A1
20050035366 Imai Feb 2005 A1
20050072981 Suenaga Apr 2005 A1
20050077535 Li Apr 2005 A1
20050082574 Tasch et al. Apr 2005 A1
20050093005 Ruhnau May 2005 A1
20050093430 Ibbetson et al. May 2005 A1
20050110033 Heremans et al. May 2005 A1
20050117320 Leu Jun 2005 A1
20050127377 Arndt Jun 2005 A1
20050135105 Teixeira et al. Jun 2005 A1
20050173692 Park et al. Aug 2005 A1
20050179041 Harbers et al. Aug 2005 A1
20050179376 Fung et al. Aug 2005 A1
20050199899 Lin Sep 2005 A1
20050205974 Su et al. Sep 2005 A1
20050212397 Murazaki Sep 2005 A1
20050212405 Negley Sep 2005 A1
20050221519 Su et al. Sep 2005 A1
20050221518 Andrews et al. Oct 2005 A1
20050231983 Dahm Oct 2005 A1
20050253130 Tsutsumi et al. Nov 2005 A1
20050265987 Loh et al. Dec 2005 A1
20050269587 Loh Dec 2005 A1
20060006404 Ibbetson Jan 2006 A1
20060022212 Waitl Feb 2006 A1
20060034576 Merritt et al. Feb 2006 A1
20060049422 Shoji Mar 2006 A1
20060049477 Arndt Mar 2006 A1
20060054912 Murakami et al. Mar 2006 A1
20060060867 Suehirom Mar 2006 A1
20060063287 Andrews Mar 2006 A1
20060076568 Keller et al. Apr 2006 A1
20060081862 Chua et al. Apr 2006 A1
20060091406 Kaneko et al. May 2006 A1
20060102917 Cyama et al. May 2006 A1
20060105478 Camras et al. May 2006 A1
20060105485 Basin et al. May 2006 A1
20060108594 Iwasaki et al. May 2006 A1
20060118775 Nagai Jun 2006 A1
20060131591 Sumitani Jun 2006 A1
20060133044 Kim et al. Jun 2006 A1
20060151809 Isokawa Jul 2006 A1
20060152926 Hama Jul 2006 A1
20060157725 Flaherty Jul 2006 A1
20060157828 Sorg Jul 2006 A1
20060158899 Ayabe et al. Jul 2006 A1
20060180818 Nagai Aug 2006 A1
20060180925 Lee et al. Aug 2006 A1
20060186418 Edmond et al. Aug 2006 A1
20060198418 Hama Sep 2006 A1
20060220046 Yu Oct 2006 A1
20060255355 Brunner et al. Nov 2006 A1
20060267031 Tasch et al. Nov 2006 A1
20060267042 Izuno et al. Nov 2006 A1
20060278882 Leung et al. Dec 2006 A1
20060291185 Atsushi Dec 2006 A1
20070025231 Ochiai et al. Feb 2007 A1
20070046176 Bukesov et al. Mar 2007 A1
20070090383 Ota et al. Apr 2007 A1
20070096139 Schultz May 2007 A1
20070109779 Sekiguchi et al. May 2007 A1
20070139923 Negley Jun 2007 A1
20070145401 Ikehara Jun 2007 A1
20070170447 Negley Jul 2007 A1
20070170449 Anandan Jul 2007 A1
20070170450 Murphy Jul 2007 A1
20070241357 Yan Oct 2007 A1
20070262328 Bando Nov 2007 A1
20070262339 Hussell et al. Nov 2007 A1
20070269586 Leatherdale Nov 2007 A1
20070278506 Tran Dec 2007 A1
20070279903 Negley Dec 2007 A1
20070295975 Omae Dec 2007 A1
20080013319 Pei et al. Jan 2008 A1
20080026498 Tarsa et al. Jan 2008 A1
20080036364 Li et al. Feb 2008 A1
20080041625 Cheong et al. Feb 2008 A1
20080079017 Loh Apr 2008 A1
20080084685 Van de Ven Apr 2008 A1
20080084701 Van de Ven Apr 2008 A1
20080089053 Negley Apr 2008 A1
20080093606 Pan et al. Apr 2008 A1
20080112168 Pickard et al. May 2008 A1
20080121921 Loh et al. May 2008 A1
20080130282 Negley Jun 2008 A1
20080137347 Trott Jun 2008 A1
20080149960 Amo et al. Jun 2008 A1
20080170391 Norfidathul et al. Jul 2008 A1
20080173884 Chitnis et al. Jul 2008 A1
20080179611 Chitnis Jul 2008 A1
20080186702 Camras et al. Aug 2008 A1
20080191232 Lee et al. Aug 2008 A1
20080198594 Lee Aug 2008 A1
20080230790 Seko et al. Sep 2008 A1
20080258130 Bergmann et al. Oct 2008 A1
20080258156 Hata Oct 2008 A1
20080258168 Loh et al. Oct 2008 A1
20080265268 Braun et al. Oct 2008 A1
20080296590 Ng Dec 2008 A1
20080298063 Hayashi Dec 2008 A1
20080303052 Lee et al. Dec 2008 A1
20080308825 Chakraborty et al. Dec 2008 A1
20090020774 Park Jan 2009 A1
20090021841 Negley Jan 2009 A1
20090050907 Yuan Feb 2009 A1
20090050908 Yuan et al. Feb 2009 A1
20090050911 Chakraborty Feb 2009 A1
20090050924 Edmond Feb 2009 A1
20090057699 Basin Mar 2009 A1
20090057708 Abdul et al. Mar 2009 A1
20090072251 Chan et al. Mar 2009 A1
20090078948 Hoelen et al. Mar 2009 A1
20090095966 Keller et al. Apr 2009 A1
20090108281 Keller et al. Apr 2009 A1
20090129085 Aizar et al. May 2009 A1
20090152573 Loh Jun 2009 A1
20090189178 Kim et al. Jul 2009 A1
20090231835 Roberts Sep 2009 A1
20090231856 Householder Sep 2009 A1
20090236618 Yasuda Sep 2009 A1
20090283781 Chan et al. Nov 2009 A1
20100001299 Chang et al. Jan 2010 A1
20100044735 Oyamada Feb 2010 A1
20100052126 Hui et al. Mar 2010 A1
20100090233 Hussell et al. Apr 2010 A1
20100103660 Van de Ven et al. Apr 2010 A1
20100105172 Li Apr 2010 A1
20100117099 Leung May 2010 A1
20100133002 Xuan et al. Jun 2010 A1
20100140648 Harada et al. Jun 2010 A1
20100193822 Inobe et al. Aug 2010 A1
20100200887 Urano et al. Aug 2010 A1
20100252851 Emerson Oct 2010 A1
20110049545 Besin et al. Mar 2011 A1
20110108874 Chu et al. May 2011 A1
20110121345 Andrews et al. May 2011 A1
20110186880 Kohler et al. Aug 2011 A1
20110193118 Oshima et al. Aug 2011 A1
20110248287 Yuan Oct 2011 A1
20110278617 Lee Nov 2011 A1
20120002419 Zaderej et al. Jan 2012 A1
20120235199 Andrews et al. Sep 2012 A1
20120257386 Harbers et al. Oct 2012 A1
Foreign Referenced Citations (194)
Number Date Country
1 274 906 Nov 2000 CN
1274906 Nov 2000 CN
2 498 694 Jul 2002 CN
2498694 Jul 2002 CN
2 549 313 May 2003 CN
2549313 May 2003 CN
2 646 873 Oct 2004 CN
2646873 Oct 2004 CN
1 581 527 Feb 2005 CN
1581527 Feb 2005 CN
1 591 924 Mar 2005 CN
1591924 Mar 2005 CN
1 679 168 Oct 2005 CN
1679168 Oct 2005 CN
1 720 608 Jan 2006 CN
1720608 Jan 2006 CN
1 744 335 Mar 2006 CN
1744335 Mar 2006 CN
1 801 498 Jul 2006 CN
1801498 Jul 2006 CN
1 874 011 Dec 2006 CN
1874011 Dec 2006 CN
1 913 135 Feb 2007 CN
1913135 Feb 2007 CN
101 005 109 Jul 2007 CN
101005109 Jul 2007 CN
101 013 689 Aug 2007 CN
101013689 Aug 2007 CN
101 061 590 Oct 2007 CN
101061590 Oct 2007 CN
101 360 368 Feb 2009 CN
101360368 Feb 2009 CN
20 2007 012 162 Apr 2008 DE
202007012162 Apr 2008 DE
0 684 648 Nov 1995 EP
0684648 Nov 1995 EP
0 936 682 Aug 1999 EP
0936682 Aug 1999 EP
1 005 085 May 2000 EP
1005085 May 2000 EP
1 187 226 Mar 2002 EP
1 187 227 Mar 2002 EP
1 187 228 Mar 2002 EP
1187226 Mar 2002 EP
1187227 Mar 2002 EP
1187228 Mar 2002 EP
1 349 202 Oct 2003 EP
1349202 Oct 2003 EP
1 521 313 Apr 2005 EP
1521313 Apr 2005 EP
1 536 487 Jun 2005 EP
1536487 Jun 2005 EP
1 653 254 May 2006 EP
1 653 255 May 2006 EP
1653254 May 2006 EP
1653255 May 2006 EP
1 681 509 Jul 2006 EP
1681509 Jul 2006 EP
1 693 904 Aug 2006 EP
1693904 Aug 2006 EP
1 864 780 Dec 2007 EP
1864780 Dec 2007 EP
2 586 844 Mar 1987 FR
2586844 Mar 1987 FR
2 759 188 Aug 1998 FR
2759188 Aug 1998 FR
2 814 220 Mar 2002 FR
2814220 Mar 2002 FR
2420221 Dec 2004 GB
2 420 221 May 2006 GB
2 466 633 Jul 2010 GB
2466633 Jul 2010 GB
S53-118019 Oct 1978 JP
S53118019 Oct 1978 JP
S 53126570 Oct 1978 JP
59-027559 Feb 1984 JP
S59-27559 Feb 1984 JP
61-048951 Mar 1986 JP
61-48951 Mar 1986 JP
S 62160564 Mar 1986 JP
62-047156 Feb 1987 JP
62-47156 Feb 1987 JP
62140758 Sep 1987 JP
038459 Jan 1991 JP
03-171780 Jul 1991 JP
06-177424 Jun 1994 JP
07-202271 Aug 1995 JP
0832120 Feb 1996 JP
51-048951 Mar 1996 JP
5148951 Mar 1996 JP
8139257 May 1996 JP
H 08-139 257 May 1996 JP
10-135492 May 1998 JP
10-321909 Dec 1998 JP
H11-54802 Feb 1999 JP
11-167805 Jun 1999 JP
2000-188358 Jul 2000 JP
2000-223752 Aug 2000 JP
2000223752 Aug 2000 JP
2000-261041 Sep 2000 JP
2001-044506 Feb 2001 JP
2001-168400 Jun 2001 JP
2001-237463 Aug 2001 JP
2002-009217 Jan 2002 JP
2002-223005 Aug 2002 JP
2002-374005 Dec 2002 JP
2003-197974 Jul 2003 JP
2003-264267 Sep 2003 JP
2003-318449 Nov 2003 JP
2003-324214 Nov 2003 JP
2004-022862 Jan 2004 JP
2004-056075 Feb 2004 JP
2004-103775 Feb 2004 JP
2004-507114 Mar 2004 JP
2004-111937 Apr 2004 JP
2004-200236 Jul 2004 JP
2004-228387 Aug 2004 JP
2004-228387 Aug 2004 JP
2004-327955 Nov 2004 JP
2004-335740 Nov 2004 JP
2004-3474480 Nov 2004 JP
2004335880 Nov 2004 JP
2004-342870 Dec 2004 JP
2005-019838 Jan 2005 JP
2005-19838 Jan 2005 JP
2005-079167 Mar 2005 JP
2005-223222 Aug 2005 JP
2005-259754 Sep 2005 JP
2005-259972 Sep 2005 JP
2005-310935 Nov 2005 JP
2005-347401 Dec 2005 JP
2005-539386 Dec 2005 JP
2006-019557 Jan 2006 JP
2006-508537 Mar 2006 JP
2006-509372 Mar 2006 JP
2006-108517 Apr 2006 JP
2006-119357 May 2006 JP
2006-179520 Jul 2006 JP
2006-253689 Sep 2006 JP
2006-324331 Nov 2006 JP
2006-332234 Dec 2006 JP
2006344692 Dec 2006 JP
2007-094088 Apr 2007 JP
2007-509505 Apr 2007 JP
2007-165029 Jun 2007 JP
2007-165840 Jun 2007 JP
2007-184542 Jul 2007 JP
2007-243226 Sep 2007 JP
2007-273763 Oct 2007 JP
2007-287981 Nov 2007 JP
2007-299905 Nov 2007 JP
2007-329516 Nov 2007 JP
2007-317896 Dec 2007 JP
2007-329516 Dec 2007 JP
2008518461 May 2008 JP
2008521236 Jun 2008 JP
2004-146815 May 2014 JP
2251761 Feb 2005 RU
352241 Jul 2008 TV
160799 Jun 1991 TW
171255 Oct 1991 TW
352241 Jul 2008 TW
WO 9856043 Dec 1998 WO
WO 9931737 Jun 1999 WO
WO 0211212 Feb 2002 WO
WO 0217405 Feb 2002 WO
WO 03044870 May 2003 WO
WO 03049204 Jun 2003 WO
WO 2004036660 Apr 2004 WO
WO 04027882 Apr 2004 WO
WO 04044877 May 2004 WO
WO 2004053933 Jun 2004 WO
WO 2004107461 Dec 2004 WO
WO 05043627 May 2005 WO
WO 05104247 Nov 2005 WO
WO 2006016398 Feb 2006 WO
WO 2006046981 May 2006 WO
WO 2006048064 May 2006 WO
WO 2006-054228 May 2006 WO
WO 06054228 May 2006 WO
WO 06054228 May 2006 WO
WO 2006-054228 Jun 2006 WO
WO 2006-135502 Dec 2006 WO
WO 07005844 Jan 2007 WO
WO 2007083408 Jul 2007 WO
WO 2007-121486 Oct 2007 WO
WO 2007122516 Nov 2007 WO
WO 2008082098 Jun 2008 WO
WO 2008081696 Jul 2008 WO
WO 2008081794 Jul 2008 WO
WO 2008082098 Jul 2008 WO
WO 2009074919 Jun 2009 WO
WO 2010005294 Jan 2010 WO
WO 2012-099145 Jul 2012 WO
Non-Patent Literature Citations (521)
Entry
Advisory Action for U.S. Appl. No. 11/149,998 dated Jul. 15, 2010.
Advisory Action for U.S. Appl. No. 11/149,998 dated Nov. 30, 2011.
Advisory Action for U.S. Appl. No. 11/465,120 dated May 4, 2009.
Advisory Action for U.S. Appl. No. 11/465,120 dated Nov. 16, 2010.
Advisory Action for U.S. Appl. No. 11/496,922 dated Apr. 8, 2010.
Advisory Action for U.S. Appl. No. 11/496,922 dated Sep. 10, 2013.
Advisory Action for U.S. Appl. No. 11/496,922 mailed Apr. 18, 2012.
Advisory Action for U.S. Appl. No. 11/600,617 dated Oct. 20, 2009.
Advisory Action for U.S. Appl. No. 11/982,275 dated Dec. 23, 2014.
Advisory Action for U.S. Appl. No. 11/982,275 dated Jul. 5, 2013.
Advisory Action for U.S. Appl. No. 12/002,410 dated Apr. 10, 2014.
Advisory Action for U.S. Appl. No. 12/002,410 dated Aug. 28, 2015.
Advisory Action for U.S. Appl. No. 12/002,410 dated Aug. 30, 2016.
Advisory Action for U.S. Appl. No. 12/002,410 dated Jul. 26, 2010.
Advisory Action for U.S. Appl. No. 12/002,410 dated Jun. 14, 2012.
Advisory Action for U.S. Appl. No. 12/002,410 dated Jun. 21, 2011.
Advisory Action for U.S. Appl. No. 12/069,827 dated Aug. 28, 2015.
Advisory Action for U.S. Appl. No. 12/069,827 dated Feb. 7, 2013.
Advisory Action for U.S. Appl. No. 12/069,827 dated Jan. 12, 2015.
Advisory Action for U.S. Appl. No. 12/069,827 dated Jan. 6, 2011.
Advisory Action for U.S. Appl. No. 12/069,827 dated Jun. 12, 2012.
Advisory Action for U.S. Appl. No. 12/069,827 dated May 17, 2016.
Advisory Action for U.S. Appl. No. 12/069,827 dated Sep. 11, 2013.
Advisory Action for U.S. Appl. No. 12/069,827 dated Sep. 7, 2011.
Advisory Action for U.S. Appl. No. 12/291,293 dated Nov. 9, 2010.
Advisory Action for U.S. Appl. No. 12/291,293 dated Oct. 28, 2013.
Advisory Action for U.S. Appl. No. 12/291,293 dated Sep. 21, 2011.
Advisory Action for U.S. Appl. No. 12/321,059 dated Aug. 26, 2011.
Advisory Action for U.S. Appl. No. 12/321,059 dated Dec. 6, 2010.
Advisory Action for U.S. Appl. No. 12/695,978 dated Aug. 19, 2014.
Advisory Action for U.S. Appl. No. 12/695,978 dated Nov. 14, 2013.
Advisory Action for U.S. Appl. No. 12/757,179 dated Jul. 24, 2013.
Advisory Action for U.S. Appl. No. 12/757,891 dated Feb. 4, 2013.
Advisory Action for U.S. Appl. No. 13/652,241 dated Sep. 8, 2016.
Advisory Action for U.S. Appl. No. 12/875,873 dated Aug. 19, 2014.
Advisory Action for U.S. Appl. No. 12/875,873 dated Dec. 13, 2013.
Advisory Action for U.S. Appl. No. 12/875,873 dated May 2, 2013.
Advisory Action for U.S. Appl. No. 12/875,873 dated May 7, 2015.
Advisory Action from U.S. Appl. No. 12/321,059 dated Apr. 20, 2012.
Appeal board's Questioning from Japanese Patent Application No. 2011/545616 dated Nov. 12, 2013.
Appeal Decision from Japanese Patent Application No. 2008/515699 dated Sep. 20, 2013.
Applicant Initiated Interview Summary for U.S. Appl. No. 12/069,827 dated Apr. 19, 2016.
Applicant Initiated Interview Summary for U.S. Appl. No. 12/875,873 dated May 23, 2016.
Applicant Initiated Interview Summary for U.S. Appl. No. 12/875,873 dated Sep. 28, 2015.
Applicant Initiated Interview Summary for U.S. Appl. No. 12/875,873 dated Sep. 23, 2015.
Applicant Initiated Interview Summary for U.S. Appl. No. 13/652,241 dated Feb. 17, 2016.
Applicant-nitiated Interview Summary for U.S. Appl. No. 12/002,410 dated Feb. 23, 2016.
Canadian Patent Application No. 2,454,310, Office Action dated Feb. 9, 2010.
Communication from European Patent Appl No. 09824413 .0/1551. dated Feb. 28. 2013.
Cree XLamp® MC-E LED data page retrieved at http://www.cree.com/products/xlamp_mce.asp on Sep. 15, 2010, pp. 1-3.
Cree XLamp® XP-E LED data page, retrieved at http://www.cree.com/products/xlamp_xpe.asp on Sep. 15, 2010, pp. 1-4.
Cree XLamp® XP-G LED data page retrieved at http://www.cree.com/products/xlamp_xpg.asp on Sep. 15, 2010, pp. 1-3.
Cree XLamp® XR-C LEDs data page, retrieved at <http://www.cree.com/products/xlamp_xrc.asp> on Sep. 15, 2010, pp. 1-3.
Cree XLamp® XR-E LEDs data page, retrieved at <http://www.cree.com/products/xlamp7090_xre.asp> on Sep. 15, 2010, pp. 1-3.
Decision of Re-Examination from Chinese Patent Application No. 201110039138.9 dated Mar. 13, 2014.
Decision of Registration from Japanese Design Application No. 2012/030304 dated Jan. 21, 2014.
Decision of Rejection from Chinese Patent Application No. 200880009255.7 dated Sep. 5, 2012.
Decision of Rejection from Chinese Patent Application No. 201001067346.2 dated Aug. 30, 2013.
Decision of Rejection from Chinese Patent Application No. 201080001658.4 dated Jun. 20, 2013.
Decision of Rejection from Chinese Patent Application No. 201110039138.9 dated Sep. 25, 2013.
Decision of Rejection from Japanese Patent Appl No. 2008-281533. dated May 28. 2013.
Decision of ReJection from Japanese Patent Application No. 2009 50719 5. dated May 21, 2013.
Decision of Rejection from Japanese Patent Application No. 2008-515699 dated Jul. 17, 2012.
Decision of Rejection from Japanese Patent Application No. 2011/259253 dated Mar. 25, 2014.
Decision of Rejection from Japanese Patent Application No. 2011-545616 dated Apr. 26. 2013.
Decision on Appeal from Japanese Patent Application No. 2011-545616 dated Jun. 27, 2014.
Decision on Rejection from Chinese Patent Application No. 2007101521097 dated Mar. 17, 2014.
European Search Report from European Patent Appl. No. 09824413.0/1551 dated Feb. 11, 2013.
Examination from European Patent Application No. 09 824 413-1551 dated May 16, 2014.
Examination Report from European Patent Application No. 07789665.2 dated Aug. 20, 2012.
Extended European Search Report for European Patent Application No. 08253519.6 dated Aug. 13, 2014.
Extended Search Report for European Patent Application No. 09824413.0-1551 dated Feb. 11, 2013.
Fifth Office Action from Chinese Patent Application No. 2007/10152109.7 dated Jan. 6, 2014.
Final Office Action for U.S. Appl. No. 11/149,998 dated Aug. 17, 2007.
Final Office Action for U.S. Appl. No. 11/149,998 dated Jul. 14, 2009.
Final Office Action for U.S. Appl. No. 11/149,998 dated Jul. 21, 2008.
Final Office Action for U.S. Appl. No. 11/149,998 dated Jul. 26, 2013.
Final Office Action for U.S. Appl. No. 11/149,998 dated Sep. 21, 2011.
Final Office Action for U.S. Appl. No. 11/465,120 dated Feb. 20, 2009.
Final Office Action for U.S. Appl. No. 11/465,120 dated Jun. 14, 2011.
Final Office Action for U.S. Appl. No. 11/496,922 dated Feb. 17, 2009.
Final Office Action for U.S. Appl. No. 11/496,922 dated Jan. 27, 2010.
Final Office Action for U.S. Appl. No. 11/600,617 dated Jul. 8, 2009.
Final Office Action for U.S. Appl. No. 11/982,275 dated Jan. 7, 2014.
Final Office Action for U.S. Appl. No. 11/982,275 dated Oct. 15, 2014.
Final Office Action for U.S. Appl. No. 12/002,410 dated Jun. 14, 2016.
Final Office Action for U.S. Appl. No. 12/002,410 dated Jun. 17, 2015.
Final Office Action for U.S. Appl. No. 12/002,410 dated Nov. 4, 2014.
Final Office Action for U.S. Appl. No. 12/069,827 dated Jul. 3, 2013.
Final Office Action for U.S. Appl. No. 12/069,827 dated Jun. 19, 2015.
Final Office Action for U.S. Appl. No. 12/069,827 dated Mar. 1, 2016.
Final Office Action for U.S. Appl. No. 12/069,827 dated Oct. 28, 2014.
Final Office Action for U.S. Appl. No. 12/291,293 dated Aug. 20, 2013.
Final Office Action for U.S. Appl. No. 12/291,293 dated Jul. 19, 2011.
Final Office Action for U.S. Appl. No. 12/291,293 dated Sep. 3, 2010.
Final Office Action for U.S. Appl. No. 12/321,059 dated Jun. 22, 2011.
Final Office Action for U.S. Appl. No. 12/321,059 dated Sep. 24, 2010.
Final Office Action for U.S. Appl. No. 12/635,818 dated Mar. 14, 2011.
Final Office Action for U.S. Appl. No. 12/695,978 dated Jul. 16, 2014.
Final Office Action for U.S. Appl. No. 12/695,978 dated Sep. 17, 2013.
Final Office Action for U.S. Appl. No. 12/757,179 dated Jul. 15, 2014.
Final Office Action for U.S. Appl. No. 12/875,873 dated Feb. 9, 2017.
Final Office Action for U.S. Appl. No. 12/875,873 dated Mar. 2, 2015.
Final Office Action for U.S. Appl. No. 13/652,241 dated Jul. 1, 2016.
Final Office Action for U.S. Appl. No. 13/652,241 dated Nov. 19, 2014.
Final Office Action for U.S. Appl. No. 13/652,241 dated Sep. 11, 2015.
Final Office Action for U.S. Appl. No. 12/875,873 dated Jan. 29, 2016.
Final Office Action for U.S. Appl. No. 13/652,241 dated Mar. 12, 2014.
Final Office Action from U.S. Appl. No. 12/757,179 dated Jun. 7, 2013.
First Office Action for Chinese Patent Application No. 201110039138.9 dated Jun. 4, 2012.
First Office Action from Chinese Patent Application No. 201080001658.4 dated Sep. 24, 2012.
First Office Action from Chinese Patent Application No. 201080027586.0 dated Feb. 8, 2014.
International Preliminary Report on Patentability from PCT/US2012/065060 dated Jun. 12, 2014.
International Search Report and Written Opinion from PCT application No. PCT/US2012/065060, dated Feb. 20, 2013.
International Search Report and Written Opinion from PCT/CN2010/001009 dated Oct. 21, 2010.
International Search Report and Written Opinion from PCT/US2013/073921 dated Feb. 18, 2014.
Interrogation from Japanese Patent Application No. 2007-211901 dated Aug. 21, 2012.
Interrogation from Japanese Patent Application No. 2008 515699. dated Feb. 19, 2013.
Interrogation from Japanese Patent Application No. 2008/281533 dated Jan. 21, 2014.
Interrogation from Japanese Patent Application No. 2009/507195 dated Jan. 28, 2014.
Nichia Corporation LEDs, Specification for NESM06CT, 15 pages.
Nichia Corporation LEDs, Specification for NSSM026BBT, 15 pages.
Nichia Corporation LEDs, Specification for NSSM227AT, 15 pages.
Non Final Office Action for U.S. Appl. No. 11/149,998 dated Feb. 5, 2008.
Non Final Office Action for U.S. Appl. No. 11/149,998 dated Jan. 5, 2009.
Non Final Office Action for U.S. Appl. No. 11/149,998 dated Jan. 8, 2007.
Non Final Office Action for U.S. Appl. No. 11/465,120 dated Aug. 21, 2008.
Non Final Office Action for U.S. Appl. No. 11/465,120 dated Jul. 21, 2009.
Non Final Office Action for U.S. Appl. No. 11/496,922 dated Jul. 5, 2011.
Non Final Office Action for U.S. Appl. No. 11/496,922 dated Jul. 2, 2009.
Non Final Office Action for U.S. Appl. No. 11/496,922 dated Jul. 21, 2008.
Non Final Office Action for U.S. Appl. No. 11/600,617 dated Dec. 19, 2008.
Non Final Office Action for U.S. Appl. No. 11/600,617 dated Jun. 11, 2008.
Non Final Office Action for U.S. Appl. No. 12/002,410 dated Feb. 23, 2015.
Non Final Office Action for U.S. Appl. No. 12/002,410 dated Nov. 30, 2015.
Non Final Office Action for U.S. Appl. No. 12/002,410 dated Nov. 5, 2009.
Non Final Office Action for U.S. Appl. No. 12/002,410 dated Sep. 25, 2012.
Non Final Office Action for U.S. Appl. No. 12/291,293 dated Dec. 31, 2013.
Non-Final Office Action and Examiner Initiated Interview Summary for U.S. Appl. No. 12/069,827 dated Jul. 14, 2016.
Non-Final Office Action for U.S. Appl. No. 11/982,275 dated Mar. 23, 2012.
Non-Final Office Action for U.S. Appl. No. 12/069,827 dated Aug. 9, 2012.
Non-Final Office Action for U.S. Appl. No. 12/069,827 dated Feb. 6, 2015.
Non-Final Office Action for U.S. Appl. No. 12/069,827 dated Jun. 16, 2011.
Non-Final Office Action for U.S. Appl. No. 12/069,827 dated Mar. 5, 2013.
Non-Final Office Action for U.S. Appl. No. 12/069,827 dated Nov. 12, 2015.
Non-Final Office Action for U.S. Appl. No. 12/069,827 dated Oct. 26, 2011.
Non-Final Office Action for U.S. Appl. No. 12/291,293 dated Mar. 1, 2011.
Non-Final Office Action for U.S. Appl. No. 12/321,059 dated Feb. 11, 2011.
Non-Final Office Action for U.S. Appl. No. 12/321,059 dated Oct. 4, 2011.
Non-Final Office Action for U.S. Appl. No. 12/614,989 dated Mar. 12, 2012.
Non-Final Office Action for U.S. Appl. No. 12/635,818 dated Jul. 15, 2011.
Non-Final Office Action for U.S. Appl. No. 12/635,818 dated Nov. 17, 2011.
Non-Final Office Action for U.S. Appl. No. 12/635,818 dated Oct. 14, 2010.
Non-Final Office Action for U.S. Appl. No. 12/695,978 dated Jan. 31, 2014.
Non-Final Office Action for U.S. Appl. No. 12/695,978 dated Sep. 14, 2011.
Non-Final Office Action for U.S. Appl. No. 12/757,179 dated Mar. 11, 2014.
Non-Final Office Action for U.S. Appl. No. 12/757,179 dated Oct. 3, 2013.
Non-Final Office Action for U.S. Appl. No. 12/875,873 dated Aug. 12, 2016.
Non-Final Office Action for U.S. Appl. No. 12/875,873 dated Jun. 29, 2015.
Non-Final Office Action for U.S. Appl. No. 12/875,873 dated Oct. 3, 2014.
Non-Final Office Action for U.S. Appl. No. 13/652,241 dated Mar. 10, 2016.
Non-Final Office Action for U.S. Appl. No. 13/652,241 dated Mar. 17, 2015.
Non-Final Office Action for U.S. Appl. No. 13/652,241 dated Sep. 29, 2016.
Non-Final Office Action for U.S. Appl. No. 13/652,241 dated Sep. 11, 2014.
Notice of Allowance and Examiner Initiated Interview Summary for U.S. Appl. No. 12/321,059 dated Oct. 10, 2012.
Notice of Allowance and Interview Summary for U.S. Appl. No. 12/757,179 dated Mar. 17, 2015.
Notice of Allowance for U.S. Appl. No. 11/149,998 dated Oct. 21, 2013.
Notice of Allowance for U.S. Appl. No. 11/465,120 dated Oct. 4, 2012.
Notice of Allowance for U.S. Appl. No. 11/496,922 dated Apr. 24, 2014.
Notice of Allowance for U.S. Appl. No. 11/496,922 dated Jan. 13, 2014.
Notice of Allowance for U.S. Appl. No. 11/600,617 dated Jun. 11, 2010.
Notice of Allowance for U.S. Appl. No. 11/982,275 dated Apr. 2, 2015.
Notice of Allowance for U.S. Appl. No. 11/982,275 dated Feb. 17, 2015.
Notice of Allowance for U.S. Appl. No. 11/982,275 dated May 11, 2015.
Notice of Allowance for U.S. Appl. No. 12/152,766 dated Aug. 31, 2011.
Notice of Allowance for U.S. Appl. No. 12/154,691 dated Jun. 17, 2010.
Notice of Allowance for U.S. Appl. No. 12/291,293 dated Jun. 24, 2014.
Notice of Allowance for U.S. Appl. No. 12/291,293 dated Mar. 27, 2014.
Notice of Allowance for U.S. Appl. No. 12/291,293 dated May 16, 2014.
Notice of Allowance for U.S. Appl. No. 12/291,293 dated May 29, 2014.
Notice of Allowance for U.S. Appl. No. 12/614,989 dated Dec. 20, 2012.
Notice of Allowance for U.S. Appl. No. 12/614,989 dated Sep. 17, 2012.
Notice of Allowance for U.S. Appl. No. 12/635,818 dated May 15, 2012.
Notice of Allowance for U.S. Appl. No. 12/635,818 dated Sep. 13, 2012.
Notice of Allowance for U.S. Appl. No. 12/695,978 dated Dec. 4, 2014.
Notice of Allowance for U.S. Appl. No. 12/695,978 dated Mar. 18, 2015.
Notice of Allowance for U.S. Appl. No. 12/757,179 dated Dec. 17, 2014.
Notice of Allowance for U.S. Appl. No. 12/757,179 dated Feb. 23, 2015.
Notice of Allowance for U.S. Appl. No. 12/868,567 dated Jan. 15, 2014.
Notice of Allowance for U.S. Appl. No. 12/757,891 dated Aug. 13, 2014.
Notice of Allowance for U.S. Appl. No. 12/757,891 dated Jul. 10, 2014.
Notice of Allowance for U.S. Appl. No. 12/757,891 dated May 29, 2014.
Notice of Allowance for U.S. Appl. No. 12/757,891 dated Sep. 10, 2014.
Notice of Allowance for U.S. Appl. No. 13/652,241 dated Feb. 21, 2017.
Notice of Allowance for U.S. Appl. No. 13/652,241 dated Jan. 27, 2017.
Notice of Allowance for U.S. Appl. No. 13/652,241 dated May 3, 2017.
Notice of Allowance for U.S. Appl. No. 29/293,900 dated Jul. 21, 2010.
Notice of Allowance for U.S. Appl. No. 29/293,900 dated Sep. 24, 2010.
Notice of Allowance for U.S. Appl. No. 13/306,589 dated Jun. 26, 2013.
Notice of Reasons for Rejection for Japanese Patent Application No. JP 2008-515699 dated May 19, 2011.
Notice of Reasons for Rejection from Japanese Patent A.pplication No. 2007-211901, dated Apr. 9, 2013.
Notice of Reasons for Rejection from Japanese Patent Appl No. 2011-534993, dated Mar. 12, 2013.
Notice of Reasons for Rejection from Japanese Patent Appl. No. 2011 259253, dated May 28, 2013.
Notice of Reasons for Rejection from Japanese Patent Application No. 2011/534993 dated Nov. 12, 2013.
Notice of Reasons for Rejection from Japanese Patent Application No. 2007/211901 dated Oct. 8, 2013.
Notification of Allowance from Taiwanese Application No. 103202911 dated Jul. 16, 2014.
Notification of Designation of the Appeal Examiner from Japanese Patent Application No. 2009/507195 dated Jan. 22, 2014.
Notification of Loss of Rights from European Patent Application No. 09824413.0 dated Oct. 17, 2013.
Notification of Reexamination from Chinese Patent Application No. 200880092557 dated May 12, 2014.
Notification of the Second Office Action from Chinese Patent Application No. 201010167346.2 dated Feb. 17, 2013.
Office Action and Interview Summary for U.S. Appl. No. 13/652,241 dated Sep. 11, 2013.
Office Action and Search Report from Chinese Patent Application No. 2011200391389 dated Jun. 23, 2014.
Office Action for U.S. Appl. No. 12/069,827, dated Apr. 20, 2010.
Office Action for U.S. Appl. No. 12/069,827, dated Jan. 27, 2011.
Office Action for U.S. Appl. No. 12/069,827, dated Oct. 29, 2010.
Office Action for U.S. Appl. No. 12/152,766, dated Apr. 1, 2011.
Office Action for U.S. Appl. No. 12/152,766, dated Mar. 12, 2010.
Office Action for U.S. Appl. No. 12/152,766, dated Oct. 7, 2010.
Office Action for U.S. Appl. No. 12/154,691, dated Dec. 17, 2009.
Office Action for U.S. Appl. No. 12/291, 293, dated Mar. 1, 2011.
Office Action for U.S. Appl. No. 12/291,293, dated May 27, 2010.
Office Action for U.S. Appl. No. 12/635,818, dated Oct. 14, 2010.
Office Action for U.S. Appl. No. 12/695,978, dated Dec. 20, 2010.
Office Action for U.S. Appl. No. 12/695,978, dated May 10, 2011.
Office Action for U.S. Appl. No. 12/291,293, dated Sep. 3, 2010.
Office Action from U.S. Appl. No. 11/465,120, dated Dec. 9, 2011.
Office Action from U.S. Appl. No. 11/496,922 dated Feb. 9, 2012.
Office Action from U.S. Appl. No. 11/982,275 dated Apr. 30, 2014.
Office Action from U.S. Appl. No. 12/002,410, dated Dec. 21, 2011.
Office Action from U.S. Appl. No. 12/002,410, dated Mar. 28, 2012.
Office Action from U.S. Appl. No. 12/321,059 dated Feb. 10, 2012.
Office Action from U.S. Appl. No. 12/614,989 dated Mar. 12, 2012.
Office Action from U.S. Appl. No. 12/695,978 dated Mar. 14, 2012.
Office Action from U.S. Appl. No. 12/757,179 dated Jan. 19, 2012.
Office Action from Japanese Patent Application No. 2008/81533 dated Jul. 22, 2014.
Office Action from Japanese Patent Application No. 2012/288000 dated Oct. 8, 2013.
Office Action from U.S. Appl. No. 12/002,410, dated Jan. 29, 2013.
Office Action from U.S. Appl. No. 12/868,567 dated Feb. 22, 2013.
Office Action from U.S. Appl. No. 12/069,827 dated Aug. 9, 2012.
Office Action from U.S. Appl. No. 11/149,998 dated Apr. 3, 2013.
Office Action from U.S. Appl. No. 11/465,120 dated Aug. 21, 2012.
Office Action from U.S. Appl. No. 11/465,120 dated Jun. 19, 2012.
Office Action from U.S. Appl. No. 11/496,922 dated Jun. 26, 2013.
Office Action from U.S. Appl. No. 11/496,922 dated Nov. 23, 2012.
Office Action from U.S. Appl. No. 11/496,922 dated Oct. 9, 2013.
Office Action from U.S. Appl. No. 11/982,275 dated Jul. 9, 2012.
Office Action from U.S. Appl. No. 11/982,275 dated May 9, 2013.
Office Action from U.S. Appl. No. 11/982,275 dated Nov. 28, 2012.
Office Action from U.S. Appl. No. 11/982,275 dated Sep. 18, 2012.
Office Action from U.S. Appl. No. 12/002,410 dated Feb. 4, 2014.
Office Action from U.S. Appl. No. 12/002,410 dated May 20, 2014.
Office Action from U.S. Appl. No. 12/002,410 dated Sep. 10, 2013.
Office Action from U.S. Appl. No. 12/002,410 filed Dec. 18, 2012.
Office Action from U.S. Appl. No. 12/002,410 dated Sep. 25, 2012.
Office Action from U.S. Appl. No. 12/069,827 dated Apr. 1, 2014.
Office Action from U.S. Appl. No. 12/069,827 dated Dec. 6, 2012.
Office Action from U.S. Appl. No. 12/069,827 dated Jul. 11, 2014.
Office Action from U.S. Appl. No. 12/069,827 dated Oct. 25, 2013.
Office Action from U.S. Appl. No. 12/069,827 dated Mar. 5, 2013.
Office Action from U.S. Appl. No. 12/291,293, dated Feb. 28, 2013.
Office Action from U.S. Appl. No. 12/695,978 dated Jan. 31, 2014.
Office Action from U.S. Appl. No. 12/695,978 dated Sep. 17, 2013.
Office Action from U.S. Appl. No. 12/695,978, dated Apr. 18, 2013.
Office Action from U.S. Appl. No. 12/757,179 dated Jul. 16, 2012.
Office Action from U.S. Appl. No. 12/757,179 filed Dec. 31, 2012.
Office Action from U.S. Appl. No. 12/757,179 filed Sep. 25, 2012.
Office Action from U.S. Appl. No. 12/757,891 dated Jan. 14, 2014.
Office Action from U.S. Appl. No. 12/757,891 dated May 9, 2012.
Office Action from U.S. Appl. No. 12/757,891 dated Nov. 28, 2012.
Office Action from U.S. Appl. No. 12/757,891 dated Jun. 18, 2013.
Office Action from U.S. Appl. No. 12/868,567 dated Jul. 5, 2013.
Office Action from U.S. Appl. No. 12/868,567 dated Sep. 12, 2012.
Office Action from U.S. Appl. No. 12/875,873 dated Aug. 22, 2012.
Office Action from U.S. Appl. No. 12/875,873 dated Feb. 25, 2014.
Office Action from U.S. Appl. No. 12/875,873 dated Feb. 21, 2013.
Office Action from U.S. Appl. No. 12/875,873 dated Jul. 3, 2013.
Office Action from U.S. Appl. No. 12/875,873 dated Jun. 25, 2014.
Office Action from U.S. Appl. No. 12/875,873 dated Oct. 18, 2013.
Office Action from U.S. Appl. No. 13/306,589 dated Feb. 20, 2013.
Office Action from Russian Patent Application No. 2011146934/28 dated Feb. 28, 2014.
Official Communication from the EPO regarding related European Application 08253301.9. dated Nov. 17, 2009.
Official Notice of Decision for Refusal regarding related Japanese Design Application No. 2009-002857, dated Oct. 30, 2009.
Partial European Search Report from European Patent Application No. 0825319.6-1564 dated Apr. 29, 2014.
Reason for Rejection from Japanese Patent Application No. 2009/507195 dated Jul. 15, 2014.
Restriction Requirement for U.S. Appl. No. 11/465,120 dated Jun. 2, 2008.
Restriction Requirement for U.S. Appl. No. 11/496,922 dated May 19, 2008.
Restriction Requirement for U.S. Appl. No. 11/600,617 dated Feb. 14, 2008.
Restriction Requirement for U.S. Appl. No. 11/982,275 dated Feb. 23, 2010.
Restriction Requirement for U.S. Appl. No. 12/002,410 dated May 27, 2009.
Restriction Requirement for U.S. Appl. No. 12/154,691 dated Sep. 29, 2009.
Restriction Requirement for U.S. Appl. No. 29/293,900 dated Apr. 5, 2010.
Restriction Requirement for U.S. Appl. No. 13/306,589 dated Jan. 9, 2013.
Restriction Requirement for U.S. Appl. No. 13/652,241 dated Aug. 2, 2013.
Sakai et al., “Experimental Investigation of Dependence of Electrical Characteristics on Device Parameters in Trench Mos Barrier Shottky Diodes,” Proceedings of 1998 International Symposium on Power Semiconductor Devices & ICs, Kyoto, pp. 293-296, Jun. 1998.
Search Report for European Patent Application No. 10731037.7 dated Dec. 11, 2013.
Search Report from Chinese Patent Application No. 201210046248.2 dated Apr. 15, 2014.
Second Office Action from Chinese Patent Appl. No. 201110039138.9. dated Jan. 31, 2013.
Second Office Action from Chinese Patent Application No. 201210046248.2 dated Apr. 15, 2014.
Supplemental European Search Report from European Patent Application No. 10731037.7 dated Jan. 9, 2014.
Second Office Action from People's Republic of China, re: China Application No. 200480027969.2, dated Jul. 4, 2008.
Third Office Action from Chinese Patent Application No. 200710152109.7, dated Mar. 5, 2013.
U.S. Appl. No. 11/685,761, filed Mar. 13, 2007.
Copending U.S. Appl. No. 11/443,741, filed Jun. 14, 2007.
(From related application) Canadian Patent Application No. 2,454,310, Office Action dated Feb. 9, 2010.
Appeal Decision in Japanese Design Patent Application No. 2009-002857 (Appeal No. 2010-002154) mailed Aug. 20, 2010.
Cree Xlamp MC-E Leds Product Info Sheets, pp. 1-3.
Declaration of Charles Swobada under 37 C.F.R.S 1.132, dated: Aug. 19, 2009.
Declaration of Gerald Negley under 37 C.F.R.S 1.132, dated: Aug. 20, 2009.
European Search Report from related European Application No. 07254498.4, dated Feb. 11, 2010.
European Search Report, dated Feb. 24, 2009, re related European Application No. EP 08253301.
Examiner's Report to the Board (Summary) from Japanese Patent Application No. 2003-529535, Appeal Filing No. 2009-007421 dated Dec. 7, 2010.
Final Office Action for U.S. Appl. No. 11/982,275 dated Jan. 13, 2011.
First Office Action for Chinese Patent Application No. 200780019643.9 dated Mar. 29, 2010.
International Preliminary Report on Patentability for Chinese PCT No. PCT/CN2010/070073 dated Apr. 28, 2011.
International Search Report and Written Opinion for PCT/CN2010/001865 dated Jun. 9, 2011.
International Search Report and Written Opinion from PCT/US2010/001852 dated Nov. 11, 2010.
International Search Report and Written Opinion in counterpart Application No. PCT/US2010/001255 dated Aug. 13, 2010.
International Search Report for PCT/CN2009/074800 dated Feb. 25, 2010.
International Search Report for PCT/US2008/004453 dated Sep. 9, 2008.
Invitation to Submit Applicant's Opinion (Summary) from Japanese Patent Application No. 2003-529535, Appeal Filing No. 2009-007421 dated Dec. 7, 2010.
JP 2001 060072A, Abstract, Matsushita Electric Ind. Co Ltd., Mar. 6, 2001.
Kim J.K et al. “Strongly Enhanced Phosphor Efficiency in GaInn White Light-Emitting Diodes Using Remote Phosphor Configuration and Diffuse Reflector Cup” Japanese Journal of Applied Physics, Japan Society of Applied Physics, Tokyo, JP, vol. 44, No. 20-23, Jan. 1, 2005 XP-001236966, pp. 649-651.
Nichia Corp. White Led Part No. NSPW300BS, Specification for Nichia White Led, Model NSPW300BS., Jan. 14, 2004.
Nichia Corp., White Led Part No. NSPW312BS, Specification for Nichia White Led, Model NSPW312BS. Jan. 14, 2004.
Nichia Corporation Leds, Models NSSM016G, NSSM16G, NESM026X, NSSM026BB, NESM005A, 9 pages.
Non-Final Office Action for U.S. Appl. No. 11/982,275 dated Aug. 20, 2010.
Notice of First Office Action from related China Patent Application No. 20071042217.6, dated Jun. 22, 2009.
Notice of Reasons for Rejection for Japanese Patent Application No. 2007-211901 dated Apr. 14, 2011.
Notice Requesting Submission of Opinion re related Korean Application No. 10-2004-7001033 dated Mar. 9, 2009.
Notification of First Office Action in Chinese Patent Application No. 200880009255.7 dated Sep. 26, 2010.
Notification of First Office Action in Chinese Patent Application No. 200880100370.5 dated Apr. 26, 2011.
Office Action from U.S. Appl. No. 11/149,998, dated May 18, 2010.
Office Action from U.S. Appl. No. 11/149,998, dated Nov. 20, 2009.
Office Action from U.S. Appl. No. 11/465,120, dated Mar. 9, 2010.
Office Action from U.S. Appl. No. 12/069,827, dated Apr. 20, 2010.
Office Action from U.S. Appl. No. 12/152,766, dated Mar. 12, 2010.
Office Action from U.S. Appl. No. 12/154,691, dated Dec. 17, 2009.
Office Action from U.S. Appl. No. 12/321,059, dated May 17, 2010.
Office Action from related U.S. Appl. No. 11/600,617, dated Dec. 22, 2009.
Office Action from related China Application No. 200710142310.7, dated Dec. 11, 2009.
Office Action in related U.S. Appl. No. 11/149,998, dated Jan. 24, 2011.
Office Action in related U.S. Appl. No. 11/149,998, dated Aug. 27, 2010.
Office Action in related U.S. Appl. No. 11/149,998, dated Nov. 20, 2009.
Office Action in related U.S. Appl. No. 11/149,998, dated May 11, 2011.
Office Action in related U.S. Appl. No. 11/149,998, dated May 18, 2010.
Office Action in related U.S. Appl. No. 11/465,120, dated Dec. 13, 2010.
Office Action in related U.S. Appl. No. 11/465,120, dated Mar. 9, 2010.
Office Action in related U.S. Appl. No. 11/465,120, dated Sep. 8, 2010.
Office Action in related U.S. Appl. No. 11/496,922, dated Dec. 15, 2010.
Office Action in related U.S. Appl. No. 11/496,922, dated Jun. 10, 2010.
Office Action in related U.S. Appl. No. 12/002,410, dated Dec. 13, 2010.
Office Action in related U.S. Appl. No. 12/002,410, dated Apr. 26, 2011.
Office Action in related U.S. Appl. No. 12/002,410, dated May 25, 2010.
Office Action in related U.S. Appl. No. 12/069,827, dated Jan. 27, 2011.
Office Action in related U.S. Appl. No. 12/069,827, dated Oct. 29, 2010.
Office Action in related U.S. Appl. No. 12/069,827, dated Apr. 20, 2010.
Office Action in related U.S. Appl. No. 12/152,766, dated Oct. 7, 2010.
Office Action in related U.S. Appl. No. 12/152,766, dated Mar. 12, 2010.
Office Action in related U.S. Appl. No. 12/152,766, dated Apr. 1, 2011.
Office Action in related U.S. Appl. No. 12/154,691, dated Dec. 17, 2009.
Office Action in related U.S. Appl. No. 12/291,293, dated Mar. 1, 2011.
Office Action in related U.S. Appl. No. 12/291,293, dated Sep. 3, 2010.
Office Action in related U.S. Appl. No. 12/291,293, dated May 27, 2010.
Office Action in related U.S. Appl. No. 12/321,059, dated May 17, 2010.
Office Action in related U.S. Appl. No. 12/635,818, dated Oct. 14, 2010.
Office Action in related U.S. Appl. No. 12/695,978, dated Dec. 20, 2010.
Office Action in related U.S. Appl. No. 12/695,978, dated May 10, 2011.
Official Communication from the EPO regarding related European Application 08253301.9.
U.S. Appl. No. 11/473,089, filed Jun. 21, 2006, “Close Loop Electrophoretic Deposition of Semiconductor Devices”.
U.S. Appl. No. 11/656,759, filed Nov. 22, 2007 and U.S. Appl. No. 11/899,790, filed Sep. 7, 2007, “Wafer Level Phosphor Coating Method and Devices Fabricated Utilizing Method”.
PCT Search Report and Written Opinion PCT/US2007/086237, dated May 8, 2008 in related application.
PCT Search Report and Written Opinion PCT/US2007/086242, dated Mar. 4, 2008.
PCT Search Report and Written Opinion PCT/US2007/12403, dated Aug. 6, 2008.
Preliminary Notice of Reasons for Refusal re related Japanese Application No. 2009-002857, dated Apr. 24, 2009, pp. 1-2.
Preliminary Notice of Reasons for Refusal re related Japanese Application No. 2009-002857, dated Jul. 24, 2009.
Response to OA in related U.S. Appl. No. 12/154,691, dated Dec. 17, 2009, Response filed: May 17, 2010.
Response to Office Action from U.S. Appl. No. 11/149,998, dated Feb. 22, 2010.
Response to Office Action from U.S. Appl. No. 12/154,691, dated May 17, 2010.
Sakai et al., “Experimental Investigtion of Dependence of Electrical Characteristics on Device Parameters in Trench Mos Barrier Shottky Diodes,” Proceedings of 1998 International Symposium on Power Semiconductor Devices & ICs, Kyoto, pp. 293-296, Jun. 1998.
Second Office Action from related Chinese Application No. 200710142217.6 dated Nov. 6, 2009.
The Second Office Action from People's Republic of China, re: China Application No. 200480027969.2, dated Jul. 4, 2008.
Copending U.S. Appl. No. 11/443,741, filed Mar. 13, 2007.
Copending U.S. Appl. No. 11/939,059, filed Nov. 13, 2007.
U.S. Appl. No. 11/982,275, filed Oct. 31, 2007 to Keller.
U.S. Appl. No. 12/024,400, filed Feb. 1, 2008 to Chakraborty.
Written Opinion for PCT/US2008/004453 dated Sep. 9, 2008.
Zhang AP et al, “Comparison of Gan P-I-N and Schottky Rectifier Performance” IEEE Transactions on Electron Devices, IEEE Inc. New York, US, vol. 48, No. 3, pp. 407-411, Mar. 2001.
Restriction Requirement for U.S. Appl. No. 29/250,973 dated May 14, 2008.
Extended European Search Report for European Patent Application No. 08253519.6 dated Aug. 13, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/875,873 dated Jun. 25, 2014. (from parent U.S. Appl. No. 11/982,275).
Response to Office Action from U.S. Appl. No. 12/875,873 filed Aug. 12, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/069,827 dated Jul. 11, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/695,978 dated Jul. 16, 2014. (from parent U.S. Appl. No. 11/982,275).
Response to Office Action from U.S. Appl. No. 12/695,978 filed Aug. 11, 2014. (from parent U.S. Appl. No. 11/982,275).
Decision on Appeal from Japanese Patent Application No. 2011-545616 dated Jun. 27, 2014.(from parent U.S. Appl. No. 11/982,275).
Reason for Rejection from Japanese Patent Application No. 2009/507195 dated Jul. 15, 2014.(from parent U.S. Appl. No. 11/982,275).
Notification of Allowance from Taiwanese Application No. 103202911 dated Jul. 16, 2014.(from parent U.S. Appl. No. 11/982,275).
Office Action and Search Report from Chinese Patent Application No. 2011200391389 dated Jun. 23, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from Japanese Patent Application No. 2008/81533 dated Jul. 22, 2014. (from parent U.S. Appl. No. 11/982,275).
Search Report from Chinese Patent Application No. 201210046248.2 dated Apr. 15, 2014. (from parent U.S. Appl. No. 11/982,275).
International Preliminary Report on Patentability from PCT/US2012/065060 dated Jun. 12, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/002,410 dated May 20, 2014. (from parent U.S. Appl. No. 11/982,275).
Notification of Reexamination from Chinese Patent Application No. 200880092557 dated May 12, 2014. (from parent U.S. Appl. No. 11/982,275).
Examination from European Patent Application No. 09 824 413-1551 dated May 16, 2014. (from parent U.S. Appl. No. 11/982,275).
Decision on Rejection from Chinese Patent Application No. 2007101521097 dated Mar. 17, 2014. (from parent U.S. Appl. No. 11/982,275).
Decision of Rejection from Japanese Patent Application No. 2011/259253 dated Mar. 25, 2014. (from parent U.S. Appl. No. 11/982,275).
Partial European Search Report from European Patent Application No. 0825319.6-1564 dated Apr. 29, 2014.(from parent U.S. Appl. No. 11/982,275).
Office Action from Russian Patent Application No. 2011146934/28 dated Feb. 28, 2014.(from parent U.S. Appl. No. 11/982,275).
Second Office Action from Chinese Patent Application No. 201210046248.2 dated Apr. 15, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/875,873 dated Feb. 25, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 13/652,241 dated Mar. 12, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/069,827 (from parent U.S. Appl. No. 11/982,275).
Decision of Re-Examination from Chinese Patent Application No. 201110039138.9 dated Mar. 13, 2014. (from parent U.S. Appl. No. 11/982,275).
First Office Action from Chinese Patent Application No. 201080027586.0 dated Feb. 8, 2014. (from parent U.S. Appl. No. 11/982,275).
Interrogation from Japanese Patent Application No. 2008/281533 dated Jan. 21, 2014. (from parent U.S. Appl. No. 11/982,275).
Interrogation from Japanese Patent Application No. 2009/507195 dated Jan. 28, 2014. (from parent U.S. Appl. No. 11/982,275).
Notification of Designation of the Appeal Examiner from Japanese Patent Application No. 2009/507195 dated Jan. 22, 2014. (from parent U.S. Appl. No. 11/982,275).
International Search Report and Written Opinion from PCT/US2013/073921 dated Feb. 18, 2014. (from parent U.S. Appl. No. 11/982,275).
Decision of Registration from Japanese Design Application No. 2012/030304 dated Jan. 21, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/757,891 dated Jan. 14, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/695,978 dated Jan. 31, 2014. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/002,410 dated Feb. 4, 2014. (from parent U.S. Appl. No. 11/982,275).
Fifth Office Action from Chinese Patent Application No. 2007/10152109.7 dated Jan. 6, 2014. (from parent U.S. Appl. No. 11/982,275).
Supplemental European Search Report from European Patent Application No. 10731037.7 dated Jan. 9, 2014. (from parent U.S. Appl. No. 11/982,275).
Search Report for European Patent Application No. 10731037.7 dated Dec. 11, 2013. (from parent U.S. Appl. No. 11/982,275).
Notice of Reasons for Rejection from Japanese Patent Application No. 2011/534993 dated Nov. 12, 2013. (from parent U.S. Appl. No. 11/982,275).
Notice of Reasons for Rejection from Japanese Patent Application No. 2007/211901 dated Oct. 8, 2013. (from parent U.S. Appl. No. 11/982,275).
Notification of Loss of Rights from European Patent Application No. 09824413.0 dated Oct. 17, 2013. (from parent U.S. Appl. No. 11/982,275).
Appeal board's Questioning from Japanese Patent Application No. 2011/545616 dated Nov. 12, 2013. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/069,827 dated Oct. 25, 2013. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 11/496,922 dated Oct. 9, 2013. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/875,873 dated Oct. 18, 2013. (from parent U.S. Appl. No. 11/982,275).
Office Action from Japanese Patent Application No. 2012/288000 dated Oct. 8, 2013. (from parent U.S. Appl. No. 11/982,275).
Decision of Rejection from Chinese Patent Application No. 201110039138.9 dated Sep. 25, 2013. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/695,978 dated Sep. 17, 2013. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 13/652,241 dated Sep. 11, 2013. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/002,410 dated Sep. 10, 2013. (from parent U.S. Appl. No. 11/982,275).
Appeal Decision from Japanese Patent Application No. 2008/515699 dated Sep. 20, 2013. (from parent U.S. Appl. No. 11/982,275).
Decision of Rejection from Chinese Patent Application No. 201001067346.2 dated Aug. 30, 2013. (from parent U.S. Appl. No. 11/982,275).
Decision of Rejection from Chinese Patent Application No. 201080001658.4 dated Jun. 20, 2013. (from parent U.S. Appl. No. 11/982,275).
Non-Final Office Action for U.S. Appl. No. 11/982,275 dated Aug. 8, 2013.
Office Action from U.S. Appl. No. 12/868,567 dated Jul. 5, 2013. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/875,873 dated Jul. 3, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 11/496,922 dated Jun. 26, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/757,891 dated Jun. 18, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/069,827 dated Mar. 5, 2013. (from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/069,627 filed Jun. 5, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 11/149,998 dated Apr. 3, 2013.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 11/149,998 filed Jun. 25, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Act ion from U.S. Appl. No. 12/868,567 dated Sep. 12, 2012.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/666,567 dated Jan. 14, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from Patent Application No. 12/002,410 dated Sep. 25, 2012.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/002,410 dated Dec. 18, 2012. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/069,827 dated Aug. 9, 2012.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/069,827 dated Nov. 9, 2012. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 11/465,120 dated Aug. 21, 2012.(from parent U.S. Appl. No. 11/982,275).
Response to DA from U.S. Appl. No. 11/465,120 dated Aug. 24, 2012.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/875,873 dated Aug. 22, 2012. (from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/875,873 dated Nov. 19, 2012.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 11/465,120 dated Jun. 19, 2012.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 11/465,120, dated Aug. 15, 2012.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/757,179 filed Sep. 25, 2012.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/757,179 filed Sep. 25, 2012.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/069,827 dated Dec. 6, 2012. (from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/069,827. filed Jan. 29, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 11/496,922 dated Nov. 23, 2012.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 11/496,922, filed Apr. 23, 2012.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/757,891 dated Nov. 28, 2012.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/757,891 filed Jan. 28, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 13/306,589, dated Feb. 20, 2013.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 13/306,589, filed May 16, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/002,410, dated Jan. 29, 2013.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/002,410. filed Apr. 18, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/868,567 dated Feb. 22, 2013.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/868,567, filed May 21, 2013,(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/875,873, dated Feb. 21, 2013.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/875,873 filed Apr. 19, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Act ion from U.S. Appl. No. 12/291,293, dated Feb. 28, 2013.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/291,293 filed Jun. 5, 2013.(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/695,978, dated Apr. 18, 2013.(from parent U.S. Appl. No. 11/982,275).
Response to OA from U.S. Appl. No. 12/695,978. filed Jul. 10, 2013. (from parent U.S. Appl. No. 11/982,275).
Notice of Reasons for Rejection from Japanese Patent Appl. No. 2011 259253, dated May 28, 2013. (from parent U.S. Appl. No. 11/982,275).
Decision of ReJection from Japanese Patent Appl. No. 2008-281533, dated May 28, 2013.(from parent U.S. Appl. No. 11/982,275).
Decision of ReJection from Japanese Patent Application No. 2009 50719 5, dated May 21, 2013.(from parent U.S. Appl. No. 11/982,275).
Notice of Reasons for Rejection from Japanese Patent A.pplication No. 2007-211901, dated Apr. 9, 2013.(from parent U.S. Appl. No. 11/982,275).
Decision of Rejection from Japanese Patent Application No. 2011-545616 dated Apr. 26, 2013.(from parent U.S. Appl. No. 11/982,275).
Third Office Action from Chinese Patent Application No. 200710152109.7, dated: Mar. 5, 2013(from parent U.S. Appl. No. 11/982,275).
Interrogation from Japanese Patent Application No. 2008 515699, dated Feb. 19, 2013(from parent U.S. Appl. No. 11/982,275).
Communication from European Patent Appl No. 09824413 .0-1551, dated Feb. 28, 2013(from parent U.S. Appl. No. 11/982,275).
European Search Report from European Patent Appl. No. 09824413.0-1551, dated Feb. 11, 2013(from parent U.S. Appl. No. 11/982,275).
Notice of Reasons for Rejection from Japanese Patent Appl No. 2011-534993, dated Mar. 12, 2013(from parent U.S. Appl. No. 11/982,275).
Notification of the Second Office Action from Chinese Patent Application No. 201010167346.2 dated Feb. 17, 2013(from parent U.S. Appl. No. 11/982,275).
First Office Action from Chinese Patent Application No. 201080001658.4 dated Sep. 24, 2012. (from parent U.S. Appl. No. 11/982,275).
Extended Search Report for European Patent Application No. 09824413.0-1551, dated Feb. 11, 2013(from parent U.S. Appl. No. 11/982,275).
Second Office Action from Chinese Patent Appl. No. 201110039138.9, dated Jan. 31, 2013(from parent U.S. Appl. No. 11/982,275).
International Search Report and Written Opinion from PCT application No. PCT/US2012/065060, dated Feb. 20, 2013.(from parent U.S. Appl. No. 11/982,275).
Nichia Corporation LEDs, Specification for NSSM227AT, 15 pages (from parent U.S. Appl. No. 12/757,891).
Nichia Corporation LEDs, Specification for NESM06CT, 15 pages (from parent U.S. Appl. No. 12/757,891).
Nichia Corporation LEDs, Specification for NSSM026BBT, 15 pages (from parent U.S. Appl. No. 12/757,891).
U.S. Appl. No. 11/685,761, filed Mar. 13, 2007. (from parent U.S. Appl. No. 12/757,891).
U.S. Appl. No. 11/939,047, filed Nov. 13, 2007.(from parent U.S. Appl. No. 12/757,891).
Interrogation from Japanese Patent Application No. 2007-211901 dated Aug. 21, 2012. (from parent U.S. Appl. No. 11/982,275).
Examination Report from European Patent Application No. 07789665.2 dated Aug. 20, 2012. (from parent U.S. Appl. No. 11/982,275).
Decision of Rejection from Chinese Patent Application No. 200880009255.7dated Sep. 5, 2012.(from parent U.S. Appl. No. 11/982,275).
First Office Action for Chinese Patent Application No. 201110039138.9 dated Jun. 4, 2012. (from parent U.S. Appl. No. 11/982,275).
Decision of Rejection from Japanese Patent Application No. 2008-515699 dated Jul. 17, 2012. (from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/757,891 dated May 9, 2012.(from parent U.S. Appl. No. 11/982,275).
Ofilce Actton from U.S. Appl. No. 11/465,120, dated Dec. 9, 2011..(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/002,410, dated Mar. 28, 2012..(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/002,410, dated Dec. 21, 2011..(from parent U.S. Appl. No. 11/982,275).
Response to Office Action tor U.S. Appl. No. 12/002,410, filed Mar. 8, 2012..(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/757,179 dated Jan. 19, 2012..(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 11/496,922 dated Feb. 9, 2012..(from parent U.S. Appl. No. 11/982,275).
Response to Office Action for U.S. Appl. No. 11/496,922 filed Apr. 6, 2012..(from parent U.S. Appl. No. 11/982,275).
Advisory Action for U.S. Appl. No. 11/496,922 dated Apr. 18, 2012..(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/321,059 dated Feb. 10, 2012..(from parent U.S. Appl. No. 11/982,275).
Response to Office Action for U.S. Appl. No. 12/321,059 filed Apr. 9, 2012..(from parent U.S. Appl. No. 11/982,275).
Advisory Action from U.S. Appl. No. 12/321,059 dated Apr. 20, 2012..(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/695,978 dated Mar. 14, 2012..(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/614,989 dated Mar. 12, 2012..(from parent U.S. Appl. No. 11/982,275).
Office Action from U.S. Appl. No. 12/069,827 dated Apr. 3, 2012..(from parent U.S. Appl. No. 11/982,275).
Related Publications (1)
Number Date Country
20120187862 A1 Jul 2012 US
Continuation in Parts (2)
Number Date Country
Parent 11982275 Oct 2007 US
Child 13187232 US
Parent 12757891 Apr 2010 US
Child 11982275 US