The present invention relates generally to solder balls on substrates and more particularly to an improved system and method for attaching solder balls to substrates utilizing solder paste with distributed solder particles.
Packaged microelectronic memory devices, for example, are used in laptop computers, PDAs, scanners, cell phones, and the like. One approach used today is flip chip interconnect technology for electrically connecting the silicon die directly to the package carrier. The package carrier, either a substrate or leadframe, provides the connection from the silicon die to the exterior of the package. In standard packaging, the interconnection between the silicon die and the carrier is typically made using wire. The silicon die is attached to the carrier face up with a wire bonded first to the silicon die, and then bonded to the carrier. In contrast, the interconnection between the silicon die and carrier in flip chip packaging is made through first level solder joints utilizing conductive “bumps” to connect the silicon die and the substrate. Solder balls are typically employed to create a second level solder joint between the substrate BGA (ball grid array) and the printed circuit board, for example. The silicon die is then “flipped over” and placed face down, with the reflowed solder bumps connecting to the carrier directly. The solder bumps are typically configured in an array or pattern so that the individual solder bumps make contact with a corresponding bump pad, for example. Flip chip devices with solder bump connections generally have lower profiles, higher “pin” counts, higher signal density, reduced signal inductance, reduced power/ground inductance, for example than conventional chip packages utilizing lead frame technology.
Flip chip devices are typically mounted to circuit boards using surface mount techniques. Typically solder paste it is deposited on the circuit board contacts, for example and solder balls are pressed into the solder paste adhering to the contacts. With the flip chip device and the circuit board pressed together, the solder balls are surrounded by solder paste and either are moved proximate or are moved adjacent to the circuit board contacts. The chip device/circuit board assembly is then heated in a reflow oven, for example, so that the solder reflows and electromechanically connects the reflowed solder to the contacts.
A typical concern with surface mounting flip chip packages to circuit boards is that electrical shorts can occur if the solder from adjacent contacts reflow together. This shorting problem arises and is difficult to detect during the manufacturing process. In addition, conductive solder paste on a circuit board can create a short that renders the assembled flip chip device and/or circuit board inoperable. There is a greater likelihood of shorts occurring in these high density devices with high density grid patterns, because the spacing between adjacent contacts is very tight.
The electrical short is most easily detected after the assembly has been manufactured, and the problem often arises after the manufacturer has sold the electronic device. There are numerous problems associated with detecting shorting issues after sale of the device. For example, these devices often go into much larger electronic packages or devices, and therefore when a component fails the entire product has to be returned. Even greater problems can result in lost future revenues with customers and the perception of poor quality control by the consumer.
In addition, in some instances solder balls instead of shorting can be missing all together. The paste at times is not strong enough to hold the solder balls in position. The use of solder flux alone to hold the solder balls is not effective in preventing the balls from shifting on the substrate, especially when the substrate is warped.
Currently, standards are being developed and established for bump sizes, pitches, bump array layout, and general trends in the industry. These trends are driving smaller bump geometries with tighter bump pitches. Current bump pitches for most flip chip devices and CSPs (chip scale packaging), for example are further being decreased as well as bump pitches. This trend of reduced bump size and bump pitch poses new challenges for testing and burn-in of flip chip, CSP and other chip scale ball grid array packages (CSBGA).
In addition the substrate warpage is very difficult to control or eliminate during substrate and package assembly processes, due to critical thermal excursions, mechanical stress loadings, and stress dissipation capabilities of the package materials, and significant CTE mismatches across different materials comprising the flip chip package. Therefore a method is needed to properly allow for CTE mismatches and solder ball alignment during flip chip package assembly processing.
Therefore in flip chip technology and other applications utilizing solder balls there remains a need for properly aligning, retaining the solder ball when utilizing reflow technologies to ensure high quality, high yields and the like.
The present invention is directed to an apparatus and method for attaching solder balls to a substrate or a similar device. The invention provides the utilization of solder paste with embedded solder particles in order to hold the solder ball on the SOP (solder over pad) pad, instead of solder flux alone.
According to one aspect of the invention, one method of applying the solder paste with distributed solder particles to the solder ball and the substrate solder pad comprises applying a solder paste with solder particles to the SOP pads utilizing a screening process. According to yet another aspect of the invention, another method of applying the solder paste to the solder balls is by dipping the solder balls into a layer of solder paste with distributed solder particles. The solder paste and solder particles are approximately uniformly dispersed throughout the paste. Another aspect of the invention is that the solder paste with distributed solder particles stabilize the solder balls so that when the substrate with solder balls is moved, prior to reflow, the ball do not move significantly or fall off the substrate, thus increasing yields over current technology.
According to yet another aspect of the invention, by attaching the solder balls to the SOP pads, with intervening solder paste with solder particles, when the solder balls reflow they do not short together, again increasing yields above current levels. This is because the solder balls are kept at a proper distance from each other which prevents the solder from one ball coming into contact with the solder from another ball.
According to yet another aspect of the present invention, another method of applying solder paste with solder particles by dipping allows up to 100% ball attach yields for solder ball systems even when there is significant BGA SOP pad metallization height differences across the substrate BGA footprint, and the substrate/package warping can not be reduced or eliminated. Substrate/package warpage is very commonly seen on large body size organic substrates before, during, and after package assembly.
To the accomplishment of the foregoing and related ends, the invention comprises the features hereinafter fully described and particularly pointed out in the claims. The following description and the annexed drawings set forth in detail certain illustrative aspects of the invention. These aspects are indicative, however, of but a few of the various ways in which the principles of the invention may be employed. Other objects, advantages and novel features of the invention will become apparent from the following detailed description of the invention when considered in conjunction with the drawings.
The present invention will now be described with reference to the drawings wherein like reference numerals are used to refer to like elements throughout. The present invention provides a method for attaching solder balls to a substrate. However, it will be appreciated that the invention may be advantageously employed in applications other than those illustrated and described herein. The drawings/figures are illustrations that are not drawn to scale.
Referring now to the drawings,
Referring now to
Referring now to
An exemplary method 1200 is hereinafter illustrated and described with respect to
At 1220, solder balls are picked from a solder ball bin utilizing a vacuum tool, for example. It should be apparent to one of ordinary skill in the art that the solder balls could be moved utilizing pinchers, pick and place devices, magnetic pickups, and the like. The solder balls are dipped into the solder paste and removed, at 1230. The viscosity of the solder paste allows the paste to adhere to the bottom of the solder ball. At 1240, the solder balls are placed proximate to the center of the solder pad and released so that the solder ball is in contact with the solder pad. The substrate, the solder balls and the solder paste with solder particles is run through a reflow oven in order to fix the solder balls to the substrate, at 1250, wherein the dipping process ends.
Yet another exemplary method 1300 is illustrated and described with respect to
Beginning with a substrate and a mask at 1310, the mask is placed over the substrate so that the openings of the mask expose various solder pads. At 1320, a uniform layer of solder paste with distributed solder particles is spread in a uniform fashion over the top of the mask employing a squeegee, for example. Once the solder paste is properly distributed on the solder pads, the mask is removed. However, it should be apparent to one of ordinary skill in the art that the solder paste can be distributed using spraying techniques, brushing techniques, roller techniques, and the like.
At 1330, solder balls are picked from a solder ball bin utilizing a vacuum tool, for example. It should be apparent to one of ordinary skill in the art that the solder balls could be moved employing pick and place devices, magnetic pickups, robotics, and the like. At 1340, the solder balls are placed near the center of the solder pad and released so that the solder ball is in contact with the solder pad that is at least partially coated with the solder paste. The substrate with attached solder balls, resting on the solder paste with solder particles is processed through a reflow oven to fix the solder balls to the substrate, at 1350, wherein the screening and/or masking process ends.
Although the invention has been shown and described with respect to a certain applications and implementations, it will be appreciated that equivalent alterations and modifications will occur to others skilled in the art upon the reading and understanding of this specification and the annexed drawings. In particular regard to the various functions performed by the above described components (assemblies, devices, circuits, systems, etc.), the terms (including a reference to a “means”) used to describe such components are intended to correspond, unless otherwise indicated, to any component which performs the specified function of the described component (i.e., that is functionally equivalent), even though not structurally equivalent to the disclosed structure, which performs the function in the herein illustrated exemplary implementations of the invention.
In addition, while a particular feature of the invention may have been disclosed with respect to only one of several implementations, such feature may be combined with one or more other features of the other implementations as may be desired and advantageous for any given or particular application. Furthermore, to the extent that the terms “includes”, “including”, “has”, “having”, and variants thereof are used in either the detailed description or the claims, these terms are intended to be inclusive in a manner similar to the term “comprising”.
This application claims priority to U.S. Provisional Application Ser. No. 60/732,503, filed Nov. 1, 2005, entitled “METHOD AND APPARATUS FOR ATTACHING SOLDER BALLS TO SUBSTRATE”.
Number | Date | Country | |
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60732503 | Nov 2005 | US |