BRIEF DESCRIPTION OF THE DRAWINGS
Preferred embodiments of the present invention will be described in detail with reference to the following drawings, wherein:
FIG. 1A and FIG. 1B illustrate a cross sectional view of a semiconductor device in accordance with a conventional embodiment;
FIG. 2A and FIG. 2B illustrate a problem of the conventional embodiment;
FIG. 3A through FIG. 3E illustrate a cross sectional view showing a fabrication process of a semiconductor device in accordance with a first embodiment;
FIG. 4A through FIG. 4D illustrate a cross sectional view showing a fabrication process of a semiconductor device in accordance with the first embodiment;
FIG. 5 illustrates a cross sectional view of the semiconductor device in accordance with the first embodiment;
FIG. 6 illustrates a cross sectional view of a semiconductor device in accordance with another example of the first embodiment;
FIG. 7 illustrates a cross sectional view of an electronic device in accordance with a second embodiment; and
FIG. 8 illustrates a die shear intensity of the electronic device in accordance with the second embodiment.