The present technology generally relates to semiconductor packages, and more particularly relates to stacked die packages incorporating a flip-chip die and a wire bonding die.
The requirements for custom electronics products have increased significantly in recent years. Miniaturization and portability are overwhelming trends which push the integrated circuit (“IC”) package to be more compact. Accordingly, portable electronic devices become smaller each day along with more functions. Thus, today's power supply systems are required to have smaller sizes along with higher power output, more functions and better efficiencies. Under these requirements, multi-chip packages are presently adopted in power supply applications. Typically, a multi-chip package includes a discrete power die and a controller die in a single package to achieve better control and smaller size. Stacked die packages are one type of multi-chip packages which stack multiple dies vertically in the same package to offer multiple functionality, smaller footprints and lower profiles along with lower cost.
As shown in
The present technology is directed to stacked die packages incorporating flip-chip dies and wire bonding dies. The term “flip-chip die” generally refers to a semiconductor chip having contacts directly connected to a leadframe and/or other suitable package substrates by solder bumps, gold bump, and/or other suitable contact bumps. The term “wire bonding die” generally refers to a semiconductor chip having a contact connected to a leadframe and/or other suitable package substrates by a wirebond. The term “contact bump” generally refers to a conductive material in a ball or a pillar shape used to directly connect two contact areas.
In one embodiment, the present technology is directed to a stacked die package that includes a leadframe, a first die, and a second die. The leadframe has a plurality of leads. The first die has a plurality of contact bumps at a first surface and a second surface opposite of the first surface. The first die is electrically coupled to a bottom surface of the leadframe through contact bumps. The second die has a first surface and a second surface opposite of the first surface, and the second die is electrically coupled to a top surface of the leadframe through a plurality of wirebonds. The second surface of the second die is attached to the first surface of the first die.
One skilled in the art will understand that several of the details set forth below are provided to describe the following embodiments in a manner sufficient to enable a person skilled in the relevant art to make and use the disclosed embodiments. Several of the details described below, however, may not be necessary to practice certain embodiments of the technology. Additionally, the technology can include other embodiments that are within the scope of the claims but are not described in detail with respect to
The leadframe 20 comprises a plurality of leads. The first die 21 has a top or first surface 21T proximate to which circuit/circuits and electrical contact pads are formed, and a bottom or second surface 21B opposite the first surface 21T. And the second die 22 has a top or first surface 22T proximate to which circuit/circuits and electrical contact pads are formed, and a bottom or second surface 22B opposite the first surface 22T.
The first die 21 is electrically coupled to the leads at the bottom surface 20B of the leadframe 20 through contact bumps 211 and the second die 22 is electrically coupled to the leads at the top surface 20T of the leadframe 20 through the wirebonds 221. The stacked die package 200 further comprises a molding material 23, encapsulating and protecting the first die 21, the second die 22, contact bumps 211, wirebonds 221 and at least a portion of the leadframe 20. Another portion of the leadframe 20 is exposed outside the molding material 23 to form external pins for communication with external circuitry (not shown). The molding material 23 can include an electrical insulation material such as epoxy and/or other suitable encapsulant.
Continuing with
Contact bumps 211 are positioned on the contact pads of the flip-chip die 21 to function as the input/output nodes of the first die 21 and also are used to connect the first die 21 to the leads of the leadframe 20. Accordingly, die attach paddles are not necessary. Electrical pads 220 are placed on the top surface 22T of the wire bonding die 22 to function as the input/output nodes of the wire bonding die 22. Wirebonds 221 connect the electrical pads 220 of the wire bonding die 22 to the corresponding leads of the leadframe 20.
With such a configuration, the leadframe 10 can be overlapped with the first die 21 as seen in
The contact bumps 3111-3114 comprise the first contact bump 3111, the second contact bump 3112, the third contact bump 3113 and the fourth contact bump 3114. The contact bumps 3111-3114 are positioned at the periphery of the flip-chip die 31 and are not covered by the wire bonding die 32. The contact bumps 3111-3114 are placed between the top side surface of the flip-chip die 31 and the bottom side surface of the leadframe 30. Circuit/circuits are fabricated at least proximate to the top surface of the flip-chip die 31.
Contact pads (not shown) are formed on the top surface as the input/output terminals of the flip-chip die 31 and the contact bumps 3111-3114 are formed on the contact pads for connecting the flip-chip die 31 to the leadframe 30. The first contact bump 3111 electrically couples the second lead 302 to the flip-chip die 31. The second contact bump 3112 electrically couples the fourth lead 304 to the flip-chip die 31. The third contact bump 3113 electrically couples the fifth lead 305 to the flip-chip die 31 and the fourth contact bump 3114 electrically couples the seventh lead 307 to the flip-chip die 31 respectively.
Electrical contact pads 3201-3203 are formed on the top side surface of the wire bonding die 32. The first contact pad 3201 is connected to the first lead 301 through the wirebond 3211. The second contact pad 3202 is connected to the third lead 303 with the wirebond 3212. And the third contact pad 3203 is connected to the sixth lead 306 with the wirebond 3213. The eighth lead 308 is floating, i.e., it does not connect to the die 31 or 32 with either contact bump or wirebond. Wirebond 3214 is adopted to directly connect the contact pad 3204 of the wire bonding die 32 to the flip-chip die 31. The position relationship of the leadframe 30, the flip-chip die 31 and the wire bonding die 32 are fixed by the contact bumps 3111-3114 and the wirebonds 3211-3214. The fixed position relationship of the leadframe 30, the flip-chip die 31 and the wire bonding die 32 are further supported and secured by the molding material 23 (
In certain embodiments, a stacked die package integrating flip-chip die/dies and wire bonding die/dies comprises more than two dies. In one embodiment as shown in
For different applications, the number of contact bumps, wirebonds and leads of the leadframe may vary. For the stacked die package 500 as shown in
In some embodiments, for one or more leads of the leadframe, each lead is connected both to the flip-chip die and the wire bonding die. Referring to
In one embodiment as shown in
The controller die 82 has a first sensing node 1, a second sensing node 2, a control end 3 and a power supply node 4. The first lead VS is externally connected to the secondary winding T, and internally connected to the source S of the rectifier die 81 and the first sensing node 1 of the controller die 82. The second lead VD is externally connected to the output node OUT of the synchronous rectification circuit 8, and internally connected to the drain D of the rectifier die 81 and the second sensing node 2 of the controller die 82.
In the package 800, the gate G of the rectifier die 81 is connected to the driving node 4 of the controller die 82. Such that the controller die 82 drives the rectifier die 81 according to the differential voltage VSD across the first lead VS and the second lead VD. The third lead VDD is externally connected to a power source US and internally connected to the power supply node 3 of the controller die 82. In the embodiment as shown in
The leadframe comprises the first lead VS, the second lead VD and the third lead VDD. Specifically, the synchronous rectifier 81 has its source contact pads (not shown, under the contact bumps 811) electrically coupled to the first lead VS through a first contact bumps 811 and has its drain contact pads electrically coupled to the second lead VD through a second contact bumps 812. The controller die 82 has its first sensing node 1 coupled to the first lead VS through a first wirebond 821, has a second sensing node 2 electrically coupled to the second lead VD through a second wirebond 822 and has a power supply node 3 electrically coupled to the third lead VDD through a third wirebond 823. The controller die 82 is electrically coupled to the opposite surface of the leadframe from the flip-chip contact bumps. The driving pad 4 of the controller die 82 is electrically coupled to the gate contact pad of the synchronous rectifier die 81 through a fourth wirebond 824. The package 800B shown in
The converter module 900 comprises a switch die 91 on which a switch device is fabricated and a controller die 92 on which control circuits are fabricated, coupled to drive the main switch M in the switch die 91. The switch die 91 has a source, a drain D and a gate G. The controller die has several input/output nodes a1-a4 and a driving node a5.
The package of the converter module 900 comprising multiple leads IN, SW, A1-A4 wherein the first lead IN is externally coupled to receive an input power source VIN and internally connected to the source S of the switch M. The second lead SW is externally coupled to the diode D and to one terminal of the output inductance L, and internally coupled to the drain D of the switch M. The other terminal of the inductance L couples with the output capacitor C and provides the output voltage VOUT. The other end of the diode D is connected to the ground GND. The leads A1-A4 of the converter module 900 are internally coupled to the input/output nodes a1-a4 of the controller die 92. In other embodiment, the leads electrically coupled to the input/output nodes of the controller die 92 are other than four. The driving node a5 of the controller die 92 is electrically coupled to the gate G of the switch die 91 such that the controller die 92 controls the turn-on and turn-off of the switch M. When the switch M is turned on, current flows from the source of the switch M to the node SW, and VOUT increases gradually. When the switch M is turned off, current flows through the rectifier D, and VOUT decreases gradually. VOUT is kept steady by controlling the switching duty cycle of the switch M.
The package 900B as shown in
From the foregoing, it will be appreciated that specific embodiments of the technology have been described herein for purposes of illustration, but that various modifications may be made without deviating from the disclosure. Though “lead” or “leads”, “contact bump” or “contact bumps”, “wire” or “wires”, “pad” or “pads” and other similar terms are referred in the description with singular or plural forms, it is not confined to the singular or plural numbers, and any number is considered in the embodiments. Many of the elements of one embodiment may be combined with other embodiments in addition to or in lieu of the elements of the other embodiments. Accordingly, the disclosure is not limited except as by the appended claims.