Claims
- 1. A bonded structure, comprising:
- an integrated circuit element having a number of composite bump bonding pads;
- a first dielectric layer formed of first dielectric material wherein said first dielectric layer has an inner perimeter forming a window having no first dielectric material;
- a lead array having a number of conductive leads formed on said first dielectric layer wherein each said conductive lead has an inner lead end and an outer lead end and each said inner lead end extends beyond said inner perimeter into said window;
- an isolation film covering said window wherein said isolation film consists of a support metal layer formed on a layer of second dielectric material, said layer of second dielectric material contacts said inner lead ends, said second dielectric layer contacts said first dielectric layer, and said second dielectric layer insulates said support metal layer from said conductive leads;
- a number of bonding pairs wherein each said bonding pair consists of one of said inner lead ends and one of said composite bump bonding pads; and
- an anisotropic conductive film having conductive particles dispersed in an insulating adhesive disposed so that a number of said conductive particles are between said inner lead end and said composite bump bonding pad of each said bonding pair wherein said conductive particles form electrical contact with said inner lead end and said composite bump bonding pad of each said bonding pair.
- 2. The bonded structure of claim 1 wherein each said inner lead end is formed on said first dielectric layer.
- 3. The bonded structure of claim 1 wherein said conductive leads are copper.
- 4. The bonded structure of claim 1 wherein said composite bump bonding pads have a first polymer body covered by a first conductive metal coating.
- 5. The bonded structure of claim 1 wherein said conductive particles are metal.
- 6. The bonded structure of claim 1 wherein said conductive particles have a second polymer body covered by a second conductive metal coating.
- 7. The bonded structure of claim 1 wherein said conductive particles have a third polymer body covered by a third conductive metal coating and said third conductive metal coating is covered by a coating of a fourth polymer body.
- 8. The bonded structure of claim 1 wherein said conductive particles are graphite.
- 9. The bonded structure of claim 1 wherein said support metal layer is aluminum having a thickness of between about 30 and 35 microns and said second dielectric layer is polyimide having a thickness between about 70 and 75 microns.
- 10. The bonded structure of claim 1 wherein said first dielectric layer is formed of polyimide having a thickness of between about 75 and 125 microns.
Parent Case Info
This is a division of patent application Ser. No. 08/578,929, filing date Dec. 27, 1995, now U.S. Pat. No. 5,749,997, A New Composite Bump Tape Automated Bonding Method And Bonded Structure, assigned to the same assignee as the present invention.
US Referenced Citations (10)
Foreign Referenced Citations (1)
Number |
Date |
Country |
362927 |
Mar 1991 |
JPX |
Continuations (1)
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Number |
Date |
Country |
Parent |
578929 |
Dec 1995 |
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