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Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
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G01R27/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R27/00
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
Sub Industries
G01R27/02
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom
G01R27/025
Measuring very high resistances, e.g. isolation resistances
G01R27/04
in circuits having distributed constants
G01R27/06
Measuring reflection coefficients Measuring standing-wave ratio
G01R27/08
Measuring resistance by measuring both voltage and current
G01R27/10
using two-coil or crossed-coil instruments forming quotient
G01R27/12
using hand generators
G01R27/14
Measuring resistance by measuring current or voltage obtained from a reference source
G01R27/16
Measuring impedance of element or network through which a current is passing from another source
G01R27/18
Measuring resistance to earth
G01R27/20
Measuring earth resistance Measuring contact resistance
G01R27/205
Measuring contact resistance of connections
G01R27/22
Measuring resistance of fluids
G01R27/26
Measuring inductance or capacitance Measuring quality factor
G01R27/2605
Measuring capacitance
G01R27/2611
Measuring inductance
G01R27/2617
Measuring dielectric properties
G01R27/2623
Measuring-systems or electronic circuits
G01R27/2629
Bridge circuits
G01R27/2635
Sample holders, electrodes or excitation arrangements
G01R27/2641
of plate type
G01R27/2647
of coaxial or concentric type
G01R27/2652
open-ended type
G01R27/2658
Cavities, resonators, free space arrangements, reflexion or interference arrangements
G01R27/2664
Transmission line, wave guide (closed or open-ended) or strip - or microstrip line arrangements
G01R27/267
Coils or antennae arrangements
G01R27/2676
Probes
G01R27/2682
using optical methods or electron beams
G01R27/2688
Measuring quality factor or dielectric loss
G01R27/2694
Measuring dielectric loss
G01R27/28
Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks
G01R27/30
with provision for recording characteristics
G01R27/32
in circuits having distributed constants
Industries
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Patents Grants
last 30 patents
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Patent Grant
High performance inductive sensing all digital phase locked loop
Patent number
11,973,498
Issue date
Apr 30, 2024
Cypress Semiconductor Corporation
Paul M. Walsh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Source driver of display panel
Patent number
11,972,707
Issue date
Apr 30, 2024
MagnaChip Semiconductor, Ltd.
Jonghyun Kim
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Parallel plate capacitor system for determining impedance character...
Patent number
11,965,873
Issue date
Apr 23, 2024
TransTech Systems, Inc.
Manfred Geier
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for determining the resistive component of the le...
Patent number
11,965,916
Issue date
Apr 23, 2024
Safetytest GmbH
Simon Schulze
G01 - MEASURING TESTING
Information
Patent Grant
Method for achieving terminal-pair definition of four-terminal-pair...
Patent number
11,965,920
Issue date
Apr 23, 2024
National Institute of Metrology, China
Yan Yang
G01 - MEASURING TESTING
Information
Patent Grant
Injection-locked clock-multiplication for mixer local oscillator (L...
Patent number
11,967,980
Issue date
Apr 23, 2024
Intel Corporation
Ashoke Ravi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for measurement of material condition
Patent number
11,959,880
Issue date
Apr 16, 2024
JENTEK Sensors, Inc.
Scott A Denenberg
G01 - MEASURING TESTING
Information
Patent Grant
Method for estimating the insulation resistance of a high-voltage c...
Patent number
11,959,951
Issue date
Apr 16, 2024
Renault S.A.S.
Houssem Halalchi
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Method and monitoring device for determining a partial insulation r...
Patent number
11,959,975
Issue date
Apr 16, 2024
Bender GmbH & Co. KG
Carsten Hartmann
G01 - MEASURING TESTING
Information
Patent Grant
System and method for electrical impedance tomography of an object,...
Patent number
11,957,443
Issue date
Apr 16, 2024
Stichting IMEC Nederland
Seulki Lee
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for controlling an armature solenoid
Patent number
11,961,665
Issue date
Apr 16, 2024
Behr-Hella Thermocontrol GmbH
Stefan Kirsch
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Contact detection via impedance analysis
Patent number
11,956,588
Issue date
Apr 9, 2024
Meta Platforms Technologies, LLC
Drew Stone Briggs
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Sense resistor and method for forming same
Patent number
11,953,531
Issue date
Apr 9, 2024
Cirrus Logic Inc.
Kathryn R. Holland
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
HVMOS reliability evaluation using bulk resistances as indices
Patent number
11,955,389
Issue date
Apr 9, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chia-Chung Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for non-invasive microwave testing of bottles o...
Patent number
11,953,485
Issue date
Apr 9, 2024
The Trustees of Dartmouth College
Paul M. Meaney
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods to determine electrochemical impedance spectrog...
Patent number
11,953,532
Issue date
Apr 9, 2024
Arizona Board of Regents on behalf of Arizona State University
Jitendran Muthuswamy
G01 - MEASURING TESTING
Information
Patent Grant
Detecting capacitive faults and sensitivity faults in capacitive se...
Patent number
11,953,533
Issue date
Apr 9, 2024
CAPITAL ONE SERVICES, LLC
Dan-Ioan-Dumitru Stoica
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring insulation resistance
Patent number
11,946,976
Issue date
Apr 2, 2024
SK ON CO., LTD.
Ho Sang Jang
G01 - MEASURING TESTING
Information
Patent Grant
Synchronization of unstable signal sources for use in a phase stabl...
Patent number
11,946,994
Issue date
Apr 2, 2024
Tektronix, Inc.
Alexander Krauska
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Resistance measurement for measurements from multiple devices
Patent number
11,946,963
Issue date
Apr 2, 2024
Infineon Technologies AG
Andre Mourrier
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor structure and testing method thereof
Patent number
11,942,380
Issue date
Mar 26, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Ming-Shiang Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitive sensing of hand presence at control input device
Patent number
11,933,827
Issue date
Mar 19, 2024
Intuitive Surgical Operations, Inc.
Brian Luptak
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Inductance detection method of reluctance motor and motor detection...
Patent number
11,933,849
Issue date
Mar 19, 2024
Delta Electronics, Inc.
Yu-Shian Lin
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method and system for fingerprint sensor evaluation
Patent number
11,935,319
Issue date
Mar 19, 2024
Fingerprint Cards Anacatum IP AB
Frank Riedijk
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automotive electronic control unit
Patent number
11,935,338
Issue date
Mar 19, 2024
Hitachi Astemo, Ltd.
Hiroshi Kanno
G07 - CHECKING-DEVICES
Information
Patent Grant
Methods and systems for in-system estimation of actuator parameters
Patent number
11,933,822
Issue date
Mar 19, 2024
Cirrus Logic Inc.
Jorge L. Reynaga
G08 - SIGNALLING
Information
Patent Grant
Execution device and execution method
Patent number
11,933,826
Issue date
Mar 19, 2024
Tokyo Electron Limited
Yuto Usuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection system and detection method for water content and conduct...
Patent number
11,927,547
Issue date
Mar 12, 2024
JIANGSU MATHE INTERNET OF THINGS TECHNOLOGY CO., LTD.
Min Meng
G01 - MEASURING TESTING
Information
Patent Grant
Sheet electrical resistance measuring device
Patent number
11,927,613
Issue date
Mar 12, 2024
FUJIFILM Business Innovation Corp.
Kouhei Yukawa
G01 - MEASURING TESTING
Information
Patent Grant
Pollution and torque measuring device for busbar additional connect...
Patent number
11,927,497
Issue date
Mar 12, 2024
Vedat Voski
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RESISTANCE MEASURING STRUCTURES OF STACKED DEVICES
Publication number
20240145479
Publication date
May 2, 2024
Samsung Electronics Co., Ltd.
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CALCULATION METHOD AND CALCULATION DEVICE
Publication number
20240142504
Publication date
May 2, 2024
Sumitomo Electric Industries, Ltd.
G01 - MEASURING TESTING
Information
Patent Application
INDUCTIVE BROAD-BAND SENSORS FOR ELECTROMAGNETIC WAVES
Publication number
20240145221
Publication date
May 2, 2024
COMET TECHNOLOGIES USA, INC.
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR CONTROLLING AN ELECTRICAL RECEPTACLE
Publication number
20240146048
Publication date
May 2, 2024
HUBBELL INCORPORATED
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING CABLE RESISTANCE USING AT LEAST O...
Publication number
20240133933
Publication date
Apr 25, 2024
CommScope Technologies LLC
Khalid W. Al-Mufti
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
LOCAL OSCILLATOR (LO) GENERATION FOR CARRIER AGGREGATION IN PHASED...
Publication number
20240137051
Publication date
Apr 25, 2024
Intel Corporation
Ashoke Ravi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTROL CIRCUIT OF HEATING APPARATUS
Publication number
20240134334
Publication date
Apr 25, 2024
Shenzhen Xinan Textile CO., Ltd
Jialing XIANG
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC APPARATUS
Publication number
20240138065
Publication date
Apr 25, 2024
SAMSUNG DISPLAY CO., LTD.
JAEJIN OH
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CAPACITANCE MEASUREMENT CIRCUIT
Publication number
20240133934
Publication date
Apr 25, 2024
Elite Semiconductor Microelectronics Technology Inc.
Yi-Chou Huang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING AN ELECTRIC CURRENT
Publication number
20240133932
Publication date
Apr 25, 2024
INFINEON TECHNOLOGIES AG
Udo Ausserlechner
G01 - MEASURING TESTING
Information
Patent Application
HEATING SYSTEM INCLUDING CONDUCTIVE THREADS ACTING AS CAPACITIVE-BA...
Publication number
20240138027
Publication date
Apr 25, 2024
GENTHERM GMBH
Jan BESKA
B60 - VEHICLES IN GENERAL
Information
Patent Application
CAPACITANCE SENSING SYSTEMS AND METHODS
Publication number
20240125832
Publication date
Apr 18, 2024
Advanced Energy Industries, Inc.
Donald Enzinna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETERMINING ELECTRONIC COMPONENT AUTHENTICITY VIA ELECTRONIC SIGNAL...
Publication number
20240126864
Publication date
Apr 18, 2024
University of South Florida
Yunghsiao CHUNG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR POWER SUPPLIES WITH DYNAMIC VOLTAGE DROP CO...
Publication number
20240125828
Publication date
Apr 18, 2024
CommScope Technologies LLC
Steven Zanft
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Testing of a Photovoltaic Panel
Publication number
20240128926
Publication date
Apr 18, 2024
Solaredge Technologies Ltd.
Meir Adest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Testing of a Photovoltaic Panel
Publication number
20240120879
Publication date
Apr 11, 2024
Solaredge Technologies Ltd.
Meir Adest
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gain Matched Amplifiers for Light Detection
Publication number
20240110859
Publication date
Apr 4, 2024
Becton, Dickinson and Company
Timothy Wayne Petersen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD FOR CALIBRATING A TEMPERATURE OF A GRAPHENE HEATING CHIP
Publication number
20240110838
Publication date
Apr 4, 2024
TSINGHUA UNIVERSITY
JIE ZHAO
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
DEVICE AND METHOD FOR DETECTING DEFECTS OF HIGH-VOLTAGE CABLE CROSS...
Publication number
20240110997
Publication date
Apr 4, 2024
State Grid Jiangsu Electric Power Co., Ltd. Research Institute
Jingying CAO
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE IMPEDANCE TUNING FOR CAPACITIVE INTERCONNECTS
Publication number
20240113420
Publication date
Apr 4, 2024
Meta Platforms Technologies, LLC
Wenjing Su
G01 - MEASURING TESTING
Information
Patent Application
Current reference operative drive-sense circuit (DSC) with voltage...
Publication number
20240103664
Publication date
Mar 28, 2024
SIGMASENSE, LLC.
Patrick Troy Gray
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS TO GENERATE AN ALERT BASED ON HEALTH OF AN EAR...
Publication number
20240103057
Publication date
Mar 28, 2024
Sonjib Banerjee
G08 - SIGNALLING
Information
Patent Application
Current Separation Method, Doping Method, and Doping Apparatus of N...
Publication number
20240105396
Publication date
Mar 28, 2024
Asahi Kasei Kabushiki Kaisha
Koichi Hiraoka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CAPACITOR INSPECTION METHOD AND INSPECTION APPARATUS USED FOR SAME
Publication number
20240103062
Publication date
Mar 28, 2024
YURI HOLDINGS CO., LTD.
Reijiro MATSUO
G01 - MEASURING TESTING
Information
Patent Application
BATTERY MEASUREMENT
Publication number
20240094301
Publication date
Mar 21, 2024
CELLIFE TECHNOLOGIES OY
Roni LUHTALA
G01 - MEASURING TESTING
Information
Patent Application
CAPACITANCE MEASUREMENT WITHOUT DISCONNECTING FROM HIGH POWER CIRCUIT
Publication number
20240096598
Publication date
Mar 21, 2024
LAM RESEARCH CORPORATION
Sunil Kapoor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CAPSULE MONITORING SYSTEM FOR AEROSOL-GENERATING DEVICE
Publication number
20240090587
Publication date
Mar 21, 2024
Altria Client Services LLC
Zack W. BLACKMON
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPLICATION DEVICE, MEASUREMENT APPLICATION SETUP AND M...
Publication number
20240094272
Publication date
Mar 21, 2024
Rohde& Schwarz GmbH & Co. KG
Tobias FASTNER
G01 - MEASURING TESTING
Information
Patent Application
IMPEDANCE MEASUREMENT CIRCUIT AND IMPEDANCE MEASUREMENT METHOD THEREOF
Publication number
20240085941
Publication date
Mar 14, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Tsung-Che Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE AND METHOD FOR TESTING CRIMPING STATUS OF HARDWARE FITTING A...
Publication number
20240077548
Publication date
Mar 7, 2024
Huaneng Power International Inc. Hebei Clean Energy Branch
Hongbin Yao
G01 - MEASURING TESTING