This disclosure relates generally to electronic packaging, and in particular to reducing electromagnetic interference of a package-on-package system.
In electronic packaging, there can be a high degree of sensitivity in integrated circuits due to electromagnetic interference (EMI) and radio-frequency interference (RFI) from external sources. This can be particularly true in package-on-package systems in which a first package is stacked on top of a second package. In these systems, the packages are being manufactured smaller and lighter, but are required to perform greater functionality. It can be difficult to reduce the effects of EMI and RFI, perform all of the required functionality, and still meet the reduced size requirements.
To overcome some of these disadvantages, a conventional package-on-package arrangement can include a separate shield casing that is attached to a die or package. The separate shield casing, however, can consume a great amount of area on a substrate and increases the overall height of the system. In another conventional system, an integrated metal coating can reduce some of the disadvantages described above, but it has limited benefit in a package-on-package system. For example, the EMI generated from electrical circuits in one of the packages can still negatively impact the other package(s).
Therefore, it would be desirable to develop an electronic package-on-package system with integrated shielding which could overcome the electromagnetic interference problems encountered in conventional electronic packages.
For a more complete understanding of the present disclosure, reference is now made to the following detailed description and the accompanying drawings. In an exemplary embodiment, an electronic package-on-package system is provided with integrated shielding. The package-on-package system includes a first package having a first die and a second package having a second die and a substrate. The system also includes a conductive shield having a first portion and a second portion. The first portion is disposed between the first die and the second die and the second portion is disposed between the substrate and the first portion. The first portion is coupled to the second portion for shielding the first die from the second die. The first portion can include a conductive plane, and in this embodiment, the conductive plane can be formed in the first package.
In form of the embodiment, a mold material is disposed between the substrate and conductive plane. In addition, one or more input/output connections are provided for coupling the first package to the substrate. The conductive shield can be continuous or discontinuous. In addition, the system can include a plurality of trenches formed in the mold material. The second portion of the conductive shield is formed in the plurality of trenches. Further, the conductive material can be formed of solder. Also, the second package can include a plurality of die. The plurality of die can be disposed between the conductive shield and the substrate. In addition, a third package can include a third die.
In another embodiment, an electronic system can include a first package having a first die and a second package having a second die and a substrate. The system can further include a conductive plane disposed between the first die and second die and a mold material disposed between the substrate and conductive plane. In addition, a conductive shield can be formed in the mold material such that the conductive shield is coupled to the conductive plane for shielding the first die from the second die.
The system can include one or more input/output connections for coupling the first package to the substrate. Also, the conductive shield can be continuous or discontinuous. The conductive shield can further be formed in trenches of the mold material. The conductive shield and conductive plane can be made of solder.
In one form of this embodiment, the conductive plane is formed in the first package. Also, the second package can include a plurality of die that is disposed between the conductive plane, conductive shield, and substrate. In addition, the system can include a third package having a third die.
In a different embodiment, a method of forming a package-on-package system with integrated shielding is provided. The method includes providing a first package and a second package such that the first package has a first die and the second package has a second die and a substrate. A mold material is applied between the substrate and a conductive plane and a plurality of trenches are formed in the mold material. The method also includes depositing a conductive material in the plurality of trenches to form a conductive shield and coupling the conductive shield to the conductive plane for shielding the first die from the second die.
In one form of this embodiment, the conductive shield can be continuous or discontinuous. In another form thereof, the conductive plane can be formed in the first package. The second package can include a plurality of die that is disposed between the conductive plane, conductive shield, and the substrate.
In another exemplary embodiment, an electronic package-on-package system includes a first package having a first die and a second package having a second die and a substrate. The system also includes a first means for shielding disposed between the first die and the second die and a mold material disposed between the substrate and conductive plane. In addition, the system includes a second means for shielding formed in the mold material such that the first means for shielding is coupled to the second means for shielding for shielding the first die from the second die.
The system can include one or more input/output connections for coupling the first package to the substrate. In addition, the second means for shielding can be continuous or discontinuous. The second means for shielding can be formed in trenches of the mold material. Also, the first means for shielding can be formed in the first package.
In one form of the embodiment, the second package can include a plurality of die such that the plurality of die is disposed between the first means for shielding, the second means for shielding, and the substrate. In another form thereof, a third package can include a third die.
The above-described embodiments are advantageous for shielding electromagnetic fields from package-on-package systems. These embodiments are effective for shielding single or multi-die applications. In addition, less area is required in the package for these assemblies, and unlike conventional packages, these embodiments do not increase the overall height of the package. Instead, the shielding can advantageously be integrated with the package to substantially shield a first die from a second die and vice versa.
Referring to
Similar to the first package 102, the second package 104 can include a second die 110. The second die 110 is coupled to a second substrate 112. The second die 110 and second substrate 112 can be formed of silicon, glass, or other die and substrate material, respectively. The second die 110 can be coupled to the second substrate 112 by a plurality of microbumps 116. In addition, an underfill layer 114 is disposed between the second die 110 and the second substrate 112 to increase the reliability of the second package 104. In this embodiment, the second substrate 112 can include a plurality of conductive traces 118 for coupling the second die 110 to a chip, another package, or other electrical component. The second substrate 112 can also be coupled to another substrate or printed circuit board 120 by a plurality of solder bumps 122, for example.
The arrangement of the first package 102 stacked above the second package 104 can be referred to as a package-on-package assembly or system. In this embodiment, the first package 102 and second package 104 can be coupled to other electrical devices by a plurality of input/output (I/O) connections 130. In
As described above, there can be electromagnetic interference that can negatively affect the first die 106 and the second die 110 due to the close proximity of the dies to one another. Conventional packaging designs have attempted to resolve this problem by using a separate shield casing that attaches to the lower die in a package-on-package assembly. However, this can greatly increase the package footprint and height of the package thereby causing additional problems when incorporating the conventional package in an electrical device.
The embodiment of
In
In
Referring back to
In another embodiment, the conductive plane 128 is not planar. Instead, the conductive plane 128 can have a non-planar configuration as desired. Regardless of the configuration of the conductive plane 128, an integrated conductive shield is formed by coupling the conductive plane 128 to the conductive material-filled trench 126. The integrated conductive shield separates the first die 106 from the second die 110 and therefore substantially reduces or eliminates electromagnetic interference between the dies. In addition, because the integrated conductive shield is integral to the package-on-package system 100, the system does not require additional footprint or increased height.
In a different embodiment, a package-on-package system 200 is shown in
The second package 204 can include a second die 210 and a second substrate 212. In addition, the second package 204 also can include a third die 214 coupled to the second substrate 212. The second die 210 and third die 214 can be coupled to the second substrate by solder bumps or microbumps 216 and an underfill layer (not shown). In other embodiments, there can be additional die in the first package 202 and/or second package 204.
The second substrate 212 can have a plurality of conductive traces 218 formed therein. The plurality of conductive traces 218 can couple the second die 210 and third die 214 to another substrate or printed circuit board 220 by a plurality of solder bumps 222.
A mold compound 224 can be disposed between the first substrate 208 and second substrate 212. The mold compound 224 can be any epoxy-based material that can, for example, reduce warpage, cracking, or other mechanical defects during assembly. Similar to the system 100 shown in
The system 200 can further include a trench 226 or a plurality of trenches 226 formed in the mold compound 224. As described above, the trench 226 can be formed by a laser cutting or etching process. The trench 226 can form a wall that substantially surrounds the second die 210 and third die 214. If the trench 226 is continuous (i.e., trench 406 in
Once the trench 226 is formed in the mold compound 224, the trench 226 can be filled with conductive material such as copper. In addition, a conductive plane 228 can be coupled to the conductive material-filled trench 226 to form a conductive shield that separates the first die 206 from the second die 210 and third die 214. In this embodiment, the conductive plane 228 is planar. In an alternative embodiment, however, the conductive plane 228 is a conductive shield layer that is non-planar. In another embodiment, the conductive plane 228 can be a layer of the first substrate 208 (e.g., a ground layer). The conductive shield can reduce the electromagnetic interference between the first die 206 and the second and third dies 210, 214.
In one embodiment, it may be necessary or desirable to only shield the first die 206 and the second die 210 from one another. In this embodiment, the trench 226 may only be formed in the mold material 224 around the second die 210. In this embodiment, the second die 210 would be shielded from both the first die 206 and the third die 214, but the first die 206 would not be shielded from the third die 214. Alternatively, a trench 226 can be formed between the second die 210 and third die 214 to shield all three dies from one another.
In an alternative embodiment, vias can be fabricated in the mold compound 224 in addition to or instead of the trench 226.
A different embodiment of an electronic package-on-package system 300 with integrated shielding is shown in
Similar to the first package 302, the second package 304 can include a second die 310. The second die 310 is coupled to a second substrate 312. The second die 310 and second substrate 312 can be formed of silicon, for example, or other die and substrate material, respectively. The second die 310 can be coupled to the second substrate 312 by a plurality of microbumps 316. Although not shown, an underfill layer can be disposed between the second die 310 and the second substrate 312 to increase the reliability of the second package 304. In this embodiment, the second substrate 312 can also include a plurality of conductive traces (not shown) for coupling the second die 310 to a chip, another package, or other electrical component.
A mold compound 324 can be disposed between the first substrate 308 and the second substrate 312. The mold compound 324 can be any epoxy-based material for reducing warpage, cracking, or other mechanical defects during the assembly process. A plurality of I/O connections 330 can be formed in the mold compound 324. The I/O connections 330 can couple the first package 302 or second package 304 to other packages, chips, or electrical components.
Similar to the embodiments of
Once the trench 326 is formed in the mold compound 324, conductive material such as copper can fill the trench 326. The conductive material therefore forms a conductive shield or wall that surrounds the first die 306. To provide additional shielding, the conductive material in the trench 326 can be coupled to a conductive plane 328. The conductive plane 328 can be formed of copper or any other conductive material. In addition, the conductive plane 328 can be a metal ground layer or any other layer in the second substrate 312. Alternatively, the conductive plane 328 can be separate from the second substrate 312.
As described above, the conductive plane 328 does not have to be planar. Instead, the conductive plane 328 can have a non-planar configuration as desired. Regardless of the configuration of the conductive plane 328, an integrated conductive shield is formed by coupling the conductive plane 328 to the conductive material-filled trench 326. The integrated conductive shield separates the first die 306 from the second die 310 and therefore substantially reduces or eliminates electromagnetic interference between the dies. In addition, because the integrated conductive shield is integral to the package-on-package system 300, the system 300 does not occupy additional footprint or increase the height thereof.
The third package 332 is similar to the first and second packages. In particular, the third package 332 can include a third die 334 that is coupled to a third substrate 336. The third die 334 and third substrate 336 can be formed of silicon, for example. Alternatively, the third die 334 and the third substrate 336 can be formed of other known die and substrate material, respectively.
The third die 334 can be coupled to the third substrate 336 by a plurality of microbumps 316 and an optional underfill layer (not shown). The third die 334 can be completely or partially surrounded by a mold compound 346. The mold compound 346 can be epoxy-based and similar to the mold compound 324 described above.
Likewise, a different mold compound 342 can be disposed between the second substrate 312 and the third substrate 336. The mold compound 342 can be any epoxy-based material that can, for example, reduce warpage, cracking, or other mechanical defects during assembly. The system 300 can also include I/O connections 340 formed in the mold compound 342 similar to the I/O connections 330 described above. The I/O connections 340 can be useful for providing conductive connections to electrical devices. In other words, the second package 304 and the third package 332 can be coupled to other electrical devices by utilizing the I/O connections 340.
The system 300 can further include another trench 338 or a plurality of trenches 338 formed in the mold compound 342. As described above, the trench 338 can be formed by a laser cutting or etching process. The trench 338 can substantially surround the second die 310. The trench 338 can be continuous (i.e., similar to the trench 406 in
Once the trench 338 is formed in the mold compound 342, the trench 338 can be filled with conductive material such as copper. In addition, a second conductive plane 344 can be coupled to the conductive material-filled trench 338 to form a second conductive shield that separates the second die 310 from the third die 334. The second conductive plane 344 can be non-planar and/or be formed as a layer of the third substrate 336 (e.g., a ground metal). The second conductive shield can reduce the electromagnetic interference between the second die 310 and the third die 334.
In another embodiment, the first package 302, second package 304, and/or third package 332 can include a plurality of dies. Shielding can be integrally fabricated in the system 300 to isolate any two dies. Advantageously, the system 300 provides integrated shielding without occupying additional footprint or increasing the overall height thereof.
In
While exemplary embodiments incorporating the principles of the present invention have been disclosed hereinabove, the present invention is not limited to the disclosed embodiments. Instead, this application is intended to cover any variations, uses, or adaptations of the invention using its general principles. Further, this application is intended to cover such departures from the present disclosure as come within known or customary practice in the art to which this invention pertains and which fall within the limits of the appended claims.
This application claims the benefit of U.S. Provisional Patent Application Ser. No. 61/364,860, filed Jul. 16, 2010, which is hereby incorporated by reference.
Number | Date | Country | |
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61364860 | Jul 2010 | US |