The present patent application claims priority from European Patent Application No. 01 128 251.4, filed on Nov. 28, 2001.
The invention is a contact device and a process to facilitate contact of power electronics components as well as an assembly that consists of one or several power electronics components that are contacted with strip conductors on a carrier.
The current state of technology generally recognizes the following processes to facilitate contact of integrated electronic components (chips):
In the case of so-called Drahtbonden [wire bonding], a semiconductor component is placed onto a substrate, whereby fine gold or aluminum wires connect the components' metallic contact surfaces (bond pads) with the substrate's contacts. The fine gold or aluminum wires are fastened to the contact surfaces by means of ultrasound welding, for example. The serial nature of the contacting process makes wire bonding relatively time-intensive.
Therefore, industrial-scale production of microelectronic components also employs the so-called Tape Automated Bonding (TAB) method, whereby a copper comb, produced by means of etching on a plastic carrier (tape), is placed on the upper side of the component and simultaneously bonded by means of thermal compression with all contact surfaces on the component.
In addition, the so-called flip chip method is a common method whereby a chip is bonded directly with the substrate. Accordingly, so-called solder bumps are produced on the contact surfaces of the component's underside. When the entire substrate is warmed, these bumps become bonded with the substrate's strip conductors.
However, due to their small contact surfaces, for instance, these commonly-known methods of facilitating contact are not entirely suitable for applications where larger amounts of power will be transferred. While it is true that power electronics components, such as power MOSFETs, are generally bonded to a substrate's contacts by means of wire bonds, the high levels of current necessitate the use of several wires for each power contact (the source and drain of a MOSFET, for example). For this reason, the use of wire bonds to contact power electronics components is relatively time-consuming and expensive. Also, inductance of the bond wires can cause distortions of the signal at high frequencies.
In the past, power electronics components were generally not placed onto a substrate in an unencapsulated condition; instead, they were enclosed in a housing. For example, German patent DE-PS 19 11 633 reveals a method of contacting and enveloping semiconductor components whereby the component is assembled onto a stamped lead frame. Accordingly, the component, such as a high performance transistor (whose contact surfaces are covered with solder), is placed onto a plate-like portion of the lead frame and the ends of the lead frame's narrow lead bridges are placed onto the contact surfaces on the transistor's upper side. The frame and the component are then placed together into a pressing mold, the temperature is increased until the solder melts, and the press mold is later filled with a plastic material. Finally, parts of the lead frame, which protrude from the encapsulated component, are removed in order to electrically separate from each other the leads to the individual contacts.
U.S. Pat. No, 4,809,054 also demonstrates a method of contacting semiconductor elements with a lead frame. The contact surfaces arranged on the upper side and underside of the component are covered with solder, the component is placed onto a right-angle section of the lead frame, and another section of the lead frame is folded over in such a way that it contacts the contact surface on the upper side of the component.
German patent DE 199 33 975 is also mentioned. It describes a pressed screen for contacting the connections of an assembly that consists of several electronic parts.
The invention pursues the objective of providing a cost-effective system for contacting power electronics components with which mechanically and electrically stable and especially low-inductance connection paths to the component's contacts can nevertheless be created.
The invention achieves this objective by means of the methods and devices detailed in claims 1, 7, and 14. Preferred designs for executing the inventions are provided in the respectively subordinate claims, as well as other places.
Accordingly, the invention provides a method of contacting one or several power electronics components with strip conductors on a substrate. The method is executed with the aid of a contact device with several flat contact elements joined to each other with bridges and includes the following steps: (a) The contact device is placed onto the upper side of the component(s); (b) the underside of a contact element is electrically connected both with the contact surface on the upper side of a component and with a strip conductor; (c) at least one of the bridges between the individual contact elements is severed by means of thermal gouging.
Furthermore, the invention provides a contact device for contacting one or several power electronics components with strip conductors on a substrate. The contact device contains one or several flat contact elements, each of which is suitable for connecting a component's contact surface with a strip conductor. The contact device's individual contact elements are joined to each other via bridges that can be severed by means of laser cutting, electron beam cutting, and/or ion beam cutting.
Finally, the invention provides an assembly that includes one or several power electronics components that exhibit contact surfaces at least on their upper sides as well as a substrate with strip conductors on which the undersides of the components rest. The assembly also includes one or several flat contact elements for contacting the component(s) with the strip conductors, whereby each contact element is electrically connected with both a contact surface on the upper side of the component and with a strip conductor.
The invention will now be more closely explained through the use of preferred design examples and the attached drawing. The figures in the drawing schematically depict the following:
Parts with the same functions or similar functions are sometimes labeled in the drawing with the same reference symbol.
The term “strip conductor” refers in the following text to the contact area that is connected to a semiconductor component's (a chip's) metallic contact surfaces (so-called pads). In general, the metal strips are located on a chip substrate, although other designs are feasible.
The flatness of the contact elements according to the invention ensures that the inductance of the connection paths between the component and the strip conductors will be minimal, a particularly advantageous characteristic in high-frequency applications. Furthermore, the correspondingly large connection surfaces result in minimal contact resistance and, therefore, a comparably small increase in the temperature of the component, especially in applications that involve high amounts of current. In contrast to the wire bond method, for example, special contact surfaces are not required for contacting because the electrical connections can be established with a simple process like soldering or bonding.
The design examples according to the invention employ a contact device that consists of several flat contact elements that during assembly are still joined together by bridges so that the contact elements can be placed together onto the component(s) that will be contacted. After the electrical connections have been established, the preferred method is to sever at least one of the bridges in order to electrically separate the respective contact elements from each other. The preferred means of separation is a thermal gouging process, which—in contrast to many mechanical separation procedures like punching, for example—requires access to the point of separation from only one side. This means that a solid substrate, such as a substrate plate, can be located underneath the component.
A contactless thermal gouging process is preferred; this method has the advantage that no mechanical forces are transferred during separation of the bridge and therefore no mechanical stresses can develop in the contact device or the component. For example, a laser beam will be focused onto the contact device and the substrate, together with the components, will be moved in the desired cutting direction of the laser. Laser cutting enables precise dosing of the energy mass applied to the cutting location and the creation of accurately defined cut edges.
In the design examples, at least one component exhibits on its underside a contact surface that is placed onto and electrically connected with a strip conductor. Direct contacting with the strip conductor has the advantage of a particularly short connection path and is especially well suited for components, such as vertical MOSFET power transistors, that are erected by means of vertical engineering whereby either the source of drain contact is arranged on the underside of the transistor chip. These types of components must be contact from both sides.
In the preferred design examples, all electrical connections, possibly including the above-mentioned connection between the underside of a component and a strip conductor, are produced in one work step. This results in considerable cost savings when compared to the serial wire bonding method. The electrical connections are preferably produced by means of a so-called reflow soldering process. Accordingly, the solder is usually deposited onto the contact device and possibly the strip conductors by means of soldering paste printing, such as screen printing; the components are then set onto the strip conductors and the contact device is set onto the component, which is made easier by means of the soldering paste's adhesive properties. Alternatively, the soldering paste can be deposited onto the component itself. Finally, the solder is melted by means of a simultaneous soldering process such as in a continuous furnace or by means of vapor-phase soldering. In the case of vapor phase soldering, the prepared assembly is brought into a zone with hot, saturated vapor, whereby the vapor that condenses on the colder assembly releases the heat energy needed to melt the solder. Alternatively, single soldering processes may be used. These include stamp soldering or laser soldering or any other soldering and bonding process.
The contact device depicted in the preferred design examples is manufactured from a stamped or a stamp and bent component. The starting material is a thin copper sheet with a thickness of 100 to 500 μm from which a grid-like arrangement of contact elements, connected to each other by bridges, is stamped. If needed, the contact device is bent in a few areas in order to adapt it to the shape of component.
The sections of the contact elements that are intended to contact the component's contact surfaces are adapted to the shape and/or the size of the corresponding contact surface. In particular, the contact elements for the power contacts (such as the source or drain of a MOSFET) completely cover the component's corresponding power contact surfaces so that it is possible to establish with the contact element an electrical connection across the entire contact surface, thereby keeping the contact resistance low.
The contact elements for the control contacts (such as the gate of a MOSFET) preferably exhibit a smaller cross section than that of the power contacts (In other words, the current between the strip conductor and the contact surface has access to a lead with a smaller cross section) and are preferably each arranged in the recess of a contact element for a power contact. This arrangement is especially advantageous for the contacting of components where the control contact is also arranged in a recess of the power contact, such as is the case with currently available power MOSFETs. This also results in a compact arrangement of all contact elements for a component.
The contact device depicted in the preferred design example exhibits positioning aids that facilitate the positioning of the contact device on the component(s) and/or on the substrate. This initially makes it easier to align the contact device or the components on the substrate during setting and also serves to prevent slippage of the contact device during the preferred simultaneous reflow soldering process. Otherwise, simultaneous heating of all connection points would encourage the contact device and the components to “swim” on top of the contact surface's liquid solder, thereby easily slipping out of position. A spring is preferred as an alternative or addition to the positioning aids. The spring elastically presses the contact device against the component(s) and/or against the substrate, thereby preventing slippage.
According to an initial design example, the component and strip conductor substrate is a plate made of epoxy resin or ceramic, for example. The ceramic substrate made of, for example, Al2O3 or AlN is laminated with a copper layer in which the strip conductors are etched by means of a photolithographic process. The underside of the substrate is also coated with copper in order to avoid asymmetrical expansion of the substrate layers during warming. Ceramic is a good insulator and thermally very stable, but has high thermal resistance and therefore contributes almost nothing to dissipation of the component's waste heat. For this reason, a second design example uses as substrate a plastic frame that is injection-molded around the strip conductors. The strips conductors are thereby hung essentially bare, making them easy to cool. In the particularly preferred design examples, the plastic frame is hung in a container with a cooling medium.
The completed assembly is employed preferably as a half bridge or inverter for a three-phase motor. The assembly depicted in the design examples exhibits particular advantages when used with crankshaft starter generators because the flat electrical connections exhibit a large amount of mechanical stability and are therefore capable of withstanding the strain of shaking that occurs in motor vehicles. It is preferable for both power components (like power MOSFETs/diodes) as well as logic components (for activating the power electronics) to be arranged on a single substrate and thereby in a single assembly.
Returning to the figures,
The contact elements 6, 8 are connected with each other by thin bridges 5 that are then severed by means of one of the above-mentioned thermal gouging processes after contacting of the components in order to electrically isolate the leads 6, 8 from each other. The wider bridges 4 between the contact elements 6 can also be severed after contacting of the components. However, this is not necessary if the three components, contacted by means of the shown contact device 1, are parallel connected.
Due to the fact that only a small control voltage flows through contact element 8, which contacts the gate electrode, while a greater current of 10–25 amperes (switched by the power component) flows through contact element 6, contact element 8 is narrower than contact element 6 and therefore exhibits a smaller cross section surface. The connection area 8a is also smaller than that of contact element 6. In addition, contact element 8 is located in a central recess of contact element 6 so that all contact elements for a component are arranged in a compact area. In other design examples (not shown), the recess is arranged at the edge of contact element 6.
The components 10 lie with each of their undersides on a strip conductor 14 so that the drain contact D can be contacted directly with this strip conductor by means of reflow soldering, for example.
After the electrical connections have been created, the bridges 4, 5, which are now no longer needed to mechanically hold together the contact device 1 and which short switch the contact elements 6, 8, will be severed by means of laser cutting or they will be cut out. Finally, the assembly 16 may be coated with gel or epoxy resin in order to provide protection.
In the case of the contact device 1 shown in
Number | Date | Country | Kind |
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01128251 | Nov 2001 | EP | regional |
Number | Name | Date | Kind |
---|---|---|---|
3967366 | Birglechner et al. | Jul 1976 | A |
4346396 | Carroll, II et al. | Aug 1982 | A |
4809054 | Waldner | Feb 1989 | A |
5173842 | Depew | Dec 1992 | A |
5343072 | Imai et al. | Aug 1994 | A |
5436405 | Hogge et al. | Jul 1995 | A |
6249041 | Kasem et al. | Jun 2001 | B1 |
Number | Date | Country |
---|---|---|
19 11 633 | Oct 1969 | DE |
199 60 013 | Jun 2000 | DE |
199 33 975 | Mar 2001 | DE |
01057726 | Mar 1989 | EP |
04098843 | Mar 1992 | EP |
05102384 | Apr 1993 | EP |
Number | Date | Country | |
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20030168252 A1 | Sep 2003 | US |