The present invention relates to digital isolators, and more particularly, to digital isolators providing isolation for voltage sensing.
Within power conversion products, there is a need for high speed digital links that provide high isolation at a low cost. Typical digital links within power conversion products require a speed of 50-100 megabits per second. Isolation between the input and output of power conversion products is required in the range of 2,500-5,000 V. Existing solutions for providing a high speed digital isolation link have focused on the use of magnetic pulse couplers, magnetic resistive couplers, capacitive couplers and optical couplers.
The present invention disclosed and claimed herein, in one aspect thereof, comprises an isolator that includes first and second substantially identical circuitry galvanically isolated from each other and each having at least one communications channel thereon for communicating signals across an isolation boundary therebetween and each of said first and second circuitry having configurable functionality associated with the operation thereof. A coupling device is provided for coupling signal across the isolation boundary between the at least one communication channels of the first and second circuitry. First and second configuration memories are provided, each associated with a respective one of the first and second circuitry. First and second configuration control devices are provided, each associated with a respective one of the first and second circuitry and each configuring the functionality of the associated one of the first and second circuitry. The first and second configurable memories have stored therein complementary configuration information to control each of the functionalities of the first and second circuitry to operate in a complementary manner for communication of signals across the isolation boundary.
For a more complete understanding of the present invention and the advantages thereof, reference is now made to the following description taken in conjunction with the accompanying Drawings in which:
a illustrates a zoom in view on the transmit side of the waveform of
a is a block diagram illustrating the circuitry included within a chip on one side of the capacitive isolation link for providing multiple isolation link channels;
b is a schematic diagram of an oscillator circuit;
a is a further view of two isolator chips in a package;
Referring now to the drawings, wherein like reference numbers are used herein to designate like elements throughout, the various views and embodiments of an isolator with complementary configurable memory are illustrated and described, and other possible embodiments are described. The figures are not necessarily drawn to scale, and in some instances the drawings have been exaggerated and/or simplified in places for illustrative purposes only. One of ordinary skill in the art will appreciate the many possible applications and variations based on the following examples of possible embodiments.
Referring now to the drawings, and more particularly to
Referring further to
A digital control circuit 124 is provided for controlling the operation of the primary switch group 102 and the secondary switch group 110. The voltages on nodes 104 and 106 are provided as inputs to the digital control circuit 124 for sensing the voltage and current on the primary side, the digital control circuit 124 generating the information on the bus 118 for control of the primary switch group 102. The control circuit 124 must be isolated from the secondary switch group 110, since there can be a significant DC voltage difference therebetween. This is facilitated by driving the bus 126 through a capacitive isolation circuit 128, such as the capacitive isolation circuit which will be discussed herein below, to drive the bus 120. Similarly, the control circuit 124 is operable to sense the voltage and current levels on the output node 112 through sense lines 130 which are also connected through a capacitive isolation circuit 132 to the digital control circuit 124. The digital control circuit 124 is also interfaced to a bus 136 to receive external control/configuration information. This can be facilitated with a serial databus such as an SMB serial databus.
Referring now to
Once the RF signals are received at the receiving side, the transmit and receive circuitry 206 detects the data contained within the transmission from the first chip and utilizes the data as appropriate. While the description with respect to
In operation, each of the transmit/receive circuits 206 operates in either transmit or receive mode. In the transmit mode, digital data received on a digital bus 203 is serially transmitted from one of the transmit/receive circuit 206 to the other one on the other of the chips 202. This is facilitated by driving the signal across capacitors 204 and 205 such that energy is coupled across the capacitors. This will allow energy to be transmitted on transmission lines 207 that couple the capacitors 204 and 205 together. A first side of capacitors 204 and 205 are with the input signal and energy associated therewith is coupled across the high voltage isolation boundary created by the capacitor and onto the transmission line 207. As will be described herein below, both of the transmit/receive circuits 206 and capacitors 204 and 205 are fabricated on an integrated circuit utilizing conventional processing techniques and available conductive layers that are shared with the transmit/receive circuits. There will be a loss associated with the coupling coefficient across the capacitor such that the amount of energy that can be delivered from the transmit/receive circuit 206 to the transmission line 207 is reduced and, further, there will be more loss at certain frequencies than others.
Referring now to
The capacitors 336 and 338 are connected across an isolation barrier 340. As is more fully described herein below, the isolation barrier may be between different chips or different dies on a single chip. Capacitors 336 and 338 connect across the isolation barriers with isolation capacitor 342 and 344, respectively. Capacitors 342 and 344 are associated with the receiver circuitry 304. Capacitor 342 connects with the receiver circuitry at node 346. Capacitor 344 connects with the receiver circuitry at node 348. The receiver circuitry comprises a differential receiver consisting of a bias and transient common mode clamp circuitry 350 for preventing the receiver node from floating and limiting the input common mode voltage to the receiver from exceeding the operating range of the receiver protecting a receiver amplifier 352. The receiver amplifier 352 detects a received signal. The bias and transient clamp circuitry 350 comprises a P-channel transistor 354 having its source/drain path connected between VDD and node 346. An N-channel transistor 356 has its drain/source path connected between node 346 and node 358. A P-channel transistor 360 has its source/drain path connected between node 358 and ground. A resistor 362 is connected between node 346 and node 364. The gates of each of transistors 354 and 356 are connected to node 364. The gate of transistor 360 connects with the gate of a transistor 366 at node 361 which is connected to a circuit (not shown) providing a bias voltage BIAS 1. Transistor 368 is a P-channel transistor having its source/drain path connected between VDD and node 348. An N-channel transistor 370 has its drain/source path connected between node 348 and node 372. The P-channel transistor 366 having its gate connected with transistor 360 has its source/drain path connected between node 372 and ground. The gates of each of transistors 370 and 356 are connected to node 364. A resistor 374 is connected between node 348 and node 364. The bias and common clamp circuitry 350 clamps the receive input nodes to keep it from floating when no RF signal is applied and clamps the input voltage to the receiver.
The receiver amplifier 352 interconnects with the isolation capacitors at nodes 346 and 348 respectively. These nodes are connected with the gates of N-channel transistors 376 and 378. Transistor 376 is connected between nodes 380 and 381. Transistor 378 has its drain/source path connected between node 382 and node 381. A transistor 383 has its drain/source path connected between node 381 and ground. The gate of transistor 383 is connected to bias circuitry (not shown) providing a bias voltage BIAS 2. A P-channel transistor 384 has its source/drain path connected between VDD and node 380. A transistor 385 has its source/drain path connected between VDD and node 382. A resistor 386 is connected between the gate of transistor 384 and node 380. A resistor 388 is connected between the gate of transistor 385 and node 382. The receive signals over the capacitive link can be detected at either of nodes 380 and 382 and the received signal are offset from each other by 180 degrees. It should be understood that the capacitive isolation link could be replaced with an inductive isolation link.
Referring now to
a illustrates the manner in which the wave form 412 is transmitted on each of the transmission lines of the capacitive link 200. A first RF signal 420 comprises the information transmitted on the TX+ line of the capacitive link from the differential driver. The wave form 422 comprises the inverted format of the RF signal on the TX− line that is 180 degrees out of phase with signal 420.
Referring now to
Using the RF isolation links 200 described above, voltage isolation of up to 5,000 volts may be achieved, 2,500 volts for each side. Thus, as illustrated in
Referring now to
An oscillator circuit 830 is also associated with all of the channels of the interface. A band gap generator 820 is provided on-chip and connected to VDD to provide a band gap reference voltage to a regulator circuit 822. While the description with respect to
b illustrates the oscillator circuit 830 of
Referring now to
Referring back to
Continuing with the configuration illustrated in
As will be noted and described in more detail herein below, each of the OTPs 810, although identical, will provide a program that is complementary. It is important to note that each of the OTPs must be programmed independently utilizing the pins (which are multiplexed) on the associated side of the isolation boundary for the programming operation. Therefore, a programming mode will be entered which will cause the OTP 810 to go into a program mode for programming thereof. It is noted that an OTP is a non-volatile memory that can be programmed one time and this program is then unable to be erased. However, the configuration for chip 902 must be complementary to the configuration for chip 904, i.e., if channel 1, for example, on chip 902 were programmed to be an input, channel 6, the complementary channel, on chip 904 would be required to be configured as an output. Further, if an I2C function were required, it would be necessary that the OTP 810 associated with chip 902 be programmed such that channel 1 and channel 2 be programmed as a data channel and only one pad associated therewith and the corresponding and complementary channels, channel 5 and channel 6, on chip 902 be programmed similarly and that channel 3 on chip 902 and channel 4 on chip 904 be configured as a clock function such that the clock will go in the appropriate direction, i.e., as an input on chip 902 and as an output on chip 904. Thus, the two stored configurations must be complementary. Therefore, the programs, although different, must compliment each other once programmed. Further, it is noted that the use of the OTP removes a need to program a chip with a bond wire option at manufacturing and thus provides more versatility for a particular chip. This will be described in more detail herein below.
Referring now to
It is noted that Channel 1, Channel 2, Channel 8 shall be referred to as CH0, CH1, . . . , CCH7, and the two may be interchangeable.
Bit 16 defines the default value of the output. Upon power up, the output will either be at a logic “high” or a logic “low” depending upon the value of the bit. Bit 17 defines whether the data path is an inverting data path or non-inverting data path, i.e., the isolator along one channel appears as an inverter or a non-inverter. Bit 18 is an enable/disable bit which, when programmed, will define the output CH5 on each of the left and right dies as being an enable pin as opposed to a channel pin, i.e., a channel is sacrificed to provide this function on the pin. Bit 20 is associated with the OTP operation and, when programmed, this will prevent further programming of the bits. It should be understood that an OTP is a non-volatile memory and bits that are “programmed” will be changed from a logic “1” to a logic “0.” For those bits that have not been changed, they could still be programmed if desired. However, when bit 20 is changed from a logic “1” to a logic “0,” then such further programming will be inhibited. Bits 21 and 22 are reserve bits. Bit 23 is an I2C enable bit that defines the particular chip as being enabled for the I2C function. Bit 24 defines whether the particular die is the input or the output. For example, in one mode, the I2C operation is enabled which means that CH0 and CH1 are one path for data and CH4 and CH5 are a second path for data. Both of these will be programmed as being a driver or a receiver. If they are a driver on the left die, they must be a receiver on the right die. Therefore, it will be an input on the left die and an output on the right die and the bit must be so programmed. It could, of course, go in the opposite direction. When the I2C enable is controlled in the direction it is controlled, this will also program CH2 and CH3 as the clock in the right direction. Additional bits could be provided and utilized individually to program the I2C path such that only half of the chip were programmed as an I2C and the other half were programmable for data channels.
non-volatile memory Referring now to
There are provided for a six channel chip, six separate input/output pads that will be connected to respective output pins on the lead frame. On the left side, for chip 1106, there are provided six channel outputs, CH0, CH1, CH2, CH3, CH4 and CH5 associated with respective pins 1136-1146. Correspondingly, there will be provided on the lead frame six output pins per channel, CH0, CH1, CH2, CH3, CH4 and CH5 labeled with respective reference pins 1148-1158 associated with the input/output pads on chip 1104. It should be noted that channel CH0 on pin 1136 corresponds to channel CH0 on pin 1148, such that data can be transferred in one direction therebetween. However, CH0 on pin 1136 is associated with the channel CH0 on chip 1106 but pin 1148 will be associated with CH5 on chip 1104 as described herein above, as this is the complementary configuration.
Referring now to
Referring now to
Referring now to
Referring now to
When configured as a receiver to drive the isolation link, the latch is disabled and the data drives an inverter 1736 which drives the gates of two series connected transistors, P-channel transistor 1738 and an N-channel transistor 1740 which constitute an inverter that drives one input of a NAND gate 1744. The output of NAND gate 1744 drives one input of a NAND gate 1746, NAND gate 1744 having the other input thereof connected to VDD such that it is basically an inverter. That is the same for NAND gate 1746. This provides a data output on a line 1748 for driving the transmitter.
Referring now to
For a data receive operation, all that is required is that a detection be made as to whether the pull down is from the block 1802 or it is an external node pulling down the line. If it is detected that the output is a true ground, less than the one diode drop provided by the PNP transistor 1826, then this indicates that the data comes from other than this chip. It should be noted that when connecting the two channels that, on the left die, the path normally associated with CH0 is utilized and on the right side the pad normally associated with CH4 is utilized. In this manner, the adjacent channel will always be connected to the correct node. Also, if the output is selected by the 30 milliamp control signal on line 1816, this will drive the gates of two series connected transistors 1850 and 1852 which act as an inverter to drive an N-channel MOS transistor 1856. This does not provide the diode drop function as associated with PNP transistor 1826.
For the output function, the pad 1808 drives the input of an inverter 1858 which drives the gates of two series connected transistors 1860 and 1862 configured as an inverter to drive one input of a NAND gate 1864. The other input of the NAND gate is connected to the output of an inverter 1866. The output of gate 1864 drives one input of a NAND gate 1868, the output thereof providing the data output on a node 1870. The other input of gate 1868 is connected to the output of a NOR gate 1872, one input thereof connected to the I2C enable signal and the other input thereof connected to the output of a control block 1876 that provides the transmit control operation. This is input to the transmit data-in block which indicates that it has detected transmit data. Transmit data is detected by comparing the data value on the output line at a data line 1877, this being the voltage on node 1808. If it detects that this is lower than a diode drop, which is provided by a diode connected PNP transistor 1880 which basically provides a diode drop for comparison with the output voltage. If it is lower than this diode drop, this indicates that data has been received and provides an output to the second input of the NOR gate 1872.
The input of NOR gate 1882 is connected to pulse circuitry which is not necessarily required. In general, if data is detected, it is then routed to the data node 1870.
It will be appreciated by those skilled in the art having the benefit of this disclosure that this isolator with complementary configurable memory provides an isolator that is configured with OTP memory. It should be understood that the drawings and detailed description herein are to be regarded in an illustrative rather than a restrictive manner, and are not intended to be limiting to the particular forms and examples disclosed. On the contrary, included are any further modifications, changes, rearrangements, substitutions, alternatives, design choices, and embodiments apparent to those of ordinary skill in the art, without departing from the spirit and scope hereof, as defined by the following claims. Thus, it is intended that the following claims be interpreted to embrace all such further modifications, changes, rearrangements, substitutions, alternatives, design choices, and embodiments.
The present invention is a Continuation-in-Part of U.S. patent application Ser. No. 12/060,049, filed Mar. 31, 2008, entitled “CAPACITIVE ISOLATOR,” (now U.S. Pat. No. 8,169,108) which is a Continuation-in-Part of U.S. patent application Ser. No. 11/772,178, filed Jun. 30, 2007, entitled “BIDIRECTIONAL MULTIPLEXED RF ISOLATOR,” (now U.S. Pat. No. 8,049,573) which is a continuation-in-part of pending U.S. Pat. No. 7,302,247, issued Nov. 27, 2007, entitled SPREAD SPECTRUM ISOLATOR which is a continuation-in-part of U.S. Pat. No. 7,421,028, issued Sep. 2, 2008, entitled TRANSFORMER ISOLATOR FOR DIGITAL POWER SUPPLY, and is a continuation-in-part of U.S. Pat. No. 7,447,492, issued Nov. 4, 2008, entitled ON-CHIP TRANSFORMER ISOLATOR, and U.S. Pat. No. 7,376,212, issued May 20, 2008, entitled RF ISOLATOR WITH DIFFERENTIAL INPUT/OUTPUT and U.S. Pat. No. 7,460,604, issued Dec. 2, 2008, entitled RF ISOLATOR FOR ISOLATING VOLTAGE SENSING AND GATE DRIVERS all of the above which are incorporated herein by reference in their entirety.
Number | Name | Date | Kind |
---|---|---|---|
3058078 | Hoh | Oct 1962 | A |
3537022 | Regan | Oct 1970 | A |
3713148 | Cardullo et al. | Jan 1973 | A |
3714540 | Galloway | Jan 1973 | A |
3760198 | Mori et al. | Sep 1973 | A |
3798608 | Huebner | Mar 1974 | A |
3859624 | Kriofsky et al. | Jan 1975 | A |
4024452 | Seidel | May 1977 | A |
4027152 | Brown et al. | May 1977 | A |
4118603 | Humhyr | Oct 1978 | A |
4227045 | Chelcun et al. | Oct 1980 | A |
4302807 | Mentler | Nov 1981 | A |
4425647 | Collins et al. | Jan 1984 | A |
4459591 | Haubner et al. | Jul 1984 | A |
4523128 | Stamm et al. | Jun 1985 | A |
4536715 | Basarath et al. | Aug 1985 | A |
4538136 | Drabing | Aug 1985 | A |
4547961 | Bokil et al. | Oct 1985 | A |
4584708 | Eilers et al. | Apr 1986 | A |
4650981 | Foletta | Mar 1987 | A |
4675579 | Hardy et al. | Jun 1987 | A |
4703283 | Samuels | Oct 1987 | A |
4748419 | Somerville | May 1988 | A |
4763075 | Weigert | Aug 1988 | A |
4780795 | Meinel | Oct 1988 | A |
4785345 | Rawls et al. | Nov 1988 | A |
4791326 | Vajdic et al. | Dec 1988 | A |
4817865 | Wray | Apr 1989 | A |
4818855 | Mongeon et al. | Apr 1989 | A |
4825450 | Herzog | Apr 1989 | A |
4835486 | Somerville | May 1989 | A |
4853654 | Sakurai | Aug 1989 | A |
4859877 | Cooperman et al. | Aug 1989 | A |
4868647 | Uehara et al. | Sep 1989 | A |
4885582 | LaBarge et al. | Dec 1989 | A |
4922883 | Iwasaki | May 1990 | A |
4924210 | Matsui et al. | May 1990 | A |
4931867 | Kikuchi | Jun 1990 | A |
4937468 | Shekhawat et al. | Jun 1990 | A |
4945264 | Lee et al. | Jul 1990 | A |
4959631 | Hasegawa et al. | Sep 1990 | A |
5041780 | Rippel | Aug 1991 | A |
5057968 | Morrison | Oct 1991 | A |
5095357 | Andoh et al. | Mar 1992 | A |
5102040 | Harvey | Apr 1992 | A |
5128729 | Alonas et al. | Jul 1992 | A |
5142432 | Schneider | Aug 1992 | A |
5164621 | Miyamoto et al. | Nov 1992 | A |
5168863 | Kurtzer | Dec 1992 | A |
5204551 | Bjornholt | Apr 1993 | A |
5270882 | Jove et al. | Dec 1993 | A |
5293400 | Monod et al. | Mar 1994 | A |
5369666 | Folwell et al. | Nov 1994 | A |
5384808 | Van Brunt et al. | Jan 1995 | A |
5396394 | Gee | Mar 1995 | A |
5404545 | Melvin | Apr 1995 | A |
5418933 | Kimura et al. | May 1995 | A |
5424709 | Tal | Jun 1995 | A |
5434886 | Kazawa et al. | Jul 1995 | A |
5442303 | Asada et al. | Aug 1995 | A |
5444740 | Mizukami et al. | Aug 1995 | A |
5448469 | Rilly et al. | Sep 1995 | A |
5467607 | Harvey | Nov 1995 | A |
5469098 | Johnson, Jr. | Nov 1995 | A |
5484012 | Hiratsuka | Jan 1996 | A |
5533054 | DeAndrea et al. | Jul 1996 | A |
5539598 | Denison et al. | Jul 1996 | A |
5544120 | Kuwagata et al. | Aug 1996 | A |
5555421 | Enzinna | Sep 1996 | A |
5572179 | Ito et al. | Nov 1996 | A |
5588021 | Hunt et al. | Dec 1996 | A |
5591966 | Harada et al. | Jan 1997 | A |
5596466 | Ochi | Jan 1997 | A |
5615091 | Palatnik | Mar 1997 | A |
5615229 | Sharma et al. | Mar 1997 | A |
5625265 | Vlahu | Apr 1997 | A |
5627480 | Young et al. | May 1997 | A |
5627488 | Tanzawa et al. | May 1997 | A |
5650357 | Dobkin et al. | Jul 1997 | A |
5654984 | Hershbarger et al. | Aug 1997 | A |
5663672 | Nuechterlein | Sep 1997 | A |
5701037 | Weber et al. | Dec 1997 | A |
5714938 | Schwabl | Feb 1998 | A |
5716323 | Lee | Feb 1998 | A |
5731727 | Iwamoto et al. | Mar 1998 | A |
5731954 | Cheon | Mar 1998 | A |
5774791 | Strohallen et al. | Jun 1998 | A |
5781071 | Kusunoki | Jul 1998 | A |
5781077 | Leitch et al. | Jul 1998 | A |
5786763 | Canipe | Jul 1998 | A |
5786979 | Douglas | Jul 1998 | A |
5789960 | Bower | Aug 1998 | A |
5801602 | Fawal et al. | Sep 1998 | A |
5812597 | Graham et al. | Sep 1998 | A |
5812598 | Sharma et al. | Sep 1998 | A |
5825259 | Harpham et al. | Oct 1998 | A |
5831426 | Black, Jr. et al. | Nov 1998 | A |
5831525 | Harvey | Nov 1998 | A |
5845190 | Bushue et al. | Dec 1998 | A |
5850436 | Rosen et al. | Dec 1998 | A |
5864607 | Rosen et al. | Jan 1999 | A |
5900683 | Rinehart et al. | May 1999 | A |
5907481 | Svardsjo | May 1999 | A |
5913817 | Lee | Jun 1999 | A |
5926358 | Dobkin et al. | Jul 1999 | A |
5945728 | Dobkin et al. | Aug 1999 | A |
5952849 | Haigh | Sep 1999 | A |
5969590 | Gutierrez | Oct 1999 | A |
6023202 | Hill | Feb 2000 | A |
6049258 | Fawal et al. | Apr 2000 | A |
6054780 | Haigh et al. | Apr 2000 | A |
6061009 | Krone et al. | May 2000 | A |
6069802 | Priegnitz | May 2000 | A |
6082744 | Allinger et al. | Jul 2000 | A |
6087882 | Chen et al. | Jul 2000 | A |
6104003 | Jones | Aug 2000 | A |
6114937 | Burghartz et al. | Sep 2000 | A |
6124756 | Yaklin et al. | Sep 2000 | A |
6137372 | Welland | Oct 2000 | A |
6222922 | Scott et al. | Apr 2001 | B1 |
6232902 | Wada | May 2001 | B1 |
6249171 | Yaklin et al. | Jun 2001 | B1 |
6262600 | Haigh et al. | Jul 2001 | B1 |
6291907 | Haigh et al. | Sep 2001 | B1 |
6307497 | Leung et al. | Oct 2001 | B1 |
6384763 | Leung et al. | May 2002 | B1 |
6389063 | Kanekawa et al. | May 2002 | B1 |
6452519 | Swanson | Sep 2002 | B1 |
6525566 | Haigh et al. | Feb 2003 | B2 |
6538136 | Rizzo et al. | Mar 2003 | B1 |
6603807 | Yukutake et al. | Aug 2003 | B1 |
6611051 | Akiyama et al. | Aug 2003 | B2 |
6670861 | Balboni | Dec 2003 | B1 |
6720816 | Strzalkowski | Apr 2004 | B2 |
6728320 | Khasnis et al. | Apr 2004 | B1 |
6747522 | Pietruszynski et al. | Jun 2004 | B2 |
6833800 | Patterson | Dec 2004 | B1 |
6873065 | Haigh et al. | Mar 2005 | B2 |
6902967 | Beasom | Jun 2005 | B2 |
6903578 | Haigh et al. | Jun 2005 | B2 |
6914547 | Swaroop et al. | Jul 2005 | B1 |
6922080 | Haigh et al. | Jul 2005 | B2 |
6927662 | Kahlmann et al. | Aug 2005 | B2 |
6940445 | Kearney | Sep 2005 | B2 |
6956727 | Brokaw | Oct 2005 | B1 |
6967513 | Balboni | Nov 2005 | B1 |
6977522 | Murabayashi et al. | Dec 2005 | B1 |
7012388 | Lin et al. | Mar 2006 | B2 |
7016490 | Beutler et al. | Mar 2006 | B2 |
7023372 | Singh et al. | Apr 2006 | B1 |
7053807 | Gaalaas | May 2006 | B1 |
7053831 | Dempsey et al. | May 2006 | B2 |
7057491 | Dempsey | Jun 2006 | B2 |
7075329 | Chen et al. | Jul 2006 | B2 |
7102388 | Murabayashi et al. | Sep 2006 | B2 |
7277491 | Dong et al. | Oct 2007 | B2 |
7315592 | Tsatsanis et al. | Jan 2008 | B2 |
7940921 | Bark et al. | May 2011 | B2 |
8044747 | Yu et al. | Oct 2011 | B2 |
Number | Date | Country |
---|---|---|
10100282 | Jul 2002 | DE |
2679670 | Jan 1993 | FR |
2173956 | Oct 1986 | GB |
57-132460 | Aug 1982 | JP |
2000-174666 | Jun 2000 | JP |
WO9921332 | Apr 1999 | WO |
03050376 | Jun 2003 | WO |
Entry |
---|
“Publications—Geoff Walker”, http://www.itee.uq.edu.au/˜walkerg/publications/pubs—grw—links.html, May 2007. |
A Tale of Two Modems, Sensors Magazine, Apr. 2002, pp. 30-32. |
Akiyama, Noboru, A High-Voltage Monolithic Isolator for a Communication Network Interface, IEEE Transactions on Electron Devices, May 2002, pp. 895-901, Vol. 49, No. 5. |
Analog Devices—ADuM130x/ADuM140x; Coupler Technology Removes the Limitations of Optocoupler Solutions, pp. 2-15, May 2003. |
Baker, Bonnie C., The Basics of Isolation Circuits, Sensors and Systems, May 1996, pp. 46-47. |
Bindra, Ashok, MEMS-Based Magnetic Coils Exceed the Limitations of Optical Couplers, Electronic Design, Jul. 24, 2000, p. 43. |
Bourgeois, J.M., “PCB-based Transformer for Power MOSFET Drive,” 0-7803-1456-5-94 at pp. 283-244, IEEE, 1994. |
Choina, Simon, Planar Transformers Make Maximum Use of Precious Board Space, Electronic Design, Mar. 9, 1999, pp. 97 & 99. |
Clark, Ron, RS-232C/422/485 Line Isolation Solves More Than Fault Problems, EDN, Sep. 28, 1995, pp. 103-115. |
EDN'S 100 Top Products 1994, EDN, Dec. 8, 1994, pp. 58. |
Green, M.W. Miniature Multilayer Spiral Inductors for GsAs MMICs, 1989 IEEE GaAs Symposium, 1989, pp. 303-306. |
Hoskins, Kevin, Isolated ADC Reduces Power Consumption, EDN, Mar. 30, 1995, pp. 73-74. |
Ichio Aoki et al.; Fully Integrated CMOS Power Amplifier Design Using the Distributed Active-Transformer Architecture; IEEE Journal of Solid State Circuits, vol. 37, No. 3, Mar. 2002; pp. 371-383. |
IEEE Standard for a High Performance Serial Bus, IEEE Std. 1395-1995, Dec. 1995, pp. 1-392, NY. |
Impedance Matching Transformers, Transformer Applications, pp. 72-85, 2001. |
Kester, W., Origins of Real-World Signals and Their Units Measurement, ch. 1, pp. 1.1-1.11, 2003. |
Kilger, R. et al., “Micromachined magnetics: a new step in the evolution of isolation technology,” Electronic Engineering, Jun. 2000 at pp. 27-32. |
Klein William, Applications of Signal Isolation, Sensors Magazine, Apr. 2000, pp. 70-74. |
Knoedl, G., A Monolithic Signal Isolator, IEEE, 1989, pp. 165-170. |
Kojima, Yasuyuki, 2.3 kVac 100 MHz Multi-Channel Monolithic Isolator IC, 2000 Proceedings Annual IEEE International ASIC Conference, 2000, pp. 309-312. |
Kojima, Yasuyuki, A Novel Monolithic Isolator for a Communications Network Interface IC, 1998 Proceedings Annual IEEE International ASIC Conference, 1998, pp. 255-258. |
Kuhn, William, An RF-Based IEEE 1394 Ground Isolator Designed in a Silicon-on-Insulator Process, 44th IEEE 2001 Midwest Symposium on Circuits and Systems, Aug. 2001, pp. 764-767. |
Lam, Sam, High-Isolation Bonding Pad Design for Silicon RFIC up to 20 GHz, IEEE Electron Device Letters, Sep. 2003, vol. 24, No. 5, pp. 601-603. |
Long, John R., A 1.9 GHz Low-Voltage Silicon Bipolar Receiver Front-End for Wireless Personal Communications Systems, IEEE Journal of Solid-State Circuits, Dec. 1995, vol. 30, No. 12, pp. 1438-1448. |
Long, John R., Monolithic Transformers for Silicon RF IC Design, IEEE Journal of Solid-State Circuits, Sep. 2000, vol. 35, No. 9, pp. 1368-1382. |
Mammano, Bob, Isolated Power Conversion: making the case for secondary-side control, EDN, Jun. 7, 2001, pp. 123-127. |
Martel, Jesus, Analysis of a Microstrip Crossover Embedded in a Multilayered Anisotropic and Lossy Media, IEEE Transactions on Microwave Theory and Techniques, March 1994, pp. 424-432, vol. 32, No. 3. |
Munzer, M. , Coreless transformer a new technology for half bridge driver IC's, pp. 1-4, 2000. |
Pickering, Paul, A System Designer's Guide to Isolation Devices, Sensors, Jan. 1999, pp. 14-26. |
Ronkainen, H., IC compatible planar inductors on silicon, IEE Proc.-Circuits Devices Syst., Feb. 1997, vol. 144, No. 1, pp. 29-35. |
Schweber, Bill, MEMS-Based Digital Isolator Answers Need for Extreme I/O Speed, EDN, Jul. 20, 2000, p. 24. |
Schweher, Bill, DAAs go for the Silicon, EDN, Feb. 17, 2000, pp. 119-130. |
Simburger, Werner, A Monolithic Transformer Coupled 5-W Silicon Power Amplifier with 59% PAE at .9Ghz, IEEE Journal of Solid-State Circuits, Dec. 1999, vol. 34, No. 12, pp. 1881-1892. |
Sorenson, Jeff, Direct-Access Arrangements Are Crucial to Successful Embedded-Modem Designs, Electronic Design, Aug. 20, 2001, pp. 66-78. |
Stapleton, Helen, Isolation Techniques for High-resolution Data-acquisition Systems, EDN, Feb. 1, 2000, pp. 113-118. |
Tang, S.C., A Low-Profile Wide-Band Three-Port Isolation Amplifier with Coreless Printed-Circuit-Board (PCB) Transformers, IEEE Transactions on Industrial Electronics, Dec. 2001, vol. 48, No. 6, pp. 1180-1187. |
Walker, Geoff, An Isolated MOSFET Gate Driver, pp. 1-6, 1996. |
Walker, Geoffry, Modulation and Control of Multilevel Converters, Thesis submitted for Doctor of Philosophy (The University of Queensland), Nov. 16, 1999, pp. 1-202. |
Ward Titus, John Kenney, “10 GHz VCO for 0.13um CMOS Sonet CDR,” Analog Devices, pp. 1-4, Jun. 2006. |
Wolfs, P.J., An Improved Transformer Coupled MOSFET/IGBT Driver, Journal of Electrical and Electronic Engineering, Australia—IE Aust. & IREE Aust., Sep. 1991, vol. 11, No. 03, pp. 197-200. |
Young, Ron, Feedback Isolation Augments Power-Supply Safety and Performance, EDN, Jun. 19, 1997, pp. 141-146. |
Zhou, Jian-Jun and Allstot, David, A Fully Integrated CMOS 900MHz LNA Utilitzing Monolithic Transformers, ISSCC Digest of Technical Papers, pp. 132-133, 1998. |
Zhou, Jianjun, Monolithic Transformers and Their Application in a Differential CMOS RF Low-Noise Amplifier, IEEE Journal of Solid-State Circuits, Dec. 1998, pp. 2020-2027. |
Number | Date | Country | |
---|---|---|---|
20100052826 A1 | Mar 2010 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 12060049 | Mar 2008 | US |
Child | 12494618 | US | |
Parent | 11772178 | Jun 2007 | US |
Child | 12060049 | US | |
Parent | 11089348 | Mar 2005 | US |
Child | 11772178 | US | |
Parent | 10860399 | Jun 2004 | US |
Child | 11089348 | US | |
Parent | 10860519 | Jun 2004 | US |
Child | 12060049 | US | |
Parent | 11020977 | Dec 2004 | US |
Child | 10860519 | US | |
Parent | 11064413 | Feb 2005 | US |
Child | 11020977 | US |