Semiconductor device dies are affixed into device packages for protection and for more convenient installation into an end use device. Device packages may be made of any suitable sturdy and resilient material, such as ceramic, glass, or plastic. The semiconductor device die is affixed to its package in a variety of manners, including the use of epoxy, solder, or brazing.
Various semiconductor-based devices are configured to detect physical events and/or cause physical events. Such devices are generally known as a Micro-Electro-Mechanical Systems (MEMS) device. For example, a MEMS gyroscope may be used to determine angular rotation and a MEMS accelerometer may be used to sense linear acceleration. The MEMS gyroscope and accelerometer measure rotation and acceleration, respectively, by measuring movement and/or forces induced in one or more silicon proof masses mechanically coupled to and suspended from a substrate, typically glass, using one or more silicon flexures. As another example, a MEMS motor may be used to induce or sense movement in a rotor.
A number of recesses etched into the substrate of the MEMS device allow selective portions of the silicon structure to move back and forth freely within an interior portion of the MEMS device. A pattern of electrical connectors, also known as metal traces, are formed on the MEMS device substrate to deliver various electrical voltages and signal outputs to and/or from the MEMS device. The MEMS device, after fabrication, may be affixed to a support structure, such as a device package, with electrical connection of the MEMS device bonded to corresponding electrical connections of the support structure.
For example, the support structure may have wire leads or connectors that provide connectivity between the outside surface of the support structure and the metal traces of the MEMS device. A flip chip bonding process affixes the MEMS die to its support structure while bonding of the metal traces of the MEMS device with the wire leads or connectors of the support structure.
Another type of support structure is a leadless chip carrier. After the MEMS die is affixed to the leadless chip carrier, external wire bonds are made to electrically couple connections of the MEMS device with traces on the leadless chip carrier or with connectors to other electrical devices.
MEMS devices may be very sensitive to inducted stresses and/or changes in orientation of the MEMS device components. Very small changes in stress and/or orientation of the working components of the MEMS device may significantly change the signal output of the MEMS device. Accordingly, prior to use in the field, the MEMS device is calibrated. Typically, calibration of the MEMS device is performed at the factory or during a field calibration process. For example, output of a stationary MEMS gyroscope or accelerometer should be null (zero). Accordingly, during the MEMS device calibration process, the output of the stationary MEMS gyroscope and accelerometer is referenced to a null value and/or is electrically compensated to a null output.
Such “hard mounting” of the MEMS die to the support structure results in the MEMS die becoming solidly, or rigidly, affixed to the support structure. Temperature fluctuations of the device package and/or the MEMS causes thermal expansion (during heating) and/or contraction (during cooling) in the support structure. However, since the materials of the device package, the MEMS die, and any bonding material therebetween, are different, the relative amount of expansion and/or retraction will be different for the support structure, the MEMS die, and any bonding material therebetween. This differential expansion and/or differential contraction during a temperature change may induce changes in the orientation and/or stress of the working components of the MEMS device. Such differential expansion and/or differential contraction during a temperature change may result in the MEMS device becoming uncalibrated.
Further, some materials do not return to their original size and/or shape after a temperature cycle. For example, a gold ball bond may be used to affix the MEMS die to the support structure. Because of the ductility of the gold ball bond, a temperature-induced deformation causes a nonelastic deformation of the gold ball bond. Accordingly, after a number of temperature cycles, the gold ball bond does not return to its original pre-deformation form and/or stress. Such nonelastic, hysteresis deformation of the gold ball bond may result in the MEMS device becoming uncalibrated.
Accordingly, it is desirable to isolate the MEMS die from changes in orientation and/or stress that may occur as a result of differential expansion and/or differential contraction during a temperature change, and from hysteresis deformations resulting from temperature cycles. One prior art technique is to dispose an isolating structure between the MEMS die and the device package. For example, a plate, a pad, or the like made of a relatively thermal-expansion-resistant material may be bonded to the MEMS die and the device package. However, such intermediate isolating structures may not be entirely effective as movement and or stresses may be transferred through the isolating structure to the MEMS die. Further, such intermediate isolating structures may be relatively complex and expensive to fabricate and install between the MEMS die and the device package.
Systems and methods of affixing a silicon device to a support structure using ribbon suspenders are disclosed. In an embodiment, the device includes a face on which is disposed at least one electrical connector. A method includes forming a ribbon suspender having a width, a first connection portion, a second connection portion, and a support portion coupling the first connection portion to the second connection portion. The support portion defines an apex portion of the ribbon suspender. The apex portion is bonded to the device. The first and second connection portions of the ribbon suspender are bonded to the support structure. The support portion of the ribbon suspender flexes to accommodate acceleration of the support structure.
Preferred and alternative embodiments are described in detail below with reference to the following drawings:
Embodiments of the invention may incorporate, or otherwise utilize, concepts described in commonly owned U.S. patent application Ser. No. 12/340,133 entitled “SYSTEMS AND METHODS FOR AFFIXING A SILICON DEVICE TO A SUPPORT STRUCTURE,” which is hereby incorporated by reference as if fully set forth herein.
The ribbon suspender 100 is formed from a ribbon of bonding material, which may include aluminum, gold, platinum and/or a gold-plated metal. The ribbon suspender 100 is defined by a thickness “T” and a width “W” (that may be greater than the thickness). The width and thickness of the ribbon suspender 100 define the flexure characteristics and suspension characteristics of the ribbon suspender 100. Accordingly, the ribbon suspender 100 may be configured to isolate a MEMS die from accelerations, changes in orientation and/or stress associated with a support structure, which may occur as a result of differential expansion and/or differential contraction during a temperature change, and from hysteresis deformations resulting from temperature cycles.
In a step B, the lower end 910 is moved down to a first bonding location 410 of a bonding surface 400, and a combination of heat, pressure, and/or ultrasonic energy is applied by the tool 902, or other device, as necessary to bond the ribbon 906 to the first bonding location. The clamp 912 may then be released.
As illustrated in a step C, the bonding tool 902 is free to move relative to the ribbon 906, which remains bonded to the first bonding location 410. In steps C through D, the shape of the lower end 910 and the path taken by the tool 902 relative to the ribbon 906 form a desired ribbon-suspender 100 shape.
In step D, clamp 912 is again applied to the ribbon 906, the lower end 910 is moved down to a second bonding location 420, and a combination of heat, pressure, and/or ultrasonic energy is applied by the tool 902, or other device, as necessary to bond the ribbon to the second bonding location. As illustrated in a step E, this action may also thin and weaken an area of the ribbon 906 proximal to the second bonding location 420, allowing the bonding tool 902 and ribbon to be pulled away from the bonding surface 400, breaking the ribbon next to the second bonding location 420 to form the ribbon suspender 100. The bonding tool 902 is now ready to repeat the above-described process.
As alluded to with reference to
In an embodiment, the apex portions of the ribbon suspenders 200a, 200b are first bonded to the face 206 of the die 202. Subsequently, the respective connection portions (e.g., connection portions 208, 210 of ribbon suspender 200a) of the ribbon suspenders 200a, 200b are attached to the support structure 204. Each of the die 202, ribbon suspenders 200a, 200b, and support structure 204 may be so bonded to one another using, for example, a conductive epoxy or solder, or other appropriate bonding material.
In an alternative embodiment, illustrated in
The ribbon suspender 500a includes a first connection portion 508, a second connection portion 510, and a support portion 512 coupling the first connection portion to the second connection portion. In the illustrated embodiment, the first connection portion 508 is bonded to the electrical connector of the face 206.
The face 206 has an area defined and bounded, at least in part, by a width (or diameter, depending on the geometric configuration of die 202) Wface. The second connection portion 510 is bonded to a surface 208 of the support structure 204 facing, or otherwise disposed toward, the face 206. The support-structure surface 208 includes a first region 210 directly below (or above, depending on the respective orientations of the die 202 and support structure 204) face 206. The area of the first region 210 is equal to the area of the face 206, and the first region is coaxial with the face.
In the illustrated embodiment, the second connection portion 510 is bonded to a region of the support-structure surface 208 external to the first region 210 (i.e., outside of the perimeter of the die 202). The support portion 512 flexes to accommodate acceleration, as well as expansion or contraction, of the support structure 204. In an embodiment, the ribbon suspender 500a is configured such that, when the ribbon suspender 500a is bonded to the die 202 and support structure 204, the distance between the die 202 and the support structure 204 (similar to the distance D illustrated in
In an embodiment, the first connection portions of the ribbon suspenders 500a, 500b are first bonded to the face 206 of the die 202.
Subsequently, and referring back to
As alluded to with reference to
Embodiments of the ribbon suspender 100 were described and illustrated as having the same, or substantially the same, width and thickness as the other ribbon suspenders 100. Differently dimensioned ribbon suspenders 100 may be used to affix the MEMS die 202, 702 and the support structure 204, 704 based upon the design needs of a particular application. For example, a wider width ribbon suspender 100 may be used to provide additional support, and/or flexure to accommodate greater amounts of thermal expansion or thermal contraction. Additionally, a wider ribbon suspender 100 will provide a greater resistance to torque forces or stresses. Also, a thicker ribbon suspender 100 will have a lesser degree of flexure in the support portion 102.
In the various embodiments, the ribbon suspender 100 is made of a relatively resilient material, such as, but not limited to, a metal. An exemplary embodiment employs a ribbon material made of gold plated Kovar. Kovar is a trademarked nickel-cobalt ferrous alloy designed to be compatible with the thermal expansion characteristics of borosilicate glass (˜5×10−6/K between 30 and 200° C., to ˜10×10−6/K at 800° C.). Kovar allows direct mechanical connections over a range of temperatures with minimal thermal expansion. The optional gold plating of the Kovar facilitates mechanical bonding of the ribbon suspender 100 to the MEMS die 202, 702 and the support structure 204, 704. Other metals may be used.
While the preferred embodiment of the invention has been illustrated and described, as noted above, many changes can be made without departing from the spirit and scope of the invention. Accordingly, the scope of the invention is not limited by the disclosure of the preferred embodiment. Instead, the invention should be determined entirely by reference to the claims that follow.