Claims
- 1. A support member for supporting at least a portion of a semiconductor die assembly thereon comprising:
a die pad having a surface having at least a portion for directly attaching at least a portion of a surface of a bare semiconductor die using a heat-activated die-attach material disposed between the at least a portion of said die pad and a portion of the surface of the bare semiconductor die, the die pad comprising one of a portion of a lead frame, printed circuit board, and the die attach portion of a die package; a die cover for enclosing the bare semiconductor die, the die cover having at least a portion of a surface thereof for attachment to the die pad at an interface between the die pad and the die cover; and a heat-activated electrically resistive attachment material; and an energizable resistance circuit interposed between the surface of the die cover and the die pad for attaching at least a portion of the die cover to the die pad, the resistance circuit for generating heat.
- 2. The die support member assembly of claim 1, wherein the lead frame comprises a Leads-Over-Chip lead frame.
- 3. The die support member assembly of claim 1, wherein the printed circuit board comprises a glass-epoxy printed circuit board.
- 4. A support member for a semiconductor die assembly comprising:
a die pad and a die cover for enclosing a bare semiconductor die, the die pad having a surface with a localized die-attach region for directly attaching to at least a portion of a surface of the bare semiconductor die, the die cover having a surface for attaching at least a portion of the die pad, said die pad comprising one of a portion of a lead frame for direct attachment to the surface of the bare semiconductor die and a die attach portion of a die package; and a heat-activated electrically resistive attachment material; and a resistance circuit for interposing between the at least a portion of the surface of the die cover and at least a portion of the die pad for attaching at least a portion of the die cover to the at least a portion of the die pad, the resistance circuit for generating heat.
- 5. The die support member assembly of claim 4, wherein the die pad includes the die attach portion of the die package configured for reworking a semiconductor die.
- 6. The die support member assembly of claim 4, wherein the die pad and the die cover together comprise a Chip-Scale-Package.
- 7. The die support member assembly of claim 4, wherein the heat-activated electrically resistive attachment material comprises a conductive epoxy.
- 8. The die support member assembly of claim 7, wherein the conductive epoxy comprises a metal-filled epoxy.
- 9. The die support member assembly of claim 4, wherein the heat-activated electrically resistive attachment material comprises a eutectic material.
- 10. The die support member assembly of claim 9, wherein the eutectic material comprises a gold/silicon eutectic material.
- 11. The die support member assembly of claim 4, wherein the heat-activated electrically resistive attachment material comprises a conducting polyamide.
- 12. The die support member assembly of claim 4, wherein the heat-activated electrically resistive attachment material comprises a solder.
- 13. An assembly having an electronic device as part thereof including:
a bare integrated circuit die; and a die support member including:
a die pad and a die cover for enclosing the bare integrated circuit die, the die pad having a portion of a surface thereof for attaching a portion of a surface of the bare integrated circuit die, the die cover having a surface for attaching a portion thereof to a portion of the die pad using an interface fit therewith for retaining said die cover and said die pad together as an assembly; a resistance circuit; and a heat-activated electrically resistive attachment material interposed between a portion of the surface of the die cover and a portion of the die pad for attaching the die cover to the die pad, said resistance circuit for generating heat.
- 14. A heating method for a heat-activated electrically resistive attachment material in one of the packaging and the reworking of a bare semiconductor die, the method comprising:
providing resistance circuit; and providing a heat-activated electrically resistive attachment material interposed between a portion of a die pad and a portion of a die cover, the die cover and the die pad for enclosing the bare semiconductor die attached to the portion of the die pad; and energizing the resistance circuit for causing the heating of at least a portion of the die cover and at least a portion of the die pad.
- 15. The method of claim 14, further comprising:
providing the resistance circuit and the heat-activated electrically resistive attachment material between a portion of the bare semiconductor die and a localized die-attach region on a portion of a surface of the die pad.
- 16. The method of claim 14, further comprising:
providing a heat-activated electrically resistive attachment material interposed between the portion of the die pad and a portion of the bare semiconductor die; and heating the heat-activated electrically resistive attachment material using at least a portion of the resistance circuit.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application is a continuation of application Ser. No. 09/942,221, filed Aug. 29, 2001, pending, which is a continuation of application Ser. No. 09/620,182, filed Jul. 20, 2000, now U.S. Pat. No. 6,339,210 B1, issued Jan. 15, 2002, which is a continuation of application Ser. No. 09/338,242, filed Jun. 22, 1999, now U.S. Pat. No. 6,111,220, issued Aug. 29, 2000, which is a continuation of application Ser. No. 08/711,201, filed Sep. 10, 1996, now U.S. Pat. No. 5,938,956, issued Aug. 17, 1999.
Continuations (4)
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Number |
Date |
Country |
Parent |
09942221 |
Aug 2001 |
US |
Child |
10205826 |
Jul 2002 |
US |
Parent |
09620182 |
Jul 2000 |
US |
Child |
09942221 |
Aug 2001 |
US |
Parent |
09338242 |
Jun 1999 |
US |
Child |
09620182 |
Jul 2000 |
US |
Parent |
08711201 |
Sep 1996 |
US |
Child |
09338242 |
Jun 1999 |
US |