BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a side view of the entire structure of a semiconductor package according to one embodiment of the present invention;
FIG. 2 is an enlarged cross-sectional view of a multilayer printed wiring board and a bump terminal in FIG. 1;
FIG. 3 is a perspective view of the bump terminal in FIGS. 1 and 2;
FIG. 4 is a plan view of a reverse face wiring pattern to be bonded to the bump terminal in FIG. 3;
FIG. 5 is a diagram showing a modification of the multilayer printed wiring board according to the embodiment;
FIG. 6 is a plan view of a reverse face wiring pattern to be bonded to a bump terminal in FIG. 5;
FIG. 7A is a diagram showing another modification of the multilayer printed wiring board according to the embodiment;
FIG. 7B is a diagram showing an additional modification of the multilayer printed wiring board according to the embodiment;
FIG. 8 is a diagram showing a modification of the reverse face wiring pattern to be bonded to the bump terminals according to the embodiment;
FIG. 9 is a diagram showing a modification of the bump terminal according to the embodiment;
FIG. 10 is a diagram showing another modification of the bump terminal according to the embodiment;
FIG. 11 is a perspective view of a bump terminal molding die used for a method for manufacturing a semiconductor package shown in FIG. 1;
FIG. 12 is a cross-sectional view of the bump terminal molding die shown in FIG. 11;
FIG. 13 is a cross-sectional view of a process for using electroless plating to deposit a copper coating on the bump terminal molding die in FIGS. 10 and 12;
FIG. 14 is a cross-sectional view of a process for using electrolytic plating to form a copper coating following the process in FIG. 13;
FIG. 15 is a cross-sectional view of a resin filling process performed following the process in FIG. 14;
FIG. 16 is a cross-sectional view of a process for removing the copper coating following the process in FIG. 15;
FIG. 17A is a plan view of a mask to be used for the process for applying a solder paste following the process in FIG. 16;
FIG. 17B is a cross-sectional view of the solder applying process;
FIG. 18A is a bottom view of a multilayer printed wiring board used for the method for manufacturing the semiconductor package shown in FIG. 1;
FIG. 18B is a cross-sectional view taken along line X-X;
FIG. 19 is a cross-sectional view of a process for bonding bump terminals following the process in FIG. 17B;
FIG. 20 is a cross-sectional view of a process for removing the bump terminal molding die following the process in FIG. 19;
FIG. 21 is a perspective view of insulating rods used for a semiconductor manufacturing method according to another embodiment of the present invention;
FIG. 22 is a perspective view of a process for forming a copper coating on the insulating rods shown in FIG. 21;
FIG. 23 is a perspective view of a process for cutting off both ends of the insulating rods following the process in FIG. 22;
FIG. 24 is a perspective view of cutting the insulating rods into a plurality of segments following the process in FIG. 23;
FIG. 25A is a bottom view of the multilayer printed wiring board;
FIG. 25B is a cross-sectional view taken along line Y-Y in FIG. 25A;
FIG. 26A is a plan view of a mask to be used for a process for applying a solder paste to the multilayer printed circuit board shown in FIG. 25;
FIG. 26B is a cross-sectional view of the solder applying process in FIG. 26A;
FIG. 27 is a perspective view of a positioning jig used for positioning bump terminals shown in FIG. 24;
FIG. 28 is a cross-sectional view of a process for mounting the positioning jig on the multilayer printed wiring board following the process shown in FIG. 26B;
FIG. 29 is a cross-sectional view of a process for fitting the bump terminals in the through holes of the positioning jig following the process in FIG. 28;
FIG. 30 is a cross-sectional view of a process for removing the positioning jig following the process in FIG. 29;
FIG. 31A is a plan view of a mask to be used for a process for applying a solder paste to a motherboard in order to mount, on the motherboard, a semiconductor package manufactured during the process shown in FIGS. 21 to 30;
FIG. 31B is a cross-sectional view of the solder applying process in FIG. 31A;
FIG. 32 is a cross-sectional view of a process for bonding the semiconductor package to the motherboard following the process in FIG. 31;
FIG. 33 is a cross-sectional view of an underfill filling process following the process in FIG. 32; and
FIG. 34 is a cross-sectional view of the structure for a multilayer printed wiring board and a bump terminal for a conventional semiconductor package.