Shielded semiconductor leadframe package

Information

  • Patent Grant
  • 6614102
  • Patent Number
    6,614,102
  • Date Filed
    Friday, May 4, 2001
    23 years ago
  • Date Issued
    Tuesday, September 2, 2003
    21 years ago
Abstract
A semiconductor chip package includes a plurality of leadframe portions and a semiconductor die mounted on at least one of the leadframe portions. A shield element is attached to at least one of the leadframe portions. A package mold surrounds the semiconductor die and the shield element. Radiation shielding is thereby provided in a practical manner for a leadframe-based semiconductor chip package.
Description




TECHNICAL FIELD OF THE INVENTION




The present invention relates to semiconductor chip packages, and in particular to a radiation-shielded semiconductor leadframe package and a method for making the same.




BACKGROUND OF THE INVENTION




Leadframe-based semiconductor chip packages are known. In particular, packages that have leads and a die pad exposed on the bottom surface are known. Some of the challenges of forming such packages, while ensuring that the leads and die pad remain locked to the package mold, are addressed in co-pending U.S. patent application, Ser. No. 09/395,875, entitled “Plastic Integrated Circuit Device Package and Micro-Leadframe and Method for Making the Package,” U.S. patent application, Ser. No. 09/393,016, entitled “Plastic Integrated Circuit Package and Method and Leadframe for Making the Package,” and in U.S. patent application, Ser. No. 09/439,917, entitled “Cavity Semiconductor Package With Exposed Leads and Die Pad and Method for Making the Same,” all of which are incorporated by reference herein in their entirety.




In some applications, it is desirable to shield an integrated circuit chip from electromagnetic interference. Shielding external to the package is costly and impractical, particularly when the package has exposed leads and an exposed die pad. Incorporation of shielding into packages has remained problematic on a commercial scale.




SUMMARY OF THE INVENTION




Therefore, a need has arisen for a semiconductor chip package and packaging method that meets these challenges. In particular, a need has arisen for a shielded, leadframe-based semiconductor chip package, and a method for making the same.




Accordingly, a semiconductor chip package is disclosed. In one embodiment, the package includes a plurality of leadframe portions and a semiconductor die mounted on at least one of the leadframe portions. A shield element is attached to at least one of the leadframe portions. A package mold surrounds the semiconductor die and the shield element.




A method for assembling a semiconductor chip package is also disclosed. In one embodiment, the method includes providing a leadframe comprising a plurality of leads, mounting a semiconductor die on the leadframe, mounting an electromagnetic interference shield on the leadframe, and encapsulating at least a portion of the leadframe and the semiconductor die with a mold material to form a package mold.




An advantage of the present invention is that radiation shielding is provided in a practical manner for a leadframe-based semiconductor chip package.











BRIEF DESCRIPTION OF THE DRAWINGS




For a more complete understanding of the present invention and for further features and advantages, reference is now made to the following description taken in conjunction with the accompanying drawings, in which:





FIG. 1

is a vertical cross section of a semiconductor chip package constructed in accordance with the present invention;





FIG. 2

is a floor plan view of the package;





FIG. 3

is a front view of the package during assembly;





FIG. 4

is a top view of a shield element used in the package;





FIG. 5

is a top view of a portion of a leadframe used in the assembly process;





FIG. 6

is a top view of the leadframe and shield element during package assembly;





FIGS. 7 and 8

are close-up views of shield element legs;





FIG. 9

is a front view of the package during assembly using a differently-shaped shield element;





FIG. 10

is a top view of a differently-shaped shield element; and





FIG. 11

is a vertical cross section of a flip-chip package constructed in accordance with the present invention











DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS




The exemplary embodiments of the present invention and their advantages are best understood by referring to

FIGS. 1 through 11

of the drawings. Like numerals are used for like and corresponding parts of the various drawings.





FIG. 1

is a vertical cross section of a semiconductor chip package


10


constructed in accordance with the present invention.

FIG. 2

is a floor plan view of package


10


. Reference may be made to these figures in conjunction with the following description to understand the various components of package


10


.




Package


10


represents one embodiment of a shielded, leadframe-based semiconductor chip package. As described below, other leadframe-based packages may also benefit from the electromagnetic shielding described herein.




Package


10


includes a semiconductor die


12


mounted on a die pad


14


. A set of leads


16


projects inward from the outer perimeter of package


10


toward die


12


and die pad


14


. Bond pads (not shown) on die


12


are electrically connected to respective ones of the leads


16


by bond wires


18


. Diagonal support elements


20


(also known as tiebars) support die pad


14


in position prior to the package molding and saw steps of the assembly process, as will be described more fully below.




A package mold


22


provides structural support for package


10


. Package mold


22


may be formed from any one of a variety of commercially available mold compounds such as epoxidized ortho cresol novolac (EOCN), biphenyl (BP), dicyclopentadiene (DCPD) and multifunctional (MF) compounds available from a variety of manufacturers. Package mold


22


has a generally square outline as shown in

FIG. 2

, with chamfered corners


22




a


. While chamfered corners


22




a


are not necessary to practice the present invention, they may help to reduce the mechanical stress caused by a thermal expansion mismatch between the leadframe material and the mold compound. Chamfered corners


22




a


may be formed by the shape of the mold used to form package mold


22


. When packages such as package


10


are to be formed in large quantities, as described below, it may be more efficient to create square corners on package


10


rather than chamfered corners


22




a.






Die pad


14


and leads


16


have bottom surfaces


14




a


and


16




a


, respectively, that are substantially coplanar with the bottom surface


22




a


of package mold


22


. Thus, the bottom surfaces


14




a


and


16




a


of die pad


14


and leads


16


, respectively, are exposed at the bottom surface


22




a


of package mold


22


so that electrical and/or thermal contact may be made with die pad


14


and leads


16


.




Because leads


16


are exposed along the bottom surface


22




a


of package mold


22


, leads


16


are susceptible to breaking free from the adhesion of package mold


22


, which can result in one or more leads


16


projecting downward from the bottom surface


22




a


of package mold


22


or even breaking free from package


10


altogether, causing an open circuit. It is, of course, desirable to keep leads


16


in a planar arrangement and fixed to package mold


22


. Thus, leads


16


may have tabs which are effective in preventing leads


16


from breaking free from package mold


22


. These tabs are described in the aforementioned U.S. patent application, Ser. No. 09/439,917, incorporated by reference.




Other known mechanisms may also be used to lock leads


16


and die pad


14


in place. These known mechanisms include etching or coining portions of die pad


14


and leads


16


, and are described in the aforementioned U.S. patent applications, Ser. Nos. 09/395,875 and 09/393,016, which have been incorporated herein by reference. Accordingly, these methods will not be described further herein.




Package


10


includes a shield element


24


which shields semiconductor die


12


from electromagnetic interference. Shield element


24


may be made from any suitable metal, such as copper, nickel, chrome, stainless steel or other alloys, and may be plated with other metals to enhance corrosion resistance, improve solderability, or add to electrical shielding efficiency. For example, shield element


24


may be plated with gold, tin lead, indium, palladium, platinum and/or alloys of these or other metals. Shield element


24


is connected to selected leads


16


, and is grounded to provide an effective electromagnetic interference shield.





FIG. 3

is a front view of package


10


during assembly, prior to the formation of package mold


22


.

FIG. 4

is a top view of shield element


24


. Holes


26


are formed in the top and sides of shield element


24


. Holes


26


allow mold compound to reach the interior of shield element


24


during formation of package mold


22


.




Holes


26


are appropriately sized relative to the wavelength of the radiation from which semiconductor die


12


is to be shielded. For example, holes


26


may have a diameter no greater than one-twelfth the predominant wavelength in the spectrum of electromagnetic interference.




No holes are formed in the central area of the top of shield element


24


(see FIG.


4


). This unperforated central area allows a vacuum pick-up head to pick and place shield element


24


during package assembly.




An exemplary set of dimensions for semiconductor chip package


10


are given in Table A. These dimensions are set forth for illustrative purposes only, and in no way represent a limitation on the usefulness of the techniques described herein. A die thickness of 0.004-0.027 inches is assumed.















TABLE A













Height of package:




 0.9 mm







Width/length of package:




   7 mm







Angle of chamfered corners;




45°







Length of package edge between




5.181 mm







chamfered corners:







Angle of inclination of package




82°







mold sides:







Number of leads:




12












Lead spacing (center-to-center):




0.762 mm







Lead width:




0.381 mm







Lead/die pad thickness:




0.004-0.010 in.







Width/length of shield:




 4.6 mm







Height of shield:




0.6-0.7 mm  







Length/width of die pad:




1.727 mm















An assembly process for creating packages such as package


10


in quantity will now be described. Referring to

FIG. 5

, a top view of a portion of a leadframe


40


for use in such an assembly process is shown, with the outline of the final shape of semiconductor chip packages


10


being overlaid in dashed lines


42


for reference. In the first step of the process, leadframe


40


is created. In one embodiment, leadframe


40


is stamped from a single, planar sheet of metal, such as the steel alloy known as “alloy


42


,” or copper, or copper alloys with or without nickel or palladium plating. After the formation of leadframe


40


, any additional modifications such as etching or coining may be carried out, if desired.




Semiconductor dies


12


are then attached to die pad


14


and wire bonds


18


are attached (as shown in

FIGS. 1 and 2

) using conventional die attach and wire bond procedures. Die


12


may be any conventional type of die. For example, die


12


may be a power MOSFET, a GaAs chip, a surface acoustical wave device, an optical chip (e.g., a camera chip), or an erasable memory chip, among other possibilities.




Shield elements


24


are then placed on leadframe


40


as shown in the top view of FIG.


6


and the front view of FIG.


3


. Shield element


24


includes legs


28


which contact some of the leads


16


in leadframe


40


. The open spaces between legs


28


provide additional apertures for the entry of mold compound into the interior of shield element


24


, thereby reduced the required number and/or diameter of holes


26


in shield element


24


.




To assist in the alignment of a shield element


24


with leadframe


40


, each leg


28


may have a concave lower surface as shown in FIG.


7


. The concave lower surface of leg


28


is shaped to receive the upper portion of a lead


16


(shown in cross section in the figure). The same shape of leg


28


may also be used to mate a corner leg


28


with a diagonal support element


20


of the leadframe (shown in FIG.


5


). Alternatively, as shown in

FIG. 8

, leg


28


may have a convex lower surface designed to mate with a corresponding recess in the upper surface of a lead


16


or diagonal support element


20


.




Shield elements


24


may be attached to leadframe


40


by means of solder or epoxy in a conventional manner. Mold compound may then be injection-molded around leadframe


40


and shield elements


24


to form an entire array of packages. Conventional molding compounds are used, as described above.




To reduce the possibility of air pockets remaining inside shield element


24


during injection molding, shield element


24


may have rounded corners as shown in the top view of FIG.


4


and the side view of FIG.


9


. Alternatively, shield element


24


may be circular in shape as shown in the top view of FIG.


10


. In this case the side view remains substantially the same as that shown in FIG.


9


.




After the formation of package mold


22


, the semiconductor chip packages


10


, shown in outline by dashed lines


42


in

FIG. 5

, then separated from each other by a sawing, punching, or equivalent cutting process. In one embodiment, the spacing between adjacent packages and the width of the saw blade are such that the region of leadframe material and mold compound between the dashed lines


42


, including connecting strip


44


, is obliterated in a single pass of the saw blade. A suitable saw process is described in more detail in the aforementioned co-pending U.S. patent applications, Ser. Nos. 09/395,875 and 09/393,016, and will not be described further herein. In this embodiment, each package


10


has square corners as shown by dashed lines


42


rather than chamfered corners


22




a


as previously illustrated. While additional saw blade passes may be used to create chamfered corners, this may not prove economical for a mass production environment.




The above-described method for creating packages such as package


10


in quantity may be the most efficient method for creating such packages in a mass production environment. However, package


10


may also be individually molded, particularly for small production runs or for testing. In that case, package mold


22


is formed for only one package in the injection molding process. Package mold


22


may therefore be formed in the desired shape, with chamfered corners


22




a


as previously described.




It will be appreciated that the above-described packaging methods yield a shielded semiconductor package with leads and a die pad at least partially exposed on their lower surfaces. This package may be used in applications where minimization of electromagnetic interference with the operation of the chip is needed.




Of course, electromagnetic shielding may be used in various types of leadframe-based packages. Another example of such a package is shown in FIG.


11


. In this figure, a flip-chip package


50


is shown in cross section. In package


50


, the leadframe consists of gull-wing shaped leads


52


. Package


50


has no die pad. Instead, semiconductor die


54


is mounted on leads


52


. Bond pads on die


54


are electrically and physically connected to leads


52


by a connection material


56


, which may be solder. An electromagnetic shield element


58


, similar to those previously described, is attached to selected leads


52


, which may establish a ground connection of shield element


58


. A package mold


60


is provided around die


54


, shield element


58


and the inner portions of leads


52


.




The fabrication process for package


50


is very similar to that previously described. A leadframe including leads


52


and connecting portions is provided. Die


54


is then mounted on the leadframe. Shield element


58


is placed on the leadframe in contact with selected leads


52


. Shield element


58


may be aligned with the leadframe using the interlocking leg and lead shapes previously described. Shield element


58


may be attached to the leadframe using solder or adhesive. Package mold


60


is then formed around die


54


and shield element


58


using conventional injection molding techniques and materials. A conventional trim-and-form process may then be used to separate leads


52


from the connecting portions of the leadframe and form leads


52


into the gullwing shape shown in FIG.


11


. When package


50


is mounted on a printed circuit board, the printed circuit board may have a ground plane which serves to complete the electromagnetic shielding of die


54


.




Although the present invention and its advantages have been described in detail, it should be understood that various changes, substitutions, and alterations can be made therein without departing from the spirit and scope of the invention as defined by the appended claims.



Claims
  • 1. A semiconductor chip package comprising:a plurality of leadframe portions; a semiconductor die mounted on at least one of the leadframe portions; a shield element attached to at least one of the leadframe portions; and a package mold surrounding the semiconductor die and the shield element; wherein the leadframe portions comprise a plurality of leads, and wherein a surface of at least one of the leads is exposed at a lower surface of the package mold; wherein the leadframe portions further comprise a die pad, and wherein a surface of the die pad is exposed at the lower surface of the package mold.
  • 2. The semiconductor chip package of claim 1, further comprising a bond wire forming an electrical connection between a bond pad on the semiconductor die and one of the leads.
  • 3. The semiconductor chip package according to claim 1, wherein the leadframe portions comprise leads and diagonal members, the diagonal members connected to the die pad, the shield element being attached to at least one of the diagonal members.
  • 4. The semiconductor chip package according to claim 1, wherein the leadframe portions comprise leads and diagonal members, the diagonal members connected to the die pad, the shield element being attached to at least one of the diagonal members and to at least one of the leads.
  • 5. The semiconductor chip package according to claim 1, wherein the shield element further comprises side surfaces adjacent the leadframe portions, the side surfaces having a plurality of holes formed therein.
  • 6. The semiconductor chip package according to claim 1, wherein the shield element further comprises a plurality of legs with slots formed in the shield element between adjacent legs, the legs being attached to the leadframe portions.
  • 7. The semiconductor chip package according to claim 1, wherein the shield element further comprises a plurality of legs, wherein individual legs have a recess formed therein and individual leadframe portions each include a protrusion engaged in the recess of a leg.
  • 8. The semiconductor chip package according to claim 1, wherein the shield element further comprises a plurality of legs, wherein individual legs have a protrusion formed therein and individual leadframe portions each include a recess, the protrusion of each leg being engaged in the recess of one of the leadframe portions.
  • 9. The semiconductor chip package according to claim 1, wherein the shield element further comprises means for interlocking engagement with at least one of the leadframe portions.
  • 10. The semiconductor chip package according to claim 1, wherein the leadframe portions further comprise means for mating with the shield element.
  • 11. A semiconductor chip package comprising:a plurality of leadframe portions; a semiconductor die mounted on at least one of the leadframe portions; a shield element attached to at least one of the leadframe portions; and a package mold surrounding the semiconductor die and the shield element; wherein the shield element comprises: a substantially planar top surface; and a plurality of substantially planar side surfaces, the side surfaces being joined to the top surface and to each other with rounded corners.
  • 12. The semiconductor chip package according to claim 11, wherein the shield element further comprises:a plurality of legs attached to the leadframe portions; slots formed in the shield element between adjacent legs.
  • 13. The semiconductor chip package according to claim 11, wherein the shield element further comprises a plurality of legs, wherein individual legs have a recess formed therein and individual leadframe portions each include a protrusion engaged in the recess of a leg.
  • 14. The semiconductor chip package according to claim 11, wherein the shield element further comprises a plurality of legs, wherein individual legs have a protrusion formed therein and individual leadframe portions each include a recess, the protrusion of each leg being engaged in the recess of one of the leadframe portions.
  • 15. The semiconductor chip package according to claim 11, wherein the leadframe portions include opposing first and second surfaces, the second surfaces of the leadframe portions being exposed through the mold compound.
  • 16. The semiconductor chip package according to claim 11, wherein the leadframe portions include a die pad, the die pad having first and second surfaces, the second surface of the die pad being exposed through the mold compound.
  • 17. The semiconductor chip package according to claim 11, wherein the leadframe portions include leads and a die pad, the leads having opposing first and second surfaces and the die pad having opposing first and second surfaces, the second surfaces of the leads and the die pad being exposed through the mold compound.
  • 18. A semiconductor chip package comprising:a plurality of leadframe portions; a semiconductor die mounted on at least one of the leadframe portions; a shield element attached to at least one of the leadframe portions; and a package mold surrounding the semiconductor die and the shield element; wherein the shield element comprises: a horizontal top surface; and least one vertical side surface, the side surface being joined to the top surface with a rounded corner.
  • 19. The semiconductor chip package of claim 18 wherein the top surface of the shield element is circular in shape.
  • 20. A semiconductor chip package comprising:a plurality of leadframe portions; a semiconductor die mounted on at least one of the leadframe portions; a shield element attached to at least one of the leadframe portions; and a package mold surrounding the semiconductor die and the shield element; wherein the shield element comprises a plurality of legs attached to a corresponding plurality of the leadframe portions; slots formed in the shield element between adjacent legs, the package mold filling the slots.
  • 21. The semiconductor chip package of claim 20 wherein at least one of the legs of the shield element comprises a concave lower surface shaped to receive a corresponding one of the leadframe portions.
  • 22. The semiconductor chip package according to claim 20, wherein the leadframe portions include leads and a die pad, the leads having opposing first and second surfaces and the die pad having opposing first and second surfaces, the second surfaces of the leads and the die pad being exposed through the mold compound.
  • 23. The semiconductor chip package according to claim 20, wherein the leadframe portions include a die pad, the die pad having first and second surfaces, the second surface of the die pad being exposed through the mold compound.
  • 24. The semiconductor chip package according to claim 20, wherein slots are formed in the shield element between adjacent ones of the legs.
  • 25. The semiconductor chip package according to claim 20, wherein individual ones of the legs have a recess formed therein and individual leadframe portions each include a protrusion engaged in the recess of a leg.
  • 26. The semiconductor chip package according to claim 20, wherein individual legs have a protrusion formed therein and individual leadframe portions each include a recess, the protrusion of each leg being engaged in the recess of one of the leadframe portions.
  • 27. A semiconductor chip package comprising:a plurality of leadframe portions; a semiconductor die mounted on at least one of the leadframe portions; a shield element attached to at least one of the leadframe portions; and a package mold surrounding the semiconductor die and the shield element; wherein the shield element comprises a plurality of legs attached to a corresponding plurality of the leadframe portions; wherein at least one the legs of the shield element comprises a convex lower surface, and wherein a corresponding one of the leadframe portions comprises a concave upper surface shaped to receive the convex lower surface of the leg.
  • 28. A semiconductor chip package, comprising:a leadframe having a die pad and a plurality of leads, the die pad having first and second surfaces and the leads having first and second surfaces; a semiconductor die mounted on the first surface of the die pad and electrically connected to the leads; a shield element mounted on the leads; a mold compound surrounding the semiconductor die and the shield element, the second surfaces of the leads and the second surface of the die pad being exposed through the mold compound.
  • 29. The semiconductor chip package of claim 28, wherein the shield element comprises:a substantially planar top surface; and a plurality of substantially planar side surfaces, the side surfaces being joined to the top surface and to each other.
  • 30. The semiconductor chip package of claim 28, wherein a set of holes are formed in the shield element, the mold compound filling the holes.
  • 31. The semiconductor chip package of claim 28, wherein the shield element comprises a plurality of legs attached to a corresponding plurality of the leads.
  • 32. The semiconductor chip package of claim 31 wherein at least one of the legs of the shield element comprises a concave lower surface shaped to receive a corresponding one of the leads.
  • 33. The semiconductor chip package of claim 31 wherein at least one of the legs of the shield element comprises a convex lower surface, and wherein a corresponding one of the leads comprises a concave upper surface shaped to receive the convex lower surface of the leg.
  • 34. The semiconductor chip package of claim 28, wherein the semiconductor die is electrically connected to the die pad.
  • 35. The semiconductor chip package of claim 28, wherein the semiconductor die is electrically connected to the first surface of the leads by a set of bond wires.
  • 36. The semiconductor chip package according to claim 28, wherein the leadframe comprises diagonal members connected to the die pad, the shield element being attached to at least one of the diagonal members and to at least one of the leads.
  • 37. The semiconductor chip package according to claim 28, wherein the shield element further comprises a plurality of legs with slots formed in the shield element between adjacent legs, the legs being attached to the leadframe.
  • 38. The semiconductor chip package according to claim 28, wherein the shield element further comprises a plurality of legs, wherein individual legs have a recess formed therein and individual leads each include a protrusion engaged in the recess of a leg.
  • 39. The semiconductor chip package according to claim 28, wherein the shield element further comprises a plurality of legs, wherein individual legs have a protrusion formed therein and individual leads each include a recess, the protrusion of each leg being engaged in the recess of one of the leads.
  • 40. A semiconductor chip package, comprising:a leadframe having a set of leads, the leads having first and second surfaces; a semiconductor die electrically connected to the first surfaces of the leads; a shield element mounted on and electrically connected to the first surfaces of the leads; a mold compound surrounding the semiconductor die, the shield element, and inner portions of the leads, wherein outer portions of the leads are exposed and extend from the mold compound; wherein the semiconductor die is electrically connected to the first surfaces of the leads by a flip-chip connection.
US Referenced Citations (44)
Number Name Date Kind
4814943 Okuaki Mar 1989 A
4935803 Kalfus et al. Jun 1990 A
5166772 Soldner et al. Nov 1992 A
5200809 Kwon Apr 1993 A
5235131 Mueller et al. Aug 1993 A
5309321 Olla et al. May 1994 A
5365107 Kuraishi et al. Nov 1994 A
5371404 Juskey et al. Dec 1994 A
5436203 Lin Jul 1995 A
5521429 Aono et al. May 1996 A
5530202 Dais et al. Jun 1996 A
5547730 Weiblen et al. Aug 1996 A
5639989 Higgins, III Jun 1997 A
5650659 Mostafazadeh et al. Jul 1997 A
5656857 Kishita Aug 1997 A
5656864 Mitsue et al. Aug 1997 A
5668406 Egawa Sep 1997 A
5677511 Taylor et al. Oct 1997 A
5703398 Sono et al. Dec 1997 A
5805427 Hoffman Sep 1998 A
5851337 Chen Dec 1998 A
5894108 Mostafazadeh et al. Apr 1999 A
5909057 McCormick et al. Jun 1999 A
5939784 Glenn Aug 1999 A
5965843 Schönberger et al. Oct 1999 A
5973263 Tuttle et al. Oct 1999 A
5977613 Takata et al. Nov 1999 A
5977630 Woodworth et al. Nov 1999 A
5981043 Murakami et al. Nov 1999 A
6092281 Glenn Jul 2000 A
6130115 Okumura et al. Oct 2000 A
6130473 Mostafazadeh et al. Oct 2000 A
6143981 Glenn Nov 2000 A
6195267 MacDonald, Jr. et al. Feb 2001 B1
6198171 Huang et al. Mar 2001 B1
6225146 Yamaguchi et al. May 2001 B1
6229200 Mclellan et al. May 2001 B1
6246115 Tang et al. Jun 2001 B1
6281568 Glenn et al. Aug 2001 B1
6392309 Wataya et al. May 2002 B1
6429044 Tuttle Aug 2002 B1
6429512 Huang et al. Aug 2002 B1
6433420 Yang et al. Aug 2002 B1
20010034076 Martin Oct 2001 A1
Foreign Referenced Citations (4)
Number Date Country
61029158 Feb 1986 JP
63-128736 Jun 1988 JP
6326218 Nov 1994 JP
10214923 Aug 1998 JP
Non-Patent Literature Citations (1)
Entry
U.S. patent application Ser. No. 09/848,932, Hoffman et al., filed May 4, 2001.