Claims
- 1. A method for testing a printed circuit formed on a common master printed circuit board including a plurality of printed circuits on respective printed circuit regions, said method comprising the steps of:
- (a) providing a testing electromagnetic insulation upon said common master printed circuit board so as to cover a printed circuit thereon to be tested;
- (b) carrying out a testing upon said printed circuit that is provided with said testing electromagnetic insulation;
- (c) removing said testing electromagnetic insulation from said printed circuit after said step of testing;
- (d) providing a permanent electromagnetic insulation upon said printed circuit, the permanent electromagnetic insulation having a size substantially identical to the testing electromagnetic insulation; and
- (e) dividing said common master printed circuit board into a plurality of printed circuit boards each carrying a printed circuit thereon.
- 2. A method as claimed in claim 1, wherein the testing electromagnetic insulation is provided upon all of said printed circuits on said common master print circuit board.
- 3. A method as in claim 1, wherein the testing electromagnetic insulation is provided simultaneously on all printed circuits on the common master printed circuit board.
- 4. A method as in claim 1, wherein all printed circuits on the common master printed circuit board are tested simultaneously.
- 5. A method as in claim 1, further comprising the following steps conducted after step (c) and before step (d):
- (a1) providing the testing electromagnetic insulation on a printed circuit not yet tested;
- (b1) carrying out a testing on the printed circuit not yet tested; and
- (c1) removing the testing electromagnetic insulation provided in step (a1).
- 6. A method as in claim 5, wherein steps (a1), (b1) and (c1) are repeated until all printed circuits are tested.
- 7. A method as in claim 5, wherein steps (a1), (b1) and (c1) are repeated such that the printed circuits are tested one by one.
- 8. A method as in claim 1, wherein the printed circuits are separately tested.
Priority Claims (1)
Number |
Date |
Country |
Kind |
7-058574 |
Mar 1995 |
JPX |
|
Parent Case Info
This application is a division of application Ser. No. 08/545,256, filed Oct. 19, 1995, now U.S. Pat. No. 5,671,531.
US Referenced Citations (13)
Foreign Referenced Citations (8)
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0287111 A2 |
Oct 1988 |
EPX |
3925814 A1 |
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DEX |
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JPX |
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Divisions (1)
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Number |
Date |
Country |
Parent |
545256 |
Oct 1995 |
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