BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a plan view penetrating a sealing body and in which showing an example of the structure of the semiconductor device of Embodiment 1 of the present invention;
FIG. 2 is a cross-sectional view showing the structure of the semiconductor device shown in FIG. 1;
FIG. 3 is an enlarged partial sectional view showing the structure of the section A shown in FIG. 2;
FIG. 4 is an enlarged partial sectional view showing an example of the structure of the wiring substrate included in the semiconductor device shown in FIG. 1;
FIG. 5 is a plan view showing an example of the foldout direction of the fiber in the core material of the wiring substrate shown in FIG. 4;
FIG. 6 is an enlarged partial sectional view showing the structure of the wiring substrate of the modification included in the semiconductor device shown in FIG. 1;
FIG. 7 is a plan view showing an example of the foldout direction of the fiber in one core material of the wiring substrate shown in FIG. 6;
FIG. 8 is an enlarged partial sectional view showing the structure of the wiring substrate of other modifications included in the semiconductor device shown in FIG. 1;
FIG. 9 is a manufacture process-flow picture showing an example of the assembly to the resin molding in the assembly of the semiconductor device shown in FIG. 1;
FIG. 10 is a manufacture process-flow picture showing an example of the assembly after the resin molding in the assembly of the semiconductor device shown in FIG. 1;
FIG. 11 is a manufacture process-flow picture showing the modification of the assembly after the resin molding in the assembly of the semiconductor device shown in FIG. 1;
FIG. 12 is a plan view showing an example in the state where the traveling direction of the dicing blade at the time of the individual separation of the assembly shown in FIG. 10 and the foldout direction of a fiber accomplish an acute angle;
FIG. 13 is a plan view showing an example in the state where the traveling direction of the dicing blade at the time of the individual separation of the assembly shown in FIG. 10 and the foldout direction of a fiber accomplish a right angle or parallel;
FIG. 14 is an enlarged partial sectional view showing an example of the structure of the wiring substrate included in the semiconductor device of Embodiment 2 of the present invention;
FIG. 15 is an enlarged partial sectional view showing the structure of the wiring substrate of the modification included in the semiconductor device of Embodiment 2 of the present invention;
FIG. 16 is an enlarged partial sectional view showing the structure of the wiring substrate of other modifications included in the semiconductor device of Embodiment 2 of the present invention; and
FIGS. 17 and 18 are enlarged partial sectional views showing the structure of the wiring substrate of a comparative example.