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Spectrometry Spectrophotometry Monochromators Measuring colour
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G01J3/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Sub Industries
G01J3/02
Details
G01J3/0202
Mechanical elements; Supports for optical elements
G01J3/0205
Optical elements not provided otherwise
G01J3/0208
using focussing or collimating elements
G01J3/021
using plane or convex mirrors, parallel phase plates, or particular reflectors
G01J3/0213
using attenuators
G01J3/0216
using light concentrators or collectors or condensers
G01J3/0218
using optical fibers
G01J3/0221
the fibers defining an entry slit
G01J3/0224
using polarising or depolarising elements
G01J3/0227
using notch filters
G01J3/0229
using masks, aperture plates, spatial light modulators or spatial filters
G01J3/0232
using shutters
G01J3/0235
using means for replacing an element by another, for replacing a filter or a grating
G01J3/0237
Adjustable
G01J3/024
using means for illuminating a slit efficiently (
G01J3/0243
having a through-hole enabling the optical element to fulfil an additional optical function
G01J3/0245
using an optical amplifier of light
G01J3/0248
using a sighting port
G01J3/0251
Colorimeters making use of an integrating sphere
G01J3/0254
Spectrometers, other than colorimeters, making use of an integrating sphere
G01J3/0256
Compact construction
G01J3/0259
Monolithic
G01J3/0262
Constructional arrangements for removing stray light
G01J3/0264
Electrical interface; User interface
G01J3/0267
Sample holders for colorimetry
G01J3/027
Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
G01J3/0272
Handheld
G01J3/0275
making use of sensor-related data
G01J3/0278
Control or determination of height or angle information for sensors or receivers
G01J3/0283
using a charging unit
G01J3/0286
Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer
G01J3/0289
Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
G01J3/0291
Housings; Spectrometer accessories; Spatial arrangement of elements
G01J3/0294
Multi-channel spectroscopy
G01J3/0297
Constructional arrangements for removing other types of optical noise or for performing calibration
G01J3/04
Slit arrangements slit adjustment
G01J3/06
Scanning arrangements arrangements for order-selection
G01J3/08
Beam switching arrangements
G01J3/10
Arrangements of light sources specially adapted for spectrometry or colorimetry
G01J3/108
for measurement in the infra-red range
G01J3/12
Generating the spectrum Monochromators
G01J3/1256
using acousto-optic tunable filter
G01J3/14
using refracting elements
G01J3/16
with autocollimation
G01J3/18
using diffraction elements
G01J3/1804
Plane gratings
G01J3/1809
Echelle gratings
G01J3/1833
Grazing incidence
G01J3/1838
Holographic gratings
G01J3/189
using at least one grating in an off-plane configuration
G01J3/1895
using fiber Bragg gratings or gratings integrated in a waveguide
G01J3/20
Rowland circle spectrometers
G01J3/22
Littrow mirror spectrometers
G01J3/24
using gratings profiled to favour a specific order
G01J3/26
using multiple reflection
G01J3/28
Investigating the spectrum
G01J3/2803
using photoelectric array detector
G01J3/2823
Imaging spectrometer
G01J3/2846
using modulation grid; Grid spectrometers
G01J3/2889
Rapid scan spectrometers; Time resolved spectrometry
G01J3/30
Measuring the intensity of spectral line directly on the spectrum itself
G01J3/32
Investigating bands of a spectrum in sequence by a single detector
G01J3/36
Investigating two or more bands of a spectrum by separate detectors
G01J3/40
Measuring the intensity of spectral lines by determining density of a photograph of the spectrum Spectrography
G01J3/42
Absorption spectrometry Double beam spectrometry Flicker spectrometry Reflection spectrometry
G01J3/427
Dual wavelengths spectrometry
G01J3/433
Modulation spectrometry Derivative spectrometry
G01J3/4338
Frequency modulated spectrometry
G01J3/44
Raman spectrometry Scattering spectrometry; Fluorescence spectrometry
G01J3/4406
Fluorescence spectrometry
G01J3/4412
Scattering spectrometry
G01J3/443
Emission spectrometry
G01J3/447
Polarisation spectrometry
G01J3/45
Interferometric spectrometry
G01J3/453
by correlation of the amplitudes
G01J3/4531
Devices without moving parts
G01J3/4532
Devices of compact or symmetric construction
G01J3/4535
Devices with moving mirror
G01J3/4537
Devices with refractive scan
G01J3/457
Correlation spectrometry
G01J3/46
Measurement of colour Colour measuring devices
G01J3/461
with colour spinners
G01J3/462
Computing operations in or between colour spaces; Colour management systems
G01J3/463
Colour matching
G01J3/465
taking into account the colour perception of the eye; using tristimulus detection
G01J3/50
using electric radiation detectors
G01J3/501
Colorimeters using spectrally-selective light sources
G01J3/502
using a dispersive element
G01J3/504
Goniometric colour measurements, for example measurements of metallic or flake based paints
G01J3/505
measuring the colour produced by lighting fixtures other than screens, monitors, displays or CRTs
G01J3/506
measuring the colour produced by screens, monitors, displays or CRTs
G01J3/508
measuring the colour of teeth
G01J3/51
using colour filters
G01J3/513
having fixed filter-detector pairs
G01J3/52
using colour charts
G01J3/522
circular colour charts
G01J3/524
Calibration of colorimeters
G01J3/526
for choosing a combination of different colours
G01J3/528
using colour harmony theory
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method for detecting a spectrum, and spectroscopy assembly
Patent number
12,078,593
Issue date
Sep 3, 2024
AMS-OSRAM INTERNATIONAL GMBH
Gerd Plechinger
G01 - MEASURING TESTING
Information
Patent Grant
Low open area and coupon endpoint detection
Patent number
12,080,574
Issue date
Sep 3, 2024
Applied Materials, Inc.
Varoujan Chakarian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical sensor having common light sensing circuit for synchronousl...
Patent number
12,078,540
Issue date
Sep 3, 2024
Anpec Electronics Corporation
Jia-Hua Hong
G01 - MEASURING TESTING
Information
Patent Grant
Optical device with a folded optical path
Patent number
12,078,541
Issue date
Sep 3, 2024
Viavi Solutions Inc.
William D. Houck
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor circuit
Patent number
12,078,542
Issue date
Sep 3, 2024
Au Optronics Corporation
Chih-Lung Lin
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for determining a degree of damage of hair, and m...
Patent number
12,076,157
Issue date
Sep 3, 2024
Henkel AG & Co. KGaA
Georg Knuebel
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Infrared spectrometer
Patent number
12,078,536
Issue date
Sep 3, 2024
United Kingdom Research and Innovation
Damien Weidmann
G01 - MEASURING TESTING
Information
Patent Grant
Single photon counting flow cytometer
Patent number
12,078,539
Issue date
Sep 3, 2024
MIFTEK CORPORATION
Masanobu Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Color chart provided with patch and marker for recognizing patch
Patent number
12,078,543
Issue date
Sep 3, 2024
DIC Corporation
Masato Takahashi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for finding the peak wavelength of the spectrum s...
Patent number
12,078,537
Issue date
Sep 3, 2024
Nicoya Lifesciences Inc.
Udayan Kanade
G01 - MEASURING TESTING
Information
Patent Grant
Detection of light source distortion in an imaging system
Patent number
12,078,538
Issue date
Sep 3, 2024
Spectricity
Jonathan Borremans
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral quantitative imaging cytometry system
Patent number
12,078,585
Issue date
Sep 3, 2024
Cytognos, S.L.
José Mário Tenera Morgado
G01 - MEASURING TESTING
Information
Patent Grant
Light detecting device, light detecting system, and filter array
Patent number
12,074,184
Issue date
Aug 27, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Atsushi Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Filter assembly, detector, and method of manufacture of a filter as...
Patent number
12,072,235
Issue date
Aug 27, 2024
ams AG
Gerhard Eilmsteiner
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength reference device
Patent number
12,072,240
Issue date
Aug 27, 2024
II-VI DELAWARE, INC.
Michael John Laurence Cahill
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Spatial light modulator spectroscopy
Patent number
12,072,241
Issue date
Aug 27, 2024
Texas Instruments Incorporated
Philip Scott King
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for element analysis of materials by means of...
Patent number
12,072,291
Issue date
Aug 27, 2024
Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
Volker Sturm
G01 - MEASURING TESTING
Information
Patent Grant
Scan-less confocal microscope with high resolution related applicat...
Patent number
12,072,480
Issue date
Aug 27, 2024
Arizona Board of Regents on behalf of the University of Arizona
Dongkyun Kang
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral sensing system and processing methods for hyperspectr...
Patent number
12,072,242
Issue date
Aug 27, 2024
Flying Gybe Inc.
Nicholas Tufillaro
G01 - MEASURING TESTING
Information
Patent Grant
Optical device
Patent number
12,072,516
Issue date
Aug 27, 2024
Viavi Solutions Inc.
Valton Smith
G01 - MEASURING TESTING
Information
Patent Grant
Multispectral ranging and imaging systems
Patent number
12,072,237
Issue date
Aug 27, 2024
Ouster, Inc.
Angus Pacala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus, systems and methods for detecting light
Patent number
12,072,188
Issue date
Aug 27, 2024
PANTECH CORPORATION
Xin Yuan
G01 - MEASURING TESTING
Information
Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
Patent number
12,066,328
Issue date
Aug 20, 2024
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Grant
Liquid sample introduction system and method, for analytical plasma...
Patent number
12,068,145
Issue date
Aug 20, 2024
Thermo Fisher Scientific (Bremen) GmbH
Ayrat Murtazin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for emitting and controlling infrared light and gas sensor u...
Patent number
12,066,377
Issue date
Aug 20, 2024
Elichens
Ayrat Galisultanov
G01 - MEASURING TESTING
Information
Patent Grant
Ghost imaging second harmonic generation microscopy
Patent number
12,066,617
Issue date
Aug 20, 2024
UChicago Argonne, LLC
Gary P. Wiederrecht
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method, apparatus and device for automatically making up portrait l...
Patent number
12,067,658
Issue date
Aug 20, 2024
MIGU VIDEO CO., LTD
Xiao Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatuses for calibrating a sensor
Patent number
12,066,327
Issue date
Aug 20, 2024
Rockley Photonics Limited
Casimir Wierzynski
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
12,066,326
Issue date
Aug 20, 2024
Hamamatsu Photonics K.K.
Takafumi Yokino
G01 - MEASURING TESTING
Information
Patent Grant
Sensor array spectrometer
Patent number
12,066,329
Issue date
Aug 20, 2024
3M Innovative Properties Company
John A. Wheatley
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
Publication number
20240295436
Publication date
Sep 5, 2024
NOVA LTD
Gilad BARAK
G01 - MEASURING TESTING
Information
Patent Application
Optical Wavelength Measurement Apparatus and Method, Optical Wavele...
Publication number
20240295437
Publication date
Sep 5, 2024
Huawei Technologies Co., Ltd
Lei Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR COLOR CORRECTING A DIGITAL PRINTER
Publication number
20240297950
Publication date
Sep 5, 2024
Akzenta Paneele + profile GmbH
Markus KLEMM
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
HYPERSPECTRAL IMAGER METHOD AND APPARATUS
Publication number
20240295438
Publication date
Sep 5, 2024
TECHNOLOGICAL RESOURCES PTY. LIMITED
Richard J. Murphy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGING SYSTEM AND IMAGING METHOD
Publication number
20240296569
Publication date
Sep 5, 2024
Panasonic Intellectual Property Management Co., Ltd.
YUMIKO KATO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE CLAMP FOR A SPECTROSCOPIC INSTRUMENT
Publication number
20240288305
Publication date
Aug 29, 2024
Thermo Scientific Portable Analytical Instruments Inc.
Sue WOODS
G01 - MEASURING TESTING
Information
Patent Application
TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM
Publication number
20240288309
Publication date
Aug 29, 2024
Purdue Research Foundation
Xueji Wang
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE, MEASURING METHOD, AND VACUUM PROCESSING APPARATUS
Publication number
20240290591
Publication date
Aug 29, 2024
TOKYO ELECTRON LIMITED
Atsushi SAWACHI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS TO ACQUIRE THREE DIMENSIONAL IMAGES USING SPECT...
Publication number
20240288307
Publication date
Aug 29, 2024
Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
Uriel LEVY
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL DATA AND IMAGE ANALYSIS USING MACHINE LEARNING
Publication number
20240288308
Publication date
Aug 29, 2024
MLVX Technologies Inc.
Migel Dileepa TISSERA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL SYSTEM FOR REFERENCE SWITCHING
Publication number
20240288306
Publication date
Aug 29, 2024
Apple Inc.
Mark Alan ARBORE
G01 - MEASURING TESTING
Information
Patent Application
STYLUS
Publication number
20240288956
Publication date
Aug 29, 2024
Sony Semiconductor Solutions Corporation
RYOJI EKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Multi-gas Detection System and Method
Publication number
20240280494
Publication date
Aug 22, 2024
Edwin Thomas Carlen
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ASSEMBLY WITH AN OPTICAL ELEMENT TO SUPPRESS A PARASITIC ET...
Publication number
20240280756
Publication date
Aug 22, 2024
Lumentum Technology UK Limited
Colin SMITH
G02 - OPTICS
Information
Patent Application
SYSTEMS AND METHODS FOR FORMULATION INFORMATION GENERATION
Publication number
20240282215
Publication date
Aug 22, 2024
AXALTA COATING SYSTEMS IP CO., LLC
Oscar Trujillo
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
HYPERSPECTRAL IMAGE SENSOR AND SYSTEM EMPLOYING THE SAME
Publication number
20240280406
Publication date
Aug 22, 2024
Korea Advanced Institute of Science and Technology
Mooseok JANG
G01 - MEASURING TESTING
Information
Patent Application
Multi-Application Optical Sensing Apparatus and Method Thereof
Publication number
20240280407
Publication date
Aug 22, 2024
Artilux, Inc.
Chih-Wei Yeh
G01 - MEASURING TESTING
Information
Patent Application
Combine Harvesters For Use In Harvesting Corn, And Related Methods
Publication number
20240276915
Publication date
Aug 22, 2024
MONSANTO TECHNOLOGY LLC
Jarrett Ryan CEGLINSKI
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
COLOR MEASUREMENT APPARATUS
Publication number
20240272003
Publication date
Aug 15, 2024
SEIKO EPSON CORPORATION
Toshio MIYAKE
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMS
Publication number
20240268680
Publication date
Aug 15, 2024
Mohammed N. ISLAM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Handheld Gas and Vapor Analyzer
Publication number
20240271994
Publication date
Aug 15, 2024
CAM2 TECHNOLOGIES, LLC
Gregg Ressler
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC DETECTION USING A TUNABLE FREQUENCY COMB
Publication number
20240275128
Publication date
Aug 15, 2024
PILOT PHOTONICS LIMITED
Jules BRADDELL
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
Publication number
20240271999
Publication date
Aug 15, 2024
Tsubasa SAITO
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH-RESOLVED PHOTONIC LANTERN WAVEFRONT SENSOR
Publication number
20240272000
Publication date
Aug 15, 2024
University of Central Florida Research Foundation, Inc.
Stephen Eikenberry
G01 - MEASURING TESTING
Information
Patent Application
Fluorescence Imaging Probe and Handheld Imaging Prober
Publication number
20240272001
Publication date
Aug 15, 2024
NANJING NUOYUAN MEDICAL DEVICES CO., LTD
Huiming CAI
G01 - MEASURING TESTING
Information
Patent Application
MULTI-VIEW LUMINANCE MEASURING DEVICE AND METHOD FOR MEASURING MULT...
Publication number
20240272002
Publication date
Aug 15, 2024
SAMSUNG DISPLAY CO., LTD.
Young Min PARK
G01 - MEASURING TESTING
Information
Patent Application
CAMERA SYSTEM
Publication number
20240263998
Publication date
Aug 8, 2024
Sony Semiconductor Solutions Corporation
MASAHIKO NAKAMIZO
G01 - MEASURING TESTING
Information
Patent Application
Serpentine Integrated Grating and Associated Devices
Publication number
20240264460
Publication date
Aug 8, 2024
The Regents of the University of Colorado, a Body Corporate
Kelvin Wagner
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR USING AN IMAGE SENSOR HAVING IMAGE PIXELS AND...
Publication number
20240263997
Publication date
Aug 8, 2024
OMNIVISION TECHNOLOGIES, INC.
Paul Wickboldt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, APPARATUS AND DEVICE FOR AUTOMATICALLY MAKING UP PORTRAIT L...
Publication number
20240265599
Publication date
Aug 8, 2024
Migu Co., Ltd
Xiao MA
G06 - COMPUTING CALCULATING COUNTING