Integrated circuit package having a plurality of spaced apart pad portions

Information

  • Patent Grant
  • 8330270
  • Patent Number
    8,330,270
  • Date Filed
    Thursday, December 9, 2004
    19 years ago
  • Date Issued
    Tuesday, December 11, 2012
    11 years ago
Abstract
An integrated circuit package having a selectively etched leadframe strip defining a die attach pad and a plurality of contact pads, at least one side of the die attach pad having a plurality of spaced apart pad portions; a semiconductor die mounted to the die attach pad and wires bonding the semiconductor die to respective ones of the contact pads; a first surface of the leadframe strip, including the semiconductor die and wire bonds, encapsulated in a molding material such that at least one surface of the leadframe strip is exposed, and wherein solder paste is disposed on said contact pads and said at least one side of said die attach pad.
Description
FIELD OF THE INVENTION

The present invention relates in general to integrated circuit packaging, and more particularly to an integrated circuit package with unique die attach pad features.


BACKGROUND OF THE INVENTION

According to well known prior art IC (integrated circuit) packaging methodologies, semiconductor dice are singulated and mounted using epoxy or other conventional means onto respective die pads (attach paddles) of a leadframe strip. Traditional QFP (Quad Flat Pack) packages incorporate inner leads which function as lands for wire bonding the semiconductor die bond pads. These inner leads typically require mold locking features to ensure proper positioning of the leadframe strip during subsequent molding to encapsulate the package. The inner leads terminate in outer leads that are bent down to contact a mother board, thereby limiting the packaging density of such prior art devices.


In order to overcome these and other disadvantages of the prior art, the Applicants previously developed a Leadless Plastic Chip Carrier (LPCC). According to Applicants' LPCC methodology, a leadframe strip is provided for supporting up to several hundred devices. Singulated IC dice are placed on the strip die attach pads using conventional die mount and epoxy techniques. After curing of the epoxy, the dice are gold wire bonded to peripheral internal leads. The leadframe strip is then molded in plastic or resin using a modified mold wherein the bottom cavity is a flat plate. In the resulting molded package, the die pad and leadframe inner leads are exposed. By exposing the bottom of the die attach pad, mold delamination at the bottom of the die attach pad (paddle) is eliminated, thereby increasing the moisture sensitivity performance. Also, thermal performance of the IC package is improved by providing a direct thermal path from the exposed die attach pad to the motherboard. By exposing the leadframe inner leads, the requirement for mold locking features of outer leads is eliminated and no outer leads are necessary, thereby increasing device density and reducing package thickness over prior art methodologies. The exposed inner leadframe leads function as solder pads for motherboard assembly such that less gold wire bonding is required as compared to prior art methodologies, thereby improving electrical performance in terms of board level parasitics and enhancing package design flexibility over prior art packages (i.e. custom trim tools and form tools are not required). These and several other advantages of Applicants' own prior art LPCC process are discussed in Applicants' U.S. Pat. No. 6,229,200, issued May 8, 2001, the contents of which are incorporated herein by reference.


In use, the exposed die attach pad and contact pads of Applicant's previously developed LPCC are soldered to the motherboard. To facilitate soldering of the exposed die attach pad and the contact pads, solder paste is printed on the exposed surface of the die attach pad and on the contact pads. The solder paste is reflowed during connection of the package to the motherboard to thereby form a solder joint between the package and the motherboard. During reflow, surface tension of the solder paste on the large die attach pad causes reduced area of coverage of solder paste on the die attach pad and increased height of the solder paste between the die pad and the motherboard. This results in lifting of the package, weakening of the solder attachment between the die attach pad and the motherboard and in extreme cases, causes opening of the input/outputs or disconnection of the contact pads from the motherboard due to increased gap height between the package and the motherboard. Reflowing of solder printed on the surface of the die attach pad and the contact pads results in a solder bump height difference between the solder bump on the large die attach pad and the solder bumps on the smaller contact pads due to surface tension of the solder. Clearly this height difference is undesirable.


Further IC package improvements are desirable and are driven by industry demands for increased reliability, improved thermal and electrical performance and decreased size and cost of manufacture.


SUMMARY OF THE INVENTION

According to one aspect of the present invention, there is provided a process for fabricating an integrated circuit package including selectively etching a leadframe strip to define a die attach pad and a plurality of contact pads. At least one side of the die attach pad has a plurality of spaced apart pad portions. A semiconductor die is mounted to the die attach pad and wires are bonded from the semiconductor die to respective ones of the contact pads. A first surface of the leadframe strip, including the semiconductor die and wire bonds, is encapsulated in a molding material such that at least one surface of the leadframe strip is exposed. The integrated circuit package is singulated from a remainder of the leadframe strip.


According to another aspect of the present invention, there is provided an integrated circuit package including a die attach pad. At least one side of the die attach pad has a plurality of spaced apart pad portions. The integrated circuit package also includes a plurality of contact pads circumscribing the die attach pad, a semiconductor die mounted to the die attach pad and a plurality of wire bonds connecting the semiconductor die to ones of the contact pads. A molding material encapsulates the semiconductor die, the wire bonds and at least a surface of each of the die attach pad and the contact pads, such that at least one surface of each of the contact pads and the die attach pad is exposed.


According to still another aspect of the present invention, there is provided a leadframe strip including a plurality of units, each of the units including a die attach pad, at least one side of the die attach pad having a plurality of spaced apart pad portions, and a plurality of contact pads circumscribing the die attach pad.


Advantageously, the side of the die attach pad that includes the plurality of spaced apart pad portions is in the form of an array that is exposed after encapsulation. This provides a number of small surfaces for attachment of the die attach pad to the motherboard. Thus, a number of spaced apart pad portions provide surfaces for solder attachment to the motherboard. Due to the small size of the spaced apart portions, and due to the discontinuity of the exposed side of the die attach pad, lifting of the package during solder reflow on the printed circuit board is reduced. Also, an array of pad portions is provided that improves self-alignment of the package during solder reflow on the printed circuit board. The individual pad portions are oriented to improve filling during molding and thereby inhibit the entrapment of air during molding.





BRIEF DESCRIPTION OF THE DRAWINGS

The present invention will be better understood with reference to the drawings and to the following description, in which:



FIGS. 1A to 1J are sectional side views showing processing steps for fabricating integrated circuit packages according to one embodiment of the present invention;



FIGS. 2A and 2B are bottom views of a single unit of a leadframe strip, showing processing steps for fabricating the integrated circuit package that correspond with FIGS. 1D, and 1H, respectively;



FIGS. 3A and 3B show bottom views of a single integrated circuit package according to alternative embodiments of the present invention; and



FIG. 4 shows a bottom view of a single integrated circuit package according to another embodiment of the present invention.





DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Referring to the figures, a process for fabricating an integrated circuit package is described. The resulting integrated circuit package is indicated generally by the numeral 20. At least one side of the die attach pad 22 has a number of spaced apart pad portions 36. The integrated circuit package 20 also includes a plurality of contact pads 24 circumscribing the die attach pad 22, a semiconductor die 26 mounted to the die attach pad 22 and a plurality of wire bonds 28 connecting the semiconductor die 26 to ones of the contact pads 24. A molding material 30 encapsulates the semiconductor die 26, the wire bonds 28 and at least a surface of each of the die attach pad 22 and the contact pads 24, such that at least one surface of each of the contact pads 24 and the die attach pad 22 is exposed.


The process for fabricating the integrated circuit package 20 will now be described with particular reference to FIGS. 1A to 1J. For ease of illustration, the Figures show the fabrication of a single integrated circuit package 20. It will be understood, however, that the integrated circuit package 20 is gang fabricated and then singulated by sawing or punching.


With reference to FIG. 1A, there is shown a sectional side view of a copper (Cu) panel substrate which forms the raw material of the leadframe strip 32. As described below, the copper panel substrate is subjected to a selective wet etch process. As discussed in detail in Applicant's U.S. Pat. No. 6,229,200, the contents of which are incorporated herein by reference, the resulting leadframe strip 32 is divided into a plurality of sections, each of which incorporates a plurality of leadframe units in an array (e.g., 3×3 array, 5×5 array, etc.). Only one such unit is depicted in the Figures. Adjacent units being indicated by stippled lines. It will be appreciated that the adjacent units of the leadframe strip 32 are similar to the unit depicted and described herein. Reference is made to a single unit throughout the following description for the purpose of simplicity. As indicated above, the process described is carried out in the fabrication of several units in the array.


Referring to FIG. 1B, the raw material of the leadframe strip 32 is coated with a layer of photo-imageable solder mask such as a photo-imageable epoxy by spin coating the solder mask.


Nest, the layer of photo-imageable etch-resist mask is imaged with a photo-tool. This is accomplished by exposure of the photo-imageable mask to ultraviolet light masked by the photo-tool and subsequent developing of the solder-mask to result in the configuration shown in FIG. 1C. The photo-imageable mask is thereby patterned to provide pits in which the upper and lower surfaces of the leadframe strip 32 are exposed. Thus, the leadframe strip 32 is selectively masked with the photo-imageable mask.


The leadframe strip 32 is then etched by, for example, immersion or pressurized spray etching and the photo-imageable mask is stripped away using conventional means (FIG. 1D). The resulting leadframe strip 32 includes a plurality of units, one of which is shown in the Figures. Each unit includes the generally centrally located die attach pad 22. The die attach pad 22 includes a continuous portion 34 on one side of the die attach pad 22 and the plurality of pad portions 36 that extend from the continuous portion 34, to the opposite side of the die attach pad 22. Each unit also includes the plurality of contact pads 24 that circumscribe the die attach pad 22.


As best shown in FIGS. 1D and 2A, the pad portions 36 each have generally square cross-sections in the form of a regular array. The pad portions 36 are oriented such that the sides of the pad portions 36 are not parallel with the sides of the continuous portion 34 of the die attach pad 22. Thus, the sides of the pad portions 36 form an oblique angle with the sides of the continuous portion 34 o the die attach pad 22 (and the molding material that is further described below). In the present embodiment, the sides of the pad portions 36 generally form an angle of about forty-five degrees with the sides of the continuous portion 34 of the die attach pad 22. Thus, the array forms a diamond pattern with pad portions 36 oriented with corners of the pad portions 36 in the direction of the molding material flow (when molding). This aids in molding material flow under the continuous portion 34 of the die attach pad 22 and results in improved filling.


The leadframe strip 32 is then plated with, for example, silver (Ag) or nickel (Ni) and palladium (Pd) to facilitate wire bonding (FIG. 1E).


A singulated semiconductor die 26 is then mounted to the continuous portion 34 of the die attach pad 22 using, for example, epoxy (FIG. 1F). Gold wire bonds 28 are then bonded between bond pads of the semiconductor die 26 and the contact pads 24 (FIG. 1G).


The leadframe strip 32 is then molded using a suitable mold, with the bottom cavity being a flat plate, followed by subsequent curing, as discussed in Applicant's U.S. Pat. No. 6,229,200, issued May 8, 2001 (FIGS. 1H and 2B). As indicated above, the pad portions 36 are oriented with corners of the pad portions 36 pointing in the direction of the molding material flow during molding to aid in the flow of molding material 30 around the pad portions 36 under the continuous portion 34 of the die attach pad 22. Clearly, the sides of the pad portions 36 are oriented at an oblique angle with the sides of the molding material 30 after molding.


The molding material 30 encapsulates the semiconductor die 26, the wire bonds 28, and all except one surface of the leadframe strip 32. In the orientation shown in FIG. 1H, a bottom surface of each of the contact pads 24 and a bottom surface of each of the pad portions 36 of the die attach pad 22 is exposed. FIG. 2B shows a bottom view of the integrated circuit package of FIG. 1H and best shows the exposed surfaces of the contact pads 24 and the pad portions 36.


Next, solder paste is applied to the contact pads 24 and to the pad portions 36 by screen printing, as will be understood by those skilled in the art. After solder paste printing, the solder is reflowed using known reflow technique (FIG. 1I).


Singulation of the individual integrated circuit package 20 follows removal of the leadframe strip 32 from the mold, resulting in the integrated circuit package 20 as shown in FIG. 1J. Singulation is performed by, for example, saw singulation.


It will be appreciated that although a particular embodiment of the invention has been described and illustrated, various changes and modifications may occur to those skilled in the art. For example, rather than saw singulation, singulation may be performed by punching. Also, rather than the arrangement of the pad portions 36, shown in FIG. 2B, other arrangements are possible without departing from the scope of the present invention. Exemplary alternative arrangements are shown in FIGS. 3A and 3B.


Reference is made to FIG. 4, which shows a bottom view of a single integrated circuit package according to another embodiment of the present invention. In this embodiment of the present invention, the pad portions 36 have generally circular cross-sections and are spaced in a regular array. Thus, the pad portions are rounded, thereby aiding in molding material flow under the continuous portion 34 of the die attach pad 22, resulting in improved filling. The remainder of the features of the integrated circuit package 20 according to the present embodiment and the process for fabricating the integrated circuit package 20 are similar to the features and process for the first-described embodiment, and therefore are not further described.


Still other variations and modifications may occur to those skilled in the art. All such changes and modifications may be made without departing from the sphere and scope of the present invention.

Claims
  • 1. An integrated circuit package comprising: a die attach pad, continuous on one side of said die attach pad and having a plurality of spaced apart pad portions on a second side of the die attach pad opposite said first side;a plurality of contact pads circumscribing said die attach pad;a semiconductor die mounted to said die attach pad on said continuous one side;a plurality of wire bonds connecting said semiconductor die to ones of said contact pads;a molding material encapsulating said semiconductor die, said wire bonds and at least a surface of each of said die attach pad and said contact pads, such that at least one surface of each of said contact pads and said die attach pad is exposed; andsolder paste disposed on said contact pads and said at least one side of said die attach pad.
  • 2. The integrated circuit package according to claim 1, wherein said pad portions form an array.
  • 3. The integrated circuit package according to claim 1 wherein ones of said pad portions have a generally square cross-section.
  • 4. An integrated circuit package comprising: a die attach pad, continuous on one side of said die attach pad and having a plurality of spaced apart pad portions on a second side of the die attach pad opposite said first side;a plurality of contact pads circumscribing said die attach pad;a semiconductor die mounted to said die attach pad on said continuous one side;a plurality of wire bonds connecting said semiconductor die to ones of said contact pads;a molding material encapsulating said semiconductor die, said wire bonds and at least a surface of each of said die attach pad and said contact pads, such that at least one surface of each of said contact pads and said die attach pad is exposed; andsolder paste disposed on said contact pads and said at least one side of said die attach pad,wherein ones of said pad portions have a generally circular cross-section.
  • 5. An integrated circuit package comprising: a die attach pad, continuous on one side of said die attach pad and having a plurality of spaced apart pad portions on a second side of the die attach pad opposite said first side;a plurality of contact pads circumscribing said die attach pad;a semiconductor die mounted to said die attach pad on said continuous one side;a plurality of wire bonds connecting said semiconductor die to ones of said contact pads;a molding material encapsulating said semiconductor die, said wire bonds and at least a surface of each of said die attach pad and said contact pads, such that at least one surface of each of said contact pads and said die attach pad is exposed; andsolder paste disposed on said contact pads and said at least one side of said die attach pad,wherein said pad portions form a diamond pattern such that sides of said pad portions form an oblique angle with sides of said molding material.
  • 6. The integrated circuit package according to claim 1, wherein said pad portions form an array of similarly sized pad portions.
  • 7. A leadframe strip comprising a plurality of units, each of said units comprising: a die attach pad, continuous on one side of said die attach pad, said continuous one side configured to have a semiconductor die mounted thereon, and having a plurality of spaced apart pad portions on a second side of the die attach pad opposite said first side; anda plurality of contact pads circumscribing said die attach pad; andsolder paste disposed on said contact pads and said at least one side of said die attach pad.
  • 8. The leadframe strip according to claim 7, wherein ones of said pad portions have a generally square cross-section.
  • 9. The leadframe strip according to claim 7, wherein ones of said pad portions have a generally circular cross-section.
  • 10. The leadframe strip according to claim 9, wherein said pad portions form a diamond pattern such that side of ones of said pad portions form an oblique angle with sides of said die attach pad at said die attach pad's said continuous one side.
  • 11. The leadframe strip according to claim 10, wherein said pad portions form an array of similarly sized pad portions.
  • 12. The leadframe strip according to claim 7, wherein ones of said plurality of pad portions have a generally square cross-section.
  • 13. The leadframe strip according to claim 7, wherein ones of said plurality of pad portions have a generally circular cross-section.
  • 14. The leadframe according to claim 12, wherein said pad portions are in a diamond pattern such that sides of said pad portions are at an oblique angle with sides of said die attach pad at said die attach pad's said continuous one side.
  • 15. The integrated circuit package according to claim 1, wherein said pad portions form an array.
RELATED APPLICATIONS

This application is a continuation-in-part of U.S. patent application Ser. No. 10/318,262, filed Dec. 13, 2002, now U.S. Pat. No. 6,872,661, which is a divisional application of U.S. application Ser. No. 09/802,679, filed Mar. 9, 2001, now U.S. Pat. No. 6,635,957, which is a continuation-in-part of U.S. application Ser. No. 09/288,352, filed Apr. 8, 1999, now U.S. Pat. No. 6,498,099 which is a continuation-in-part of U.S. application Ser. No. 09/095,803, filed Jun. 10, 1998, now U.S. Pat. No. 6,229,200.

US Referenced Citations (114)
Number Name Date Kind
4530152 Roche et al. Jul 1985 A
4685998 Quinn et al. Aug 1987 A
4812896 Rothgery et al. Mar 1989 A
5066831 Spielberger et al. Nov 1991 A
5157480 MsShane et al. Oct 1992 A
5200362 Lin et al. Apr 1993 A
5200809 Kwon Apr 1993 A
5214845 King et al. Jun 1993 A
5216278 Lin et al. Jun 1993 A
5221642 Burns Jun 1993 A
5273938 Lin et al. Dec 1993 A
5277972 Sakumoto et al. Jan 1994 A
5279029 Burns Jan 1994 A
5293072 Tsuji et al. Mar 1994 A
5332864 Liang et al. Jul 1994 A
5343076 Katayama et al. Aug 1994 A
5406124 Morita et al. Apr 1995 A
5424576 Djennas et al. Jun 1995 A
5430331 Hamzehdoost et al. Jul 1995 A
5444301 Song et al. Aug 1995 A
5457340 Templeton, Jr. et al. Oct 1995 A
5474958 Djennas et al. Dec 1995 A
5483099 Natarajan et al. Jan 1996 A
5521432 Tsuji et al. May 1996 A
5596231 Combs Jan 1997 A
5604376 Hamburgen et al. Feb 1997 A
5608267 Mahulikar et al. Mar 1997 A
5639990 Nishihara et al. Jun 1997 A
5640047 Nakashima Jun 1997 A
5641997 Ohta et al. Jun 1997 A
5646831 Manteghi Jul 1997 A
5650663 Parthasarathi Jul 1997 A
5656550 Tsuji et al. Aug 1997 A
5683806 Sakumoto et al. Nov 1997 A
5696666 Miles et al. Dec 1997 A
5701034 Marrs Dec 1997 A
5710064 Song et al. Jan 1998 A
5710695 Manteghi Jan 1998 A
5726502 Beddingfield Mar 1998 A
5777382 Abbott et al. Jul 1998 A
5847455 Manteghi Dec 1998 A
5847458 Nakamura et al. Dec 1998 A
5894108 Mostafazadeh et al. Apr 1999 A
5900676 Kweon et al. May 1999 A
5969426 Baba et al. Oct 1999 A
5976912 Fukutomi et al. Nov 1999 A
6001671 Fjelstad Dec 1999 A
6025640 Yagi et al. Feb 2000 A
6057601 Lau et al. May 2000 A
6081029 Yamaguchi Jun 2000 A
6093584 Fjelstad Jul 2000 A
6124637 Freyman et al. Sep 2000 A
6153503 Lin et al. Nov 2000 A
6194786 Orcutt Feb 2001 B1
6197615 Song et al. Mar 2001 B1
6204553 Liu et al. Mar 2001 B1
6208020 Minamio et al. Mar 2001 B1
6229200 McLellan et al. May 2001 B1
6238952 Lin May 2001 B1
6294100 Fan et al. Sep 2001 B1
6294830 Fjelstad Sep 2001 B1
6306685 Liu et al. Oct 2001 B1
6372539 Bayan et al. Apr 2002 B1
6459163 Bai Oct 2002 B1
6476469 Hung et al. Nov 2002 B2
6489557 Eskildsen et al. Dec 2002 B2
6498099 McLellan et al. Dec 2002 B1
6528877 Ernst et al. Mar 2003 B2
6528893 Jung et al. Mar 2003 B2
6545347 McClellan Apr 2003 B2
6583499 Huang et al. Jun 2003 B2
6585905 Fan et al. Jul 2003 B1
6586677 Glenn Jul 2003 B2
6635957 Kwan et al. Oct 2003 B2
6762118 Liu et al. Jul 2004 B2
6777788 Wan et al. Aug 2004 B1
6812552 Islam et al. Nov 2004 B2
6821821 Fjelstad Nov 2004 B2
6861734 Minamio et al. Mar 2005 B2
6872661 Kwan et al. Mar 2005 B1
6879034 Yang et al. Apr 2005 B1
6907658 Li Jun 2005 B2
6909168 Minamio et al. Jun 2005 B2
6930377 Bayan Aug 2005 B1
6933594 McLellen et al. Aug 2005 B2
6964918 Fan et al. Nov 2005 B1
6989294 McLellen et al. Jan 2006 B1
7033517 Fan et al. Apr 2006 B1
7042068 Ahn et al. May 2006 B2
7042071 Minamio et al. May 2006 B2
7053492 Takahashi et al. May 2006 B2
7087986 Bayan et al. Aug 2006 B1
7149088 Lin et al. Dec 2006 B2
7169651 Park et al. Jan 2007 B2
7335532 Noquil et al. Feb 2008 B2
7378299 Koh et al. May 2008 B2
7397129 Lee Jul 2008 B2
7405106 Maloney et al. Jul 2008 B2
7410834 Fukaya et al. Aug 2008 B2
20010009301 Azuma Jul 2001 A1
20020031869 Minamio et al. Mar 2002 A1
20020084518 Hasebe et al. Jul 2002 A1
20020133943 Sakamoto et al. Sep 2002 A1
20030001244 Araki et al. Jan 2003 A1
20030006055 Chien-Hung et al. Jan 2003 A1
20030015780 Kang et al. Jan 2003 A1
20050067712 Imaoka et al. Mar 2005 A1
20050167855 Minamio et al. Aug 2005 A1
20050224924 Koh et al. Oct 2005 A1
20050242417 Youn et al. Nov 2005 A1
20060151862 Lin et al. Jul 2006 A1
20060170081 Gerber et al. Aug 2006 A1
20070007634 Youn et al. Jan 2007 A1
20070273017 Maloney et al. Nov 2007 A1
Foreign Referenced Citations (3)
Number Date Country
59-208756 Nov 1984 JP
2003031753 (A) Jan 2003 JP
WO-0048249 Aug 2000 WO
Divisions (1)
Number Date Country
Parent 09802679 Mar 2001 US
Child 10318262 US
Continuation in Parts (3)
Number Date Country
Parent 10318262 Dec 2002 US
Child 11008593 US
Parent 09288352 Apr 1999 US
Child 09802679 US
Parent 09095803 Jun 1998 US
Child 09288352 US