Disclosed embodiments relate to semiconductor power converter packages comprising stacked die assemblies.
Multi-die packaging is common in power converters in which Metal Oxide Semiconductor Field Effect Transistors (MOSFETs, which can have a doped polysilicon gate, generally referred to herein as simply FETs) which function as switching transistors are included. Motivations for multi-die packaging as opposed to a single monolithic integrated circuit (IC) solution include both performance and cost.
A conventional power converter package includes a lead frame having a first FET die and a second FET die in a side-by-side or lateral mounting arrangement on a common plane with a controller (or driver) die that is connected via bond wires between conductive pads on the controller die and to contacts on the respective lead frame portions, and by bond wires connected to various contact pads on the FETs. A first clip (also known as a strap), typically formed from copper in ribbon form, is in electrical and thermal contact with the upper surface of the second FET die and a second clip is in electrical and thermal contact with the upper surface of the first FET die. The first clip may be L-shaped and include a columnar portion that is in contact with a contact pad of the lead frame. The clip is similarly shaped and is in contact with another portion of the lead frame. In typical power converter operations, the clips serve as current carrying conductors as well as heat sinks. This structure is typically encapsulated in a thermoset-based mold compound to define an IC circuit package.
The conventional lateral power converter package is generally thin, but has a foot print (e.g., 5 mm×7 mm) that may be too large for some applications. Moreover, parasitics (inductance and resistance) resulting from long bond wire connections may adversely limit performance including the frequency response (e.g., ringing) and maximum frequency performance. New solutions that minimize the area of power converter package while also providing improved performance are needed for applications including, but not limited to, highly dense servers, set-top boxes, industrial equipment, and notebook computers.
Disclosed embodiments describe new multi-chip module (MCM) power converter packages that include stacked power transistor die, at least one metal clip, and a controller embodied as either a third die stacked on the stacked power transistor die, or integrated on one of the power transistor die. Disclosed stacked die power converter packages comprise a lead frame including a die pad and a plurality of package pins, a first die including first power transistor switch (first power transistor) attached to the die pad, and a first metal clip attached to one side of the first die. The first metal clip is coupled to at least one package pin. A second die including a second power transistor switch (second power transistor) is attached to another side of the first metal clip. A controller comprises a controller die attached to a second metal clip on one side of the second die, a controller die attached to the second die, or the controller is integrated with one of the power transistors on the second die. The controller is coupled to both a first control node of the first power transistor and a second control node of the second power transistor.
In one embodiment the power converter package is a buck converter. In this embodiment the first power transistor comprises a low side (LS) power transistor and the second power transistor comprises a high side (HS) power transistor. Since the HS power transistor is generally significantly smaller in area as compared to the LS power transistor, for the embodiment where the controller is integrated on the same die with a power transistor, the controller is generally integrated with the HS power transistor.
As used herein the term “power transistor” or “power transistor switch” is used broadly, and includes, but is not limited to, III-V field effect transistors (FETs) including GaN FETs, CMOS switches (NMOS, PMOS), double-diffused metal-oxide-semiconductor (DMOS) FETs, junction gate field-effect transistors (JFETs), bipolar transistors, insulated gate bipolar transistor (IGBTs), trench FETs, and vertical field-effect transistors (VFETs).
When the term “die” is used herein, it is understood that a die can include one or more die, and each die can include a plurality of each of the transistor terminals, such a plurality of drains, sources, and gates hooked in parallel in the case of a power FET.
Disclosed embodiments provide close proximity of the controller to the respective power transistors which allows shortened connection paths that reduce the parasitic interconnect inductance and resistance. As a result, disclosed power converter packages are smaller, quieter and denser as compared to conventional power converters. Lower inductance leads to reduced ringing that provides benefits including (1) higher frequency switching and (2) safer and more robust drive.
Example embodiments are described with reference to the drawings, wherein like reference numerals are used to designate similar or equivalent elements. Illustrated ordering of acts or events should not be considered as limiting, as some acts or events may occur in different order and/or concurrently with other acts or events. Furthermore, some illustrated acts or events may not be required to implement a methodology in accordance with this disclosure.
A first vertical NFET die 110 identified in
A first metal clip 116 is attached to the first drain side 112 of the LS vertical NFET die 110. First metal clip 116 generally comprises copper and may be attached with solder or another electrically conductive material such as a conductive epoxy (e.g., silver epoxy). The first metal clip 116 is shown coupling the drain on the first drain side 112 of LS vertical NFET die 110 to package pins 10 through 12 (shown as the switching node (SW)).
A second vertical NFET die 120 identified in
A second metal clip 126 is attached to the second drain side 122 of HS vertical FET die 120, and the second metal clip 126 is shown coupling the drain of HS vertical FET 120 die to package pins 1 and 2 (shown as the power input VIN).
The controller die 130 is attached onto the second metal clip 126. In one embodiment, the controller die 130 comprises a low-dropout (LDO) controller that includes an open drain topology. The second clip 126 provides a mounting area large enough to accommodate the controller die 130. The controller die 130 is generally mounted onto the second metal clip 126 using a dielectric adhesive, such as a non-electrically conductive epoxy.
Power converter package 100 is shown including a plurality of bondwires for coupling within the die stack. Bondwires shown include a bondwire 131A that couples a pad on the controller die 130 to VIN, a bond wire 132B the couples a pad on the controller die 130 to the first gate contact 113 on the LS vertical FET die 110, and another bondwire 131C that couples a pad on the controller die 130 to the second gate contact 123 on the HS FET die 120. As described above, the proximity of the controller die 130 to the respective FET die 110 and 120 allows shortened bond wires that reduce the parasitic interconnect inductance and resistance. Lower inductance leads to reduced ringing that provides the benefits of (1) higher frequency switching and (2) safer and more robust drive. This low inductance feature can be especially important for the connections to the HS FET die 120.
Node 317 is coupled by second metal clip 126 to a pin of the lead frame 105. Metal clips such as second metal clip 126 can be soldered to pins of the lead frame 105. The LS power transistor on first die 320 is shown as a pair of first lateral transistors 325 and 325′. Lateral transistor 325 includes a control node 326, and two other nodes 327 and 328, such as a gate as a control node 326 and source and drain nodes 327, 328 for a FET, while lateral transistor 325′ includes control node 326′, and two other nodes 327′ and 328′, such as a gate as a control node 326′ and source and drain nodes 327′, 328′ for a FET on first die 320. Control nodes 326 and 326′ are connected together by metal (not shown) on a topside of the first die 320. First die 320 includes at least one TSV 312(b) that couples nodes 328, 328′ to the die pad 106. The first clip 116 couples nodes 327, 327′ to a pin of the lead frame 105. The controller die 130 is attached to the second metal clip 126. Bond wires 131 are shown coupling controller die 130 to control nodes 316 on second die 310 and control nodes 326/326′ on first die 320.
The LS lateral transistors 325 and 325′ on first die 320 include protruding bonding features shown as solder balls 341 that couple non-control nodes 328 and 328′ to the die pad 106 and non-control nodes 327/327′ to a package pin of lead frame 105. The HS lateral transistor 315 on second die 310 and includes solder balls 341 that couple a non-control node 317 to second metal clip 326 and a non-control node 318 to first metal clip 316. Metal posts/pillars, such as copper pillars may be use instead of the solder balls 341 shown. The controller die 130 is attached to the second die 310, such as by a dielectric adhesive (e.g., epoxy).
In embodiments described below relative to
Regarding assembly for stacked die power converter package 550 for vertical power FET embodiments, the lead frame 105 goes through the assembly and the LS FET die 110 is attached to the die pad 106. The lead frame 106/LS FET 110 combination then goes through the assembly process again, this time the SWN clip 575 and GL clips 571 are added and soldered down to the LS FET 110 and to pins of the lead frame 105. Then, the VIN clip 576 and I/O clips such as 577-581 are soldered to the lead frame 105 on the third pass. It is noted that the VIN clip 576 and I/O clips are not soldered to the LS FET 110. Lastly, the top die 560 which can be embodied as a WCSP die is flipped onto the all the clips and stubs provided by clip array 570, thus making connections to SWN, VIN, GL and the I/Os.
An example method of assembling a dual-clip triple stack die power converter, such as dual-clip triple stack die power converter package 100 shown in
A first side of a first die including a first power transistor is attached onto a die pad of a lead frame. One side of a first metal clip is coupled to a second side of the first die. A second die including a second power transistor is attached to a second side of the first metal clip. A second metal clip is attached to the first side or the second side of said second die. A controller die is attached onto the second metal clip or onto the second die. The controller die is generally attached with a dielectric adhesive, such as a non-conductive epoxy. For embodiments where the controller die is attached to the second metal clip, the second metal clip provides a mounting area large enough to accommodate a controller die. The first metal clip and second metal clip are each bonded to at least one of a plurality of package pins of the lead frame. The controller die is coupled to a first control node on the first power transistor and to a second control node on the second power transistor, such as by wire bonding. The assembly process is then completed including molding for encapsulation.
Significantly, the disclosed assembly provides for alignment of the second metal clip and the controller die. This alignment extends the available space for the controller die and provides a strip carrier that allows the die pick and place machine to be used more efficiently since the same machine that allows the leadframe to go through the assembly is the machine that also installs the clips, so that a conventional bowl feed is not required.
For example, the lead frame goes through assembly, and the LS FET is attached to the lead frame. Then the lead frame/LSFET goes through assembly again, this time with one of the clip arrays mounted on top of the lead frame/LSFET array. For the disclosed triple stack embodiment, the HSFET is placed on the SWN (LSFET) clip and then the lead frame/LSFET/Clip 1/HSFET goes through assembly again, this time with a new clip array mounted to the whole assembly. Then, the controller die is placed on the HSFET clip. Thus, for each pass, the clip assembly can go through the lead frame assembly process. Therefore, machine requiring different alignment for clips needed for a conventional bowl clip process is not required. The lead frame process also self-aligns all mechanical elements.
In one embodiment, disclosed stack die power converter packages are used to configure a synchronous buck converter. However, disclosed embodiments can generally be applied to any power switching topology with three (or more) semiconductor elements. Examples include boost, buck-boost, and Cuk power converters. Disclosed embodiments can also be used in certain isolated converters, with only one side at a time. Examples include the primary side a two-switch forward converter or two switch flyback converter where the three die in the MCM power package are the two switches and the controller. Also, disclosed embodiments can be used on the secondary side of any converter with two switches on the secondary (forward converter is an example here) where two power transistor switches are required. The control IC could either be a full secondary control IC or a simpler synchronous rectifier control.
In one realization of disclosed embodiments, based on power converter package 100 shown in
Disclosed embodiments can be integrated into a variety of assembly flows to form a variety of different packaged semiconductor devices and related products. The assembly can comprise single die or multiple die, such as PoP configurations comprising a plurality of stacked die. A variety of package substrates may be used. The active circuitry formed on the die including the controller comprises circuit elements that may generally include transistors, diodes, capacitors, and resistors, as well as signal lines and other electrical conductors that interconnect the various circuit elements. Disclosed embodiments can be integrated into a variety of process flows to form a variety of devices and related products. Moreover, disclosed embodiments can be used in a variety of semiconductor device fabrication processes including bipolar, CMOS, BiCMOS and MEMS processes.
Those skilled in the art to which this disclosure relates will appreciate that many other embodiments and variations of embodiments are possible within the scope of the claimed invention, and further additions, deletions, substitutions and modifications may be made to the described embodiments without departing from the scope of this disclosure.