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Measuring arrangements characterised by the use of optical means
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Industry
CPC
G01B11/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Current Industry
G01B11/00
Measuring arrangements characterised by the use of optical means
Sub Industries
G01B11/002
for measuring two or more coordinates
G01B11/005
coordinate measuring machines
G01B11/007
feeler heads therefor
G01B11/02
for measuring length, width or thickness
G01B11/022
by means of tv-camera scanning
G01B11/024
by means of diode-array scanning
G01B11/026
by measuring distance between sensor and object
G01B11/028
by measuring lateral position of a boundary of the object
G01B11/03
by measuring coordinates of points
G01B11/04
specially adapted for measuring length or width of objects while moving
G01B11/043
for measuring length
G01B11/046
for measuring width
G01B11/06
for measuring thickness
G01B11/0608
Height gauges
G01B11/0616
of coating
G01B11/0625
with measurement of absorption or reflection
G01B11/0633
using one or more discrete wavelengths
G01B11/0641
with measurement of polarization
G01B11/065
using one or more discrete wavelengths
G01B11/0658
with measurement of emissivity or reradiation
G01B11/0666
using an exciting beam and a detection beam including surface acoustic waves [SAW]
G01B11/0675
using interferometry
G01B11/0683
measurement during deposition or removal of the layer
G01B11/0691
of objects while moving
G01B11/08
for measuring diameters
G01B11/10
of objects while moving
G01B11/105
using photoelectric detection means
G01B11/12
internal diameters
G01B11/14
for measuring distance or clearance between spaced objects or spaced apertures
G01B11/16
for measuring the deformation in a solid
G01B11/161
by interferometric means
G01B11/162
by speckle- or shearing interferometry
G01B11/164
by holographic interferometry
G01B11/165
by means of a grating deformed by the object
G01B11/167
by projecting a pattern on the object
G01B11/168
by means of polarisation
G01B11/18
using photoelastic elements
G01B11/20
using brittle lacquer
G01B11/22
for measuring depth
G01B11/24
for measuring contours or curvatures
G01B11/2408
for measuring roundness
G01B11/2416
of gears
G01B11/2425
of screw-threads
G01B11/2433
for measuring outlines by shadow casting
G01B11/2441
using interferometry
G01B11/245
using a plurality of fixed, simultaneously operating transducers
G01B11/25
by projecting a pattern
G01B11/2504
Calibration devices
G01B11/2509
Color coding
G01B11/2513
with several lines being projected in more than one direction
G01B11/2518
Projection by scanning of the object
G01B11/2522
the position of the object changing and being recorded
G01B11/2527
with phase change by in-plane movement of the patern
G01B11/2531
using several gratings, projected with variable angle of incidence on the object, and one detection device
G01B11/2536
using several gratings with variable grating pitch, projected on the object with the same angle of incidence
G01B11/254
Projection of a pattern, viewing through a pattern
G01B11/2545
with one projection direction and several detection directions
G01B11/255
for measuring radius of curvature
G01B11/26
for measuring angles or tapers for testing the alignment of axes
G01B11/27
for testing the alignment of axes
G01B11/272
using photoelectric detection means
G01B11/275
for testing wheel alignment
G01B11/2755
using photoelectric detection means
G01B11/28
for measuring areas
G01B11/285
using photoelectric detection means
G01B11/30
for measuring roughness or irregularity of surfaces
G01B11/303
using photoelectric detection means
G01B11/306
for measuring evenness
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Electrochemical deposition system including optical probes
Patent number
12,180,607
Issue date
Dec 31, 2024
Lam Research Corporation
Andrew James Pfau
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Optical positioning aid for a distance sensor, distance measuring s...
Patent number
12,181,268
Issue date
Dec 31, 2024
Micro-Epsilon Optronic GmbH
Torsten Stautmeister
G01 - MEASURING TESTING
Information
Patent Grant
Method of size measurement in mono-vision scope image
Patent number
12,181,269
Issue date
Dec 31, 2024
The Johns Hopkins University
Dan Stoianovici
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection device for cylindrical bodies
Patent number
12,181,270
Issue date
Dec 31, 2024
Schott AG
André Witzmann
G01 - MEASURING TESTING
Information
Patent Grant
Gear inspection system
Patent number
12,181,272
Issue date
Dec 31, 2024
SLONE GEAR INTERNATIONAL, INC.
Brian W. Slone
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and device for determining the shape of an optical waveguide...
Patent number
12,181,369
Issue date
Dec 31, 2024
Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
Wolfgang Schade
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and systems for shape sensing
Patent number
12,178,400
Issue date
Dec 31, 2024
FBGS TECHNOLOGIES GMBH
Jan Van Roosbroeck
G01 - MEASURING TESTING
Information
Patent Grant
Curvature value detection and evaluation
Patent number
12,181,290
Issue date
Dec 31, 2024
HERE Global B.V.
Liming Wang
G01 - MEASURING TESTING
Information
Patent Grant
Dishwashing appliances and sensor assemblies for detecting a positi...
Patent number
12,178,379
Issue date
Dec 31, 2024
Haier US Appliance Solutions, Inc.
Ricardo Alberto Aguiar
G01 - MEASURING TESTING
Information
Patent Grant
Crop state map generation and control system
Patent number
12,178,157
Issue date
Dec 31, 2024
Deere & Company
Nathan R. Vandike
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Estimating in-die overlay with tool induced shift correction
Patent number
12,181,271
Issue date
Dec 31, 2024
KLA Corporation
Min-Yeong Moon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Three-dimensional measurement device
Patent number
12,181,273
Issue date
Dec 31, 2024
Hamamatsu Photonics K.K.
Kazuyoshi Hirose
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for positioning center of V-type notch of wafer,...
Patent number
12,183,616
Issue date
Dec 31, 2024
XI'AN ESWIN MATERIAL TECHNOLOGY CO., LTD.
Leilei Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Facility and method for measuring the thickness of the walls of gla...
Patent number
12,181,266
Issue date
Dec 31, 2024
TIAMA
Marc Leconte
G01 - MEASURING TESTING
Information
Patent Grant
Measuring method
Patent number
12,181,267
Issue date
Dec 31, 2024
Disco Corporation
Yasukuni Nomura
G01 - MEASURING TESTING
Information
Patent Grant
Reflective coating for material calibration
Patent number
12,179,432
Issue date
Dec 31, 2024
Inkbit, LLC
Aaron Weber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hand-held tire scanner and method for obtaining a three-dimensional...
Patent number
12,174,007
Issue date
Dec 24, 2024
Snap-on Equipment SRL a Unico Socio
Andrew Pryce
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Device and method for inspecting reflective surfaces
Patent number
12,174,008
Issue date
Dec 24, 2024
NEXTSENSE GMBH
Eduard Luttenberger
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Focused light beam alignment apparatus for aligning fixture relativ...
Patent number
12,173,836
Issue date
Dec 24, 2024
Snap-on Incorporated
Craig F. Govekar
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Locating system for medical devices
Patent number
12,171,500
Issue date
Dec 24, 2024
Baxter Medical Systems GmbH & Co. KG
Tobias Klemm
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Metrology system with position and orientation tracking utilizing l...
Patent number
12,174,005
Issue date
Dec 24, 2024
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Calibration system for an extreme ultraviolet light source
Patent number
12,174,550
Issue date
Dec 24, 2024
ASML Netherlands B.V.
Daniel Jason Riggs
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Current assisted photonic demodulator (CAPD) indirect time of fligh...
Patent number
12,176,371
Issue date
Dec 24, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Takeshi Yamazaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Devices and methods for measuring using augmented reality
Patent number
12,174,006
Issue date
Dec 24, 2024
Apple Inc.
Allison W. Dryer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Laser device and laser beam detector for detecting light of a laser...
Patent number
12,174,019
Issue date
Dec 24, 2024
Spectra Precision (Kaiserslautern) GmbH
Lars Schumacher
G01 - MEASURING TESTING
Information
Patent Grant
Distance measurement device, method of controlling distance measure...
Patent number
12,174,297
Issue date
Dec 24, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Kazuki Ohashi
G01 - MEASURING TESTING
Information
Patent Grant
Measurement tool for cable-preparation system
Patent number
12,176,689
Issue date
Dec 24, 2024
3M Innovative Properties Company
Douglas B. Gundel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for predicting inclination angle, and method and...
Patent number
12,176,252
Issue date
Dec 24, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Bo Shao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for monitoring toilet paper rolls
Patent number
12,171,378
Issue date
Dec 24, 2024
7-Eleven, Inc.
Matthew O'Daniel Redmond
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for planning an obstacle-free measurement traj...
Patent number
12,174,645
Issue date
Dec 24, 2024
Carl Zeiss Industrielle Messetechnik GmbH
Yu Kou
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...
Publication number
20250003731
Publication date
Jan 2, 2025
Alcon Inc.
Yeming Gu
G02 - OPTICS
Information
Patent Application
Device and Method for Measuring Sealing Gap for Secondary Battery
Publication number
20250003733
Publication date
Jan 2, 2025
LG ENERGY SOLUTION, LTD.
Young Joo Oh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
Publication number
20250003882
Publication date
Jan 2, 2025
NOVA LTD
GILAD BARAK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MEASURING OPTICAL PROPERTIES AND GEOMETRIC PROPERTIES OF...
Publication number
20250003866
Publication date
Jan 2, 2025
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Xiuguo Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MATERIAL MEASUREMENT SYSTEM AND METHOD
Publication number
20250003734
Publication date
Jan 2, 2025
Samsung Electronics Co., Ltd.
Sungyoon Ryu
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE MOLD GAP MEASUREMENT USING OPTICAL FIBER INTERFERO...
Publication number
20250003735
Publication date
Jan 2, 2025
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Jie Huang
G01 - MEASURING TESTING
Information
Patent Application
OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR
Publication number
20250003737
Publication date
Jan 2, 2025
Applied Materials, Inc.
Andrew Thomas Koll
G01 - MEASURING TESTING
Information
Patent Application
DETECTION OF SNOW AND ICE ACCUMULATION ON A VEHICLE
Publication number
20250002025
Publication date
Jan 2, 2025
GM Cruise Holdings LLC
Jeffrey Brandon
B60 - VEHICLES IN GENERAL
Information
Patent Application
CMM WITH TUNABLE FOCAL LENS
Publication number
20250003732
Publication date
Jan 2, 2025
HEXAGON TECHNOLOGY CENTER GMBH
Thomas JENSEN
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT HEAD AND CONFOCAL DISPLACEMENT SENSOR
Publication number
20250003736
Publication date
Jan 2, 2025
KEYENCE CORPORATION
Hideto TAKEI
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURED LIGHT CODING METHOD AND SYSTEM FOR THREE-DIMENSIONAL INF...
Publication number
20250003740
Publication date
Jan 2, 2025
Alliedstar (Shanghai) Medical Technology Co., Ltd.
Houhang Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL FIBER SENSING SYSTEM, OPTICAL FIBER SENSING APPARATUS, AND...
Publication number
20250003791
Publication date
Jan 2, 2025
NEC Corporation
Tadayuki IWANO
G01 - MEASURING TESTING
Information
Patent Application
HANDHELD SCANNER FOR MEASURING THREE-DIMENSIONAL COORDINATES
Publication number
20250008071
Publication date
Jan 2, 2025
FARO TECHNOLOGIES, INC.
Paul C. Atwell
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SURFACE PROCESSING EQUIPMENT
Publication number
20250006475
Publication date
Jan 2, 2025
Industrial Technology Research Institute
Chih-Chieh Chen
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT APPARATUS
Publication number
20250003738
Publication date
Jan 2, 2025
DENSO WAVE INCORPORATED
Yusuke MITANI
G01 - MEASURING TESTING
Information
Patent Application
EYE SAFETY FOR PROJECTORS
Publication number
20250003739
Publication date
Jan 2, 2025
trinamiX GmbH
Benjamin REIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR DETERMINING REASONABLE SAMPLING INTERVAL WITH...
Publication number
20250003741
Publication date
Jan 2, 2025
CHINA UNIVERSITY OF GEOSCIENCES (WUHAN)
Yunfeng GE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING DEVICE AND METHOD FOR THE THREE-DIMENSIONAL OPTIC...
Publication number
20240426601
Publication date
Dec 26, 2024
Carl Zeiss GOM Metrology GmbH
Thorsten Bothe
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE, METHOD FOR MEASURING AN ACTUAL TILT OF AN OPTICAL S...
Publication number
20240426603
Publication date
Dec 26, 2024
Carl Zeiss SMT GMBH
Heiner ZWICKEL
G01 - MEASURING TESTING
Information
Patent Application
IMAGE ANALYSIS DEVICE, ANALYIS DEVICE, SHAPE MEASUREMENT DEVICE, IM...
Publication number
20240426599
Publication date
Dec 26, 2024
Nikon Corporation
Sumito NAKANO
G01 - MEASURING TESTING
Information
Patent Application
SCANNER SYSTEM FOR THREE-DIMENSIONAL SCANNING OF MOVING OBJECTS
Publication number
20240426596
Publication date
Dec 26, 2024
Northrop Grumman Systems Corporation
Grant Camden Miars
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DIMENSION MEASUREMENT APPARATUS
Publication number
20240426595
Publication date
Dec 26, 2024
CONTEMPORARY AMPEREX TECHNOLOGY(HONG KONG) LIMITED
Qizhi Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM TO DETERMINE SURFACE SHAPES OF HELIOSTATS USING F...
Publication number
20240426597
Publication date
Dec 26, 2024
Arizona Board of Regents on behalf of The University of Arizona
James Roger P . Angel
F24 - HEATING RANGES VENTILATING
Information
Patent Application
SYSTEM AND METHOD FOR CREATING A CUSTOM PROTECTIVE EQUIPMENT ITEM
Publication number
20240426598
Publication date
Dec 26, 2024
Riddell, Inc.
Steven King
G01 - MEASURING TESTING
Information
Patent Application
WELDING CONDITION EVALUATION METHOD
Publication number
20240424613
Publication date
Dec 26, 2024
Panasonic Intellectual Property Management Co., Ltd.
Kenta KUBOTA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
IDENTIFICATION APPARATUS
Publication number
20240426758
Publication date
Dec 26, 2024
Canon Kabushiki Kaisha
Yuki Yonetani
G01 - MEASURING TESTING
Information
Patent Application
DETECTION DEVICE FOR VEHICLES
Publication number
20240426345
Publication date
Dec 26, 2024
DENSO CORPORATION
Yoshihiro KIDA
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD
Publication number
20240426600
Publication date
Dec 26, 2024
TOKYO SEIMITSU CO., LTD.
Kyohei HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Laser Level with Direct Projection to Multiple Targets
Publication number
20240426602
Publication date
Dec 26, 2024
Milwaukee Electric Tool Corporation
Austin Alexander Borkowski
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING APPARATUS, ELECTRONIC APPARATUS, PROCESSING METHOD, AND...
Publication number
20240418862
Publication date
Dec 19, 2024
FUJIFILM CORPORATION
Kenkichi HAYASHI
G01 - MEASURING TESTING