Industry
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CPC
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C23C14/00
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Sub Industries
C23C14/0005Separation of the coating from the substrate
C23C14/001Coating on a liquid substrate
C23C14/0015characterized by the colour of the layer
C23C14/0021Reactive sputtering or evaporation
C23C14/0026Activation or excitation of reactive gases outside the coating chamber
C23C14/0031Bombardment of substrates by reactive ion beams
C23C14/0036Reactive sputtering
C23C14/0042Controlling partial pressure or flow rate of reactive or inert gases with feedback of measurements
C23C14/0047Activation or excitation of reactive gases outside the coating chamber
C23C14/0052Bombardment of substrates by reactive ion beams
C23C14/0057using reactive gases other than O2, H2O, N2, NH3 or CH4
C23C14/0063characterised by means for introducing or removing gases
C23C14/0068characterised by means for confinement of gases or sputtered material
C23C14/0073by exposing the substrates to reactive gases intermittently
C23C14/0078by moving the substrates between spatially separate sputtering and reaction stations
C23C14/0084Producing gradient compositions
C23C14/0089in metallic mode
C23C14/0094in transition mode
C23C14/02Pre-treatment of the material to be coated
C23C14/021Cleaning or etching treatments
C23C14/022by means of bombardment with energetic particles or radiation
C23C14/024Deposition of sublayers
C23C14/025Metallic sublayers
C23C14/027Graded interfaces
C23C14/028Physical treatment to alter the texture of the substrate surface
C23C14/04Coating on selected surface areas
C23C14/042using masks
C23C14/044using masks to redistribute rather than totally prevent coating
C23C14/046Coating cavities or hollow spaces
C23C14/048using irradiation by energy or particles
C23C14/06characterised by the coating material
C23C14/0605Carbon
C23C14/0611Diamond
C23C14/0617AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
C23C14/0623Sulfides, selenides or tellurides
C23C14/0629of zinc, cadmium or mercury
C23C14/0635Carbides
C23C14/0641Nitrides
C23C14/0647Boron nitride
C23C14/0652Silicon nitride
C23C14/0658Carbon nitride
C23C14/0664Carbonitrides
C23C14/067Borides
C23C14/0676Oxynitrides
C23C14/0682Silicides
C23C14/0688Cermets
C23C14/0694Halides
C23C14/08Oxides
C23C14/081of aluminium, magnesium or beryllium
C23C14/082of alkaline earth metals
C23C14/083of refractory metals or yttrium
C23C14/085of iron group metals
C23C14/086of zinc, germanium, cadmium, indium, tin, thallium or bismuth
C23C14/087of copper or solid solutions thereof
C23C14/088of the type ABO3 with A representing alkali, alkaline earth metal or Pb and B representing a refractory or rare earth metal
C23C14/10Glass or silica
C23C14/12Organic material
C23C14/14Metallic material, boron or silicon
C23C14/16on metallic substrates or on substrates of boron or silicon
C23C14/165by cathodic sputtering
C23C14/18on other inorganic substrates
C23C14/185by cathodic sputtering
C23C14/20on organic substrates
C23C14/205by cathodic sputtering
C23C14/22characterised by the process of coating
C23C14/221Ion beam deposition
C23C14/223specialy adapted for coating particles
C23C14/225Oblique incidence of vaporised material on substrate
C23C14/226in order to form films with columnar structure
C23C14/228Gas flow assisted PVD deposition
C23C14/24Vacuum evaporation
C23C14/243Crucibles for source material
C23C14/246Replenishment of source material
C23C14/26by resistance or inductive heating of the source
C23C14/28by wave energy or particle radiation
C23C14/30by electron bombardment
C23C14/32by explosion by evaporation and subsequent ionisation of the vapours
C23C14/325Electric arc evaporation
C23C14/34Sputtering
C23C14/3407Cathode assembly for sputtering apparatus
C23C14/3414Metallurgical or chemical aspects of target preparation
C23C14/3421using heated targets
C23C14/3428using liquid targets
C23C14/3435Applying energy to the substrate during sputtering
C23C14/3442using an ion beam
C23C14/345using substrate bias
C23C14/3457using other particles than noble gas ions
C23C14/3464using more than one target
C23C14/3471Introduction of auxiliary energy into the plasma
C23C14/3478using electrons
C23C14/3485using pulsed power to the target
C23C14/3492Variation of parameters during sputtering
C23C14/35by application of a magnetic field
C23C14/351using a magnetic field in close vicinity to the substrate
C23C14/352using more than one target
C23C14/354Introduction of auxiliary energy into the plasma
C23C14/355using electrons
C23C14/357Microwaves
C23C14/358Inductive energy
C23C14/46by ion beam produced by an external ion source
C23C14/48Ion implantation
C23C14/50Substrate holders
C23C14/505for rotation of the substrates
C23C14/52Means for observation of the coating process
C23C14/54Controlling or regulating the coating process
C23C14/541Heating or cooling of the substrates
C23C14/542Controlling the film thickness or evaporation rate
C23C14/543using measurement on the vapor source
C23C14/544using measurement in the gas phase
C23C14/545using measurement on deposited material
C23C14/546using crystal oscillators
C23C14/547using optical methods
C23C14/548Controlling the composition
C23C14/56Apparatus specially adapted for continuous coating Arrangements for maintaining the vacuum
C23C14/562for coating elongated substrates
C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
C23C14/566using a load-lock chamber
C23C14/568Transferring the substrates through a series of coating stations
C23C14/58After-treatment
C23C14/5806Thermal treatment
C23C14/5813using lasers
C23C14/582using electron bombardment
C23C14/5826Plasma treatment
C23C14/5833Ion beam bombardment
C23C14/584Non-reactive treatment
C23C14/5846Reactive treatment
C23C14/5853Oxidation
C23C14/586Nitriding
C23C14/5866Treatment with sulfur, selenium or tellurium
C23C14/5873Removal of material
C23C14/588by mechanical treatment
C23C14/5886Mechanical treatment
C23C14/5893Mixing of deposited material