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Instruments as specified in the subgroups and characterised by the use of optical measuring means
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G01B9/00
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Current Industry
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Sub Industries
G01B9/02
Interferometers for determining dimensional properties of, or relations between, measurement objects
G01B9/02001
characterised by manipulating or generating specific radiation properties
G01B9/02002
Frequency variation
G01B9/02003
by using beat frequencies generated by mixing of two or more frequencies
G01B9/02004
by using a continuous frequency sweep or scan
G01B9/02005
by using discrete frequency stepping or switching
G01B9/02007
Two or more frequencies or sources used for interferometric measurement
G01B9/02008
by using a frequency comb
G01B9/02009
by using two or more low coherence lengths using different or varying spectral width
G01B9/0201
using temporal phase variation
G01B9/02011
using temporal polarization variation
G01B9/02012
using temporal intensity variation
G01B9/02014
by using pulsed light
G01B9/02015
characterised by a particular beam path configuration
G01B9/02016
contacting two or more objects
G01B9/02017
contacting one object several times
G01B9/02018
Multiple-pass interferometer
G01B9/02019
contacting different points on same face of object
G01B9/02021
contacting different faces of object
G01B9/02022
contacting one object by grazing incidence
G01B9/02023
Indirect probing of object
G01B9/02024
Measuring in transmission
G01B9/02025
Interference between three or more discrete surfaces
G01B9/02027
Two or more interferometric channels or interferometers
G01B9/02028
Two or more reference or object arms in one interferometer
G01B9/02029
Combination with non-interferometric systems
G01B9/0203
With imaging systems
G01B9/02031
With non-optical systems
G01B9/02032
generating a spatial carrier frequency
G01B9/02034
characterised by particularly shaped beams or wavefronts
G01B9/02035
Shaping the focal point
G01B9/02036
by using chromatic effects
G01B9/02037
by generating a transverse line focus
G01B9/02038
Shaping the wavefront
G01B9/02039
by matching the wavefront with a particular object surface shape
G01B9/02041
characterised by particular imaging or detection techniques
G01B9/02042
Confocal imaging
G01B9/02043
Imaging of the Fourier or pupil or back focal plane
G01B9/02044
Imaging in the frequency domain
G01B9/02045
using the Doppler effect
G01B9/02047
using digital holographic imaging
G01B9/02048
Rough and fine measurement
G01B9/02049
characterised by particular mechanical design details
G01B9/0205
of probe head
G01B9/02051
Integrated design
G01B9/02052
Protecting
G01B9/02054
Hand held
G01B9/02055
characterised by error reduction techniques
G01B9/02056
Passive error reduction, i.e. not varying during measurement
G01B9/02057
by using common path configuration
G01B9/02058
by particular optical compensation or alignment elements
G01B9/02059
Reducing effect of parasitic reflections
G01B9/02061
Reducing or preventing effect of tilt or misalignment
G01B9/02062
Active error reduction
G01B9/02063
by particular alignment of focus position
G01B9/02064
by particular adjustment of coherence gate
G01B9/02065
using a second interferometer before or after measuring interferometer
G01B9/02067
by electronic control systems
G01B9/02068
Auto-alignment of optical elements
G01B9/02069
Synchronization of light source or manipulator and detector
G01B9/0207
Error reduction by correction of the measurement signal based on independently determined error sources
G01B9/02071
by measuring path difference independently from interferometer
G01B9/02072
by calibration or testing of interferometer
G01B9/02074
of the detector
G01B9/02075
of particular errors
G01B9/02076
Caused by motion
G01B9/02077
of the object
G01B9/02078
Caused by ambiguity
G01B9/02079
Quadrature detection
G01B9/02081
simultaneous quadrature detection
G01B9/02082
Caused by speckles
G01B9/02083
characterised by particular signal processing and presentation
G01B9/02084
Processing in the Fourier or frequency domain when not imaged in the frequency domain
G01B9/02085
Combining two or more images of different regions
G01B9/02087
Combining two or more images of the same region
G01B9/02088
Matching signals with a database
G01B9/02089
Displaying the signal
G01B9/0209
Non-tomographic low coherence interferometers
G01B9/02091
Tomographic low coherence interferometers
G01B9/02092
Self-mixing interferometers
G01B9/02094
Speckle interferometers
G01B9/02095
detecting deformation from original shape
G01B9/02096
detecting a contour or curvature
G01B9/02097
Self-interferometers
G01B9/02098
shearing interferometers
G01B9/021
using holographic techniques
G01B9/023
for contour producing
G01B9/025
Double exposure technique
G01B9/027
in real time
G01B9/029
by time averaging
G01B9/04
Measuring microscopes
G01B9/06
Measuring telescopes
G01B9/08
Optical projection comparators
G01B9/10
Goniometers for measuring angles between surfaces
Industries
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Organizations
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
LIDAR waveform calibration system
Patent number
11,965,992
Issue date
Apr 23, 2024
AURORA OPERATIONS, INC.
Andrew Steil Michaels
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Method and system for quantitatively evaluating surface roughness o...
Patent number
11,965,734
Issue date
Apr 23, 2024
NORTHEAST PETROLEUM UNIVERSITY
Shansi Tian
E21 - EARTH DRILLING MINING
Information
Patent Grant
Method and a system for characterising structures etched in a subst...
Patent number
11,959,736
Issue date
Apr 16, 2024
UNITY SEMICONDUCTOR
Wolfgang Alexander Iff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Estimating gemstone weight in mounted settings
Patent number
11,959,796
Issue date
Apr 16, 2024
The RealReal, Inc.
Loretta Catherine Castoro
G01 - MEASURING TESTING
Information
Patent Grant
Method and a system for combined characterisation of structures etc...
Patent number
11,959,737
Issue date
Apr 16, 2024
UNITY SEMICONDUCTOR
Wolfgang Alexander Iff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dimensionless kinematics calibration method based on virtual point...
Patent number
11,959,743
Issue date
Apr 16, 2024
GUANGDONG UNIVERSITY OF TECHNOLOGY
Jian Gao
G05 - CONTROLLING REGULATING
Information
Patent Grant
Optical coherence tomographic imager, optical coherence tomographic...
Patent number
11,953,320
Issue date
Apr 9, 2024
NEC Corporation
Shigeru Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Characterization device for characterizing the quality of light bea...
Patent number
11,953,236
Issue date
Apr 9, 2024
FUNDACION CENER-CIEMAT
Iñigo Les Aguerrea
G01 - MEASURING TESTING
Information
Patent Grant
Method and computer program product for OCT measurement beam adjust...
Patent number
11,951,564
Issue date
Apr 9, 2024
TRUMPF Laser- und Systemtechnik Gm H
Martin Stambke
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for tomographic imaging of object reflectivity under inhomog...
Patent number
11,948,229
Issue date
Apr 2, 2024
Mitsubishi Electric Research Laboratories, Inc.
Hassan Mansour
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detection device, recording medium, and positioning method
Patent number
11,940,397
Issue date
Mar 26, 2024
Horiba, Ltd.
Tomoki Aoyama
G01 - MEASURING TESTING
Information
Patent Grant
Inertial point-source matter-wave atom interferometer gyroscope and...
Patent number
11,940,276
Issue date
Mar 26, 2024
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
John Edward Kitching
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Finger devices with self-mixing interferometric proximity sensors
Patent number
11,940,293
Issue date
Mar 26, 2024
Apple Inc.
Mengshu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interferometer and optical instrument with integrated optical compo...
Patent number
11,933,609
Issue date
Mar 19, 2024
Yokogawa Electric Corporation
Nobuhide Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Quantum interferometer with improved entangled photon identification
Patent number
11,933,608
Issue date
Mar 19, 2024
Qubit Moving and Storage, LLC
Gary Vacon
G01 - MEASURING TESTING
Information
Patent Grant
Optical tomography system and method of using
Patent number
11,933,610
Issue date
Mar 19, 2024
NEC Corporation
John Kenji David Clark
G01 - MEASURING TESTING
Information
Patent Grant
Measurement machine and method for detecting a defect in solder joints
Patent number
11,927,436
Issue date
Mar 12, 2024
Hewlett Packard Enterprise Development LP
Jaime E. Llinas
G01 - MEASURING TESTING
Information
Patent Grant
Intra-oral scanning device with integrated optical coherence tomogr...
Patent number
11,925,435
Issue date
Mar 12, 2024
D4D Technologies, LLC
Ye Li
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Apparatus and methods for determining the position of a target stru...
Patent number
11,927,891
Issue date
Mar 12, 2024
ASML Netherlands B.V.
Nitesh Pandey
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for characterizing the surface shape of an optica...
Patent number
11,927,500
Issue date
Mar 12, 2024
Carl Zeiss SMT GmbH
Steffen Siegler
G01 - MEASURING TESTING
Information
Patent Grant
Workpiece processing machine and method for processing a workpiece,...
Patent number
11,925,999
Issue date
Mar 12, 2024
Trumpf Laser- und Systemtechnik GmbH
Jan-Patrick Hermani
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Self-mixing inteferometry sensor module, electronic device and meth...
Patent number
11,927,441
Issue date
Mar 12, 2024
ams International AG
Ferran Suarez
G01 - MEASURING TESTING
Information
Patent Grant
System and method for correcting optical path length measurement er...
Patent number
11,920,928
Issue date
Mar 5, 2024
Tokyo Electron Limited
Kenji Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Light-sheet photonic-force optical coherence elastography
Patent number
11,920,930
Issue date
Mar 5, 2024
Cornell University
Steven G Adie
G01 - MEASURING TESTING
Information
Patent Grant
On-chip signal processing method and pixel-array signal
Patent number
11,921,285
Issue date
Mar 5, 2024
Arizona Board of Regents on behalf of the University of Arizona
John Koshel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Holographic three-dimensional multi-spot light stimulation device a...
Patent number
11,921,045
Issue date
Mar 5, 2024
National University Corporation Kobe University
Osamu Matoba
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Detecting and guiding optical connection(s) for one or more imaging...
Patent number
11,920,929
Issue date
Mar 5, 2024
Canon U.S.A., Inc.
Badr Elmaanaoui
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Non-contact measurement for interface gaps
Patent number
11,920,915
Issue date
Mar 5, 2024
The Boeing Company
Farahnaz Sisco
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Extended reach ring interferometer with at least two broadband ligh...
Patent number
11,913,785
Issue date
Feb 27, 2024
Zbigniew Sobolewski
G01 - MEASURING TESTING
Information
Patent Grant
Locking a self-homodyne mixed beat frequency to an external frequen...
Patent number
11,914,038
Issue date
Feb 27, 2024
Aeva, Inc.
Bryce Bradford
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
Publication number
20240133673
Publication date
Apr 25, 2024
Samsung Electronics Co., Ltd.
Garam CHOI
G01 - MEASURING TESTING
Information
Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
Publication number
20240133674
Publication date
Apr 25, 2024
THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
Shuixing Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method and System for Determining the Location of Artefacts and/or...
Publication number
20240133822
Publication date
Apr 25, 2024
The Australian National University
Roland Fleddermann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Solid-State Distinct-Unidirectional Photonic Interferometers for Co...
Publication number
20240133672
Publication date
Apr 25, 2024
Val Parker
G01 - MEASURING TESTING
Information
Patent Application
FILTERING FOR CO-SENSOR FUSION IN ATOMIC SENSORS
Publication number
20240125587
Publication date
Apr 18, 2024
Vector Atomic, Inc.
Jonathan Lynn KOHLER
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
OPTICAL ALIGNMENT APPARATUS AND METHOD FOR SURFACE MOUNTABLE OPTICA...
Publication number
20240126041
Publication date
Apr 18, 2024
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
HAECHUNG KANG
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC MICROSCOPE
Publication number
20240126206
Publication date
Apr 18, 2024
KOREA PHOTONICS TECHNOLOGY INSTITUTE
Seon Kyu YOON
G01 - MEASURING TESTING
Information
Patent Application
NIRAF Calibration Packaging Phantom
Publication number
20240125588
Publication date
Apr 18, 2024
Canon U.S.A., Inc.
Emily Chernich
G01 - MEASURING TESTING
Information
Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
Publication number
20240118072
Publication date
Apr 11, 2024
Samsung Electronics Co., Ltd.
Sungho Jang
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
Publication number
20240115128
Publication date
Apr 11, 2024
Carl Zeiss Meditec, Inc.
Tilman Schmoll
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
Publication number
20240115222
Publication date
Apr 11, 2024
Weng-Dah Ken
G04 - HOROLOGY
Information
Patent Application
OPTICAL LOCKER
Publication number
20240110778
Publication date
Apr 4, 2024
Lumentum Technology UK Limited
Adrian Perrin JANSSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20240110779
Publication date
Apr 4, 2024
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MINIATURIZED MOBILE, LOW COST OPTICAL COHERENCE TOMOGRAPHY SYSTEM F...
Publication number
20240108216
Publication date
Apr 4, 2024
Acucela Inc.
Lukas Scheibler
G01 - MEASURING TESTING
Information
Patent Application
LASER DEVICE
Publication number
20240106198
Publication date
Mar 28, 2024
NKT PHOTONICS A/S
Jens E. PEDERSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY
Publication number
20240094642
Publication date
Mar 21, 2024
KLA Corporation
Franz Zach
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRO-ACOUSTIC TRANSDUCER
Publication number
20240098410
Publication date
Mar 21, 2024
ams Sensors Singapore Pte. Ltd.
Laurent NEVOU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEMS AND METHODS FOR SURFACE PROFILE ESTIMATION VIA OPTICAL COHE...
Publication number
20240090768
Publication date
Mar 21, 2024
Mitsubishi Electric Research Laboratories, Inc.
Joshua Rapp
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...
Publication number
20240085776
Publication date
Mar 14, 2024
TECHNOLOGIES DIGITHO INC.
Richard BEAUDRY
G01 - MEASURING TESTING
Information
Patent Application
Apparatus of Inner Light Layer Illumination by Multi-beam Interfere...
Publication number
20240085168
Publication date
Mar 14, 2024
Shangqing Liu
G02 - OPTICS
Information
Patent Application
SYSTEMS AND METHODS OF IMAGING WITH MULTI-DOMAIN IMAGE SENSOR
Publication number
20240085169
Publication date
Mar 14, 2024
QUALCOMM Incorporated
Yun-Chieh CHANG
G02 - OPTICS
Information
Patent Application
METHOD OF CALIBRATING OPTICAL COHERENCE TOMOGRAPHY APPARATUS TO MEA...
Publication number
20240077300
Publication date
Mar 7, 2024
University of Manitoba
RODRIGO DE OLIVEIRA FRANÇA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING INSTRUMENT WITH A SCANNING ABSOLUTE DISTANCE METER
Publication number
20240077301
Publication date
Mar 7, 2024
Leica Geosystems AG
Thomas LÜTHI
G01 - MEASURING TESTING
Information
Patent Application
ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
Publication number
20240077304
Publication date
Mar 7, 2024
TOKYO SEIMITSU CO., LTD.
Tasuku SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
BROADBAND INTERFEROMETRIC CONFOCAL MICROSCOPE
Publication number
20240068797
Publication date
Feb 29, 2024
University of Rochester
Arturo Alejandro Canales Benavides
G11 - INFORMATION STORAGE
Information
Patent Application
MULTI-PITCH GRID OVERLAY TARGET FOR SCANNING OVERLAY METROLOGY
Publication number
20240068804
Publication date
Feb 29, 2024
KLA Corporation
Yuval Lubashevsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTRAORAL OCT WITH COLOR TEXTURE
Publication number
20240065552
Publication date
Feb 29, 2024
Dental Imaging Technologies Corporation
Chuanmao FAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SELF-MIXING INTEFEROMETRY SENSOR MODULE, ELECTRONIC DEVICE AND METH...
Publication number
20240060766
Publication date
Feb 22, 2024
ams International AG
Ferran SUAREZ
G01 - MEASURING TESTING
Information
Patent Application
AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARA...
Publication number
20240061351
Publication date
Feb 22, 2024
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G01 - MEASURING TESTING
Information
Patent Application
MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING
Publication number
20240061226
Publication date
Feb 22, 2024
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Stephen A. Boppart
G02 - OPTICS