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Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R1/00
Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
Sub Industries
G01R1/02
General constructional details
G01R1/025
concerning dedicated user interfaces
G01R1/04
Housings Supporting members Arrangements of terminals
G01R1/0408
Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
G01R1/0416
Connectors, terminals
G01R1/0425
Test clips
G01R1/0433
Sockets for IC's or transistors
G01R1/0441
Details
G01R1/045
Sockets or component fixtures for RF or HF testing
G01R1/0458
related to environmental aspects
G01R1/0466
concerning contact pieces or mechanical details
G01R1/0475
for TAB IC's
G01R1/0483
Sockets for un-leaded IC's having matrix type contact fields
G01R1/0491
for testing integrated circuits on wafers
G01R1/06
Measuring leads Measuring probes
G01R1/067
Measuring probes
G01R1/06705
Apparatus for holding or moving single probes
G01R1/06711
Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
G01R1/06716
Elastic
G01R1/06722
Spring-loaded
G01R1/06727
Cantilever beams
G01R1/06733
Geometry aspects
G01R1/06738
related to tip portion
G01R1/06744
Microprobes
G01R1/0675
Needle-like
G01R1/06755
Material aspects
G01R1/06761
related to layers
G01R1/06766
Input circuits therefor
G01R1/06772
High frequency probes
G01R1/06777
High voltage probes
G01R1/06783
containing liquids
G01R1/06788
Hand-held or hand-manipulated probes
G01R1/06794
Devices for sensing when probes are in contact, or in position to contact, with measured object
G01R1/07
Non-contact-making probes
G01R1/071
containing electro-optic elements
G01R1/072
containing ionised gas
G01R1/073
Multiple probes
G01R1/07307
with individual probe elements
G01R1/07314
the body of the probe being perpendicular to test object
G01R1/07321
the probes being of different lengths
G01R1/07328
for testing printed circuit boards
G01R1/07335
for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
G01R1/07342
the body of the probe being at an angle other than perpendicular to test object
G01R1/0735
arranged on a flexible frame or film
G01R1/07357
with flexible bodies
G01R1/07364
with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
G01R1/07371
using an intermediate card or back card with apertures through which the probes pass
G01R1/07378
using an intermediate adapter
G01R1/07385
using switching of signals between probe tips and test bed
G01R1/07392
manipulating each probe element or tip individually
G01R1/08
Pointers Scales Scale illumination
G01R1/10
Arrangements of bearings
G01R1/12
of strip or wire bearings
G01R1/14
Braking arrangements Damping arrangements
G01R1/16
Magnets
G01R1/18
Screening arrangements against electric or magnetic fields
G01R1/20
Modifications of basic electric elements for use in electric measuring instruments Structural combinations of such elements with such instruments
G01R1/203
Resistors used for electric measuring
G01R1/206
Switches for connection of measuring instruments or electric motors to measuring loads
G01R1/22
Tong testers acting as secondary windings of current tranformers
G01R1/24
Transmission-line
G01R1/26
with linear movement of probe
G01R1/28
Provision in measuring instruments for reference values
G01R1/30
Structural combination of electric measuring instruments with basic electronic circuits
G01R1/36
Overload protection arrangements or circuits for electric measuring instruments
G01R1/38
Arrangements for altering the indicating characteristic
G01R1/40
Modifications of instruments to indicate the maximum or the minimum value reached in a time interval
G01R1/42
thermally operated
G01R1/44
Modifications of instruments for temperature compensation
Industries
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Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
High current contact for contacting a high current socket
Patent number
11,978,977
Issue date
May 7, 2024
Lisa Draxlmaier GmbH
Manuel Kagerhuber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Broken rail detector
Patent number
11,975,750
Issue date
May 7, 2024
Athena Industrial Technologies Inc.
Paul D. Gies
B61 - RAILWAYS
Information
Patent Grant
Method for manufacturing semiconductor device
Patent number
11,977,099
Issue date
May 7, 2024
HITACHI HIGH-TECH CORPORATION
Tomohisa Ohtaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection jig
Patent number
11,977,100
Issue date
May 7, 2024
NIDEC READ CORPORATION
Michio Kaida
G01 - MEASURING TESTING
Information
Patent Grant
State detection apparatus
Patent number
11,977,101
Issue date
May 7, 2024
Yokogawa Electric Corporation
Nobuhiro Kanatani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for testing an integrated circuit of a device and its method...
Patent number
11,977,098
Issue date
May 7, 2024
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Diode voltage measurement systems
Patent number
11,977,102
Issue date
May 7, 2024
Simmonds Precision Products, Inc.
Scott R. Durkee
G01 - MEASURING TESTING
Information
Patent Grant
Power device monitoring system and monitoring method
Patent number
11,977,103
Issue date
May 7, 2024
LS ELECTRIC CO., LTD.
Sunghee Kang
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring set-up to detect supply-line faults for a control unit
Patent number
11,977,108
Issue date
May 7, 2024
Robert Bosch GmbH
Rainer Zuschlag
G01 - MEASURING TESTING
Information
Patent Grant
Holding device, current monitoring device, and power supply device
Patent number
11,980,002
Issue date
May 7, 2024
DENSO TEN Limited
Kazuya Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Supply voltage proportionality monitoring in a system-on-chip (SOC)
Patent number
11,977,664
Issue date
May 7, 2024
NXP USA, INC.
Markus Regner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fault detection for a solid state power converter
Patent number
11,977,131
Issue date
May 7, 2024
Rolls-Royce North American Technologies, Inc.
Yu Yang
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Pull out-assisting linkage device for test load board of automatic...
Patent number
11,977,111
Issue date
May 7, 2024
Zhijie Bao
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic timing for shutdown including asynchronous dynamic random a...
Patent number
11,977,900
Issue date
May 7, 2024
Hewlett Packard Enterprise Development LP
Jared Johnson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Resonant conversion system and control method
Patent number
11,979,086
Issue date
May 7, 2024
HUAWEI DIGITAL POWER TECHNOLOGIES CO., LTD.
Ken Chin
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Amplifier circuitry and current sensor having the same
Patent number
11,979,120
Issue date
May 7, 2024
Alps Alpine Co., Ltd.
Takaharu Uekura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Mounting device, switchgear cabinet and read-out device
Patent number
11,977,104
Issue date
May 7, 2024
WAGO Verwaltungsgesellschaft mbH
Sascha Kulas
G01 - MEASURING TESTING
Information
Patent Grant
Current and voltage measuring unit
Patent number
11,977,105
Issue date
May 7, 2024
SORAYTEC SCANDINAVIA
Harutyun Sargsyan
G01 - MEASURING TESTING
Information
Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
Patent number
11,971,449
Issue date
Apr 30, 2024
Technoprobe S.p.A.
Flavio Maggioni
G01 - MEASURING TESTING
Information
Patent Grant
Electrical fault detection device and vehicle power supply system
Patent number
11,971,458
Issue date
Apr 30, 2024
Sanyo Electric Co., LTD
Masato Nakayama
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Level shifter with automatic direction sensing
Patent number
11,973,499
Issue date
Apr 30, 2024
Texas Instruments Incorporated
Deric Wayne Waters
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electrical connector and device for testing conduction
Patent number
11,973,289
Issue date
Apr 30, 2024
SUZHOU HYC TECHNOLOGY CO., LTD.
Jianye Xu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Variable power supply and load system
Patent number
11,971,762
Issue date
Apr 30, 2024
SIGMASENSE, LLC.
Patrick Troy Gray
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical probe, optical probe array, optical probe card, and method...
Patent number
11,971,431
Issue date
Apr 30, 2024
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
G01 - MEASURING TESTING
Information
Patent Grant
Current measuring device for switched-mode power converters and reg...
Patent number
11,971,433
Issue date
Apr 30, 2024
Inventronics GmbH
Joachim Muehlschlegel
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Power source with error detection
Patent number
11,971,434
Issue date
Apr 30, 2024
KEITHLEY INSTRUMENTS, LLC
William C. Weeman
G01 - MEASURING TESTING
Information
Patent Grant
System and method for identifying product information
Patent number
11,971,435
Issue date
Apr 30, 2024
Opple Lighting Co., Ltd
Guoping Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for determining a phase shift between a phase cur...
Patent number
11,971,436
Issue date
Apr 30, 2024
Bombardier Primove GmbH
Andreas Büming
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Magnetic field detection and interaction
Patent number
11,972,674
Issue date
Apr 30, 2024
Aclara Technologies LLC
Thomas Lee McDougall
G08 - SIGNALLING
Information
Patent Grant
Mass-interconnect engaging device
Patent number
11,971,430
Issue date
Apr 30, 2024
Jeffery P. Stowers
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...
Publication number
20240142495
Publication date
May 2, 2024
Sumitomo Electric Industries, Ltd.
Kosuke FUJII
G01 - MEASURING TESTING
Information
Patent Application
Defect Type Classifying System and Defect Type Classifying Method
Publication number
20240142535
Publication date
May 2, 2024
LG ENERGY SOLUTION, LTD.
Jaeyoon Jeong
G01 - MEASURING TESTING
Information
Patent Application
SOCKET FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20240142493
Publication date
May 2, 2024
Samsung Electronics Co., Ltd.
Sanguk Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POWER RECEIVING AND DISTRIBUTING EQUIPMENT MANAGEMENT DEVICE, POWER...
Publication number
20240146055
Publication date
May 2, 2024
Mitsubishi Electric Corporation
Yoshitsugu KAWAMURA
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
Publication number
20240142492
Publication date
May 2, 2024
CHROMA ATE INC.
I-Shih TSENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AN...
Publication number
20240142497
Publication date
May 2, 2024
RENESAS ELECTRONICS CORPORATION
Masaaki TANIMURA
G01 - MEASURING TESTING
Information
Patent Application
VOLTAGE DETECTION DEVICE AND METHOD FOR PREVENTING SYSTEM FAILURE
Publication number
20240142498
Publication date
May 2, 2024
SigmaStar Technology Ltd.
Wei-Ping WANG
G01 - MEASURING TESTING
Information
Patent Application
FOLDED CURRENT SENSE SHUNT RESISTOR
Publication number
20240142499
Publication date
May 2, 2024
Schweitzer Engineering Laboratories, Inc.
James Mobley
G01 - MEASURING TESTING
Information
Patent Application
COMPACT CURRENT SENSING FOR PROTECTION AND WIRING DEVICES
Publication number
20240142500
Publication date
May 2, 2024
SCHNEIDER ELECTRIC USA, INC.
Andi Jakupi
G01 - MEASURING TESTING
Information
Patent Application
Load Shed System
Publication number
20240146099
Publication date
May 2, 2024
Generac Power Systems, Inc.
Brendan Pancheri
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
PEN PROBE WITH NON-PRECIOUS METAL WIRE FOR USE IN PRECIOUS METAL TE...
Publication number
20240142494
Publication date
May 2, 2024
Jarrett Schaffer
G01 - MEASURING TESTING
Information
Patent Application
CONDUCTIVE PERFORATED PLATE FOR ELECTRICAL TEST
Publication number
20240142496
Publication date
May 2, 2024
TEXAS INSTRUMENTS INCORPORATED
Wolfgang Weiss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC DEVICE
Publication number
20240142522
Publication date
May 2, 2024
Innolux Corporation
Chih-Yung Hsieh
G01 - MEASURING TESTING
Information
Patent Application
VOLTAGE BOOSTER ISOLATION TRANSFORMER SYSTEM AND METHOD OF OPERATIN...
Publication number
20240145164
Publication date
May 2, 2024
HUBBELL INCORPORATED
Steve Liscinsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Fault Detection for a Flying Capacitor Converter
Publication number
20240142501
Publication date
May 2, 2024
ABB Schweiz AG
Sami Pettersson
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SYSTEM AND METHOD FOR CONTROLLING AN ELECTRICAL RECEPTACLE
Publication number
20240146048
Publication date
May 2, 2024
HUBBELL INCORPORATED
Robert Simon
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
MOTOR-DRIVING APPARATUS
Publication number
20240146229
Publication date
May 2, 2024
Hyundai Motor Company
Kang Ho Jeong
B60 - VEHICLES IN GENERAL
Information
Patent Application
CURRENT SENSOR WITH INVERTED SHIELDING ELEMENT
Publication number
20240147681
Publication date
May 2, 2024
Suzhou Littelfuse OVS Co., Ltd.
Tao Chen
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MONITORING AT LEAST ONE SEMICONDUCTOR ELEMENT IN A SEMIC...
Publication number
20240133924
Publication date
Apr 25, 2024
SIEMENS AKTIENGESELLSCHAFT
ULRICH WETZEL
G01 - MEASURING TESTING
Information
Patent Application
LOCALIZED IR DROP DETECTION AND CALIBRATION SCHEME TO CREATE HIGH A...
Publication number
20240133925
Publication date
Apr 25, 2024
Intel Corporation
Chia How Low
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR CIRCUIT
Publication number
20240133927
Publication date
Apr 25, 2024
NXP B.V.
Joachim Josef Maria Kruecken
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ABNORMAL DETECTION CIRCUIT FOR DETECTING THREE-PHASE AC POWER
Publication number
20240133928
Publication date
Apr 25, 2024
Industrial Technology Research Institute
Wen-Cheng Liang
G01 - MEASURING TESTING
Information
Patent Application
CURRENT DETECTION CIRCUIT, SWITCHING POWER SUPPLY DEVICE, AND INDUS...
Publication number
20240133930
Publication date
Apr 25, 2024
Rohm Co., Ltd.
Kazuhiro Horii
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
TESTING MODULE AND TESTING METHOD USING THE SAME
Publication number
20240133942
Publication date
Apr 25, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Hao Chen
G01 - MEASURING TESTING
Information
Patent Application
DUAL CURRENT MAGNETIC FIELD SENSOR
Publication number
20240133981
Publication date
Apr 25, 2024
INFINEON TECHNOLOGIES AG
Stephan LEISENHEIMER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Device and method for ratiometric measurement of voltages for an an...
Publication number
20240133929
Publication date
Apr 25, 2024
AVL Software and Functions GmbH
Michele BEDIN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE
Publication number
20240133941
Publication date
Apr 25, 2024
CARUX TECHNOLOGY PTE. LTD.
Chao-Chin Sung
G01 - MEASURING TESTING
Information
Patent Application
BATTERY CURRENT MONITORING METHOD, CONTROLLER AND CIRCUIT
Publication number
20240133956
Publication date
Apr 25, 2024
HUIZHOU ROYPOW TECHNOLOGY CO., LTD
Tingjun RUAN
G01 - MEASURING TESTING
Information
Patent Application
DETECTION CIRCUIT FOR POWER SUPPLY CIRCUIT
Publication number
20240136916
Publication date
Apr 25, 2024
Power Forest Technology Corporation
Chia-Hsien Liu
G05 - CONTROLLING REGULATING
Information
Patent Application
VOLTAGE SUPERVISOR
Publication number
20240134407
Publication date
Apr 25, 2024
TEXAS INSTRUMENTS INCORPORATED
Ramakrishna ANKAMREDDI
G06 - COMPUTING CALCULATING COUNTING