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Particle spectrometer or separator tubes
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H01J49/00
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Parent Industries
H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Current Industry
H01J49/00
Particle spectrometer or separator tubes
Sub Industries
H01J49/0004
Imaging particle spectrometry
H01J49/0009
Calibration of the apparatus
H01J49/0013
Miniaturised spectrometers
H01J49/0018
Microminiaturised spectrometers
H01J49/0022
Portable spectrometers
H01J49/0027
Methods for using particle spectrometers
H01J49/0031
Step by step routines describing the use of the apparatus
H01J49/0036
Step by step routines describing the handling of the data generated during a measurement
H01J49/004
Combinations of spectrometers, tandem spectrometers
H01J49/0045
characterised by the fragmentation or other specific reaction
H01J49/005
by collision with gas
H01J49/0054
by an electron beam
H01J49/0059
by a photon beam, photo-dissociation
H01J49/0063
by applying a resonant excitation voltage
H01J49/0068
by collision with a surface
H01J49/0072
by ion/ion reaction
H01J49/0077
specific reactions other than fragmentation
H01J49/0081
Tandem in time
H01J49/0086
Accelerator mass spectrometers
H01J49/009
Spectrometers having multiple channels, parallel analysis
H01J49/0095
Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
H01J49/02
Details
H01J49/022
Circuit arrangements
H01J49/025
Detectors specially adapted to particle spectrometers
H01J49/027
detecting image current induced by the movement of charged particles
H01J49/04
Arrangements for introducing or extracting samples to be analysed
H01J49/0404
Capillaries used for transferring samples or ions
H01J49/0409
Sample holders or containers
H01J49/0413
for automated handling
H01J49/0418
for laser desorption
H01J49/0422
for gaseous samples
H01J49/0427
using a membrane permeable to gases
H01J49/0431
for liquid samples
H01J49/0436
using a membrane permeable to liquids
H01J49/044
with means for preventing droplets from entering the analyzer; Desolvation of droplets
H01J49/0445
with means for introducing as a spray, a jet or an aerosol
H01J49/045
with means for using a nebulising gas
H01J49/0454
with means for vaporising using mechanical energy
H01J49/0459
for solid samples
H01J49/0463
Desorption by laser or particle beam, followed by ionisation as a separate step
H01J49/0468
with means for heating or cooling the sample
H01J49/0472
with means for pyrolysis
H01J49/0477
using a hot fluid
H01J49/0481
with means for collisional cooling
H01J49/0486
with means for monitoring the sample temperature
H01J49/049
with means for applying heat to desorb the sample; Evaporation
H01J49/0495
Vacuum locks; Valves
H01J49/06
Electron- or ion-optical arrangements
H01J49/061
Ion deflecting means
H01J49/062
Ion guides
H01J49/063
Multipole ion guides
H01J49/065
having stacked electrodes
H01J49/066
Ion funnels
H01J49/067
Ion lenses, apertures, skimmers
H01J49/068
Mounting, supporting, spacing, or insulating electrodes
H01J49/08
Electron sources
H01J49/10
Ion sources Ion guns
H01J49/102
using reflex discharge
H01J49/105
using high-frequency excitation
H01J49/107
Arrangements for using several ion sources
H01J49/12
using an arc discharge
H01J49/123
Duoplasmatrons
H01J49/126
Other arc discharge ion sources using an applied magnetic field
H01J49/14
using particle bombardment
H01J49/142
using a solid target which is not previously vapourised
H01J49/145
using chemical ionisation
H01J49/147
with electrons
H01J49/16
using surface ionisation
H01J49/161
using photoionisation
H01J49/162
Direct photo-ionisation
H01J49/164
Laser desorption/ionisation
H01J49/165
Electrospray ionisation
H01J49/167
Capillaries and nozzles specially adapted therefor
H01J49/168
field ionisation
H01J49/18
using spark ionisation
H01J49/20
Magnetic deflection
H01J49/22
Electrostatic deflection
H01J49/24
Vacuum systems
H01J49/26
Mass spectrometers or separator tubes
H01J49/28
Static spectrometers
H01J49/282
using electrostatic analysers
H01J49/284
using electrostatic and magnetic sectors with simple focusing
H01J49/286
with energy analysis
H01J49/288
using crossed electric and magnetic fields perpendicular to the beam
H01J49/30
using magnetic analysers
H01J49/305
with several sectors in tandem
H01J49/32
using double focusing
H01J49/322
with a magnetic sector of 90 degrees
H01J49/324
with an electrostatic section of 90 degrees
H01J49/326
with magnetic and electrostatic sectors of 90 degrees
H01J49/328
with a cycloidal trajectory by using crossed electric and magnetic fields
H01J49/34
Dynamic spectrometers
H01J49/36
Radio frequency spectrometers
H01J49/38
Omegatrons Using ion cyclotron resonance
H01J49/40
Time-of-flight spectrometers
H01J49/401
characterised by orthogonal acceleration
H01J49/403
characterised by the acceleration optics and/or the extraction fields
H01J49/405
characterised by the reflectron
H01J49/406
with multiple reflections
H01J49/408
with multiple changes of direction
H01J49/42
Stability-of-path spectrometers
H01J49/4205
Device types
H01J49/421
Mass filters
H01J49/4215
Quadrupole mass filters
H01J49/422
Two-dimensional RF ion traps
H01J49/4225
Multipole linear ion traps
H01J49/423
with radial ejection
H01J49/4235
Stacked rings or stacked plates
H01J49/424
Three-dimensional ion traps
H01J49/4245
Electrostatic ion traps
H01J49/425
with a logarithmic radial electric potential
H01J49/4255
with particular constructional features
H01J49/426
Methods for controlling ions
H01J49/4265
Controlling the number of trapped ions, preventing space charge effects
H01J49/427
Ejection and selection methods
H01J49/4275
Applying a non-resonant auxiliary oscillating voltage
H01J49/428
Applying a notched broadband signal
H01J49/4285
Applying a resonant signal
H01J49/429
Scanning an electric parameter
H01J49/4295
Storage methods
H01J49/44
Energy spectrometers
H01J49/443
Dynamic spectrometers
H01J49/446
Time-of-flight spectrometers
H01J49/46
Static spectrometers
H01J49/463
using static magnetic fields
H01J49/466
using crossed electric and magnetic fields perpendicular to the beam
H01J49/48
using electrostatic analysers
H01J49/482
with cylindrical mirrors
H01J49/484
with spherical mirrors
H01J49/486
with plane mirrors
H01J49/488
with retarding grids
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Manufacturing method for an ion guide
Patent number
11,978,618
Issue date
May 7, 2024
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion shuttling system with compensation electrodes for ion trap
Patent number
11,978,619
Issue date
May 7, 2024
Infineon Technologies Austria AG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to correct ion source inefficiencies makes sample-to-sample...
Patent number
11,977,008
Issue date
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Patent Grant
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Patent number
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Issue date
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Information
Patent Grant
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Patent number
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Issue date
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Patent Grant
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Patent number
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Issue date
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Patent number
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for preparing sample and analysis method
Patent number
11,971,336
Issue date
Apr 30, 2024
Shimadzu Corporation
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
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Patent number
11,971,386
Issue date
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Filament assembly
Patent number
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Issue date
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Patent number
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Voltage supply for a mass analyser
Patent number
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Issue date
Apr 30, 2024
Thermo Fisher Scientific (Bremen) GmbH
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron capture detector
Patent number
11,971,394
Issue date
Apr 30, 2024
SHARP KABUSHIKI KAISHA
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
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Patent number
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Issue date
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Leidos, Inc.
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H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
High resolution imaging apparatus and method
Patent number
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Issue date
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Standard BioTools Canada Inc.
Paul Corkum
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Surface-assisted laser desorption/ionization method, mass spectrome...
Patent number
11,961,728
Issue date
Apr 16, 2024
Hamamatsu Photonics K.K.
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light absorption anisotropic film, laminate, and image display device
Patent number
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Issue date
Apr 16, 2024
FUJIFILM Corporation
Yumi Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer and program for mass spectrometer
Patent number
11,961,727
Issue date
Apr 16, 2024
Shimadzu Corporation
Yuki Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High confidence compound identification by liquid chromatography-ma...
Patent number
11,959,897
Issue date
Apr 16, 2024
REGENERON PHARMACEUTICALS, INC.
Jikang Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In situ chemical transformation and ionization of inorganic perchlo...
Patent number
11,959,846
Issue date
Apr 16, 2024
SMITHS DETECTION MONTREAL INC.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrum processing apparatus and method
Patent number
11,961,726
Issue date
Apr 16, 2024
Jeol Ltd.
Hirokazu Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transfer line, GCMS arrangement and mounting assembly
Patent number
11,959,896
Issue date
Apr 16, 2024
Micromass UK Limited
Carl Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Identification and scoring of related compounds in complex samples
Patent number
11,959,898
Issue date
Apr 16, 2024
DH Technologies Development Pte. Ltd.
Stephen A. Tate
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Longitudinal tool for cleaning ion optic multipole devices
Patent number
11,961,729
Issue date
Apr 16, 2024
Thermo Fisher Scientific (Bremen) GmbH
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B08 - CLEANING
Information
Patent Grant
Plasma generating device
Patent number
11,961,730
Issue date
Apr 16, 2024
Atonarp Inc.
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion detector
Patent number
11,955,327
Issue date
Apr 9, 2024
HITACHI HIGH-TECH CORPORATION
Kiyomi Yoshinari
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for trapping and accumulation of ions
Patent number
11,953,466
Issue date
Apr 9, 2024
MOBILion Systems, Inc.
John Daniel DeBord
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-device removal and installation tool
Patent number
11,955,326
Issue date
Apr 9, 2024
Agilent Technologies, Inc.
Alan D. Loux
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
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Patent Grant
Agnostic compound elution determination
Patent number
11,953,478
Issue date
Apr 9, 2024
DH Technologies Development Pte. Ltd.
Nic G. Bloomfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fast cooling of ion motion in a long chain using local modes
Patent number
11,954,560
Issue date
Apr 9, 2024
IONQ, INC.
Shantanu Debnath
G06 - COMPUTING CALCULATING COUNTING
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Publication date
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H01 - BASIC ELECTRIC ELEMENTS
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Publication date
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H01 - BASIC ELECTRIC ELEMENTS
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20240142415
Publication date
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H01 - BASIC ELECTRIC ELEMENTS
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Publication date
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Micromass UK Limited
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H01 - BASIC ELECTRIC ELEMENTS
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20240145228
Publication date
May 2, 2024
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Publication date
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ION SOURCE NEBULISER
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Publication date
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Micromass UK Limited
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H01 - BASIC ELECTRIC ELEMENTS
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DUCTING GAS OF MASS SPECTROMETER
Publication number
20240136171
Publication date
Apr 25, 2024
Thermo Finnigan LLC
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H01 - BASIC ELECTRIC ELEMENTS
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SYSTEMS AND METHODS FOR INCREASING REACTION YIELD
Publication number
20240131490
Publication date
Apr 25, 2024
Purdue Research Foundation
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Methods and Apparatus for Washing Sampling Probe for Use in Mass Sp...
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20240136168
Publication date
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20240136167
Publication date
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Publication date
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H01 - BASIC ELECTRIC ELEMENTS
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20240136170
Publication date
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR TRAPPING IONS
Publication number
20240136172
Publication date
Apr 25, 2024
Thermo Fisher Scientific (Bremen) GmbH
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FUNCTIONALIZED CALIBRANTS FOR SPECTROMETRY AND CHROMATOGRAPHY
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20240128067
Publication date
Apr 18, 2024
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H01 - BASIC ELECTRIC ELEMENTS
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APPARATUS AND METHOD FOR AGRICULTURAL CONTAMINANT DETECTION
Publication number
20240128068
Publication date
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Publication date
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20240128072
Publication date
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FAST COOLING OF ION MOTION IN A LONG CHAIN USING LOCAL MODES
Publication number
20240127091
Publication date
Apr 18, 2024
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G06 - COMPUTING CALCULATING COUNTING
Information
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INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...
Publication number
20240128071
Publication date
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C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
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Publication number
20240128069
Publication date
Apr 18, 2024
DH Technologies Development Pte. Ltd.
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR ANALYZING A SAMPLE
Publication number
20240118212
Publication date
Apr 11, 2024
Analytik Jena GmbH+Co. KG
Marcus Großmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRY DEVICE AND ANALYSIS METHOD
Publication number
20240120190
Publication date
Apr 11, 2024
SHIMADZU CORPORATION
Takuro KISHIDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYSIS PLATE FOR A MASS SPECTROMETRY ANALYSIS AND ASSOCIATED METH...
Publication number
20240118287
Publication date
Apr 11, 2024
BIOMERIEUX
Jean-Philippe CHARRIER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETRIC QUANTITATION ASSAY FOR METABOLITES OF LEFLUNOMIDE
Publication number
20240118294
Publication date
Apr 11, 2024
Quest Diagnostics Investments LLC
Karin O. Thomassian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETERMINATION OF ANTIDEPRESSANTS BY MASS SPECTROMETRY
Publication number
20240120188
Publication date
Apr 11, 2024
Quest Diagnostics Investments LLC
Anita Dermartirosian
H01 - BASIC ELECTRIC ELEMENTS