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Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
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Industry
CPC
G11C29/00
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Parent Industries
G
PHYSICS
G11
Information storage
G11C
STATIC STORES
Current Industry
G11C29/00
Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
Sub Industries
G11C29/003
in serial memories
G11C29/006
at wafer scale level
G11C29/02
Detection or location of defective auxiliary circuits
G11C29/021
in voltage or current generators
G11C29/022
in I/O circuitry
G11C29/023
in clock generator or timing circuitry
G11C29/024
in decoders
G11C29/025
in signal lines
G11C29/026
in sense amplifiers
G11C29/027
in fuses
G11C29/028
with adaption or trimming of parameters
G11C29/04
Detection or location of defective memory elements
G11C29/06
Acceleration testing
G11C29/08
Functional testing
G11C29/10
Test algorithms
G11C29/12
Built-in arrangements for testing
G11C29/12005
comprising voltage or current generators
G11C29/1201
comprising I/O circuitry
G11C29/12015
comprising clock generation or timing circuitry
G11C29/14
Implementation of control logic
G11C29/16
using microprogrammed units
G11C29/18
Address generation devices Devices for accessing memories
G11C29/20
using counters or linear-feedback shift registers [LFSR]
G11C29/22
Accessing serial memories
G11C29/24
Accessing extra cells
G11C29/26
Accessing multiple arrays
G11C29/28
Dependent multiple arrays
G11C29/30
Accessing single arrays
G11C29/32
Serial access Scan testing
G11C29/34
Accessing multiple bits simultaneously
G11C29/36
Data generation devices
G11C29/38
Response verification devices
G11C29/40
using compression techniques
G11C29/42
using error correcting codes [ECC] or parity check
G11C29/44
Indication or identification of errors
G11C29/4401
for self repair
G11C29/46
Test trigger logic
G11C29/48
Arrangements in static stores specially adapted for testing by means external to the store
G11C29/50
Marginal testing
G11C29/50004
of threshold voltage
G11C29/50008
of impedance
G11C29/50012
of timing
G11C29/50016
of retention
G11C29/52
Protection of memory contents Detection of errors in memory contents
G11C29/54
Arrangements for designing test circuits
G11C29/56
External testing equipment for static stores
G11C29/56004
Pattern generation
G11C29/56008
Error analysis, representation of errors
G11C29/56012
Timing aspects, clock generation, synchronisation
G11C29/56016
Apparatus features
G11C29/70
Masking faults in memories by using spares or by reconfiguring
G11C29/702
by replacing auxiliary circuits
G11C29/72
with optimized replacement algorithms
G11C29/74
using duplex memories
G11C29/76
using address translation or modifications
G11C29/765
in solid state disks
G11C29/78
using programmable devices
G11C29/781
combined in a redundant decoder
G11C29/783
with refresh of replacement cells
G11C29/785
with redundancy programming schemes
G11C29/787
using a fuse hierarchy
G11C29/789
using non-volatile cells or latches
G11C29/80
with improved layout
G11C29/802
by encoding redundancy signals
G11C29/804
to prevent clustered faults
G11C29/806
by reducing size of decoders
G11C29/808
using a flexible replacement scheme
G11C29/81
using a hierarchical redundancy scheme
G11C29/812
using a reduced amount of fuses
G11C29/814
for optimized yield
G11C29/816
for an application-specific layout
G11C29/818
for dual-port memories
G11C29/82
for EEPROMs
G11C29/822
for read only memories
G11C29/824
for synchronous memories
G11C29/83
with reduced power consumption
G11C29/832
with disconnection of faulty elements
G11C29/835
with roll call arrangements for redundant substitutions
G11C29/838
with substitution of defective spares
G11C29/84
with improved access time or stability
G11C29/842
by introducing a delay in a signal path
G11C29/844
by splitting the decoders in stages
G11C29/846
by choosing redundant lines at an output stage
G11C29/848
by adjacent switching
G11C29/86
in serial access memories
G11C29/88
with partially good memories
G11C29/883
using a single defective memory device with reduced capacity
G11C29/886
combining plural defective memory devices to provide a contiguous address range
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Inline buffer for in-memory post package repair (PPR)
Patent number
11,989,106
Issue date
May 21, 2024
Intel Corporation
Jongwon Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
ZQ resistor calibration circuit in memory device and calibration me...
Patent number
11,990,900
Issue date
May 21, 2024
Yangtze Memory Technologies Co., Ltd.
Huangpeng Zhang
G11 - INFORMATION STORAGE
Information
Patent Grant
Data transmission using delayed timing signals
Patent number
11,990,912
Issue date
May 21, 2024
RAMBUS INC.
Frederick A. Ware
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Bit retiring to mitigate bit errors
Patent number
11,990,200
Issue date
May 21, 2024
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Grant
Data recovery method for memory device
Patent number
11,990,202
Issue date
May 21, 2024
Macronix International Co., Ltd.
You-Liang Chou
G11 - INFORMATION STORAGE
Information
Patent Grant
Neural processing unit capable of testing component therein during...
Patent number
11,990,203
Issue date
May 21, 2024
DEEPX CO., LTD.
Lok Won Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
ECC protected storage
Patent number
11,989,092
Issue date
May 21, 2024
Texas Instruments Incorporated
Samuel Paul Visalli
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Computing register with non-volatile-logic data storage
Patent number
11,990,196
Issue date
May 21, 2024
Texas Instruments Incorporated
Adolf Baumann
G11 - INFORMATION STORAGE
Information
Patent Grant
Peak power management connectivity check in a memory device
Patent number
11,990,197
Issue date
May 21, 2024
Micron Technology, Inc.
Eleuterio Mannella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor memory device and test system including the same
Patent number
11,989,459
Issue date
May 21, 2024
Samsung Electronics Co., Ltd.
Hongjun Jin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus with memory array programming
Patent number
11,990,187
Issue date
May 21, 2024
Samsung Electronics Co., Ltd.
Seok Ju Yun
G11 - INFORMATION STORAGE
Information
Patent Grant
Centralized error correction circuit
Patent number
11,990,199
Issue date
May 21, 2024
Micron Technology, Inc.
Taeksang Song
G11 - INFORMATION STORAGE
Information
Patent Grant
Storage system
Patent number
11,990,201
Issue date
May 21, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Kangling Ji
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and system for inspection of defective MTJ cell in STT-MRAM
Patent number
11,988,702
Issue date
May 21, 2024
Samsung Electronics Co., Ltd.
Yun Heub Song
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device with selective command delay and associated me...
Patent number
11,990,195
Issue date
May 21, 2024
Boon Hor Lam
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory system and operation method of memory system
Patent number
11,990,198
Issue date
May 21, 2024
SK Hynix Inc.
Chul Moon Jung
G11 - INFORMATION STORAGE
Information
Patent Grant
Automatic mirrored ROM
Patent number
11,984,175
Issue date
May 14, 2024
Advanced Micro Devices, Inc.
Cai YongFeng
G11 - INFORMATION STORAGE
Information
Patent Grant
Methods and devices for flexible RAM loading
Patent number
11,984,178
Issue date
May 14, 2024
STMicroelectronics S.r.l.
Gabriele Solcia
G11 - INFORMATION STORAGE
Information
Patent Grant
Systems and methods for fault-resilient system management random ac...
Patent number
11,984,183
Issue date
May 14, 2024
Dell Products L.P.
Balasingh P. Samuel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatuses and methods for zone-based soft post-package repair
Patent number
11,984,185
Issue date
May 14, 2024
Micron Technology, Inc.
Alan J. Wilson
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatuses and methods for repairing defective memory cells based...
Patent number
11,984,186
Issue date
May 14, 2024
Micron Technology, Inc.
David Hulton
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Storage device for generating identity code and identity code gener...
Patent number
11,984,166
Issue date
May 14, 2024
Macronix International Co., Ltd.
Yu-Hsuan Lin
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory component provided with a test interface
Patent number
11,984,177
Issue date
May 14, 2024
Antonino Mondello
G11 - INFORMATION STORAGE
Information
Patent Grant
Redundant circuit assigning method and device, and medium
Patent number
11,984,179
Issue date
May 14, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Yui-Lang Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Systems and methods for evaluating integrity of adjacent sub blocks...
Patent number
11,984,181
Issue date
May 14, 2024
Western Digital Technologies, Inc.
Srinivasan Seetharaman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Voltage testing circuit with error protection scheme
Patent number
11,984,184
Issue date
May 14, 2024
Micron Technology, Inc.
Subhasis Sasmal
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory card performance characteristic detection and monitoring
Patent number
11,985,445
Issue date
May 14, 2024
GoPro, Inc.
Naveen Chinya Krishnamurthy
G11 - INFORMATION STORAGE
Information
Patent Grant
Anti-fuse devices and anti-fuse units
Patent number
11,985,818
Issue date
May 14, 2024
Changxin Memory Technologies, Inc.
ChihCheng Liu
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus of testing word line to detect fault after repair
Patent number
11,984,176
Issue date
May 14, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Yulong Zhai
G11 - INFORMATION STORAGE
Information
Patent Grant
Enabling or disabling on-die error-correcting code for a memory bui...
Patent number
11,984,180
Issue date
May 14, 2024
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...
Publication number
20240161848
Publication date
May 16, 2024
Intelligent Memory Limited
Mike Hossein Amidi
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED...
Publication number
20240161850
Publication date
May 16, 2024
Samsung Electronics Co., Ltd.
Byeongho Kim
G11 - INFORMATION STORAGE
Information
Patent Application
ADJUSTING MEMORY POWER CONSUMPTION
Publication number
20240161852
Publication date
May 16, 2024
Microsoft Technology Licensing, LLC
Ori LASLO
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUSES AND METHODS FOR SEPARATE WRITE ENABLE FOR SINGLE-PASS A...
Publication number
20240161859
Publication date
May 16, 2024
Micron Technology, Inc.
Sujeet Ayyapureddi
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD
Publication number
20240161860
Publication date
May 16, 2024
Samsung Electronics Co., Ltd.
MYEONGJIN OH
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY BUFFER WITH DATA SCRAMBLING AND ERROR CORRECTION
Publication number
20240161795
Publication date
May 16, 2024
Rambus Inc.
Christopher HAYWOOD
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY SYSTEM WITH CACHED MEMORY MODULE OPERATIONS
Publication number
20240160587
Publication date
May 16, 2024
Rambus Inc.
Frederick A. Ware
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM
Publication number
20240161854
Publication date
May 16, 2024
Micron Technology, Inc.
Melissa I. Uribe
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUSES AND METHODS FOR ENHANCED METADATA SUPPORT
Publication number
20240161855
Publication date
May 16, 2024
Micron Technology, Inc.
Scott E. Smith
G11 - INFORMATION STORAGE
Information
Patent Application
VERA DETECTION METHOD TO CATCH ERASE FAIL
Publication number
20240161858
Publication date
May 16, 2024
SANDISK TECHNOLOGIES LLC
Parth Amin
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING MET...
Publication number
20240161861
Publication date
May 16, 2024
SK HYNIX INC.
Jung Taek YOU
G11 - INFORMATION STORAGE
Information
Patent Application
TRIM SETTING DETERMINATION FOR A MEMORY DEVICE
Publication number
20240161846
Publication date
May 16, 2024
Micron Technology, Inc.
Aswin Thiruvengadam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TESTING METHOD AND TESTING SYSTEM
Publication number
20240161847
Publication date
May 16, 2024
NANYA TECHNOLOGY CORPORATION
Bo Jung PENG
G11 - INFORMATION STORAGE
Information
Patent Application
WORD LINE LAYER DEPENDENT STRESS AND SCREEN VOLTAGE
Publication number
20240161849
Publication date
May 16, 2024
Western Digital Technologies, Inc.
Yidan Liu
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUSES AND METHODS FOR SINGLE-PASS ACCESS OF ECC INFORMATION,...
Publication number
20240161856
Publication date
May 16, 2024
Micron Technology, Inc.
Scott E. Smith
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATE...
Publication number
20240159818
Publication date
May 16, 2024
SK HYNIX INC.
Nam Cheol JEON
G11 - INFORMATION STORAGE
Information
Patent Application
Programmable Memory Timing
Publication number
20240161796
Publication date
May 16, 2024
Micron Technology, Inc.
Kang-Yong Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY DEVICE PERFORMING ECS OPERATION, OPERATION METHOD OF THE MEM...
Publication number
20240161807
Publication date
May 16, 2024
Samsung Electronics Co. Ltd.
Junha HWANG
G11 - INFORMATION STORAGE
Information
Patent Application
TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPL...
Publication number
20240161851
Publication date
May 16, 2024
SK HYNIX INC.
Sang Ah HYUN
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM PERFORMING ERROR CORR...
Publication number
20240161853
Publication date
May 16, 2024
SK HYNIX INC.
Hong Ki MOON
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY TESTING SYSTEM AND MEMORY TESTING METHOD
Publication number
20240161857
Publication date
May 16, 2024
NANYA TECHNOLOGY CORPORATION
Chien Yu CHEN
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD, DEVICE, AND CIRCUIT FOR HIGH-SPEED MEMORIES
Publication number
20240153573
Publication date
May 9, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Jaspal Singh SHAH
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY SYSTEM, MEMORY CONTROLLER AND METHOD FOR OPERATING MEMORY SY...
Publication number
20240153576
Publication date
May 9, 2024
SK HYNIX INC.
Seong Chan KIM
G11 - INFORMATION STORAGE
Information
Patent Application
TEST CONTROLLER ENABLING A SNAPSHOT RESTORE AND RESUME OPERATION WI...
Publication number
20240153572
Publication date
May 9, 2024
Western Digital Technologies, Inc.
Eran Moshe
G11 - INFORMATION STORAGE
Information
Patent Application
NON-VOLATILE XNOR AND NON-VOLATILE SRAM SYSTEM WITH ENHANCED STORE...
Publication number
20240153574
Publication date
May 9, 2024
Rouwaida Kanj
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD OF TESTING STORAGE CONTROLLER INCLUDED IN STORAGE DEVICE
Publication number
20240153575
Publication date
May 9, 2024
Samsung Electronics Co., Ltd.
Jongyeong JUNG
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...
Publication number
20240154605
Publication date
May 9, 2024
Lodestar Licensing Group LLC
Dean Gans
G11 - INFORMATION STORAGE
Information
Patent Application
INTERFACE READ AFTER WRITE
Publication number
20240152294
Publication date
May 9, 2024
Micron Technology, Inc.
Yue Chan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY AUTHENTICATION
Publication number
20240143195
Publication date
May 2, 2024
Lodestar Licensing Group LLC
Rachael R. Carlson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FLASH MEMORY FOR PERFORMING MARGIN READ TEST OPERATION AND MARGIN R...
Publication number
20240145021
Publication date
May 2, 2024
Samsung Electronics Co., Ltd.
Gyuseong KIM
G11 - INFORMATION STORAGE