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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2223/00
Investigating materials by wave or particle radiation
Sub Industries
G01N2223/01
by radioactivity, nuclear decay
G01N2223/03
by transmission
G01N2223/04
and measuring absorption
G01N2223/041
X-ray absorption fine structure [EXAFS]
G01N2223/043
gamma ray resonance absorption (Mossbauer effect)
G01N2223/045
combination of at least 2 measurements (transmission and scatter)
G01N2223/05
by diffraction, scatter or reflection
G01N2223/051
correcting for scatter
G01N2223/052
reflection
G01N2223/053
back scatter
G01N2223/054
small angle scatter
G01N2223/055
scatter raster collimator
G01N2223/056
diffraction
G01N2223/0561
diffraction cameras
G01N2223/0563
measure of energy-dispersion spectrum of diffracted radiation
G01N2223/0565
diffraction of electrons
G01N2223/0566
analysing diffraction pattern
G01N2223/0568
spectro-diffractometry
G01N2223/063
inelastic scatter
G01N2223/064
interference of radiation
G01N2223/07
secondary emission
G01N2223/071
combination of measurements, at least 1 secondary emission
G01N2223/072
combination of measurements, 2 kinds of secondary emission
G01N2223/073
use of a laser
G01N2223/074
activation analysis
G01N2223/0745
neutron-gamma activation analysis
G01N2223/076
X-ray fluorescence
G01N2223/0763
Compton background correcting
G01N2223/0766
X-ray fluorescence with indicator, tags
G01N2223/079
incident electron beam and measuring excited X-rays
G01N2223/08
incident electron beam and measuring cathode luminescence (U.V.)
G01N2223/081
incident ion beam
G01N2223/0813
incident ion beam and measuring X-rays [PIXE]
G01N2223/0816
incident ion beam and measuring secondary ion beam [SIMS]
G01N2223/084
photo-electric effect
G01N2223/085
photo-electron spectrum [ESCA, XPS]
G01N2223/086
Auger electrons
G01N2223/09
exo-electron emission
G01N2223/095
tribo-emission
G01N2223/10
Different kinds of radiation or particles
G01N2223/1003
monochromatic
G01N2223/1006
different radiations
G01N2223/101
electromagnetic radiation
G01N2223/1013
gamma
G01N2223/1016
X-ray
G01N2223/102
beta or electrons
G01N2223/104
ions
G01N2223/1045
alpha
G01N2223/105
molecular or atomic beams
G01N2223/106
neutrons
G01N2223/1063
fast
G01N2223/1066
thermal
G01N2223/107
protons
G01N2223/108
positrons electron-positron annihilation
G01N2223/11
neutrino
G01N2223/20
Sources of radiation
G01N2223/201
betatron
G01N2223/202
isotopes
G01N2223/203
synchrotron
G01N2223/204
source created from radiated target
G01N2223/205
natural source
G01N2223/206
sources operating at different energy levels
G01N2223/30
Accessories, mechanical or electrical features
G01N2223/301
portable apparatus
G01N2223/302
comparative arrangements
G01N2223/303
calibrating, standardising
G01N2223/3032
periodic calibration
G01N2223/3035
phantom
G01N2223/3037
standards (constitution)
G01N2223/304
electric circuits, signal processing
G01N2223/305
computer simulations
G01N2223/306
computer control
G01N2223/307
cuvettes-sample holders
G01N2223/3075
correcting for the properties of the container
G01N2223/308
support of radiation source
G01N2223/309
support of sample holder
G01N2223/31
temperature control
G01N2223/3103
cooling, cryostats
G01N2223/3106
heating, furnaces
G01N2223/311
high pressure testing, anvil cells
G01N2223/312
powder preparation
G01N2223/313
filters, rotating filter disc
G01N2223/314
chopper
G01N2223/315
monochromators
G01N2223/316
collimators
G01N2223/317
windows
G01N2223/318
protective films
G01N2223/319
using opaque penetrant medium
G01N2223/32
adjustments of elements during operation
G01N2223/321
manipulator for positioning a part
G01N2223/322
immerged detecting head
G01N2223/323
irradiation range monitor
G01N2223/33
scanning
G01N2223/3301
beam is modified for scan
G01N2223/3302
object and detector fixed
G01N2223/3303
object fixed source and detector move
G01N2223/3304
helicoidal scan
G01N2223/3305
detector fixed source and body moving
G01N2223/3306
object rotates
G01N2223/3307
source and detector fixed object moves
G01N2223/3308
object translates
G01N2223/331
rocking curve analysis
G01N2223/335
electronic scanning
G01N2223/34
sensing means for gap between source and detector
G01N2223/345
mathematical transformations on beams or signals
G01N2223/348
ellipsoidal collector
G01N2223/351
prohibiting charge accumulation on sample substrate
G01N2223/40
Imaging
G01N2223/401
image processing
G01N2223/402
mapping distribution of elements
G01N2223/403
mapping with false colours
G01N2223/404
contrast medium
G01N2223/405
mapping of a material property
G01N2223/406
fluoroscopic image
G01N2223/407
stimulable phosphor sheet
G01N2223/408
display on monitor
G01N2223/409
embedding or impregnating the object
G01N2223/41
imaging specifically internal structure
G01N2223/411
tv imaging from fluorescent screen
G01N2223/412
use of image converter tube [PMT]
G01N2223/413
sensor array [CCD]
G01N2223/414
stereoscopic system
G01N2223/415
radiographic film
G01N2223/416
wrap around
G01N2223/417
recording with co-ordinate markings
G01N2223/418
electron microscope
G01N2223/419
computed tomograph
G01N2223/42
image digitised, -enhanced in an image processor
G01N2223/421
digitised image, analysed in real time (recognition algorithms)
G01N2223/422
windows within the image
G01N2223/423
multispectral imaging-multiple energy imaging
G01N2223/424
energy substraction image processing (dual energy processing)
G01N2223/425
temporal (time difference) substraction processing
G01N2223/426
image comparing, unknown with known substance
G01N2223/427
stepped imaging (selected area of sample is changed)
G01N2223/50
Detectors
G01N2223/501
array
G01N2223/5015
linear array
G01N2223/502
ionisation chamber
G01N2223/503
auxiliary reference detector
G01N2223/504
pin-diode
G01N2223/505
scintillation
G01N2223/5055
scintillation crystal coupled to PMT
G01N2223/506
time-of-flight
G01N2223/507
secondary-emission detector
G01N2223/508
photo-acoustic
G01N2223/509
infra-red
G01N2223/60
Specific applications or type of materials
G01N2223/601
density profile
G01N2223/602
crystal growth
G01N2223/603
superlattices
G01N2223/604
monocrystal
G01N2223/605
phases
G01N2223/606
texture
G01N2223/607
strain
G01N2223/608
supraconductors
G01N2223/61
thin films, coatings
G01N2223/611
patterned objects electronic devices
G01N2223/6113
printed circuit board [PCB]
G01N2223/6116
semiconductor wafer
G01N2223/612
biological material
G01N2223/6123
bone mineral
G01N2223/6126
tissue
G01N2223/613
moisture
G01N2223/614
road surface
G01N2223/615
composite materials, multilayer laminates
G01N2223/616
earth materials
G01N2223/617
ash in coal
G01N2223/618
food
G01N2223/619
wood
G01N2223/62
powders
G01N2223/621
tobacco
G01N2223/622
paper
G01N2223/623
plastics
G01N2223/624
steel, castings
G01N2223/625
nuclear fuels, laser imploded targets
G01N2223/626
radioactive material
G01N2223/6265
sample with radioactive tracer, tag, label
G01N2223/627
tyres
G01N2223/628
tubes, pipes
G01N2223/629
welds, bonds, sealing compounds
G01N2223/63
turbine blades
G01N2223/631
large structures, walls
G01N2223/632
residual life, life expectancy
G01N2223/633
thickness, density, surface weight (unit area)
G01N2223/634
wear behaviour, roughness
G01N2223/635
fluids, granulates
G01N2223/636
fluid sample with radioactive sources
G01N2223/637
liquid
G01N2223/638
gas
G01N2223/639
material in a container
G01N2223/64
multiple-sample chamber, multiplicity of materials
G01N2223/641
particle sizing
G01N2223/642
moving sheet, web
G01N2223/6425
correcting for web flutter
G01N2223/643
object on conveyor
G01N2223/645
quality control
G01N2223/646
flaws, defects
G01N2223/6462
microdefects
G01N2223/6464
radioactive substance into defect site
G01N2223/6466
flaws comparing to predetermined standards
G01N2223/6468
at different temperatures
G01N2223/647
leak detection
G01N2223/648
voids
G01N2223/649
porosity
G01N2223/65
cavitation pits
G01N2223/651
dust
G01N2223/652
impurities, foreign matter, trace amounts
G01N2223/66
multiple steps inspection
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Variable zoom X-ray computed tomography method for composites
Patent number
12,130,245
Issue date
Oct 29, 2024
Board of Regents, The University of Texas System
Andrew Makeev
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Bonding wire for semiconductor devices
Patent number
12,132,026
Issue date
Oct 29, 2024
NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
Tomohiro Uno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method of producing a tomogram
Patent number
12,131,411
Issue date
Oct 29, 2024
ADAPTIX LTD
Gil Travish
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
Patent number
12,123,840
Issue date
Oct 22, 2024
Arizona Board of Regents on behalf of Arizona State University
Alexandra Ros
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Multifunctional and visual rock triaxial testing system
Patent number
12,123,852
Issue date
Oct 22, 2024
INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
Yanzhi Hu
G01 - MEASURING TESTING
Information
Patent Grant
Methods for correlative microscopy
Patent number
12,123,047
Issue date
Oct 22, 2024
Leica Mikrosysteme GmbH
Julia König
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Method and system to characterize and monitor the sharpness of a di...
Patent number
12,118,701
Issue date
Oct 15, 2024
AGFA NV
Marc Cresens
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
Patent number
12,115,502
Issue date
Oct 15, 2024
Sartorius Stedim Biotech GmbH
Volkmar Thom
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Charged particle detection for spectroscopic techniques
Patent number
12,117,406
Issue date
Oct 15, 2024
VG Systems Limited
Bryan Barnard
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector and radiography apparatus
Patent number
12,115,011
Issue date
Oct 15, 2024
FUJIFILM Corporation
Hisatsugu Horiuchi
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
X-ray scanning system and method for inspecting an object
Patent number
12,111,271
Issue date
Oct 8, 2024
Seethru AI, Inc.
Omar Al-Kofahi
G01 - MEASURING TESTING
Information
Patent Grant
Densitometer assembly for high-pressure flow lines
Patent number
12,111,331
Issue date
Oct 8, 2024
KHOLLE Magnolia 2015, LLC
William Brent Stroebel
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for determining the mineralogy of drill solids
Patent number
12,111,273
Issue date
Oct 8, 2024
Schlumberger Technology Corporation
Jonathan Mitchell
E21 - EARTH DRILLING MINING
Information
Patent Grant
System for estimating the occurrence of defects, and computer-reada...
Patent number
12,111,272
Issue date
Oct 8, 2024
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Intelligent data acquisition system and method for pipelines
Patent number
12,111,007
Issue date
Oct 8, 2024
Shuyong Paul Du
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Radiation detector and radiography apparatus
Patent number
12,111,430
Issue date
Oct 8, 2024
FUJIFILM Corporation
Hisatsugu Horiuchi
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Radiation imaging apparatus, radiation imaging system, control meth...
Patent number
12,102,468
Issue date
Oct 1, 2024
Canon Kabushiki Kaisha
Kazuaki Umekawa
G01 - MEASURING TESTING
Information
Patent Grant
Fast 3D radiography with multiple pulsed X-ray sources by deflectin...
Patent number
12,102,469
Issue date
Oct 1, 2024
AIXSCAN INC.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
Patent number
12,106,867
Issue date
Oct 1, 2024
Bruker Nano GmbH
Ulrich Waldschläger
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection system, determination processing apparatus, and inspecti...
Patent number
12,105,033
Issue date
Oct 1, 2024
JGC CORPORATION
Teruaki Sano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and plant for inspecting an animal carcass
Patent number
12,102,094
Issue date
Oct 1, 2024
BIOMETIC S.R.L.
Enrico Ursella
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
X-ray spectrometer and pulse height prediction program
Patent number
12,105,035
Issue date
Oct 1, 2024
Rigaku Corporation
Tsutomu Tada
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
Patent number
12,104,997
Issue date
Oct 1, 2024
FAXITRON BIOPTICS, LLC
Donogh O'Driscoll
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method and apparatus for monitoring beam profile and power
Patent number
12,105,036
Issue date
Oct 1, 2024
ASML Netherlands B.V.
Jian Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Assessing characteristics of subterranean formations using micro-co...
Patent number
12,105,077
Issue date
Oct 1, 2024
Saudi Arabian Oil Company
Osman Hamid
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for high angle liquid electron tomography
Patent number
12,099,022
Issue date
Sep 24, 2024
UNIVERSIDAD REY JUAN CARLOS
Jesus Gonzalez Casablanca
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
Patent number
12,099,025
Issue date
Sep 24, 2024
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
Patent number
12,099,024
Issue date
Sep 24, 2024
FEI Company
Austin Penrose Day
G01 - MEASURING TESTING
Information
Patent Grant
Diffractometer-based global in situ diagnostic system for animals
Patent number
12,094,609
Issue date
Sep 17, 2024
Arion Diagnostics, Inc.
Alexander Lazarev
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Diffraction-based global in vitro diagnostic system
Patent number
12,094,610
Issue date
Sep 17, 2024
Bragg Analytics, Inc.
Alexander Lazarev
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Radiation Effects Testing System with a Beam Accelerator
Publication number
20240353358
Publication date
Oct 24, 2024
SHINE Technologies, LLC
Craig Jacobson
G01 - MEASURING TESTING
Information
Patent Application
Tray Insert for Screening Tray
Publication number
20240353354
Publication date
Oct 24, 2024
Rapiscan Holdings, Inc.
Philippe Desjeans-Gauthier
G01 - MEASURING TESTING
Information
Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
Publication number
20240353355
Publication date
Oct 24, 2024
CiTEX Holding GmbH
Arno NEUMEISTER
G01 - MEASURING TESTING
Information
Patent Application
TERMINAL AND ELECTRODE DEFECT DETECTION METHOD
Publication number
20240354932
Publication date
Oct 24, 2024
LG ELECTRONICS INC.
Duho LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME
Publication number
20240345004
Publication date
Oct 17, 2024
SK On Co., Ltd.
Hye Ju JANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...
Publication number
20240345007
Publication date
Oct 17, 2024
Zhejiang University
Haikuo WANG
G01 - MEASURING TESTING
Information
Patent Application
3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE
Publication number
20240345003
Publication date
Oct 17, 2024
Faxitron Bioptics, LLC
Ciaran PURDY
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD
Publication number
20240345005
Publication date
Oct 17, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...
Publication number
20240345006
Publication date
Oct 17, 2024
NOVA MEASURING INSTRUMENTS INC.
Heath POIS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER
Publication number
20240342771
Publication date
Oct 17, 2024
Amgen Inc.
Yasser Nashed-Samuel
C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information
Patent Application
METHOD FOR DISLOCATION ANALYSIS
Publication number
20240337611
Publication date
Oct 10, 2024
Oxford Instruments Nanotechnology Tools Limited
Aimo WINKELMANN
G01 - MEASURING TESTING
Information
Patent Application
AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...
Publication number
20240337610
Publication date
Oct 10, 2024
FEI Company
Wouter René J. Van den Broek
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
Publication number
20240328970
Publication date
Oct 3, 2024
Carl Zeiss SMT GMBH
Dmitry Klochkov
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION
Publication number
20240331132
Publication date
Oct 3, 2024
ASML NETHERLANDS B.V.
Haoyi LIANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY
Publication number
20240331179
Publication date
Oct 3, 2024
Carl Zeiss SMT GMBH
Dmitry Klochkov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
Publication number
20240328969
Publication date
Oct 3, 2024
MITEGEN, LLC
Robert E. Thorne
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...
Publication number
20240328965
Publication date
Oct 3, 2024
Baker Hughes Holdings LLC
Thomas Mayer
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CYCLIC IMAGING A ROCK SAMPLE
Publication number
20240328966
Publication date
Oct 3, 2024
Saudi Arabian Oil Company
Sinan Caliskan
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM
Publication number
20240328964
Publication date
Oct 3, 2024
Anritsu Corporation
Itaru MIYAZAKI
G01 - MEASURING TESTING
Information
Patent Application
Process and device for the spatially resolved localization of defec...
Publication number
20240328973
Publication date
Oct 3, 2024
Sri Ranjini ARUMUGAM
B82 - NANO-TECHNOLOGY
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM
Publication number
20240328967
Publication date
Oct 3, 2024
Anritsu Corporation
Itaru MIYAZAKI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE ANALYZER
Publication number
20240328971
Publication date
Oct 3, 2024
Shimadzu Corporation
Yuji MORIHISA
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL RADIOGRAPHY SYSTEM AND DIGITAL RADIOGRAPHY METHOD
Publication number
20240319113
Publication date
Sep 26, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
Publication number
20240319120
Publication date
Sep 26, 2024
MITEGEN, LLC
Robert E. Thorne
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD
Publication number
20240319114
Publication date
Sep 26, 2024
Nuctech Company Limited
Weizhen WANG
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20240319118
Publication date
Sep 26, 2024
ISHIDA CO., LTD.
Kota TOMINAGA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
Publication number
20240319121
Publication date
Sep 26, 2024
Rigaku Corporation
Yoshiyasu ITO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IN-SITU U-Pb DATING OF HETEROGENEOUS MINERALS
Publication number
20240319137
Publication date
Sep 26, 2024
Zijin Mining Group Co., Ltd.
Youye ZHENG
G01 - MEASURING TESTING
Information
Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
Publication number
20240320816
Publication date
Sep 26, 2024
Samsung Electronics Co., Ltd.
Nohong Kwak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD
Publication number
20240319112
Publication date
Sep 26, 2024
Nuctech Company Limited
Bicheng LIU
G01 - MEASURING TESTING