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Investigating materials by wave or particle radiation
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2223/00
Investigating materials by wave or particle radiation
Sub Industries
G01N2223/01
by radioactivity, nuclear decay
G01N2223/03
by transmission
G01N2223/04
and measuring absorption
G01N2223/041
X-ray absorption fine structure [EXAFS]
G01N2223/043
gamma ray resonance absorption (Mossbauer effect)
G01N2223/045
combination of at least 2 measurements (transmission and scatter)
G01N2223/05
by diffraction, scatter or reflection
G01N2223/051
correcting for scatter
G01N2223/052
reflection
G01N2223/053
back scatter
G01N2223/054
small angle scatter
G01N2223/055
scatter raster collimator
G01N2223/056
diffraction
G01N2223/0561
diffraction cameras
G01N2223/0563
measure of energy-dispersion spectrum of diffracted radiation
G01N2223/0565
diffraction of electrons
G01N2223/0566
analysing diffraction pattern
G01N2223/0568
spectro-diffractometry
G01N2223/063
inelastic scatter
G01N2223/064
interference of radiation
G01N2223/07
secondary emission
G01N2223/071
combination of measurements, at least 1 secondary emission
G01N2223/072
combination of measurements, 2 kinds of secondary emission
G01N2223/073
use of a laser
G01N2223/074
activation analysis
G01N2223/0745
neutron-gamma activation analysis
G01N2223/076
X-ray fluorescence
G01N2223/0763
Compton background correcting
G01N2223/0766
X-ray fluorescence with indicator, tags
G01N2223/079
incident electron beam and measuring excited X-rays
G01N2223/08
incident electron beam and measuring cathode luminescence (U.V.)
G01N2223/081
incident ion beam
G01N2223/0813
incident ion beam and measuring X-rays [PIXE]
G01N2223/0816
incident ion beam and measuring secondary ion beam [SIMS]
G01N2223/084
photo-electric effect
G01N2223/085
photo-electron spectrum [ESCA, XPS]
G01N2223/086
Auger electrons
G01N2223/09
exo-electron emission
G01N2223/095
tribo-emission
G01N2223/10
Different kinds of radiation or particles
G01N2223/1003
monochromatic
G01N2223/1006
different radiations
G01N2223/101
electromagnetic radiation
G01N2223/1013
gamma
G01N2223/1016
X-ray
G01N2223/102
beta or electrons
G01N2223/104
ions
G01N2223/1045
alpha
G01N2223/105
molecular or atomic beams
G01N2223/106
neutrons
G01N2223/1063
fast
G01N2223/1066
thermal
G01N2223/107
protons
G01N2223/108
positrons electron-positron annihilation
G01N2223/11
neutrino
G01N2223/20
Sources of radiation
G01N2223/201
betatron
G01N2223/202
isotopes
G01N2223/203
synchrotron
G01N2223/204
source created from radiated target
G01N2223/205
natural source
G01N2223/206
sources operating at different energy levels
G01N2223/30
Accessories, mechanical or electrical features
G01N2223/301
portable apparatus
G01N2223/302
comparative arrangements
G01N2223/303
calibrating, standardising
G01N2223/3032
periodic calibration
G01N2223/3035
phantom
G01N2223/3037
standards (constitution)
G01N2223/304
electric circuits, signal processing
G01N2223/305
computer simulations
G01N2223/306
computer control
G01N2223/307
cuvettes-sample holders
G01N2223/3075
correcting for the properties of the container
G01N2223/308
support of radiation source
G01N2223/309
support of sample holder
G01N2223/31
temperature control
G01N2223/3103
cooling, cryostats
G01N2223/3106
heating, furnaces
G01N2223/311
high pressure testing, anvil cells
G01N2223/312
powder preparation
G01N2223/313
filters, rotating filter disc
G01N2223/314
chopper
G01N2223/315
monochromators
G01N2223/316
collimators
G01N2223/317
windows
G01N2223/318
protective films
G01N2223/319
using opaque penetrant medium
G01N2223/32
adjustments of elements during operation
G01N2223/321
manipulator for positioning a part
G01N2223/322
immerged detecting head
G01N2223/323
irradiation range monitor
G01N2223/33
scanning
G01N2223/3301
beam is modified for scan
G01N2223/3302
object and detector fixed
G01N2223/3303
object fixed source and detector move
G01N2223/3304
helicoidal scan
G01N2223/3305
detector fixed source and body moving
G01N2223/3306
object rotates
G01N2223/3307
source and detector fixed object moves
G01N2223/3308
object translates
G01N2223/331
rocking curve analysis
G01N2223/335
electronic scanning
G01N2223/34
sensing means for gap between source and detector
G01N2223/345
mathematical transformations on beams or signals
G01N2223/348
ellipsoidal collector
G01N2223/351
prohibiting charge accumulation on sample substrate
G01N2223/40
Imaging
G01N2223/401
image processing
G01N2223/402
mapping distribution of elements
G01N2223/403
mapping with false colours
G01N2223/404
contrast medium
G01N2223/405
mapping of a material property
G01N2223/406
fluoroscopic image
G01N2223/407
stimulable phosphor sheet
G01N2223/408
display on monitor
G01N2223/409
embedding or impregnating the object
G01N2223/41
imaging specifically internal structure
G01N2223/411
tv imaging from fluorescent screen
G01N2223/412
use of image converter tube [PMT]
G01N2223/413
sensor array [CCD]
G01N2223/414
stereoscopic system
G01N2223/415
radiographic film
G01N2223/416
wrap around
G01N2223/417
recording with co-ordinate markings
G01N2223/418
electron microscope
G01N2223/419
computed tomograph
G01N2223/42
image digitised, -enhanced in an image processor
G01N2223/421
digitised image, analysed in real time (recognition algorithms)
G01N2223/422
windows within the image
G01N2223/423
multispectral imaging-multiple energy imaging
G01N2223/424
energy substraction image processing (dual energy processing)
G01N2223/425
temporal (time difference) substraction processing
G01N2223/426
image comparing, unknown with known substance
G01N2223/427
stepped imaging (selected area of sample is changed)
G01N2223/50
Detectors
G01N2223/501
array
G01N2223/5015
linear array
G01N2223/502
ionisation chamber
G01N2223/503
auxiliary reference detector
G01N2223/504
pin-diode
G01N2223/505
scintillation
G01N2223/5055
scintillation crystal coupled to PMT
G01N2223/506
time-of-flight
G01N2223/507
secondary-emission detector
G01N2223/508
photo-acoustic
G01N2223/509
infra-red
G01N2223/60
Specific applications or type of materials
G01N2223/601
density profile
G01N2223/602
crystal growth
G01N2223/603
superlattices
G01N2223/604
monocrystal
G01N2223/605
phases
G01N2223/606
texture
G01N2223/607
strain
G01N2223/608
supraconductors
G01N2223/61
thin films, coatings
G01N2223/611
patterned objects electronic devices
G01N2223/6113
printed circuit board [PCB]
G01N2223/6116
semiconductor wafer
G01N2223/612
biological material
G01N2223/6123
bone mineral
G01N2223/6126
tissue
G01N2223/613
moisture
G01N2223/614
road surface
G01N2223/615
composite materials, multilayer laminates
G01N2223/616
earth materials
G01N2223/617
ash in coal
G01N2223/618
food
G01N2223/619
wood
G01N2223/62
powders
G01N2223/621
tobacco
G01N2223/622
paper
G01N2223/623
plastics
G01N2223/624
steel, castings
G01N2223/625
nuclear fuels, laser imploded targets
G01N2223/626
radioactive material
G01N2223/6265
sample with radioactive tracer, tag, label
G01N2223/627
tyres
G01N2223/628
tubes, pipes
G01N2223/629
welds, bonds, sealing compounds
G01N2223/63
turbine blades
G01N2223/631
large structures, walls
G01N2223/632
residual life, life expectancy
G01N2223/633
thickness, density, surface weight (unit area)
G01N2223/634
wear behaviour, roughness
G01N2223/635
fluids, granulates
G01N2223/636
fluid sample with radioactive sources
G01N2223/637
liquid
G01N2223/638
gas
G01N2223/639
material in a container
G01N2223/64
multiple-sample chamber, multiplicity of materials
G01N2223/641
particle sizing
G01N2223/642
moving sheet, web
G01N2223/6425
correcting for web flutter
G01N2223/643
object on conveyor
G01N2223/645
quality control
G01N2223/646
flaws, defects
G01N2223/6462
microdefects
G01N2223/6464
radioactive substance into defect site
G01N2223/6466
flaws comparing to predetermined standards
G01N2223/6468
at different temperatures
G01N2223/647
leak detection
G01N2223/648
voids
G01N2223/649
porosity
G01N2223/65
cavitation pits
G01N2223/651
dust
G01N2223/652
impurities, foreign matter, trace amounts
G01N2223/66
multiple steps inspection
Industries
Overview
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People
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Patents Grants
last 30 patents
Information
Patent Grant
Material species identification system using material spectral data
Patent number
12,146,844
Issue date
Nov 19, 2024
Toyota Jidosha Kabushiki Kaisha
Masaki Adachi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Component residual stress testing platform based on neutron diffrac...
Patent number
12,146,845
Issue date
Nov 19, 2024
NCS TESTING TECHNOLOGY CO., LTD
Lixia Yang
G01 - MEASURING TESTING
Information
Patent Grant
Artificial intelligence training with multiple pulsed x-ray source-...
Patent number
12,144,670
Issue date
Nov 19, 2024
AIXSCAN INC.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing apparatus, radiography system, image processing me...
Patent number
12,140,553
Issue date
Nov 12, 2024
FUJIFILM Corporation
Kengo Nomura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic imaging quality control device, storage medium, and dynamic...
Patent number
12,140,552
Issue date
Nov 12, 2024
Konica Minolta, Inc.
Sumiya Nagatsuka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detector and method for manufacturing radiation detector
Patent number
12,140,715
Issue date
Nov 12, 2024
Kyoto University
Keiji Abe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated circumferential pipe scanning system
Patent number
12,135,297
Issue date
Nov 5, 2024
Mistras Group, Inc.
John Musgrave
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence analyzer
Patent number
12,135,299
Issue date
Nov 5, 2024
Shimadzu Corporation
Takuro Izumi
G01 - MEASURING TESTING
Information
Patent Grant
Variable zoom X-ray computed tomography method for composites
Patent number
12,130,245
Issue date
Oct 29, 2024
Board of Regents, The University of Texas System
Andrew Makeev
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Bonding wire for semiconductor devices
Patent number
12,132,026
Issue date
Oct 29, 2024
NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
Tomohiro Uno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method of producing a tomogram
Patent number
12,131,411
Issue date
Oct 29, 2024
ADAPTIX LTD
Gil Travish
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
Patent number
12,123,840
Issue date
Oct 22, 2024
Arizona Board of Regents on behalf of Arizona State University
Alexandra Ros
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Multifunctional and visual rock triaxial testing system
Patent number
12,123,852
Issue date
Oct 22, 2024
INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
Yanzhi Hu
G01 - MEASURING TESTING
Information
Patent Grant
Methods for correlative microscopy
Patent number
12,123,047
Issue date
Oct 22, 2024
Leica Mikrosysteme GmbH
Julia König
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Method and system to characterize and monitor the sharpness of a di...
Patent number
12,118,701
Issue date
Oct 15, 2024
AGFA NV
Marc Cresens
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle detection for spectroscopic techniques
Patent number
12,117,406
Issue date
Oct 15, 2024
VG Systems Limited
Bryan Barnard
G01 - MEASURING TESTING
Information
Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
Patent number
12,115,502
Issue date
Oct 15, 2024
Sartorius Stedim Biotech GmbH
Volkmar Thom
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Radiation detector and radiography apparatus
Patent number
12,115,011
Issue date
Oct 15, 2024
FUJIFILM Corporation
Hisatsugu Horiuchi
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
X-ray scanning system and method for inspecting an object
Patent number
12,111,271
Issue date
Oct 8, 2024
Seethru AI, Inc.
Omar Al-Kofahi
G01 - MEASURING TESTING
Information
Patent Grant
Densitometer assembly for high-pressure flow lines
Patent number
12,111,331
Issue date
Oct 8, 2024
KHOLLE Magnolia 2015, LLC
William Brent Stroebel
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for determining the mineralogy of drill solids
Patent number
12,111,273
Issue date
Oct 8, 2024
Schlumberger Technology Corporation
Jonathan Mitchell
E21 - EARTH DRILLING MINING
Information
Patent Grant
System for estimating the occurrence of defects, and computer-reada...
Patent number
12,111,272
Issue date
Oct 8, 2024
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Intelligent data acquisition system and method for pipelines
Patent number
12,111,007
Issue date
Oct 8, 2024
Shuyong Paul Du
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Radiation detector and radiography apparatus
Patent number
12,111,430
Issue date
Oct 8, 2024
FUJIFILM Corporation
Hisatsugu Horiuchi
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Radiation imaging apparatus, radiation imaging system, control meth...
Patent number
12,102,468
Issue date
Oct 1, 2024
Canon Kabushiki Kaisha
Kazuaki Umekawa
G01 - MEASURING TESTING
Information
Patent Grant
Fast 3D radiography with multiple pulsed X-ray sources by deflectin...
Patent number
12,102,469
Issue date
Oct 1, 2024
AIXSCAN INC.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
Patent number
12,106,867
Issue date
Oct 1, 2024
Bruker Nano GmbH
Ulrich Waldschläger
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection system, determination processing apparatus, and inspecti...
Patent number
12,105,033
Issue date
Oct 1, 2024
JGC CORPORATION
Teruaki Sano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray spectrometer and pulse height prediction program
Patent number
12,105,035
Issue date
Oct 1, 2024
Rigaku Corporation
Tsutomu Tada
G01 - MEASURING TESTING
Information
Patent Grant
Method and plant for inspecting an animal carcass
Patent number
12,102,094
Issue date
Oct 1, 2024
BIOMETIC S.R.L.
Enrico Ursella
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Patents Applications
last 30 patents
Information
Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
Publication number
20240385126
Publication date
Nov 21, 2024
VIEWORKS CO., LTD.
Jungmin CHOI
G01 - MEASURING TESTING
Information
Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
Publication number
20240385127
Publication date
Nov 21, 2024
Samsung SDI Co.,Ltd.
Seong Ho WOO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR INSPECTING HONEYCOMB CERAMIC STRUCTURES USI...
Publication number
20240386540
Publication date
Nov 21, 2024
Corning Incorporated
Patrick Garret Cigno
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...
Publication number
20240387295
Publication date
Nov 21, 2024
SANDISK TECHNOLOGIES, INC.
Tsuyoshi Sendoda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AN X-RAY FLUORESCENCE SYSTEM
Publication number
20240385129
Publication date
Nov 21, 2024
Commonwealth Scientific and Industrial Research Organisation
Brianna Ganly
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER
Publication number
20240385130
Publication date
Nov 21, 2024
Shimadzu Corporation
Goshi AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
Analysis Device and Analysis Method
Publication number
20240385131
Publication date
Nov 21, 2024
JEOL Ltd.
Takeshi Otsuka
G01 - MEASURING TESTING
Information
Patent Application
ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...
Publication number
20240387448
Publication date
Nov 21, 2024
TOKYO ELECTRON LIMITED
Francisco MACHUCA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA
Publication number
20240377339
Publication date
Nov 14, 2024
KUB TECHNOLOGIES, INC. DBA KUBTEC
Vikram Butani
G01 - MEASURING TESTING
Information
Patent Application
Small-Angle X-Ray Scatterometry
Publication number
20240377342
Publication date
Nov 14, 2024
BRUKER TECHNOLOGIES LTD.
Alex Dikopoltsev
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONVERTING METROLOGY DATA
Publication number
20240377343
Publication date
Nov 14, 2024
ASML NETHERLANDS B.V.
Yunbo GUO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM
Publication number
20240374223
Publication date
Nov 14, 2024
GE Precision Healthcare LLC
Björn Cederström
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
Publication number
20240377340
Publication date
Nov 14, 2024
Greyscale AI
Brian Green
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RAY COLLIMATION DEVICE AND RADIATION INSPECTION DEVICE
Publication number
20240379258
Publication date
Nov 14, 2024
Nuctech Company Limited
Yaohong LIU
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
FEEDING DEVICE FOR AN X-RAY INSPECTION DEVICE
Publication number
20240369501
Publication date
Nov 7, 2024
WIPOTEC GmbH
Sebastian MORSCH
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240369502
Publication date
Nov 7, 2024
Canon ANELVA Corporation
Takeo TSUKAMOTO
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
RAY SCANNING APPARATUS
Publication number
20240369499
Publication date
Nov 7, 2024
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
Publication number
20240369500
Publication date
Nov 7, 2024
Robert Koch
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
Publication number
20240369505
Publication date
Nov 7, 2024
FEI Company
Garrett Budnik
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
Publication number
20240359187
Publication date
Oct 31, 2024
Faxitron Bioptics, LLC
Ciaran Purdy
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SYSTEM AND METHOD FOR SCANNING A COMPONENT
Publication number
20240361218
Publication date
Oct 31, 2024
Rolls-Royce plc
Akhil MULLOTH
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
Publication number
20240361257
Publication date
Oct 31, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM
Publication number
20240361258
Publication date
Oct 31, 2024
VAREX IMAGING CORPORATION
Rajashekar Venkatachalam
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
Publication number
20240361260
Publication date
Oct 31, 2024
TOHOKU UNIVERSITY
Hiroshi JINNAI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING
Publication number
20240363447
Publication date
Oct 31, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Te-Chien HOU
B24 - GRINDING POLISHING
Information
Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
Publication number
20240361255
Publication date
Oct 31, 2024
VIDERAY TECHNOLOGIES, INC.
Paul Bradshaw
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
X-RAY ANALYZER
Publication number
20240361261
Publication date
Oct 31, 2024
Shimadzu Corporation
Keijiro SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD
Publication number
20240361256
Publication date
Oct 31, 2024
Konica Minolta, Inc.
Mika Matsusaka
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN
Publication number
20240361262
Publication date
Oct 31, 2024
ETROLOGY, LLC
Vladislav Kaplan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20240361263
Publication date
Oct 31, 2024
Rigaku Corporation
Yasuhiko Nagoshi
G01 - MEASURING TESTING