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Investigating materials by wave or particle radiation
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2223/00
Investigating materials by wave or particle radiation
Sub Industries
G01N2223/01
by radioactivity, nuclear decay
G01N2223/03
by transmission
G01N2223/04
and measuring absorption
G01N2223/041
X-ray absorption fine structure [EXAFS]
G01N2223/043
gamma ray resonance absorption (Mossbauer effect)
G01N2223/045
combination of at least 2 measurements (transmission and scatter)
G01N2223/05
by diffraction, scatter or reflection
G01N2223/051
correcting for scatter
G01N2223/052
reflection
G01N2223/053
back scatter
G01N2223/054
small angle scatter
G01N2223/055
scatter raster collimator
G01N2223/056
diffraction
G01N2223/0561
diffraction cameras
G01N2223/0563
measure of energy-dispersion spectrum of diffracted radiation
G01N2223/0565
diffraction of electrons
G01N2223/0566
analysing diffraction pattern
G01N2223/0568
spectro-diffractometry
G01N2223/063
inelastic scatter
G01N2223/064
interference of radiation
G01N2223/07
secondary emission
G01N2223/071
combination of measurements, at least 1 secondary emission
G01N2223/072
combination of measurements, 2 kinds of secondary emission
G01N2223/073
use of a laser
G01N2223/074
activation analysis
G01N2223/0745
neutron-gamma activation analysis
G01N2223/076
X-ray fluorescence
G01N2223/0763
Compton background correcting
G01N2223/0766
X-ray fluorescence with indicator, tags
G01N2223/079
incident electron beam and measuring excited X-rays
G01N2223/08
incident electron beam and measuring cathode luminescence (U.V.)
G01N2223/081
incident ion beam
G01N2223/0813
incident ion beam and measuring X-rays [PIXE]
G01N2223/0816
incident ion beam and measuring secondary ion beam [SIMS]
G01N2223/084
photo-electric effect
G01N2223/085
photo-electron spectrum [ESCA, XPS]
G01N2223/086
Auger electrons
G01N2223/09
exo-electron emission
G01N2223/095
tribo-emission
G01N2223/10
Different kinds of radiation or particles
G01N2223/1003
monochromatic
G01N2223/1006
different radiations
G01N2223/101
electromagnetic radiation
G01N2223/1013
gamma
G01N2223/1016
X-ray
G01N2223/102
beta or electrons
G01N2223/104
ions
G01N2223/1045
alpha
G01N2223/105
molecular or atomic beams
G01N2223/106
neutrons
G01N2223/1063
fast
G01N2223/1066
thermal
G01N2223/107
protons
G01N2223/108
positrons electron-positron annihilation
G01N2223/11
neutrino
G01N2223/20
Sources of radiation
G01N2223/201
betatron
G01N2223/202
isotopes
G01N2223/203
synchrotron
G01N2223/204
source created from radiated target
G01N2223/205
natural source
G01N2223/206
sources operating at different energy levels
G01N2223/30
Accessories, mechanical or electrical features
G01N2223/301
portable apparatus
G01N2223/302
comparative arrangements
G01N2223/303
calibrating, standardising
G01N2223/3032
periodic calibration
G01N2223/3035
phantom
G01N2223/3037
standards (constitution)
G01N2223/304
electric circuits, signal processing
G01N2223/305
computer simulations
G01N2223/306
computer control
G01N2223/307
cuvettes-sample holders
G01N2223/3075
correcting for the properties of the container
G01N2223/308
support of radiation source
G01N2223/309
support of sample holder
G01N2223/31
temperature control
G01N2223/3103
cooling, cryostats
G01N2223/3106
heating, furnaces
G01N2223/311
high pressure testing, anvil cells
G01N2223/312
powder preparation
G01N2223/313
filters, rotating filter disc
G01N2223/314
chopper
G01N2223/315
monochromators
G01N2223/316
collimators
G01N2223/317
windows
G01N2223/318
protective films
G01N2223/319
using opaque penetrant medium
G01N2223/32
adjustments of elements during operation
G01N2223/321
manipulator for positioning a part
G01N2223/322
immerged detecting head
G01N2223/323
irradiation range monitor
G01N2223/33
scanning
G01N2223/3301
beam is modified for scan
G01N2223/3302
object and detector fixed
G01N2223/3303
object fixed source and detector move
G01N2223/3304
helicoidal scan
G01N2223/3305
detector fixed source and body moving
G01N2223/3306
object rotates
G01N2223/3307
source and detector fixed object moves
G01N2223/3308
object translates
G01N2223/331
rocking curve analysis
G01N2223/335
electronic scanning
G01N2223/34
sensing means for gap between source and detector
G01N2223/345
mathematical transformations on beams or signals
G01N2223/348
ellipsoidal collector
G01N2223/351
prohibiting charge accumulation on sample substrate
G01N2223/40
Imaging
G01N2223/401
image processing
G01N2223/402
mapping distribution of elements
G01N2223/403
mapping with false colours
G01N2223/404
contrast medium
G01N2223/405
mapping of a material property
G01N2223/406
fluoroscopic image
G01N2223/407
stimulable phosphor sheet
G01N2223/408
display on monitor
G01N2223/409
embedding or impregnating the object
G01N2223/41
imaging specifically internal structure
G01N2223/411
tv imaging from fluorescent screen
G01N2223/412
use of image converter tube [PMT]
G01N2223/413
sensor array [CCD]
G01N2223/414
stereoscopic system
G01N2223/415
radiographic film
G01N2223/416
wrap around
G01N2223/417
recording with co-ordinate markings
G01N2223/418
electron microscope
G01N2223/419
computed tomograph
G01N2223/42
image digitised, -enhanced in an image processor
G01N2223/421
digitised image, analysed in real time (recognition algorithms)
G01N2223/422
windows within the image
G01N2223/423
multispectral imaging-multiple energy imaging
G01N2223/424
energy substraction image processing (dual energy processing)
G01N2223/425
temporal (time difference) substraction processing
G01N2223/426
image comparing, unknown with known substance
G01N2223/427
stepped imaging (selected area of sample is changed)
G01N2223/50
Detectors
G01N2223/501
array
G01N2223/5015
linear array
G01N2223/502
ionisation chamber
G01N2223/503
auxiliary reference detector
G01N2223/504
pin-diode
G01N2223/505
scintillation
G01N2223/5055
scintillation crystal coupled to PMT
G01N2223/506
time-of-flight
G01N2223/507
secondary-emission detector
G01N2223/508
photo-acoustic
G01N2223/509
infra-red
G01N2223/60
Specific applications or type of materials
G01N2223/601
density profile
G01N2223/602
crystal growth
G01N2223/603
superlattices
G01N2223/604
monocrystal
G01N2223/605
phases
G01N2223/606
texture
G01N2223/607
strain
G01N2223/608
supraconductors
G01N2223/61
thin films, coatings
G01N2223/611
patterned objects electronic devices
G01N2223/6113
printed circuit board [PCB]
G01N2223/6116
semiconductor wafer
G01N2223/612
biological material
G01N2223/6123
bone mineral
G01N2223/6126
tissue
G01N2223/613
moisture
G01N2223/614
road surface
G01N2223/615
composite materials, multilayer laminates
G01N2223/616
earth materials
G01N2223/617
ash in coal
G01N2223/618
food
G01N2223/619
wood
G01N2223/62
powders
G01N2223/621
tobacco
G01N2223/622
paper
G01N2223/623
plastics
G01N2223/624
steel, castings
G01N2223/625
nuclear fuels, laser imploded targets
G01N2223/626
radioactive material
G01N2223/6265
sample with radioactive tracer, tag, label
G01N2223/627
tyres
G01N2223/628
tubes, pipes
G01N2223/629
welds, bonds, sealing compounds
G01N2223/63
turbine blades
G01N2223/631
large structures, walls
G01N2223/632
residual life, life expectancy
G01N2223/633
thickness, density, surface weight (unit area)
G01N2223/634
wear behaviour, roughness
G01N2223/635
fluids, granulates
G01N2223/636
fluid sample with radioactive sources
G01N2223/637
liquid
G01N2223/638
gas
G01N2223/639
material in a container
G01N2223/64
multiple-sample chamber, multiplicity of materials
G01N2223/641
particle sizing
G01N2223/642
moving sheet, web
G01N2223/6425
correcting for web flutter
G01N2223/643
object on conveyor
G01N2223/645
quality control
G01N2223/646
flaws, defects
G01N2223/6462
microdefects
G01N2223/6464
radioactive substance into defect site
G01N2223/6466
flaws comparing to predetermined standards
G01N2223/6468
at different temperatures
G01N2223/647
leak detection
G01N2223/648
voids
G01N2223/649
porosity
G01N2223/65
cavitation pits
G01N2223/651
dust
G01N2223/652
impurities, foreign matter, trace amounts
G01N2223/66
multiple steps inspection
Industries
Overview
Organizations
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Patents Grants
last 30 patents
Information
Patent Grant
Radiographic imaging apparatus, method of controlling the same, rad...
Patent number
11,969,284
Issue date
Apr 30, 2024
Canon Kabushiki Kaisha
Tadahiko Iijima
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,971,370
Issue date
Apr 30, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method and apparatus for reconstructing image projections
Patent number
11,969,279
Issue date
Apr 30, 2024
Medtronic Navigation, Inc.
Patrick A. Helm
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and systems of testing formation samples using a rock hydro...
Patent number
11,971,369
Issue date
Apr 30, 2024
Halliburton Energy Services, Inc.
Abraham S. Grader
G01 - MEASURING TESTING
Information
Patent Grant
Sample inspection system comprising a beam former to project a poly...
Patent number
11,971,371
Issue date
Apr 30, 2024
The Nottingham Trent University
Paul Evans
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Systems and methods for monitoring slope stability
Patent number
11,971,373
Issue date
Apr 30, 2024
Muon Vision Inc.
Tancredi Botto
E21 - EARTH DRILLING MINING
Information
Patent Grant
Grid coatings for capture of proteins and other compounds
Patent number
11,965,851
Issue date
Apr 23, 2024
Purdue Research Foundation
David H. Thompson
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Multi-physical field imaging method and system based on PET-CT and DAS
Patent number
11,965,995
Issue date
Apr 23, 2024
Yibo Wang
G01 - MEASURING TESTING
Information
Patent Grant
System and methods for determining air content of fresh concrete, a...
Patent number
11,965,837
Issue date
Apr 23, 2024
COMMAND ALKON INCORPORATED
Denis Beaupre
G08 - SIGNALLING
Information
Patent Grant
Portable assessment kit and method for measuring metal content of a...
Patent number
11,965,838
Issue date
Apr 23, 2024
3AWater Oy
Tuomo Nissinen
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for acquiring elastic modulus of rock containing...
Patent number
11,965,839
Issue date
Apr 23, 2024
INST. OF GEOL. & GEOPHYS., CN ACAD. OF SCIENCES
Beixiu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Surface analyzer
Patent number
11,965,841
Issue date
Apr 23, 2024
Shimadzu Corporation
Akira Ogoshi
G01 - MEASURING TESTING
Information
Patent Grant
System and method to adjust a kinetics model of surface reactions d...
Patent number
11,966,203
Issue date
Apr 23, 2024
KLA Corporation
Ankur Agarwal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system and method for operating a measurement system
Patent number
11,959,865
Issue date
Apr 16, 2024
RAYSCAN TECHNOLOGIES GMBH
Christoph Sauerwein
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Live flaw detection system for multi-bundled conductor splicing sle...
Patent number
11,959,866
Issue date
Apr 16, 2024
STATE GRID HUNAN ELECTRIC COMPANY LIMITED
Dehua Zou
G05 - CONTROLLING REGULATING
Information
Patent Grant
X-ray detector device, glass body for shielding optical detector me...
Patent number
11,953,453
Issue date
Apr 9, 2024
Intom GmbH
Severin Ebner
G01 - MEASURING TESTING
Information
Patent Grant
Ore component analysis device and method
Patent number
11,953,455
Issue date
Apr 9, 2024
SHANDONG UNIVERSITY
Chen Liu
G01 - MEASURING TESTING
Information
Patent Grant
Ionizing radiation detector with reduced street width and improved...
Patent number
11,953,452
Issue date
Apr 9, 2024
Redlen Technologies, Inc.
Pramodha Marthandam
G01 - MEASURING TESTING
Information
Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
Patent number
11,953,316
Issue date
Apr 9, 2024
Applied Materials Israel Ltd.
Rafael Bistritzer
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor-based biosensors for base calling
Patent number
11,953,464
Issue date
Apr 9, 2024
Illumina, Inc.
Dietrich Dehlinger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Converting borehole images into three dimensional structures for nu...
Patent number
11,954,800
Issue date
Apr 9, 2024
Saudi Arabian Oil Company
Hussain AlBahrani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and method for constraining 3D fracture model properties us...
Patent number
11,952,891
Issue date
Apr 9, 2024
Saudi Arabian Oil Company
Otto Meza Camargo
G01 - MEASURING TESTING
Information
Patent Grant
Item inspection by dynamic selection of projection angle
Patent number
11,953,451
Issue date
Apr 9, 2024
Universiteit Antwerpen
Jan De Beenhouwer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Process monitoring of deep structures with X-ray scatterometry
Patent number
11,955,391
Issue date
Apr 9, 2024
KLA-Tencor Corporation
Antonio Arion Gellineau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System and method for crack detection
Patent number
11,946,883
Issue date
Apr 2, 2024
United States as represented by the Administrator of NASA
Ajay M Koshti
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Biological imaging method using X-ray fluorescence
Patent number
11,946,884
Issue date
Apr 2, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan Cao
G01 - MEASURING TESTING
Information
Patent Grant
Crosslinked fluoropolymer resin and control method for same
Patent number
11,946,924
Issue date
Apr 2, 2024
PROTERIAL, LTD.
Kazufumi Suenaga
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Radiation detector with automatic exposure control and a method of...
Patent number
11,944,483
Issue date
Apr 2, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan Cao
G01 - MEASURING TESTING
Information
Patent Grant
Method to determine relative thermal maturity from porosities measu...
Patent number
11,940,398
Issue date
Mar 26, 2024
Saudi Arabian Oil Company
Shannon Lee Eichmann
E21 - EARTH DRILLING MINING
Information
Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
Patent number
11,942,303
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Yan Ren
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
Publication number
20240142392
Publication date
May 2, 2024
MULTICT IMAGING LTD
Nathan HERMONY
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNT...
Publication number
20240142393
Publication date
May 2, 2024
NeuroLogica Corporation, a subsidiary of Samsung Electronics Co., Ltd.
Duhgoon Lee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Analyzing Method and Analyzer
Publication number
20240142395
Publication date
May 2, 2024
JEOL Ltd.
Koki Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Calibration Method and Device Therefor
Publication number
20240134083
Publication date
Apr 25, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION
Publication number
20240133830
Publication date
Apr 25, 2024
Sortera Technologies Inc.
Lakshmi Chellappan
G01 - MEASURING TESTING
Information
Patent Application
LUBRICATING OIL ANALYSIS
Publication number
20240133859
Publication date
Apr 25, 2024
ExxonMobil Technology and Engineering Company
Andrew SATTERFIELD
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Determining the Location of Artefacts and/or...
Publication number
20240133822
Publication date
Apr 25, 2024
The Australian National University
Roland Fleddermann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...
Publication number
20240130699
Publication date
Apr 25, 2024
SIEMENS HEALTHINEERS INTERNATIONAL AG
Mathieu PLAMONDON
G01 - MEASURING TESTING
Information
Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
Publication number
20240122568
Publication date
Apr 18, 2024
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD
Publication number
20240125715
Publication date
Apr 18, 2024
TOTALENERGIES ONETECH
Michel N'GUYEN
G01 - MEASURING TESTING
Information
Patent Application
Artificial Intelligence-Based Dual Energy X-Ray Image Motion Correc...
Publication number
20240122566
Publication date
Apr 18, 2024
GE Precision Healthcare LLC
Balázs P. Cziria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
Publication number
20240125718
Publication date
Apr 18, 2024
Silanna UV Technologies Pte Ltd
Petar Atanackovic
G01 - MEASURING TESTING
Information
Patent Application
PREDICTION OF CEMENT LONGEVITY USING DIGITAL CEMENT MODELING
Publication number
20240125755
Publication date
Apr 18, 2024
ARAMCO SERVICES COMPANY
Arpita P. Bathija
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
Publication number
20240127417
Publication date
Apr 18, 2024
HITACHI HIGH-TECH CORPORATION
Takehiro HIRAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
Publication number
20240127425
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ARTICLE INSPECTION SYSTEM
Publication number
20240114913
Publication date
Apr 11, 2024
Anritsu Corporation
Eiji ASAI
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
Publication number
20240110880
Publication date
Apr 4, 2024
FEI Company
Maurice PEEMEN
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Scanners
Publication number
20240111070
Publication date
Apr 4, 2024
Rapiscan Systems, Inc.
Edward James Morton
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Systems And Methods For Detecting Beam Displacement
Publication number
20240110881
Publication date
Apr 4, 2024
FEI Company
James B. McGinn
G01 - MEASURING TESTING
Information
Patent Application
X-RAY PHASE IMAGING APPARATUS AND X-RAY PHASE IMAGING METHOD
Publication number
20240102946
Publication date
Mar 28, 2024
Shimadzu Corporation
Kana KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...
Publication number
20240103391
Publication date
Mar 28, 2024
FUJIFILM Business Innovation Corp.
Yosuke TSURUMI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
RAPID X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD
Publication number
20240102944
Publication date
Mar 28, 2024
JST POWER EQUIPMENT, INC.
Haoning Liang
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING PHYSICAL PROPERTIES OF ITEMS INPUT TO AN X-RAY SCANNER...
Publication number
20240102948
Publication date
Mar 28, 2024
Analogic Corporation
Steven Urchuk
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
Publication number
20240102949
Publication date
Mar 28, 2024
NEUF Inc.
Myoung Chan NA
G01 - MEASURING TESTING
Information
Patent Application
HIGH RESOLUTION COMPUTED TOMOGRAPHY OBJECT SCANNING
Publication number
20240102947
Publication date
Mar 28, 2024
Baker Hughes Holdings LLC
Nils Rothe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
Publication number
20240102945
Publication date
Mar 28, 2024
Shimadzu Corporation
Kana KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
Publication number
20240102950
Publication date
Mar 28, 2024
Industrial Technology Research Institute
Chun-Ting LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
Publication number
20240093603
Publication date
Mar 21, 2024
Talgat Shokanov
E21 - EARTH DRILLING MINING
Information
Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
Publication number
20240094148
Publication date
Mar 21, 2024
Industrial Technology Research Institute
Bo-Ching HE
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
Publication number
20240094151
Publication date
Mar 21, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS