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Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/00
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Sub Industries
G01R31/001
Measuring interference from external sources to, or emission from, the device under test
G01R31/002
where the device under test is an electronic circuit
G01R31/003
Environmental or reliability tests
G01R31/005
Testing of electric installations on transport means
G01R31/006
on road vehicles
G01R31/007
using microprocessors or computers
G01R31/008
on air- or spacecraft, railway rolling stock or sea-going vessels
G01R31/01
Subjecting similar articles in turn to test
G01R31/013
Testing passive components
G01R31/016
Testing of capacitors
G01R31/02
Testing of electric apparatus, lines or components, for short-circuits, discontinuities, leakage of current , or incorrect line connection
G01R31/021
Testing of cables or conductors
G01R31/022
Testing while the cable or conductor passes continuously the testing apparatus
G01R31/023
Identification of wires in a multicore cable
G01R31/024
Arrangements for indicating continuity or short-circuits in electric apparatus or lines, leakage or ground faults
G01R31/025
Testing short circuits, leakage or ground faults
G01R31/026
Testing continuity
G01R31/027
Testing of transformers
G01R31/028
Testing of capacitors
G01R31/04
Testing connections
G01R31/041
Testing of correct wire connections in electrical apparatus and circuits
G01R31/043
of releaseable connections
G01R31/045
of plugs, sockets or terminals at the end of a cable or a wire harness; of wall sockets; of power sockets in appliances
G01R31/046
of connections between components and printed circuit boards (PCB's)
G01R31/048
Details concerning testing solder joints
G01R31/06
Testing of electric windings
G01R31/07
Testing of fuses
G01R31/08
Locating faults in cables, transmission lines, or networks
G01R31/081
according to type of conductors
G01R31/083
in cables
G01R31/085
in power transmission or distribution lines, e.g.overhead
G01R31/086
in power transmission or distribution networks
G01R31/088
Aspects of digital computing
G01R31/10
by increasing destruction at fault
G01R31/11
using pulse reflection methods
G01R31/12
Testing dielectric strength or breakdown voltage; Testing or monitoring effectiveness or level of insulation
G01R31/1209
using acoustic measurements
G01R31/1218
using optical methods; using charged particle
G01R31/1227
of components, parts or materials
G01R31/1236
of surge arresters
G01R31/1245
of line insulators or spacers
G01R31/1254
of gas-insulated power appliances or vacuum gaps
G01R31/1263
of solid or fluid materials
G01R31/1272
of cable, line or wire insulation
G01R31/1281
of liquids or gases
G01R31/129
of components or parts made of semiconducting materials; of LV components or parts
G01R31/14
Circuits therefor
G01R31/16
Construction of testing vessels Electrodes therefor
G01R31/18
Subjecting similar articles in turn to test
G01R31/20
Preparation of articles or specimens to facilitate testing
G01R31/24
Testing of discharge tubes
G01R31/245
Testing of gas discharge tubes
G01R31/25
Testing of vacuum tubes
G01R31/252
Testing of electron multipliers
G01R31/255
Testing of transit-time tubes
G01R31/257
Testing of beam-tubes
G01R31/26
Testing of individual semiconductor devices
G01R31/2601
Apparatus or methods therefor
G01R31/2603
for curve tracing of semiconductor characteristics
G01R31/2607
Circuits therefor
G01R31/2608
for testing bipolar transistors
G01R31/261
for measuring break-down voltage or punch through voltage therefor
G01R31/2612
for measuring frequency response characteristics
G01R31/2614
for measuring gain factor thereof
G01R31/2616
for measuring noise
G01R31/2617
for measuring switching properties thereof
G01R31/2619
for measuring thermal properties thereof
G01R31/2621
for testing field effect transistors
G01R31/2623
for measuring break-down voltage therefor
G01R31/2625
for measuring gain factor thereof
G01R31/2626
for measuring noise
G01R31/2628
for measuring thermal properties thereof
G01R31/263
for testing thyristors
G01R31/2632
for testing diodes
G01R31/2633
for measuring switching properties thereof
G01R31/2635
Testing light-emitting diodes, laser diodes or photodiodes
G01R31/2637
for testing other individual devices
G01R31/2639
for testing field-effect devices
G01R31/2641
for testing charge coupled devices
G01R31/2642
Testing semiconductor operation lifetime or reliability
G01R31/2644
Adaptations of individual semiconductor devices to facilitate the testing thereof
G01R31/2646
for measuring noise
G01R31/2648
Characterising semiconductor materials
G01R31/265
Contactless testing
G01R31/2653
using electron beams
G01R31/2656
using non-ionising electromagnetic radiation
G01R31/27
Testing of devices without physical removal from the circuit of which they form part
G01R31/275
for testing individual semiconductor components within integrated circuits
G01R31/28
Testing of electronic circuits
G01R31/2801
Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
G01R31/2803
by means of functional tests
G01R31/2805
Bare printed circuit boards
G01R31/2806
Apparatus therefor
G01R31/2808
Holding, conveying or contacting devices
G01R31/281
Specific types of tests or tests for a specific type of fault
G01R31/2812
Checking for open circuits or shorts
G01R31/2813
Checking the presence, location, orientation or value
G01R31/2815
Functional tests
G01R31/2817
Environmental-, stress-, or burn-in tests
G01R31/2818
using test structures on, or modifications of, the card under test, made for the purpose of testing
G01R31/282
Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
G01R31/2822
of microwave or radiofrequency circuits
G01R31/2824
testing of oscillators or resonators
G01R31/2825
in household appliances or professional audio/video equipment
G01R31/2827
Testing of electronic protection circuits
G01R31/2829
Testing of circuits in sensor or actuator systems
G01R31/2831
Testing of materials or semi-finished products
G01R31/2832
Specific tests of electronic circuits not provided for elsewhere
G01R31/2834
Automated test systems [ATE]; using microprocessors or computers
G01R31/2836
Fault-finding or characterising
G01R31/2837
Characterising or performance testing
G01R31/2839
using signal generators, power supplies or circuit analysers
G01R31/2841
Signal generators
G01R31/2843
In-circuit-testing
G01R31/2844
using test interfaces
G01R31/2846
using hard- or software simulation or using knowledge-based systems
G01R31/2848
using simulation
G01R31/2849
Environmental or reliability testing
G01R31/2851
Testing of integrated circuits [IC]
G01R31/2853
Electrical testing of internal connections or -isolation
G01R31/2855
Environmental, reliability or burn-in testing
G01R31/2856
Internal circuit aspects
G01R31/2858
Measuring of material aspects
G01R31/286
External aspects
G01R31/2862
Chambers or ovens; Tanks
G01R31/2863
Contacting devices
G01R31/2865
Holding devices
G01R31/2867
Handlers or transport devices
G01R31/2868
Complete testing stations; systems; procedures; software aspects
G01R31/287
Procedures; Software aspects
G01R31/2872
related to electrical or environmental aspects
G01R31/2874
related to temperature
G01R31/2875
related to heating
G01R31/2877
related to cooling
G01R31/2879
related to electrical aspects
G01R31/2881
related to environmental aspects other than temperature
G01R31/2882
Testing timing characteristics
G01R31/2884
using dedicated test connectors, test elements or test circuits on the IC under test
G01R31/2886
Features relating to contacting the IC under test
G01R31/2887
involving moving the probe head or the IC under test; docking stations
G01R31/2889
Interfaces
G01R31/2891
related to sensing or controlling of force, position, temperature
G01R31/2893
Handling, conveying or loading
G01R31/2894
Aspects of quality control [QC]
G01R31/2896
Testing of IC packages; Test features related to IC packages
G01R31/2898
Sample preparation
G01R31/30
Marginal testing
G01R31/3004
Current or voltage test
G01R31/3008
Quiescent current [IDDQ] test or leakage current test
G01R31/3012
Built-In-Current test [BIC]
G01R31/3016
Delay or race condition test
G01R31/302
Contactless testing
G01R31/3025
Wireless interface with the DUT
G01R31/303
of integrated circuits
G01R31/304
of printed or hybrid circuits
G01R31/305
using electron beams
G01R31/306
of printed or hybrid circuits
G01R31/307
of integrated circuits
G01R31/308
using non-ionising electromagnetic radiation
G01R31/309
of printed or hybrid circuits or circuit substrates
G01R31/311
of integrated circuits
G01R31/312
by capacitive methods
G01R31/315
by inductive methods
G01R31/316
Testing of analog circuits
G01R31/3161
Marginal testing
G01R31/3163
Functional testing
G01R31/3167
Testing of combined analog and digital circuits
G01R31/317
Testing of digital circuits
G01R31/31701
Arrangements for setting the Unit Under Test [UUT] in a test mode
G01R31/31702
Testing digital circuits including elements other than semiconductor transistors
G01R31/31703
Comparison aspects
G01R31/31704
Design for test; Design verification
G01R31/31705
Debugging aspects
G01R31/31706
involving differential digital signals
G01R31/31707
Test strategies
G01R31/31708
Analysis of signal quality
G01R31/31709
Jitter measurements; Jitter generators
G01R31/3171
BER [Bit Error Rate] test
G01R31/31711
Evaluation methods
G01R31/31712
Input or output aspects
G01R31/31713
Input or output interfaces for test
G01R31/31715
Testing of input or output circuits; test of circuitry between the I/C pins and the functional core
G01R31/31716
Testing of input or output with loop-back
G01R31/31717
Interconnect testing
G01R31/31718
Logistic aspects
G01R31/31719
Security aspects
G01R31/3172
Optimisation aspects
G01R31/31721
Power aspects
G01R31/31722
Addressing or selecting of test units
G01R31/31723
Hardware for routing the test signal within the device under test to the circuits to be tested
G01R31/31724
Test controller
G01R31/31725
Timing aspects
G01R31/31726
Synchronization
G01R31/31727
Clock circuits aspects
G01R31/31728
Optical aspects
G01R31/3173
Marginal testing
G01R31/3177
Testing of logic operation
G01R31/3181
Functional testing
G01R31/31813
Test pattern generators
G01R31/31816
Soft error testing; Soft error rate evaluation; Single event testing
G01R31/3183
Generation of test inputs
G01R31/318307
computer-aided
G01R31/318314
Tools
G01R31/318321
for combinational circuits
G01R31/318328
for delay tests
G01R31/318335
Test pattern compression or decompression
G01R31/318342
by preliminary fault modelling
G01R31/31835
Analysis of test coverage or failure detectability
G01R31/318357
Simulation
G01R31/318364
as a result of hardware simulation
G01R31/318371
Methodologies therefor
G01R31/318378
of patterns for devices arranged in a network
G01R31/318385
Random or pseudo-random test pattern
G01R31/318392
for sequential circuits
G01R31/3185
Reconfiguring for testing
G01R31/318502
Test of Combinational circuits
G01R31/318505
Test of Modular systems
G01R31/318508
Board Level Test
G01R31/318511
Wafer Test
G01R31/318513
Test of Multi-Chip-Moduls
G01R31/318516
Test of programmable logic devices [PLDs]
G01R31/318519
Test of field programmable gate arrays [FPGA]
G01R31/318522
Test of Sequential circuits
G01R31/318525
Test of flip-flops or latches
G01R31/318527
Test of counters
G01R31/31853
Test of registers
G01R31/318533
using scanning techniques
G01R31/318536
Scan chain arrangements
G01R31/318538
Topological or mechanical aspects
G01R31/318541
Scan latches or cell details
G01R31/318544
Scanning methods, algorithms and patterns
G01R31/318547
Data generators or compressors
G01R31/31855
Interconnection testing
G01R31/318552
Clock circuits details
G01R31/318555
Control logic
G01R31/318558
Addressing or selecting of subparts of the device under test
G01R31/318561
Identification of the subpart
G01R31/318563
Multiple simultaneous testing of subparts
G01R31/318566
Comparators; Diagnosing the device under test
G01R31/318569
Error indication, logging circuits
G01R31/318572
Input/Output interfaces
G01R31/318575
Power distribution; Power saving
G01R31/318577
AC testing
G01R31/31858
Delay testing
G01R31/318583
Design for test
G01R31/318586
with partial scan or non-scannable parts
G01R31/318588
Security aspects
G01R31/318591
Tools
G01R31/318594
Timing aspects
G01R31/318597
JTAG or boundary scan test of memory devices
G01R31/3187
Built-in tests
G01R31/319
Tester hardware
G01R31/31901
Analysis of tester Performance; Tester characterization
G01R31/31903
tester configuration
G01R31/31905
Interface with the device under test [DUT]
G01R31/31907
Modular tester
G01R31/31908
Tester set-up
G01R31/3191
Calibration
G01R31/31912
Tester/user interface
G01R31/31914
Portable Testers
G01R31/31915
In-circuit Testers
G01R31/31917
Stimuli generation or application of test patterns to the device under test [DUT]
G01R31/31919
Storing and outputting test patterns
G01R31/31921
using compression techniques
G01R31/31922
Timing generation or clock distribution
G01R31/31924
Voltage or current aspects
G01R31/31926
Routing signals to or from the device under test [DUT]
G01R31/31928
Formatter
G01R31/3193
with comparison between actual response and known fault free response
G01R31/31932
Comparators
G01R31/31935
Storing data
G01R31/31937
Timing aspects
G01R31/327
Testing of circuit interrupters, switches or circuit-breakers
G01R31/3271
of high voltage or medium voltage devices
G01R31/3272
Apparatus, systems or circuits therefor
G01R31/3274
Details related to measuring
G01R31/3275
Fault detection or status indication
G01R31/3277
of low voltage devices
G01R31/3278
of relays, solenoids or reed switches
G01R31/333
Testing of the switching capacity of high-voltage circuit-breakers; Testing of breaking capacity or related variables
G01R31/3333
Apparatus, systems or circuits therefor
G01R31/3336
Synthetic testing
G01R31/34
Testing dynamo-electric machines
G01R31/343
in operation
G01R31/346
Testing of armature or field windings
G01R31/36
Apparatus for testing electrical condition of accumulators or electric batteries
G01R31/3606
Monitoring, i.e. measuring or determining some variables continuously or repeatedly over time
G01R31/361
using current integration
G01R31/3613
without voltage measurement
G01R31/3617
using analog integrators
G01R31/362
based on measuring voltage only
G01R31/3624
based on combined voltage and current measurement
G01R31/3627
Testing, i.e. making a one-time determination of some variables
G01R31/3631
based on the use of test loads
G01R31/3634
for determining the ampere-hour charge capacity or state-of-charge (SoC)
G01R31/3637
based on voltage measurements
G01R31/3641
related to manufacture
G01R31/3644
Various constructional arrangements
G01R31/3648
comprising digital calculation means
G01R31/3651
Software aspects
G01R31/3655
the digital calculation means being combined with the battery or battery pack
G01R31/3658
for testing or monitoring individual cells or groups of cells in a battery
G01R31/3662
involving measuring the internal battery impedance, conductance or related variables
G01R31/3665
whereby the type of battery is of primary emphasis
G01R31/3668
Lead-acid batteries
G01R31/3672
Primary cells
G01R31/3675
for compensating for temperature or ageing
G01R31/3679
for determining battery ageing or deterioration
G01R31/3682
for indicating electrical conditions or variables
G01R31/3686
the indicator being combined with the battery
G01R31/3689
the indication being remote from the battery
G01R31/3693
for determining the ability of a battery to perform a critical function
G01R31/3696
Battery pole connectors combined with measurement function
G01R31/40
Testing power supplies
G01R31/42
AC power supplies
G01R31/44
Testing lamps
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Fault monitoring method, monitoring device, and recording medium
Patent number
11,971,875
Issue date
Apr 30, 2024
Panasonic Intellectual Property Corporation of America
Naohisa Nishida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Gas monitoring system for gas-insulated switchgears
Patent number
11,971,442
Issue date
Apr 30, 2024
Siemens Energy Global GmbH & Co. KG
Graeme Coapes
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Interface system for interconnected die and MPU and communication m...
Patent number
11,971,446
Issue date
Apr 30, 2024
Jinghe Wei
G01 - MEASURING TESTING
Information
Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
Patent number
11,971,449
Issue date
Apr 30, 2024
Technoprobe S.p.A.
Flavio Maggioni
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining parameters in on-wafer calibration piece model
Patent number
11,971,451
Issue date
Apr 30, 2024
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
Aihua Wu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining a battery condition
Patent number
11,971,454
Issue date
Apr 30, 2024
Zitara Technologies, Inc.
Evan Murphy
G01 - MEASURING TESTING
Information
Patent Grant
Multispectral impedance determination under dynamic load conditions
Patent number
11,971,456
Issue date
Apr 30, 2024
Battelle Energy Alliance, LLC
Jon P. Christophersen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for measuring AC impedance of battery in composite power sup...
Patent number
11,971,457
Issue date
Apr 30, 2024
Tongji University
Tiancai Ma
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Electrical fault detection device and vehicle power supply system
Patent number
11,971,458
Issue date
Apr 30, 2024
Sanyo Electric Co., LTD
Masato Nakayama
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Method for diagnosing degradation of fuel cell stack, method for mu...
Patent number
11,973,248
Issue date
Apr 30, 2024
Tsinghua University
Jian-Qiu Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Preload control system
Patent number
11,973,454
Issue date
Apr 30, 2024
Textron Innovations Inc.
Robert Reynolds
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Image-capturing unit and image-capturing apparatus
Patent number
11,974,056
Issue date
Apr 30, 2024
Nikon Corporation
Hirofumi Arima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical probe, optical probe array, optical probe card, and method...
Patent number
11,971,431
Issue date
Apr 30, 2024
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
G01 - MEASURING TESTING
Information
Patent Grant
System and method for identifying product information
Patent number
11,971,435
Issue date
Apr 30, 2024
Opple Lighting Co., Ltd
Guoping Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for determining conductors involved in a fault on a power tr...
Patent number
11,971,440
Issue date
Apr 30, 2024
University of Manitoba
Athula Dayanarth Rajapakse
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Injection device and inspection and repairing method
Patent number
11,971,444
Issue date
Apr 30, 2024
PlayNitride Display Co., Ltd.
Cheng-Cian Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for scan chain in a memory
Patent number
11,971,448
Issue date
Apr 30, 2024
Ceremorphic, Inc.
Robert F. Wiser
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Vehicle accessory load control and power stability
Patent number
11,970,078
Issue date
Apr 30, 2024
GM Global Technology Operations LLC
Chandra S. Namuduri
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Method for determining an ageing condition of a battery, computer p...
Patent number
11,970,079
Issue date
Apr 30, 2024
Volkswagen Aktiengesellschaft
Fabian Kai-Dietrich Noering
B60 - VEHICLES IN GENERAL
Information
Patent Grant
State of charge and state of health assessment of a mixed chemistry...
Patent number
11,971,455
Issue date
Apr 30, 2024
GM Global Technology Operations LLC
Chengwu Duan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for determining an intermediate circuit voltage
Patent number
11,973,410
Issue date
Apr 30, 2024
Audi AG
Franz Honkomp
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Thermal runaway detection and mitigation for electric vehicles
Patent number
11,970,082
Issue date
Apr 30, 2024
GM CRUISE HOLDINGS LLC
Kenneth Ramon Ferguson
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Semiconductor device inspection method and semiconductor device ins...
Patent number
11,971,364
Issue date
Apr 30, 2024
Hamamatsu Photonics K.K.
Shinsuke Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Mass-interconnect engaging device
Patent number
11,971,430
Issue date
Apr 30, 2024
Jeffery P. Stowers
G01 - MEASURING TESTING
Information
Patent Grant
Active symmetrization via insulation monitoring for electrical vehi...
Patent number
11,971,443
Issue date
Apr 30, 2024
Volvo Car Corporation
Ustun Saglam
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Integrated circuit and associated method
Patent number
11,971,445
Issue date
Apr 30, 2024
NXP B.V.
Anton Salfelner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic tester and testing method
Patent number
11,971,450
Issue date
Apr 30, 2024
Rohde & Schwarz GmbH & Co. KG
Yi Jin
G01 - MEASURING TESTING
Information
Patent Grant
Reference electrode assembly and method of manufacturing the same
Patent number
11,973,200
Issue date
Apr 30, 2024
GM Global Technology Operations LLC
Gayatri V. Dadheech
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for operating an electrical energy store
Patent number
11,970,076
Issue date
Apr 30, 2024
Robert Bosch GmbH
Christel Sarfert
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Method for determining an electrical cell voltage of a battery cell...
Patent number
11,970,077
Issue date
Apr 30, 2024
Daimler AG
Andreas Maier
B60 - VEHICLES IN GENERAL
Patents Applications
last 30 patents
Information
Patent Application
TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...
Publication number
20240142495
Publication date
May 2, 2024
Sumitomo Electric Industries, Ltd.
Kosuke FUJII
G01 - MEASURING TESTING
Information
Patent Application
ONLINE MONITORING METHOD FOR DYNAMIC CHANGES IN POSITIONS OF TRANSM...
Publication number
20240142509
Publication date
May 2, 2024
TSINGHUA UNIVERSITY
Bo ZHANG
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Defect Type Classifying System and Defect Type Classifying Method
Publication number
20240142535
Publication date
May 2, 2024
LG ENERGY SOLUTION, LTD.
Jaeyoon Jeong
G01 - MEASURING TESTING
Information
Patent Application
BATTERY MANAGEMENT SYSTEM AND METHOD FOR CONTROLLING THE SAME
Publication number
20240142541
Publication date
May 2, 2024
HYUNDAI MOBIS CO., LTD.
Yeon Ho CHO
G01 - MEASURING TESTING
Information
Patent Application
Remaining-Life and Time-To-Failure Predictions of Power Assets
Publication number
20240142543
Publication date
May 2, 2024
Fischer Block, Inc.
Gregory Wolfe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILIT...
Publication number
20240142546
Publication date
May 2, 2024
CHONGQING UNIVERSITY
Hui LI
G01 - MEASURING TESTING
Information
Patent Application
SOCKET FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20240142493
Publication date
May 2, 2024
Samsung Electronics Co., Ltd.
Sanguk Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
META-STABILITY-FREE TWO-CLOCK-DOMAIN SYNCHRONOUS LATCH
Publication number
20240146285
Publication date
May 2, 2024
VIETTEL GROUP
Thai Ha Le
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BATTERY CHARGE AND DISCHARGE TEST APPARATUS
Publication number
20240145796
Publication date
May 2, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Keyu Ruan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTELLIGENT BATTERY SYSTEM
Publication number
20240140261
Publication date
May 2, 2024
Volvo Car Corporation
Andreas Martin Viktor Ropel
B60 - VEHICLES IN GENERAL
Information
Patent Application
INTELLIGENT BATTERY SYSTEM
Publication number
20240140263
Publication date
May 2, 2024
Volvo Car Corporation
Andreas Martin Viktor Ropel
B60 - VEHICLES IN GENERAL
Information
Patent Application
BATTERY MANAGEMENT SYSTEM FOR BATTERIES
Publication number
20240140269
Publication date
May 2, 2024
Deltran Operations USA, Inc.
Edward William Brumley
B60 - VEHICLES IN GENERAL
Information
Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
Publication number
20240142492
Publication date
May 2, 2024
CHROMA ATE INC.
I-Shih TSENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AN...
Publication number
20240142497
Publication date
May 2, 2024
RENESAS ELECTRONICS CORPORATION
Masaaki TANIMURA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...
Publication number
20240142516
Publication date
May 2, 2024
Battelle Memorial Institute
Thomas F. Kent
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR PRECISE SIGNAL INJECTION INTO MICROELECTRON...
Publication number
20240142517
Publication date
May 2, 2024
Battelle Memorial Institute
Thomas F. Kent
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Selecting an Output as a System Output Responsive to an Indication...
Publication number
20240142518
Publication date
May 2, 2024
SiFive, Inc.
Cameron Mcnairy
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT HAVING TEST CIRCUITRY FOR MEMORY SUB-SYSTEMS
Publication number
20240142520
Publication date
May 2, 2024
NXP USA, Inc.
Alexander Hoefler
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF PRODUCING ALL-SOLID-STATE BATTERY
Publication number
20240142529
Publication date
May 2, 2024
TOYOTA JIDOSHA KABUSHIKI KAISHA
Ryuto Sakamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTELLIGENT BATTERY SYSTEM
Publication number
20240142534
Publication date
May 2, 2024
Volvo Car Corporation
Andreas Martin Viktor Ropel
B60 - VEHICLES IN GENERAL
Information
Patent Application
METHODS AND SYSTEMS FOR MANAGING MULTI-CELL BATTERIES
Publication number
20240142538
Publication date
May 2, 2024
Nova Semiconductor Inc.
Ahmad Ashrafzadeh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DISTRIBUTED BATTERY MANAGEMENT SYSTEM AND BATTERY RECORD DEVICE THE...
Publication number
20240145798
Publication date
May 2, 2024
Grace Connection Microelectronics Limited
Pei Wei Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR IDENTIFYING NON-SWITCHING SEMICONDUCTOR SWITCHES
Publication number
20240146296
Publication date
May 2, 2024
LEONI BORDNETZ-SYSTEME GMBH
Matthias Ebert
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ESTIMATION OF REMAINING BATTERY CHARGE TIME IN STATIONARY ELECTRIC...
Publication number
20240140256
Publication date
May 2, 2024
GM GLOBAL TECHNOLOGY OPERATIONS LLC
Amirthamshan Murugesapillai
B60 - VEHICLES IN GENERAL
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20240142511
Publication date
May 2, 2024
Fuji Electric Co., Ltd.
Yuki KUMAZAWA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF SCAN TEST FOR THEREOF
Publication number
20240142519
Publication date
May 2, 2024
RENESAS ELECTRONICS CORPORATION
Kazushi NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE
Publication number
20240142522
Publication date
May 2, 2024
Innolux Corporation
Chih-Yung Hsieh
G01 - MEASURING TESTING
Information
Patent Application
METHODS, APPARATUS, AND ARTICLES OF MANUFACTURE TO IMPROVE ONE-HOP...
Publication number
20240142523
Publication date
May 2, 2024
TEXAS INSTRUMENTS INCORPORATED
Ariton Xhafa
G01 - MEASURING TESTING
Information
Patent Application
Methods for managing the energy of at least one equipment, correspo...
Publication number
20240142524
Publication date
May 2, 2024
ORANGE
Wided Hammedi
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, METHODS, AND DEVICES FOR ESTIMATING AN ADAPTIVE STATE-OF-C...
Publication number
20240142526
Publication date
May 2, 2024
Nuvation Research Corporation
MICHAEL WORRY
G06 - COMPUTING CALCULATING COUNTING